ECSS-Q-ST-60-14C Rev.1-Corrigendum1 (2march2020)
ECSS-Q-ST-60-14C Rev.1-Corrigendum1 (2march2020)
1 Corrigendum 1
2 March 2020
Space product
assurance
Relifing procedure – EEE
components
ECSS Secretariat
ESA-ESTEC
Requirements & Standards Division
Noordwijk, The Netherlands
ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
2 March 2020
Foreword
This Standard is one of the series of ECSS Standards intended to be applied together for the
management, engineering, product assurance and sustainability in space projects and applications.
ECSS is a cooperative effort of the European Space Agency, national space agencies and European
industry associations for the purpose of developing and maintaining common standards. Requirements
in this Standard are defined in terms of what shall be accomplished, rather than in terms of how to
organize and perform the necessary work. This allows existing organizational structures and methods
to be applied where they are effective, and for the structures and methods to evolve as necessary
without rewriting the standards.
This Standard has been prepared by the ECSS Executive Secretariat, reviewed and approved by the
ECSS Technical Authority.
Disclaimer
ECSS does not provide any warranty whatsoever, whether expressed, implied, or statutory, including,
but not limited to, any warranty of merchantability or fitness for a particular purpose or any warranty
that the contents of the item are error-free. In no respect shall ECSS incur any liability for any damages,
including, but not limited to, direct, indirect, special, or consequential damages arising out of, resulting
from, or in any way connected to the use of this Standard, whether or not based upon warranty,
business agreement, tort, or otherwise; whether or not injury was sustained by persons or property or
otherwise; and whether or not loss was sustained from, or arose out of, the results of, the item, or any
services that may be provided by ECSS.
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Change log
Added requirements:
4.2.3b; 5c to h; 6.1.1e to o (moved, modified and recreated from former
clause 6.1.2 requirements); 6.1.1p and q; 6.1.4d; 6.5d; 7.1.1a to h, Table 7-1;
7.1.2a; 7.1.3a to d; 7.2a to e; 7.3a to c; 7.4 a; 7.5a to d;
Modified requirements:
4.1.3a; 4.1.5a Note deleted; 4.1.6a; 4.2.3a; 4.2.4a and b (term “package”
replaced by “container”); Table 5-1; 6.1.1c; Table 6-1; 6.1.3a; 6.1.4a; 6.1.5a
(text of Note separated from text of requirement); 6.2c; 6.2e; 6.2f (brackets
removed); 6.4a; 6.5b;
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
2 March 2020
Editorial changes:
• Scope updated
• Normative References and Terms and definitions updated
• Heading of clause 4 updated
• Heading of clause 4.2.4 changed from “Package” by “Container”
• Heading of clause 5, 6 and 6.1.1 updated
ECSS-Q-ST-60-14C Rev. 1 First issue Revision 1 Corrigendum 1
Corrigendum 1 This standard was approved by the ECSS Technical Authority at TA#69
2 March 2020 on 19 February 2020 and contains the following changes with respect to
ECSS-Q-ST-60-14C Rev. 1 (1 August 2019):
• Correction of title of Normative Reference of IPC/JEDEC-J-STD-033D
April 2018
• Addition of abbreviated terms for “MSL” and “AQL”
• Addition of clause 3.5 “Nomenclature”
• Correction of cross-references in requirement 5a and 5b
• Correction of requirement 5c from “ECSS parts manufacturer” to read
“EEE parts manufacturer”
• Deletion of requirement 5f. that was a duplicate of 5e.
• Completion of caption of Table 6-1 to contain “for Class 1 and Class 2
programmes”
• Correction of the DOORS ECSS PUID and OUID numbers
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
2 March 2020
Table of contents
1 Scope ....................................................................................................................... 7
5
ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
2 March 2020
6.1.2 <<deleted>> ..............................................................................................25
6.1.3 Electrical testing ........................................................................................25
6.1.4 External visual inspection .......................................................................... 25
6.1.5 Seal test ....................................................................................................26
6.2 Nonconformance ....................................................................................................26
6.3 Relifing datecode ....................................................................................................27
6.4 Relifing report .........................................................................................................27
6.5 Certificate of Conformity .........................................................................................27
Bibliography............................................................................................................. 37
Figures
Figure C-1 : Example of a relifing traveller sheet .................................................................. 36
Tables
Table 5-1: Timing parameters...............................................................................................19
Table 6-1: Control parameters and detailed application of categories for Class 1 and
Class 2 programmes ..........................................................................................22
Table 7-1: Control parameters and detailed application of categories for Class 3
programmes .......................................................................................................30
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
2 March 2020
1
Scope
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
2 March 2020
2
Normative references
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2 March 2020
3
Terms, definitions and abbreviated terms
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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volume conductive type: materials with a volume resistivity less
than 104 Ω-cm.
3.2.3 container
receptacle which holds, restrains or encloses an item for the purpose of storage or
transportation
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3.2.11 ESD protective material
material with one or more of the following properties: limits the generation of
electrostatic charge, dissipates electrostatic charge, and provides shielding from
electric fields
3.2.15 identification
application of appropriate markings to ensure that the identity of an item is
unfailingly indicated after preservation and each stage of packing
3.2.17 package
support used for enveloping, protecting or containing materials
NOTE Different types of packages are normally used:
Primary, intermediate and final packages
3.2.21 packaging
operations consisting in the preparation of supplies for transit and delivery.
NOTE The term includes preservation, identification
and packing
3.2.22 packing
operation by which supplies are placed in container or wrapped and placed in
containers
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3.2.23 particle
unit of matter with observable length, width and thickness
NOTE A particle can be object of solid or liquid
composition, or both, and generally between
0,001 μm and 1000 μm in size
3.2.24 preservation
cleaning of an item and the application of a suitable temporary protective, where
necessary, to maintain the item in prime condition
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Abbreviation Meaning
DSP digital signal processor
EEE electronic, electrical and electromechanical
ESCC European space components coordination
ESD electrostatic discharge
FPGA field programmable gate arrays
HBM human body model
JEDEC joint electronic devices engineering council
MM machine model
MMIC microwave monolithic integrated circuit
MSL moisture sensitivity level
NA not applicable
NCR nonconformance report
NSA national space agency
RH relative humidity
SCSB space components steering board
VLSI very large scale integration
3.4 Symbols
Ω ohm
Ω/ ohm per square
Ω-cm ohm centimetre
μm micrometer
V Volt
3.5 Nomenclature
The following nomenclature applies throughout this document:
a. The word “shall” is used in this Standard to express requirements. All the
requirements are expressed with the word “shall”.
b. The word “should” is used in this Standard to express recommendations.
All the recommendations are expressed with the word “should”.
NOTE It is expected that, during tailoring,
recommendations in this document are either
converted into requirements or tailored out.
c. The words “may” and “need not” are used in this Standard to express
positive and negative permissions, respectively. All the positive
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permissions are expressed with the word “may”. All the negative
permissions are expressed with the words “need not”.
d. The word “can” is used in this Standard to express capabilities or
possibilities, and therefore, if not accompanied by one of the previous
words, it implies descriptive text.
NOTE In ECSS “may” and “can” have completely
different meanings: “may” is normative
(permission), and “can” is descriptive.
e. The present and past tenses are used in this Standard to express statements
of fact, and therefore they imply descriptive text.
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4
Environmental parameters for handling and
storage for Class 1 to Class 3 programmes
4.1.1 <<deleted>>
4.1.2 Procedures
ECSS-Q-ST-60-14_0470002
a. The following domains shall be covered and documented by procedures
sent to the customer for information, on request:
1. Storage area and storage zone
2. Cleanliness
3. ESD protection
4. Packing and Packaging
5. Handling
6. Quality assurance.
ECSS-Q-ST-60-14_0470003
a. It shall be demonstrated that storage areas and storage zones provide such
protection against vibration, electromagnetic fields, radiation fields and
against light so that possible degradation of organic packaging material is
prevented.
4.1.4 Cleanliness
ECSS-Q-ST-60-14_0470004
a. Rules for cleanliness efficiency shall be implemented.
ECSS-Q-ST-60-14_0470005
b. The working areas and the contained equipment shall be maintained as
visually clean with no loose material.
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ECSS-Q-ST-60-14_0470006
c. Access rules shall apply for personnel, materials and equipment.
ECSS-Q-ST-60-14_0470007
d. Storage areas shall conform to a cleanliness level as defined in ECSS-Q-ST-
70-01 clause 5.3.1.4.
NOTE This cleanliness level is often called and known
as “grey zone”.
ECSS-Q-ST-60-14_0470008
a. The efficiency of ESD protection measures in storage, handling and testing
areas shall be demonstrated.
ECSS-Q-ST-60-14_0470009
a. EEE parts manufacturers requirements or, by default, ESCC 20600 or
IPC/JEDEC J-STD-033D (April 2018) shall apply for packing, packaging
and handling.
ECSS-Q-ST-60-14_0470010
a. The storage responsible entity shall establish and document the following:
1. Prohibited materials
2. Personnel access rules
3. Prohibited personnel actions
4. Measures and facilities to segregate and protect components during
receiving, inspection, storage and delivery
5. Control measures to ensure that electrostatic discharge susceptible
components are identified and handled only by trained personnel
using anti static packaging and tools.
4.2.1 Air
Normal air is used.
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4.2.2 Temperature
ECSS-Q-ST-60-14_0470011
a. Temperature in the immediate vicinity of stored components shall at all
times be maintained between a minimum temperature of 17 °C and a
maximum temperature of 27 °C.
NOTE This is to avoid chemical reactions catalysis when
it is too high or electronic reactions on certain
technologies when it is too low.
ECSS-Q-ST-60-14_0470012
a. RH in store cupboards shall be kept in the range 20 % to 65 % of RH.
NOTE This is to avoid, when combined with
temperature, corrosion phenomena. The lower is
the Relative Humidity the greater is the
probability for ESD damage.
ECSS-Q-ST-60-14_0470059
b. EEE parts with MSL > 1 shall be stored, before and after relifing test
sequence, in one of the following conditions:
1. Nitrogen,
2. Dry and ionised air in a range up to 20 % RH maximum,
3. Dry packs as specified in IPC/JEDEC J-STD-033D (April 2018).
4.2.4 Container
ECSS-Q-ST-60-14_0470013
a. The containers used during storage shall ensure protection against ESD as
defined in clause 4.1.6 and against any form of corrosion or contamination.
ECSS-Q-ST-60-14_0470014
b. Parts shall be stored in containers such that it can be demonstrated that
they offer protection against ESD, corrosion and contamination including
the contamination induced by the package itself.
NOTE Their primary containers can be used as long as
they meet this requirement.
ECSS-Q-ST-60-14_0470015
c. CCDs and opto-electronic sensors shall be stored in dry air or in neutral
ambience, to prevent risks of cover glass pollution and moisture ingress.
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5
Timing parameters for Class 1 to Class 3
programmes
ECSS-Q-ST-60-14_0470060
c. The maximum lifetime requirements of the EEE parts manufacturers shall
be taken into account.
ECSS-Q-ST-60-14_0470016
d. In absence of EEE manufacturer's lifetime limitation and when required,
relifing shall be performed between T1 and T2 according to the timing
parameters given in Table 5-1.
NOTE 1 Relife can be anticipated before T1, provided dT
remains applicable.
NOTE 2 For parts not planned to be mounted and to be
kept in stock, relifing is not mandatory.
ECSS-Q-ST-60-14_0470057
e. In case of parts procured through an external procurement entity, the
customer should require the supplier to state the minimum period of
validity of parts, w.r.t. T1 or T2, after delivery.
ECSS-Q-ST-60-14_0470061
f. When started, all relifing tests as described in Table 6-1 and Table 7-1 shall
be completed in a maximum period of six weeks.
ECSS-Q-ST-60-14_0470062
g. First of all, the maximum lifetime requirements of the EEE parts
manufacturers shall be taken into account.
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ECSS-Q-ST-60-14_0470055
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6
Control parameters for Class 1 and Class 2
programmes
ECSS-Q-ST-60-14_0470018
a. For relifing, the following tests, as specified in Table 6-1 shall be
performed:
1. External Visual Inspection
2. Electrical measurements
3. Seal test
4. Specific test
ECSS-Q-ST-60-14_0470019
b. Component families not covered in Table 6-1 shall be subject to special
procedures to be defined by the program.
NOTE The relifing procedure can be applied on a sub-
lot containing only the quantity of components
immediately needed for production. In this case,
the relifing date-code is applicable only to parts
actually tested. The time limits specified in Table
5-1 remain applicable for the residual sub-lot.
ECSS-Q-ST-60-14_0470020
c. When sampling is specified in Table 6-1, it shall be performed in
accordance with AQL 0,65 % level II according to ANSI ASQ Z1.4-2003
Revision 2008.
ECSS-Q-ST-60-14_0470021
d. The specifications and methods to be used during relifing shall be those
that were in effect for the initial procurement or, if demonstrated that they
are not applicable, the most recent updated issues.
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ECSS-Q-ST-60-14_0470022
e. Seal test shall be performed on components made with a hermetic cavity
package in conformance with the applicable procurement specification.
ECSS-Q-ST-60-14_0470023
f. For ceramic chip or moulded capacitors, electrical measurement shall be
done after 4 hours of stabilisation at 125 °C for Type II ceramic.
ECSS-Q-ST-60-14_0470024
g. Multi-chips (stacked) capacitors shall be submitted to 100% visual
inspection and electrical testing.
ECSS-Q-ST-60-14_0470025
h. For all type of solid tantalum capacitors, the following specific tests shall
be performed before the parametrical measurement:
1. Apply 9 discharges and 8 charges with a cycle time of 2 seconds and
under nominal voltage and monitor the current during both charge
and discharge tests to detect short circuit,
2. Perform a burn-in test for a duration or 96 hours at rated voltage at
85 °C.
ECSS-Q-ST-60-14_0470063
i. For all type of non-solid tantalum capacitors, the following specific test
shall be performed before the parametrical measurement:
1. Perform a burn-in test for a duration or 96 hours at rated voltage at
85 °C.
ECSS-Q-ST-60-14_0470026
j. For film capacitors using the polycarbonate technology, a DPA test shall be
performed on three pieces, including:
1. external visual inspection,
2. sealing test after insulate sleeve removal,
3. microsection on two pieces, and
4. decaping on third part.
ECSS-Q-ST-60-14_0470027
k. For programmed parts, the total duration, including storage and mission,
shall not exceed data retention duration given by the manufacturer.
ECSS-Q-ST-60-14_0470058
l. For VLSI, hybrids and CCD, when electrical test is not practicable because
of test program or product complexity, the validation may be transferred
to use step such as functional tests or programming stages.
NOTE For example, VLSI can be ASIC, FPGA, MMIC, DSP,
microprocessors, microcontrollers.
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ECSS-Q-ST-60-14_0470029
m. For electromagnetic relays of latching and non-latching type, 10 switching
shall be run before electrical measurements.
ECSS-Q-ST-60-14_0470030
n. For low frequency and radio-frequency wires and cables, the following
shall be done:
1. inspect at least 0,5 m, and
2. remove 0,2 m of the insulating material.
ECSS-Q-ST-60-14_0470031
o. Electrical test shall be optional for cavity hermetically sealed qualified
parts when the qualification level is in line with the quality level defined
by the applicable Tables 7-1, Table 7-2 or Table 7-3 of ECSS-Q-ST-60.
ECSS-Q-ST-60-14_0470064
p. For cable assemblies, electrical test shall be limited to insulation resistance
test.
ECSS-Q-ST-60-14_0470065
q. When relifed, commercial components shall be tested as defined in Table
6-1 providing in addition, the following:
1. the availability of endurance test results on the flight lot,
2. the availability of humidity test results on the flight lot as per ECSS-
Q-ST-60-13, in case of non-hermetic package sensitive to humidity,
3. the availability of a report of DPA performed on 3 pieces for each lot
of commercial components in the frame of the relifing procedure.
ECSS-Q-ST-60-14_0470056
Table 6-1: Control parameters and detailed application of categories for Class 1 and
Class 2 programmes
External SPECIFIC
ELECTRICAL SEAL
Visual
(6.1.1o) (6.1.1e) TESTS
Inspection
sampling
capacitors, chip, ceramic sampling no no
(6.1.1f)
sampling sampling
capacitors, moulded, ceramic no no
(6.1.1g) (6.1.1f, 6.1.1g)
capacitors, glass (CYR, …) 100 % 100 % no no
capacitors, mica (HTxx, …) 100 % 100 % no no
capacitors, chip, solid tantalum yes
sampling 100 % no
(TAJ, T495, CWR11, …) (6.1.1h)
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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External SPECIFIC
ELECTRICAL SEAL
Visual
(6.1.1o) (6.1.1e) TESTS
Inspection
capacitors, leaded, solid tantalum yes
sampling 100 % no
(CSR, …) (6.1.1h)
capacitors, leaded, yes
100 % 100 % no
non solid (tantalum,(CLR79, …) (6.1.1i)
capacitors, film yes
sampling 100 % no
(CRH, CHS, PMxx, MKTS, …) (6.1.1j)
capacitors, variable sampling no no no
connectors, non filtered, rectangular 100 % no 100 % no
connectors, filtered, rectangular 100 % 100 % 100 % no
connectors, non filtered, circular 100 % no 100 % no
connectors, filtered, circular 100 % 100 % 100 % no
contacts, savers & accessories no no no no
crystals 100 % 100 % 100 % no
diodes 100 % sampling 100 % no
diodes, microwave 100 % sampling 100 % no
Filters 100 % 100 % 100 % no
fuses, "cermet" sampling sampling no no
fuses, wire link sampling sampling no no
heaters, flexible 100 % 100 % no no
inductors, coils, moulded sampling sampling no no
inductors, coils, non moulded sampling sampling no no
sampling
integrated circuits 100 % 100 % no
(6.1.1k, 6.1.1l)
sampling
integrated circuits, microwave 100 % 100 % no
(6.1.1l)
µwave passive parts (isolators, circulators) 100 % sampling no no
µwave passive parts
100 % sampling no no
(power dividers, couplers)
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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External SPECIFIC
ELECTRICAL SEAL
Visual
(6.1.1o) (6.1.1e) TESTS
Inspection
resistors, high precision,
sampling 100 % no no
fixed, metal foil (RNC90, ...)
sampling
wires and cables, low frequency no no no
(6.1.1n)
sampling
cables, coaxial, radio frequency no no no
(6.1.1n)
100 %
hybrids 100 % 100 % no
(6.1.1l)
100 %
charge coupled devices 100 % 100 % no
(6.1.1l)
opto discrete devices
(photodiodes, LED, phototransistors, 100 % 100 % 100 % no
optocouplers, …)
100 %
cable assembly 100 % no no
(6.1.1p)
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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6.1.2 <<deleted>>
a. <<deleted, modified and moved to 6.1.1e>>
b. <<deleted and moved to 6.1.1f>>
c. <<deleted, modified and moved to 6.1.1g>>
d. <<deleted, modified and moved to 6.1.1h>>
e. <<deleted and moved to 6.1.1j>>
f. <<deleted, modified and moved to 6.1.1k>>
g. <<deleted, modified and moved to 6.1.1l>>
h. <<deleted, modified and moved to 6.1.1m>>
i. <<deleted, modified and moved to 6.1.1n>>
j. <<deleted, modified and moved to 6.1.1o>>
ECSS-Q-ST-60-14_0470032
a. A subset of DC parameters as given in the table of room temperature
electrical measurements of the relevant procurement specification, ESCC or
equivalent, shall be selected, submitted for customer approval on request
and then measured.
NOTE 1 It is important to pay attention to the test and set up
procedures which can have changed since the initial
date code.
NOTE 2 Additional burn-in and drift calculation to be
performed only when specified in Table 6-1.
ECSS-Q-ST-60-14_0470033
a. In case of doubt or anomaly regarding any surface of the leads, one part
shall be sampled in order to make a solderability test according to the
applicable test method.
ECSS-Q-ST-60-14_0470034
b. The solderability test results shall be recorded in the relifing report.
ECSS-Q-ST-60-14_0470035
c. The part tested for solderability shall be considered destroyed.
ECSS-Q-ST-60-14_0470066
d. External Visual Inspection shall be done in accordance with applicable
procurement specifications.
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ECSS-Q-ST-60-14_0470036
a. The sealing tests shall be recorded as "pass" where the results meet the
requirements of the original procurement specification
NOTE Sealing tests include fine leaks or gross leaks or
both, depending on the applicable specification.
ECSS-Q-ST-60-14_0470037
b. The measurement values of leaks on non-conforming components shall be
recorded in the relifing report.
6.2 Nonconformance
ECSS-Q-ST-60-14_0470038
a. ECSS-Q-ST-10-09 shall apply for the handling and processing of
nonconformances.
NOTE The processing of nonconformances is identical
for both relifing and normal procurement
procedures.
ECSS-Q-ST-60-14_0470039
b. Any components not satisfying at least one of the requirements included in
this standard shall be considered as not conform.
ECSS-Q-ST-60-14_0470040
c. When performing the sampling test, as per Table 6-1, any batch of
components failing the sampling rule defined in requirement 6.1.1c shall
be considered as not conform.
ECSS-Q-ST-60-14_0470041
d. <<deleted>>
ECSS-Q-ST-60-14_0470042
e. In the case specified in 6.2c, the test shall be repeated on a 100% basis on
the whole lot and the causes of the nonconformance investigated and
recorded in the relifing report.
ECSS-Q-ST-60-14_0470043
f. In case of 100% test, as per Table 6-1, any batch of components shall be
declared as not conform when failing the following requirement:
(a) lot size < 100 parts : 0 defect allowed
(b) lot size > 100 parts : 1 defect allowed
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ECSS-Q-ST-60-14_0470045
b. This date code shall be assigned independent of the report conclusions.
ECSS-Q-ST-60-14_0470046
c. The relifing date code shall not be marked on the component and no other
additional marking added.
ECSS-Q-ST-60-14_0470049
b. The Certificate of Conformity shall be delivered with the components.
ECSS-Q-ST-60-14_0470050
c. Discarded batches shall be processed internally by the relevant reject
system of the supplier.
ECSS-Q-ST-60-14_0470067
d. The relifing NCR, if any, signed and dated by the supplier, shall be
delivered with the components.
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7
Control parameters for Class 3 programmes
ECSS-Q-ST-60-14_0470068
a. For relifing, the following tests, as specified in Table 7-1 shall be
performed:
1. External Visual Inspection
2. Electrical measurements
3. Specific test
NOTE The relifing procedure can be applied on a sub-lot
containing only the quantity of components
immediately needed for production. In this case, the
relifing date-code is applicable only to parts actually
tested. The time limits specified in Table 5-1 remain
applicable for the residual sub-lot.
ECSS-Q-ST-60-14_0470069
b. When sampling is specified in Table 7-1, it shall be performed in
accordance with AQL 0,65 % level II according to ANSI ASQ Z1.4.
ECSS-Q-ST-60-14_0470070
c. The relifing requirements defined in Table 7-1 shall apply to Class 3
programmes.
NOTE Components that are not listed in the Table 7-1 are
not subject to relifing.
ECSS-Q-ST-60-14_0470071
d. The specifications and methods to be used during relifing shall be those
that were in effect for the initial procurement or, if demonstrated that they
are not applicable, the most recent updated issues.
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ECSS-Q-ST-60-14_0470072
e. For all type of solid tantalum capacitors, the following specific tests shall
be performed before the parametrical measurement:
1. Apply 9 discharges and 8 charges with a cycle time of 2 seconds and
under nominal voltage and monitor the current during both charge
and discharge tests to detect short circuit.
2. Perform a burn-in test for a duration of 96 hours, at rated voltage, at
85 °C.
ECSS-Q-ST-60-14_0470073
f. For all type of non-solid tantalum capacitors, the following specific tests
shall be performed before the parametrical measurement:
1. Perform a burn-in test for a duration of 96 hours, at rated voltage, at
85 °C.
ECSS-Q-ST-60-14_0470074
g. For hybrids and commercial active parts, when electrical test is not
practicable because of test program or product complexity, the validation
may be transferred to use step such as functional test or programming
stage.
ECSS-Q-ST-60-14_0470075
h. When relifed, commercial components shall be tested as defined in Table
7-1, providing in addition the following:
1. the availability of lifetest test results on the flight lot,
2. the availability of humidity test results on the flight lot as per ECSS-
Q-ST-60-13, in the case of non-hermetic package sensitive to
humidity,
3. a DPA is performed on 3 pieces for each lot of commercial
components in the frame of the relifing procedure.
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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ECSS-Q-ST-60-14_0470076
Table 7-1: Control parameters and detailed application of categories for Class 3
programmes
External SPECIFIC
Component family Visual ELECTRICAL
Inspection TESTS
sampling
commercial active components 100% No
(see 7.1.1g)
ECSS-Q-ST-60-14_0470077
a. A subset of DC parameters, as given in the Table of room temperature
electrical measurements of the relevant procurement specification, ESCC or
equivalent, shall be selected, submitted to customer’s approval and then
measured.
NOTE 1 It is important to pay attention to the test and set up
procedures which can have changed since the initial
date code.
NOTE 2 Additional burn-in to be performed only when
specified inTable 7-1.
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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ECSS-Q-ST-60-14_0470078
a. In case of doubt or anomaly regarding any surface of the leads, one part
shall be sampled in order to make a solderability test according to the
applicable test method.
ECSS-Q-ST-60-14_0470079
b. The solderability test results shall be recorded in the relifing report.
ECSS-Q-ST-60-14_0470080
c. The part tested for solderability shall be considered destroyed.
ECSS-Q-ST-60-14_0470081
d. In case of doubt or anomaly in the integrity of the glass sealing, parts shall
be submitted to seal test according to the applicable test method.
7.2 Nonconformance
ECSS-Q-ST-60-14_0470082
a. ECSS-Q-ST-10-09 shall apply for the handling and processing of
nonconformances.
NOTE The processing of nonconformances is identical for
both relifing and normal procurement procedures.
ECSS-Q-ST-60-14_0470083
b. Any components that are not in compliance at least with one of the
requirements of ECSS-Q-ST-10-09 shall be declared as not conform.
ECSS-Q-ST-60-14_0470084
c. When performing the sampling test, as per Table 7-1, any batch of
components failing the sampling rule defined in requirement 7.1.1b shall
be considered as not conform.
ECSS-Q-ST-60-14_0470085
d. In the case specified in 7.2c, the test shall be repeated on a 100 % basis on
the whole lot and the causes of the nonconformance investigated and
recorded in the relifing report.
ECSS-Q-ST-60-14_0470086
e. In case of 100 % test, as per Table 7-1, any batch of components shall be
declared as not conform when failing the following “pass” conditions:
1. lot size < 100 parts: 0 defect allowed
2. lot size > 100 parts: 1 defect allowed
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ECSS-Q-ST-60-14_0470088
b. The relifing date code shall be assigned independent of the report
conclusions.
ECSS-Q-ST-60-14_0470089
c. The relifing date code shall not be marked on the component and no other
additional marking added.
ECSS-Q-ST-60-14_0470092
b. The Certificate of Conformity shall be attached with the components
during their delivery.
ECSS-Q-ST-60-14_0470093
c. Discarded batches shall be processed internally by the relevant reject
system of the supplier.
ECSS-Q-ST-60-14_0470094
d. The relifing NCR, if any, signed and dated by the supplier, shall be
delivered with the components.
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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Annex A (normative)
<<deleted and recreated as informative
Annex C>>
A.1 <<deleted>>
A.1.1 <<deleted>>
A.1.2 <<deleted>>
A.2 <<deleted>>
A.2.1 <<deleted>>
ECSS-Q-ST-60-14_0470051
a. <<deleted>>
ECSS-Q-ST-60-14_0470052
b. <<deleted>>
ECSS-Q-ST-60-14_0470053
c. <<deleted>>
ECSS-Q-ST-60-14_0470054
d. <<deleted>>
A.2.2 <<deleted>>
Annex B
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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Annex B (informative)
<<deleted>
Annex C
Annex C
Annex C
Annex C
34
ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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Annex C (informative)
Guidelines for a Relifing report
35
ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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Part Style:
Detailed specification: Issue: Var:
Item identification at User:
Quantity Stored: Date code: Date of Storage:
TESTS RELIFING
1. External visual
Operator
Date
Quantity tested
Quantity rejected
Comments
2. Electrical tests
Operator
Date
Quantity tested
Quantity rejected
Comments
3. Hermeticity
Operator
Date
Quantity tested
Quantity rejected
Comments
4. DPA (if any)
Operator
Date
Quantity tested
Results
DPA Report number
5. Other tests
Conclusion:
Accepted / Rejected
New date code
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ECSS-Q-ST-60-14C Rev. 1 Corrigendum 1
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Bibliography
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