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ThinLayer2 report (B.Sc. Physics, UniDeb)

Lab report

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5 views

ThinLayer2 report (B.Sc. Physics, UniDeb)

Lab report

Uploaded by

Suzanne
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 4

ELECTRONICS TECHNOLOGY

2. Thin film deposition and examination


Name: May Swann Sint Yee

Table of Contents
ELECTRONICS TECHNOLOGY..........................................................................................1
Task: ......................................................................................................................................2
I. Duties: .............................................................................................................................2
II. Scheme of the vacuum system .....................................................................................2
III. Optical transmission spectrum .....................................................................................3
IV. Profilometer data: ........................................................................................................3
V. Surface structure (AFM data) and Raman spectra. ........................................................4
VI. Summary, conclusions: ................................................................................................4
Task: Using thermal evaporation in a vacuum to deposit a thin layer of
selenium on a glass substrate. Layer parameter determination.

I. Duties:
For the thin film experiment, the follwing procedures will be performed:
1. Preparing and cleaning the glass substrate
2. Se evaporation to create thin layer
3. Measurements of optical and other characteristics, such as thickness,
refractive index, and transmission spectrum.
4. The thickness was measured using a profilometer.
5. Surface roughness measured with an AFM.
6. Additional options such as adding conductive paste and measuring
conductivity

Because some of the machinery was not working at the time when this
experiment took place, some measurements could not be done.

II. Scheme of the vacuum system

This is a basic schemetic of the overall vacuum system:

Courtsey to: Prof. Istvan Csarnovics


III. Optical transmission spectrum

Parameters
Wavelength: 550.000 nm (green),
0.074 T%

From this spectrum, the calculated thickness will be 4507.332 nm. Various
values of refractive index is recorded in the corresponding Excel file.

IV. Profilometer data:

The thickness of the created thin film was to be measured with a profilometer.
However, due to the functionality issues of machinery, this process could not be
performed at the time.
V. Surface structure (AFM data) and Raman spectra.

AFM measurement of surface structure could not be performed due to


machinery issues.

The raman spectra for amorphous and crystalline Se are as shown in figure:

VI. Summary, conclusions:

In this lab session, we mainly explored the properties of the created Se thin
films. Although some measurements could not be performed due to some
machines not working at the time, a lot of interesting data could be processed.

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