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SurfaceScience_Flyer_EN

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0% found this document useful (0 votes)
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SurfaceScience_Flyer_EN

Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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FT-IR SPECTROSCOPY

Surface Science
Infrared Reflection Absorption Spectroscopy

Innovation with Integrity

Infrared Reflection Absorption Spectroscopy (IRRAS) is a widely used Bruker offers several products to meet
technique to examine chemical structure, conformation, and orientation all these requirements:
of molecules in ultrathin films on various substrates and at interfaces.
ƒ INVENIO
Whether you operate the ALPHA II in a small laboratory with The next generation FT-IR R&D spectrometer
professional staff or utilize it in a large industrial hall with ever with innovative technology and highest degree
of automation is made to fit your need.
changing users, Bruker’s ALPHA II is “plug and play” and
always offers the same, easy-to-understand workflows. ƒ VERTEX series
Purge and vacuum FT-IR research spectrometer
Typical IR absorbances of a monolayer in an IRRAS experiment are offer highest sensitivity for demanding research
about 10-3 - 10-4 absorbance units (AU). Detection of such small absor- experiments and provide evacuated optics and
integrated vacuum control.
bances calls for an FT-IR that can provide high signal-to-noise ratios in
a short acquisition time. ƒ PMA 50
Polarization-modulation accessory for
Since atmospheric water vapor absorbs in the mid-infrared, it can in- the INVENIO and VERTEX series FT-IR
terfere with the measurement of very small sample absorption peaks. spectrometers.
To achieve the best results, the FT-IR must be capable of keeping the
water vapor interference to a minimum. The additional important re-
quirements for FT-IR for surface science include a high dynamic analog
digital converter (ADC) range and a low baseline drift.

ƒ Monolayers on metal and ƒ Catalytic material analysis ƒ Electrochemistry ƒ Surface reactions in situ in
glass surfaces ƒ Electrochemistry ƒ Thin dielectric layers in UHV chambers
ƒ Air/water interface ƒ Corrosion studies semiconductor industry ƒ Biological surface structures
INVENIO and VERTEX Purge Systems FT-IR Accessories

ƒ Outstanding signal-to-noise ratio

Absorbance Units x 10-3


ƒ Sealed and purged design

15
ƒ Highest stability by permanently aligned RockSolid interferometer
ƒ Proprietary ultra-low noise electronics technology 10 mAU

5
The INVENIO and VERTEX series combine ultimate performance and flexi-
bility with an intuitive and easy to operate interface. With the DigiTectTM (or

-5
1800 1600 1400 1200 1000
MultiTect™ for INVENIO) technology and standard room temperature op- Wavenumber cm-1

erated DLaTGS detector, a peak-to-peak signal-to-noise ratio of better than Comparison of a thin organic layer
11000:1 in 5 sec at a spectral resolution of 4 cm-1 is achievable. 50000:1 in on gold measured in a purged
1 min have been demonstrated. The permanently aligned, high throughput VERTEX 80 (red) and evacuated
RockSolidTM interferometer guarantees unlimited performance and stability VERTEX 80v (blue) FT-IR spectrome-
for at least 10 years. ter with 80° reflectance unit A518/Q.
It can be observed that in the purged
VERTEX Vacuum Systems spectrometer small residues of water
vapor mask very weak signals which
can be detected with the vacuum

Bruker Optics is continually improving its products and reserves the right to change specifications without notice.
ƒ VERTEX70v and 80v with evacuated optics for superior performance
ƒ Integrated vacuum control includes flaps for automated sample optics due to removal of the atmo-
chamber venting and re-evacuation spheric interferences (respective
ƒ External high power water cooled source option signals are marked by arrows).

The VERTEX 70v and VERTEX 80v offer evacuated optics and integrated

0.8
vacuum control. State-of-the-art interferometer design and high quality

Absorbance Units x 10-3


optics provide the ultimate in sensitivity and stability, necessary for IRRAS

0.4
measurements. The major advantage of the vacuum FT-IR is that the inter-

0
ference of atmospheric water vapor in spectra is negligible. The VERTEX

-0.4
vacuum optics can be evacuated within a few minutes, allowing quick 0.6 mAU

sample change.

-0.8
1800 1600 1400 1200 1000
Wavenumber cm -1

An organic monolayer on gold mea-


PMA 50 Module sured in a purged VERTEX 80 with
80° reflectance unit A518/Q (red)
ƒ PM-IRRAS and VCD accessory for the INVENIO and VERTEX series and in comparison with the PMA50
FT-IR spectrometers module in PM-IRRAS mode (blue).
ƒ PEM: ZnSe, 42 kHz with demodulator Although atmospheric interferences
ƒ Parallel dual channel data acquisition (24 bit) are even lower than in the upper
example weak sample information
The PMA 50 accessory takes advantage of the difference in the absorption is covered. It can been clearly seen

© 2023 Bruker Optics BOPT-01


of p- and s-polarized light. By modulating the polarization of the infrared that polarization modulation enables
light, the PMA 50 can be used to probe trace quantities of surface-sorbed revealing those signals (marked by
molecules. It consists of a housing with an input for the IR beam, a pho- arrows). Please note the difference
toelastic modulator (PEM), a specialized sample holder and non-polarizing in y-scale for the two samples of
almost two orders of magnitude.
detector optics. The PMA 50 has a variable angle of incidence (70°-89°) de-
tector mount and MCT detector with nonbirefringent BaF2 window. For an
enlarged angle of incidence (32.5°-89°) the PMA 50XL module is available.
Using these accessories completely eliminates atmospheric interference
and increases the sensitivity of the IRRAS technique.

Bruker Optics GmbH & Co. KG Worldwide offices Online information


[email protected] bruker.com/bopt-offices bruker.com/ALPHA

Online information
bruker.com bruker.com/sc-xrd

Bruker Optics is ISO 9001, ISO 13485,


ISO 14001 and ISO 50001 certified.

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