I n d u s t r i a l M e a s u r i n g Te c h n o l o g y f r o m C a r l Z e i s s

CONTURA

Specifications

Universal 3D-CMM
with measuring probe heads

Economic
Versatile
User-oriented
Accurate
CONTURA Technology

Description

• CNC-controlled measuring machines with measuring probe heads • Takes up amazingly little space by integrating the controller into the
• Crossbeam and quill are made of ceramic material which is virtually machine base.
insensitive to temperature fluctuations, humidity and contamination. • Several sizes for optimal measuring volume

Application

• For use in your production environment and tool shop, in the receiving • For production screening or individual workpiece inspection.
department and final inspection. • For pallet measurement also of different parts in several, unmanned
• For large and small parts, whether they are made of metal or plastic. shifts.

Technical Features

• Bridge-type CMM with stationary machine table and lateral bridge drive for acceleration-free measurement and constant precision within the entire
measuring volume
• Cross beam and quill made of ceramic material for insensitive factory use
• Air bearings on all four sides of the Y-guideway for additional rigidity and stability
• Capstan drives for high acceleration and speed in the CNC mode
• Computer-aided compensation of mechanical residual errors (CAA) for lasting, consistent accuracy
• Ergonomic operator panel for optimal static and dynamic construction
• Passive vibration damping system

Select Equipment
When conditions become worse or the accuracy has to be better: • Increased accuracy
• Extended temperature conditions
• Temperature sensor for workpiece, machine temperature sensor

Sensor Technology

Zeiss VASTXT universal probe Zeiss probe DT

• VAST: Variable Accuracy and Speed Probing Technology • Measuring single-point probe system
• For scanning multi-point and single point measurements • Adjustable measuring force
• Just the right one, if statements are required not only on dimension and • Dynamic single-point probing for more probing security
position but also on form • Upgradeable to scanning probe VASTXT under usage of the same
• Just the right one, if function-oriented inspection is required with ring or styli configurations and probe change rack; assembly on site.
plug gage
• Just the right one, if the probing technology is to be adapted to the mea- A reliable, long-term return on your investment – with CONTURA
suring task - and not vice versa.
• Additional CONTURA performance characteristics:
- Probe changing magazine (option)

Control

• Ergonomc control panel, switchable to creep speed for manual control of CMM with joysticks with progressive characteristics
• with two joysticks for exact driving in three axes
• and variable speed control for the measuring speed to be reduced, e.g. when performing CNC runs
for checking the collision hazard and error-free operation

Software

The Zeiss measuring library • supports process-oriented production

• links up all areas of product creation: development, design, construc- • generates complex measuring runs automatically
tion, testing, production, quality control ... • makes your processes reliable due to statistics functions and data
• uses the same data base in all areas feedback to your production department
• provides a solution for any measuring application
• is based on modern hardware platforms And last but not least:
under MS Windows, Linux and UNIX • The Zeiss measuring software guides you through your metrology
• operates interactively with CAD work with user-friendly menu prompting and programming logic.
• has networking, multi-user and multi-tasking capabilities

2
CONTURA Performance

Dimensions and Weights 7/7/6 7/10/6 10/12/6 10/16/6

Measuring range X in mm (in.) 700 (27.5) 700 (27.5) 1000 (39.4) 1000 (39.4)
Y in mm (in.) 700 (27.5) 1000 (39.4) 1200 (47.2) 1600 (63.0)
Z in mm (in.) 600 (23.6) 600 (23.6) 600 (23.6) 600 (23.6)
Overall CMM dimensions width in mm (in.) 1560 (61.5) 1560 (61.5) 1865 (73.3) 1865 (73.3)
length in mm (in.) 1535 (60.5) 1840 (72.5) 2040 (80.3) 2440 (96.1)
height in mm (in.) 2800 (110.5) 2800 (110.5) 2800 (110.5) 2800 (110.5)
Table height mm (in.) 850 (33.4) 850 (33.4) 850 (33.4) 850 (33.4)
Clearance under bridge mm (in.) 850 (33.4) 850 (33.4) 850 (33.4) 850 (33.4)
Clearance under probe head mm (in.) 680 (26.7) 680 (26.7) 680 (26.7) 680 (26.7)
Work table area X, Y mm (in.) 920 x 1016 920 x 1340 1225 x 1540 1225 x 1940
(36.2 x 40) (36.2 x 52.7) (48.2 x 60.6) (48.2 x 76.4)
CMM weight kg (lb) 1070 (2350) 1270 (2794) 2140 (4710) 2540 (5586)
Maximum workpiece weight kg (lb) 560 (1230) 730 (1606) 1150 (2530) 1500 (3300)

Accuracy Data 1) X = 700 mm (27.5 in.) X = 1000 mm (39.4 in.)

CONTURA CONTURA Select CONTURA CONTURA Select
Length (size) measuring error 2)
MPE acc. EN ISO 10360-2 for E in µm (in./1000) 2.5+L/250 2.0+L/300 at 18 - 22 °C 2.7+L/250 2.2+L/300 at 18 - 22 °C
(0.089+L/250) (0.079+L/300 at 64 - 72 °F) (0.106+L/250) (0.087+L/300 at 64 - 72 °F)
2.3+L/300 at 18 - 26 °C 2.5+L/300 at 18 - 26 °C
(0.091+L/300 at 64 - 79 °F) (0.098+L/300 at 64 - 79 °F)
Probing error
MPE acc. EN ISO 10360-2 for P in µm (in./1000) 2.4 (0.094) 2.0 (0.079) 2.4 (0.094) 2.0 (0.079)
per VDI/VDE 2617 3) (probing uncertainty) V2 in µm (in./1000) 2.0 (0.079) 1.7 (0.067) 2.2 (0.087) 1.9 (0.075)
Scanning probing error 3)
MPE per EN ISO 10360-4 for THP in µm (in./1000) 4.6 (0.181) 4.1 (0.161) 4.8 (0.189) 4.3 (0.169)
required measuring time t in sec. 72 72 72 72
Form measurement error 3)
MPE for roundness RONt (MZCI) in µm (in./1000) 4.0 (0.158) 3.4 (0.134) 4.4 (0.173) 3.8 (0.149)
acc. EN ISO 12181 4)
Scales Zeiss glass scales; reflected light system, photoelectric
Resolution 0.2 µm (0.000 008 in.)
1) Stylus for acceptance test: Length 60 mm (2.4 in.), stylus tip diameter 8 mm (0.32 in.)
2) L = measured length in mm (in.).
3) For VASTXT only
4) Used filter 50 W/U, scanning speed at V2 and roundness: 5 mm/s (0.2 ips)

Dynamics

Travel speeds axial vectorial

Set-up: 0 to 70 mm/s (0 to 2.8 ips)
Measuring operation: max. 250 mm/s (10 ips) max. 425 mm/s (17 ips)
Creep speed: 0 to 5 mm/s (0 to 0.2 ips)
Acceleration: max. 1000 mm/s (39 ips )
2 2
max. 1700 mm/s2 (67 ips2)

Probe Systems

Probe systems Zeiss VASTXT universal probe for scanning and single point measurements;
Zeiss DT for single point measurements.
Full collision protection of mobile part up to v=70 mm/s (2.8 ips)
Measuring force during data acquisition: Variable, 50 to 1000 mN
Styli weight: Maximum 500 g (17.6 oz.) (incl. adapter plate)
Probe length: Maximum 500 mm (19.7 in.)
Styli tip diameter: Minimum 1 mm (0.04 in.)
Probe changing system Manual change by push-button control at panel (electromagnetic clamping)
Optional: CNC change in connection with probe magazine
or ProMax active probe magazine (without loss in measuring range)

Supply Data

Power supply 1/N/PE 100/110/115/120/125/230/240 V (±10%); 50-60 Hz (±3.5%)

Max. power consumption: 2000 VA
Air supply Supply pressure 6 to 8 bar (87 to 145 psi), pre-filtered,
Approx. consumption at 5.0 bar (72 psi) 30 l/min (1.2 cfm),
Air quality according to ISO 8573 part 1, classification 4

Ambient Requirements

Air humidity 40% to 60%

Permissible ambient temperature +17°C to +35°C (63 °F to 95 °F)
CONTURA CONTURA Select
Temperature ranges in which Ambient temperature 18 - 22 °C (65 °F - 72 °F) 18 - 26 °C (65 °F - 79 °F)
the specified maximum permissible Thermal fluctuations per hour 1.0 K/h (1.8 °F/h) 2.0 (3.6 °F/h)
errors are guaranteed per day 1.5 K/h (2.7 °F/h) 3.0 K/h (6.0 °F/h)
Thermal gradient spacial 1.0 K/m (0.5 °F/ft) 1.0 K/m (0.5 °F/ft)

3
CONTURA

Dimensions in mm (in.)

CONTURA 7/7/6 7/10/6 10/12/6 10/16/6 100 mm (4 in.) min. clearance

b 1535 1840 2040 2440
(60.4) (72.4) (80.3) (96.1)

60-22-209/III-e Printed in Germany. VII/2002 Noo

Printed on chlorine-free paper.

Subject to technical modification and to changes in scope and design.

© Carl Zeiss © Conception, text and design by Carl Zeiss.

c 920 920 1225 1225
(36.2) (36.2) (48.2) (48.2)
Transport height
d 1560 1560 1865 1865 of secured
machine array
(61.3) (61.3) (73.3) (73.3) 838
(33) 2800
max. (110) Transport height
680 2620
(103) of secured
(26.8) c machine array
without palett
without Z-array

850 2200
DIN EN ISO 9001 (33.5) (86.6)

Our CONTURA CMMs comply with CE and GS regulations.

The Carl Zeiss quality assurance system is certified 220
in accordance with DIN EN ISO 9001. (8.7)
d b

Explanations to CONTURA accuracy

MPE = Maximum Permissible Error

As defined in the DIN EN ISO 10360, every specification for accuracy will be noted with "Maximum Permissible
error (MPE)". MPE defines a maximum value that a measuring deviation is not allowed to exceed. Accuracy re-
sults are represented as an index number. MPEE describes the length measuring error and MPEP describes the
probing error.

Z
Maximum Permissible Error for length measurement Maximum Permissible Error for probing

MPEE 5

3
MPEP
7
To determine length measuring error, calibra- 2
6 To determine the probing error, a sphere
4
ted gage blocks or step gage blocks are Y (diameter 10 to 50 mm) with negligible form
measured. With every measurement, 5 diffe- error will be probed on 25 recommended
1
rent lengths in 7 different positions within positions (from ISO 10360-2). From the
the measuring range of the CMM will be X measurement results, a so called Gaussian
determined according to ISO 10360-2. least squares sphere is calculated. The range
Every length will be measured 3 times. None of the 105 measurements of radial distances from ther associated
are allowed to deviate from the calibrated value by more then the speci- is not allowed to exceed the specification.
fied amount. The specification is in most cases dependent on the length,
written in the form MPEE=A+L/K, whereby L represents the length. Some-
times the formula will be written as MPEE=A+F•L/K, in which case the for-
mula must be converted in order to compare to it to the first variation. Maximum Permissible Error for scanning probing
For example, the values MPEE=2.5+1.5•L/333 and MPEE=2.5+L/220 are
the same.
MPETHP and MPE t
2
To determine the scanning probing error, 3
1
a sphere (diameter of 25 mm) with negli-
gible form error will be scanned along 4
Maximum Permissible Error for form measurement (roundness) 4 recommended scanning lines (from
ISO 10360-4). When comparing the
t
MPERONt(MZCI) measurements with the MPETHP specifica-
tions, there are two conditions that must be
The application of CMMs for form meas- met. First, the range that is determined from
urement is discussed in VDI 2617, sheet radial distances from the associated sphere is not allowed to exceed the
2.2. Parameters for roundness measure- specification (see MPEP). Second, the deviation between the radial distan-
ments are defined in DIN EN ISO 12181. ces and the calibrated sphere diameter is not allowed to exceed the speci-
For testing, a 50 mm ring gage with negligible form error is measured fication. Additionally, the time required (t) for the test must be specified,
with high point density (with Zeiss: scanning mode). From the measure- as speed has an enormous influence on the results.
ment results, a so called Tschebyscheff-circle (MZCI = minimum zone cir- When the accuracy and time needed is indicated, the specification
cle) is calculated. The outcome of the form deviation results in the range of the scanning probing error is an important indicator of the pro-
of radial distances of this circle. It is not allowed to exceed the specification. ductivity of a CMM.

Carl Zeiss Carl Zeiss

Industrial Metrology IMT Corporation
73446 Oberkochen/Germany 6250 Sycamore Lane N.E.
Sales: +49 18 03 33 63 36 Minneapolis, MN 55369
Service: +49 18 03 33 63 37 Phone: +1 763 533-9990
Fax: +49 73 64 20 38 70 Fax: +1 763 533-0219
E-mail: [email protected] E-Mail: [email protected]
Internet: www.zeiss.de/imt Internet: www.zeiss.com/imt