Sched Day 3
Sched Day 3
Parallel - 2
18-May 10:50 - 12:35 Advanced Techniques - 4
10:50 - 11:15 Abhinandan Gangopadhyay, IIT Bombay Characterization of interfacial defects in MBE-grown
GaAs(001)-based heterostructures using transmission electron microscopy
11:15 - 11:35 Jiří Dluhoš LabIndia, Multimodal Characterization of Energy Materials using TESCAN Plasma FIB-SEM
with integrated ToF-SIMS
11:35 - 11:55 Nitish Bibhanshu, IIT Ropar The role of in-situ orientation imaging in the identification of deformation
mechanisms
11:55 - 12:15 Abhishek Tripathi, MNIT Jaipur Limits of Physical Lateral Resolution of Electron Backscatter Diffraction
(EBSD) Technique
12:15 - 12:35 Bhagyaraj Jayabalan, Tata Steel Jamshedpur Application of correlative electron microscopy for the
study of metallurgical phenomenon in advanced high strength steels (AHSS)
Parallel - 3
10:50 - 12:40 2D layered / thin films / Nano Technology
10:50 - 11:15 Jyoti Ranjan Mohanty, IIT Hyderabad Exploring functional magnetic thin film with correlated microscopy
and multiscale modeling
11:15 - 11:35 Kartik Senapati, NISER Bhubhneshwar Fabrication of nanoscale Josephson junctions using Gallium
Focused Ion Beam (FIB) patterning techniques
11:35 - 11:55 Ahin Roy IIT Kgp Structure-Property Correlation in Functional Oxides from Atomic-scale Electron
Microscopy & Synergistic Simulations
11:55 - 12:10 Manish K Singh Univ. Allahabad Formation and Dynamics of Iron germanide Nanowires on Ge (110)
using in situ UHV TEM
12:10 - 12:25 Indra Sulania, IUAC, New Delhi, Tetrapods based composite electrodes for environmental monitoring
12:25 - 12:40 Madhumita Roy, CSIR AMPRI Bhopal Intelligent Wearable Nano Sweat Detector platform
Parallel - 5
10:50 -12:40 Advanced Materials and Techniques - 1
10:50 - 11:15 Debalay Chakrabarti, IIT Kgp Fractography
11:15 - 11:35 Shashank Shekhar, IIT Kanpur Exploring Deformation Mechanisms in Si-Stainless-Steel utilizing in-situ
tensile tests in SEM
11:35 - 11:55 Nicholas Randall, Alemnis Switzerland In situ Extreme Micromechanics – Recent Innovations and
Prospects
11:55 - 12:10 Satanand Mishra, CSIR- AMPRI, Bhopal Discovering Patterns on Electron Microscopic Images using
Machine Learning Techniques
12:10 - 12:25 Alphy George, IGCAR Atomic insight into stacking fault in non-close packed system, WC simple
hexagonal with pentahedron voids
12:25 - 12:40 Ameer Suhail M, IIT Guwahati Multiscale Microscopic Characterization of a Scalable Optofluidic
Microreactor System for Photocatalytic Hydrogen Production Using CoOx-Ag Loaded Mo-BiVO4 and
Rh&Cr2O3 Loaded gC3N4 Nanosheets
14:45 - 15:05 Indrani Sen, IIT Kgp, Understanding the microstructural evolution and deformation behavior in
aerospace-grade metallic materials using electron microscopy techniques
15:05 - 15:20 Swayamprakash Biswal, IIT Delhi Effect of Electronic Modulation through Single Atomic Stabilization: An
Iridium Single Atom Catalyst for Oxygen Evolution Reaction
15:20 - 15:35 Vignesh Viswanathan, Raith India, Focused ion beams from Liquid Metal Alloy Ion Sources (LMAIS) for
nanofabrication, ion imaging and SIMS nano-analytics
15:35 - 15:50 Manish Chandra, IGCAR, Microscopic analysis of uranium electro-deposits for pyro-chemical
reprocessing of metallic fuel
Parallel - 6
10:50 -12:45 Advanced Materials Processing
10:50 - 11:15 Arijit Laik, BARC Mumbai, Role of Interfacial Microstructure in Joining of Dissimilar Materials
11:15 - 11:35 Abhay Gautam, IIT Gandhinagar, Development of core-shell precipitates in ternary Al alloys
11:35 - 11:55 Vijay Devidas Hiwarkar, DIAT, Pune, Effect of heat treatment on microstructure and hardness of
additively manufactured Ti6Al4V alloy
11:55 - 12:15 Suresh K.S, IIT Roorkee, Contrasting deformation effects on the thermal stability of microstructures in
severe plastically deformed Al powder compacts
12:15 - 12:30 Akshat Godha, IISc Bangalore, Investigation of secondary hardening mechanism in MP35N multi-
component alloys
12:30 - 12:45 Sushmitha H, HASETRI, Mysuru, Study of chemical Staining in Rubber Composites: Microstructural
Insights and morphological Characterization