Vlsi Notes CH1 2
Vlsi Notes CH1 2
EC DEPARTMENT
6th SEM
Subject : VLSI Subject Code :- 3361104
Lecture Notes for CH-1
Q-1 What is VLSI ?
Advantages :- 1. Smaller Size 2. Lower Cost 3. Lower Power Consumption 4. Higher Reliability 5. More
Functionality
Disadvantages :- 1. Long design and Fabrication Time 2. Higher risk to project
1. Behavioral domain,
2. Structural domain,
3. Geometrical layout domain.
The design flow starts from the algorithm that describes the behavior of the target chip.
The corresponding architecture of the processor is first defined.
It is mapped onto the chip surface by floorplanning of Chip .
The next design evolution in the behavioral domain defines finite state machines.
Finite state Machines are structurally implemented with functional modules such as registers and arithmetic
logic units (ALUs).
These modules are then geometrically placed onto the chip surface using CAD tools for automatic module
placement followed by routing, with a goal of minimizing the interconnects area and signal delays.
The third evolution starts with a behavioral module description.
Individual modules are then implemented with leaf cells(Logic Cells).
Then logic gates which can be placed and interconnected by using a cell placement & routing program.
The last evolution involves a detailed Boolean description of leaf cells followed by a transistor level
implementation of leaf cells and mask generation.
In standard-cell based design, leaf cells are already pre-designed and stored in a library for logic design use.
Above figure provides a more simplified view of the VLSI design flow, taking into account the various
representations, or abstractions of design - behavioral, logic, circuit and mask layout.
Note that the verification of design plays a very important role in every step during this process.
The failure to properly verify a design in its early phases typically causes significant and expensive re-design at a
later stage, which ultimately increases the time-to-market.
Although the design process has been described in linear fashion for simplicity, in reality there are many
iterations back and forth, especially between any two neighboring steps, and occasionally even remotely
separated pairs.
Although top-down design flow provides an excellent design process control, in reality, there is no truly
unidirectional top-down design flow. Both top-down and bottom-up approaches have to be combined.
For instance, if a chip designer defined architecture without close estimation of the corresponding chip area,
then it is very likely that the resulting chip layout exceeds the area limit of the available technology. In such a
case, in order to fit the architecture into the allowable chip area, some functions may have to be removed and
the design process must be repeated.
Such changes may require significant modification of the original requirements.
The inter connection between CLB and I/O blocks are made with the help of horizontal routing channels,
vertical routing channels and PSM (Programmable Multiplexers).
It is implemented by programming of RAM cells whose output terminals are connected to the gates of MOS
pass transistors.
CLB performs the logic operation given to the module. The number of CLB it contains only decides the complexity of
FPGA. The functionality of CLB’s and PSM are designed by VHDL or any other hardware descriptive language. After
programming, CLB and PSM are placed on chip and connected with each other with routing channels.
Advantages
It requires very small time; starting from design process to functional chip.
No physical manufacturing steps are involved in it.
The only disadvantage is, it is costly than other styles
Design Flow of FPGA
1. Behavioral description of its functionality (using a hardware description language such as VHDL)
2. Technology-mapped (or partitioned) into circuits or logic cells (At this stage, the chip design is completely
described in terms of available logic cells)
3. Assign individual logic cells to CLBs and determines the routing pattern among the cells in accordance with the
netlist.
A general architecture of FPGA from XILINX is shown in Fig. 1.12. A more detailed view showing the locations of switch
matrices used for interconnect routing is given in Fig. 1.13.
Figure-1.13: Detailed view of switch matrices and interconnection routing between CLBs.
The gate array (GA) ranks second after the FPGA, in terms of fast prototyping capability.
While the design implementation of the FPGA chip is done with user programming, that of the gate array is
done with metal mask design and processing.
Gate array implementation requires a two-step manufacturing process:
1. The first phase, which is based on standard masks, results in an array of uncommitted transistors
on each GA chip. These uncommitted chips can be stored for later customization
2. In the Second Phase, the uncommitted chips are customized by defining the metal interconnects
between the transistors of the array (Fig. 1.15). Since the patterning of metallic interconnects is
done at the end of the chip fabrication, the turn-around time can be still short, a few days to a few
weeks.
Advantage :-
For Gate Array Design, chip utilization factor ( used chip area/ total chip area)is higher than that of the FPGA
and so chip speed is high.
since more customized design can be achieved with metal mask designs.
The standard-cells based design is one of the most prevalent full custom design styles which require
development of a full custom mask set.
The standard cell is also called the polycell.
In this design style, all of the commonly used logic cells are developed, characterized, and stored in a standard
cell library.
A typical library may contain a few hundred cells including inverters, NAND gates, NOR gates, complex AOI, OAI
gates, D-latches, and flip-flops.
Each gate type can have multiple implementations to provide adequate driving capability for different fanouts.
For instance, the inverter gate can have standard size transistors, double size transistors, and quadruple size
transistors so that the chip designer can choose the proper size to achieve high circuit speed and layout
density.
The characterization of each cell is done for several different categories. It consists of
To enable automated placement of the cells and routing of inter-cell connections, each cell layout is designed
with a fixed height, so that a number of cells can be abutted side-by-side to form rows.
The power and ground rails typically run parallel to the upper and lower boundaries of the cell, thus,
neighboring cells share a common power and ground bus.
The input and output pins are located on the upper and lower boundaries of the cell.
Generally the nMOS transistors are located closer to the ground rail while the pMOS transistors are placed
closer to the power rail
Figure shows a floorplan for standard-cell based design.
The physical design and layout of logic cells ensure that when cells are placed into rows, their heights are
matched and neighboring cells can be abutted side-by-side, which provides natural connections for power and
ground lines in each row.
The signal delay, noise margins, and power consumption of each cell should be also optimized with proper
sizing of transistors using circuit simulation.
If a number of cells must share the same input and/or output signals, a common signal bus structure can also
be incorporated into the standard-cell-based chip layout.
Standard-cell based designs may consist of several such macro-blocks, each corresponding to a specific unit of
the system architecture such as ALU, control logic, etc.
After chip logic design is done using standard cells in the library, the most challenging task is to place individual
cells into rows and interconnect them in a way that meets stringent design goals in circuit speed, chip area, and
power consumption.
Many advanced CAD tools for place-and-route have been developed and used to achieve such goals.
For timing critical paths, proper gate sizing is often practiced to meet the timing requirements.
In many VLSI chips, such as microprocessors and digital signal processing chips, standard-cells based design is
used to implement complex control logic modules.
Some full custom chips can be also implemented exclusively with standard cells.
Although the standard-cells based design is often called full custom design, in a strict sense, it is somewhat less
than fully custom since the cells are pre-designed for general use and the same cells are utilized in many different
chip designs.
In a full-custom design, the entire mask design is made new, without the use of any library.
The development cost of this design style is High.
So the concept of design reuse is becoming famous to reduce design cycle time and development cost.
In real full-custom layout in which the geometry, orientation and placement of every transistor is done individually
by the designer, design productivity is usually very low - typically 10 to 20 transistors per day, per designer.
In digital CMOS VLSI, full-custom design is hardly used due to the high labor cost.
These design styles include the design of high-volume products such as memory chips, high-performance
microprocessors and FPGA.
For logic chip design, a good negotiation can be obtained using a combination of different design styles on the
same chip.
Offers high performance lower cost as compared to semi. More cost. Low performance.
Design time and complexity is more. Design time and complexity is less
Q-1 Explain MOS Structure with necessary diagram/ Explain Energy Band Diagram for MOS
MOS structure forms a capacitor, with gate and substrate are as two plates and oxide layer as the dielectric
material.
The thickness of dielectric material (SiO2) is usually between 10 nm and 50 nm.
Carrier concentration and distribution within the substrate can be manipulated by external voltage applied
to gate and substrate terminal.
[B] Basic electric properties of P – Type semiconductor substrate. :-
Concentration of carrier in semiconductor material is always following the Mass Action Law.
Mass Action Law is given by – n.p = ni2 , Where n= electron carrier concentration
P = Holes carrier concentration
ni = intrinsic carrier concentration of Silicon
Assume, Substrate is uniformly doped with acceptor (p-type) concentration, So, electron and hole
concentration in p–type substrate is
npo = ni2 / NA & Ppo = NA
Here, doping concentration NA is (1015 to 1016 cm−3) greater than intrinsic concentration ni.
As shown in the figure, the band gap between conduction band and valance band is 1.1eV.
Fermi potential ΦF = (Ei - EFp)/q (Potential diff. between Intrinsic Fermi level and bulk Fermi level)
Electron affinity (qx.) :- The potential difference between conduction band and free space
Work Function (qΦS) :- Energy required for an electron to move from Fermi level to free space is called work
function
(2) Energy Band diagram of MOS System ( Metal, Oxide, Semiconductor as separate components)
The following figure shows the energy band diagram of components that make up the MOS.
As shown in the above figure, insulating SiO2 layer has large energy band gap of 8eV and work function is 0.95
eV.
Metal gate has work function of 4.1eV.
Here, the work functions are different so it will create voltage drop across the MOS system.
As shown in this figure, the Fermi potential level of metal gate and semiconductor (Si) are at same
potential. (Efp = Efm)
Fermi potential at surface is called surface potential ΦS and it is smaller than Fermi potential ΦF in
magnitude.
Q-2 Explain with neat sketch Mos System under external bias
In MOS there is an oxide layer below the Gate terminal. Since oxide is a very good insulator, it contributes to
an oxide capacitance in the circuit.
Normally, the capacitance value of a capacitor doesn't change with values of voltage applied across its
terminals.
However, this is not the case with MOS capacitor. We find that the capacitance of MOS capacitor changes its
value with the variation in Gate voltage.
This is because application of gate voltage results in band bending in silicon substrate and hence variation in
charge concentration at Si-SiO2 interface
Modes of operation
Depending upon the value of gate voltage applied, the MOS capacitor works in three modes :
1. When Vg <0, the holes in p-type substrate are attracted to the semiconductor-oxide interface.
2. There is accumulation of holes (assuming nMOSFET) at the Si-SiO2 interface.
3. The oxide electric field is directed towards the gate electrode.
4. The negative surface potential causes the energy band to bend up-ward near the surface
1. When we apply Vg > 0 (Small), the holes at the interface are repelled and pushed back into the substrate
leaving a depleted layer.
2. These holes will leave negatively charged fixed acceptor ions behind.
3. Thus a depletion region is created near the surface
4. Vg > 0 (Small), and as the substrate bias is zero, the oxide electric field will be directed towards the substrate in
this case.
5. The positive surface potential causes the energy bands to bend downwards near the surface.
1. When we apply Vg > 0 (Large), attracts additional minority carriers(electrons) from the p-type substrate to the
surface.
2. The n-type region created near the surface by the positive gate bias is called the inversion layer and this
condition is called surface inversion.
3. The thin inversion layer on the surface with a large mobile electron concentration can be utilized for conducting
current between two terminals of the MOS transistor.
4. When surface is inverted, the density of mobile electron at the surface is same as the density of the holes in the
p-type substrate.
Q -3 Draw only energy band diagram of MOS system under external bias
FETs have a few disadvantages like high drain resistance, moderate input impedance and slower operation. To
overcome these disadvantages, the MOSFET which is an advanced FET is invented. Practically it look likes as shown
Not
Terminals Interchangeable Interchangeable
interchangeable
Operational modes No modes Depletion mode only Both Enhancement and Depletion modes
Construction of a MOSFET
Classification of MOSFETs
Depending upon the type of materials used in the construction, and the type of operation, the MOSFETs are classified
as in the following figure
Types of MOSFET
Further than the pinch off point, i.e. for VDS > VDSAT, a depleted region forms near to the drain and
extends towards the source with increasing drain voltage.
This mode is called beyond saturation mode or beyond saturation region
In this region, the inversion layer near the drain decreases, the effective channel length is reduced.
The channel end voltage remains constant (=VDSAT)
So most of the exceed voltage(VDS-VDSAT) will drop across the pinch-off section (between channel-end
and drain) hence high electric field region created there.
So electrons coming from the source to the channel-end will be entered into the high electric field
region and accelerated toward the drain end.
We are modeling the terminal characteristics of a MOSFET and thus want i D(vDS, vGS, vBS), iB(vDS, vGS, vBS), and iG(vDS, vGS,
vBS). We restrict our model to VDS ≥ 0 and VBS ≤ 0, so the diodes at the source and drain are always reverse biased; in this
case iB ≈ 0. Because of the insulating nature of the oxide beneath the gate, we also have i G = 0, and our problem
reduces to finding iD(vDS, vGS, vBS).
it is so named because we assume that the voltages vary gradually along the channel from the drain to the source. At
the same time, they vary quickly perpendicularly to the channel moving from the gate to the bulk semiconductor.
𝑾
Id = μn COX [2 (VGS-VTO)VDS - VDS2 ] -------------------------------Eq-3
𝑳
𝛍𝐧 𝐂𝐎𝐗 𝑾
Id(Sat) = (VGS –VTO)2
𝟐 𝑳
Principle of Operation
The logic symbol and truth table of ideal inverter is shown in figure given below. Here A is the input and B is the
inverted output represented by their node voltages. Using positive logic, the Boolean value of logic 1 is represented by
Vdd and logic 0 is represented by 0. Vth is the inverter threshold voltage, which is V dd /2, where Vdd is the output
voltage.
The output is switched from 0 to Vdd when input is less than Vth. So, for 0<Vin<Vth output is equal to logic 0 input and
Vth<Vin< Vdd is equal to logic 1 input for inverter.
The characteristics shown in the figure are ideal. The generalized circuit structure of an nMOS inverter is shown in the
figure below.
The basic structure of a resistive load inverter is shown in the figure given below. Here, enhancement type nMOS acts
as the driver transistor. The load consists of a simple linear resistor R L. The power supply of the circuit is VDD and the
drain current ID is equal to the load current IR.
Circuit Operation
When the input of the driver transistor is less than threshold voltage VTH (Vin < VTH), driver transistor is in the cut – off
region and does not conduct any current. So, the voltage drop across the load resistor is ZERO and output voltage is
equal to the VDD. Now, when the input voltage increases further, driver transistor will start conducting the non-zero
current and nMOS goes in saturation region.
Mathematically,
𝐾𝑛
ID = 2
[VGS − VTO]2
Increasing the input voltage further, driver transistor will enter into the linear region and output of the driver
transistor decreases.
𝐾𝑛
ID= 2[VGS − VTO]2 𝑉𝐷𝑆
2
VTC of the resistive load inverter, shown below, indicates the operating mode of driver transistor and voltage points.
The five critical voltage points, which determine the steady-state input-output behavior of the inverter are
VOL = VDD
VOH =
1
VIL = VIL = VTO +
𝐾𝑛𝑅𝐿
VIH =
Q-3 Describe inverter circuit with saturated and Linear Enhancement type load.
The main advantage of using MOSFET as load device is that the silicon area occupied by the transistor is smaller than
the area occupied by the resistive load. Here, MOSFET is active load and inverter with active load gives a better
performance than the inverter with resistive load.
Two inverters with enhancement-type load device are shown in the figure. Load transistor can be operated either, in
saturation region or in linear region, depending on the bias voltage applied to its gate terminal. The saturated
enhancement load inverter is shown in the fig. (a). It requires a single voltage supply and simple fabrication process
and so VOH is limited to the VDD − VT.
------self Assignment---------------
Drawbacks of the enhancement load inverter can be overcome by using depletion load inverter. Compared to
enhancement load inverter, depletion load inverter requires few more fabrication steps for channel implant to adjust
the threshold voltage of load.
The advantages of the depletion load inverter are - sharp VTC transition, improved switching speed ,better noise
margin, single power supply and smaller overall layout area.
As shown in the figure, the gate and source terminal of load are connected; So, V GS = 0. Thus, the threshold voltage of
the load is negative. Hence,
VGS,load > VT,load
is satisfied
Therefore, load device always has a conduction channel regardless of input and output voltage level.
When the load transistor is in saturation region, the load current is given by
ID,load=Kn,load2[−VT,load(Vout)]2ID,load=Kn,load2[−VT,load(Vout)]2
When the load transistor is in linear region, the load current is given by
The voltage transfer characteristics of the depletion load inverter is shown in the figure given below −
Q-7 Explain CMOS Inverter with Different Operating Modes of nMOS and pMOS transistor.
The CMOS inverter circuit is shown in the figure. Here, nMOS and pMOS transistors work as driver transistors; when
one transistor is ON, other is OFF.
This configuration is called complementary MOS (CMOS). The input is connected to the gate terminal of both the
transistors such that both can be driven directly with input voltages. Substrate of the nMOS is connected to the
ground and substrate of the pMOS is connected to the power supply, VDD.
So VSB = 0 for both the transistors.
VGS,n = Vin
VGS,p = Vin−VDD
VDS,p = Vout−VDD
When the input of nMOS is smaller than the threshold voltage (Vin < VTO,n), the nMOS is cut – off and pMOS is in
linear region. So, the drain current of both the transistors is zero.
ID,n = ID,p = 0
When the input voltage is greater than the VDD + VTO,p, the pMOS transistor is in the cutoff region and the nMOS is
in the linear region, so the drain current of both the transistors is zero.
ID,n = ID,p = 0
Vout ≥ Vin−VTO,n
The pMOS operates in the saturation region if Vin < VDD + VTO,p and if following conditions are satisfied.
VDS,p ≤ VGS,p − VTO,p
Vout ≤ Vin−VTO,p
For different value of input voltages, the operating regions are listed below for both transistors.
Noise margin represents the amount of noise voltage on the input of a gate so that the output will not be corrupted. It
is closely relate to the dc characteristics. and it is also known as noise immunity.
Noise Margin
Noise margin is the amount of noise that a CMOS circuit could withstand without compromising the operation of
circuit. Noise margin does makes sure that any signal which is logic ‘1’ with finite noise added to it, is still recognized as
logic ‘1’ and not logic ‘0’. It is basically the difference between signal value and the noise value. Refer to the diagram
below.
But due to voltage droop and ground bounce, Vih is usually slightly less than Vdd i.e. Vdd’, whereas Vil is slightly higher
that Vss i.e. Vss’.
Hence Noise margins for a practical circuit is defined as follows :
Hence, if input voltage (Vin) lies somewhere between Vol and Vil, it would be detected as logic ‘0’, and would result in
an output which is acceptable. Similarly, if input voltage (Vin) lies between Vih and Voh, it would be detected as logic
‘1’ and would result in an output which is acceptable.
Vth is not constant with respect to voltage difference between substrate and source of transistor. This is known as
body effect. It is otherwise known as substrate-bias effect.
Q-6. Give the expression for rise time and fall time in cmos inverter circuit.(Apply)
Rise time:
The time needed for Vout to rise fron 0.1 Vdd to 0.9 Vdd is called rise time.
tr =ln(9) τp
tr =2.2 τp
Fall time:
The time needed for Vout to fall from 0.9 vdd to 0.1 Vdd is called fall time.
tf =ln(9) τn
tf =2.2 τn
Q-9. What are the different regions in nMOS depending upon voltages? (Remember)
There are three different regions in nMOS transistor depending upon the operating voltages i.e Vgs & Vds
The fabrication of an IC using CMOS transistor is known as CMOS technology. CMOS transistor is nothing but an
inverter, made up of an n-MOS and p-MOS transistor connected in series
1. Size is less
Prepared By : L.J.Vora, LEC, Govt. Polytechnic, Ahemdabad Page 29
2. High Speed
3. Less Power Dissipation
Q-12. Why does the present VLSI circuits use MOSFETs instead of BJTs?
Compared to BJTs, MOSFETs can be made very small as they occupy very small silicon area on IC chip and are relatively
simple in terms of manufacturing. Moreover digital and memory ICs can be implemented with circuits that use only
MOSFETs i.e. no resistors, diodes, etc.
Q-13. What are the various regions of operation of MOSFET? How are those regions used?
MOSFET has three regions of operation: the cut-off region, the triode region, and the saturation region.
The cut-off region and the triode region are used to operate as switch. The saturation region is used to operate as
amplifier.
The value of voltage between Gate and Source i.e. VGS at which a sufficient number of mobile electrons accumulate in
the channel region to form a conducting channel is called threshold voltage (Vt is positive for NMOS and negative for
PMOS).
For a MOSFET when VGS is greater than Vt, a channel is induced. As we increase VDS current starts flowing from Drain
to Source (triode region). When we further increase VDS, till the voltage between gate and channel at the drain end to
become Vt, i.e. VGS – VDS = Vt, the channel depth at Drain end decreases almost to zero, and the channel is said to be
pinched off. This is where a MOSFET enters saturation region.
Cut-off region: When VGS < Vt, no channel is induced and the MOSFET will be in cut-off region. No current flows.
Triode region: When VGS ≥ Vt, a channel will be induced and current starts flowing if VDS > 0. MOSFET will be in triode
region as long as VDS < VGS – Vt.
Saturation region: When VGS ≥ Vt, and VDS ≥ VGS – Vt, the channel will be in saturation mode, where the current
value saturates. There will be little or no effect on MOSFET when VDS is further increased.
In practice, when VDS is further increased beyond saturation point, it does have some effect on the characteristics of
the MOSFET. When VDS is increased the channel pinch-off point starts moving away from the Drain and towards the
Source. Due to which the effective channel length decreases, and this phenomenon is called as Channel Length
Modulation.
When a positive voltage is applied across Gate, it causes the free holes (positive charge) to be repelled from the region
of substrate under the Gate (the channel region). When these holes are pushed down the substrate they leave behind a
carrier-depletion region.
Usually, in an integrated circuit there will be several MOSFETs and in order to maintain cut-off condition for all
MOSFETs the body substrate is connected to the most negative power supply (in case of PMOS most positive power
As discussed in the above question, the Vt depends on the voltage connected to the Body terminal. It also depends on
the temperature, the magnitude of Vt decreases by about 2mV for every 1oC rise in temperature.
In MOSFET, current flow is either due to electrons(n-channel MOS) or due to holes(p-channel MOS) – In BJT, we see
current due to both the carriers : Electrons and Holes. BJT is a current controlled device and MOSFET is a voltage
controlled device.
If you consider the transistor level of a module, active low means the capacitor in the output terminal gets charged or
discharged based on low to high and high to low transition, respectively. when it goes from high to low it depends on
the pull down resistor that pulls it down and it is relatively easy for the output capacitance to discharge rather than
charging. Hence designers prefer active low interrupt signals.
Q-23. Why is the number of gate inputs to CMOS gates (e.g. NAND or NOR gates)usually limited to four?
To limit the height of the stack. The higher the stack the slower the gate will be. In NAND and NOR gates the number of
gates present in the stack is usually same as the number of inputs plus one. So inputs are limited to four.
R = (p.l)/A
Where
R = Resistance of the metal.
p = Resistivity of the metal.
A = is the cross sectional area.
l = length of the metal.
With increase in length or decrease in cross sectional area resistance of the metal wire increases. Resistivity(p) is the
material property which depends on temperature. In general, resistivity of metals increases with temperature.
Dynamic power consumption, due to logic transitions causing logic gates to charge/discharge load capacitance.
Short-circuit current, this occurs when p-tree and n-tree shorted (for a while) during logic transition.
Leakage current, this is a very important source of power dissipation in nano technology, it increases with
decrease in lambda value. It is caused due to diode leakages around transistors and n-wells.
Voltage scaling, transistor resizing, pipelining and parallelism, power management modes like standby modes, etc.
When voltage is scaled, designers tend to decrease threshold voltage to maintain good noise margins. But decreasing
threshold voltages increases leakage currents exponentially.
Pswitching = (1/2)CVdd2f
Where
Pswitching = Switching power.
C = Load capacitance.
Vdd = Supply voltage.
f = Operating frequency.
There are two components that establish the amount of power dissipated in a CMOS circuit. These are:
i) Static dissipation due to leakage current or other current drawn continuously from the power supply.
ii) Dynamic dissipation due to - Switching transient current – Charging and discharging of load capacitances.
Q-39 . What are the advantages of CMOS inverter over the other inverter configurations ?
a. The steady state power dissipation of the CMOS inverter circuit is negligible.
b. The voltage transfer characteristic (VTC) exhibits a full output voltage wing between 0V and VDD. This results in high
noise margin.
When positive voltage is transmitted across Gate, it causes the free holes (positive charge) to be pushed back or
repelled from the region of the substrate under the Gate. When these holes are pushed down the substrate, they
leave behind a carrier depletion region.
A latch is level-sensitive while a flip-flop is edge triggered. A latch stores when the clock level is low and is transparent
when the level is high. A flip-flop stores when the rises and is mostly never transparent.
A field programmable gate array (FPGA) is a programmable logic device that supports implementation of relatively
large logic circuits. FPGAs can be used to implement a logic circuit with more than 20,000 gates whereas a CPLD can
implement circuits of upto about 20,000 equivalent gates.