Electronic Device Lab Report 1
Electronic Device Lab Report 1
The purpose of this lab is to study the behavior of a silicon diode under forward bias. To
achieve this, we will conduct an experiment by setting up a circuit that includes a diode, a
resistor, and a DC power supply. We will gradually increase the voltage and record the
voltage across the diode (VD) and the resistor (VR). Afterward, we will calculate and
document the current (ID). We will then repeat the same experiment using Multisim
simulation software. Finally, we will plot the results of both experiments (ID vs. VD) on a
characteristic curve to analyze the diode’s performance.
Theory:
Diode Structure:
The structure of a semiconductor diode is created by the joining of n-type and p-type
materials, forming what is known as a pn junction.
Forward/Reverse-Bias Characteristics:
When a negative voltage is applied to the pn junction, the diode is reverse-biased. In this
condition, free holes and electrons are pulled toward the ends of the crystal, away from the
junction. As a result, all available carriers are attracted away from the junction, causing an
extension of the depletion region, and no current flow occurs under these conditions. When a
positive voltage is applied, the diode is placed in forward bias, which results in a shrinking of
the depletion region. In this case, electrons in the p-type region are attracted to the positive
applied voltage, while holes in the n-type region are attracted to the negative applied voltage.
Diode Characteristics:
For diode characteristics, in the forward-bias condition, a cut-in voltage must be overcome
for conduction to begin. In silicon diodes, this voltage is about 0.6-0.7 V. Under reverse-bias
conditions, the current is limited to the reverse saturation current (IS). With higher values of
reverse voltage, junction breakdown occurs. Figure 3 shows the diode I-V characteristics.
Precautions:
The following special safety precautions should be taken into consideration when working
with diodes:
1. A diode should never be removed or inserted into a circuit while voltage is applied.
2. When testing a diode, it should be ensured that the test voltage does not exceed the diode’s:
- Maximum allowable voltage.
- When replacing a diode in a circuit, the correct direction should be ensured.
Procedure:
The following experimental procedures should be followed:
1. The actual value of the 1 kΩ resistor should be measured.
2. The circuit should be connected as shown in Figure 4.
0.1 0.19 0 0
Simulations:
Figure for 0V
Figure for 0.1V
Figure for 2V
Figure for 3V
Figure for 5V
Figure for 6V
Figure for 7V
Figure for 8V
Figure for 9V
0 0 0 0
0.1 0.100 0 0
0.2 0.200 0 0
0.3 0.299 0 0
0.4 0.399 0 0
VD Vs ID Graph
12
10
6
ID
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8
VD
Discussion & Conclusion:
In this experiment we observed diodes forward bias condition in different voltage . The
diode starts conducting once it reaches the cut in voltage of 0.7V for silicon and the current
increases with applied voltage which we can see from the characteristics curve VD VS Id.
References:
[1] Robert L. Boylestad, Louis Nashelsky, Electronic Devices and Circuit Theory, 9th
Edition, 2007-2008.
[2] Adel S. Sedra, Kenneth C. Smith, Microelectronic Circuits, Saunders College Publishing,
3rd ed., ISBN: 0-03 051648-X, 1991.
[3] American International University–Bangladesh (AIUB) Electronic Devices Lab Manual.
[4] David J. Comer, Donald T. Comer, Fundamentals of Electronic Circuit Design, John
Wiley & Sons Canada, Ltd., ISBN: 0471410160, 2002. [5] Resistor values:
https://www.eleccircuit.com/how-to-basic-use-resistor/, accessed on 20 September 2023.