bq25710
bq25710
BQ25710 SMBus Narrow VDC Buck-Boost Battery Charge Controller With System
Power Monitor and Processor Hot Monitor
– ±0.5% Charge voltage regulation
1 Features – ±2% Input/charge current regulation
• Pin-to-pin and software compatible to BQ25700A – ±2% Input/charge current monitor
• Charge 1s to 4s battery from wide range of input – ±4% Power monitor
source • Safety
– 3.5-V to 24-V Input operating voltage – Thermal shutdown
– Supports USB2.0, USB 3.0, USB 3.1 (Type – Input, system, battery overvoltage protection
C), and USB Power Delivery (USB-PD) input – Input, MOSFET, inductor overcurrent protection
current settings • Safety-Related Certifications:
– Seamless transition among buck, buck-boost – IEC 62368-1 CB Certification
and boost operations • Low battery quiescent current
– Input current and voltage regulation (IDPM and • Package: 32-Pin 4 × 4 WQFN
VDPM) against source overload
• Power/current monitor for CPU throttling 2 Applications
– Comprehensive PROCHOT profile, IMVP8/ • Ultra-Books, notebooks, detachable, tablet PCs
IMVP9 compliant and power bank
– Input and battery current monitor • Industrial and medical equipment
– System power monitor, IMVP8/IMVP9 • Portable equipment with rechargeable batteries
compliant
• Narrow voltage DC (NVDC) power path
3 Description
management This device is a synchronous NVDC buck-boost
– Instant-on with no battery or depleted battery battery charge controller, offering a low component
– Battery supplements system when adapter is count, high efficiency solution for space constrained,
fully-loaded 1s-4s battery charging applications.
– Battery MOSFET ideal diode operation in Device Information
supplement mode
PART NUMBER PACKAGE(1) BODY SIZE (NOM)
• Power up USB port from battery (USB OTG)
BQ25710 WQFN (32) 4.00 mm × 4.00 mm
– 3-V to 20.8-V VOTG With 8-mV resolution
– Output current limit up to 6.4 A with 50-mA (1) For all available packages, see the orderable addendum at
resolution the end of the data sheet.
• TI patented Pass Through Mode (PTM) for system
power efficiency improvement and battery fast
charging
• When system is powered by battery only, Vmin
Active Protection (VAP) mode supplements battery
from input capacitors during system peak power
spike
• Input Current Optimizer (ICO) to extract max input
power
• 800-kHz or 1.2-MHz Programmable switching
frequency for 2.2-µH or 1.0-µH inductor
• Host control interface for flexible system
configuration
– SMBus Port optimal system performance and
status reporting Application Diagram
– Hardware pin to set input current limit without
EC control
• Integrated ADC to monitor voltage, current and
power
• High accuracy for the regulation and monitor
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com
Table of Contents
1 Features............................................................................1 9.5 Programming............................................................ 32
2 Applications..................................................................... 1 9.6 Register Map.............................................................34
3 Description.......................................................................1 10 Application and Implementation................................ 72
4 Revision History.............................................................. 2 10.1 Application Information........................................... 72
5 Description (continued).................................................. 4 10.2 Typical Application.................................................. 72
6 Device Comparison Table...............................................5 11 Power Supply Recommendations..............................80
7 Pin Configuration and Functions...................................6 12 Layout...........................................................................81
8 Specifications.................................................................. 9 12.1 Layout Guidelines................................................... 81
8.1 Absolute Maximum Ratings........................................ 9 12.2 Layout Example...................................................... 82
8.2 ESD Ratings............................................................... 9 13 Device and Documentation Support..........................83
8.3 Recommended Operating Conditions.........................9 13.1 Device Support....................................................... 83
8.4 Thermal Information..................................................10 13.2 Documentation Support.......................................... 83
8.5 Electrical Characteristics...........................................10 13.3 Receiving Notification of Documentation Updates..83
8.6 Timing Requirements................................................ 18 13.4 Support Resources................................................. 83
8.7 Typical Characteristics.............................................. 20 13.5 Trademarks............................................................. 83
9 Detailed Description......................................................22 13.6 Electrostatic Discharge Caution..............................83
9.1 Overview................................................................... 22 13.7 Glossary..................................................................83
9.2 Functional Block Diagram......................................... 23 14 Mechanical, Packaging, and Orderable
9.3 Feature Description...................................................24 Information.................................................................... 84
9.4 Device Functional Modes..........................................31
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (February 2021) to Revision B (April 2023) Page
• Added Safety-Related Certifications: IEC 62368-1 CB Certification to Features............................................... 1
• Added bullet 2 in Power-Up from DC Source................................................................................................... 24
• Changed IVBUS in Figure 9-1 ......................................................................................................................... 27
• Changed EN_PROCHOT_LPWR 01b and 10b in ChargeOption1 Register.................................................... 39
• Changed ICRIT_DEG 01b, 10b, and 11b and INOM_DEG 0b and 1b in ProchotOption0 Register.................45
• Changed IDCHG_DEG and PROCHOT_PROFILE_VDPM in ProchotOption1 Register.................................47
• Changed PROCHOT_WIDTH 11b in ProchotStatus Register.......................................................................... 53
• Changed list in System Voltage Regulation......................................................................................................59
5 Description (continued)
The NVDC configuration allows the system to be regulated at battery voltage, but not drop below system
minimum voltage. The system keeps operating even when the battery is completely discharged or removed.
When load power exceeds input source rating, the battery goes into supplement mode and prevents the system
from crashing.
The BQ25710 charges battery from a wide range of input sources including USB adapter, high voltage USB PD
sources and traditional adapters.
During power up, the charger sets converter to buck, boost or buck-boost configuration based on input source
and battery conditions. The charger automatically transits among buck, boost and buck-boost configuration
without host control.
In the absence of an input source, the BQ25710 supports USB On-the-Go (OTG) function from 1- to 4-cell
battery to generate adjustable 3 V to 20.8 V on VBUS with 8 mV resolution. The OTG output voltage transition
slew rate can be configurable, which is complied with the USB PD 3.0 PPS specifications.
When only battery powers the system and no external load is connected to the USB OTG port, the BQ25710
supports the Vmin Active Protection (VAP) feature, in which the device charges up the VBUS voltage from the
battery to store some energy in the input decoupling capacitors. During the system peak power spike, the huge
current drawing from the battery creates a larger voltage drop across the impedance from the battery to the
system. The energy stored in the input capacitors will supplement the system, to prevent the system voltage
from dropping below the minimum system voltage and causing the system crash. This Vmin Active Protection
(VAP) is designed to absorb system power peaks during periods of SOC high power demand, which is highly
recommended by Intel for the platforms with 1S~2S battery.
The BQ25710 monitors adapter current, battery current and system power. The flexibly programmed PROCHOT
output goes directly to CPU for throttle back when needed.
LODRV1
LODRV2
HIDRV1
BTST1
BTST2
REGN
PGND
SW1
32
31
30
29
28
27
26
25
VBUS 1 24 HIDRV2
ACN 2 23 SW2
ACP 3 22 VSYS
CHRG_OK 4 21 BATDRV
Thermal
OTG/VAP 5 Pad 20 SRP
ILIM_HIZ 6 19 SRN
VDDA 7 18 CELL_BATPRESZ
IADPT 8 17 COMP2
10
11
12
13
14
15
16
9
IBAT
PSYS
PROCHOT
SDA
SCL
CMPIN
CMPOUT
COMP1
8 Specifications
8.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1) (2)
MIN MAX UNIT
SRN, SRP, ACN, ACP, VBUS, VSYS –0.3 30
SW1, SW2 –2 30
BTST1, BTST2, HIDRV1, HIDRV2, /BATDRV –0.3 36
LODRV1, LODRV2 (25nS) –4 7
HIDRV1, HIDRV2 (25nS) –4 36
Voltage V
SW1, SW2 (25nS) –4 30
SDA, SCL, REGN, PSYS, CHRG_OK, OTG/VAP, CELL_BATPRESZ,
ILIM_HIZ, LODRV1, LODRV2, VDDA, COMP1, COMP2, CMPIN, –0.3 7
CMPOUT
/PROCHOT –0.3 5.5
IADPT, IBAT, PSYS –0.3 3.6
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
(2) All voltages are with respect to GND if not specified. Currents are positive into, negative out of the specified terminal. Consult
Packaging Section of the data book for thermal limitations and considerations of packages.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(1) Devices participating in a transfer will timeout when any clock low exceeds the 25ms minimum timeout period. Devices that have
detected a timeout condition must reset the communication no later than the 35 ms maximum timeout period. Both a master and a
slave must adhere to the maximum value specified as it incorporates the cumulative stretch limit for both a master (10 ms) and a slave
(25 ms).
(2) User can adjust threshold via SMBus ChargeOption() REG0x12().
85 85
80 80
Efficiency (%)
Efficiency (%)
75 75
70 70
VOUT = 6.1 V VOUT = 6.1 V
65 VOUT = 8.4 V 65 VOUT = 8.4 V
VOUT = 9.2 V VOUT = 9.2 V
VOUT = 12.5 V VOUT = 12.5 V
60 60
0 0.01 0.02 0.03 0.04 0.05 0 0.01 0.02 0.03 0.04 0.05
Output Current (A) D001
Output Current (A) D001
VIN = 5 V VIN = 12 V
Figure 8-1. Light Load Efficiency Figure 8-2. Light Load Efficiency
90 96
94
85
92
80
Efficiency (%)
Efficiency (%)
90
75 88
86
70
VOUT = 6.1 V 84 VOUT = 3.7 V
65 VOUT = 8.4 V VOUT = 7.4 V
VOUT = 9.2 V 82 VOUT = 11.1 V
VOUT = 12.5 V VOUT = 14.8 V
60 80
0 0.01 0.02 0.03 0.04 0.05 0 1 2 3 4 5 6
Output Current (A) D001
Output Current (A) D001
VIN = 20 V VIN = 5 V
Figure 8-3. Light Load Efficiency Figure 8-4. System Efficiency
98 98
96 96
94 94
92 92
Efficiency (%)
Efficiency (%)
90 90
88 88
86 86
VIN = 9 V VIN = 12 V
Figure 8-5. System Efficiency Figure 8-6. System Efficiency
Efficiency (%)
90
90
88
88
86
86
VOUT = 3.7 V 84
84
VOUT = 7.4 V
82 VOUT = 11.1 V 82
VOUT = 14.8 V
80 80
0 1 2 3 4 5 6 0 1 2 3 4 5
Output Current (A) D001
Output Current (A) D001
94 96
94
92
92
Efficiency (%)
Efficiency (%)
90
90
88
88
86
86
84
84
VOTG = 5 V VOTG = 5 V
82 VOTG = 12 V 82 VOTG = 12 V
VOTG = 20 V VOTG = 20 V
80 80
0 1 2 3 4 5 6 0 1 2 3 4 5 6
Output Current (A) D001
Output Current (A) D001
Figure 8-9. OTG Efficiency with 2S Battery Figure 8-10. OTG Efficiency with 3S Battery
98
96
94
92
Efficiency (%)
90
88
86
84
VOTG = 5 V
82 VOTG = 12 V
VOTG = 20 V
80
0 1 2 3 4 5 6
Output Current (A) D001
Figure 8-11. OTG Efficiency with 4S Battery
9 Detailed Description
9.1 Overview
The BQ25710 is a Narrow VDC buck-boost charger controller for portable electronics such as notebook,
detachable, ultrabook, tablet and other mobile devices with rechargeable batteries. It provides seamless
transition among different converter operation modes (buck, boost, or buck boost), fast transient response, and
high light load efficiency.
BQ25710 supports wide range of power sources, including USB PD ports, legacy USB ports, traditional ACDC
adapters, etc. It takes input voltage from 3.5 V to 24 V, and charges battery of 1-4 series. In the absence of an
input source, BQ25710 supports USB On-the-Go (OTG) function from 1-4 cell battery to generate adjustable 3
V ~ 20.8 V at USB port with 8mV resolution. The OTG output voltage transition slew rate can be configurable,
which complies with the USB Power Delivery 3.0 PPS specifications.
When only the battery powers the system and no external load is connected to the USB OTG port, BQ25710
provides the Vmin Active Protection (VAP) feature. In the VAP operation, BQ25710 first charges up the voltage
of the input decoupling capacitors at VBUS to store a certain amount of energy. During the system peak power
spike, the huge current drawn from the battery introduces a larger voltage drop across the impedance from the
battery to the system. Then the energy stored in the input capacitors will supplement the system, to prevent the
system voltage from drooping below the minimum system voltage and leading the system to black screen. This
VAP is designed to absorb system power peaks during the periods of high demand to improve the system turbo
performance, which is highly recommended by Intel for the platforms with 1S~2S battery.
BQ25710 features Dynamic Power Management (DPM) to limit the input power and avoid AC adapter
overloading. During battery charging, as the system power increases, the charging current will reduce to
maintain total input current below adapter rating. If system power demand temporarily exceeds adapter rating,
BQ25710 supports NVDC architecture to allow battery discharge energy to supplement system power. For
details, refer to Section 9.6.5.1.
In order to be compliant with an Intel IMVP8 / IMVP9 compliant system, BQ25710 includes PSYS function to
monitor the total platform power from adapter and battery. Besides PSYS, it provides both an independent input
current buffer (IADPT) and a battery current buffer (IBAT) with highly accurate current sense amplifiers. If the
platform power exceeds the available power from adapter and battery, a PROCHOT signal is asserted to CPU
so that the CPU optimizes its performance to the power available to the system.
The SMBus controls input current, charge current and charge voltage registers with high resolution, high
accuracy regulation limits. It also sets the PROCHOT timing and threshold profile to meet system requirements.
CHRG_OK 4
CHRG_OK_DRV 50ms Rising
Deglitch
BQ25710 Block Diagram
** programmable in register
50ms Rising EN_REGN
Deglitch
3.9V
VBUS 1 VREF_CMP**
CMP_DEG**
ACOVP
14 CMPIN
26V 15 CMPOUT
VREF_VDPM or VREF_VOTG
16
COMP1
VSNS_VDPM or VSYS_VOTG
EN_HIZ 17
COMP2
ILIM_HIZ 6 Decoder VREF_ILIM
VSYS
VREF_IDPM, or VREF_IOTG
23 SW2
VSNS_VSYS
ACN VSNS_VBAT Over
(ACP-ACN) VSNS_ICHG Current
PSYS 10
SRN
VSNS_IDCHG Over
(SRN-SRP) VSNS_IDPM Voltage 26 LODRV2
VSNS_VDPM Detect
EN_HIZ
SMBUS
EN_LEARN
Interface BATPRESZ
SDA 12 EN_LDO
ChargeOption0() Decoder
EN_CHRG CELL_CONFIG 18 CELL_BATPRESZ
ChargeOption1() EN_OTG
ChargeOption2()
ChargeCurrent() VREF_VSYS
SCL 13
ChargeVoltage() VREF_VBAT
VREF_ICHG
InputCurrent() Loop
VREF_IDPM IADPT
OTG/VAP 5 InputVoltage() Regulation Processor
VREF_VDPM IBAT
MinSysVoltage() Reference Hot 11 PROCHOT
VREF_IOTG VSYS
OTGVoltage() VREF_VOTG CHRG_OK
OTGCurrent()
For proper PSYS functionality, RAC and RSR values are limited to 10 mΩ and 20 mΩ.
To minimize the quiescent current, the PSYS function is disabled by default. It can be enabled by setting
REG0x30[12] = 1.
9.3.7 Input Source Dynamic Power Manage
Refer to Section 9.6.6.
9.3.8 Two-Level Adapter Current Limit (Peak Power Mode)
Usually adapter can supply current higher than DC rating for a few milliseconds to tens of milliseconds. The
charger employs two-level input current limit, or peak power mode, to fully utilize the overloading capability and
minimize battery discharge during CPU turbo mode. Peak power mode is enabled in REG0x31[13:12]. The DC
current limit, or ILIM1, is the same as adapter DC current, set in REG0x3F(). The overloading current, or ILIM2, is
set in REG0x33[15:11], as a percentage of ILIM1.
When the charger detects input current surge and battery discharge due to load transient (both the adapter and
battery support the system together), or when the charger detects the system voltage starts to drop due to load
transient (only the adapter supports the system), the charger will first apply ILIM2 for TOVLD in REG0x31[15:14],
and then ILIM1 for up to TMAX – TOVLD time. TMAX is programmed in REG0x31[9:8]. After TMAX, if the load is
still high, another peak power cycle starts. Charging is disabled during TMAX,; once TMAX, expires, charging
continues. If TOVLD is programmed to be equal to TMAX, then peak power mode is always on.
ICRIT_DEG
ICRIT
ILIM2
ILIM1
TOVLD
TOVLD
TMAX
IBUS
ISYS
IBAT 0A
Baery Discharge
PROCHOT_WIDTH
PROCHOT
PP_ICRIT
IADPT
+
ICRIT Adjustable
Deglitch EXIT_VAP
Low Pass
(triggered by IN_VAP VDD
Filter PP_INOM
falling edge)
+
INOM
PP_IDCHG
IDCHG
+ PROCHOT
IDCHG_VTH
< 0.3V
10ms
Debounce
PP_VSYS
VSYS_VTH +
V_SRP
• 10ms
Fixed
Deglitch
PP_VDPM
A*VDPM +
VBUS
1.2 V PROCHOT
Independent
Comparator
CMPIN
Voltage v VSYS
BQ25710
configuration will change with CELL pin voltage. When SYSOVP happens, the device latches off the converter.
REG0x20[4] is set to 1. The user can clear latch-off by either writing 0 to the SYSOVP bit or removing and
plugging in the adapter again. After latch-off is cleared, the converter starts again.
9.3.10.5 Battery Overvoltage Protection (BATOVP)
Battery over-voltage may happen when battery is removed during charging or the user plugs in a wrong battery.
The BATOVP threshold is 104% (1 s) or 102% (2 s to 4 s) of regulation voltage set in REG0x15().
9.3.10.6 Battery Short
If BAT voltage falls below SYSMIN during charging, the maximum current is limited to 384 mA.
9.3.10.7 System Short Hiccup Mode
VSYS pin is monitoring the system voltage, when Vsys is lower than 2.4V, after 2ms deglitch time, the charger
will be shut down for 500ms. The charger will restart for 10ms and measure Vsys again, if it is still lower than
2.4V, the charger will be shut down again. This hiccup mode will be tried continuously, if the charger restart is
failed for 7 times in 90 second, the charger will be latched off. REG0x20[3] will be set to 1 to report a system
short fault. The charger only can be enabled again once the host writes REG0x20[3]= 0.
The charger system short hiccup mode can be disabled by writing REG0x12[6]= 1.
9.3.10.8 Thermal Shutdown (TSHUT)
The WQFN package has low thermal impedance, which provides good thermal conduction from the silicon to
the ambient, to keep junction temperatures low. As added level of protection, the charger converter turns off for
self-protection whenever the junction temperature exceeds the 155°C. The charger stays off until the junction
temperature falls below 135°C. During thermal shut down, the LDO current limit is reduced to 16 mA and REGN
LDO stays off. When the temperature falls below 135°C, charge can be resumed with soft start.
9.4 Device Functional Modes
9.4.1 Forward Mode
When input source is connected to VBUS, BQ25710 is in forward mode to regulate system and charge battery.
9.4.1.1 System Voltage Regulation with Narrow VDC Architecture
BQ25710 employs Narrow VDC architecture (NVDC) with BATFET separating system from battery. The
minimum system voltage is set by MinSystemVoltage(). Even with a deeply depleted battery, the system is
regulated above the minimum system voltage.
When the battery is below minimum system voltage setting, the BATFET operates in linear mode (LDO mode).
As the battery voltage rises above the minimum system voltage, BATFET is fully on when charging or in
supplement mode and the voltage difference between the system and battery is the VDS of BATFET. System
voltage is regulated 160 mV above battery voltage when BATFET is off (no charging or no supplement current).
The BATDRV pin is only able to drive a battery MOSFET with Ciss lower than 5nF. The Ciss in the range of
1nF~3nF is recommended.
See Section 9.6.5.1 for details on system voltage regulation and register programming.
9.4.1.2 Battery Charging
BQ25710 charges 1-4 cell battery in constant current (CC), and constant voltage (CV) mode. Based
on CELL_BATPREZ pin setting, the charger sets default battery voltage 4.2V/cell to ChargeVoltage(), or
REG0x15(). According to battery capacity, the host programs appropriate charge current to ChargeCurrent(),
or REG0x14(). When battery is full or battery is not in good condition to charge, host terminates charge by
setting REG0x12[0] to 1, or setting ChargeCurrent() to zero.
See Section 9.3 for details on register programming.
SMBCLK
SMBDATA
B = MSB of address clocked into slave I = Slave pulls SMBDATA line low
E = Slave pulls SMBDATA line low L = Stop condition, data executed by slave
A B C D E F G H I J K
tLOW tHIGH
SMBCLK
SMBDATA
A = START CONDITION E = SLAVE PULLS SMBDATA LINE LOW I = ACKNOWLEDGE CLOCK PULSE
B = MSB of address clocked into slave H = LSB of data clocked into master
7 6 5 4 3 2 1 0
Reserved SYS_SHORT EN_LEARN IADPT_GAIN IBAT_GAIN EN_LDO EN_IDPM CHRG_INHIBIT
DISABLE
R/W R/W R/W R/W R/W R/W R/W R/W
Table 9-7. ChargeOption0 Register (SMBus address = 12h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
10 EN_OOA R/W 1b Out-of-Audio Enable
0b: No limit of PFM burst frequency
1b: Set minimum PFM burst frequency to above 25 kHz to avoid audio noise
<default at POR>
9 PWM_FREQ R/W 1b Switching Frequency
Two converter switching frequencies. One for small inductor and the other for
big inductor.
Recommend 800 kHz with 2.2 µH or 3.3 µH, and 1.2 MHz with 1 µH or 1.5 µH.
0b: 1200 kHz
1b: 800 kHz <default at POR>
8 LOW_PTM_ R/W 1b PTM mode input voltage and current ripple reduction.
RIPPLE 0b: Disable
1b: Enable <default at POR>
Table 9-8. ChargeOption0 Register (SMBus address = 12h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
1 EN_IDPM R/W 1b IDPM Enable
Host writes this bit to enable IDPM regulation loop. When the IDPM is disabled
by the charger (refer to IDPM_AUTO_DISABLE), this bit goes LOW.
0b: IDPM disabled
1b: IDPM enabled <default at POR>
0 CHRG_INHIBIT R/W 0b Charge Inhibit
When this bit is 0, battery charging will start with valid values in the
MaxChargeVoltage register and the ChargeCurrent register.
0b: Enable Charge <default at POR>
1b: Inhibit Charge
7 6 5 4 3 2 1 0
CMP_REF CMP_POL CMP_DEG FORCE_ EN_PTM EN_SHIP_ AUTO_
LATCHOFF DCHG WAKEUP_EN
R/W R/W R/W R/W R/W R/W R/W
7 6 5 4 3 2 1 0
EN_EXTILIM EN_ICHG Q2_OCP ACX_OCP EN_ACOC ACOC_VTH EN_ _VTH
_IDCHG
R/W R/W R/W R/W R/W R/W R/W R/W
7 6 5 4 3 2 1 0
Reserved EN_CONS OTG_VAP IL_AVG OTG_RANGE BATFETOFF_ PSYS_OTG_
VAP _MODE _LOW HIZ IDCHG
R/W R/W R/W R/W R/W R/W R/W
Table 9-14. ChargeOption3 Register (SMBus address = 32h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
5 OTG_VAP_MODE R/W 1b The selection of the external OTG/VAP pin control.
0b: the external OTG/VAP pin controls the EN/DIS VAP mode
1b: the external OTG/VAP pin controls the EN/DIS OTG mode <default at
POR>
4-3 IL_AVG R/W 10b 4 levels inductor average current clamp.
00b: 6A
01b: 10A
10b: 15A <default at POR>
11b: Disabled
2 OTG_RANGE_LOW R/W 0b Selection of the different OTG ouput voltage range.
0b: VOTG high range 4.28 V - 20.8 V <default at POR>
1b: VOTG low range 3 V - 19.52 V
1 BATFETOFF_ R/W 0b Control BATFET during HIZ mode.
HIZ 0b: BATFET on during Hi-Z <default at POR>
1b: BATFET off during Hi-Z
0 PSYS_OTG_ R/W 0b PSYS function during OTG mode.
IDCHG 0b: PSYS as battery discharge power minus OTG output power <default
at POR>
1b: PSYS as battery discharge power only
7-4 3-2 1 0
VSYS_TH1 VSYS_TH2 INOM_DEG LOWER_
PROCHOT
_VDPM
R/W R/W R/W R/W
Table 9-16. ProchotOption0 Register (SMBus address = 33h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
3-2 VSYS_TH2 R/W 01b VSYS Threshold to assert /PROCHOT_VSYS.
Measure on VSYS with fixed 5-µs deglitch time. Trigger when SYS pin voltage is
below the thresholds.
2S - 4S battery
00b: 5.9V; 01b: 6.2V <default at POR>;
10b: 6.5V; 11b: 6.8V.
1S battery
00b: 3.1V; 01b: 3.3V <default at POR>;
10b: 3.5V; 11b: 3.7V.
1 INOM_DEG R/W 0b INOM Deglitch Time
INOM is always 10% above IDPM in 0x3FH. Measure current between ACP and
ACN.
Trigger when the current is above this threshold.
0b: 1 ms <default at POR>
1b: 50 ms
0 LOWER_ R/W 0b Enable the lower threshold of the PROCHOT_VDPM comparator
PROCHOT 0b: the threshold of the PROCHOT_VDPM comparator follows the same VinDPM
_VDPM
REG0x3D() setting.
1b: the threshold of the PROCHOT_VDPM comparator is lower and determined
by REG0x33[8] setting. <default at POR>
7 6 5 4 3 2 1 0
PP_VDPM PROCHOT_PR PP_ICRIT PP_INOM PP_IDCHG PP_VSYS PP_BATPRES PP_ACOK
OFILE_IC
R/W R/W R/W R/W R/W R/W R/W R/W
When the REG0x34h[7:0] are set to be disabled, the PROCHOT event associated with that bit will not be
reported in the PROCHOT status register REG0x21h[7:0] any more, and the PROCHOT pin will not be pulled
low any more if the event happens.
Table 9-17. ProchotOption1 Register (SMBus address = 34h) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15-10 IDCHG_VTH R/W 100000b IDCHG Threshold
6 bit, range, range 0 A to 32256 mA, step 512 mA. There is a 128 mA offset
Measure current between SRN and SRP.
Trigger when the discharge current is above the threshold.
If the value is programmed to 000000b PROCHOT is always triggered.
Default: 16384 mA or 100000b
9-8 IDCHG_DEG R/W 01b Typical IDCHG Deglitch Time
00b: 2 ms
01b: 130 µs <default at POR>
10b: 8 ms
11b: 16 ms
Table 9-18. ProchotOption1 Register (SMBus address = 34h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
1 PROCHOT R/W 0b 0b: disable <default at POR>
_PROFILE_BATPRES 1b: enable (one-shot falling edge triggered)
If BATPRES is enabled in PROCHOT after the battery is removed, it will
immediately send out one-shot PROCHOT pulse.
0 PROCHOT R/W 0b 0b: disable <default at POR>
_PROFILE_ACOK 1b: enable
ChargeOption0[15] = 0 to assert PROCHOT pulse after adapter removal.
If PROCHOT_PROFILE_ACOK is enabled in PROCHOT after the adapter is
removed, it will be pulled low.
7 6 5 4 3 2 1 0
EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_
CMPIN VBUS PSYS IIN IDCHG ICHG VSYS VBAT
R/W R/W R/W R/W R/W R/W R/W R/W
The ADC registers are read in the following order: VBAT, VSYS, ICHG, IDCHG, IIN, PSYS, VBUS, CMPIN. ADC
is disabled in low power mode. Before enabling ADC, low power mode should be disabled first.
Table 9-19. ADCOption Register (SMBus address = 35h) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 ADC_CONV R/W 0b Typical ADC conversion time is 10 ms.
0b: One-shot update. Do one set of conversion updates to registers
REG0x23(), REG0x24(), REG0x25(), and REG0x26() after ADC_START =
1.
1b: Continuous update. Do a set of conversion updates to registers
REG0x23(), REG0x24(), REG0x25(), and REG0x26() every 1 sec.
14 ADC_START R/W 0b 0b: No ADC conversion
1b: Start ADC conversion. After the one-shot update is complete, this bit
automatically resets to zero
13 ADC_ R/W 1b ADC input voltage range. When input voltage is below 5 V, or battery is 1S,
FULLSCALE full scale 2.04 V is recommended.
0b: 2.04 V
1b: 3.06 V <default at POR>
12-8 Reserved R/W 00000b Reserved
Table 9-20. ADCOption Register (SMBus address = 35h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
0 EN_ADC_VBAT R/W 0b 0b: Disable <default at POR>
1b: Enable
Table 9-22. ChargerStatus Register (SMBus address = 20h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
4 SYSOVP_STAT R/W 0b SYSOVP Status and Clear
When the SYSOVP occurs, this bit is HIGH. During the SYSOVP, the
converter is disabled.
After the SYSOVP is removed, the user must write a 0 to this bit
or unplug the adapter to clear the SYSOVP condition to enable the
converter again.
0b: Not in SYSOVP <default at POR>
1b: In SYSOVP. When SYSOVP is removed, write 0 to clear the
SYSOVP latch.
3 Fault SYS_SHORT R/W 0b The fault is latched until a clear from host by writing this bit to 0.
0b: No fault <default at POR>
1b: When SYS is lower than 2.4V, then 7 times restart tries are
failed.
2 Fault Latchoff R 0b The faults are latched until a read from host.
0b: No fault
1b: Latch off (REG0x30[3])
1 Fault_OTG_OVP R 0b The faults are latched until a read from host.
0b: No fault
1b: OTG OVP
0 Fault_OTG_UVP R 0b The faults are latched until a read from host.
0b: No fault
1b: OTG UVP
Table 9-24. ProchotStatus Register (SMBus address = 21h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
6 STAT_COMP R 0b 0b: Not triggered
1b: Triggered
5 STAT_ICRIT R 0b 0b: Not triggered
1b: Triggered
4 STAT_INOM R 0b 0b: Not triggered
1b: Triggered
3 STAT_IDCHG R 0b 0b: Not triggered
1b: Triggered
2 STAT_VSYS R 0b 0b: Not triggered
1b: Triggered
1 STAT_Battery_Removal R 0b 0b: Not triggered
1b: Triggered
0 STAT_Adapter_Removal R 0b 0b: Not triggered
1b: Triggered
Table 9-25. Charge Current Register (14h) With 10-mΩ Sense Resistor (SMBus address = 14h) Field
Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15-13 Reserved R/W 000b Not used. 1 = invalid write.
12 Charge Current, bit 6 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 4096 mA of charger current.
11 Charge Current, bit 5 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 2048 mA of charger current.
10 Charge Current, bit 4 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 1024 mA of charger current.
9 Charge Current, bit 3 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 512 mA of charger current.
8 Charge Current, bit 2 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 256 mA of charger current.
Table 9-26. Charge Current Register (14h) With 10-mΩ Sense Resistor (SMBus address = 14h) Field
Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 Charge Current, bit 1 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 128 mA of charger current.
6 Charge Current, bit 0 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 64 mA of charger current.
5-0 Reserved R/W 000000b Not used. Value Ignored.
9.6.4 MaxChargeVoltage Register (SMBus address = 15h) [reset value based on CELL_BATPRESZ pin
setting]
To set the output charge voltage, write a 16-bit ChargeVoltage register command (REG0x15()) using the data
format listed in Figure 9-16, Table 9-27, and Table 9-28. The charger provides charge voltage range from 1.024
V to 19.200 V, with 8-mV step resolution. Any write below 1.024 V or above 19.200 V is ignored.
Upon POR, REG0x15() is by default set as 4200 mV for 1 s, 8400 mV for 2 s, 12600 mV for 3 s or 16800 mV
for 4 s. After CHRG_OK goes high, the charge will start when the host writes the charging current to REG0x14(),
the default charging voltage is used if REG0x15() is not programmed. If the battery is different from 4.2 V/cell,
the host has to write to REG0x15() before REG0x14() for correct battery voltage setting. Writing REG0x15() to 0
will set REG0x15() to the default value based on CELL_BATPRESZ pin, and force REG0x14() to zero to disable
charge.
The SRN pin senses the battery voltage for voltage regulation and should be connected as close to the battery
as possible, and directly place a decoupling capacitor (0.1 µF recommended) as close to the device as possible
to decouple high frequency noise.
Figure 9-16. MaxChargeVoltage Register (SMBus address = 15h) [reset value based on CELL_BATPRESZ
pin setting]
15 14 13 12 11 10 9 8
Reserved Max Charge Max Charge Max Charge Max Charge Max Charge Max Charge Max Charge
Voltage, bit 11 Voltage, bit 10 Voltage, bit 9 Voltage, bit 8 Voltage, bit 7 Voltage, bit 6 Voltage, bit 5
R/W R/W R/W R/W R/W R/W R/W R/W
7 6 5 4 3 2 1 0
Max Charge Max Charge Max Charge Max Charge Max Charge Reserved
Voltage, bit 4 Voltage, bit 3 Voltage, bit 2 Voltage, bit 1 Voltage, bit 1
R/W R/W R/W R/W R/W R/W
9.6.5 MinSystemVoltage Register (SMBus address = 3Eh) [reset value based on CELL_BATPRESZ pin
setting]
To set the minimum system voltage, write a 16-bit MinSystemVoltage register command (REG0x3E()) using the
data format listed in Figure 9-17, Table 9-29, and Table 9-30. The charger provides minimum system voltage
range from 1.024 V to 16.128 V, with 256-mV step resolution. Any write below 1.024 V or above 16.128 V is
ignored. Upon POR, the MinSystemVoltage register is 3.584 V for 1 S, 6.144 V for 2 S and 9.216 V for 3 S, and
12.288 V for 4 S.
Figure 9-17. MinSystemVoltage Register (SMBus address = 3Eh) [reset value based on CELL_BATPRESZ
pin setting]
15 14 13 12 11 10 9 8
Reserved Min System Min System Min System Min System Min System Min System
Voltage, bit 5 Voltage, bit 4 Voltage, bit 3 Voltage, bit 2 Voltage, bit 1 Voltage, bit 0
R/W R/W R/W R/W R/W R/W R/W
7 6 5 4 3 2 1 0
Reserved
R/W
between the system and battery is the VDS of BATFET. System voltage is regulated 160 mV above battery
voltage when BATFET is off (no charging or no supplement current).
When BATFET is removed, the system node VSYS is shorted to SRP. Before the converter starts operation,
LDO mode needs to be disabled. The following sequence is required to configure charger without BATFET.
1. Before adapter plugs in, put the charger into HIZ mode. (either pull pin 6 ILIM_HIZ to ground, or set
REG0x32[15] to 1)
2. Set 0x12[2] to 0 to disable LDO mode.
3. Set 0x30[0] to 0 to disable auto-wakeup mode.
4. Check if battery voltage is properly programmed (REG0x15)
5. Set precharge/charge current (REG0x14)
6. Put the device out of HIZ mode. (Release ILIM_HIZ from ground and set REG0x32[15]=0).
In order to prevent any accidental SW mistakes, the host sets low input current limit (a few hundred milliamps)
when device is out of HIZ.
9.6.6 Input Current and Input Voltage Registers for Dynamic Power Management
The charger supports Dynamic Power Management (DPM). Normally, the input power source provides power for
the system load or to charge the battery. When the input current exceeds the input current setting, or the input
voltage falls below the input voltage setting, the charger decreases the charge current to provide priority to the
system load. As the system current rises, the available charge current drops accordingly towards zero. If the
system load keeps increasing after the charge current drops down to zero, the system voltage starts to drop. As
the system voltage drops below the battery voltage, the battery will discharge to supply the heavy system load.
9.6.6.1 Input Current Registers
To set the maximum input current limit, write a 16-bit IIN_HOST register command (REG0x3F()) using the
data format listed in Table 9-31 and Table 9-32. When using a 10-mΩ sense resistor, the charger provides an
input-current limit range of 50 mA to 6400 mA, with 50-mA resolution. The default current limit is 3.25 A. Due
to the USB current setting requirement, the register setting specifies the maximum current instead of the typical
current. Upon adapter removal, the input current limit is reset to the default value of 3.25 A. With code 0, the
input current limit is 50 mA.
The ACP and ACN pins are used to sense RAC with the default value of 10 mΩ. For a 20-mΩ sense resistor, a
larger sense voltage is given and a higher regulation accuracy, but at the expense of higher conduction loss.
Instead of using the internal DPM loop, the user can build up an external input current regulation loop and have
the feedback signal on the ILIM_HIZ pin.
In order to disable ILIM_HIZ pin, the host can write to 0x31[7] to disable ILIM_HIZ pin, or pull ILIM_HIZ pin
above 4.0 V.
9.6.6.1.1 IIN_HOST Register With 10-mΩ Sense Resistor (SMBus address = 3Fh) [reset = 4100h]
With code 0, the input current limit readback is 50 mA.
Figure 9-18. IIN_HOST Register With 10-mΩ Sense Resistor (SMBus address = 3Fh) [reset = 4100h]
15 14 13 12 11 10 9 8
Reserved Input Current Input Current Input Current Input Current Input Current Input Current Input Current
set by host, bit set by host, bit set by host, bit set by host, bit set by host, bit set by host, bit set by host, bit
6 5 4 3 2 1 0
R/W R/W R/W R/W R/W R/W R/W R/W
7 6 5 4 3 2 1 0
Reserved
R
Table 9-31. IIN_HOST Register With 10-mΩ Sense Resistor (SMBus address = 3Fh) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 Reserved R/W 0b Not used. 1 = invalid write.
14 Input Current set by host, bit 6 R/W 1b 0 = Adds 0 mA of input current.
1 = Adds 3200 mA of input current.
13 Input Current set by host, bit 5 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 1600 mA of input current.
12 Input Current set by host, bit 4 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 800 mA of input current.
11 Input Current set by host, bit 3 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 400 mA of input current.
10 Input Current set by host, bit 2 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 200 mA of input current.
9 Input Current set by host, bit 1 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 100 mA of input current.
8 Input Current set by host, bit 0 R/W 1b 0 = Adds 0 mA of input current.
1 = Adds 50 mA of input current.
Table 9-32. IIN_HOST Register With 10-mΩ Sense Resistor (SMBus address = 3Fh) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7-0 Reserved R 00000000 Not used. Value Ignored.
b
9.6.6.1.2 IIN_DPM Register With 10-mΩ Sense Resistor (SMBus address = 022h) [reset = 4100h]
IIN_DPM register reflects the actual input current limit programmed in the register, either from host or from ICO.
After ICO, the current limit used by DPM regulation may differ from the IIN_HOST register settings. The actual
DPM limit is reported in REG0x22(). With code 0, the input current limit read-back is 50 mA.
Figure 9-19. IIN_DPM Register With 10-mΩ Sense Resistor (SMBus address = 022h) [reset = 4100h]
15 14 13 12 11 10 9 8
Reserved Input Current in Input Current in Input Current in Input Current in Input Current in Input Current in Input Current in
DPM, bit 6 DPM, bit 5 DPM, bit 4 DPM, bit 3 DPM, bit 2 DPM, bit 1 DPM, bit 0
R R R R R R R R
7 6 5 4 3 2 1 0
Reserved
R
Table 9-33. IIN_DPM Register With 10-mΩ Sense Resistor (SMBus address = 022h) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 Reserved R 0b Not used. 1 = invalid write.
14 Input Current in DPM, bit 6 R 0b 0 = Adds 0 mA of input current.
1 = Adds 3200 mA of input current.
13 Input Current in DPM, bit 5 R 0b 0 = Adds 0 mA of input current.
1 = Adds 1600 mA of input current.
12 Input Current in DPM, bit 4 R 0b 0 = Adds 0 mA of input current.
1 = Adds 800mA of input current
11 Input Current in DPM, bit 3 R 0b 0 = Adds 0 mA of input current.
1 = Adds 400 mA of input current.
10 Input Current in DPM, bit 2 R 0b 0 = Adds 0 mA of input current.
1 = Adds 200 mA of input current.
9 Input Current in DPM, bit 1 R 0b 0 = Adds 0 mA of input current.
1 = Adds 100 mA of input current.
8 Input Current in DPM, bit 0 R 0b 0 = Adds 0 mA of input current.
1 = Adds 50 mA of input current.
Table 9-34. IIN_DPM Register With 10-mΩ Sense Resistor (SMBus address = 022h) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7-0 Reserved R 00000000b Not used. Value Ignored.
7 6 5 4 3 2 1 0
Input Voltage, Input Voltage, Reserved
bit 1 bit 0
R/W R/W R/W
7 6 5 4 3 2 1 0
OTG Voltage, OTG Voltage, OTG Voltage, OTG Voltage, OTG Voltage, OTG Voltage, Reserved
bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
R/W R/W R/W R/W R/W R/W R/W
Table 9-38. OTGVoltage Register (SMBus address = 3Bh) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
2 OTG Voltage, bit 0 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 8.1 mV of OTG voltage.
1-0 Reserved R/W 00b Not used. Value Ignored.
7 6 5 4 3 2 1 0
Reserved
R/W
R R R R R R R R
7 6 5 4 3 2 1 0
R R R R R R R R
Reserved R R R R R R R
7 6 5 4 3 2 1 0
Reserved R R R R R R R
R R R R R R R R
7 6 5 4 3 2 1 0
R R R R R R R R
R R R R R R R R
7 6 5 4 3 2 1 0
R R R R R R R R
9.6.13 ID Registers
9.6.13.1 ManufactureID Register (SMBus address = FEh) [reset = 0040h]
Figure 9-27. ManufactureID Register (SMBus address = FEh) [reset = 0040h]
15-0
MANUFACTURE_ID
R
7-0
DEVICE_ID
R
6x10 µ F
2.2 µH
RAC=10 PŸ RSR=10 PŸ
ADAPTER
Q2 Q4
2.2 Ÿ Q3
6x10 µ F 10 nF BATT
Q1
47 nF
4.99 Ÿ 47 nF
1µF
1Ÿ
33 nF 33 nF HIDRV1 LODRV1 SW1 BTST1 BTST2 SW2 LODRV2 HIDRV2
Optional VBUS
snubber SYS
470 nF
ACN /BATDRV
ACP SRP
10 Ÿ
REGN VDDA SRN
REGN
VDDA
1 uF ILIM_HIZ
2.2 ± 3.3 uF
GND 350 NŸ
BQ25710
CELL_BATPRESZ
COMP1 250 NŸ
COMP2
33 pF 40.2 NŸ
10 NŸ IADPT
15pF IBAT
1800 pF 680 pF 100 pF 137 NŸ
100 pF
PSYS
50 Ÿ
1.05 V /PROCHOT SDA SCL CHRG_OK EN_OTG CMPOUT CMPIN 30 NŸ
10 NŸ
To CPU
10 NŸ
10 NŸ
3.3 V or 1.8 V
10 NŸ
Host
(SMBus)
6x10uF
(0805) RACP RACN
4.99ohm 4.99ohm
10nF(0402) 1nF(0402)
CDIFF
CACP Open CACN
33nF 33nF
ACP ACN
HIDRV1
The inductor ripple current in buck operation depends on input voltage (VIN), duty cycle (DBUCK = VOUT/VIN),
switching frequency (fS) and inductance (L):
VIN ´ D ´ (1 - D)
IRIPPLE_BUCK =
fS ´ L (4)
The maximum inductor ripple current happens with D = 0.5 or close to 0.5. For example, the battery charging
voltage range is from 9 V to 12.6 V for 3-cell battery pack. For 20-V adapter voltage, 10-V battery voltage gives
the maximum inductor ripple current. Another example is 4-cell battery, the battery voltage range is from 12 V to
16.8 V, and 12-V battery voltage gives the maximum inductor ripple current.
Usually inductor ripple is designed in the range of (20 – 40%) maximum charging current as a trade-off between
inductor size and efficiency for a practical design.
10.2.2.3 Input Capacitor
Input capacitor should have enough ripple current rating to absorb input switching ripple current. The worst case
RMS ripple current is half of the charging current (plus system current there is any system load) when duty cycle
is 0.5 in buck mode. If the converter does not operate at 50% duty cycle, then the worst case capacitor RMS
current occurs where the duty cycle is closest to 50% and can be estimated by Equation 5:
Low ESR ceramic capacitor such as X7R or X5R is preferred for input decoupling capacitor and should be
placed in front of RAC current sensing and as close as possible to the power stage half bridge MOSFETs.
Capacitance after RAC before power stage half bridge should be limited to 10 nF + 1 nF referring to Figure 10-2.
Because too large capacitance after RAC could filter out RAC current sensing ripple information. Voltage rating of
the capacitor must be higher than normal input voltage level, 25-V rating or higher capacitor is preferred for 19-V
to 20-V input voltage. The minimum input effective capacitance recommendation is shown in Table 10-1.
Ceramic capacitors (MLCC) show a dc-bias effect. This effect reduces the effective capacitance when a dc-bias
voltage is applied across a ceramic capacitor, as on the input capacitor of a charger. The effect may lead
to a significant capacitance drop, especially for high input voltages and small capacitor packages. See the
manufacturer's datasheet about the derating performance with a dc bias voltage applied. It may be necessary to
choose a higher voltage rating or nominal capacitance value in order to get the required effective capacitance
value at the operating point. Considering the 25 V 0603 package MLCC capacitance derating under 19-V to 20-V
input voltage, the recommended practical capacitors configuration can also be found in Table 10-1. Tantalum
capacitors (POSCAP) can avoid dc-bias effect and temperature variation effect which is recommended for 90 W
to 130 W higher power application.
Table 10-1. Minimum Input Capacitance Requirement
INPUT CAPACITORS VS TOTAL INPUT
65W 90W 130W
POWER
Minimum effective input capacitance 4 μF 6 μF 13 μF
Minimum practical input capacitors 4*10 μF (0603 25 V MLCC) 6*10 μF (0603 25 V MLCC) 3*10 μF (0603 25 V MLCC)
configuration 1* 10 μF (25 V to 35 V
POSCAP)
voltage, the recommended practical capacitors configuration at VSYS output terminal can also be found in
Table 10-2. Tantalum capacitors (POSCAP) can avoid dc-bias effect and temperature variation effect which are
recommended to be used along VSYS output distribution line to meet total minimum effective output capacitance
requirement.
Table 10-2. Minimum Output Capacitance Requirement
OUTPUT CAPACITORS VS TOTAL INPUT
65W 90W 130W
POWER
Minimum Effective Output Capacitance 50 μF 50 μF 50 μF
Minimum output capacitors at charger VSYS 7*10 μF (0603 25 V MLCC) 9*10 μF (0603 25 V MLCC) 9*10 μF (0603 25 V MLCC)
output terminal
Additional output capacitors along VSYS 2*22 μF (25 V~35 V 2*22 μF (25 V~35 V 2*22 μF (25 V~35 V
distribution line POSCAP) POSCAP) POSCAP)
The lower the FOM value, the lower the total power loss. Usually lower RDS(ON) has higher cost with the same
package size.
The top-side MOSFET loss includes conduction loss and switching loss. It is a function of duty cycle (D=VOUT/
VIN), charging current (ICHG), MOSFET's on-resistance (RDS(ON)), input voltage (VIN), switching frequency (fS),
turn on time (ton) and turn off time (toff):
1
Ptop = D ´ ICHG2 ´ RDS(on) + ´ VIN ´ ICHG ´ (t on + t off ) ´ f s
2 (7)
The first item represents the conduction loss. Usually MOSFET RDS(ON) increases by 50% with 100°C junction
temperature rise. The second term represents the switching loss. The MOSFET turn-on and turn-off times are
given by:
QSW Q
t on = , t off = SW
Ion Ioff (8)
where Qsw is the switching charge, Ion is the turn-on gate driving current and Ioff is the turn-off gate driving
current. If the switching charge is not given in MOSFET datasheet, it can be estimated by gate-to-drain charge
(QGD) and gate-to-source charge (QGS):
1
QSW = QGD + ´ QGS
2 (9)
Gate driving current can be estimated by REGN voltage (VREGN), MOSFET plateau voltage (Vplt), total turn-on
gate resistance (Ron) and turn-off gate resistance (Roff) of the gate driver:
The conduction loss of the bottom-side MOSFET is calculated with the following equation when it operates in
synchronous continuous conduction mode:
When charger operates in non-synchronous mode, the bottom-side MOSFET is off. As a result all the
freewheeling current goes through the body-diode of the bottom-side MOSFET. The body diode power loss
depends on its forward voltage drop (VF), non-synchronous mode charging current (INONSYNC), and duty cycle
(D).
PD = VF x INONSYNC x (1 - D) (12)
The maximum charging current in non-synchronous mode can be up to 0.25 A for a 10-mΩ charging current
sensing resistor or 0.5 A if battery voltage is below 2.5 V. The minimum duty cycle happens at lowest battery
voltage. Choose the bottom-side MOSFET with either an internal Schottky or body diode capable of carrying the
maximum non-synchronous mode charging current.
10.2.3 Application Curves
CH1: VBUS
CH1: VBUS
CH2: SW1
CH2: SW1
CH3: SW2
CH3: SW2
CH2: SW1
CH1: HIDRV1
CH2: SW1
CH3: LODRV1
CH3: SW2
CH1: IL
CH4: IL
CH2: SW2
CH2: SW1
CH3: LODRV2
CH4: IL CH4: IL
Figure 10-9. Switching During Boost Mode Figure 10-10. Switching During Buck Boost Mode
CH2: IIN
CH2: IIN
VBUS = 12 V/3.3 A, 3-cell, VSYS = 9 V, Without battery VBUS = 9 V/3.3 A, 3-cell, VSYS = 9 V, Without battery
Figure 10-11. System Regulation in Buck Mode Figure 10-12. System Regulation in Buck Boost
Mode
CH2: IIN
CH3: ISYS
VBUS = 5 V/3.3 A, 3-cell, VSYS = 9 V, Without battery VBUS = 20 V/3.3 V, VBAT = 7.5 V
Figure 10-13. System Regulation in Boost Mode Figure 10-14. Input Current Regulation in Buck
Mode
CH2:IIN
CH1: EN_OTG
CH4:IBAT
Figure 10-15. Input Current in Boost Mode Figure 10-16. OTG Power Up from 8 V Battery
CH2: VBUS
CH2: VBUS
CH3: SW2
CH3: SW2
CH2: VBUS
CH3: IVBUS
VBAT = 10 V, VBUS = 20 V
12 Layout
12.1 Layout Guidelines
Proper layout of the components to minimize high frequency current path loop (see Section 12.2) is important
to prevent electrical and magnetic field radiation and high frequency resonant problems. Here is a PCB layout
priority list for proper layout.
Table 12-1. PCB Layout Guidelines
RULES COMPONENTS FUNCTION IMPACT GUIDELINES
1 PCB layer stack up Thermal, efficiency, Multi- layer PCB is suggested. Allocate at least one ground layer.
signal integrity The BQ257XXEVM uses a 4-layer PCB (top layer, ground layer,
signal layer and bottom layer).
2 CBUS, RAC, Q1, Input loop High frequency VBUS capacitors, RAC, Q1 and Q2 form a small loop 1. It is best
Q2 noise, ripple to put them on the same side. Connect them with large copper to
reduce the parasitic resistance. Move part of CBUS to the other
side of PCB for high density design. After RAC before Q1 and
Q2 power stage recommend to put 10 nF + 1 nF (0402 package)
decoupling capacitors as close as possible to IC to decoupling
switching loop high frequency noise.
3 RAC, Q1, L1, Q4 Current path Efficiency The current path from VBUS to VSYS, through RAC, Q1, L1, Q4,
has low impedance. Pay attention to via resistance if they are not
on the same side. The number of vias can be estimated as 1 to
2A/via for a 10-mil via with 1 oz. copper thickness.
4 CSYS, Q3, Q4 Output loop High frequency VSYS capacitors, Q3 and Q4 form a small loop 2. It is best to
noise, ripple put them on the same side. Connect them with large copper to
reduce the parasitic resistance. Move part of CSYS to the other
side of PCB for high density design.
5 QBAT, RSR Current path Efficiency, battery Place QBAT and RSR near the battery terminal. The current path
voltage detection from VBAT to VSYS, through RSRand QBAT, has low impedance.
Pay attention to via resistance if they are not on the same side.
The device detects the battery voltage through SRN near battery
terminal.
6 Q1, Q2, L1, Q3, Power stage Thermal, efficiency Place Q1, Q2, L1, Q3 and Q4 next to each other. Allow
Q4 enough copper area for thermal dissipation. The copper area
is suggested to be 2x to 4x of the pad size. Multiple thermal
vias can be used to connect more copper layers together and
dissipate more heat.
7 RAC, RSR Current sense Regulation accuracy Use Kelvin-sensing technique for RAC and RSR current sense
resistors. Connect the current sense traces to the center of the
pads, and run current sense traces as differential pairs.
8 Small capacitors IC bypass caps Noise, jittering, Place VBUS cap, VCC cap, REGN caps near IC.
ripple
9 BST capacitors HS gate drive High frequency Place HS MOSFET boost strap circuit capacitor close to IC and
noise, ripple on the same side of PCB board. Capacitors SW1/2 nodes are
recommended to use wide copper polygon to connect to power
stage and capacitors BST1/2 node are recommended to use at
least 8mil trace to connected to IC BST1/2 pins.
10 Ground partition Measurement Separate analog ground(AGND) and power grounds(PGND) is
accuracy, regulation preferred. PGND should be used for all power stage related
accuracy, jitters, ground net. AGND should be used for all sensing, compensation
ripple and control network ground for example ACP/ACN/COMP1/
COMP2/CMPIN/CMPOUT/IADPT/IBAT/PSYS. Connect all
analog grounds to a dedicated low-impedance copper plane,
which is tied to the power ground underneath the IC exposed
pad. If possible, use dedicated COMP1, COMP2 AGND traces.
Connect analog ground and power ground together using power
pad as the single ground connection point.
Figure 12-2. Buck-Boost Charger Gate Drive/Current Sensing/AGND Signal Layer Routing Example
13.7 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 13-Sep-2022
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
BQ25710RSNR ACTIVE QFN RSN 32 3000 RoHS & Green NIPDAU | NIPDAUAG Level-2-260C-1 YEAR -40 to 85 BQ25710 Samples
BQ25710RSNT ACTIVE QFN RSN 32 250 RoHS & Green NIPDAU | NIPDAUAG Level-2-260C-1 YEAR -40 to 85 BQ25710 Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 13-Sep-2022
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 16-Jul-2023
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 16-Jul-2023
Width (mm)
H
W
Pack Materials-Page 2
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