AMERICAN INTERNATIONAL UNIVERSITY-

BANGLADESH (AIUB)
Faculty of Engineering
Department of Electrical and Electronic Engineering
Undergraduate Program

PART A

1. Course No/Course Code EEE 2103

2. Course Title Electronic Devices
3. Course Type Core Course
4. Year/Level/Semester/Term Second year (4th Semester)
5. Academic Session Fall 2024-25
6. Course Teachers/Instructors Dr. Md. Kabiruzzaman, Dr. Mohammad Hasan Imam, Dr. M. Tanseer
Ali, Dr. Effat Jahan, Dr. Md. Rifat Hazari, Dr. Nadia Afroze, Dr.
Mohammad Alif Arman, Mr. Ebad Zahir, Ms. Susmita Ghosh, Ms.
Bismoy Jahan, Mr. Abu Hena Md. Shatil, Ms. Sadia Yasmin, Mr. Ali
Noor, Ms. Lia Moni, Mr. S M Tanvir Hassan Shovon, Mr. Md.
Ashiquzzaman, Mr. Joheb Muhammad Tanzeer Sayeed, Mr. Shaoran
Sayem, Mr. Md. Salehin Ferdous Kader

7. Pre-requisite (If any) EEE 2101: Electrical Circuits 2 (AC)

8. Credit Value 3 credit hours
9. Contact Hours 3 hours of theory per week
10. Total Marks 100
11. Mission of EEE Department • Educate young leaders for academia, industry,
entrepreneurship, and public and private organization through
theory and practical knowledge to solve engineering problems
individually and in teams.
• Create knowledge through innovative research and
collaboration with multiple disciplines and societies.
• Serve the communities at national, regional, and global levels
with ethical and professional responsibilities.
12. Vision of EEE Department To become a front runner in preparing Electrical and Electronics
Engineering graduates to be nationally and globally competitive and
thereby contribute value for the knowledge-based economy and
welfare for the people of the world.
13. Rationale of the Course (Course This core course of Electrical and Electronic Engineering program
Description) explores principles, analysis and applications of different types of
semiconductor devices such as diodes, BJTs and FETs. The
knowledge and understanding of this course can be used in many
advanced courses like analog electronics, VLSI circuits, micro-
electronic devices etc.
14. Course Content The course is designed to provide students with:
• Electronic Devices Semiconductors: electron and holes in
an intrinsic semiconductor, donor and acceptor
impurities. Introduction to solid state electronics: Energy
band structure in solids, insulators, semiconductors and
metals, Conductance and semiconductors, electrons and
holes, Diodes: open circuit p-n junction, diode
characteristics, small signal model of diode, and circuit
applications of diode, rectifiers and Zener diode.
• Bipolar junction transistors: characteristics, different
configuration of transistor amplifiers, voltage, and current
amplifiers small signal analysis high input resistance
transistor circuits, transistor biasing MOSFET: switching
characteristics, depletion and enhancement MOSFET.

© Department of EEE, FE, American International University-Bangladesh (AIUB) Page 1 of 7

 15. Course Outcomes (CO)/Course Learning Outcomes (CLOs):
By the end of this course, students should be able to –

Assessed Teaching
COs/
Program BNQF - Assessment
CLOs COs/CLOs Statements K P A
Outcome Indicat Learning Strategy
Number
Indicator or Strategy
Identify the semiconductor
diode principles with
comparison to each other for Lecture Mid
1 1 P.b.1.C4 FS.1
practical applications having Tutorial Assignment
different electronic
arrangements.
Apply information and
concepts of mathematics to
Quiz 1 & 2
solve basic electronic circuits
Lecture and Term
2 e.g., series, parallel, clipper, 2 P.a.2.C3 FS.2
Tutorial Exam (Mid)
clamper, and Zener diode
circuits and DC biasing of BJT
circuits.
Formulate solutions,
Quiz-1and
procedures, and methods of Lecture
3 2 P.b.2.C4 FS.1 Term Exam
BJT circuits using AC analysis Tutorial
(Final)
concepts.
Formulate solutions, Assignment,
procedures, and methods of Lecture Quiz-2, and
4 2 P.b.2.C4 FS.1
FET circuits using DC and AC Tutorial Term Exam
analysis concepts (Final)

16. Mapping with Course Learning Outcomes (CLOs) with Program Learning
Outcomes (PLOs)

CLOs PLO PLO PLO PLO PLO PLO PLO PLO PLO PLO PLO PLO
1 2 3 4 5 6 7 8 9 10 11 12
1 FS.1
2 FS.2
3 FS.1
4 FS.1

PART B

17. Course plan:

By the end of this course, students should be able to –

Time Teaching
Assessment Corresponding Assessment
Frame Topics Learning
Strategy COs /CLOs
(Week) Strategy
Mission & Vision of
AIUB, Dept. of EEE; Lecture
Week 1
Semiconductor Materials, Tutorial
Energy Levels, Extrinsic
EEE 2103: Electronic Devices Page 2 of 7
 Materials (n- and p-type),
Biasing p-n junctions
Semiconductor Diode, I-V
characteristics, 1,2
Zener Region, Resistance Assignment,
Levels Quiz 1 (Mid-
Term) and
Diode equivalent circuits, Load- Mid-Term
Line Analysis, Diode- Exam
Approximations, Series Diode
Configurations with DC Inputs, Lecture Judging the
Week 2 Parallel and Series-Parallel Tutorial skill of
Diode Configurations, Diode
applications: AND/OR Gates, concepts and
electronic
designs through
Half-Wave Rectification, Full- fundamental
Wave Rectification: Full bridge Lecture
Week 3 understanding
rectifier, Center-tap rectifier, Tutorial
Clipper, and clamper circuits and numerical
problems using
assignments,
Zener diodes, voltage regulation quizzes, and
with fixed and variable voltage, Lecture
Week 4 mid-term
loads (Network Analysis), BJT: Tutorial
Construction, Operation examination.
BJT: Structure Characteristics
of Common-Base (CB) and
Common-Emitter (CE)
Common-Collector (CC) Lecture
Week 5 Quiz 2 (Mid-
Configuration, BJT DC biasing: Tutorial
Operating Point, Fixed-Bias Term) and
Circuit, 2
Mid-Term
Exam

BJT DC biasing: Emitter Bias

Circuit, Voltage-Divider Bias
Week 6 Lecture
Circuit and Collector Feedback
configuration, Bias Stabilization, Tutorial
Emitter-Follower Configuration,

Week 7 MID-TERM EXAM WEEK

BJT Small Signal Low

Frequency AC Response: BJT
transistor Modeling: re Transistor
Model; CB and CE Lecture Judging skill of
Week 8 concepts and
configurations, CE Fixed Bias, Tutorial 3
Voltage-Divider Bias, Emitter- electronic Quiz-1and
Bias, Emitter-Follower, CB designs through Term Exam
amplifier critical (Final)
understanding,
JFET: Construction, numerical and
Characteristics, Depletion- and Lecture
Enhancement-Type MOSFET;
analytical
Week 9 Tutorial problems using
Construction, Operation and
Characteristics, Complementary Lecture assignments,
MOSFET (CMOS), CMOS Tutorial quizzes and
inverter, final
JFET DC Biasing: Fixed-Bias examination.
Configuration and Self-Bias Lecture
Week 10 Configuration, Voltage-
Tutorial q
Divider Biasing D-MOSFET
DC Biasing: Fixed Bias

© Department of EEE, FE, American International University-Bangladesh (AIUB) Page 3 of 7

 Configuration, Self-Bias
Configuration E-MOSFET
DC Biasing: Feedback
Biasing and
Voltage Divider Biasing
Configuration JFET small
signal model, JFET input and Lecture
Week 11
output impedance, JFET AC Tutorial Assignment,
equivalent circuit Quiz-2, and
4 Term Exam
JFET Amplifier: Fixed bias
configuration, Self-bias (Final)
configuration (bypass Rs and un- Lecture
Week 12 bypass Rs), Voltage divider Tutorial
configuration

JFET: Common-Gate
configuration, Common-Drain
configuration, D-MOSFET
amplifiers, E-MOSFET
Lecture
Week 13 amplifiers, E-MOSFET
amplifiers: Drain-Feedback Tutorial
configuration, Voltage-Divider
configuration.

Week 14 FINAL-TERM EXAM WEEK

* The faculty reserves the right to change, amend, add or delete any of the contents.

PART C

18. Assessment and Evaluation

1. Assessment Strategy:
CO/CLO 1 CO/CLO 2 CO/CLO 3 CO/CLO 4 Marks for
(marks) (marks) (marks) (marks) Grading
Assignment (Mid) 20
Quiz (Mid) 30
Term exam (Mid) 30
Quiz (Final) 15 15
Term exam (Final) 20 20
Assignment (Final) 20
Total 10 80 35 55

EEE 2103: Electronic Devices Page 4 of 7

 2. Table of Specification (TOS)
Mid-Term Exam

Level of Bloom’s Taxonomy

Remember Understand Apply Analyze Evaluate Create

No. of Items
No. of Days

No. of COs
CO No.
Topics

POI
Test Type

Test Type

Test Type

Test Type

Test Type

Test Type
Item No.

Item No.

Item No.

Item No.

Item No.

Item No.
Marks

Marks

Marks

Marks

Marks

Marks
Diode 2(a)
PS 15
Characteristics 2 2 3 3(b)
and Rectifier 1(a)
5(b)
Clipper/Clamper 4(a)
2 3 2 PS 15
Circuit
1(b)
P.a.2.C3
2(b)
Zener Diode 2 2 2 PS 10
4(b)

BJT 2 7 3 3(a) PS 10
5(a)
Total 1 14 10 50

Final Exam

Level of Bloom’s Taxonomy

Remember Understand apply Analyze Evaluate Create

No. of Items
No. of Days

No. of COs
CO No.
Topics

POI
Test Type

Test Type

Test Type

Test Type

Test Type

Test Type
Item No.

Item No.

Item No.

Item No.

Item No.

Item No.
Marks

Marks

Marks

Marks

Marks

Marks

BJT AC 2(a)
3 4 2 PS 10
Analysis 4(b)
1(b)
DC Analysis of 2(b)
FET 3(b)
4 PS
6 6 30 P.b.2.C4
4(a)
5(a)
5(b)

Small Signal AC 1(a)

4 4 2 PS 10
Analysis of FET 3(a)
Total 14 10 50

Test Type Legend: AS: Assignment; BQ: Broad question; SQ: Short question; D: Derivation; ES: Essay; EX: Exercise; GE: Group Exercise;
ID: Identification; MC: Multiple Choice; MT: Matching Type; OB: Observation; PS: Problem Solving; SA: Short Answer; TF: True or
False; VV: Viva Voce; Other please specify:

© Department of EEE, FE, American International University-Bangladesh (AIUB) Page 5 of 7

 3. Marks Distribution:
The evaluation system will be strictly followed as par the AIUB grading policy. The following grading
system will be strictly followed in this class.

Assessment Type Marking system For Theory Classes (Midterm and Final term)
Continuous Attendance 10%
Continuous Quiz 30%
Continuous Assignment 20%
Summative Midterm/Final Exam 40%
Total 100%
Final Grade/ Grand Total
Grand Total Midterm: 40%
Final Term: 60%

4. Grading Policy
Letter Grade Point Numerical %
A+ 4.00 90-100
A 3.75 85-<90
B+ 3.50 80-<85
B 3.25 75-<80
C+ 3.00 70-<75
C 2.75 65-<70
D+ 2.50 60-<65
D 2.25 50-<60
F 0.00 <50(Failed)

5. Makeup Procedure:
Students who fail to maintain the requirements and deadlines needed to contact faculty with reasoning.
Continuous assessments will be taken with agreement with the student and faculty. For the make up of
Summative assessments students need to apply for SET – B exam according to the AIUB policy.

PART D

19. Learning Materials

Formal lectures will provide the theoretical base for the subject as well as covering its practical application. A set
of lecture notes, tutorial examples, with subsequent discussion and explanation, together with suggested reading
will support and direct the students in their own personal study.
Maximum topics will be covered from the textbook. For the rest of the topics, reference books will be followed.
Some Class notes will be uploaded on the web. White board will be used for most of the time.
For some cases, multimedia projector will be used for the convenience of the students.
Students must study up to the last lecture before coming to the class and it is suggested that they should go through
the relevant chapter before coming to the class. Just being present in the class is not enough- students must
participate in classroom discussions.

Few assignments will be given to the students based on that class to test their class performance.

1. Recommended Readings (Textbook);

[1] Louis Nashelsky and Robert Boylestad, “Electronic Devices and Circuit Theory”, 11th Edition, Pearson
Education, 2013.
[2] Kenneth Smith, Adel Sedra, “Microelectronic Circuits”, 7th Edition, Oxford University Press, 2015.

EEE 2103: Electronic Devices Page 6 of 7

 2. Supplementary Readings (Reference Book);

[1] Donald A. Neamen, “Microelectronics: Circuit Analysis and Design”, 4th Edition, McGraw-Hill, 2010.
[2] Chenming Hu, Modern Semiconductor Device for Integrated Circuits, 2009.
[3] Muhammad H. Rashid, "Power Electronics Circuits, devices and applications", Prentice Hall of India Pvt
Ltd, 4th Edition, 2014.
[4] Ned Mohan, " Power Electronics: A First Course ", John Wiley and Sons, 2012.
[5] R. S. Ramshaw, "Power Electronics - Thyristor Controlled Power for Electric Motors", Springer US,
2019.
[6] Barry W Williams, "Power Electronics: Devices, Drivers, Applications and Passive Components",
McGraw-Hill, 2006. Available online: http://personal.strath.ac.uk/barry.williams/book.htm
[7] Charles A. Schuler and William L. McNamee, Industrial Electronics and Robotics, McGraw-Hill Book
Company, Singapore, 1986.
[8] Cyril W. Lander, "Power Electronics", McGraw-Hill Book Company, (UK), London, 1981.

PART E

Verification: EEE 2103: Electronic Devices

Prepared by: Checked and certified by: Approved by:

………………………………... .......................................................... ..........................................................

Dr. Md. Kabiruzzaman Nafiz Ahmed Chisty Prof. Dr. A B M Siddique Hossain
(Course Co-ordinator) Head (UG), Department of EEE, Dean, Faculty of Engineering
Faculty of Engineering

Date: 04/11/2024 Date: ............................................... Date: ...............................................

Moderated by: Moderated by:

……………………. ……………………….

Date: …………………………. Date: ………………………….

© Department of EEE, FE, American International University-Bangladesh (AIUB) Page 7 of 7