0% found this document useful (0 votes)
21 views92 pages

bq25710

Uploaded by

akash
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
0% found this document useful (0 votes)
21 views92 pages

bq25710

Uploaded by

akash
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 92

BQ25710

SLUSD20B – JULY 2018 – REVISED APRIL 2023

BQ25710 SMBus Narrow VDC Buck-Boost Battery Charge Controller With System
Power Monitor and Processor Hot Monitor
– ±0.5% Charge voltage regulation
1 Features – ±2% Input/charge current regulation
• Pin-to-pin and software compatible to BQ25700A – ±2% Input/charge current monitor
• Charge 1s to 4s battery from wide range of input – ±4% Power monitor
source • Safety
– 3.5-V to 24-V Input operating voltage – Thermal shutdown
– Supports USB2.0, USB 3.0, USB 3.1 (Type – Input, system, battery overvoltage protection
C), and USB Power Delivery (USB-PD) input – Input, MOSFET, inductor overcurrent protection
current settings • Safety-Related Certifications:
– Seamless transition among buck, buck-boost – IEC 62368-1 CB Certification
and boost operations • Low battery quiescent current
– Input current and voltage regulation (IDPM and • Package: 32-Pin 4 × 4 WQFN
VDPM) against source overload
• Power/current monitor for CPU throttling 2 Applications
– Comprehensive PROCHOT profile, IMVP8/ • Ultra-Books, notebooks, detachable, tablet PCs
IMVP9 compliant and power bank
– Input and battery current monitor • Industrial and medical equipment
– System power monitor, IMVP8/IMVP9 • Portable equipment with rechargeable batteries
compliant
• Narrow voltage DC (NVDC) power path
3 Description
management This device is a synchronous NVDC buck-boost
– Instant-on with no battery or depleted battery battery charge controller, offering a low component
– Battery supplements system when adapter is count, high efficiency solution for space constrained,
fully-loaded 1s-4s battery charging applications.
– Battery MOSFET ideal diode operation in Device Information
supplement mode
PART NUMBER PACKAGE(1) BODY SIZE (NOM)
• Power up USB port from battery (USB OTG)
BQ25710 WQFN (32) 4.00 mm × 4.00 mm
– 3-V to 20.8-V VOTG With 8-mV resolution
– Output current limit up to 6.4 A with 50-mA (1) For all available packages, see the orderable addendum at
resolution the end of the data sheet.
• TI patented Pass Through Mode (PTM) for system
power efficiency improvement and battery fast
charging
• When system is powered by battery only, Vmin
Active Protection (VAP) mode supplements battery
from input capacitors during system peak power
spike
• Input Current Optimizer (ICO) to extract max input
power
• 800-kHz or 1.2-MHz Programmable switching
frequency for 2.2-µH or 1.0-µH inductor
• Host control interface for flexible system
configuration
– SMBus Port optimal system performance and
status reporting Application Diagram
– Hardware pin to set input current limit without
EC control
• Integrated ADC to monitor voltage, current and
power
• High accuracy for the regulation and monitor

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table of Contents
1 Features............................................................................1 9.5 Programming............................................................ 32
2 Applications..................................................................... 1 9.6 Register Map.............................................................34
3 Description.......................................................................1 10 Application and Implementation................................ 72
4 Revision History.............................................................. 2 10.1 Application Information........................................... 72
5 Description (continued).................................................. 4 10.2 Typical Application.................................................. 72
6 Device Comparison Table...............................................5 11 Power Supply Recommendations..............................80
7 Pin Configuration and Functions...................................6 12 Layout...........................................................................81
8 Specifications.................................................................. 9 12.1 Layout Guidelines................................................... 81
8.1 Absolute Maximum Ratings........................................ 9 12.2 Layout Example...................................................... 82
8.2 ESD Ratings............................................................... 9 13 Device and Documentation Support..........................83
8.3 Recommended Operating Conditions.........................9 13.1 Device Support....................................................... 83
8.4 Thermal Information..................................................10 13.2 Documentation Support.......................................... 83
8.5 Electrical Characteristics...........................................10 13.3 Receiving Notification of Documentation Updates..83
8.6 Timing Requirements................................................ 18 13.4 Support Resources................................................. 83
8.7 Typical Characteristics.............................................. 20 13.5 Trademarks............................................................. 83
9 Detailed Description......................................................22 13.6 Electrostatic Discharge Caution..............................83
9.1 Overview................................................................... 22 13.7 Glossary..................................................................83
9.2 Functional Block Diagram......................................... 23 14 Mechanical, Packaging, and Orderable
9.3 Feature Description...................................................24 Information.................................................................... 84
9.4 Device Functional Modes..........................................31

4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (February 2021) to Revision B (April 2023) Page
• Added Safety-Related Certifications: IEC 62368-1 CB Certification to Features............................................... 1
• Added bullet 2 in Power-Up from DC Source................................................................................................... 24
• Changed IVBUS in Figure 9-1 ......................................................................................................................... 27
• Changed EN_PROCHOT_LPWR 01b and 10b in ChargeOption1 Register.................................................... 39
• Changed ICRIT_DEG 01b, 10b, and 11b and INOM_DEG 0b and 1b in ProchotOption0 Register.................45
• Changed IDCHG_DEG and PROCHOT_PROFILE_VDPM in ProchotOption1 Register.................................47
• Changed PROCHOT_WIDTH 11b in ProchotStatus Register.......................................................................... 53
• Changed list in System Voltage Regulation......................................................................................................59

Changes from Revision * (July 2018) to Revision A (February 2021) Page


• Changed units of measure for several parameters in Electrical Characteristics.............................................. 10
• Changed in Timing Requirements.................................................................................................................... 18
• Changed 3.25A in Input Voltage and Current Limit Setup................................................................................ 25
• Changed in USB On-The-Go (OTG).................................................................................................................25
• Added in System Short Hiccup Mode............................................................................................................... 31
• Updated SMBus Interface.................................................................................................................................32
• Changed in ChargeOption0 Register................................................................................................................36
• Changed in ChargeOption2 Register................................................................................................................41
• Changed in ProchotOption0 Register............................................................................................................... 45
• Changed in ProchotStatus Register................................................................................................................. 53
• Changed in Input Current Registers................................................................................................................. 60
• Changed in IIN_DPM Register With 10-mΩ Sense Resistor............................................................................ 62
• Changed in ADCIINCMPIN Register................................................................................................................ 69
• Updated Typical Application Diagram...............................................................................................................72
• Updated ACP-ACN Input Filter Diagram.......................................................................................................... 73
• Updated Input Capacitor ..................................................................................................................................74
• Updated Output Capacitor................................................................................................................................ 74

2 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

• Changed in Layout Guidelines..........................................................................................................................81


• Added detailed layout reference in Layout Example........................................................................................ 82

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 3

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

5 Description (continued)
The NVDC configuration allows the system to be regulated at battery voltage, but not drop below system
minimum voltage. The system keeps operating even when the battery is completely discharged or removed.
When load power exceeds input source rating, the battery goes into supplement mode and prevents the system
from crashing.
The BQ25710 charges battery from a wide range of input sources including USB adapter, high voltage USB PD
sources and traditional adapters.
During power up, the charger sets converter to buck, boost or buck-boost configuration based on input source
and battery conditions. The charger automatically transits among buck, boost and buck-boost configuration
without host control.
In the absence of an input source, the BQ25710 supports USB On-the-Go (OTG) function from 1- to 4-cell
battery to generate adjustable 3 V to 20.8 V on VBUS with 8 mV resolution. The OTG output voltage transition
slew rate can be configurable, which is complied with the USB PD 3.0 PPS specifications.
When only battery powers the system and no external load is connected to the USB OTG port, the BQ25710
supports the Vmin Active Protection (VAP) feature, in which the device charges up the VBUS voltage from the
battery to store some energy in the input decoupling capacitors. During the system peak power spike, the huge
current drawing from the battery creates a larger voltage drop across the impedance from the battery to the
system. The energy stored in the input capacitors will supplement the system, to prevent the system voltage
from dropping below the minimum system voltage and causing the system crash. This Vmin Active Protection
(VAP) is designed to absorb system power peaks during periods of SOC high power demand, which is highly
recommended by Intel for the platforms with 1S~2S battery.
The BQ25710 monitors adapter current, battery current and system power. The flexibly programmed PROCHOT
output goes directly to CPU for throttle back when needed.

4 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

6 Device Comparison Table


BQ25700A BQ25703A BQ25708 BQ25710 BQ25718 BQ25713 BQ25713B
Interface SMBus I2C SMBus SMBus SMBus I2C I2C
Device Address 09h 6Bh 09h 09h 09h 6Bh 6Ah
VAP for IMVP9 No No No Yes Yes Yes Yes
Pass Through Mode No No No Yes Yes Yes Yes
OTG Mode Yes Yes No Yes No Yes Yes
OTG Voltage Range 4.48V-20.8V 4.48V-20.8V N/A 3.0V-20.8V N/A 3.0V-20.8V 3.0V-20.8V
OTG Voltage
64mV 64mV N/A 8mV N/A 8mV 8mV
Resolution
Charging Voltage
16mV 16mV 16mV 8mV 8mV 8mV 8mV
Resolution

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 5

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

7 Pin Configuration and Functions

LODRV1

LODRV2
HIDRV1

BTST1

BTST2
REGN

PGND
SW1
32

31

30

29

28

27

26

25
VBUS 1 24 HIDRV2

ACN 2 23 SW2

ACP 3 22 VSYS

CHRG_OK 4 21 BATDRV
Thermal
OTG/VAP 5 Pad 20 SRP

ILIM_HIZ 6 19 SRN

VDDA 7 18 CELL_BATPRESZ

IADPT 8 17 COMP2
10

11

12

13

14

15

16
9
IBAT

PSYS

PROCHOT

SDA

SCL

CMPIN

CMPOUT

COMP1

Figure 7-1. RSN Package 32-Pin WQFN Top View

Table 7-1. Pin Functions


PIN
I/O DESCRIPTION
NAME NO.
Input current sense resistor negative input. The leakage on ACP and ACN are matched. A
R-C low-pass filter is required to be placed between the sense resistor and the ACN pin
ACN 2 PWR
to suppress the high frequency noise in the input current signal. Refer to Section 10 for
ACP/ACN filter design.
Input current sense resistor positive input. The leakage on ACP and ACN are matched. A
R-C low-pass filter is required to be placed between the sense resistor and the ACP pin
ACP 3 PWR
to suppress the high frequency noise in the input current signal. Refer to Section 10 for
ACP/ACN filter design.
P-channel battery FET (BATFET) gate driver output. It is shorted to VSYS to turn off the
BATFET. It goes 10 V below VSYS to fully turn on BATFET. BATFET is in linear mode to
BATDRV 21 O
regulate VSYS at minimum system voltage when battery is depleted. BATFET is fully on
during fast charge and works as an ideal-diode in supplement mode.
Buck mode high side power MOSFET driver power supply. Connect a 0.047-µF capacitor
BTST1 30 PWR
between SW1 and BTST1. The bootstrap diode between REGN and BTST1 is integrated.
Boost mode high side power MOSFET driver power supply. Connect a 0.047-μF capacitor
BTST2 25 PWR
between SW2 and BTST2. The bootstrap diode between REGN and BTST2 is integrated.
Battery cell selection pin for 1–4 cell battery setting. CELL_BATPRESZ pin is biased from
VDDA. CELL_BATPRESZ pin also sets SYSOVP thresholds to 5 V for 1-cell, 12 V for 2-cell,
CELL_BATPRESZ 18 I and 19.5 V for 3-cell/4-cell. CELL_BATPRESZ pin is pulled below VCELL_BATPRESZ_FALL to
indicate battery removal. The device exits LEARN mode, and disables charge. The charge
voltage register REG0x15() goes back to default.

6 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

Table 7-1. Pin Functions (continued)


PIN
I/O DESCRIPTION
NAME NO.
Open drain active high indicator to inform the system good power source is connected to the
charger input. Connect to the pullup rail via 10-kΩ resistor. When VBUS rises above 3.5V or
CHRG_OK 4 O falls below 24.5V, CHRG_OK is HIGH after 50ms deglitch time. When VBUS falls below 3.2
V or rises above 26 V, CHRG_OK is LOW. When any fault occurs, CHRG_OK is asserted
LOW.
Input of independent comparator. The independent comparator compares the voltage
sensed on CMPIN pin with internal reference, and its output is on CMPOUT pin. Internal
reference, output polarity and deglitch time is selectable by the SMBus host. With polarity
CMPIN 14 I
HIGH (REG0x30[6] = 1), place a resistor between CMPIN and CMPOUT to program
hysteresis. With polarity LOW (REG0x30[6] = 0), the internal hysteresis is 100 mV. If the
independent comparator is not in use, tie CMPIN to ground.
Open-drain output of independent comparator. Place pullup resistor from CMPOUT to pullup
CMPOUT 15 O supply rail. Internal reference, output polarity and deglitch time are selectable by the SMBus
host.
Buck boost converter compensation pin 2. Refer to BQ2571X EVM schematic for COMP2
COMP2 17 I
pin RC network.
Buck boost converter compensation pin 1. Refer to BQ2571X EVM schematic for COMP1
COMP1 16 I
pin RC network.
Active HIGH to enable OTG or VAP modes. When REG0x32[5]=1, pulling high OTG/VAP
OTG/VAP 5 I pin and setting REG0x32[12]=1 can enable OTG mode. When REG0x32[5]=0, pulling high
OTG/VAP pin is to enable VAP mode.
Buck mode high side power MOSFET (Q1) driver. Connect to high side n-channel MOSFET
HIDRV1 31 O
gate.
Boost mode high side power MOSFET(Q4) driver. Connect to high side n-channel MOSFET
HIDRV2 24 O
gate.
The adapter current monitoring output pin. V(IADPT) = 20 or 40 × (V(ACP) – V(ACN)) with ratio
selectable in REG0x12[4]. Place a resistor from the IADPT pin to ground corresponding to
IADPT 8 O the inductance in use. For a 2.2 µH inductance, the resistor is 137 kΩ. Place a 100-pF
or less ceramic decoupling capacitor from IADPT pin to ground. IADPT output voltage is
clamped below 3.3 V.
The battery current monitoring output pin. V(IBAT) = 8 or 16 × (V(SRP) – V(SRN)) for charge
current, or V(IBAT) = 8 or 16 × (V(SRN) – V(SRP)) for discharge current, with ratio selectable in
IBAT 9 O
REG0x12[3]. Place a 100-pF or less ceramic decoupling capacitor from IBAT pin to ground.
This pin can be floating if not in use. Its output voltage is clamped below 3.3 V.
Input current limit setting pin. Program ILIM_HIZ voltage by connecting a resistor divider
from supply rail to ILIM_HIZ pin to ground. The pin voltage is calculated as: V(ILIM_HIZ) = 1 V
+ 40 × IDPM × RAC, in which IDPM is the target input current. The input current limit used
ILIM_HIZ 6 I
by the charger is the lower setting of ILIM_HIZ pin and REG0x3F(). When the pin voltage is
below 0.4 V, the device enters Hi-Z mode with low quiescent current. When the pin voltage is
above 0.8 V, the device is out of Hi-Z mode.
Buck mode low side power MOSFET (Q2) driver. Connect to low side n-channel MOSFET
LODRV1 29 O
gate.
Boost mode low side power MOSFET (Q3) driver. Connect to low side n-channel MOSFET
LODRV2 26 O
gate.
PGND 27 GND Device power ground.
Active low open drain output of processor hot indicator. It monitors adapter input current,
PROCHOT 11 O battery discharge current, and system voltage. After any event in the PROCHOT profile is
triggered, a pulse is asserted. The minimum pulse width is adjustable in REG0x21[14:11].
Current mode system power monitor. The output current is proportional to the total power
from the adapter and the battery. The gain is selectable through SMBus. Place a resistor
PSYS 10 O from PSYS to ground to generate output voltage. This pin can be floating if not in use. Its
output voltage is clamped below 3.3 V. Place a capacitor in parallel with the resistor for
filtering.
6-V linear regulator output supplied from VBUS or VSYS. The LDO is active when VBUS
REGN 28 PWR above VVBUS_CONVEN. Connect a 2.2- or 3.3-μF ceramic capacitor from REGN to power
ground. REGN pin output is for power stage gate drive.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 7

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 7-1. Pin Functions (continued)


PIN
I/O DESCRIPTION
NAME NO.
SMBus clock input. Connect to clock line from the host controller or smart battery. Connect a
SCL 13 I
10-kΩ pullup resistor according to SMBus specifications.
SMBus open-drain data I/O. Connect to data line from the host controller or smart battery.
SDA 12 I/O
Connect a 10-kΩ pullup resistor according to SMBus specifications.
Charge current sense resistor negative input. SRN pin is for battery voltage sensing as well.
Connect SRN pin with optional 0.1-μF ceramic capacitor to GND for common-mode filtering.
SRN 19 PWR
Connect a 0.1-μF ceramic capacitor from SRP to SRN to provide differential mode filtering.
The leakage current on SRP and SRN are matched.
Charge current sense resistor positive input. Connect SRP pin with optional 0.1-uF ceramic
capacitor to GND for common-mode filtering. Connect a 0.1-μF ceramic capacitor from SRP
SRP 20 PWR
to SRN to provide differential mode filtering. The leakage current on SRP and SRN are
matched.
Buck mode high side power MOSFET driver source. Connect to the source of the high side
SW1 32 PWR
n-channel MOSFET.
Boost mode high side power MOSFET driver source. Connect to the source of the high side
SW2 23 PWR
n-channel MOSFET.
Charger input voltage. An input low pass filter of 1Ω and 0.47 µF (minimum) is
VBUS 1 PWR
recommended.
Internal reference bias pin. Connect a 10-Ω resistor from REGN to VDDA and a 1-μF
VDDA 7 PWR
ceramic capacitor from VDDA to power ground.
Charger system voltage sensing. The system voltage regulation limit is programmed in
VSYS 22 PWR
REG0x15() and REG0x3E().
Exposed pad beneath the IC. Always solder thermal pad to the board, and have vias on
Thermal pad – – the thermal pad plane connecting to power ground planes. It serves as a thermal pad to
dissipate the heat.

8 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

8 Specifications
8.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1) (2)
MIN MAX UNIT
SRN, SRP, ACN, ACP, VBUS, VSYS –0.3 30
SW1, SW2 –2 30
BTST1, BTST2, HIDRV1, HIDRV2, /BATDRV –0.3 36
LODRV1, LODRV2 (25nS) –4 7
HIDRV1, HIDRV2 (25nS) –4 36
Voltage V
SW1, SW2 (25nS) –4 30
SDA, SCL, REGN, PSYS, CHRG_OK, OTG/VAP, CELL_BATPRESZ,
ILIM_HIZ, LODRV1, LODRV2, VDDA, COMP1, COMP2, CMPIN, –0.3 7
CMPOUT
/PROCHOT –0.3 5.5
IADPT, IBAT, PSYS –0.3 3.6

Differential BTST1-SW1, BTST2-SW2, HIDRV1-SW1, HIDRV2-SW2 –0.3 7


V
Voltage SRP-SRN, ACP-ACN –0.5 0.5
Junction temperature range, TJ –40 155 °C
Temperature
Storage temperature, Tstg –40 155 °C

(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
(2) All voltages are with respect to GND if not specified. Currents are positive into, negative out of the specified terminal. Consult
Packaging Section of the data book for thermal limitations and considerations of packages.

8.2 ESD Ratings


VALUE UNIT
Human body model (HBM), per ANSI/ESDA/
±2000
JEDEC JS-001, all pins(1)
V(ESD) Electrostatic discharge V
Charged device model (CDM), per JEDEC
±500
specificationJESD22-C101, all pins(2)

(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

8.3 Recommended Operating Conditions


over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
ACN, ACP, VBUS 0 24
SRN, SRP, VSYS 0 19.2
SW1, SW2 –2 24
BTST1, BTST2, HIDRV1, HIDRV2, /BATDRV 0 30
Voltage V
SDA, SCL, REGN, PSYS, CHRG_OK, OTG/VAP, CELL_BATPRESZ, ILIM_HIZ,
0 6.5
LODRV1, LODRV2, VDDA, COMP1, COMP2, CMPIN, CMPOUT
/PROCHOT 0 5.3
IADPT, IBAT, PSYS 0 3.3

Differential BTST1-SW1, BTST2-SW2, HIDRV1-SW1, HIDRV2-SW2 0 6.5


V
Voltage SRP-SRN, ACP-ACN –0.5 0.5
Junction temperature range, TJ –20 125 °C

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 9

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

8.3 Recommended Operating Conditions (continued)


over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
Operating free-air temperature range, TJ –40 85 °C

8.4 Thermal Information


BQ25710
THERMAL METRIC(1) RSN (WQFN) UNIT
32 PINS
RθJA Junction-to-ambient thermal resistance 37.2 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 26.1 °C/W
RθJB Junction-to-board thermal resistance 7.8 °C/W
ΨJT Junction-to-top characterization parameter 0.3 °C/W
YJB Junction-to-board characterization parameter 7.8 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance 2.3 °C/W

(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.

8.5 Electrical Characteristics


over TJ = -40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VINPUT_OP Input voltage operating range 3.5 26 V
REGULATION ACCURACY
MAX SYSTEM VOLTAGE REGULATION
System Voltage Regulation,
VSYSMAX_RNG measured on VSYS (charge 1.024 19.2 V
disabled)
VSRN +
REG0x15() = 0x41A0H (16.800 160 V
V) mV
–2% 2%
VSRN +
REG0x15() = 0x3138H (12.600 160 V
V) mV

System voltage regulation –2% 2%


VSYSMAX_ACC
accuracy (charge disabled) VSRN +
160 V
REG0x15() = 0x20D0H (8.400 V) mV
–3% 3%
VSRN +
160 V
REG0x15() = 0x1068H (4.200 V) mV
–3% 3%
MINIMUM SYSTEM VOLTAGE REGULATION
System Voltage Regulation,
VSYSMIN_RNG 1.024 19.2 V
measured on VSYS

10 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

8.5 Electrical Characteristics (continued)


over TJ = -40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
REG0x3E() = 0x3000H 12.288 V
–2% 2%
REG0x3E() = 0x2400H 9.216 V
Minimum System Voltage –2% 2%
VSYSMIN_REG_ACC Regulation Accuracy (VBAT
below REG0x3E() setting) REG0x3E() = 0x1800H 6.144 V
–3% 3%
REG0x3E() = 0x0E00H 3.584 V
–3% 3%
CHARGE VOLTAGE REGULATION
VBAT_RNG Battery voltage regulation 1.024 19.2 V
REG0x15() = 0x41A0H 16.8 V
–0.5% 0.5%
REG0x15() = 0x3138H 12.6 V
Battery voltage regulation –0.5% 0.5%
VBAT_REG_ACC accuracy (charge enable) (0°C to
85°C) REG0x15() = 0x20D0H 8.4 V
–0.6% 0.6%
REG0x15() = 0x1068H 4.2 V
–1.1% 1.2%
CHARGE CURRENT REGULATION IN FAST CHARGE
Charge current regulation
VIREG_CHG_RNG VIREG_CHG = VSRP –VSRN 0 81.28 mV
differential voltage range
4096 mA
REG0x14() = 0x1000H
–3% 2%
2048 mA
Charge current regulation REG0x14() = 0x0800H
accuracy 10-mΩ sensing resistor, –4% 3%
ICHRG_REG_ACC
VBAT above REG0x3E() setting 1024 mA
(0°C to 85°C) REG0x14() = 0x0400H
–5% 6%
512 mA
REG0x14() = 0x0200H
–12% 12%
CHARGE CURRENT REGULATION IN LDO MODE
CELL 2s-4s 384 mA
CELL 1 s, VSRN < 3 V 384 mA
ICLAMP Precharge current clamp
CELL 1 s, 3 V < VSRN <
2 A
VSYSMIN
REG0x14() = 0x0180H 384 mA
2S-4S –15% 15%
1S –25% 25%
REG0x14() = 0x0100H 256 mA
Precharge current regulation 2S-4S –20% 20%
accuracy with 10-mΩ SRP/SRN
IPRECHRG_REG_ACC 1S –35% 35%
series resistor, VBAT below
REG0x3E() setting (0°C to 85°C) REG0x14() = 0x00C0H 192 mA
2S-4S –25% 25%
1S –50% 50%
REG0x14() = 0x0080H 128 mA
2S-4S –30% 30%

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 11

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

8.5 Electrical Characteristics (continued)


over TJ = -40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SRP, SRN leakage current
ILEAK_SRP_SRN –12 10 µA
mismatch (0°C to 85°C)
INPUT CURRENT REGULATION
Input current regulation
VIREG_DPM_RNG VIREG_DPM = VACP – VACN 0.5 64 mV
differential voltage range
REG0x3F() = 0x5000H 3800 3900 4000 mA
Input current regulation accuracy REG0x3F() = 0x3C00H 2800 2900 3000 mA
IDPM_REG_ACC (-40°C to 105°C) with 10-mΩ
ACP/ACN series resistor REG0x3F() = 0x1E00H 1300 1400 1500 mA
REG0x3F() = 0x0A00H 300 400 500 mA
ACP, ACN leakage current
ILEAK_ACP_ACN –16 10 µA
mismatch (-40°C to 105°C)
Voltage range for input current
VIREG_DPM_RNG_ILIM 1.15 4 V
regulation (ILIM_HIZ Pin)
Input Current Regulation VILIM_HIZ = 2.6 V 3800 4000 4200 mA
Accuracy on ILIM_HIZ pin VILIM_HIZ = 2.2 V 2800 3000 3200 mA
IDPM_REG_ACC_ILIM VILIM_HIZ = 1 V + 40 × IDPM
× RAC, with 10-mΩ ACP/ACN VILIM_HIZ = 1.6 V 1300 1500 1700 mA
series resistor VILIM_HIZ = 1.2 V 300 500 700 mA
ILEAK_ILIM ILIM_HIZ pin leakage current –1 1 µA
INPUT VOLTAGE REGULATION
VIREG_DPM_RNG Input voltage regulation range Voltage on VBUS 3.2 19.52 V
REG0x3D()=0x3C80H 18688 mV
–3% 2%
REG0x3D()=0x1E00H 10880 mV
VDPM_REG_ACC Input voltage regulation accuracy
–4% 2.5%
REG0x3D()=0x0500H 4480 mV
–5% 5%
OTG CURRENT REGULATION
OTG output current regulation
VIOTG_REG_RNG VIOTG_REG = VACP – VACN 0 81.28 mV
differential voltage range
REG0x3C() = 0x3C00H 2800 3000 3200 mA
OTG output current regulation
IOTG_ACC accuracy with 50-mA LSB and REG0x3C() = 0x1E00H 1300 1500 1700 mA
10-mΩ ACP/ACN series resistor
REG0x3C() = 0x0A00H 300 500 700 mA
OTG VOLTAGE REGULATION
VOTG_REG_RNG OTG voltage regulation range Voltage on VBUS 3 20.8 V
REG0x3B() = 0x23F8H
20.002 V
REG0x32[2] = 0
–2% 2%
REG0x3B() = 0x1710H
12.004 V
VOTG_REG_ACC OTG voltage regulation accuracy REG0x32[2] = 1
–2% 2%
REG0x3B() = 0x099CH
5.002 V
REG0x32[2] = 1
–3% 3%
REFERENCE AND BUFFER
REGN REGULATOR
REGN regulator voltage (0 mA –
VREGN_REG VVBUS = 10 V 5.7 6 6.3 V
60 mA)

12 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

8.5 Electrical Characteristics (continued)


over TJ = -40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VDROPOUT REGN voltage in drop out mode VVBUS = 5 V, ILOAD = 20 mA 3.8 4.3 4.6 V
REGN current limit when
IREGN_LIM_Charging VVBUS = 10 V, force VREGN =4 V 50 65 mA
converter is enabled
REGN output capacitor required
CREGN ILOAD = 100 µA to 50 mA 2.2 µF
for stability
REGN output capacitor required
CVDDA ILOAD = 100 µA to 50 mA 1 µF
for stability
QUIESCENT CURRENT
VBAT = 18 V, REG0x12[15] = 1,
22 45 µA
in low power mode
VBAT = 18 V, REG0x12[15] = 1,
125 195 µA
System powered by battery. REG0x30[13] = 1, REGN off
BATFET on. ISRN + ISRP + ISW2 VBAT = 18 V, REG0x12[15] =
IBAT_BATFET_ON
+ IBTST2 + ISW1 + IBTST1 + IACP + 0, REG0x30[12] = 0, REGN on, 880 1170 µA
IACN + IVBUS + IVSYS DIS_PSYS
VBAT = 18 V, REG0x12[15] =
0, REG0x30[12] = 1, REGN on, 980 1270 µA
EN_PSYS
Input current during PFM in buck
VIN = 20 V, VBAT = 12.6 V, 3s,
mode, no load, IVBUS + IACP +
IAC_SW_LIGHT_buck REG0x12[10] = 0; MOSFET Qg = 2.2 mA
IACN + IVSYS + ISRP + ISRN + ISW1
4 nC
+ IBTST + ISW2 + IBTST2
Input current during PFM in boost
VIN = 5 V, VBAT = 8.4 V, 2s,
mode, no load, IVBUS + IACP +
IAC_SW_LIGHT_boost REG0x12[10] = 0; MOSFET Qg 2.7 mA
IACN + IVSYS + ISRP + ISRN + ISW1
= 4 nC
+ IBTST2 + ISW2 + IBTST2
Input current during PFM in buck
VIN = 12 V, VBAT = 12 V,
boost mode, no load, IVBUS + IACP
IAC_SW_LIGHT_buckboost REG0x12[10] = 0; MOSFET Qg 2.4 mA
+ IACN + IVSYS + ISRP + ISRN +
= 4 nC
ISW1 + IBTST1 + ISW2 + IBTST2
VBAT = 8.4 V, VBUS = 5 V,
800 kHz switching frequency, 3 mA
MOSFET Qg = 4nC
Quiescent current during PFM in
VBAT = 8.4 V, VBUS = 12
OTG mode IVBUS + IACP + IACN +
IOTG_STANDBY V, 800 kHz switching frequency, 4.2 mA
IVSYS + ISRP + ISRN + ISW1 + IBTST2
MOSFET Qg = 4nC
+ ISW2 + IBTST2
VBAT = 8.4 V, VBUS = 20
V, 800 kHz switching frequency, 6.2 mA
MOSFET Qg = 4nC
VACP/N_OP Input common mode range Voltage on ACP/ACN 3.8 26 V
VIADPT_CLAMP IADPT output clamp voltage 3.1 3.2 3.3 V
IIADPT IADPT output current 1 mA
V(IADPT) / V(ACP-ACN), REG0x12[4]
20 V/V
=0
AIADPT Input current sensing gain
V(IADPT) / V(ACP-ACN), REG0x12[4]
40 V/V
=1
V(ACP-ACN) = 40.96 mV –2% 2%
V(ACP-ACN) = 20.48 mV –3% 3%
VIADPT_ACC Input current monitor accuracy
V(ACP-ACN) =10.24 mV –6% 6%
V(ACP-ACN) = 5.12 mV –10% 10%
Maximum capacitance at IADPT
CIADPT_MAX 100 pF
Pin
VSRP/N_OP Battery common mode range Voltage on SRP/SRN 2.5 18 V

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 13

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

8.5 Electrical Characteristics (continued)


over TJ = -40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VIBAT_CLAMP IBAT output clamp voltage 3.05 3.2 3.3 V
IIBAT IBAT output current 1 mA
V(IBAT) / V(SRN-SRP), REG0x12[3] =
8 V/V
Charge and discharge current 0,
AIBAT
sensing gain on IBAT pin V(IBAT) / V(SRN-SRP), REG0x12[3] =
16 V/V
1,
V(SRN-SRP) = 40.96 mV –2% 2%

Charge and discharge current V(SRN-SRP) = 20.48 mV –4% 4%


IIBAT_CHG_ACC
monitor accuracy on IBAT pin V(SRN-SRP) =10.24 mV –7% 7%
V(SRN-SRP) = 5.12 mV –15% 15%
Maximum capacitance at IBAT
CIBAT_MAX 100 pF
Pin
SYSTEM POWER SENSE AMPLIFIER
VPSYS PSYS output voltage range 0 3.3 V
IPSYS PSYS output current 0 160 µA
V(PSYS) / (P(IN) +P(BAT)),
APSYS PSYS system gain 1 µA/W
REG0x30[9] = 1
Adapter only with system power
= 19.5 V / 45 W, TA = -40°C to –4% 4%
PSYS gain accuracy 85°C
VPSYS_ACC
(REG0x30[9] = 1)
Battery only with system power =
–3% 3%
11 V / 44 W, TA = –40°C to 85°C
VPSYS_CLAMP PSYS clamp voltage 3 3.3 V
COMPARATOR
VBUS UNDER VOLTAGE LOCKOUT COMPARATOR
VBUS undervoltage rising
VVBUS_UVLOZ VBUS rising 2.30 2.55 2.80 V
threshold
VBUS undervoltage falling
VVBUS_UVLO VBUS falling 2.18 2.40 2.62 V
threshold
VVBUS_UVLO_HYST VBUS undervoltage hysteresis 150 mV
VBUS converter enable rising
VVBUS_CONVEN VBUS rising 3.2 3.5 3.9 V
threshold
VBUS converter enable falling
VVBUS_CONVENZ VBUS falling 2.9 3.2 3.5 V
threshold
VBUS converter enable
VVBUS_CONVEN_HYST 400 mV
hysteresis
BATTERY UNDER VOLTAGE LOCKOUT COMPARATOR
VBAT undervoltage rising
VVBAT_UVLOZ VSRN rising 2.35 2.55 2.75 V
threshold
VBAT undervoltage falling
VVBAT_UVLO VSRN falling 2.2 2.4 2.6 V
threshold
VVBAT_UVLO_HYST VBAT undervoltage hysteresis 150 mV
VBAT OTG enable rising
VVBAT_OTGEN VSRN rising 3.25 3.55 3.85 V
threshold
VBAT OTG enable falling
VVBAT_OTGENZ VSRN falling 2.2 2.4 2.6 V
threshold
VVBAT_OTGEN_HYST VBAT OTG enable hysteresis 1100 mV
VBUS UNDER VOLTAGE COMPARATOR (OTG MODE)
VBUS undervoltage falling
VVBUS_OTG_UV As percentage of REG0x3B() 85 %
threshold

14 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

8.5 Electrical Characteristics (continued)


over TJ = -40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tVBUS_OTG_UV VBUS time undervoltage deglitch 7 ms
VBUS OVER VOLTAGE COMPARATOR (OTG MODE)
VBUS overvoltage rising
VVBUS_OTG_OV As percentage of REG0x3B() 110 %
threshold
VBUS Time Over-Voltage
tVBUS_OTG_OV 10 ms
Deglitch
PRECHARGE to FAST CHARGE TRANSITION
LDO mode to fast charge mode
VBAT_SYSMIN_RISE as percentage of 0x3E() 98 100 102 %
threshold, VSRN rising
LDO mode to fast charge mode
VBAT_SYSMIN_FALL as percentage of 0x3E() 97.5 %
threshold, VSRN falling
Fast charge mode to LDO mode
VBAT_SYSMIN_HYST as percentage of 0x3E() 2.5 %
threshold hysteresis
BATTERY LOWV COMPARATOR (Precharge to Fast Charge Threshold for 1S)
VBATLV_FALL BATLOWV falling threshold 1s 2.8 V
VBATLV_RISE BATLOWV rising threshold 3 V
VBATLV_RHYST BATLOWV hysteresis 200 mV
INPUT OVER-VOLTAGE COMPARATOR (ACOVP)
VBUS overvoltage rising
VACOV_RISE VBUS rising 25 26 27 V
threshold
VBUS overvoltage falling
VACOV_FALL VBUS falling 23.5 24.5 25 V
threshold
VACOV_HYST VBUS overvoltage hysteresis 1.5 V
VBUS converter rising to stop
tACOV_RISE_DEG VBUS deglitch overvoltage rising 100 µs
converter
VBUS converter falling to start
tACOV_FALL_DEG VBUS deglitch overvoltage falling 1 ms
converter
INPUT OVER CURRENT COMPARATOR (ACOC)
ACP to ACN rising threshold, Voltage across input sense
VACOC 1.8 2 2.2
w.r.t. ILIM2 in REG0x33[15:11] resistor rising, REG0x31[2] = 1
VACOC_FLOOR Measure between ACP and ACN Set IDPM to minimum 44 50 56 mV
VACOC_CEILING Measure between ACP and ACN Set IDPM to maximum 172 180 188 mV
tACOC_DEG_RISE Rising deglitch time Deglitch time to trigger ACOC 250 µs
Relax time before converter starts
tACOC_RELAX Relax time 250 ms
again
SYSTEM OVER-VOLTAGE COMPARATOR (SYSOVP)
1s 4.85 5 5.1 V
System overvoltage rising
VSYSOVP_RISE 2s 11.7 12 12.2 V
threshold to turn off converter
3 s, 4 s 19 19.5 20 V
1s 4.8 V
System overvoltage falling
VSYSOVP_FALL 2s 11.5 V
threshold
3 s, 4 s 19 V
Discharge current when SYSOVP
ISYSOVP on SYS 20 mA
stop switching was triggered
BAT OVER-VOLTAGE COMPARATOR (BATOVP)
Overvoltage rising threshold as
VBATOVP_RISE percentage of VBAT_REG in 1 s, 4.2 V 102.5 104 106 %
REG0x15()
2s-4s 102.5 104 105 %

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 15

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

8.5 Electrical Characteristics (continued)


over TJ = -40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Overvoltage falling threshold as
VBATOVP_FALL percentage of VBAT_REG in 1s 100 102 104 %
REG0x15()
2s-4s 100 102 103 %
Overvoltage hysteresis as
VBATOVP_HYST percentage of VBAT_REG in 1s 2 %
REG0x15()
2s-4s 2 %
Discharge current during
IBATOVP on VSYS pin 20 mA
BATOVP
Overvoltage rising deglitch to turn
tBATOVP_RISE 20 ms
off BATDRV to disable charge
CONVERTER OVER-CURRENT COMPARATOR (Q2)
REG0x31[5]=1 150 mV
VOCP_limit_Q2 Converter Over-Current Limit
REG0x31[5]=0 210 mV
REG0x31[5]=1 45 mV
VOCP_limit_SYSSHORT_Q2 System Short or SRN < 2.4 V
REG0x31[5]=0 60 mV
CONVERTER OVER-CURRENT COMPARATOR (ACX)
REG0x31[4]=1 150 mV
VOCP_limit_ACX Converter Over-Current Limit
REG0x31[4]=0 280 mV
REG0x31[4]=1 90 mV
VOCP_limit_SYSSHORT_ACX System Short or SRN < 2.4 V
REG0x31[4]=0 150 mV
THERMAL SHUTDOWN COMPARATOR
Thermal shutdown rising
TSHUT_RISE Temperature increasing 155 °C
temperature
Thermal shutdown falling
TSHUTF_FALL Temperature reducing 135 °C
temperature
TSHUT_HYS Thermal shutdown hysteresis 20 °C
tSHUT_RDEG Thermal deglitch shutdown rising 100 µs
tSHUT_FHYS Thermal deglitch shutdown falling 12 ms
VSYS PROCHOT COMPARATOR

VSYS_TH1 comparator falling REG0x33[7:4] = 0111, 2-4 s 6.6 V


VSYS_TH1
threshold REG0x33[7:4] = 0100, 1 s 3.5 V

VSYS_TH2 comparator falling REG0x33[3:2] = 10, 2-4 s 6.5 V


VSYS_TH2
threshold REG0x33[3:2] = 10, 1 s 3.5 V
tSYS_PRO_falling_DEG VSYS falling deglitch for throttling 4 µs
ICRIT PROCHOT COMPARATOR
Input current rising threshold for
Only when ILIM2 setting is higher
VICRIT_PRO throttling as 10% above ILIM2 105 110 117 %
than 2A
(REG0x33[15:11])
INOM PROCHOT COMPARATOR
INOM rising threshold as 10%
VINOM_PRO 105 110 116 %
above IIN (REG0x3F())
IDCHG PROCHOT COMPARATOR

IDCHG threshold for throttling for 6272 mA


VIDCHG_PRO REG0x34[15:10] = 001100
IDSCHG of 6 A 95 103 %
INDEPENDENT COMPARATOR

16 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

8.5 Electrical Characteristics (continued)


over TJ = -40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

Independent comparator REG0x30[7] = 1, CMPIN falling 1.17 1.2 1.23 V


VINDEP_CMP
threshold REG0x30[7] = 0, CMPIN falling 2.27 2.3 2.33 V
Independent comparator
VINDEP_CMP_HYS REG0x30[7] = 0, CMPIN falling 100 mV
hysteresis
POWER MOSFET DRIVER
PWM OSCILLATOR AND RAMP
FSW PWM switching frequency REG0x12[9] = 0 1020 1200 1380 kHz
REG0x12[9] = 1 680 800 920 kHz
BATFET GATE DRIVER (BATDRV)
VBATDRV_ON Gate drive voltage on BATFET 8.5 10 11.5 V
Drain-source voltage on BATFET
VBATDRV_DIODE 30 mV
during ideal diode operation
Measured by sourcing 10 µA
RBATDRV_ON 2.5 4 6 kΩ
current to BATDRV
Measured by sinking 10 µA
RBATDRV_OFF 1.2 2.1 kΩ
current from BATDRV
PWM HIGH SIDE DRIVER (HIDRV Q1)
High side driver (HSD) turn on
RDS_HI_ON_Q1 VBTST1 - VSW1 = 5 V 6 Ω
resistance
High side driver turn off
RDS_HI_OFF_Q1 VBTST1 - VSW1 = 5 V 1.3 2.2 Ω
resistance
Bootstrap refresh comparator VBTST1 - VSW1 when low side
VBTST1_REFRESH 3.2 3.7 4.6 V
falling threshold voltage refresh pulse is requested
PWM HIGH SIDE DRIVER (HIDRV Q4)
High side driver (HSD) turn on
RDS_HI_ON_Q4 VBTST2 - VSW2 = 5 V 6 Ω
resistance
High side driver turn off
RDS_HI_OFF_Q4 VBTST2 - VSW2 = 5 V 1.5 2.4 Ω
resistance
Bootstrap refresh comparator VBTST2 - VSW2 when low side
VBTST2_REFRESH 3.1 3.7 4.5 V
falling threshold voltage refresh pulse is requested
PWM LOW SIDE DRIVER (LODRV Q2)
Low side driver (LSD) turn on
RDS_LO_ON_Q2 VBTST1 - VSW1 = 5.5 V 6 Ω
resistance
RDS_LO_OFF_Q2 Low side driver turn off resistance VBTST1 - VSW1 = 5.5 V 1.7 2.6 Ω
PWM LOW SIDE DRIVER (LODRV Q3)
Low side driver (LSD) turn on
RDS_LO_ON_Q3 VBTST2 - VSW2 = 5.5 V 7.6 Ω
resistance
RDS_LO_OFF_Q3 Low side driver turn off resistance VBTST2 - VSW2 = 5.5 V 2.9 4.6 Ω
INTERNAL SOFT START During Charge Enable
SSSTEP_DAC Soft Start Step Size 64 mA
SSSTEP_DAC Soft Start Step Time 8 µs
INTEGRATED BTST DIODE (D1)
VF_D1 Forward bias voltage IF = 20 mA at 25°C 0.8 V
VR_D1 Reverse breakdown voltage IR = 2 µA at 25°C 20 V
INTEGRATED BTST DIODE (D2)
VF_D2 Forward bias voltage IF = 20 mA at 25°C 0.8 V
VR_D2 Reverse breakdown voltage IR = 2 µA at 25°C 20 V
INTERFACE

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 17

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

8.5 Electrical Characteristics (continued)


over TJ = -40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
LOGIC INPUT (SDA, SCL, OTG/VAP)
VIN_ LO Input low threshold SMBus 0.8 V
VIN_ HI Input high threshold SMBus 2.1 V
LOGIC OUTPUT OPEN DRAIN (SDA, CHRG_OK, CMPOUT)
VOUT_ LO Output saturation voltage 5 mA drain current 0.4 V
VOUT_ LEAK Leakage current V=7V –1 1 µA
LOGIC OUTPUT OPEN DRAIN SDA
VOUT_ LO_SDA Output Saturation Voltage 5 mA drain current 0.4 V
VOUT_ LEAK_SDA Leakage Current V = 7V –1 1 µA
LOGIC OUTPUT OPEN DRAIN CHRG_OK
VOUT_ LO_CHRG_OK Output Saturation Voltage 5 mA drain current 0.4 V
VOUT_ LEAK _CHRG_OK Leakage Current V = 7V –1 1 µA
LOGIC OUTPUT OPEN DRAIN CMPOUT
VOUT_ LO_CMPOUT Output Saturation Voltage 5 mA drain current 0.4 V
VOUT_ LEAK _CMPOUT Leakage Current V = 7V –1 1 µA
LOGIC OUTPUT OPEN DRAIN (PROCHOT)
VOUT_ LO_PROCHOT Output saturation voltage 50 Ω pullup to 1.05 V / 5-mA 300 mV
VOUT_ LEAK_PROCHOT Leakage current V = 5.5 V –1 1 µA
ANALOG INPUT (ILIM_HIZ)
VHIZ_ LO Voltage to get out of HIZ mode ILIM_HIZ pin rising 0.8 V
VHIZ_ HIGH Voltage to enable HIZ mode ILIM_HIZ pin falling 0.4 V
ANALOG INPUT (CELL_BATPRESZ)
REGN of REGN = 6 V, as
VCELL_4S 4S 68.4 75 %
percentage
REGN of REGN = 6 V, as
VCELL_3S 3S 51.7 55 65 %
percentage
REGN of REGN = 6 V, as
VCELL_2S 2S 35 40 49.1 %
percentage
REGN of REGN = 6 V, as
VCELL_1S 1S 18.4 25 31.6 %
percentage
VCELL_BATPRESZ_RISE Battery is present CELL_BATPRESZ rising 18 %
VCELL_BATPRESZ_FALL Battery is removed CELL_BATPRESZ falling 15 %

8.6 Timing Requirements


MIN NOM MAX UNIT
SMBus TIMING CHARACTERISTICS
tr SCLK/SDATA rise time 300 ns
tf SCLK/SDATA fall time 300 ns
tW(H) SCLK pulse width high 0.6 50 µs
tW(L) SCLK Pulse Width Low 1.3 µs
tSU(STA) Setup time for START condition 0.6 µs
tH(STA) START condition hold time after which first clock pulse is generated 0.6 µs
tSU(DAT) Data setup time 100 ns
tH(DAT) Data hold time 300 ns
tSU(STOP) Setup time for STOP condition 0.6 µs

18 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

8.6 Timing Requirements (continued)


MIN NOM MAX UNIT
t(BUF) Bus free time between START and STOP condition 1.3 µs
FS(CL) Clock Frequency 10 100 kHz
HOST COMMUNICATION FAILURE
ttimeout SMBus bus release timeout(1) 25 35 ms
tDeg_WD Deglitch for watchdog reset signal 10 ms
Watchdog timeout period, ChargeOption() bit [14:13] = 01(2) 4 5.5 7 s
tWDI Watchdog timeout period, ChargeOption() bit bit [14:13] = 10(2) 70 88 105 s
Watchdog timeout period, ChargeOption() bit bit [14:13] = 11(2) 140 175 210 s

(1) Devices participating in a transfer will timeout when any clock low exceeds the 25ms minimum timeout period. Devices that have
detected a timeout condition must reset the communication no later than the 35 ms maximum timeout period. Both a master and a
slave must adhere to the maximum value specified as it incorporates the cumulative stretch limit for both a master (10 ms) and a slave
(25 ms).
(2) User can adjust threshold via SMBus ChargeOption() REG0x12().

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 19

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

8.7 Typical Characteristics


90 90

85 85

80 80
Efficiency (%)

Efficiency (%)
75 75

70 70
VOUT = 6.1 V VOUT = 6.1 V
65 VOUT = 8.4 V 65 VOUT = 8.4 V
VOUT = 9.2 V VOUT = 9.2 V
VOUT = 12.5 V VOUT = 12.5 V
60 60
0 0.01 0.02 0.03 0.04 0.05 0 0.01 0.02 0.03 0.04 0.05
Output Current (A) D001
Output Current (A) D001

VIN = 5 V VIN = 12 V
Figure 8-1. Light Load Efficiency Figure 8-2. Light Load Efficiency
90 96

94
85
92
80
Efficiency (%)

Efficiency (%)

90

75 88

86
70
VOUT = 6.1 V 84 VOUT = 3.7 V
65 VOUT = 8.4 V VOUT = 7.4 V
VOUT = 9.2 V 82 VOUT = 11.1 V
VOUT = 12.5 V VOUT = 14.8 V
60 80
0 0.01 0.02 0.03 0.04 0.05 0 1 2 3 4 5 6
Output Current (A) D001
Output Current (A) D001

VIN = 20 V VIN = 5 V
Figure 8-3. Light Load Efficiency Figure 8-4. System Efficiency
98 98

96 96

94 94

92 92
Efficiency (%)

Efficiency (%)

90 90

88 88

86 86

84 VOUT = 3.7 V 84 VOUT = 3.7 V


VOUT = 7.4 V VOUT = 7.4 V
82 VOUT = 11.1 V 82 VOUT = 11.1 V
VOUT = 14.8 V VOUT = 14.8 V
80 80
0 1 2 3 4 5 6 0 1 2 3 4 5 6
Output Current (A) D001
Output Current (A) D001

VIN = 9 V VIN = 12 V
Figure 8-5. System Efficiency Figure 8-6. System Efficiency

20 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

8.7 Typical Characteristics (continued)


98 96
VOTG = 5 V
96 94 VOTG = 12 V
VOTG = 20 V
94
92
92
Efficiency (%)

Efficiency (%)
90
90
88
88
86
86
VOUT = 3.7 V 84
84
VOUT = 7.4 V
82 VOUT = 11.1 V 82
VOUT = 14.8 V
80 80
0 1 2 3 4 5 6 0 1 2 3 4 5
Output Current (A) D001
Output Current (A) D001

VIN = 20 V Figure 8-8. OTG Efficiency with 1S Battery

Figure 8-7. System Efficiency


96 98

94 96

94
92
92
Efficiency (%)

Efficiency (%)

90
90
88
88
86
86
84
84
VOTG = 5 V VOTG = 5 V
82 VOTG = 12 V 82 VOTG = 12 V
VOTG = 20 V VOTG = 20 V
80 80
0 1 2 3 4 5 6 0 1 2 3 4 5 6
Output Current (A) D001
Output Current (A) D001
Figure 8-9. OTG Efficiency with 2S Battery Figure 8-10. OTG Efficiency with 3S Battery
98

96

94

92
Efficiency (%)

90

88

86

84
VOTG = 5 V
82 VOTG = 12 V
VOTG = 20 V
80
0 1 2 3 4 5 6
Output Current (A) D001
Figure 8-11. OTG Efficiency with 4S Battery

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 21

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9 Detailed Description
9.1 Overview
The BQ25710 is a Narrow VDC buck-boost charger controller for portable electronics such as notebook,
detachable, ultrabook, tablet and other mobile devices with rechargeable batteries. It provides seamless
transition among different converter operation modes (buck, boost, or buck boost), fast transient response, and
high light load efficiency.
BQ25710 supports wide range of power sources, including USB PD ports, legacy USB ports, traditional ACDC
adapters, etc. It takes input voltage from 3.5 V to 24 V, and charges battery of 1-4 series. In the absence of an
input source, BQ25710 supports USB On-the-Go (OTG) function from 1-4 cell battery to generate adjustable 3
V ~ 20.8 V at USB port with 8mV resolution. The OTG output voltage transition slew rate can be configurable,
which complies with the USB Power Delivery 3.0 PPS specifications.
When only the battery powers the system and no external load is connected to the USB OTG port, BQ25710
provides the Vmin Active Protection (VAP) feature. In the VAP operation, BQ25710 first charges up the voltage
of the input decoupling capacitors at VBUS to store a certain amount of energy. During the system peak power
spike, the huge current drawn from the battery introduces a larger voltage drop across the impedance from the
battery to the system. Then the energy stored in the input capacitors will supplement the system, to prevent the
system voltage from drooping below the minimum system voltage and leading the system to black screen. This
VAP is designed to absorb system power peaks during the periods of high demand to improve the system turbo
performance, which is highly recommended by Intel for the platforms with 1S~2S battery.
BQ25710 features Dynamic Power Management (DPM) to limit the input power and avoid AC adapter
overloading. During battery charging, as the system power increases, the charging current will reduce to
maintain total input current below adapter rating. If system power demand temporarily exceeds adapter rating,
BQ25710 supports NVDC architecture to allow battery discharge energy to supplement system power. For
details, refer to Section 9.6.5.1.
In order to be compliant with an Intel IMVP8 / IMVP9 compliant system, BQ25710 includes PSYS function to
monitor the total platform power from adapter and battery. Besides PSYS, it provides both an independent input
current buffer (IADPT) and a battery current buffer (IBAT) with highly accurate current sense amplifiers. If the
platform power exceeds the available power from adapter and battery, a PROCHOT signal is asserted to CPU
so that the CPU optimizes its performance to the power available to the system.
The SMBus controls input current, charge current and charge voltage registers with high resolution, high
accuracy regulation limits. It also sets the PROCHOT timing and threshold profile to meet system requirements.

22 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.2 Functional Block Diagram

CHRG_OK 4
CHRG_OK_DRV 50ms Rising
Deglitch
BQ25710 Block Diagram
** programmable in register
50ms Rising EN_REGN
Deglitch
3.9V

VBUS 1 VREF_CMP**
CMP_DEG**
ACOVP
14 CMPIN
26V 15 CMPOUT

VREF_VDPM or VREF_VOTG
16
COMP1
VSNS_VDPM or VSYS_VOTG

EN_HIZ 17
COMP2
ILIM_HIZ 6 Decoder VREF_ILIM
VSYS
VREF_IDPM, or VREF_IOTG

ACP 2 VSNS_IDPM, or VSNS_IOTG LDO Mode


20X** Gate Control
21 BATDRV
ACN 3
VSYS-10V
IADPT 8
VSNS_ICHG 30 BTST1
IBAT 9 VSNS_IDCHG

Loop Selector 31 HIDRV1


and
32 SW1
16X Error Amplifier
VREF_ICHG PWM VDDA
7

SRP 20 VSNS_ICHG EN_REGN REGN REGN


20X** 28
LDO
SRN 19
EN_HIZ
VREF_VBAT EN_LEARN
EN_LDO
VSNS_VBAT EN_CHRG
PWM 29 LODRV1
EN_OTG
Driver
Logic 27 PGND
VSYS 22 VREF_VSYS
25 BTST2
VSNS_VSYS
24 HIDRV2

23 SW2
VSNS_VSYS
ACN VSNS_VBAT Over
(ACP-ACN) VSNS_ICHG Current
PSYS 10
SRN
VSNS_IDCHG Over
(SRN-SRP) VSNS_IDPM Voltage 26 LODRV2
VSNS_VDPM Detect
EN_HIZ
SMBUS
EN_LEARN
Interface BATPRESZ
SDA 12 EN_LDO
ChargeOption0() Decoder
EN_CHRG CELL_CONFIG 18 CELL_BATPRESZ
ChargeOption1() EN_OTG
ChargeOption2()
ChargeCurrent() VREF_VSYS
SCL 13
ChargeVoltage() VREF_VBAT
VREF_ICHG
InputCurrent() Loop
VREF_IDPM IADPT
OTG/VAP 5 InputVoltage() Regulation Processor
VREF_VDPM IBAT
MinSysVoltage() Reference Hot 11 PROCHOT
VREF_IOTG VSYS
OTGVoltage() VREF_VOTG CHRG_OK
OTGCurrent()

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 23

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9.3 Feature Description


9.3.1 Power-Up from Battery Without DC Source
If only battery is present and the voltage is above VVBAT_UVLOZ, the BATFET turns on and connects battery to
system. By default, the charger is in low power mode (REG0x12[15] = 1) with lowest quiescent current. The
LDO stays off. When device moves to performance mode (REG0x12[15] = 0), The host can enable IBAT buffer
through SMBus to monitor discharge current. The PSYS, PROCHOT or independent comparator also can be
enabled by the host through the SMBus commands. In performance mode, the REGN LDO is always available
to provide an accurate reference for the other features.
9.3.2 Vmin Active Protection (VAP) when Battery only Mode
In VAP mode operation, the buck-boost charger delivers the energy from the battery to charge the voltage of the
input decoupling capacitors (VBUS) as high as possible (like 20V). The system peak power pulse for a 2S1P or
1S2P system can be as high as 100W if the SoC and motherboard systems spikes coincide. These spikes are
expected to be very rare, but possible. During these high power spikes, the charger is expected to supplement
the battery (drawing the power from the charger’s input decoupling capacitors) to prevent the system voltage
from drooping. VAP allows the SoC to set much higher peak power levels to the SoC, thus provides for much
better Turbo performance.
Follows the steps below to enter VAP operation.:
1. Set the voltage limit to charge VBUS in REG0x3B().
2. Set the current limit to charge VBUS in REG0x3C() and REG0x34[15:10].
3. Set the system voltage regulation point in REG0x3E[13:8], when the input cap supplements battery, the
VSYS_MIN regulation loop will maintain VSYS at this regulation point.
4. Set the PROCHOT_VSYS_TH1 threshold to trigger the VAP discharging VBUS in REG0x33[7:4].
5. Set the PROCHOT_VSYS_TH2 threshold to assert /PROCHOT active low signal to throttle SoC in
REG0x33[3:2].
6. Enable the VAP mode by setting REG0x32[5] = 0, REG0x32[12] = 0, and pulling the OTG/VAP pin to high.
To exit VAP mode, the host should write either REG0x32[5] = 1 or pull low the OTG/VAP pin to low.
Any regular fault conditions of the charger in VAP mode will reset REG0x32[5] = 1, and the charger will exit VAP
mode automatically.
9.3.3 Power-Up From DC Source
When an input source plugs in, the charger checks the input source voltage to turn on LDO and all the bias
circuits. It sets the input current limit before the converter starts.
The power-up sequence from DC source is as follows:
1. 50 ms after VBUS above VVBUS_CONVEN, enable 6 V LDO and CHRG_OK goes HIGH
2. VBUS qualification is executed 50 ms after VBUS first rises above VVBUS_UVLOZ. If
VVBUS_UVLOZ < VBUS < VVBUS_CONVEN then charger fails VBUS qualification, and the charger will re-qualify
VBUS every 2s.
3. Input voltage and current limit setup
4. Battery CELL configuration
5. 150 ms after VBUS above VVBUS_CONVEN, converter powers up.
9.3.3.1 CHRG_OK Indicator
CHRG_OK is an active HIGH open drain indicator. It indicates the charger is in normal operation when the
following conditions are valid:
• VBUS is above VVBUS_CONVEN
• VBUS is below VACOV
• No MOSFET/inductor, or over-voltage, over-current, thermal shutdown fault

24 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.3.3.2 Input Voltage and Current Limit Setup


After CHRG_OK goes HIGH, the charger sets default input current limit in REG0x3F() to 3.25 A. The actual input
current limit being adopted by the device is the lower setting of REG0x3F() and pin.
Charger initiates a VBUS voltage measurement without any load (VBUS at no load) right before the converter is
enabled. The default VINDPM threshold is VBUS at no load – 1.28 V.
After input current and voltage limits are set, the charger device is ready to power up. The host can always
program the input current and voltage limit after the charger being powered up, based on the input source type.
9.3.3.3 Battery Cell Configuration
CELL_BATPRESZ pin is biased with a resistor divider from REGN to CELL_BATPRESZ to GND. After VDDA
LDO is activated, the device detects the battery configuration through CELL_BATPRESZ pin bias voltage. Refer
to Table 9-1 for cell setting thresholds.
Table 9-1. Battery Cell Configuration
CELL COUNT PIN VOLTAGE w.r.t. VDDA BATTERY VOLTAGE (REG0x15) SYSOVP
4S 75% 16.800 V 19.5 V
3S 55% 12.592 V 19.5 V
2S 40% 8.400 V 12 V
1S 25% 4.192 V 5V

9.3.3.4 Device Hi-Z State


The charger enters Hi-Z mode when ILIM_HIZ pin voltage is below 0.4 V or REG0x32[15] is set to 1. During
Hi-Z mode, the input source is present, and the charger is in the low quiescent current mode with REGN LDO
enabled.
9.3.4 USB On-The-Go (OTG)
The device supports USB OTG operation to deliver power from the battery to other portable devices through
USB port. The OTG mode output voltage is set in REG0x3B(). The OTG mode output current is set in
REG0x3C(). The OTG operation can be enabled if the conditions are valid:
• Valid battery voltage is set REG0x15(), the battery voltage should not trip the BATOVP threshold, otherwise,
the converter will stop switching.
• OTG output voltage is set in REG0x3B() and REG0x32[2], if REG0x32[2] = 0, the VOTG digital DAC is offset
by 1.28V to achieve higher range from 4.28V~20.8V, if REG0x32[2] = 1, the VOTG digital DAC is from 3V to
19.52V.
• OTG output current is set in REG0x3C().
• EN_OTG pin is HIGH, REG0x32[12] = 1 and REG0x32[5] = 1.
• VBUS is below VVBUS_CONVENZ.
• 10 ms after the above conditions are valid, converter starts and VBUS ramps up to target voltage. CHRG_OK
pin goes HIGH if REG0x12[11] = 1.
9.3.5 Converter Operation
The charger employs a synchronous buck-boost converter that allows charging from a standard 5-V or a
high-voltage power source. The charger operates in buck, buck-boost and boost mode. The buck-boost can
operate uninterruptedly and continuously across the three operation modes.
Table 9-2. MOSFET Operation
MODE BUCK BUCK-BOOST BOOST
Q1 Switching Switching ON
Q2 Switching Switching OFF
Q3 OFF Switching Switching
Q4 ON Switching Switching

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 25

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9.3.5.1 Inductance Detection Through IADPT Pin


The charger reads the inductance value through the resistance tied to IADPT pin before the converter starts up.
The resistances recommended for 1uH, 2.2uH and 3.3uH inductance are 93kΩ, 137kΩ and 169kΩ, respectively.
A surface mount chip resistor with ±3% or better tolerance must to be used for an accurate inductance detection.
Table 9-3. Inductor Detection Through IADPT Resistance
INDUCTOR IN USE RESISTOR ON IADPT PIN
1 µH 93 kΩ
2.2 µH 137 kΩ
3.3 µH 169 kΩ

9.3.5.2 Continuous Conduction Mode (CCM)


With sufficient charge or system current, the inductor current does not cross 0 A, which is defined as CCM. The
controller starts a new cycle with ramp coming up from 200 mV. As long as the error amplifier output voltage
is above the ramp voltage, the high-side MOSFET (HSFET) stays on. When the ramp voltage exceeds error
amplifier output voltage, HSFET turns off and low-side MOSFET (LSFET) turns on. At the end of the cycle,
ramp gets reset and LSFET turns off, ready for the next cycle. There is always break-before-make logic during
transition to prevent cross-conduction and shoot-through. During the dead time when both MOSFETs are off, the
body-diode of the low-side power MOSFET conducts the inductor current.
During CCM, the inductor current always flows and creates a fixed two-pole system. Having the LSFET turn-on
when the HSFET is off keeps the power dissipation low and allows safe charging at high currents.
9.3.5.3 Pulse Frequency Modulation (PFM)
In order to improve converter light-load efficiency, BQ25710 switches to PFM operation at light load. The
effective switching frequency will decrease accordingly when system load decreases. The minimum frequency
can be limit to 25 kHz when the OOA feature is enabled (ChargeOption0() bit[10]=1).
9.3.6 Current and Power Monitor
9.3.6.1 High-Accuracy Current Sense Amplifier (IADPT and IBAT)
As an industry standard, a high-accuracy current sense amplifier (CSA) is used to monitor the charger input
current during forward charging mode, or output current during OTG mode (IADPT) and the battery charge/
discharge current (IBAT). IADPT voltage is 20× or 40× the differential voltage across ACP and ACN. IBAT
voltage is 8x/16× (during charging), or 8×/16× (during discharging) of the differential across SRP and SRN. After
input voltage or battery voltage is above UVLO, IADPT output becomes valid. To lower the voltage on current
monitoring, a resistor divider from CSA output to GND can be used and accuracy over temperature can still be
achieved.
• V(IADPT) = 20 or 40 × (V(ACP) – V(ACN)) during forward mode, or 20 or 40 × (V(ACN) – V(ACP)) during reverse
OTG mode.
• V(IBAT) = 8 or 16 × (V(SRP) – V(SRN)) for battery charging current.
• V(IBAT) = 8 or 16 × (V(SRN) – V(SRP)) for battery discharging current.
A maximum 100-pF capacitor is recommended to connect on the output for decoupling high-frequency noise.
An additional RC filter is optional, if additional filtering is desired. Note that adding filtering also adds additional
response delay. The CSA output voltage is clamped at 3.3 V.
9.3.6.2 High-Accuracy Power Sense Amplifier (PSYS)
The charger monitors total system power. During forward mode, the input adapter powers system. During
reverse OTG mode, the battery powers the system and VBUS output. The ratio of PSYS pin output current and
total system power, KPSYS, can be programmed in REG0x30[9] with default 1 μA/W. The input and charge sense
resistors (RAC and RSR) are selected in REG0x30[11:10]. PSYS voltage can be calculated with Equation 1,
where IIN>0 IBAT<0 when the charger is in forward charging with an adapter connected, and IBAT>0 when the
battery is in discharging mode.

26 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

VPSYS RPSYS u KPSYS (VACP u IIN VBAT u IBAT ) (1)

For proper PSYS functionality, RAC and RSR values are limited to 10 mΩ and 20 mΩ.
To minimize the quiescent current, the PSYS function is disabled by default. It can be enabled by setting
REG0x30[12] = 1.
9.3.7 Input Source Dynamic Power Manage
Refer to Section 9.6.6.
9.3.8 Two-Level Adapter Current Limit (Peak Power Mode)
Usually adapter can supply current higher than DC rating for a few milliseconds to tens of milliseconds. The
charger employs two-level input current limit, or peak power mode, to fully utilize the overloading capability and
minimize battery discharge during CPU turbo mode. Peak power mode is enabled in REG0x31[13:12]. The DC
current limit, or ILIM1, is the same as adapter DC current, set in REG0x3F(). The overloading current, or ILIM2, is
set in REG0x33[15:11], as a percentage of ILIM1.
When the charger detects input current surge and battery discharge due to load transient (both the adapter and
battery support the system together), or when the charger detects the system voltage starts to drop due to load
transient (only the adapter supports the system), the charger will first apply ILIM2 for TOVLD in REG0x31[15:14],
and then ILIM1 for up to TMAX – TOVLD time. TMAX is programmed in REG0x31[9:8]. After TMAX, if the load is
still high, another peak power cycle starts. Charging is disabled during TMAX,; once TMAX, expires, charging
continues. If TOVLD is programmed to be equal to TMAX, then peak power mode is always on.
ICRIT_DEG

ICRIT
ILIM2

ILIM1

TOVLD
TOVLD
TMAX
IBUS

ISYS

IBAT 0A
Baery Discharge
PROCHOT_WIDTH
PROCHOT

Figure 9-1. Two-Level Adapter Current Limit Timing Diagram

9.3.9 Processor Hot Indication


When CPU is running turbo mode, the system peak power may exceed available power from adapter and
battery together. The adapter current and battery discharge peak current, or system voltage drop is an indication
that system power is too high. The charger processor hot function monitors these events, and PROCHOT pulse
is asserted if the system power is too high. Once CPU receives PROCHOT pulse from charger, it slows down to
reduce system power. The events monitored by the processor hot function includes:
• ICRIT: adapter peak current, as 110% of ILIM2

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 27

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

• INOM: adapter average current (110% of input current limit)


• IDCHG: battery discharge current
• VSYS: system voltage on VSYS
• Adapter Removal: upon adapter removal (CHRG_OK pin HIGH to LOW)
• Battery Removal: upon battery removal (CELL_BATPRESZ pin goes LOW)
• CMPOUT: Independent comparator output (CMPOUT pin HIGH to LOW)
• VDPM: VBUS lower than 80%/90%/100% of VINDPM threshold.
• EXIT_VAP: Every time when the charger exits VAP mode.
The threshold of ICRIT, IDCHG, VSYS or VDPM, and the deglitch time of ICRIT, INOM, IDCHG or CMPOUT
are programmable through SMBus. Except the PROCHOT_EXIT_VAP is always enabled, the other triggering
events can be individually enabled in REG0x34[7:0]. When any enabled event in PROCHOT profile is triggered,
PROCHOT is asserted low for a single pulse with minimal width programmable in REG0x21[13:12]. At the end
of the single pulse, if the PROCHOT event is still active, the pulse gets extended until the event is removed.
If the PROCHOT pulse extension mode is enabled by setting REG0x21[14] = 1, the PROCHOT pin will be kept
as low until host writes REG0x21[11]21[11] = 0, even if the triggering event has been removed.
If the PROCHOT_VDPM or PROCHOT_EXIT_VAP is triggered, PROCHOT pin will always stay low until the
host clears it, no matter the PROCHOT is in one pulse mod or in extended mode.

28 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

PP_ICRIT
IADPT
+

ICRIT Adjustable
Deglitch EXIT_VAP
Low Pass
(triggered by IN_VAP VDD
Filter PP_INOM
falling edge)
+

INOM

PP_IDCHG
IDCHG
+ PROCHOT

IDCHG_VTH
< 0.3V
10ms
Debounce
PP_VSYS

VSYS_VTH +
V_SRP
• 10ms
Fixed
Deglitch
PP_VDPM

A*VDPM +
VBUS

PP_BATPRES PP_CMP PP_ACOK


CELL_BATPRESZ CHRG_OK
(one shot on pin falling edge) CMPOUT (one shot on pin falling edge)

Figure 9-2. PROCHOT Profile

9.3.9.1 PROCHOT During Low Power Mode


During low power mode (REG0x12[15] = 1), the charger offers a low power PROCHOT function with very
low quiescent current consumption (~150uA), which uses the independent comparator to monitor the system
voltage, and assert PROCHOT to CPU if the system power is too high.
Below lists the register setting to enable PROCHOT monitoring system voltage in low power mode.
• REG0x12[15] = 1 to enable charger low power mode.
• REG0x34[7:0] = 00h
• REG0x30[6:4] = 100
• Independent comparator threshold is always 1.2 V
• When REG0x30[13] = 1, charger monitors system voltage. Connect CMPIN to voltage proportional to system.
PROCHOT triggers from HIGH to LOW when CMPIN voltage rises above 1.2 V.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 29

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

1.2 V PROCHOT
Independent
Comparator
CMPIN
Voltage v VSYS

BQ25710

Figure 9-3. PROCHOT Low Power Mode Implementation

9.3.9.2 PROCHOT Status


REG0x21[8:0] reports which event in the profile triggers PROCHOT if the corresponding bit is set to 1. The
status bit can be reset back to 0 after it is read by host, when the current PROCHOT event is not active any
more.
Assume there are two PROCHOT events, event A and event B. Event A triggers PROCHOT first, but event B
is also active. Both status bits will be HIGH. At the end of the 10 ms PROCHOT pulse, if any of the PROCHOT
event is still active (either A or B), the PROCHOT pulse is extended.
9.3.10 Device Protection
9.3.10.1 Watchdog Timer
The charger includes watchdog timer to terminate charging if the charger does not receive a write
MaxChargeVoltage() or write ChargeCurrent() command within 175 s (adjustable via REG0x12[14:13]). When
watchdog timeout occurs, all register values are kept unchanged except ChargeCurrent() resets to zero. Battery
charging is suspended. Write MaxChargeVoltage() or write ChargeCurrent() commands must be re-sent to reset
watchdog timer and resume charging. Writing REG0x12[14:13] = 00 to disable watchdog timer also resumes
charging.
9.3.10.2 Input Overvoltage Protection (ACOV)
The charger has fixed ACOV voltage. When VBUS pin voltage is higher than ACOV, it is considered as adapter
over voltage. CHRG_OK will be pulled low, and converter will be disabled. As system falls below battery voltage,
BATFET will be turned on. When VBUS pin voltage falls below ACOV, it is considered as adapter voltage returns
back to normal voltage. CHRG_OK is pulled high by external pull up resistor. The converter resumes if enable
conditions are valid.
9.3.10.3 Input Overcurrent Protection (ACOC)
If the input current exceeds the 1.33× or 2× (REG0x31[2]) of ILIM2_VTH (REG0x33[15:11]) set point, converter
stops switching. After 300 ms, converter starts switching again.
9.3.10.4 System Overvoltage Protection (SYSOVP)
When the converter starts up, BQ25710 reads CELL pin configuration and sets MaxChargeVoltage() and
SYSOVP threshold (1s – 5 V, 2s – 12 V, 3s/4s – 19.5 V). Before REGx15() is written by the host, the battery

30 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

configuration will change with CELL pin voltage. When SYSOVP happens, the device latches off the converter.
REG0x20[4] is set to 1. The user can clear latch-off by either writing 0 to the SYSOVP bit or removing and
plugging in the adapter again. After latch-off is cleared, the converter starts again.
9.3.10.5 Battery Overvoltage Protection (BATOVP)
Battery over-voltage may happen when battery is removed during charging or the user plugs in a wrong battery.
The BATOVP threshold is 104% (1 s) or 102% (2 s to 4 s) of regulation voltage set in REG0x15().
9.3.10.6 Battery Short
If BAT voltage falls below SYSMIN during charging, the maximum current is limited to 384 mA.
9.3.10.7 System Short Hiccup Mode
VSYS pin is monitoring the system voltage, when Vsys is lower than 2.4V, after 2ms deglitch time, the charger
will be shut down for 500ms. The charger will restart for 10ms and measure Vsys again, if it is still lower than
2.4V, the charger will be shut down again. This hiccup mode will be tried continuously, if the charger restart is
failed for 7 times in 90 second, the charger will be latched off. REG0x20[3] will be set to 1 to report a system
short fault. The charger only can be enabled again once the host writes REG0x20[3]= 0.
The charger system short hiccup mode can be disabled by writing REG0x12[6]= 1.
9.3.10.8 Thermal Shutdown (TSHUT)
The WQFN package has low thermal impedance, which provides good thermal conduction from the silicon to
the ambient, to keep junction temperatures low. As added level of protection, the charger converter turns off for
self-protection whenever the junction temperature exceeds the 155°C. The charger stays off until the junction
temperature falls below 135°C. During thermal shut down, the LDO current limit is reduced to 16 mA and REGN
LDO stays off. When the temperature falls below 135°C, charge can be resumed with soft start.
9.4 Device Functional Modes
9.4.1 Forward Mode
When input source is connected to VBUS, BQ25710 is in forward mode to regulate system and charge battery.
9.4.1.1 System Voltage Regulation with Narrow VDC Architecture
BQ25710 employs Narrow VDC architecture (NVDC) with BATFET separating system from battery. The
minimum system voltage is set by MinSystemVoltage(). Even with a deeply depleted battery, the system is
regulated above the minimum system voltage.
When the battery is below minimum system voltage setting, the BATFET operates in linear mode (LDO mode).
As the battery voltage rises above the minimum system voltage, BATFET is fully on when charging or in
supplement mode and the voltage difference between the system and battery is the VDS of BATFET. System
voltage is regulated 160 mV above battery voltage when BATFET is off (no charging or no supplement current).
The BATDRV pin is only able to drive a battery MOSFET with Ciss lower than 5nF. The Ciss in the range of
1nF~3nF is recommended.
See Section 9.6.5.1 for details on system voltage regulation and register programming.
9.4.1.2 Battery Charging
BQ25710 charges 1-4 cell battery in constant current (CC), and constant voltage (CV) mode. Based
on CELL_BATPREZ pin setting, the charger sets default battery voltage 4.2V/cell to ChargeVoltage(), or
REG0x15(). According to battery capacity, the host programs appropriate charge current to ChargeCurrent(),
or REG0x14(). When battery is full or battery is not in good condition to charge, host terminates charge by
setting REG0x12[0] to 1, or setting ChargeCurrent() to zero.
See Section 9.3 for details on register programming.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 31

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9.4.2 USB On-The-Go


BQ25710 supports USB OTG functionality to deliver power from the battery to other portable devices through
USB port (reverse mode). The OTG output voltage is compliant with USB PD specification, including 5 V, 9 V, 15
V, and 20 V. The output current regulation is compliant with USB type C specification, including 500 mA, 1.5 A, 3
A and 5 A.
Similar to forward operation, the device switches from PWM operation to PFM operation at light load to improve
efficiency.
9.4.3 Pass Through Mode (PTM)
When the system is in the sleep mode or light load condition, the charger can be operated in the pass through
mode to improve the light load efficiency. In TI patented pass through mode (PTM), the Buck and Boost high
side FETs are both turned on, while the Buck and Boost low side FETs are both turned off. The input power is
directly passed through the charger to the system. The switching losses of MOSFETs and the inductor core loss
are saved.
Device will be transition from normal Buck-Boost operation to PTM operation by:
• Set REG0x31[7] = 0, to disable the EN_EXITILIM.
• Set REG0x30[8] = 1.
• Set REG0x30[2] = 1.
• Ground ILIM_HIZ pin.
Device will transition out of PTM mode with host control by:
• Set REG0x30[2] = 0.
• Pull ILIM_HIZ pin to high.
• Device exits PTM to buck-boost operation if tripping VINDPM.
• Device exits PTM to buck-boost operation under fault conditions
9.5 Programming
The charger supports battery-charger commands that use either Write-Word or Read-Word protocols, as
summarized in Section 9.5.1.1. The SMBus address is 12h. The ManufacturerID and DeviceID registers are
assigned identify the charger device. The ManufacturerID register command always returns 40h.
9.5.1 SMBus Interface
The BQ25710 device operates as a slave, receiving control inputs from the embedded controller host through
the SMBus interface. The BQ25710 device uses a simplified subset of the commands documented in System
Management Bus Specification V1.1, which can be downloaded from www.smbus.org. The BQ25710 device
uses the SMBus read-word and write-word protocols (shown in Table 9-4 and Table 9-5) to communicate with
the smart battery. The device performs only as a SMBus slave device with address 0b00010010 (0x12H) and
does not initiate communication on the bus. In addition, the device has two identification registers, a 16-bit
device ID register (0xFFH) and a 16-bit manufacturer ID register (0xFEH).
SMBus communication starts when VCC is above V(UVLO).
The data (SDA) and clock (SCL) pins have Schmitt-trigger inputs that can accommodate slow edges. Choose
pullup resistors (10 kΩ) for SDA and SCL to achieve rise times according to the SMBus specifications.
Communication starts when the master signals a start condition, which is a high-to-low transition on SDA,
while SCL is high. When the master has finished communicating, the master issues a stop condition, which is a
low-to-high transition on SDA, while SCL is high. The bus is then free for another transmission. Figure 9-4 and
Figure 9-5 show the timing diagram for signals on the SMBus interface. The address byte, command byte, and
data bytes are transmitted between the start and stop conditions. The SDA state changes only while SCL is low,
except for the start and stop conditions. Data is transmitted in 8-bit bytes and is sampled on the rising edge of
SCL. Nine clock cycles are required to transfer each byte in or out of the device because either the master or
the slave acknowledges the receipt of the correct byte during the ninth clock cycle. The BQ25710 supports the
charger commands listed in Table 9-4.

32 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.5.1.1 SMBus Write-Word and Read-Word Protocols


Table 9-4. Write-Word Format
S SLAVE W ACK COMMAND ACK LOW DATA ACK HIGH DATA ACK P
(1) (3) ADDRESS(1) (1) (6) (2) (5) BYTE(1) (2) (5) BYTE(1) (2) (5) BYTE(1) (2) (5) (1) (4)

7 bits 1b 1b 8 bits 1b 8 bits 1b 8 bits 1b


MSB LSB 0 0 MSB LSB 0 MSB LSB 0 MSB LSB 0

(1) Master to slave


(2) Slave to master (shaded gray)
(3) S = Start condition or repeated start condition
(4) P = Stop condition
(5) ACK = Acknowledge (logic-low)
(6) W = Write bit (logic-low)

Table 9-5. Read-Word Format


S(1) SLAVE W ACK COMMAND ACK S(1) SLAVE R(1) ACK LOW DATA ACK HIGH DATA NACK P
(3) ADDRESS(1) (1) (7) (2) (5) BYTE(1) (2) (5) (3) ADDRESS(1) (8) (2) (5) BYTE(2) (1) (5) BYTE(2) (1) (6) (1) (4)

7 bits 1b 1b 8 bits 1b 7 bits 1b 1b 8 bits 1b 8 bits 1b


MSB LSB 0 0 MSB LSB 0 MSB LSB 1 0 MSB LSB 0 MSB LSB 1

(1) Master to slave


(2) Slave to master (shaded gray)
(3) S = Start condition or repeated start condition
(4) P = Stop condition
(5) ACK = Acknowledge (logic-low)
(6) NACK = Not acknowledge (logic-high)
(7) W = Write bit (logic-low)
(8) R = Read bit (logic-high)

9.5.1.2 Timing Diagrams


A B C D E F G H I J K L M
tLOW tHIGH

SMBCLK

SMBDATA

tSU:STA tHD:STA tSU:DAT tHD:DAT tHD:DAT tSU:STO tBUF


A = Start condition H = LSB of data clocked into slave

B = MSB of address clocked into slave I = Slave pulls SMBDATA line low

C = LSB of address clocked into slave J = Acknowledge clocked into master

D = R/W bit clocked into slave K = Acknowledge clock pulse

E = Slave pulls SMBDATA line low L = Stop condition, data executed by slave

F = ACKNOWLEDGE bit clocked into master M = New start condition

G = MSB of data clocked into slave

Figure 9-4. SMBus Write Timing

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 33

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

A B C D E F G H I J K
tLOW tHIGH

SMBCLK

SMBDATA

tSU:STA tHD:STA tSU:DAT tHD:DAT tSU:DAT tSU:STO tBUF

A = START CONDITION E = SLAVE PULLS SMBDATA LINE LOW I = ACKNOWLEDGE CLOCK PULSE

A = Start condition G = MSB of data clocked into master

B = MSB of address clocked into slave H = LSB of data clocked into master

C = LSB of address clocked into slave I = Acknowledge clock pulse

D = R/W bit clocked into slave J = Stop condition

E = Slave pulls SMBDATA line low K = New start condition

F = ACKNOWLEDGE bit clocked into master

Figure 9-5. SMBus Read Timing

9.6 Register Map


Table 9-6. Charger Command Summary
SMBus
REGISTER NAME TYPE DESCRIPTION LINKS
ADDR
12h ChargeOption0() R/W Charge Option 0 Go
14h ChargeCurrent() R/W 7-bit charge current setting Go
LSB 64 mA, Range 0 mA - 8128 mA
15h MaxChargeVoltage() R/W 12-bit charge voltage setting Go
LSB 16 mV, Default: 1S-4200mV, 2S-8400mV,
3S-12600mV, 4S-16800mV
30h ChargeOption1() R/W Charge Option 1 Go
31h ChargeOption2() R/W Charge Option 2 Go
32h ChargeOption3() R/W Charge Option 3 Go
33h ProchotOption0() R/W PROCHOT Option 0 Go
34h ProchotOption1() R/W PROCHOT Option 1 Go
35h ADCOption() R/W ADC Option Go
20h ChargerStatus() R Charger Status Go
21h ProchotStatus() R Prochot Status Go
22h IIN_DPM() R 7-bit input current limit in use Go
LSB: 50 mA, Range: 50 mA - 6400 mA
23h ADCVBUS/PSYS() R 8-bit digital output of input voltage, Go
8-bit digital output of system power
PSYS: Full range: 3.06 V, LSB: 12 mV
VBUS: Full range: 3.2 V - 19.52 V, LSB 64 mV
24h ADCIBAT() R 8-bit digital output of battery charge current, Go
8-bit digital output of battery discharge current
ICHG: Full range 8.128 A, LSB 64 mA
IDCHG: Full range: 32.512 A, LSB: 256 mA

34 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

Table 9-6. Charger Command Summary (continued)


SMBus
REGISTER NAME TYPE DESCRIPTION LINKS
ADDR
25h ADCIINCMPIN() R 8-bit digital output of input current, Go
8-bit digital output of CMPIN voltage
POR State - IIN: Full range: 12.75 A, LSB 50 mA
CMPIN: Full range 3.06 V, LSB: 12 mV
26h ADCVSYSVBAT() R 8-bit digital output of system voltage, Go
8-bit digital output of battery voltage
VSYS: Full range: 2.88 V - 19.2 V, LSB: 64 mV
VBAT: Full range : 2.88 V - 19.2 V, LSB 64 mV
3Bh OTGVoltage() R/W 12-bit OTG voltage setting Go
LSB 8 mV, Range: 3000 mV – 20800 mV
3Ch OTGCurrent() R/W 7-bit OTG output current setting Go
LSB 50 mA, Range: 0 A – 6350 mA
3Dh InputVoltage() R/W 8-bit input voltage setting Go
LSB 64 mV, Range: 3200 mV – 19520 mV
3Eh MinSystemVoltage() R/W 6-Bit minimum system voltage setting Go
LSB: 256 mV, Range: 1024 mV - 16182 mV
Default: 1S-3.584V, 2S-6.144V, 3S-9.216V,
4S-12.288V
3Fh IIN_HOST() R/W 6-bit Input current limit set by host Go
LSB: 50 mA, Range: 50 mA - 6400 mA
FEh ManufacturerID() R Manufacturer ID - 0x0040H Go
FFh DeviceID() R Device ID Go

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 35

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9.6.1 Setting Charge and PROCHOT Options


9.6.1.1 ChargeOption0 Register (SMBus address = 12h) [reset = E70Eh]
Figure 9-6. ChargeOption0 Register (SMBus address = 12h) [reset = E70Eh]
15 14 13 12 11 10 9 8
EN_LWPWR WDTMR_ADJ IDPM_AUTO_ OTG_ON_ EN_OOA PWM_FREQ PTM_LL_EFF
DISABLE CHRGOK
R/W R/W R/W R/W R/W R/W R/W

7 6 5 4 3 2 1 0
Reserved SYS_SHORT EN_LEARN IADPT_GAIN IBAT_GAIN EN_LDO EN_IDPM CHRG_INHIBIT
DISABLE
R/W R/W R/W R/W R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-7. ChargeOption0 Register (SMBus address = 12h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 EN_LWPWR R/W 1b Low Power Mode Enable
0b: Disable Low Power Mode. Device in performance mode with battery only.
The PROCHOT, current/power monitor buffer and comparator follow register
setting.
1b: Enable Low Power Mode. Device in low power mode with battery only
for lowest quiescent current. The LDO is off. The PROCHOT, discharge
current monitor buffer, power monitor buffer and independent comparator are
disabled. ADC is not available in Low Power Mode. Independent comparator
can be enabled by setting either REG0X30()[14] or [13] to 1. <default at POR>
14-13 WDTMR_ADJ R/W 11b WATCHDOG Timer Adjust
Set maximum delay between consecutive SMBus write of charge voltage or
charge current command.
If device does not receive a write on the REG0x15() or the REG0x14()
within the watchdog time period, the charger will be suspended by setting
the REG0x14() to 0 mA.
After expiration, the timer will resume upon the write of REG0x14(),
REG0x15() or REG0x12[14:13]. The charger will resume if the values are
valid.
00b: Disable Watchdog Timer
01b: Enabled, 5 sec
10b: Enabled, 88 sec
11b: Enable Watchdog Timer, 175 sec <default at POR>
12 IDPM_AUTO_ R/W 0b IDPM Auto Disable
DISABLE When CELL_BATPRESZ pin is LOW, the charger automatically disables the
IDPM function by setting EN_IDPM (REG0x12[1]) to 0. The host can enable
IDPM function later by writing EN_IDPM bit (REG0x12[1]) to 1.
0b: Disable this function. IDPM is not disabled when CELL_BATPRESZ goes
LOW. <default at POR>
1b: Enable this function. IDPM is disabled when CELL_BATPRESZ goes
LOW.
11 OTG_ON_ R/W 0b Add OTG to CHRG_OK
CHRGOK Drive CHRG_OK to HIGH when the device is in OTG mode.
0b: Disable <default at POR>
1b: Enable

36 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

Table 9-7. ChargeOption0 Register (SMBus address = 12h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
10 EN_OOA R/W 1b Out-of-Audio Enable
0b: No limit of PFM burst frequency
1b: Set minimum PFM burst frequency to above 25 kHz to avoid audio noise
<default at POR>
9 PWM_FREQ R/W 1b Switching Frequency
Two converter switching frequencies. One for small inductor and the other for
big inductor.
Recommend 800 kHz with 2.2 µH or 3.3 µH, and 1.2 MHz with 1 µH or 1.5 µH.
0b: 1200 kHz
1b: 800 kHz <default at POR>
8 LOW_PTM_ R/W 1b PTM mode input voltage and current ripple reduction.
RIPPLE 0b: Disable
1b: Enable <default at POR>

Table 9-8. ChargeOption0 Register (SMBus address = 12h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 Reserved R/W 0b Reserved
6 SYS_SHORT_DISABLE R/W 0b To disable the hiccup mode during the system short protection.
0b: When VSYS is short to lower than 2.4V, the charger enters hiccup mode
<default at POR>
1b: The charger hiccup mode is disabled during system short fault
5 EN_LEARN R/W 0b LEARN function allows the battery to discharge while the adapter is present.
It calibrates the battery gas gauge over a complete discharge/charge cycle.
When the battery voltage is below battery depletion threshold, the system
switches back to adapter input by the host. When CELL_BATPRESZ pin is
LOW, the device exits LEARN mode and this bit is set back to 0.
0b: Disable LEARN Mode <default at POR>
1b: Enable LEARN Mode
4 IADPT_GAIN R/W 0b IADPT Amplifier Ratio
The ratio of voltage on IADPT and voltage across ACP and ACN.
0b: 20× <default at POR>
1b: 40×
3 IBAT_GAIN R/W 1b IBAT Amplifier Ratio
The ratio of voltage on IBAT and voltage across SRP and SRN
0b: 8×
1b: 16× <default at POR>
2 EN_LDO R/W 1b LDO Mode Enable
When battery voltage is below minimum system voltage (REG0x3E()), the
charger is in precharge with LDO mode enabled.
0b: Disable LDO mode, BATFET fully ON. Precharge current is set by battery
pack internal resistor. The system is regulated by the MaxChargeVoltage
register.
1b: Enable LDO mode, Precharge current is set by the ChargeCurrent register
and clamped below 384 mA (2 cell – 4 cell) or 2A (1 cell). The system is
regulated by the MinSystemVoltage register. <default at POR>

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 37

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-8. ChargeOption0 Register (SMBus address = 12h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
1 EN_IDPM R/W 1b IDPM Enable
Host writes this bit to enable IDPM regulation loop. When the IDPM is disabled
by the charger (refer to IDPM_AUTO_DISABLE), this bit goes LOW.
0b: IDPM disabled
1b: IDPM enabled <default at POR>
0 CHRG_INHIBIT R/W 0b Charge Inhibit
When this bit is 0, battery charging will start with valid values in the
MaxChargeVoltage register and the ChargeCurrent register.
0b: Enable Charge <default at POR>
1b: Inhibit Charge

38 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.1.2 ChargeOption1 Register (SMBus address = 30h) [reset = 0211h]


Figure 9-7. ChargeOption1 Register (SMBus address = 30h) [reset = 0211h]
15 14 13 12 11 10 9 8
EN_IBAT EN_PROCHOT_LPWR EN_PSYS RSNS_RAC RSNS_RSR PSYS_RATIO PTM_PINSEL
R/W R/W R/W R/W R/W R/W R/W

7 6 5 4 3 2 1 0
CMP_REF CMP_POL CMP_DEG FORCE_ EN_PTM EN_SHIP_ AUTO_
LATCHOFF DCHG WAKEUP_EN
R/W R/W R/W R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-9. ChargeOption1 Register (SMBus address = 30h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 EN_IBAT R/W 0b IBAT Enable
Enable the IBAT output buffer. In low power mode (REG0x12[15] = 1), IBAT
buffer is always disabled regardless of this bit value.
0b Turn off IBAT buffer to minimize Iq <default at POR>
1b: Turn on IBAT buffer
14-13 EN_PROCHOT R/W 00b Enable PROCHOT during battery only low power mode
_LPWR With battery only, enable VSYS in PROCHOT with low power consumption. Do
not enable this function with adapter present. Refer to Section 9.3.9.1 for more
details.
00b: Disable low power PROCHOT <default at POR>
01b: Enable VSYS low power PROCHOT
10b: Reserved
11b: Reserved
12 EN_PSYS R/W 0b PSYS Enable
Enable PSYS sensing circuit and output buffer (whole PSYS circuit). In low
power mode (REG0x12[15] = 1), PSYS sensing and buffer are always disabled
regardless of this bit value.
0b: Turn off PSYS buffer to minimize Iq <default at POR>
1b: Turn on PSYS buffer
11 RSNS_RAC R/W 0b Input sense resistor RAC
0b: 10 mΩ <default at POR>
1b: 20 mΩ
10 RSNS_RSR R/W 0b Charge sense resistor RSR
0b: 10 mΩ <default at POR>
1b: 20 mΩ
9 PSYS_RATIO R/W 1b PSYS Gain
Ratio of PSYS output current vs total input and battery power with 10-mΩ sense
resistor.
0b: 0.25 µA/W
1b: 1 µA/W <default at POR>
8 PTM_PINSEL R/W 0b Select the ILIM_HIZ pin function
0b: charger enters HIZ mode when pull low the ILIM_HIZ pin. <default at POR>
1b: charger enters PTM when pull low the ILIM_HIZ pin.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 39

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-10. ChargeOption1 Register (SMBus address = 30h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 CMP_REF R/W 0b Independent Comparator internal Reference
0b: 2.3 V <default at POR>
1b: 1.2 V
6 CMP_POL R/W 0b Independent Comparator output Polarity
0b: When CMPIN is above internal threshold, CMPOUT is LOW (internal
hysteresis) <default at POR>
1b: When CMPIN is below internal threshold, CMPOUT is LOW (external
hysteresis)
5-4 CMP_DEG R/W 01b Independent comparator deglitch time, only applied to the falling edge of
CMPOUT (HIGH → LOW).
00b: Independent comparator is disabled
01b: Independent comparator is enabled with output deglitch time 1 µs <default
at POR>
10b: Independent comparator is enabled with output deglitch time of 2 ms
11b: Independent comparator is enabled with output deglitch time of 5 sec
3 FORCE_LATCHOFF R/W 0b Force Power Path Off
When independent comparator triggers, charger turns off Q1 and Q4 (same as
disable converter) so that the system is disconnected from the input source. At
the same time, CHRG_OK signal goes to LOW to notify the system.
0b: Disable this function <default at POR>
1b: Enable this function
2 EN_PTM R/W 0b PTM enable register bit
0b: disable PTM. <default at POR>
1b: enable PTM.
1 EN_SHIP_DCHG R/W 0b Discharge SRN for Shipping Mode
When this bit is 1, discharge SRN pin down below 3.8 V in 140 ms. When 140
ms is over, this bit is reset to 0.
0b: Disable shipping mode <default at POR>
1b: Enable shipping mode
0 AUTO_WAKEUP_EN R/W 1b Auto Wakeup Enable
When this bit is HIGH, if the battery is below minimum system voltage
(REG0x3E()), the device will automatically enable 128 mA charging current
for 30 mins. When the battery is charged up above minimum system voltage,
charge will terminate and the bit is reset to LOW.
0b: Disable
1b: Enable <default at POR>

40 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.1.3 ChargeOption2 Register (SMBus address = 31h) [reset = 02B7h]


Figure 9-8. ChargeOption2 Register (SMBus address = 31h) [reset = 02B7h]
15 14 13 1.2 11 10 9 8
PKPWR_TOVLD_DEG EN_PKPWR_ EN_PKPWR_ PKPWR_ PKPWR_ PKPWR_TMAX[1:0]
IDPM VSYS OVLD_STAT RELAX_STAT
R/W R/W R/W R/W R/W R/W

7 6 5 4 3 2 1 0
EN_EXTILIM EN_ICHG Q2_OCP ACX_OCP EN_ACOC ACOC_VTH EN_ _VTH
_IDCHG
R/W R/W R/W R/W R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-11. ChargeOption2 Register (SMBus address = 31h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15-14 PKPWR_ R/W 00b Input Overload time in Peak Power Mode
TOVLD_DEG 00b: 1 ms <default at POR>
01b: 2 ms
10b: 10 ms
11b: 20 ms
13 EN_PKPWR_IDPM R/W 0b Enable Peak Power Mode triggered by input current overshoot
If REG0x31[13:12] are 00b, peak power mode is disabled. Upon adapter
removal, the bits are reset to 00b.
0b: Disable peak power mode triggered by input current overshoot
<default at POR>
1b: Enable peak power mode triggered by input current overshoot.
12 EN_PKPWR_VSYS R/W 0b Enable Peak Power Mode triggered by system voltage under-shoot
If REG0x31[13:12] are 00b, peak power mode is disabled. Upon adapter
removal, the bits are reset to 00b.
0b: Disable peak power mode triggered by system voltage under-shoot
<default at POR>
1b: Enable peak power mode triggered by system voltage under-shoot.
11 PKPWR_ R/W 0b Indicator that the device is in overloading cycle. Write 0 to get out of
OVLD_STAT overloading cycle.
0b: Not in peak power mode. <default at POR>
1b: In peak power mode.
10 PKPWR_ R/W 0b Indicator that the device is in relaxation cycle. Write 0 to get out of
RELAX_STAT relaxation cycle.
0b: Not in relaxation cycle. <default at POR>
1b: In relaxation mode.
9-8 PKPWR_ R/W 10b Peak power mode overload and relax cycle time.
TMAX[1:0] When REG0x31[15:14] is programmed longer than REG0x31[9:8], there
is no relax time.
00b: 5 ms
01b: 10 ms
10b: 20 ms <default at POR>
11b: 40 ms

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 41

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-12. ChargeOption2 Register (SMBus address = 31h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 EN_EXTILIM R/W 1b Enable ILIM_HIZ pin to set input current limit
0b: Input current limit is set by REG0x3F.
1b: Input current limit is set by the lower value of ILIM_HIZ pin and
REG0x3F. <default at POR>
6 EN_ICHG R/W 0b 0b: IBAT pin as discharge current. <default at POR>
_IDCHG 1b: IBAT pin as charge current.
5 Q2_OCP R/W 1b Q2 OCP threshold by sensing Q2 VDS
0b: 210 mV
1b: 150 mV <default at POR>
4 ACX_OCP R/W 1b Input current OCP threshold by sensing ACP-ACN.
0b: 280 mV
1b: 150 mV <default at POR>
3 EN_ACOC R/W 0b ACOC Enable
Input overcurrent (ACOC) protection by sensing the voltage across
ACP and ACN. Upon ACOC (after 100-µs blank-out time), converter
is disabled.
0b: Disable ACOC <default at POR>
1b: ACOC threshold 133% or 200% ILIM2
2 ACOC_VTH R/W 1b ACOC Limit
Set MOSFET OCP threshold as percentage of IDPM with current
sensed from RAC.
0b: 133% of ILIM2
1b: 200% of ILIM2 <default at POR>
1 EN_BATOC R/W 1b BATOC Enable
Battery discharge overcurrent (BATOC) protection by sensing the
voltage across SRN and SRP. Upon BATOC, converter is disabled.
0b: Disable BATOC
1b: BATOC threshold 133% or 200% PROCHOT IDCHG <default at
POR>
0 BATOC_VTH R/W 1b Set battery discharge overcurrent threshold as percentage of
PROCHOT battery discharge current limit.
0b: 133% of PROCHOT IDCHG
1b: 200% of PROCHOT IDCHG <default at POR>

42 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.1.4 ChargeOption3 Register (SMBus address = 32h) [reset = 0030h]


Figure 9-9. ChargeOption3 Register (SMBus address = 32h) [reset = 0030h]
15 14 13 12 11 10 9 8
EN_HIZ RESET_REG RESET_ EN_OTG EN_ICO Reserved
VINDPM MODE
R/W R/W R/W R/W R/W R/W

7 6 5 4 3 2 1 0
Reserved EN_CONS OTG_VAP IL_AVG OTG_RANGE BATFETOFF_ PSYS_OTG_
VAP _MODE _LOW HIZ IDCHG
R/W R/W R/W R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-13. ChargeOption3 Register (SMBus address = 32h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 EN_HIZ R/W 0b Device Hi-Z Mode Enable
When the charger is in Hi-Z mode, the device draws minimal quiescent
current. With VBUS above UVLO. REGN LDO stays on, and system
powers from battery.
0b: Device not in Hi-Z mode <default at POR>
1b: Device in Hi-Z mode
14 RESET_REG R/W 0b Reset Registers
All the registers go back to the default setting except the VINDPM
register.
0b: Idle <default at POR>
1b: Reset all the registers to default values. After reset, this bit goes back
to 0.
13 RESET_VINDPM R/W 0b Reset VINDPM Threshold
0b: Idle
1b: Converter is disabled to measure VINDPM threshold. After VINDPM
measurement is done, this bit goes back to 0 and converter starts.
12 EN_OTG R/W 0b OTG Mode Enable
Enable device in OTG mode when EN_OTG pin is HIGH.
0b: Disable OTG <default at POR>
1b: Enable OTG mode to supply VBUS from battery.
11 EN_ICO_MODE R/W 0b Enable ICO Algorithm
0b: Disable ICO algorithm. <default at POR>
1b: Enable ICO algorithm.
10-8 Reserved R/W 000b Reserved

Table 9-14. ChargeOption3 Register (SMBus address = 32h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 Reserved R/W 0b Reserved
6 EN_CON_VAP R/W 0b Enable the conservative VAP mode.
0b: Disabled <default at POR>
1b: Enabled

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 43

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-14. ChargeOption3 Register (SMBus address = 32h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
5 OTG_VAP_MODE R/W 1b The selection of the external OTG/VAP pin control.
0b: the external OTG/VAP pin controls the EN/DIS VAP mode
1b: the external OTG/VAP pin controls the EN/DIS OTG mode <default at
POR>
4-3 IL_AVG R/W 10b 4 levels inductor average current clamp.
00b: 6A
01b: 10A
10b: 15A <default at POR>
11b: Disabled
2 OTG_RANGE_LOW R/W 0b Selection of the different OTG ouput voltage range.
0b: VOTG high range 4.28 V - 20.8 V <default at POR>
1b: VOTG low range 3 V - 19.52 V
1 BATFETOFF_ R/W 0b Control BATFET during HIZ mode.
HIZ 0b: BATFET on during Hi-Z <default at POR>
1b: BATFET off during Hi-Z
0 PSYS_OTG_ R/W 0b PSYS function during OTG mode.
IDCHG 0b: PSYS as battery discharge power minus OTG output power <default
at POR>
1b: PSYS as battery discharge power only

44 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.1.5 ProchotOption0 Register (SMBus address = 33h) [reset = 4A65h]


Figure 9-10. ProchotOption0 Register (SMBus address = 33h) [reset = 4A65h]
15-11 10-9 8
ILIM2_VTH ICRIT_DEG PROCHOT_
VDPM_80_90
R/W R/W R/W

7-4 3-2 1 0
VSYS_TH1 VSYS_TH2 INOM_DEG LOWER_
PROCHOT
_VDPM
R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-15. ProchotOption0 Register (SMBus address = 33h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15-11 ILIM2_VTH R/W 01001b ILIM2 Threshold
5 bits, percentage of IDPM in 0x3FH. Measure current between ACP and ACN.
Trigger when the current is above this threshold:
00001b - 11001b: 110% - 230%, step 5%
11010b - 11110b: 250% - 450%, step 50%
11111b: Out of Range (Ignored)
Default 150%, or 01001
10-9 ICRIT_DEG R/W 01b ICRIT Deglitch time
ICRIT threshold is set to be 110% ofILIM2.
Typical ICRIT deglitch time to trigger PROCHOT.
00b: 15 µs
01b: 120 µs <default at POR>
10b: 500 µs
11b: 1 ms
8 PROCHOT_ R/W 0b Lower threshold of the PROCHOT_VDPM comparator
VDPM_80_90 When REG0x33[0]=1, the threshold of the PROCHOT_VDPM comparator is
determined by this bit setting.
0b: 80% of VinDPM threshold <default at POR>.
1b: 90% of VinDPM threshold

Table 9-16. ProchotOption0 Register (SMBus address = 33h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7-4 VSYS_TH1 R/W 0110b VSYS Threshold to trigger discharging VBUS in VAP mode.
Measure on VSYS with fixed 5-µs deglitch time. Trigger when SYS pin voltage is
below the thresholds.
2S - 4S battery
0000b - 1111b: 5.9 V - 7.4V with 0.1 V step size.
1S battery
0000b - 0111b: 3.1 V - 3.8 V with 0.1 V step size.
1000b - 1111b: 3.1 V - 3.8 V with 0.1 V step size.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 45

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-16. ProchotOption0 Register (SMBus address = 33h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
3-2 VSYS_TH2 R/W 01b VSYS Threshold to assert /PROCHOT_VSYS.
Measure on VSYS with fixed 5-µs deglitch time. Trigger when SYS pin voltage is
below the thresholds.
2S - 4S battery
00b: 5.9V; 01b: 6.2V <default at POR>;
10b: 6.5V; 11b: 6.8V.
1S battery
00b: 3.1V; 01b: 3.3V <default at POR>;
10b: 3.5V; 11b: 3.7V.
1 INOM_DEG R/W 0b INOM Deglitch Time
INOM is always 10% above IDPM in 0x3FH. Measure current between ACP and
ACN.
Trigger when the current is above this threshold.
0b: 1 ms <default at POR>
1b: 50 ms
0 LOWER_ R/W 0b Enable the lower threshold of the PROCHOT_VDPM comparator
PROCHOT 0b: the threshold of the PROCHOT_VDPM comparator follows the same VinDPM
_VDPM
REG0x3D() setting.
1b: the threshold of the PROCHOT_VDPM comparator is lower and determined
by REG0x33[8] setting. <default at POR>

46 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.1.6 ProchotOption1 Register (SMBus address = 34h) [reset = 81A0h]


Figure 9-11. ProchotOption1 Register (SMBus address = 34h) [reset = 81A0h]
15-10 9-8
IDCHG_VTH IDCHG_DEG
R/W R/W

7 6 5 4 3 2 1 0
PP_VDPM PROCHOT_PR PP_ICRIT PP_INOM PP_IDCHG PP_VSYS PP_BATPRES PP_ACOK
OFILE_IC
R/W R/W R/W R/W R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

When the REG0x34h[7:0] are set to be disabled, the PROCHOT event associated with that bit will not be
reported in the PROCHOT status register REG0x21h[7:0] any more, and the PROCHOT pin will not be pulled
low any more if the event happens.
Table 9-17. ProchotOption1 Register (SMBus address = 34h) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15-10 IDCHG_VTH R/W 100000b IDCHG Threshold
6 bit, range, range 0 A to 32256 mA, step 512 mA. There is a 128 mA offset
Measure current between SRN and SRP.
Trigger when the discharge current is above the threshold.
If the value is programmed to 000000b PROCHOT is always triggered.
Default: 16384 mA or 100000b
9-8 IDCHG_DEG R/W 01b Typical IDCHG Deglitch Time
00b: 2 ms
01b: 130 µs <default at POR>
10b: 8 ms
11b: 16 ms

Table 9-18. ProchotOption1 Register (SMBus address = 34h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 PROCHOT R/W 1b PROCHOT Profile
_PROFILE_VDPM When all the REG0x34[7:0] bits are 0, PROCHOT function is disabled.
Bit7 PP_VDPM detects VBUS voltage
0b: disable
1b: enable <default at POR>
6 PROCHOT R/W 0b 0b: disable <default at POR>
_PROFILE_COMP 1b: enable
5 PROCHOT R/W 1b 0b: disable
_PROFILE_ICRIT 1b: enable <default at POR>
4 PROCHOT R/W 0b 0b: disable <default at POR>
_PROFILE_INOM 1b: enable
3 PROCHOT R/W 0b 0b: disable <default at POR>
_PROFILE_IDCHG 1b: enable
2 PROCHOT R/W 0b 0b: disable <default at POR>
_PROFILE_VSYS 1b: enable

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 47

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-18. ProchotOption1 Register (SMBus address = 34h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
1 PROCHOT R/W 0b 0b: disable <default at POR>
_PROFILE_BATPRES 1b: enable (one-shot falling edge triggered)
If BATPRES is enabled in PROCHOT after the battery is removed, it will
immediately send out one-shot PROCHOT pulse.
0 PROCHOT R/W 0b 0b: disable <default at POR>
_PROFILE_ACOK 1b: enable
ChargeOption0[15] = 0 to assert PROCHOT pulse after adapter removal.
If PROCHOT_PROFILE_ACOK is enabled in PROCHOT after the adapter is
removed, it will be pulled low.

48 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.1.7 ADCOption Register (SMBus address = 35h) [reset = 2000h]


Figure 9-12. ADCOption Register (SMBus address = 35h) [reset = 2000h]
15 14 13 12-8
ADC_CONV ADC_START ADC_ Reserved
FULLSCALE
R/W R/W R/W R/W

7 6 5 4 3 2 1 0
EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_ EN_ADC_
CMPIN VBUS PSYS IIN IDCHG ICHG VSYS VBAT
R/W R/W R/W R/W R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

The ADC registers are read in the following order: VBAT, VSYS, ICHG, IDCHG, IIN, PSYS, VBUS, CMPIN. ADC
is disabled in low power mode. Before enabling ADC, low power mode should be disabled first.
Table 9-19. ADCOption Register (SMBus address = 35h) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 ADC_CONV R/W 0b Typical ADC conversion time is 10 ms.
0b: One-shot update. Do one set of conversion updates to registers
REG0x23(), REG0x24(), REG0x25(), and REG0x26() after ADC_START =
1.
1b: Continuous update. Do a set of conversion updates to registers
REG0x23(), REG0x24(), REG0x25(), and REG0x26() every 1 sec.
14 ADC_START R/W 0b 0b: No ADC conversion
1b: Start ADC conversion. After the one-shot update is complete, this bit
automatically resets to zero
13 ADC_ R/W 1b ADC input voltage range. When input voltage is below 5 V, or battery is 1S,
FULLSCALE full scale 2.04 V is recommended.
0b: 2.04 V
1b: 3.06 V <default at POR>
12-8 Reserved R/W 00000b Reserved

Table 9-20. ADCOption Register (SMBus address = 35h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 EN_ADC_CMPIN R/W 0b 0b: Disable <default at POR>
1b: Enable
6 EN_ADC_VBUS R/W 0b 0b: Disable <default at POR>
1b: Enable
5 EN_ADC_PSYS R/W 0b 0b: Disable <default at POR>
1b: Enable
4 EN_ADC_IIN R/W 0b 0b: Disable <default at POR>
1b: Enable
3 EN_ADC_IDCHG R/W 0b 0b: Disable <default at POR>
1b: Enable
2 EN_ADC_ICHG R/W 0b 0b: Disable <default at POR>
1b: Enable
1 EN_ADC_VSYS R/W 0b 0b: Disable <default at POR>
1b: Enable

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 49

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-20. ADCOption Register (SMBus address = 35h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
0 EN_ADC_VBAT R/W 0b 0b: Disable <default at POR>
1b: Enable

50 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.2 Charge and PROCHOT Status


9.6.2.1 ChargerStatus Register (SMBus address = 20h) [reset = 0000h]
Figure 9-13. ChargerStatus Register (SMBus address = 20h) [reset = 0000h]
15 14 13 12 11 10 9 8
AC_STAT ICO_DONE IN_VAP IN_VINDPM IN_IINDPM IN_FCHRG IN_PCHRG IN_OTG
R R R R R R R R
7 6 5 4 3 2 1 0
Fault ACOV Fault BATOC Fault ACOC SYSOVP Fault SYS Fault Latchoff Fault_OTG Fault_OTG
_STAT _SHORT _OVP _OCP
R R R R/W R/W R R R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-21. ChargerStatus Register (SMBus address = 20h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 AC_STAT R 0b Input source status, same as CHRG_OK bit
0b: Input not present
1b: Input is present
14 ICO_DONE R 0b After the ICO routine is successfully executed, the bit goes 1.
0b: ICO is not complete
1b: ICO is complete
13 IN_VAP R 0b 0b: Charger is not operated in VAP mode
1b: Charger is operated in VAP mode
12 IN_VINDPM R 0b 0b: Charger is not in VINDPM during forward mode, or voltage
regulation during OTG mode
1b: Charger is in VINDPM during forward mode, or voltage
regulation during OTG mode
11 IN_IINDPM R 0b 0b: Charger is not in IINDPM
1b: Charger is in IINDPM
10 IN_FCHRG R 0b 0b: Charger is not in fast charge
1b: Charger is in fast charger
9 IN_PCHRG R 0b 0b: Charger is not in precharge
1b: Charger is in precharge
8 IN_OTG R 0b 0b: Charger is not in OTG
1b: Charge is in OTG

Table 9-22. ChargerStatus Register (SMBus address = 20h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 Fault ACOV R 0b The faults are latched until a read from host.
0b: No fault
1b: ACOV
6 Fault BATOC R 0b The faults are latched until a read from host.
0b: No fault
1b: BATOC
5 Fault ACOC R 0b The faults are latched until a read from host.
0b: No fault
1b: ACOC

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 51

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-22. ChargerStatus Register (SMBus address = 20h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
4 SYSOVP_STAT R/W 0b SYSOVP Status and Clear
When the SYSOVP occurs, this bit is HIGH. During the SYSOVP, the
converter is disabled.
After the SYSOVP is removed, the user must write a 0 to this bit
or unplug the adapter to clear the SYSOVP condition to enable the
converter again.
0b: Not in SYSOVP <default at POR>
1b: In SYSOVP. When SYSOVP is removed, write 0 to clear the
SYSOVP latch.
3 Fault SYS_SHORT R/W 0b The fault is latched until a clear from host by writing this bit to 0.
0b: No fault <default at POR>
1b: When SYS is lower than 2.4V, then 7 times restart tries are
failed.
2 Fault Latchoff R 0b The faults are latched until a read from host.
0b: No fault
1b: Latch off (REG0x30[3])
1 Fault_OTG_OVP R 0b The faults are latched until a read from host.
0b: No fault
1b: OTG OVP
0 Fault_OTG_UVP R 0b The faults are latched until a read from host.
0b: No fault
1b: OTG UVP

52 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.2.2 ProchotStatus Register (SMBus address = 21h) [reset = A800h]


Figure 9-14. ProchotStatus Register (SMBus address = 21h) [reset = A800h]
15 14 13 12 11 10 9 8
Reserved EN_PROCHOT PROCHOT_WIDTH PROCHOT Reserved STAT_VAP STAT_EXIT
_EXIT _CLEAR _FAIL _VAP
R R/W R/W R/W R R/W R/W
7 6 5 4 3 2 1 0
STAT_VDPM STAT_COMP STAT_ICRIT STAT_INOM STAT_IDCHG STAT_VSYS STAT_BAT STAT_ADPT
_Removal _Removal
R/W R R R R R R R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-23. ProchotStatus Register (SMBus address = 21h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 Reserved R 1b Reserved
14 EN_PROCHOT _EXIT R/W 0b PROCHOT Pulse Extension Enable. When pulse extension is
enabled, keep the PROCHOT pin voltage LOW until host writes
REG0x21[11] = 0.
0b: Disable pulse extension <default at POR>
1b: Enable pulse extension
13-12 PROCHOT _WIDTH R/W 10b PROCHOT Pulse Width.
Minimum PROCHOT pulse width when REG0x21[14] = 0
00b: 100 us
01b: 1 ms
10b: 10 ms <default at POR>
11b: 5 ms
11 PROCHOT _CLEAR R/W 1b PROCHOT Pulse Clear.
Clear PROCHOT pulse when 0x21[14] = 1.
0b: Clear PROCHOT pulse and drive PROCHOT pin HIGH
1b: Idle <default at POR>
10 Reserved R 0b Reserved
9 STAT_VAP_FAIL R/W 0b This status bit reports a failure to load VBUS 7 consecutive times
in VAP mode, which indicates the battery voltage might be not
high enough to enter VAP mode, or the VAP loading current
settings are too high.
0b: Not is VAP failure <default at POR>
1b: In VAP failure, the charger exits VAP mode, and latches off
until the host writes this bit to 0.
8 STAT_EXIT_VAP R/W 0b When the charger is operated in VAP mode, it can exit VAP by
either being disabled through host, or there is any charger faults.
0b: PROCHOT_EXIT_VAP is not active <default at POR>
1b: PROCHOT_EXIT_VAP is active, PROCHOT pin is low until
host writes this status bit to 0.

Table 9-24. ProchotStatus Register (SMBus address = 21h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 STAT_VDPM R/W 0b 0b: Not triggered
1b: Triggered

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 53

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-24. ProchotStatus Register (SMBus address = 21h) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
6 STAT_COMP R 0b 0b: Not triggered
1b: Triggered
5 STAT_ICRIT R 0b 0b: Not triggered
1b: Triggered
4 STAT_INOM R 0b 0b: Not triggered
1b: Triggered
3 STAT_IDCHG R 0b 0b: Not triggered
1b: Triggered
2 STAT_VSYS R 0b 0b: Not triggered
1b: Triggered
1 STAT_Battery_Removal R 0b 0b: Not triggered
1b: Triggered
0 STAT_Adapter_Removal R 0b 0b: Not triggered
1b: Triggered

54 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.3 ChargeCurrent Register (SMBus address = 14h) [reset = 0000h]


To set the charge current, write a 16-bit ChargeCurrent() command (REG0x14h()) using the data format listed in
Figure 9-15, Table 9-25, and Table 9-26.
With 10-mΩ sense resistor, the charger provides charge current range of 64 mA to 8.128 A, with a 64-mA
step resolution. Upon POR, ChargeCurrent() is 0 A. Any conditions for CHRG_OK low except ACOV will reset
ChargeCurrent() to zero. CELL_BATPRESZ going LOW (battery removal) will reset the ChargeCurrent() register
to 0 A.
Charge current is not reset in ACOC, TSHUT, power path latch off (REG0x30[1]), and SYSOVP.
A 0.1-µF capacitor between SRP and SRN for differential mode filtering is recommended; an optional 0.1-µF
capacitor between SRN and ground, and an optional 0.1-µF capacitor between SRP and ground for common
mode filtering. Meanwhile, the capacitance on SRP should not be higher than 0.1 µF in order to properly sense
the voltage across SRP and SRN for cycle-by-cycle current detection.
The SRP and SRN pins are used to sense voltage drop across RSR with default value of 10 mΩ. However,
resistors of other values can also be used. For a larger sense resistor, a larger sense voltage is given, and a
higher regulation accuracy; but, at the expense of higher conduction loss. A current sensing resistor value no
more than 20 mΩ is suggested.
Figure 9-15. ChargeCurrent Register With 10-mΩ Sense Resistor (SMBus address = 14h) [reset = 0h]
15 14 13 12 11 10 9 8
Reserved Charge Current, Charge Current, Charge Current, Charge Current, Charge Current,
bit 6 bit 5 bit 4 bit 3 bit 2
R/W R/W R/W R/W R/W R/W
7 6 5 4 3 2 1 0
Charge Current, Charge Current, Reserved Reserved
bit 1 bit 0
R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-25. Charge Current Register (14h) With 10-mΩ Sense Resistor (SMBus address = 14h) Field
Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15-13 Reserved R/W 000b Not used. 1 = invalid write.
12 Charge Current, bit 6 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 4096 mA of charger current.
11 Charge Current, bit 5 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 2048 mA of charger current.
10 Charge Current, bit 4 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 1024 mA of charger current.
9 Charge Current, bit 3 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 512 mA of charger current.
8 Charge Current, bit 2 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 256 mA of charger current.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 55

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-26. Charge Current Register (14h) With 10-mΩ Sense Resistor (SMBus address = 14h) Field
Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 Charge Current, bit 1 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 128 mA of charger current.
6 Charge Current, bit 0 R/W 0b 0 = Adds 0 mA of charger current.
1 = Adds 64 mA of charger current.
5-0 Reserved R/W 000000b Not used. Value Ignored.

9.6.3.1 Battery Precharge Current Clamp


During precharge, BATFET works in linear mode or LDO mode (default REG0x12[2] = 1). For 2-4 cell battery,
the system is regulated at minimum system voltage in REG0x3E() and the precharge current is clamped at 384
mA. For 1 cell battery, the precharge to fast charge threshold is 3 V, and the precharge current is clamped at 384
mA. However, the BATFET stays in LDO mode operation until battery voltage is above minimum system voltage
(~3.6 V). During battery voltage from 3 V to 3.6 V, the fast charge current is clamped at 2 A.

56 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.4 MaxChargeVoltage Register (SMBus address = 15h) [reset value based on CELL_BATPRESZ pin
setting]
To set the output charge voltage, write a 16-bit ChargeVoltage register command (REG0x15()) using the data
format listed in Figure 9-16, Table 9-27, and Table 9-28. The charger provides charge voltage range from 1.024
V to 19.200 V, with 8-mV step resolution. Any write below 1.024 V or above 19.200 V is ignored.
Upon POR, REG0x15() is by default set as 4200 mV for 1 s, 8400 mV for 2 s, 12600 mV for 3 s or 16800 mV
for 4 s. After CHRG_OK goes high, the charge will start when the host writes the charging current to REG0x14(),
the default charging voltage is used if REG0x15() is not programmed. If the battery is different from 4.2 V/cell,
the host has to write to REG0x15() before REG0x14() for correct battery voltage setting. Writing REG0x15() to 0
will set REG0x15() to the default value based on CELL_BATPRESZ pin, and force REG0x14() to zero to disable
charge.
The SRN pin senses the battery voltage for voltage regulation and should be connected as close to the battery
as possible, and directly place a decoupling capacitor (0.1 µF recommended) as close to the device as possible
to decouple high frequency noise.
Figure 9-16. MaxChargeVoltage Register (SMBus address = 15h) [reset value based on CELL_BATPRESZ
pin setting]
15 14 13 12 11 10 9 8
Reserved Max Charge Max Charge Max Charge Max Charge Max Charge Max Charge Max Charge
Voltage, bit 11 Voltage, bit 10 Voltage, bit 9 Voltage, bit 8 Voltage, bit 7 Voltage, bit 6 Voltage, bit 5
R/W R/W R/W R/W R/W R/W R/W R/W
7 6 5 4 3 2 1 0
Max Charge Max Charge Max Charge Max Charge Max Charge Reserved
Voltage, bit 4 Voltage, bit 3 Voltage, bit 2 Voltage, bit 1 Voltage, bit 1
R/W R/W R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-27. MaxChargeVoltage Register (SMBus address = 15h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 Reserved R/W 0b Not used. 1 = invalid write.
14 Max Charge Voltage, bit 11 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 16384 mV of charger voltage.
13 Max Charge Voltage, bit 10 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 8192 mV of charger voltage
12 Max Charge Voltage, bit 9 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 4096 mV of charger voltage.
11 Max Charge Voltage, bit 8 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 2048 mV of charger voltage.
10 Max Charge Voltage, bit 7 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 1024 mV of charger voltage.
9 Max Charge Voltage, bit 6 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 512 mV of charger voltage.
8 Max Charge Voltage, bit 5 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 256 mV of charger voltage.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 57

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

Table 9-28. MaxChargeVoltage Register (SMBus address = 15h) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 Max Charge Voltage, bit 4 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 128 mV of charger voltage.
6 Max Charge Voltage, bit 3 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 64 mV of charger voltage.
5 Max Charge Voltage, bit 2 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 32 mV of charger voltage.
4 Max Charge Voltage, bit 1 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 16 mV of charger voltage.
3 Max Charge Voltage, bit 0 R/W 0b 0 = Adds 0 mV of charger voltage.
1 = Adds 8 mV of charger voltage.
2-0 Reserved R/W 000b Not used. Value Ignored.

58 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.5 MinSystemVoltage Register (SMBus address = 3Eh) [reset value based on CELL_BATPRESZ pin
setting]
To set the minimum system voltage, write a 16-bit MinSystemVoltage register command (REG0x3E()) using the
data format listed in Figure 9-17, Table 9-29, and Table 9-30. The charger provides minimum system voltage
range from 1.024 V to 16.128 V, with 256-mV step resolution. Any write below 1.024 V or above 16.128 V is
ignored. Upon POR, the MinSystemVoltage register is 3.584 V for 1 S, 6.144 V for 2 S and 9.216 V for 3 S, and
12.288 V for 4 S.
Figure 9-17. MinSystemVoltage Register (SMBus address = 3Eh) [reset value based on CELL_BATPRESZ
pin setting]
15 14 13 12 11 10 9 8
Reserved Min System Min System Min System Min System Min System Min System
Voltage, bit 5 Voltage, bit 4 Voltage, bit 3 Voltage, bit 2 Voltage, bit 1 Voltage, bit 0
R/W R/W R/W R/W R/W R/W R/W
7 6 5 4 3 2 1 0
Reserved
R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-29. MinSystemVoltage Register (SMBus address = 3Eh) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15-14 Reserved R/W 00b Not used. 1 = invalid write.
13 Min System Voltage, bit 5 R/W 0b 0 = Adds 0 mV of system voltage.
1 = Adds 8192 mV of system voltage.
12 Min System Voltage, bit 4 R/W 0b 0 = Adds 0 mV of system voltage.
1 = Adds 4096mV of system voltage.
11 Min System Voltage, bit 3 R/W 0b 0 = Adds 0 mV of system voltage.
1 = Adds 2048 mV of system voltage.
10 Min System Voltage, bit 2 R/W 0b 0 = Adds 0 mV of system voltage.
1 = Adds 1024 mV of system voltage.
9 Min System Voltage, bit 1 R/W 0b 0 = Adds 0 mV of system voltage.
1 = Adds 512 mV of system voltage.
8 Min System Voltage, bit 0 R/W 0b 0 = Adds 0 mV of system voltage.
1 = Adds 256 mV of system voltage.

Table 9-30. MinSystemVoltage Register (SMBus address = 3Eh) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7-0 Reserved R/W 00000000 Not used. Value Ignored.
b

9.6.5.1 System Voltage Regulation


The device employs Narrow VDC architecture (NVDC) with BATFET separating system from battery. The
minimum system voltage is set by REG0x3E(). Even with a deeply depleted battery, the system is regulated
above the minimum system voltage with BATFET.
When the battery is below minimum system voltage setting, the BATFET operates in linear mode (LDO mode),
and the system is regulated above the minimum system voltage setting. As the battery voltage rises above the
minimum system voltage, BATFET is fully on when charging or in supplement mode and the voltage difference

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 59

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

between the system and battery is the VDS of BATFET. System voltage is regulated 160 mV above battery
voltage when BATFET is off (no charging or no supplement current).
When BATFET is removed, the system node VSYS is shorted to SRP. Before the converter starts operation,
LDO mode needs to be disabled. The following sequence is required to configure charger without BATFET.
1. Before adapter plugs in, put the charger into HIZ mode. (either pull pin 6 ILIM_HIZ to ground, or set
REG0x32[15] to 1)
2. Set 0x12[2] to 0 to disable LDO mode.
3. Set 0x30[0] to 0 to disable auto-wakeup mode.
4. Check if battery voltage is properly programmed (REG0x15)
5. Set precharge/charge current (REG0x14)
6. Put the device out of HIZ mode. (Release ILIM_HIZ from ground and set REG0x32[15]=0).
In order to prevent any accidental SW mistakes, the host sets low input current limit (a few hundred milliamps)
when device is out of HIZ.
9.6.6 Input Current and Input Voltage Registers for Dynamic Power Management
The charger supports Dynamic Power Management (DPM). Normally, the input power source provides power for
the system load or to charge the battery. When the input current exceeds the input current setting, or the input
voltage falls below the input voltage setting, the charger decreases the charge current to provide priority to the
system load. As the system current rises, the available charge current drops accordingly towards zero. If the
system load keeps increasing after the charge current drops down to zero, the system voltage starts to drop. As
the system voltage drops below the battery voltage, the battery will discharge to supply the heavy system load.
9.6.6.1 Input Current Registers
To set the maximum input current limit, write a 16-bit IIN_HOST register command (REG0x3F()) using the
data format listed in Table 9-31 and Table 9-32. When using a 10-mΩ sense resistor, the charger provides an
input-current limit range of 50 mA to 6400 mA, with 50-mA resolution. The default current limit is 3.25 A. Due
to the USB current setting requirement, the register setting specifies the maximum current instead of the typical
current. Upon adapter removal, the input current limit is reset to the default value of 3.25 A. With code 0, the
input current limit is 50 mA.
The ACP and ACN pins are used to sense RAC with the default value of 10 mΩ. For a 20-mΩ sense resistor, a
larger sense voltage is given and a higher regulation accuracy, but at the expense of higher conduction loss.
Instead of using the internal DPM loop, the user can build up an external input current regulation loop and have
the feedback signal on the ILIM_HIZ pin.

VILIM _ HIZ = 1V + 40 ´ (VACP - VACN ) = 1 + 40 ´ IDPM ´ R AC (2)

In order to disable ILIM_HIZ pin, the host can write to 0x31[7] to disable ILIM_HIZ pin, or pull ILIM_HIZ pin
above 4.0 V.

60 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.6.1.1 IIN_HOST Register With 10-mΩ Sense Resistor (SMBus address = 3Fh) [reset = 4100h]
With code 0, the input current limit readback is 50 mA.
Figure 9-18. IIN_HOST Register With 10-mΩ Sense Resistor (SMBus address = 3Fh) [reset = 4100h]
15 14 13 12 11 10 9 8
Reserved Input Current Input Current Input Current Input Current Input Current Input Current Input Current
set by host, bit set by host, bit set by host, bit set by host, bit set by host, bit set by host, bit set by host, bit
6 5 4 3 2 1 0
R/W R/W R/W R/W R/W R/W R/W R/W
7 6 5 4 3 2 1 0
Reserved
R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-31. IIN_HOST Register With 10-mΩ Sense Resistor (SMBus address = 3Fh) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 Reserved R/W 0b Not used. 1 = invalid write.
14 Input Current set by host, bit 6 R/W 1b 0 = Adds 0 mA of input current.
1 = Adds 3200 mA of input current.
13 Input Current set by host, bit 5 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 1600 mA of input current.
12 Input Current set by host, bit 4 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 800 mA of input current.
11 Input Current set by host, bit 3 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 400 mA of input current.
10 Input Current set by host, bit 2 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 200 mA of input current.
9 Input Current set by host, bit 1 R/W 0b 0 = Adds 0 mA of input current.
1 = Adds 100 mA of input current.
8 Input Current set by host, bit 0 R/W 1b 0 = Adds 0 mA of input current.
1 = Adds 50 mA of input current.

Table 9-32. IIN_HOST Register With 10-mΩ Sense Resistor (SMBus address = 3Fh) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7-0 Reserved R 00000000 Not used. Value Ignored.
b

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 61

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9.6.6.1.2 IIN_DPM Register With 10-mΩ Sense Resistor (SMBus address = 022h) [reset = 4100h]
IIN_DPM register reflects the actual input current limit programmed in the register, either from host or from ICO.
After ICO, the current limit used by DPM regulation may differ from the IIN_HOST register settings. The actual
DPM limit is reported in REG0x22(). With code 0, the input current limit read-back is 50 mA.

Figure 9-19. IIN_DPM Register With 10-mΩ Sense Resistor (SMBus address = 022h) [reset = 4100h]
15 14 13 12 11 10 9 8
Reserved Input Current in Input Current in Input Current in Input Current in Input Current in Input Current in Input Current in
DPM, bit 6 DPM, bit 5 DPM, bit 4 DPM, bit 3 DPM, bit 2 DPM, bit 1 DPM, bit 0
R R R R R R R R
7 6 5 4 3 2 1 0
Reserved
R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-33. IIN_DPM Register With 10-mΩ Sense Resistor (SMBus address = 022h) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 Reserved R 0b Not used. 1 = invalid write.
14 Input Current in DPM, bit 6 R 0b 0 = Adds 0 mA of input current.
1 = Adds 3200 mA of input current.
13 Input Current in DPM, bit 5 R 0b 0 = Adds 0 mA of input current.
1 = Adds 1600 mA of input current.
12 Input Current in DPM, bit 4 R 0b 0 = Adds 0 mA of input current.
1 = Adds 800mA of input current
11 Input Current in DPM, bit 3 R 0b 0 = Adds 0 mA of input current.
1 = Adds 400 mA of input current.
10 Input Current in DPM, bit 2 R 0b 0 = Adds 0 mA of input current.
1 = Adds 200 mA of input current.
9 Input Current in DPM, bit 1 R 0b 0 = Adds 0 mA of input current.
1 = Adds 100 mA of input current.
8 Input Current in DPM, bit 0 R 0b 0 = Adds 0 mA of input current.
1 = Adds 50 mA of input current.

Table 9-34. IIN_DPM Register With 10-mΩ Sense Resistor (SMBus address = 022h) Field Descriptions
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7-0 Reserved R 00000000b Not used. Value Ignored.

62 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.6.1.3 InputVoltage Register (SMBus address = 3Dh) [reset = VBUS-1.28V]


To set the input voltage limit, write a 16-bit InputVoltage register command (REG0x3D()) using the data format
listed in Figure 9-20, Table 9-35, and Table 9-36.
If the input voltage drops more than the InputVoltage register allows, the device enters DPM and reduces the
charge current. The default offset voltage is 1.28 V below the no-load VBUS voltage. The DC offset is 3.2 V
(0000000).
Figure 9-20. InputVoltage Register (SMBus address = 3Dh) [reset = VBUS-1.28V]
15 14 13 12 11 10 9 8
Reserved Input Voltage, Input Voltage, Input Voltage, Input Voltage, Input Voltage, Input Voltage,
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2
R/W R/W R/W R/W R/W R/W R/W

7 6 5 4 3 2 1 0
Input Voltage, Input Voltage, Reserved
bit 1 bit 0
R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-35. InputVoltage Register (SMBus address = 3Dh) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15-14 Reserved R/W 00b Not used. 1 = invalid write.
13 Input Voltage, bit 7 R/W 0b 0 = Adds 0 mV of input voltage.
1 = Adds 8192 mV of input voltage.
12 Input Voltage, bit 6 R/W 0b 0 = Adds 0 mV of input voltage.
1 = Adds 4096mV of input voltage.
11 Input Voltage, bit 5 R/W 0b 0 = Adds 0 mV of input voltage.
1 = Adds 2048 mV of input voltage.
10 Input Voltage, bit 4 R/W 0b 0 = Adds 0 mV of input voltage.
1 = Adds 1024 mV of input voltage.
9 Input Voltage, bit 3 R/W 0b 0 = Adds 0 mV of input voltage.
1 = Adds 512 mV of input voltage.
8 Input Voltage, bit 2 R/W 0b 0 = Adds 0 mV of input voltage.
1 = Adds 256 mV of input voltage.

Table 9-36. InputVoltage Register (SMBus address = 3Dh) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 Input Voltage, bit 1 R/W 0b 0 = Adds 0 mV of input voltage.
1 = Adds 128 mV of input voltage.
6 Input Voltage, bit 0 R/W 0b 0 = Adds 0 mV of input voltage.
1 = Adds 64 mV of input voltage
5-0 Reserved R/W 000000b Not used. Value Ignored.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 63

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9.6.7 OTGVoltage Register (SMBus address = 3Bh) [reset = 0000h]


To set the OTG output voltage limit, write to REG0x3B() using the data format listed in Figure 9-21, Table 9-37,
and Table 9-38.
The DAC is clamped in digital core at minimal 3V and maximum 20.8V. Any register writing lower than the
minimal or higher than the maximum will be ignored. When REG0x32[2] = 1, there is no DAC offset. When
REG0x32[2] = 0 the DAC is offset by 1.28V
Figure 9-21. OTGVoltage Register (SMBus address = 3Bh) [reset = 0000h]
15 14 13 12 11 10 9 8
Reserved OTG Voltage, OTG Voltage, OTG Voltage, OTG Voltage, OTG Voltage, OTG Voltage,
bit 11 bit 10 bit 9 bit 8 bit 7 bit 6
R/W R/W R/W R/W R/W R/W R/W

7 6 5 4 3 2 1 0
OTG Voltage, OTG Voltage, OTG Voltage, OTG Voltage, OTG Voltage, OTG Voltage, Reserved
bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
R/W R/W R/W R/W R/W R/W R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-37. OTGVoltage Register (SMBus address = 3Bh) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15-14 Reserved R/W 00b Not used. 1 = invalid write.
13 OTG Voltage, bit 11 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 16656 mV of OTG voltage.
12 OTG Voltage, bit 10 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 8328 mV of OTG voltage.
11 OTG Voltage, bit 9 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 4164 mV of OTG voltage.
10 OTG Voltage, bit 8 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 2082 mV of OTG voltage.
9 OTG Voltage, bit 7 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 1041 mV of OTG voltage.
8 OTG Voltage, bit 6 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 521 mV of OTG voltage.

Table 9-38. OTGVoltage Register (SMBus address = 3Bh) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7 OTG Voltage, bit 5 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 260 mV of OTG voltage.
6 OTG Voltage, bit 4 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 130 mV of OTG voltage.
5 OTG Voltage, bit 3 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 65 mV of OTG voltage.
4 OTG Voltage, bit 2 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 33 mV of OTG voltage.
3 OTG Voltage, bit 1 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 16 mV of OTG voltage.

64 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

Table 9-38. OTGVoltage Register (SMBus address = 3Bh) Field Descriptions (continued)
SMBus
FIELD TYPE RESET DESCRIPTION
BIT
2 OTG Voltage, bit 0 R/W 0b 0 = Adds 0 mV of OTG voltage.
1 = Adds 8.1 mV of OTG voltage.
1-0 Reserved R/W 00b Not used. Value Ignored.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 65

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9.6.8 OTGCurrent Register (SMBus address = 3Ch) [reset = 0000h]


To set the OTG output current limit, write to REG0x3C() using the data format listed in Figure 9-22, Table 9-39,
and Table 9-40.
Figure 9-22. OTGCurrent Register (SMBus address = 3Ch) [reset = 0000h]
15 14 13 12 11 10 9 8
Reserved OTG Current OTG Current OTG Current OTG Current OTG Current OTG Current OTG Current
set by host, bit set by host, bit set by host, bit set by host, bit set by host, bit set by host, bit set by host, bit
6 5 4 3 2 1 0
R/W R/W R/W R/W R/W R/W R/W R/W

7 6 5 4 3 2 1 0
Reserved
R/W

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-39. OTGCurrent Register (SMBus address = 3Ch) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
15 Reserved R/W 0b Not used. 1 = invalid write.
14 OTG Current set by host, bit 6 R/W 0b 0 = Adds 0 mA of OTG current.
1 = Adds 3200 mA of OTG current.
13 OTG Current set by host, bit 5 R/W 0b 0 = Adds 0 mA of OTG current.
1 = Adds 1600mA of OTG current.
12 OTG Current set by host, bit 4 R/W 0b 0 = Adds 0 mA of OTG current.
1 = Adds 800 mA of OTG current.
11 OTG Current set by host, bit 3 R/W 0b 0 = Adds 0 mA of OTG current.
1 = Adds 400 mA of OTG current.
10 OTG Current set by host, bit 2 R/W 0b 0 = Adds 0 mA of OTG current.
1 = Adds 200 mA of OTG current.
9 OTG Current set by host, bit 1 R/W 0b 0 = Adds 0 mA of OTG current.
1 = Adds 100 mA of OTG current.
8 OTG Current set by host, bit 0 R/W 0b 0 = Adds 0 mA of OTG current.
1 = Adds 50 mA of OTG current.

Table 9-40. OTGCurrent Register (SMBus address = 3Ch) Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION
BIT
7-0 Reserved R/W 00000000b Not used. Value Ignored.

66 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.9 ADCVBUS/PSYS Register (SMBus address = 23h)


• PSYS: Full range: 3.06 V, LSB: 12 mV
• VBUS: Full range: 3200 mV to 19520 mV, LSB: 64 mV
Figure 9-23. ADCVBUS/PSYS Register (SMBus address = 23h)
15 14 13 12 11 10 9 8

R R R R R R R R

7 6 5 4 3 2 1 0

R R R R R R R R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-41. ADCVBUS/PSYS Register Field Descriptions


BIT FIELD TYPE RESET DESCRIPTION
15-8 R 8-bit Digital Output of Input Voltage
7-0 R 8-bit Digital Output of System Power

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 67

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9.6.10 ADCIBAT Register (SMBus address = 24h)


• ICHG: Full range: 8.128 A, LSB: 64 mA
• IDCHG: Full range: 32.512 A, LSB: 256 mA
Figure 9-24. ADCIBAT Register (SMBus address = 24h)
15 14 13 12 11 10 9 8

Reserved R R R R R R R

7 6 5 4 3 2 1 0

Reserved R R R R R R R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-42. ADCIBAT Register Field Descriptions


BIT FIELD TYPE RESET DESCRIPTION
15 Reserved R Not used. Value ignored.
14-8 R 7-bit Digital Output of Battery Charge Current
7 Reserved R Not used. Value ignored.
6-0 R 7-bit Digital Output of Battery Discharge Current

68 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.11 ADCIINCMPIN Register (SMBus address = 25h)


• IIN: Full range: 12.75 A, LSB: 50 mA. For 10mΩ sense resistor, IIN full range = 6.4A
• CMPIN: Full range: 3.06 V, LSB: 12 mV
Figure 9-25. ADCIINCMPIN Register (SMBus address = 25h)
15 14 13 12 11 10 9 8

R R R R R R R R

7 6 5 4 3 2 1 0

R R R R R R R R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-43. ADCIINCMPIN Register Field Descriptions


BIT FIELD TYPE RESET DESCRIPTION
15-8 R 8-bit Digital Output of Input Current
7-0 R 8-bit Digital Output of CMPIN voltage

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 69

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

9.6.12 ADCVSYSVBAT Register (SMBus address = 26h)


• VSYS: Full range: 2.88 V to 19.2 V, LSB: 64 mV
• VBAT: Full range: 2.88 V to 19.2 V, LSB: 64 mV
Figure 9-26. ADCVSYSVBAT Register (SMBus address = 26h)
15 14 13 12 11 10 9 8

R R R R R R R R

7 6 5 4 3 2 1 0

R R R R R R R R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-44. ADCVSYSVBAT Register Field Descriptions


BIT FIELD TYPE RESET DESCRIPTION
15-8 R 8-bit Digital Output of System Voltage
7-0 R 8-bit Digital Output of Battery Voltage

70 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

9.6.13 ID Registers
9.6.13.1 ManufactureID Register (SMBus address = FEh) [reset = 0040h]
Figure 9-27. ManufactureID Register (SMBus address = FEh) [reset = 0040h]
15-0
MANUFACTURE_ID
R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-45. ManufactureID Register Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION (READ ONLY)
BIT
15-0 MANUFACTURE_ID R 40h

9.6.13.2 Device ID (DeviceAddress) Register (SMBus address = FFh) [reset = 0h]


Figure 9-28. Device ID (DeviceAddress) Register (SMBus address = FFh) [reset = 0h]
15-8
Reserved
R

7-0
DEVICE_ID
R

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 9-46. Device ID (DeviceAddress) Register Field Descriptions


SMBus
FIELD TYPE RESET DESCRIPTION (READ ONLY)
BIT
15-8 Reserved R 0b Reserved
7-0 DEVICE_ID R 0b SMBus: 89h

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 71

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

10 Application and Implementation


Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.

10.1 Application Information


The BQ2571xEVM-017 evaluation module (EVM) is a complete charger module for evaluating the BQ25710.
The application curves were taken using the BQ2571xEVM-017. Refer to the EVM User's Guide for EVM
information.
10.2 Typical Application
VSYS

6x10 µ F

2.2 µH
RAC=10 PŸ RSR=10 PŸ
ADAPTER
Q2 Q4
2.2 Ÿ Q3
6x10 µ F 10 nF BATT
Q1
47 nF
4.99 Ÿ 47 nF
1µF

33 nF 33 nF HIDRV1 LODRV1 SW1 BTST1 BTST2 SW2 LODRV2 HIDRV2
Optional VBUS
snubber SYS
470 nF

ACN /BATDRV

ACP SRP
10 Ÿ
REGN VDDA SRN
REGN
VDDA
1 uF ILIM_HIZ
2.2 ± 3.3 uF
GND 350 NŸ
BQ25710

CELL_BATPRESZ

COMP1 250 NŸ

COMP2
33 pF 40.2 NŸ
10 NŸ IADPT
15pF IBAT
1800 pF 680 pF 100 pF 137 NŸ
100 pF
PSYS
50 Ÿ
1.05 V /PROCHOT SDA SCL CHRG_OK EN_OTG CMPOUT CMPIN 30 NŸ

10 NŸ
To CPU
10 NŸ

10 NŸ
3.3 V or 1.8 V
10 NŸ

Host
(SMBus)

Figure 10-1. Application Diagram

10.2.1 Design Requirements


DESIGN PARAMETER EXAMPLE VALUE
Input Voltage(2) 3.5 V < Adapter Voltage < 24 V
Input Current Limit (2) 3.2 A for 65 W adapter
Battery Charge Voltage(1) 8400 mV for 2s battery
Battery Charge Current(1) 3072 mA for 2s battery

72 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

DESIGN PARAMETER EXAMPLE VALUE


Minimum System Voltage(1) 6144 mV for 2s battery

(1) Refer to battery specification for settings.


(2) Refer to adapter specification for settings for Input Voltage and Input Current Limit.

10.2.2 Detailed Design Procedure


The parameters are configurable using the evaluation software. The simplified application circuit (see Figure
10-1, as the application diagram) shows the minimum component requirements. Inductor, capacitor, and
MOSFET selection are explained in the rest of this section. Refer to the EVM User's Guide for the complete
application schematic.
10.2.2.1 ACP-ACN Input Filter
The BQ25710 has average current mode control. The input current sensing through ACP/ACN is critical to
recover inductor current ripple. Parasitic inductance on board will generate high frequency ringing on ACP-ACN
which overwhelms converter sensed inductor current information, so it is difficult to manage parasitic inductance
created based on different PCB layout. Bigger parasitic inductance will generate bigger sense current ringing
which will cause the average current control loop to go into oscillation.
For real system board condition, we suggest to use below circuit design to get best result and filter noise induced
from different PCB parasitic factor. With time constant of filter from 47 nsec to 200 nsec, the filtering on ringing
is effective and in the meantime, the delay of on the sensed signal is small and therefore poses no concern for
average current mode control.
RAC
Q1

6x10uF
(0805) RACP RACN
4.99ohm 4.99ohm
10nF(0402) 1nF(0402)
CDIFF
CACP Open CACN
33nF 33nF

ACP ACN
HIDRV1

Figure 10-2. ACN-ACP Input Filter

10.2.2.2 Inductor Selection


The BQ25710 has two selectable fixed switching frequency. Higher switching frequency allows the use of
smaller inductor and capacitor values. Inductor saturation current should be higher than the charging current
(ICHG) plus half the ripple current (IRIPPLE):

ISAT ³ ICHG + (1/2) IRIPPLE (3)

The inductor ripple current in buck operation depends on input voltage (VIN), duty cycle (DBUCK = VOUT/VIN),
switching frequency (fS) and inductance (L):

VIN ´ D ´ (1 - D)
IRIPPLE_BUCK =
fS ´ L (4)

During boost operation, the duty cycle is:


DBOOST = 1 – (VIN/VBAT)

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 73

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

The maximum inductor ripple current happens with D = 0.5 or close to 0.5. For example, the battery charging
voltage range is from 9 V to 12.6 V for 3-cell battery pack. For 20-V adapter voltage, 10-V battery voltage gives
the maximum inductor ripple current. Another example is 4-cell battery, the battery voltage range is from 12 V to
16.8 V, and 12-V battery voltage gives the maximum inductor ripple current.
Usually inductor ripple is designed in the range of (20 – 40%) maximum charging current as a trade-off between
inductor size and efficiency for a practical design.
10.2.2.3 Input Capacitor
Input capacitor should have enough ripple current rating to absorb input switching ripple current. The worst case
RMS ripple current is half of the charging current (plus system current there is any system load) when duty cycle
is 0.5 in buck mode. If the converter does not operate at 50% duty cycle, then the worst case capacitor RMS
current occurs where the duty cycle is closest to 50% and can be estimated by Equation 5:

ICIN = ICHG ´ D × (1 - D) (5)

Low ESR ceramic capacitor such as X7R or X5R is preferred for input decoupling capacitor and should be
placed in front of RAC current sensing and as close as possible to the power stage half bridge MOSFETs.
Capacitance after RAC before power stage half bridge should be limited to 10 nF + 1 nF referring to Figure 10-2.
Because too large capacitance after RAC could filter out RAC current sensing ripple information. Voltage rating of
the capacitor must be higher than normal input voltage level, 25-V rating or higher capacitor is preferred for 19-V
to 20-V input voltage. The minimum input effective capacitance recommendation is shown in Table 10-1.
Ceramic capacitors (MLCC) show a dc-bias effect. This effect reduces the effective capacitance when a dc-bias
voltage is applied across a ceramic capacitor, as on the input capacitor of a charger. The effect may lead
to a significant capacitance drop, especially for high input voltages and small capacitor packages. See the
manufacturer's datasheet about the derating performance with a dc bias voltage applied. It may be necessary to
choose a higher voltage rating or nominal capacitance value in order to get the required effective capacitance
value at the operating point. Considering the 25 V 0603 package MLCC capacitance derating under 19-V to 20-V
input voltage, the recommended practical capacitors configuration can also be found in Table 10-1. Tantalum
capacitors (POSCAP) can avoid dc-bias effect and temperature variation effect which is recommended for 90 W
to 130 W higher power application.
Table 10-1. Minimum Input Capacitance Requirement
INPUT CAPACITORS VS TOTAL INPUT
65W 90W 130W
POWER
Minimum effective input capacitance 4 μF 6 μF 13 μF
Minimum practical input capacitors 4*10 μF (0603 25 V MLCC) 6*10 μF (0603 25 V MLCC) 3*10 μF (0603 25 V MLCC)
configuration 1* 10 μF (25 V to 35 V
POSCAP)

10.2.2.4 Output Capacitor


Output capacitor also should have enough ripple current rating to absorb output switching ripple current. To
get good loop stability, the resonant frequency of the output inductor and output capacitor should be designed
between 10 kHz and 20 kHz. The preferred ceramic capacitor is 25-V X7R or X5R for output capacitor. Minimum
7 pcs of 10-μF 0603 package capacitor is suggested to be placed as close as possible to Q3&Q4 half bridge
(between Q4 drain and Q3 source terminal). Total minimum output effective capacitance along VSYS distribution
line is 50 μF refers to Table 10-2. Recommend to place minimum 20-μF MLCC capacitors after the charge
current sense resistor for best stability.
Ceramic capacitors show a dc-bias effect. This effect reduces the effective capacitance when a dc-bias
voltage is applied across a ceramic capacitor, as on the output capacitor of a charger. The effect may lead
to a significant capacitance drop, especially for high output voltages and small capacitor packages. See the
manufacturer's data sheet about the derating performance with a dc bias voltage applied. It may be necessary
to choose a higher voltage rating or nominal capacitance value in order to get the required capacitance value at
the operating point. Considering the 25-V 0603 package MLCC capacitance derating under 21-V to 23-V output

74 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

voltage, the recommended practical capacitors configuration at VSYS output terminal can also be found in
Table 10-2. Tantalum capacitors (POSCAP) can avoid dc-bias effect and temperature variation effect which are
recommended to be used along VSYS output distribution line to meet total minimum effective output capacitance
requirement.
Table 10-2. Minimum Output Capacitance Requirement
OUTPUT CAPACITORS VS TOTAL INPUT
65W 90W 130W
POWER
Minimum Effective Output Capacitance 50 μF 50 μF 50 μF
Minimum output capacitors at charger VSYS 7*10 μF (0603 25 V MLCC) 9*10 μF (0603 25 V MLCC) 9*10 μF (0603 25 V MLCC)
output terminal
Additional output capacitors along VSYS 2*22 μF (25 V~35 V 2*22 μF (25 V~35 V 2*22 μF (25 V~35 V
distribution line POSCAP) POSCAP) POSCAP)

10.2.2.5 Power MOSFETs Selection


Four external N-channel MOSFETs are used for a synchronous switching battery charger. The gate drivers are
internally integrated into the IC with 6 V of gate drive voltage. 30 V or higher voltage rating MOSFETs are
preferred for 19 V - 20 V input voltage.
Figure-of-merit (FOM) is usually used for selecting proper MOSFET based on a tradeoff between the conduction
loss and switching loss. For the top side MOSFET, FOM is defined as the product of a MOSFET's on-resistance,
RDS(ON), and the gate-to-drain charge, QGD. For the bottom side MOSFET, FOM is defined as the product of the
MOSFET's on-resistance, RDS(ON), and the total gate charge, QG.

FOMtop = RDS(on) x QGD; FOMbottom = RDS(on) x QG (6)

The lower the FOM value, the lower the total power loss. Usually lower RDS(ON) has higher cost with the same
package size.
The top-side MOSFET loss includes conduction loss and switching loss. It is a function of duty cycle (D=VOUT/
VIN), charging current (ICHG), MOSFET's on-resistance (RDS(ON)), input voltage (VIN), switching frequency (fS),
turn on time (ton) and turn off time (toff):

1
Ptop = D ´ ICHG2 ´ RDS(on) + ´ VIN ´ ICHG ´ (t on + t off ) ´ f s
2 (7)

The first item represents the conduction loss. Usually MOSFET RDS(ON) increases by 50% with 100°C junction
temperature rise. The second term represents the switching loss. The MOSFET turn-on and turn-off times are
given by:

QSW Q
t on = , t off = SW
Ion Ioff (8)

where Qsw is the switching charge, Ion is the turn-on gate driving current and Ioff is the turn-off gate driving
current. If the switching charge is not given in MOSFET datasheet, it can be estimated by gate-to-drain charge
(QGD) and gate-to-source charge (QGS):

1
QSW = QGD + ´ QGS
2 (9)

Gate driving current can be estimated by REGN voltage (VREGN), MOSFET plateau voltage (Vplt), total turn-on
gate resistance (Ron) and turn-off gate resistance (Roff) of the gate driver:

VREGN - Vplt Vplt


Ion = , Ioff =
Ron Roff (10)

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 75

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

The conduction loss of the bottom-side MOSFET is calculated with the following equation when it operates in
synchronous continuous conduction mode:

Pbottom = (1 - D) x ICHG 2 x RDS(on) (11)

When charger operates in non-synchronous mode, the bottom-side MOSFET is off. As a result all the
freewheeling current goes through the body-diode of the bottom-side MOSFET. The body diode power loss
depends on its forward voltage drop (VF), non-synchronous mode charging current (INONSYNC), and duty cycle
(D).

PD = VF x INONSYNC x (1 - D) (12)

The maximum charging current in non-synchronous mode can be up to 0.25 A for a 10-mΩ charging current
sensing resistor or 0.5 A if battery voltage is below 2.5 V. The minimum duty cycle happens at lowest battery
voltage. Choose the bottom-side MOSFET with either an internal Schottky or body diode capable of carrying the
maximum non-synchronous mode charging current.
10.2.3 Application Curves

CH1: VBUS CH1: VBUS

CH2: VDDA CH2: VDDA

CH3: CHRG_OK CH3: CHRG_OK

CH4: VSYS CH4: VSYS

2-cell without battery 2-cell without battery

Figure 10-3. Power Up from 20 V Figure 10-4. Power Up from 5 V

CH1: VBUS

CH1: VBUS

CH2: SW1
CH2: SW1
CH3: SW2

CH3: SW2

CH4: VSYS with 9Vos


CH4: IL

3-cell VBAT = 10 V VBUS 5 V to 20 V

Figure 10-5. Power Off from 12 V Figure 10-6. System Regulation

76 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

CH2: SW1
CH1: HIDRV1

CH2: SW1

CH3: LODRV1
CH3: SW2

CH1: IL
CH4: IL

VBUS = 20 V, VSYS = 10 V, ISYS = 200 mA Figure 10-8. PWM Operation


Figure 10-7. PFM Operation

CH2: SW2

CH2: SW1

CH1: HIDRV2 CH3: SW2

CH3: LODRV2

CH4: IL CH4: IL

VBUS = 5 V, VBAT = 10 V VBUS = 12 V, VBAT = 12 V

Figure 10-9. Switching During Boost Mode Figure 10-10. Switching During Buck Boost Mode

CH1: VSYS CH1: VSYS

CH2: IIN

CH2: IIN

CH3: ISYS CH3: ISYS

VBUS = 12 V/3.3 A, 3-cell, VSYS = 9 V, Without battery VBUS = 9 V/3.3 A, 3-cell, VSYS = 9 V, Without battery

Figure 10-11. System Regulation in Buck Mode Figure 10-12. System Regulation in Buck Boost
Mode

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 77

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

CH1: VSYS CH2: IIN

CH2: IIN

CH3: ISYS

CH3: ISYS CH4: IBAT

VBUS = 5 V/3.3 A, 3-cell, VSYS = 9 V, Without battery VBUS = 20 V/3.3 V, VBAT = 7.5 V

Figure 10-13. System Regulation in Boost Mode Figure 10-14. Input Current Regulation in Buck
Mode

CH2:IIN
CH1: EN_OTG

CH3:ISYS CH2: VBUS

CH4:IBAT

VBUS = 5 V/3.3 V, VBAT = 7.5 V VBUS = 5 V

Figure 10-15. Input Current in Boost Mode Figure 10-16. OTG Power Up from 8 V Battery

CH1: SCL CH1: SCL

CH2: VBUS

CH2: VBUS

CH3: SW2

CH3: SW2

VBAT = 10 V, VBUS 5 V to 20 V, IOTG = 500 mA Figure 10-18. OTG Power Off


Figure 10-17. OTG Voltage Ramp Up

78 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

CH2: VBUS

CH3: IVBUS

VBAT = 10 V, VBUS = 20 V

Figure 10-19. OTG Load Transient

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 79

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

11 Power Supply Recommendations


The valid adapter range is from 3.5 V (VVBUS_CONVEN) to 24 V (ACOV) with at least 500-mA current rating. When
CHRG_OK goes HIGH, the system is powered from adapter through the charger. When adapter is removed, the
system is connected to battery through BATFET. Typically the battery depletion threshold should be greater than
the minimum system voltage so that the battery capacity can be fully utilized for maximum battery life.

80 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

12 Layout
12.1 Layout Guidelines
Proper layout of the components to minimize high frequency current path loop (see Section 12.2) is important
to prevent electrical and magnetic field radiation and high frequency resonant problems. Here is a PCB layout
priority list for proper layout.
Table 12-1. PCB Layout Guidelines
RULES COMPONENTS FUNCTION IMPACT GUIDELINES
1 PCB layer stack up Thermal, efficiency, Multi- layer PCB is suggested. Allocate at least one ground layer.
signal integrity The BQ257XXEVM uses a 4-layer PCB (top layer, ground layer,
signal layer and bottom layer).
2 CBUS, RAC, Q1, Input loop High frequency VBUS capacitors, RAC, Q1 and Q2 form a small loop 1. It is best
Q2 noise, ripple to put them on the same side. Connect them with large copper to
reduce the parasitic resistance. Move part of CBUS to the other
side of PCB for high density design. After RAC before Q1 and
Q2 power stage recommend to put 10 nF + 1 nF (0402 package)
decoupling capacitors as close as possible to IC to decoupling
switching loop high frequency noise.
3 RAC, Q1, L1, Q4 Current path Efficiency The current path from VBUS to VSYS, through RAC, Q1, L1, Q4,
has low impedance. Pay attention to via resistance if they are not
on the same side. The number of vias can be estimated as 1 to
2A/via for a 10-mil via with 1 oz. copper thickness.
4 CSYS, Q3, Q4 Output loop High frequency VSYS capacitors, Q3 and Q4 form a small loop 2. It is best to
noise, ripple put them on the same side. Connect them with large copper to
reduce the parasitic resistance. Move part of CSYS to the other
side of PCB for high density design.
5 QBAT, RSR Current path Efficiency, battery Place QBAT and RSR near the battery terminal. The current path
voltage detection from VBAT to VSYS, through RSRand QBAT, has low impedance.
Pay attention to via resistance if they are not on the same side.
The device detects the battery voltage through SRN near battery
terminal.
6 Q1, Q2, L1, Q3, Power stage Thermal, efficiency Place Q1, Q2, L1, Q3 and Q4 next to each other. Allow
Q4 enough copper area for thermal dissipation. The copper area
is suggested to be 2x to 4x of the pad size. Multiple thermal
vias can be used to connect more copper layers together and
dissipate more heat.
7 RAC, RSR Current sense Regulation accuracy Use Kelvin-sensing technique for RAC and RSR current sense
resistors. Connect the current sense traces to the center of the
pads, and run current sense traces as differential pairs.
8 Small capacitors IC bypass caps Noise, jittering, Place VBUS cap, VCC cap, REGN caps near IC.
ripple
9 BST capacitors HS gate drive High frequency Place HS MOSFET boost strap circuit capacitor close to IC and
noise, ripple on the same side of PCB board. Capacitors SW1/2 nodes are
recommended to use wide copper polygon to connect to power
stage and capacitors BST1/2 node are recommended to use at
least 8mil trace to connected to IC BST1/2 pins.
10 Ground partition Measurement Separate analog ground(AGND) and power grounds(PGND) is
accuracy, regulation preferred. PGND should be used for all power stage related
accuracy, jitters, ground net. AGND should be used for all sensing, compensation
ripple and control network ground for example ACP/ACN/COMP1/
COMP2/CMPIN/CMPOUT/IADPT/IBAT/PSYS. Connect all
analog grounds to a dedicated low-impedance copper plane,
which is tied to the power ground underneath the IC exposed
pad. If possible, use dedicated COMP1, COMP2 AGND traces.
Connect analog ground and power ground together using power
pad as the single ground connection point.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 81

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

12.2 Layout Example


12.2.1 Layout Example Reference Top View
Based on the above layout guidelines, the buck-boost charger layout example top view is shown below including
all the key power components.

Figure 12-1. Buck-Boost Charger Layout Reference Example Top View

12.2.2 Inner Layer Layout and Routing Example


For both input sensing resistor and charging current sensing resistor, differential sensing and routing method are
suggested and highlighted in below figure. Use wide trace for gate drive traces, minimum 15 mil trace width.
Connect all analog grounds to a dedicated low-impedance copper plane, which is tied to the power ground
underneath the IC exposed pad. Suggest using dedicated COMP1, COMP2 analog ground traces shown in
below figure.

Figure 12-2. Buck-Boost Charger Gate Drive/Current Sensing/AGND Signal Layer Routing Example

82 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


BQ25710
www.ti.com SLUSD20B – JULY 2018 – REVISED APRIL 2023

13 Device and Documentation Support


13.1 Device Support
13.1.1 Third-Party Products Disclaimer
TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT
CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES
OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER
ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE.
13.2 Documentation Support
13.2.1 Related Documentation
For related documentation see the following:
• Semiconductor and IC Package Thermal Metrics Application Report
• BQ2571x Evaluation Module User's Guide
• QFN/SON PCB Attachment Application Report
13.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
13.4 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
13.5 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
13.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.

13.7 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.

Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 83

Product Folder Links: BQ25710


BQ25710
SLUSD20B – JULY 2018 – REVISED APRIL 2023 www.ti.com

14 Mechanical, Packaging, and Orderable Information


The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

84 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated

Product Folder Links: BQ25710


PACKAGE OPTION ADDENDUM

www.ti.com 13-Sep-2022

PACKAGING INFORMATION

Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)

BQ25710RSNR ACTIVE QFN RSN 32 3000 RoHS & Green NIPDAU | NIPDAUAG Level-2-260C-1 YEAR -40 to 85 BQ25710 Samples

BQ25710RSNT ACTIVE QFN RSN 32 250 RoHS & Green NIPDAU | NIPDAUAG Level-2-260C-1 YEAR -40 to 85 BQ25710 Samples

(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.

(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.

(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.

(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.

(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.

(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.

Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.

In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.

Addendum-Page 1
PACKAGE OPTION ADDENDUM

www.ti.com 13-Sep-2022

Addendum-Page 2
PACKAGE MATERIALS INFORMATION

www.ti.com 16-Jul-2023

TAPE AND REEL INFORMATION

REEL DIMENSIONS TAPE DIMENSIONS


K0 P1

B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers

Reel Width (W1)


QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE

Sprocket Holes

Q1 Q2 Q1 Q2

Q3 Q4 Q3 Q4 User Direction of Feed

Pocket Quadrants

*All dimensions are nominal


Device Package Package Pins SPQ Reel Reel A0 B0 K0 P1 W Pin1
Type Drawing Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
BQ25710RSNR QFN RSN 32 3000 330.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2
BQ25710RSNT QFN RSN 32 250 180.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2

Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION

www.ti.com 16-Jul-2023

TAPE AND REEL BOX DIMENSIONS

Width (mm)
H
W

*All dimensions are nominal


Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
BQ25710RSNR QFN RSN 32 3000 367.0 367.0 35.0
BQ25710RSNT QFN RSN 32 250 210.0 185.0 35.0

Pack Materials-Page 2
IMPORTANT NOTICE AND DISCLAIMER
TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATA SHEETS), DESIGN RESOURCES (INCLUDING REFERENCE
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD
PARTY INTELLECTUAL PROPERTY RIGHTS.
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable
standards, and any other safety, security, regulatory or other requirements.
These resources are subject to change without notice. TI grants you permission to use these resources only for development of an
application that uses the TI products described in the resource. Other reproduction and display of these resources is prohibited. No license
is granted to any other TI intellectual property right or to any third party intellectual property right. TI disclaims responsibility for, and you
will fully indemnify TI and its representatives against, any claims, damages, costs, losses, and liabilities arising out of your use of these
resources.
TI’s products are provided subject to TI’s Terms of Sale or other applicable terms available either on ti.com or provided in conjunction with
such TI products. TI’s provision of these resources does not expand or otherwise alter TI’s applicable warranties or warranty disclaimers for
TI products.
TI objects to and rejects any additional or different terms you may have proposed. IMPORTANT NOTICE

Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2023, Texas Instruments Incorporated

You might also like