Hall Effect Final Manual
Hall Effect Final Manual
Basic Theory:
Lorentz Force: In physics (particularly in electromagnetism) the Lorentz force is the
combination of electric and magnetic force on a point charge due to electromagnetic fields.
fields A
particle of charge q moving with velocity v in the presence of an electric field E and a magnetic
field B experiences a force:
Drift Velocity: The drift velocity is the average velocity that a particle, such as an electron,
attains in a material due to an electric field
field.. It can also be referred to as axial drift velocity. In
general, an electron will propagate randomly in a conductor at the Fermi velocity.
velocity An applied
electric field will give this random motion a small net flow velocity in one direction.
Electromigration: Electromigration
Electromigration(Fig 1) is the transport of material caused by the gradual
movement of the ions in a conductor due to the momentum transfer between conducting
electrons and diffusing metal atoms
atoms.. The effect is important in applications where high direct
currentt densities are used, such as in microelectronics and related structures. As the structure size
in electronics such as integrated circuits (ICs) decreases, the practical significance of this effect
increases.
Fig 1: Electromigration
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The conductivity of semiconductors may easily be modified by introducing impurities into their
crystal lattice. The process of adding controlled impurities to a semiconductor is known as
doping. The amount of impurity, or dopant, added to an intrinsic (pure) semiconductor varies its
level of conductivity. Doped semiconductors are referred to as extrinsic. By adding impurity to
the pure semiconductors, the electrical conductivity may be varied by factors of thousands or
millions.
Four Probe Set-up: The four probe set-up (Fig:2) consists of four equally spaced tungsten metal
tips with finite radius. Each tips supported by springs on the end to minimize sample damage
during probing. The four metal tips are part of an auto-mechanical stage which travels up and
down during measuring. A high impedance current source is used to supply current through the
outer two probes. A voltmeter measures the voltage across the inner two port to determine the
sample resistivity .Typical probe spacing ~1mm.
Fig:2 Fig:3
These inner probes draw no current because of the high input impedance voltmeter in the circuit.
Thus unwanted voltage drop (IR drop) at point B and C caused by contact resistance between
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probes and the sample is eliminated from the potential measurement. Since these contact
resistance are very sensitive to pressure & to surface condition (such as oxidation of either
surface),error with the conventional two electrode technique (in which potential measuring
contact passes a current) can be quite large.
The electric current carried through the two outer probes, sets up an electric field in the sample
In Fig:3 the electric lines are drawn solid and the equipotential lines are drawn broken. The two
inner probes measure the potential difference between point B & C.
Hall Effect: The Hall effect is the basic of solid-state physics and is an important diagnostic tool
for the characterization of semi-conductors. It provides a direct determination of both the sign of
the charge carriers, e.g. electron or holes and their density in a given sample. The basic setup is
shown in Fig:4. A thin strip (thickness δ) of the material to be studied is placed in a magnetic
field B oriented at right angles to the strip.
Fig: 4
We know that the static magnetic field has no effect on the charge unless they are in motion.
When charges flow, a magnetic field directed perpendicular to the direction of flow produces a
mutually perpendicular force on the charges. When this happens, electron & hole will be
separated by opposite forces . They will in turn produce an electric field EH which depends on
the cross product of the magnetic intensity, H and the current density, J . The situation is
demonstrated in Fig:4
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asymmetric distribution of charge density across the Hall element, arising from a force that is
perpendicular to both the 'line of sight' path and the applied magnetic field. The separation of
charge establishes an electric field that opposes the migration of further charge, so a steady
electrical potential is established for as long as the charge is flowing.
In classical electromagnetism electrons move in the opposite direction of the current I (by
convention "current" describes a theoretical "hole flow"). In some semiconductors it appears
"holes" are actually flowing because the direction of the voltage is opposite to the derivation
below.
For a simple metal where there is only one type of charge carrier (electrons) the Hall voltage VH
can be derived by using the Lorentz force and seeing that in the steady-state condition charges
are not moving in the y-axis direction because the magnetic force on each electron in the y-axis
direction is cancelled by a y-axis electrical force due to the buildup of charges. The vx term is the
drift velocity of the current which is assumed at this point to be holes by convention. The vxBz
term is negative in the y-axis direction by the right hand rule.
Or, 0 −
Where, Ey is assigned in direction of y-axis.
If electrons instead of holes are flowing, then → − and → −.
Also, "!.
Substituting these changes gives: # $
The conventional "hole" current is in the negative direction of the electron current and the
negative of the electrical charge which gives % &'$(− )(−*), where n is charge carrier
density, tω is the cross-sectional area, and is the charge of each electron. Solving for and
+, -.
plugging into the above gives the Hall voltage: # /01
If the charge build up had been positive (as it appears in some semiconductors), then the VH
assigned in the image would have been negative (positive charge would have built up on the left
side).
Fig:5 Schematic representation of Hall Effect in a conductor. CCG – Constant Current Generator,
JX–current density, ē–electron, B–applied magnetic field, t–thickness, w–width VH–Hall voltage
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Hall Coefficient: Hall coefficient is defined as the ratio of the induced electric field to the
product of the current density and the applied magnetic field. It is a characteristic of the material
from which the conductor is made, since its value depends on the type, number, and properties of
the charge carriers that constitute the current.
23
The Hall coefficient is defined as:
4 -
, .
where 5 is the current density of the carrier electrons, the magnetic field and is the induced
electric field.
23 0 6
In SI units, this becomes ! −
4, -. +- /1
(The units of RH are usually expressed as m3/C, or Ω·cm/G, or other variants.) As a result, the
Hall effect is very useful as a means to measure either the carrier density or the magnetic field.
Characteristics of Hall Effect: One very important feature of the Hall effect is that it
differentiates between positive charges moving in one direction and negative charges moving in
the opposite. The Hall Effect offered the first real proof that electric currents in metals are
carried by moving electrons, not by protons. The Hall effect also showed that in some substances
(especially p-type semiconductors), it is more appropriate to think of the current as positive
"holes" moving rather than negative electrons. A common source of confusion with the Hall
Effect is that holes moving to the left are really electrons moving to the right, so one expects the
same sign of the Hall coefficient for both electrons and holes. This confusion, however, can only
be resolved by modern quantum mechanical theory of transport in solids.
The sample inhomogeneity might result in spurious sign of the Hall effect, even in ideal Van Der
Pauw configuration of electrodes. For example, positive Hall effect was observed in evidently n-
type semiconductors. Another source of artifact, in uniform materials, occurs when the sample's
aspect ratio is not long enough: the full Hall voltage only develops far away from the current-
introducing contacts, since at the contacts the transverse voltage is shorted out to zero.
Apparatus used:
• Gaussmeter
• Digital milivoltmeter
• Electromagnet
• Constant power supply
• Electric field sensor
• Hall effect set up
• Hall probe
• Crystal sample
• Holding stand
Procedure:
• Place the standard hall probe in the central region within the gap between pole pieces.
Turn on the current source and the Gaussmeter. Turn on the knob so that the current from
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this source is zero. The standard Hall probe should read zero. Adjust the zero control knob
to make it zero.
• Apply magnetizing current.
• Increase the current in small steps of 0.2A (upto 2A) and note down the magnetic field.
• Remove the standard hall probe. Insert the semiconductor chip for which you want to
measure the hall coefficient .
• Fix the hall current in small value, I=1mA.
• Note down the initial hall voltage corresponding to zero magnetizing current.
• Apply magnetizing current.
• Vary the magnetizing current in the same small steps as before. Note the Hall voltage in
each case.
• Now again fix the hall current, I=2mA. Repeat the above step.
• Draw a graph of magnetizing current vs magnetic field.
• Use the calibration curve to find out the magnetic field corresponding to the hall voltage
data for the two fixed hall currents.
• Draw a graph of magnetic field vs. Hall voltage for the two hall currents.
Precautions:
• Place hall probe and gauss meter probe exactly in the middle of the magnetic field to
avoid wrong readings.
• Wire Connection should not be loose.
• Hall Probe (GE crystal) should be handled carefully.
Observation:
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4) Calculation:
• Plot the calibration graph of magnetizing current vs magnetic field.
• Plot a graph of magnetic field vs. Hall voltage for the 1mA and 2mA values of hall
currents.
• Draw the best fitted line.
;( ! )
• Calculate the 789:* ;()
of the two lines separately.
0
• Find the value of (789:*) +
separately from the two lines.
• Find the mean value of Hall Coefficient.
• Calculate the percentage error.
5) Error:
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