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Portable X-ray Fluorescence Spectrometry
Capabilities for In Situ Analysis
Portable X-ray Fluorescence
Spectrometry
Capabilities for In Situ Analysis
Edited by
Philip J Potts
The Open University, Milton Keynes, UK
Margaret West
West X-ray Solutions Ltd, Sheffield, UK
ISBN: 978-0-85404-552-5
A catalogue record for this book is available from the British Library
Apart from fair dealing for the purposes of research for non-commercial purposes or for
private study, criticism or review, as permitted under the Copyright, Designs and Patents
Act 1988 and the Copyright and Related Rights Regulations 2003, this publication may not
be reproduced, stored or transmitted, in any form or by any means, without the prior
permission in writing of The Royal Society of Chemistry, or in the case of reproduction in
accordance with the terms of licences issued by the Copyright Licensing Agency in the UK,
or in accordance with the terms of the licences issued by the appropriate Reproduction
Rights Organization outside the UK. Enquiries concerning reproduction outside the terms
stated here should be sent to The Royal Society of Chemistry at the address printed on
this page.
v
vi Preface
move the test piece. In many cases quantification for in situ XRF analysis may
be complex, requiring careful consideration of physical matrix effects (related
to particle size, surface irregularity, sample mineralogy and moisture), chemical
matrix effects (including absorption and enhancement), and spectral inter-
ferences. All the interfering effects, together with the relevant correction pro-
cedures, are introduced and critically reviewed. In addition, parameters related
to the applications of portable XRF spectrometers are defined, such as critical
penetration depth, detection limit, precision, accuracy, role of blank samples,
and total uncertainty of the in situ XRF measurements.
Several chapters demonstrate the ability of in situ measurements to provide
supplementary information such as the determination of coating thickness and
the identification of a manufactured alloy. Hand-held systems are particularly
suited to situations where conformance to legislation is a priority, as demon-
strated in the chapters on surveying contaminated land and workplace
monitoring.
Future improvements in portable XRF systems are considered where the
analyser will be expected to be a tool to solve problems and enable decisions to
be made rather than simply produce data. Devices today may be equipped with
wireless technology to link the spectrometer to a larger computer or with GPS
capability for linking the measurement results with the geographical location.
Given the multitude of possible situations and objects that may require testing
there is still much untapped potential for the use of in situ hand-held XRF
spectrometry. The way this potential will be exploited in the future, especially in
the area of environmental analysis, will depend on changes in regulatory re-
quirements, recognizing the continuing societal concern about minimizing the
impact of human activities. Details in this book cover the contemporary
standing of the technique, but readers will need to check and monitor changes
that will influence the applicability of PXRF in the future.
Acknowledgements
The editors and authors thank the many scientists and practitioners who
generously shared the information and data used in this book.
Philip J. Potts
Margaret West
Contents
vii
viii Contents
3.1 Introduction 39
3.2 Typical In Situ Applications of PXRF 40
3.3 Advantages and Disadvantages of In Situ PXRF 41
3.4 Uncertainty in PXRF Measurements 44
3.5 Factors Controlling the Precision, and hence
Detection Limits 50
3.6 Less Obvious Advantages and Disadvantages
of In Situ PXRF 52
3.7 Future Developments 53
References 54
4.1 Introduction 56
4.2 What is a Coating? 56
4.2.1 Brief Overview of Major Non-destructive
Methods of Coating Thickness Measurement 57
4.3 XRF Method for Coating Thickness 60
4.3.1 Theory 60
Contents ix
6.1 Introduction 98
6.1.1 Rationale behind Analysis of Alloys in the Field 98
6.1.2 Existing Methods of Alloys Identification
and XRF Analysis 101
6.2 Addressing the Problem of Alloy Identification 102
6.2.1 Defining the Task 102
6.2.2 Solutions 103
6.3 Analytical Approach 106
x Contents
Introduction, Analytical
Instrumentation and
Application Overview
PHILIP J. POTTS
Faculty of Science, The Open University, Walton Hall, Milton Keynes, MK7
6AA, UK
1
2 Chapter 1
for analysis also have immediate access to the chemical analyst operating
the laboratory to provide expertise on data quality and the resolution of
any analytical difficulties. Many techniques can be used in this way just
as effectively as PXRF, and the analytical procedures used are likely to be the
same as those adopted in a permanent laboratory. However, the particular
advantage of PXRF results from the capability of the technique to undertake
in situ analytical measurements. In this context, ‘‘in situ’’ is used to mean that
the analytical instrument is taken to, and placed in contact with, the sample. An
analytical measurement is undertaken and the result is immediately available to
the operator. The operator can then make use of this information in deciding
what to analyse next, giving rise to the concept of an ‘‘interactive sampling and
analysis’’ capability. PXRF belongs, therefore, to a special category of ‘‘hand
held’’ instrumentation.
The importance of PXRF in the field of in situ analysis is that few other
techniques are capable of this mode of operation. Considering only the tech-
niques used to determine inorganic elements (other portable techniques can
measure organic species), the capabilities of the principle techniques that can be
operated in this mode are shown in Table 1.1. The analytical characteristics of
these techniques are outlined briefly below.
conventional X-ray tube. As can be seen from Table 1.2, the closest X-ray tube
equivalents to these sources are 55Fe – Cr anode, 109Cd – Rh or Ag anode
and 238Pu – Mo anode. The 59.5 keV gamma emission from 241Am has no direct
X-ray tube equivalent, mainly because tube generators are often restricted to a
maximum operating potential of 60 or 75 kV and so are not capable of efficiently
exciting characteristic X-rays of this energy (as a rule of thumb, a potential of 3
to 4 times the X-ray emission energy is required for effective excitation). As with
all XRF applications, choice of source is dictated by the intended application,
with a combination of 55Fe, 109Cd and 241Am being required for a comprehensive
multi-element analysis capability. PXRF instruments that incorporate sources
are generally simple in design, with the source offering stable and essentially
monochromatic excitation characteristics. For elements with absorption
edges just below the source emission energies, which are particularly well excited,
the absence of a continuum component to the excitation spectrum offers the
advantage of minimizing scatter under the fluorescence lines of interest, so
avoiding a degradation in detection limits. The predictable decay characteristics
(characterized by source half-life) permits a simple calculation to be made of
the progressive reduction in source intensity based on the known half-life of
the source.
However, there are several specific disadvantages to the use of radioactive
source excitation especially in comparison with miniature X-ray tubes, as follows:
Language: English