Gen7™

C-SAM® Inspection System

Our most versatile C-SAM instrument ever!

The industry’s best dual pulsers
provide the ultimate in image
Features:
control and gain.
See more of the image on dual 28” 4k monitors.
Impressive image detail
with dual 28” 4k monitors. Do more with advance user interface Sonolytics 2™ for
Windows 10®.

Better results with up to six times the acquisition rate.

Scan larger parts with a 23% greater scan area.

Faster acquisition times with five individual motors.

Simple one button on / off.

The Gen7 C-SAM inspection system is the latest generation in Acoustic Micro Imaging. Built on the advancements made by its
predecessors, the Gen7 delivers the most advanced hardware ever available. The advanced hardware allows for new features
and analysis that can now be completed faster than ever before.

Advanced features such as PolyGate, SonoSimulator, Virtual Rescanning Mode (VRM) and Frequency Domain Imaging (FDI)
add value and confidence. With its large, easy access illuminated scanning area, the Gen7 has the capability to efficiently scan
everything from a small part up to 350mm sized parts.

In addition to being packed with leading innovations, the Gen7 was designed with the user in mind. Its ergonomic features
make it comfortable and convenient to use. The new Sonolytics 2 is an advanced operating software with new, even more
intuitive operator interface menus which help maximize results, while saving operator time.

The Gen7 is truly the most advanced acoustic microscope, delivering a package of technology, ergonomics, and advanced
Nordson Test & Inspection developed features that cannot be found anywhere else.

www.nordson.com/TestInspect
Gen7™ C-SAM® Inspection System

Inspection Modes • Securely capture images with • Precise selectable TOF in 10ns For more information,
included advance triggering tools: steps. speak with your Nordson
• Easily Capture 100 images • Acoustic Impedance Polarity representative or contact
simultaneously with Visual • Trigger at Positive, Negative Detector (AIPD) displays your Nordson regional office
PolyGate™ and ± crossing. simultaneously both polarity and
• Set start at Front Interface Echo amplitude information.
• Create informative images with Nordson Test & Inspection
(FIE), Main Bang, or Gated Patent 4,866,986 Europe, SEA, Africa
customizable color mapping
Trigger.
schemes • Industrial rackmount Intel Core® [email protected]
• Accurately locate layers with
• Flexible scanning modes: Dynamic Trigger and lock in i7-7700 computer.
Nordson Test & Inspection
• A-Scan displays the positions with dynamic gating.
Americas
transducer signal Facility Requirements [email protected]
• B-Scan provides a • Save time for repeat setups with
cross-sectional image AUTOSCAN™. A single button • Ergonomic wrap-around Nordson Test & Inspection
• C-Scan is a two dimensional starts a scan of multiple areas and L 248 cm x W 158 cm x H 186 cm China
plane image will automatically align, center [email protected]
• Weight approximately 610kg
• Bulk Scan reveals defects in and focus each area. Complete
uniform materials the automation with integrated • Universal power requirements
90VAC to 250VAC Single Phase Nordson Test & Inspection
• Multi-Scan generates multiple analysis through our DIA feature.
Japan
images at different levels 50/60Hz
• VRM™ (Virtual Rescanning Mode) [email protected]
• Surface Scan shows defects stores 100% of A-Scan echo data to • DI Water Flow Rate: 15 lpm.
at the surface reproduce an image in any mode
• Loss of Back Echo (LoBE) Nordson Test & Inspection
without rescanning the actual Singapore
reveals continuity defects sample. [email protected]
• Nordson Test & Inspection
• DIA™ (Digital Image Analyzer)
Optional Features and
exclusive Q-BAM™ (Quantitative
B-Scan Analysis Mode) is a
advanced algorithm to quantify Equipment Nordson Test & Inspection
results for automated accept/reject Taiwan
focused cross sectional view of • WaterFall™ Non-Immersion
criteria. [email protected]
a sample technique.
• THRU-Scan (Through
transmission Image) an optional • WaterPlume™ Inverted Non- Nordson Test & Inspection
shadowgraph view through Immersion technique. Korea
the sample Operating System • THRU-Scan™ A through [email protected]
• Simultaneous Thru-Scan and transmission image.
Reflection (STaR) an optional • Easy to use operating environment
• Degassification extracts trapped
feature that generates both a Sonolytics 2™ for Windows® 10.
gases to reduce bubbles that can
Thru-Scan image and relection • SONOLINK™ Direct online support cause interference.
images in one pass for diagnostic and application
• Simultaneous ASF and • Water Heater for optimum high
assistance.
Reflection (SASFaR) option frequency performance.
• C-SAM Interactive™ provides user
allows two modes in one scan • QDZ™ Quantitative Dynamic
application support.
Z maintains focus on warped
• Accurate waveform surfaces.
analysis modes: System • Universal wafer fixture precisely
holds 1” to 300mm wafers.
• FDI™ (Frequency Domain • Accurate images with patented
Imaging) frequency response of balanced scanner.
echo reveals detail not seen Patent 7,584,664 B2
with other methods. Patent • Repeatable positioning utilizing
7,522,780 & 6,890,302 a scan tower connected to the
• Amplitude captures peak-to- sample’s position and X,Y and Z axis
peak signal and polarity. precision of ± 0.5 microns.
• Profile tracks the position
• Capacity to scan a 350 mm x 350
of an interface.
mm sample with an adjustable Z
• Time Difference evaluates
height of 170 mm vertically.
distance or thickness between
two interfaces. • Five High Speed Scanner motors for
• Integration Mode™ easily the fastest image acquisition time.
finds defects in multiple • Huge image generation greater
layer samples. than 1 Gigapixel.
• ASF™ (Acoustic Surface
• Pulser/Receiver with 500 MHz
Flatness) an optional feature
bandwidth for transducers up to
that measures curvature or
400 MHz.
warpage of a surface.
Patent 8,794,072 • 95 dB Gain selectable in 0.5 dB
steps.
• Transducers available from 5 to
400 MHz.
• Digital Gating selectable from 1 to
10,000 ns.

www.nordson.com/TestInspect
DS-GEN7-271022