Module - 1
Module - 1
• A direct current in a metal wire running over a substantial time period, causes a transport of the metal ions
• this causes the wire to break or to short circuit to another wire. This type of failure will only occur after the
device has been in use for some time
• The rate of the Electro-migration depends upon the temperature, the crystal structure, and the average
current density.
• Electro-migration depends upon the temperature, the crystal structure, and the average current density.
• The latter is the only factor that can be effectively controlled by the circuit designer
• Keeping the current below 0.5 to 1 mA/µm normally prevents migration. This parameter can be used to
determine the minimal wire width of the power and ground network.
Resistance and Performance—RC Delay
1. RC Time Constant:
• The product of resistance (R) and capacitance (C) gives the RC time constant
(τ=RC)
• This time constant determines how long it takes for a signal to rise or fall in a
circuit.
• Specifically, the delay is proportional to RC, meaning that as R or C increases, the
delay increases.
2. Distributed RC Model
• As a signal moves through the wire, it experiences delays at each small segment
due to the resistance and capacitance at that point
• The total delay is the sum of all these small delays along the wire.
3. Introducing Repeaters
• Another approach is to use a metal bypass wire, which runs parallel to the polysilicon
word line. This metal wire has significantly lower resistance than polysilicon, but it only
connects to the polysilicon line at certain intervals, every k cells.
• Instead of the entire word line being limited by the high resistance of a long polysilicon
wire, the signal now mainly travels through the low-resistance metal wire, while the
polysilicon is only responsible for short segments between the contacts. As a result, the
propagation delay is significantly reduced, and the delay is dominated by the shorter
polysilicon segments.
• By limiting the use of high-resistance polysilicon to small segments and relying on a low-
resistance metal line for the longer distances, this method speeds up signal propagation
while still preserving implementation density. The memory array remains dense because
metal contacts are only placed every k cells.
2. Better Interconnect Strategies
• In the design of electronic chips, one of the biggest challenges is how to connect
different parts of the chip (called interconnections) using wires
• These wires carry signals from one part of the chip to another. The length of the
wire is really important because:
• Longer wires cause more delay (signals take longer to travel).
• Longer wires also use more power, which reduces the chip's efficiency.
• To solve this, different methods of routing the wires are used. Traditionally, a
method called Manhattan routing was used. Recently, a better method, diagonal
routing, has been found to improve the chip's performance by shortening the
wires.
• Manhattan Routing: Wires are routed in horizontal and vertical directions (along x and y
axes).
Example: A wire first moves horizontally (x-axis) and then vertically (y-axis) to reach its
destination.
• Diagonal Routing: Instead of strict x and y movement, wires can follow diagonal paths
(45° lines), which reduces the total wire length
• Diagonal Routing:
• Reduces wire length
• Shorter wires mean faster signal transmission and lower energy consumption.
• Chip area reduction: Less wire length leads to more efficient use of space on the chip,
reducing the overall chip size.
Challenges with Diagonal Routing:
•Early on, 45° lines were popular but then fell out of use due to:
•Tool complexity: More complex design and manufacturing processes.
•Mask-making issues: Difficulty in creating masks for integrated
circuit fabrication
Recent Improvements:
•Newer techniques have made diagonal routing feasible again, and it can
reduce wire length by 20%, leading to:
•Higher performance
•Lower power usage
•Smaller chip area
3. Introducing Repeaters
• The most popular design approach to reducing the propagation delay of long wires
is to introduce intermediate buffers, also called repeaters, in the interconnect line
• When multiple output drivers, such as the 16 drivers of an output bus, switch at the
same time, they draw a large transient current simultaneously
• This simultaneous current demand can cause a substantial voltage drop across the
inductive parasitic in the power supply network
Design Techniques
A number of approaches are available to the designer to address the L(di/dt)
problem
1. Separate power pins for I/O pads and chip core
2. Multiple power and ground pins
3. Careful selection of the positions of the power and ground pins on the package
4. Increase the rise and fall times
5. Use advanced packaging technologies
6. Adding decoupling capacitances on the board
7. Adding decoupling capacitances on the chip
1. Separate power pins for I/O pads and chip core
• I/O drivers typically require the largest switching currents, as they handle signals
going in and out of the chip.
• These drivers experience the most significant current changes when they switch
states, leading to large L(di/dt) voltage drops
• To prevent the noise and voltage fluctuations caused by these large current
changes from affecting the core logic of the chip, it is beneficial to isolate the
power supplies for the I/O pads and the chip’s internal logic
• This is done by using separate power and ground pins for:
• The I/O drivers (which handle external communication)
• The chip core (which handles the internal logic operations)
• By separating the power supplies, the switching noise generated by the I/O drivers
does not propagate to the sensitive core logic circuitry
• This isolation reduces the risk of logic errors and ensures more stable operation
for the core logic, especially in high-speed circuits where fast switching occurs.
2. Multiple power and ground pins
• I/O drivers require substantial current to switch, and when multiple drivers switch
simultaneously, it causes large current surges, leading to significant voltage drops due to
parasitic inductance
• To minimize this, designers can reduce the di/dt per supply pin by limiting the number of
I/O drivers connected to each power pin.
• Typical designs connect around five to ten drivers per power pin to distribute the current
load.
• The exact number of drivers connected to a single pin depends on factors such as:
• The switching characteristics of the drivers (how fast they switch and how much current they draw).
• The number of gates switching simultaneously
• The rise and fall times of the signals
• By distributing the load across multiple power and ground pins, the current per pin is
reduced, lowering the L(di/dt) voltage drop
• This approach helps maintain stable supply voltages, minimizing the risk of noise and
ensuring more reliable circuit operation, particularly during high-speed switching.
3. Careful selection of the positions of the power and ground pins on
the package
• The inductance of the pins on the chip package can vary based on their physical location
• Pins located at the corners of the package generally have substantially higher inductance
compared to those positioned closer to the center
• This higher inductance at the corners can lead to larger voltage drops due to the L(di/dt) effect,
especially during fast switching events when the current changes rapidly.
• It is advisable to place power and ground pins closer to the center of the package rather than at
the corners, where inductance is lower
• This helps in reducing the inductive parasitic effects and ensures a more stable power supply to
the chip
• By optimizing the positions of the power and ground pins, the inductive voltage drop across the
pins can be minimized, improving the reliability of the circuit
• This careful pin placement can also help in enhancing performance, especially for high-speed
circuits where the impact of inductance is more significant.
Increase the rise and fall times
• When electronic signals travel from a chip to the outside world (off-
chip), it's better to make the signals change (rise and fall) as slowly as
possible, within allowed limits.
• This helps reduce problems, especially when the signals have to travel
over long distances across the chip, like under data buses.
• If you try to make signals change too fast, you need bigger
components, which take up more space on the chip
Use advanced packaging technologies
• Advanced packaging technologies, like surface-mount or hybrid techniques, help
make electronic components smaller and more efficient. These methods
significantly reduce the unwanted effects of capacitance and inductance (which
can cause delays or noise in the circuit)
• One example is a flip-chip package, where the chip is mounted directly onto the
circuit board using tiny solder bumps. This setup reduces the inductance (which
slows down the signal) to just 0.1 nano henries (nH), which is 50 to 100 times
smaller compared to traditional packaging methods
• In simple terms, the newer packaging methods make the connections shorter and
cleaner, leading to faster and more reliable electronic devices.
Adding decoupling capacitances on the board
• Adding decoupling capacitors to a circuit helps keep the power supply to a chip
steady
• These capacitors act like small energy storage units placed next to the chip
• When the power supply fluctuates (due to fast-changing signals), the capacitors
release energy to smooth out these changes and prevent voltage drops or spikes
• They also help filter out unwanted noise from the power lines, making sure the
chip receives clean, stable power, which improves its performance and reliability
Adding decoupling capacitances on the chip
• In high-performance circuits, where signals switch quickly, adding
decoupling capacitors directly on the chip is a common practice to stabilize
the power supply and reduce voltage fluctuations. These on-chip capacitors
help ensure that the chip gets a steady voltage, especially during fast
changes in current demand