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Lab-12 AFM Slides

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7 views

Lab-12 AFM Slides

Uploaded by

saiftheali7
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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MM141 Lab

Atomic Force Microscopy

Introduction to Materials and


Nanotechnology Lab
Other Microscopy Techniques
● Optical Microscopy
● Scanning Electron Microscope
● Transmission Electron Microscope
Results of Atomic Force Microscopy
Graphite Bacteria Nano-contact Printing
Results of Atomic Force Microscopy
IBM writing Pentacene DNA
AFM
Atomic force microscopy (AFM) is one kind of
observation method that takes advantage
of the atomic force between the probe and
the sample surface.

● Characterization Tool
Components of AFM
Side view of Cantilever
Tip of AFM
Understanding the working of AFM
● AFM is a type of Scanning Probe Microscopy that uses a very sharp
probe to scan the surface of an object to be imaged.
● As the probe raster scans the surface, any deflection from its
natural position due to the presence of surface features is
detected.
● This deflection data is plotted in a computer to produce an image
of the surface, allowing for high-resolution imaging of the object
at the nanoscale.
Types of forces involved in AFM
1. Near Field Forces
2.Van der Waals Forces
3. Repulsive Forces
Interaction between Tip and Surface
Force

Distance
AFM can operate in various modes including

Contact Mode
Probe is continuously in physical contact with the
sample surface during scanning
Operation
Non-Contact Mode
Modes
Probe oscillates near the sample surface without
making physical contact

Tapping Mode
The probe oscillates at the resonance frequency,
intermittently tapping the sample surface to minimize
damage and enable high-resolution imaging of
delicate samples.
Contact Mode
● AFM tip is brought close to the sample surface.
● Repulsive near-field forces act on the tip.
● High-resolution 3D images of the object are produced.

Pros

• High-Resolution Images
• Straightforward Circuit is involved.

Cons

• Tip gets damaged over time or blunt


• Soft and Delicate samples like Polymers, and biological tissue
may get damaged
Non-Contact
● AFM tip does not touch the sample surface.
● Cantilever oscillates at its resonant frequency.
● Van der Waals forces decrease the resonant frequency and amplitude of the tip.
● Tip is moved away to maintain amplitude and frequency.

Pros
• Doesn’t damage the sample
• Used for biological samples and organic Thin films

Cons
• The non-contact mode can be a time-consuming process
Tapping Mode
● Tip just taps over the sample surface
● Tip is vibrated at the resonant frequency.
● Frequency and Amplitude is maintained constant
● When the tip nears the raised feature, the amplitude of the vibration

Pros
● It does not suffer from poor force detection on the sample due to the presence of
moisture on the sample surface.
● Good Surface Resolution
● Minimal Surface Damage
● Gives you the idea about adhesion, viscosity, and friction
AFM
Advantages Disadvantages

● 3-D Image ● Tips get blunt and need to


be replaced
● Non-conductive samples can be
imaged ● Small Scan area compared
to SEM
● Imaging can be done in liquids
● A large number of Artifacts
● Higher Resolution than SEM
● Very Slow Process
● No need for a vacuum
● Very Prone to vibrations in
● Living molecules can be studied the environment.

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