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EDC Lab 04 Fall 2023

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EDC Lab 04 Fall 2023

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i229855
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© © All Rights Reserved
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Electronic Devices and Circuits

(EL-1004)
LABORATORY MANUAL
FALL 2023

(LAB # 04)
Analysis and Implementation of Practical Circuits
containing Diodes

Student Name: ___________________________

Roll No: _____________ Section: ___________

Date performed: _____________________, 2023


______________________________________________________________________________________________________________________________________________________

NATIONAL UNIVERSITY OF COMPUTER AND EMERGING SCIENCES, ISLAMABAD


Manual Submission Date: ______________, 2023
Prepared by: Engr. Kashif Ullah Version: 2.14
Last Edited by: Engr. Kashif Ullah Updated: Fall 2023
Verified by: Dr. Awais Ayub
_______________________________
LAB ENGINEER SIGNATURE & DATE
Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

MARKS AWARDED: /10


LAB 04 Analysis and Implementation of Practical Circuits
: containing Diodes
Objectives:
 To analyze practical diode circuits.
To construct practical diode circuits on breadboard.
 To analyze theoritical and practical results of diode circuits.
Equipment required:
 DC power supply (variable)
 Multi-meter (DMM)
 Resistor 1kohm
 IN 4007 (diode)
 Bread Board
Theory:
A diode is an electrical device allowing current to move through it in one direction with far greater
ease than in the other. The most common kind of diode in modern circuit design is
the semiconductor diode, although other diode technologies exist.
When placed in a simple battery circuit, the diode will either allow or prevent current through the it,
depending on the polarity of the applied voltage.
Forward Bias:
When the positive terminal of the battery is connected to the P-side and the negative terminal is
connected to the N-side of the diode, then the diode is in the forward bias. In forward bias the diode
does not conduct until the breakdown occurs. At a certain voltage the majority carriers get sufficient
energy to pass the junction. This voltage is called breakdown voltage and if the applied voltage is
increased beyond the voltage, a large current flows through the diode. In the reverse bias the
breakdown occurs at high voltages.
Reverse Bias:
When the positive terminal of the battery is connected to the n-side and negative terminal is connected
to the p-side, then the diode is in reverse bias. In this condition the diode does not conduct and there
is no current due to majority carriers, because the depletion layer widens with the reverse bias. The
positive ions in the n-side is repel by the positive terminal and the negative ions in the P-side are repel
by the negative terminal of the battery, so the depletion region widens.
In reverse bias, there is reverse saturation current due to the minority carriers which is very small.
The minority carriers that found themselves in the depletion region passes it and thus a small reverse
saturation current denoted by ‘Is’ flows in the reverse direction.
The diode is a device formed from a junction of n-type and p-type semiconductor material. The I-V
characteristic curve of diode is shown below.

EDC LAB NUCES, ISLAMABAD Page 2 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

Fig-3.1: Characteristic Curve of PN-junction diode

The lead connected to the p-type material is called


anode and the lead connected to n-type material is
called cathode. In general, the cathode of a diode is
marked by a solid line on diode.

Fig-3.2: Leads Indication and symbol of diode

When analyzing circuits, the real diode is usually replaced with a simple model. In the simplest form,
the diode is modeled by a switch (shown in figure).the switch is closed when the diode is forward
biased and open when the diode is reversed biased.
Fig-
3.4:
Model
of diode

Testing a diode:
Digital multimeters can test diodes using one of two methods:
1. Diode Test mode: almost always the best approach.
2. Resistance mode: typically used only if a multimeter is not equipped with a Diode Test mode.
Note: In some cases it may be necessary to remove one end of the diode from the circuit in order to
test the diode.
1. Diode Test mode:
A diode is best tested by measuring the voltage drop across the diode when it is forward-
biased. A forward-biased diode acts as a closed switch, permitting current to flow.

EDC LAB NUCES, ISLAMABAD Page 3 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________
A multimeter’s Diode Test mode produces a small voltage between test leads. The multimeter
then displays the voltage drop when the test leads are connected across a diode when forward-
biased. The Diode Test procedure is conducted as follows:
i. Make certain a) all power to the circuit is OFF and b) no voltage exists at the diode.
Voltage may be present in the circuit due to charged capacitors. If so, the capacitors need to
be discharged. Set the multimeter to measure ac or dc voltage as required.
ii. Turn the dial (rotary switch) to Diode Test mode ( ) It may share a space on the dial
with another function.
iii. Connect the test leads to the diode. Record the measurement displayed.
iv. Reverse the test leads. Record the measurement displayed.
Diode Test Analysis:
i. A good forward-based diode displays a voltage drop ranging from 0.5 to 0.8 volts for the most
commonly used silicon diodes. Some germanium diodes have a voltage drop ranging from 0.2 to
0.3 V.
ii. The multimeter displays OL when a good diode is reverse-biased. The OL reading indicates the
diode is functioning as an open switch.
iii. A bad (opened) diode does not allow current to flow in either direction. A multimeter will
display OL in both directions when the diode is opened.
iv. A shorted diode has the same voltage drop reading (approximately 0.4V) in both directions

Fig 3.5: Diode test mode


2. Resistance Test mode:
A multimeter set to the Resistance mode (Ω) can be used as an additional diode test or, as
mentioned previously, if a multimeter does not include the Diode Test mode.
i. The forward-biased resistance of a good diode should range from 1000 Ω to 10
MΩ. The resistance measurement is high when the diode is forward-biased because
current from the multimeter flows through the diode, causing the high-resistance
measurement required for testing.
ii. The reverse-biased resistance of a good diode displays OL on a multimeter. The
diode is bad if readings are the same in both directions.
Things to know about the Resistance mode when testing diodes:
i. Does not always indicate whether a diode is good or bad.

EDC LAB NUCES, ISLAMABAD Page 4 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________
ii. Should not be taken when a diode is connected in a circuit since it can produce a false
reading.
iii. Can be used to verify a diode is bad in a specific application after a Diode Test indicates a
diode is bad.
Precautions:
 Do not use current meter in parallel.
 Always break the circuit while measuring current.
 Do not use volt meter in series.
 Before applying to the circuit measured the voltages of source.
LAB TASKS
Task 1:
Connect the diode in the forward and reverse biased configurations in diode test mode(Fig 3.5). Note
the voltages and check whether the diode is faulty one or not.
a) Voltage of diode in forward biased configuration: ______________________________.
b) Voltage of diode in reverse biased configuration: _______________________________.
Connect the diode in the forward and reverse biased configurations in resistance test mode.
Note the resistances and check whether the diode is faulty one or not.
a) Resistance of diode in forward biased configuration: ______________________________.
b) Resistance of diode in reverse biased configuration: _______________________________.
Task 2:
Construct the circuits as shown below and measure output currents and volatges.
Compare Theoritical and Practical results.
(a) Calculations:

Practical Results:

With Diode With LED (Status: ON / OFF ?)

Vin (V) V (V) I (mA) V (V) I (mA)

5V

EDC LAB NUCES, ISLAMABAD Page 5 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

(b)
Calculations:

EDC LAB NUCES, ISLAMABAD Page 6 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

Practical Results:
With LED (Status: ON / OFF
With Diode
?)With LED
Vin (V) V (V) I (mA) V (V) I(mA)

5V
(c)Calculations:

Practical Results:

(d) With LED (Status: ON / OFF


With Diode
?)

Vin (V) V (V) I (mA) V (V) I (mA)

5V

Calculations:

Practical Results:
With LED x(Status: ON /
Task 3: With Diode
OFF ?)
Construct the
circuits Vin (V) V (V) I (mA) V (V) I (mA) as shown below
and measure output
currents 5V and volatges.
Compare
Theoritical and Practical results.

EDC LAB NUCES, ISLAMABAD Page 7 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________
i.

Practical Results:

Vin(V) V (V) I (mA) ID2 (mA)


Calculations: ± 5V
(a) Vin = ± 10V
± 10V

(b) Vin = ± 5V

EDC LAB NUCES, ISLAMABAD Page 8 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

ii.

Practical Results:

Vin(V) V (V) I (mA) ID2 (mA)

± 5V

± 10V

Calculations:
(a) Vin = ± 10V

EDC LAB NUCES, ISLAMABAD Page 9 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

(b) Vin = ± 5V

Task 4:
Lets connect three diodes in parallel combinations as shown below and apply three different
volatges. First how they will behave, how many of these diode will be in forward biased
conditions. Show your observations and then prove them with practical results.

+ 5V

+ 3V
EDC LAB NUCES, ISLAMABAD Page 10 of 12

+2V
Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

(a) Observations:

EDC LAB NUCES, ISLAMABAD Page 11 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

Practical Results:
Output

V (V) I (mA)

(b) Observations:

+ 5V

+ 3V

Practical Results: +2V

Output

V (V) I (mA)

EDC LAB NUCES, ISLAMABAD Page 12 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

EDC LAB NUCES, ISLAMABAD Page 13 of 12


Electronic Devices National University Roll No: __________
& Circuits of Computer and Emerging Sciences
04

Lab
(EL-1004) Islamabad

#
_________________________________________________________________________________

EDC LAB NUCES, ISLAMABAD Page 14 of 12

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