ENGINEERING PHYSICS Way Interference: Introduction- Principle of superposition Interference of light —Conditions for sustained Interference-Interference in thin films (Reflection Geometry) & applications - Colors in thin films- Newton's Rings- Determination of wavelength and reffactive index. Introductoin: Particle nature of light: 1.lt capt be explained by Sir.Isaac Newton in 17 century. (England). L 2,This theory can explains reflection and refraction. Wave nature of light: 1, It can be explained by Chistian Huygen’s in 1678 (Dutch). 2.This theory can explains wave nature of light interference, diffraction and polarization. Principle of Superposition of waves: When two or more waves reach a point in space simultaneously, the resultant displacement at that point at eny instant of time is the algebraic sum of the displacements Produced by the individual waves. This is known as the principle of superposition. Tf ys and ya are the displacements at a given point due two waves, then the net displacementis given by y=y1+y2 Here + ve sign has to be taken when both the displacements yi and y2 are in the same direction (or) both the waves are ‘phase in’’as shown in fig(a). Similarly -ve sign has to be taken when both the displacements y1 and yz are in the opposite direction (or) both the waves are‘ phase out? as shown in fig(b). Interference of light: Thomas young-1801 MA )\ WW. a Ms Fia(b): Waves out of phase Fig(al: Waves In Phase The variation in intensity in the region of superposition of two or more waves of same frequency, whose phase relationship does not change with time, then that phenomenon is known as, Interference. (or) ‘Superposition of two coherent waves is known as interference. (or) ‘When two light waves superimpose, then the resultant amplitude of intensity in the region off superposition is different than the amplitude of individual waves. This modification in the distribution of intensity in the region of superposition is called interference, Ex.1.soap bubbles, 2.flowting of oil, 3.butterfly wings, 4.rainbow etc,. The main principle of Interference is Superposition of waves. Interference is classified into two types. © scanned with OKEN Scanner|.Constructive interference 2.Destructive interference. LConstructive Interference: een the relat amplitude is the sum of the amplitudes of two individual light ‘waves then the interference is constructive, (or) If the two waves reach the point ‘In Phase’ (or) with zero phase difference then Fa inertrence is constructive as shown in lela): conseruevanterteranca g(a). For constructive the resultant displacement y=yi+ ya 2Destructive Interference: TF the resultant amplitude is equal to the difference of amplitudes of two individual ‘waves then the interference is destructive, . (or) Ifthe two waves reach the point with phase difference of ‘n" radions or 180? then the imerference is destructive as shown in fig(b) & & fig(c). For destructive the resultant displacement y= yi-y2 a Yt : alc): Detrctvetaeance, Wavarhaing aga anpitcr 2 + Conditions for interference: Sonditions for interference: 1 ng ie bH0 light souroes emiting light ‘Waves having unequal amplitude: ‘Waves should be coherent. ‘The two sources must emit continuous light waves of sum wavelengths and frequency. ‘The separation between the two sources should be small, Flg(b): estructive nterferanc, ‘The distance besween the two soures and soreen should be large, To View interference fringes the background shouldbe dark, ‘The amplitudes ofthe light waves should be equal or nearly equal, The two light sources should be natrow i, small, ‘The two light sources must be monochromatio, SN Dw A wp © scanned with OKEN Scanneron ah Principle: Division of amplitude. eho ey Ka-ftec than — oS {nterference of light in thin films ean be explained by allowing monochromatic light of wavelength 1a" to fallon a thin film of shown in the fig. A Monochromatic light ray reffactive index(y) 1 (thin film thickness Suppose a ray AB of ‘partly reflected along BE and refta CD, After refraction at D the ray fin In fig. DF is parallel difference bet hickness * 1" and refractive index “y" og oy Cc Interference in thin film by reflection ‘monochromatic light incident on its upper surface, This ray is icted along BC, After one reflecti ion at C, we obtain the ray ally emeries out along DP in air.; se BE. Now draw a normal DG on BE. 80 the effective path DF is given by 5= 4 (BC+ CD) in flm—BG in air ..(1) But Pane oss. 8) From fig. BD = Ptanr +t tanr (from (3)) ta (4) int=22 Be From ABDG, sini = #2 = 20 (from (4)) 2 BG = 2etanr sini. u..(5) By the Snell's law is y= S04 the Snell's law is y= SRL sini = sine w...(6) ‘Then eq. (5) becomes BG = 2¢tanr xsinr (From (6)) BG = 2) 6 str 2ut sin’, Be ear) ‘Now substituting eq. (2) and (7) in (1) we get path difference = ik i “| 2ut sin?r ost" cosr] cost 2ut — 2ytsin® Path difference = 2Ht _ 2utsin?r cost” cosr Qut 5 Path difference = <2 [1 — sintr] path 2 difference. = 2 cost © scanned with OKEN Scanner@ path difference = 2p1t cost « a But we know that the reflected ray suffers a path difference is sum of 3. —---(9) a total path difference = 2ut cost +2 — Conditions: Lovight fringe: total path dif ference=n2 ayccosr stent 2utcosr = (2n—1)2-—-(10) Wheren= 1,2,3.,, 2dark fringe + total path difference = (2n+ 1)2 2utcosr +2 = (2n+1)3 \ Where n= 0.1,23... (11) 2ytcosr = nd Colors in thin films: Depending on the above conditions the interference pattern consists of bright and dark fringes. When a thin film is exposed to white light from an extended source, it shows beautiful colors in the reflected system, Light is reflected from the top and bottom surfaces of @ thin film and the reflected rays interfere. ‘The path difference between the interfering rays depends on the thickness.of the film ‘t’ and the angle of reftaction “r' and hence on the inclination of the incident ray. 2pt Cosr= nd, Where 1 = refractive index of thin film tis the thickness of the thin film ris angle of refraction nis.a whole number>0 2a is the wavelength in the medium. White light consists of a continuous range of wavelengths, At a particular point of the film and for a particular position of the eye ({,e:t and r constant) those wavelengths of incident light that satisfy the condition for the constructive interference in the reflected system will be seen in reflected light. The coloration will vary with the thickness of the film and inclination of the ray With the position of the eye with respect to the film).Hence if the same point of the film is observed with an eye in different positions or different points of the film are observed with the eye in the same position, a different set of colors is observed each time. e. © scanned with OKEN ScannerPaddolens, 1A thin film of soap solution is illuminated by white light at a i 1/5). In the reflected light, two dark consecutive overlnppiog hinges wececred corresponding to wavelengths 6.1 x 1077 m and 6.0 x 10° m. The refractive index for soa solution is 4/3. Cateulate the thickness of the film. a Given, = 4/3, d1 = 6.1 x 107 m da = 6.0 x 107 m solution: Sini= 4/5 u=Sini/Sinr Sinr=sini/w=%/423 ssinr=%=0.6 cos r= Vi ~sin’r=0.8 Given two consecutive fringes are overlapping, ph =(a+ 1a =nki-na =a == Aa/ Ay —2a= 6.0.x 107/ 6.1 x 1076.0 x 107 =60 Now, 2pt Cos r=nhi tn /2u Cosr= 60x 6.1 x 107/2 x (4/3) x 0.8 t= 172x108 m=1.72x 10? mm 2. A soap film of refractive index 1.33 is illuminated by the light of wavelength at an angle of 45 degrees. There is complete destructive interference. For, find the thickness ofthe film. Given = 1.33, i= 45°, Solutic H=Sini/ Sinr=sini/ Sin r=0,5317 cos r= VI —sin’r= 0.8496 For destructive interference 2pt Cos r=n- 2x 1.33 xt x 0,8469=1 x 5890 x 10" A 5890 x 10" /2 x 1.33 xtx 0.8469 2.61410 mm i : : 3. Therefractive index of the thin soap film of uniform thickness is 1.4. Find the smallest thickness of the film that gives on the inteference maximum in the reflected light of wavelength 5460 amstrong fall at normal incidence. Solutio Maximu 2pteosr=Q2n- 1) = Refiactive index of the film relative tothe surrounding t= Thickness of film and r= Angle of refraction For normal incidence, =0 2teosr=2n-AE ,2=0,1,2 For minimum thickness, 2nin tin = ttn 975, rm avi ings (or) Circular Rings in 45 /1.33=1 2/133 im interference in the reflected light, in case of thin-film interference, expressed as, © scanned with OKEN Scanner{ i Mewtoae’ $ Riss Cor) Principle: Division of amplitude 7 igxneri angement of Newton’s rings: H ’ r Lesa Ae fee ‘with its convex surface isplced ons glass alate, shot . i i i ed betwoon the lens The dually increasing thickness is form : cf Ft erm atthe point of eontact Is zero, The experimental arrangement of pbtsining Newton's tings is shawn in the fig ()- | i FA es Tz having ads of curvature which spaced on = plane glass plate P with its convex surface. So the lens makes contac the point 0° wit te ans, Now 2 \ i s in Tight from the monochromatic source falls on a glass plate G which is ind gle « eth vertical So the gless plate G reflects normally, a part of incident light towards the air film enclosed by the lens and the plane glass plate P. M | Travelling microscope Monochromatic aS Light source 33 r a $ G: glass plate C) ) ea Air film Liplano convex lens t 1. PePlane glass plate fig (i) Experimental arrangement of Newton’s rings ‘Now a part of the incident light is reflected by the curved surface of the lens and a part transmitted which is reflected back from the plane surface of the plate. These two reflected rays interfere and give rise to an interference pattern in the form of circular rings which are observed through a microscope. (ii) Explanation of Newton’s rings: + A ray) ray? fig (ii) Explanation of Newton's rings In above fig (i), AB is a monochromatic ray of light which falls on the system, a part of light is ceflected at C which goes in the form of ray I without any phase change (or) path difference, The other part is transmitted along CD and at point D it is again reflected and goes out in the form of ray 2 with a phase change r (or) path difference 3, “The reflected rays | and 2 produce interference, Thus the interference pallern is due to the reflected light rays, Hence the path difference = 2yt cor r+ 2—--(1) For normal incidence r=0 and w= | for ait. Therefore path difference = 2t-+ 4... (2) © scanned with OKEN Scanner1.The condition for maximum intensity is na = 2t + 3 2t= (2n—1)4 2. The condition for minimum intensity is (2n + 1) 2t=nda shere n=O, ii). Theory of Ne in (or) where n=0,1,2,3...., Diameters of bright and dark ring conditions: Let be the planoconvex lens placed on a glass plate AB, Let R be the radius of curvature and t be the radius of Newton rings corresponding to the constant film of thickness't’ as shown in the fg. (i). R L + Bi Aytl P ° fg (ii). Theory of Newton Rings From the property of circle, we have NAX NB = ON X ND rxr=tx(OD-ON) 1 xXT=tx (OC+CD-ON) rxr =tx (RHR) rxrs tx(@R-2) r=2Rtt? Since ‘tis very small, t? can be neglected. BRE TP (1) Let Da be the diameter of ring. Then - 1. Bright ring condition: 2t = (2n - 1)2 Then eq. (2) becomes (2n—1)3 = 22 Dm? = 228 (2n~1) Dm? = 4maR——-—-(3) Dm = V2aRVin—-1 Dmavin=1 ... (4) Thus the diameters of bright rings ate directly proportional to the square root of odd numbers. 2. Dark ring condition: we have 2t =n n=0,1,2,3......+4 Then eq. (4) becomes nt = 2 Dn? = 4nAR © Dn = VavaRA ie, Dnayn. (6) ‘Thus the diameter ofthe dak rings i diretly proportional fo the square root of natural numbers. © scanned with OKEN Scannertion of wavelength of monochromatic light (Sodinm light) using Newton, jv) Detormina Let R be the radins of curvature of Plano convex lens and 2. be the wavelength of light used Let Dy and Dy be the diameters of mand n™ dark rings respectively. el QQ) @ we have Da = 4maR Dg = 4naR ‘Now subtracting eq. (1) & (2) we get D4, — Dz = 44R(n ~ 1) DR DE -@) Anim) Using this formula 2.can be calculated. Now a graph is plotted by taking number of rings ‘n’ on \ ht line as xeaxis and square of the corresponding diameters (D?) on y-axis, which is @ st shown in the fig. y —+ Number of rings (v) Determination of refractive index of a liquid (1): The experimental is performed when there is an air film between the glass plate and the Plan convex lens. The diameters of m‘*and ni dark rings are determined with the help of a travelling microscope, Thus, we have DZ — D3 = 4R(m— AYA sao vee (1) ‘Now the system is placed in a container consists of a liquid of refractive index jz which is to be determined. So the air film is replaced by the liquid film. Again, the diameters of the same mand nt dark rings are to be obtained, Then we have DB pp = See) From equations (11) and (12) we have Dix dk _ 4RGm=n)A _ Die DE De=pe .@) Using the above formula, the refractive index of a liquid ‘y’ can be calculated. Applications of Interference: 1). TO determine the adelante dy av menocksrmatt dys « ay. TO detetning the thickness dy haw “oh 3) TO DRA INNe tre AefRAcveorlen of ACiguid of GAS fy. To dekeyming te nestles Ops ctunlmre tye Pere S) To tk he Ptaknend of SUuaPrcer » GTO ek ttre Aatleckiviiy, OF eugefaced prising « ey Lens ond © scanned with OKEN Scannera Types of diffraction a Di fraction:Introduction-Fresnel and Fraunhofer diffractions- single slit, double slit & N-slits (Qualitative) — Diffeetin Grating peal power a resolving power of Grating (Qualitative)- Engineering applications of difftacten PON S4 Introduction : The wave nature of light is first confirmed by the phenomenon of interference. Further itis confirmed by the phenomenon of diffraction. The weed -dittaction” derived from the Latin word diffrneuts which means break to plece, ami Definition: The bending of light rays in to the shadow region of an obstacle, whose comparable with the wavelength of incident light rays is known as diffraction Te was first observed by Gremaldy, t Diffraction can be divided into two types. i, Fresnel’s diffraction. ii.Fraunhofer diffraction, Ie 1. The light source and the screen are placed at finite distance of an obstacle. 2cIn this case of no lenses are used. 3. The propagation of light source. The incident wave front is either spherical (or) cylindrical, Fraunhofer diffriiction: L-The light source and screen are placed at infinite distance of an obstacle. 2uln the case of Tenses are used 3.Any direction of light source. 4. In this case the wave front is plane. Distinction between Fresnel diffraction and Fraunhofer diffraction: : ‘Fraunhofer diffraction Fresnel diffraction. @ Either a point source (or) an illuminated | (i) Extended source at infinite distance Ts used. aartow slit is used. (ii) The source and the screen are at infinite (ii) The source and the screen are at finite distances. distances. ii) No lenses are necessary to study the (ii) Converging lenses are used to study the diffraction, diffraction, (iv) Study of the diffraction is complicated. _| (iv) Study of the diffraction is easy. ; (¥) Diffraction can be studied only in the (v) Diffraction can be'studied in any di : rection of propagation of light. of propagation of light, (vi) The wave front is either spherical (or) (vi) The wave front is a plane, cylindrical. Distinction between interference and diffraction: Interference Difiraction (@ The bending of light wavesin the shadow @ The variation in intensity in the region of superposition of two or more waves of same frequency, whose phase relation ship does not change with time is Interference, (ii) It is formed due to superposition of two : different wave fronts originating from two | — secondary wavelets originating from ‘coherent sources. different parts of the same wave front. (iii) Interference bands are of equal width. | (ii) Diffraction bands decrease in their widths as the order increases. (iv) All the bright fringes are of the same (jv) The intensity of bright fringes usually intensity. decreases with increase of order. (iv) The intensity of dark fringes is not zero. ‘region of an obstacle, whose size is comparable with the wavelength of light vwaves is Diffraction, (ii) Itis formed due to Superposition of (iv) Alll the dark fringes have zero intensity. © scanned with OKEN ScannerRe Fraunhofer diffraction due to a single slit: P, (rninimumy (maximum) Light source—| uw Screen * Plane ste Lens wavefront Fig(a);Fraunhofer diffraction - Single slit Let AB be a narrow slit of width ‘e’ through which a plane wave front of monochromatic, light of wave length propagates normally. Let the diffracted light be focused by using # convex ens on a screen as shown in the fig. Then according to Huygens’s principle, every point of the wave front in the plane of slit produce the secondary wave lets. The wavelets travelling normal to the slit are focus at P, while travelling at an angle 6 with normal is focus at P: on the screen. ‘The intensity of point P1 is maximum (or) minimum depending up on the path difference between the secondary wavelets. In order to find out the intensity at P1, draw a perpendicular line AC from A to the light ray at B, 7 ‘Now from AABC, Path difference BC = AB Sind = esind.. () Phase difference =: = x path difference 6 =x BC 8 af x esind. (2) Let the total width of the slit is divided into ‘n’ equal parts and the amplitude of'the wave from each part is ‘a’. Then width of each part will be =. Hence, the phase difference between any two successive waves is 2cTotal phase) = 3 (2% esin 6) =d(say) Now the resultant amplitude R is given by sin(™?) __ sin(Zesing) n= a G@l- : a(Eeesine aint Put 2 esin@ = a,then R R (‘a is very large sin (2) = (£)) R —o Hence the resultant intensity at P) is given by 2 p= R= ASS —_(d) © scanned with OKEN Scannerintnlemaxina _ ‘The resultant amplitude R can be written in powers of a as eas a? e-f48-24 4] b- $4 5-74 ~-] “T wil be maximum, When the value of Ris maximum. ie Ris maximum when @ Then Imax =R?= A? ~ (5) ie Fe sin=0 Sind 0 oo? — (6) Hence, the secondary wavelets that travel normal to the slit ean produce maximum amplitude known as principal maximum. inimum intensi The intensi a= t mt Int 3r... ie Ze sin e sind -() Where n= 1, 2,3 . The value of n e because for this value @ = 0 which comesponds o principal ‘maximum, In this way we obtain the points of minimum intensity on either side of the principal maximum. 3.Secondary maxit In between equally spaced minima, weak secondary maxima ae found. The positions of secondary maxims ean be obtained by differentiating the 9,2) with ‘a’ and equating ro ze. a_i (sin a?) a-ale 3) fez (acum In the above eq. either sina = 0 (or) acosa—sina=0. sina = 0, gives positions of ‘minima. Hence the positions of secondary inaxima are given by acosa—sina=0 a=tana- (8) ‘The value of a that satisfy the above eq. can be obtained by plotting y= @ &y = tana curves on the same graph, The points of interaction of two curves gives the value of ‘a’ which satisfy the above eq. Fig): Y=a and y=tana graph © scanned with OKEN Scanner- gives the Valucsopg = yan 450 ‘The points of intersection of two curves are a=0,F yk) £7 : tana. The value a = 0 always corresponds to central maximd and the which satisfies remaining values gives the positions of secondary maxima. ity distribution (or) tant intensity: 4.Intensity dis nition (or) resultant nten 7 meetthe variation of intensity” I’ with ‘a is shown in the below fig. Fig(¢): Graph between a and I i Fora=0,+= (Principal maxima) i Fora=+55, (1* secondary maxima) | Fora=t 5 (2 secondary maxima) ....and soon i From the above values, we come to know that most of the incident light is found in the principal maxima. . i From the graph, we say that, the principal maxima occurs at the center of diffraction i Pattern and the subsidiary maxima of decreasing intensity on both sides of principal maxima, The secondery maxima are not exactly at the central of minima but slightly towerds thé centre of the diffraction pattern, © scanned with OKEN Scannerow Eraunhofer diffrnetion due to double slit fentt 8S consider two parallel slits AB and CD of equal width ‘e" and separated by Cette distance'd'. Then the distance between the two eenisl points S; and S: of two slits is (© +4) which is shown in the fig. y vw! oo a Ww Tae e Plane, wave front of monochromatic light of wavelength propagates normally froueh the two slits, Then the diffracted light is focused by using vosee lens on a screen. The Finges iiited on a screen is due difaction by a single slit on which « system of interference Gunes super imposed i.e, the diffraction pattem by a doable at te the combination of difftaction as well as interference, teperding to Buygen’s theory, the secondary wavelets travelling nommal to are focus at Po, while travelling at an angle 9 with nocmal to sit are foows ot Poe the sereen, From the theory of diffraction at a single slit, the resultant amplitude R = Ane Zesin8 &A=na, Thus the two slits sending the wave lets of amplitude “©24 in a direction 6, ‘Therefore, the path difference between the secondary wavelets from Si and Szia the direction is given by SK =(e+d)siné (From AS,S2K, sin@ = sa” fena ) + phase difference 6 = 2 x path difference (SK) = Be+a)sing. wm By using the vector addition method, the resultant amplitude atP onthe sereen is the resultant of interference between the two waves of amplitude Ane ‘and phase difference 8, is given by - PSs OST pee = fa +1+20086) = site 1 + 0088) = that oac2 Ee+asin 8] (From (1)) = Matte costp where p= (e +d) sind, i + The resultant intensity at P is given by I = sae cost @) © scanned with OKEN Scanner\*, Lprinciple maxima and minima positions: ae in gives the central maxima in the direction a = 0 (or) 0 = q The diffracted term = \hich corresponds to the point Ps on the sereen. 7 Positions of minima and maxima intensities: The central maximum has an alternate minima and secondary maxima of diminis| ng intensity on either side which is shown in the fig (i). * ns given by sina = 0 = sinma 9% a= dm (or) £ (e+d)sing= tmz “esin@ = +mdwherem= 1,2,3 sow Now the interference term cos? gives a set of equidistant dark and bright fringes which are shown in fig (ii). : cos?B, Y t 3x 2 nr oO & 2n 3x x fig (i) interference—> B ‘Thus the minima are obtained in the direction given by ¢os*B =1 (or) cos f = 0 = cos(2n+ nF @ B= £2n+1)F (or) = (e+d)sind= + (2n+ 1} where Similarly, the maxima ate obtained in the direction given by cos®B = 1 (or)cos, 01,2. ° 2lntensit The resultant intensity distribution of the diffraction pattern is shown in fg (i fig) cur © scanned with OKEN Scannerif Hraunlofer diffraction due to Grating (N- number of parallel slits):- ee be et tet Ela{ah Fraunhofer diffraction = sitte Consider a grating AB" consisting of N parallel slits with grating element ‘etd’. Let a Plane wave front ‘WW" of monochromatic ight of wave length 2. be inetdene normally on the rating. The diffracted light trough the N parallel slit is focused by means ofa cones lens on w sereen placed in the focal plane of the lens, ‘The secondary wavelets travelling normal to the slit (or) along the direction OPo are: brought to focus at Po by the lens. The point Po will be the central maximum. The ‘Secondary ‘Wavelets travelling at an angle @ with the direction of the incident light are focused at a point P; on the screen, Since the grating consists of N parallel sits ftom each slit ight wave emerges and we have N waves through the sls. From the concept of single slit we get N waves cr amplitude - * The path difference between the waves emerging through two successive slits=(etd)sin 8, ‘The corresponding phase difference= 2* (e + d) sind, Le 2 (e+d)sing B =2(e+d)sing From the method of vector additions of amplitudes, the resultant amplitude is given by sing sine Re Ass SNe -B «sing it sina), (sin Resultant Intensity [= R2= (=) (seas —— (1) The factor (“E*)? gives the diffaction effect due to Single slit ond (S242): Lorine omblned effet of interference and diffraction due to al the sits of grating. LPrincipal_maxims Resultant Intensity will be maximum when sinf = 0. ie B= tne But atthe same time sing , then ME becomes indeterminate, Hence ftom ‘L? Hospital's rule, we get ‘tn fy sin ( a lim ‘lag NB praas \snt) Ete Ue aing ten (2 Ncosng lim (2M) 5 (coBNE vin (Gar) = lim, (222) 2,3 © scanned with OKEN ScannerBe » im. € 4 Resultant intensity T= (4%24)2 12 (2) ; ‘The above resultant intensity represents principal maximum and are obtained for B= :t nn, ie F(e+d)sind = tne (e+d)sin@= +n\ Where n=0,1,2,3, a For n= 0 corresponds to zero order principal maximum. For n= 1,2,3, —. We get fitst, second, third, —~ order principal maxima, : ‘The <£ sign shows that thete are two principal maxxima of the same order lying on either si zero order maximum, Principal Mi \ A series of minima occur, when sin NB = 0, but sing #0 For minima sinNg =0 7 ie NB=ing Ni +@)sii@= tne where n=1,23,—— N@+d)sing = +n2 3.Secondary maxima: To find out the positions of secondary maxima, Let us differentiate te intensity ‘qusion with respect to B and then equate it to zero, us at _ a s(Astna, (sing eal) GP) 2 (sae sans essNbsas orp _ 4 To satisfy the above equation either sinNB =0 (or) NcosNB sing —cosf sinNp =0 If sin NB = 0 then we get minima. Hence 0 Nos Nf sin — cos sinNB=0 NcosNB sing = cosf sinNB Ntan = tan NB : The roots of this equation other than those for which f = -tnm(principal maxima) give the positions of secondary maxima. To find out the value of SS¥74 from equation N tan f = tan NB. we make use of the triangle shown in fig(b). IN? +cot” 8. eae NB x ; cot B ‘Fig(b): Schematic representation © scanned with OKEN Scanner+ Ntan# = tang m fnnp= From Fig.(b) t x sin NB = eee stg Nye “an (n?tcot% A)sin= sin yp wt sin? @ NE sin? pcos? sintng ere se Ta aeg * Intensity of secondary maxima In (4228) wos 8) 14+(N?=a) sin Intenaty of secondary anima a er otsecondary maxima(s) Tateosly of principal maxima) T7(WECA) AR ml ASIN increases, the intensity of secondary maxima relative to principal maxima decreases and becomes negligible when N becomes large. Alntensity Distribution: Fig(e) and fig(d) shows the variation of intensity due to the fhctors (22) and (a8) respectively. The resultant intensity is shown in ig(). A2(sinaray? *Fig(@): Intensity vacation due to A°¢ slaalay? 4 AAA ‘Fig(@y Intensity variation due to (sn p/siapy? A Rerattant a AMAA Fia(ey: Reeultant tensity © scanned with OKEN Scanner7 . ino: i game width Distinction tra Toment which consists of a large number of parallel slits of s and separated by equal opaque spaces is known as diffraction grating: Fe ramon ng Traum ¥920), tho gang ennts of «argo nunbes 9 pl wires placed side by side very closely at regular intervals. Now oe fine diamond point. The equidistant parallel lines on a transparent material such as glass 7 ‘a ransparent of light and ruled lines are opaque to light while the space between any two lines ‘ acts as a slit which is shown in the fig. . Ruled tine ' i | (qpsaue) il I | | Wig: Dittkaction Grate Let ‘e" be the width of the slit and ‘d’ be the width of the line. Then ‘etd’ (combined width of a slit and ruled Jine) is known as grating element. IfN is the number of lines per inch on the grating then : N (+d) =1 inch=2.54 em, etde 2 Wy : _.__ When light falls on the grating, the light gets difftacted through each slit. As a result both diffraction and interference of diffracted light forms a diffraction pattern known as diffraction spectrum. Dispersive power and resolving power of Grating: Dispersive power of Grating: ' © scanned with OKEN Scanner. esolvini ‘er of Grating : The separation Of such close objects is termed as resolution, The ability of an optical instrument to form distinctly sc eparate images of two objects very close to each other is called resolving power, © scanned with OKEN ScannerEngineering applications of diffraction: a Lathe waveleridy of monochKornadie Ligne 2) -ThE KPDeEN ES of K- RA ane cleterntined TX x ON + ou wy cutee dy cryin maida, A w. valet, dp sound in GgHids con be entinalzd « Fa) ULwalond seaniany uses ere Pontne Or Abrpracts so ra Sige aud Slope Ar leeks pM ere ty Wwanbedy 4 Con be wants, Important Question: 1) Define interference, Write the conditions for interference, 2) Explain the interference in thin film by reflection? 3) Describe the formation of Newton's rings with necessary theory. 4) Explain the wavelength of light source and refractive index of liquid is determined by forming Newton’s rings? 5) Distinguish between Fresnel and Fraunhofer diffraction, 6) Distinguish between Interference and Diffraction, 7) Describe Fraunhofer diffraction due to single slit? 8) Describe Fraunhofer diffraction due to double slit. 9) Describe Fraunhofer diffraction due to N-no.of slits. 10) Explin diffraction grating and grating spectrum. 20 Mise; fag \ : Atak PrebeseR Puy, depe ef # OS. ATTC EW © scanned with OKEN Scanner