Bec301 Electronic Devices
Bec301 Electronic Devices
BTECH
(SEM III) THEORY EXAMINATION 2023-24
ELECTRONIC DEVICES
TIME: 3HRS M.MARKS: 70
Note: Attempt all Sections. If require any missing data, then choose suitably.
SECTION A
2
b. Illustrate Intrinsic and Extrinsic Semiconductor in detail. 7
13
c. Explain the small signal model of PN-Junction Diode 7
_2
2.
d. Describe stability factor and explain how it affect the transistor biasing. 7
P2
24
e. Explain the C-V Characteristic of MOS Transistor. 7
4D
5.
SECTION C
.5
P2
|1
qualitatively and more rigorously from the results of using the Kronig–Penney model.
2
a. Define the term Doping. Explain the effect of Impurity on energy band gap Diagram 7
in detail.
13
b. Using the concept of drift and diffusion of carriers, derive the continuity equation. 7
4
b. Name the different biasing schemes used transistor biasing. Explain voltage divider 7
biasing in detail.
7. Attempt any one part of the following:
a. Explain various biasing schemes for JFET. 7
b. Explain Enhancement P channel MOSFET in detail. Draw and elaborate the drain 7
Characteristic
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