SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

& ANSI/NCSL Z540-1-1994

SIMCO ELECTRONICS
6295 Ferris Square, STE A
San Diego, CA 92121
Eduardo Miguel Phone: 858 200 7027

CALIBRATION

Valid To: September 30, 2026 Certificate Number: 1395.06

In recognition of the successful completion of the A2LA evaluation process (including an assessment of
the organization’s compliance with A2LA’s Calibration Program Requirements), accreditation is granted
to this laboratory to perform the following calibrations1, 9:
I. Dimensional

Parameter/Equipment Range CMC2, 6 () Comments

Calipers3 Up to 5 in (280 + 6L) µin Gage blocks

(5 to 48) in (540 + 6L) µin

Micrometers3 –

Flatness Up to 1 in 12 µin Optical parallels &

monochromatic
Parallelism <0.001 in 11 µin light
Linearity Up to 48 in (11 + 2.7L) µin Gage blocks

Height Gages3 Up to 36 in (32 + 1.3L) µin Gage blocks,

surface plates

Depth Gages3 –
Linearity Up to 5 in (78 + 10L) µin + 0.6R Gage blocks,
(5 to 36) in (80 + 6L) µin + 0.6R surface plates
Flatness Up to 1 in 11 µin Optical parallels &
monochromatic
light

(A2LA Cert. No. 1395.06) 10/08/2024 Page 1 of 15

 Parameter/Equipment Range CMC2, 6 () Comments

Pin, Plug Gages Up to 1 in (25 + 4.5L) µin Supermicrometer™, gage

blocks

Digital & Dial Up to 2 in (7.2 + 10L) µin + 0.6R Gage blocks & surface
Indicators3 plates
Up to 1 in (33 + 4.5L) µin Supermicrometer™

End Standards Up to 5 in (32 + 4.5L) µin Gage blocks,

(5 to 12) in (38 + 4.5L) µin Supermicrometer™

Surface Plates3 –

Flatness Up to 180 in DL (42 + 0.41DL) µin Leveling system

Repeatability Up to 0.002 in 49 µin Repeat-o-meter

Thread Plug Gages –

Pitch Diameter (4 to 80) TPI (65 + 7.4L) µin Supermicrometer™,

(0.3 to 6) mm (1.7 + 0.0074L) µm gage blocks & thread
wires
Major Diameter Up to 1 in (46 + 7.4L) µin
Up to 25.4 mm (1.2 + 0.0074L) µm
(1 to 4) in (54 + 7.4L) µin
(25.4 to 104) mm (1.4 + 0.0074L) µm

Protractors & Up to 180° 0.000 35° + 0.58R Surface plate, gage

Inclinometers³ blocks & sine bar

(A2LA Cert. No. 1395.06) 10/08/2024 Page 2 of 15

II. Electrical – DC/Low Frequency

Parameter/Equipment Range CMC2, 4, 5, 7, 8 () Comments

DC Voltage – Generate3 (0 to 220) mV 8 µV/V + 0.7 µV Fluke 5700A/EP,

(0.22 to 2.2) V 7 µV/V + 1.6 µV 5725A
(2.2 to 11) V 7 µV/V + 12 µV
(11 to 22) V 7 µV/V + 13 µV
(22 to 220) V 8 µV/V + 140 µV
(220 to 1100) V 9 µV/V + 1400 µV

DC Voltage – ± (0 to 100) mV 5.8 V/V + 0.000 055 mV Agilent 3458A OPT-2

Measure3 ± (0.1 to 1) V 4 V/V + 0.000 14 mV
± (1 to 10) V 4 V/V + 0.000 78 mV
± (10 to 100) V 6 V/V + 0.018 mV
± (100 to 1000) V* 6 µV/V + 0.58 mV* *add 12(Vin /1000)2
Parts in 106 to all Vin
>100

(1000 to 10 000) V 0.13 % Ross VD60-6.2-A-

(10 000 to 60 000) V 0.16 % KB-AL & HP 34401A

DC Current – Generate3 (20 to 220) µA 50 µA/A + 8.2 nA Fluke 5700A/EP,

(0.22 to 2.2) mA 50 µA/A + 43 nA 5725A
(2.2 to 22) mA 50 µA/A + 420 nA
(22 to 220) mA 60 µA/A + 4.4 µA
(0.22 to 2.2) A 80 µA/A + 74 µA
(2.2 to 11) A 0.036 % + 530 µA

(11 to 20.5) A 0.078 % + 590 µA Fluke

5520A/SC1100

(10 to 100) A 0.06 % L&N 4361 & Agilent

3458A

Clamp Meters to (20.5 to 1000) A 0.51 % + 0.75 A Fluke 5500A/coil &

1000 A 5520A/SC1100

(A2LA Cert. No. 1395.06) 10/08/2024 Page 3 of 15

 Parameter/Equipment Range CMC2, 5, 7, 8 () Comments

DC Current – Measure3 (0 to 100) nA 30 µA/A + 70 pA Agilent 3458A OPT-2

(0.1 to 1) µA 20 µA/A + 70 pA
(1 to 10) µA 20 µA/A + 120 pA
(10 to 100) µA 20 µA/A + 0.8 µA
(0.1 to 1) mA 20 µA/A + 5 nA
(1 to 10) mA 20 µA/A + 50 nA
(10 to 100) mA 35 µA/A + 0.5 µA
(0.1 to 1) A 110 µA/A + 10 µA

(1 to 10) A 0.05 % Valhalla 2575A &

(10 to 100) A 0.07 % Agilent 3458A OPT-2

Resistance – Measure3 (0 to 10) Ω 15 µΩ/Ω + 52 µΩ Agilent 3458A OPT-2

(10 to 100) Ω 12 µΩ/Ω + 0.51 mΩ
(0.1 to 1) kΩ 10 µΩ/Ω + 0.56 mΩ
(1 to 10) kΩ 10 µΩ/Ω + 5.8 mΩ
(10 to 100) kΩ 10 µΩ/Ω + 62 mΩ
(0.1 to 1) MΩ 15 µΩ/Ω + 2.2 Ω
(1 to 10) MΩ 50 µΩ/Ω + 100 Ω
(10 to 100) MΩ 0.05 % + 1.4 kΩ
(0.1 to 1.0) GΩ 0.50 % + 11 kΩ

Resistance – Generate3, 0Ω 51 µΩ Fluke 5700A/EP

Fixed Points 1Ω 95 µΩ/Ω + 12 µΩ
1.9 Ω 95 µΩ/Ω + 20 µΩ
10 Ω 28 µΩ/Ω + 43 µΩ
19 Ω 27 µΩ/Ω + 80 µΩ
100 Ω 17 µΩ/Ω + 290 µΩ
190 Ω 17 µΩ/Ω + 560 µΩ
1 kΩ 13 µΩ/Ω + 2300 µΩ
1.9 kΩ 13 µΩ/Ω + 4500 µΩ
10 kΩ 12 µΩ/Ω + 36 000 µΩ
19 kΩ 12 µΩ/Ω + 43 mΩ
100 kΩ 14 µΩ/Ω + 640 mΩ
190 kΩ 14 µΩ/Ω + 1200 mΩ
1 MΩ 20 µΩ/Ω + 6200 mΩ
1.9 MΩ 21 µΩ/Ω + 12 000 mΩ
10 MΩ 40 µΩ/Ω + 190 000 mΩ
19 MΩ 47 µΩ/Ω + 360 Ω
100 MΩ 0.011 % + 2200 Ω

(A2LA Cert. No. 1395.06) 10/08/2024 Page 4 of 15

 Parameter/Equipment Range CMC2, 4, 8 () Comments

Resistance – Generate3 (0 to 11) Ω 31 µΩ/Ω + 1.1 mΩ Fluke 5520A/SC1100

(11 to 33) Ω 23 µΩ/Ω + 1.9 mΩ
(33 to 110) Ω 22 µΩ/Ω + 2.2 mΩ
(110 to 330) Ω 22 µΩ/Ω + 4.1 mΩ
(0.33 to 1.1) kΩ 22 µΩ/Ω + 18 mΩ
(1.1 to 3.3) kΩ 22 µΩ/Ω + 44 mΩ
(3.3 to 11) kΩ 22 µΩ/Ω + 140 mΩ
(11 to 33) kΩ 22 µΩ/Ω + 430 mΩ
(33 to 110) kΩ 22 µΩ/Ω + 1300 mΩ
(110 to 330) kΩ 25 µΩ/Ω + 7.7 Ω
(0.33 to 1.1) MΩ 25 µΩ/Ω + 22 Ω
(1.1 to 3.3) MΩ 47 µΩ/Ω + 140 Ω
(3.3 to 11) MΩ 0.01 % + 770 Ω
(11 to 33) MΩ 0.019 % + 3.7 kΩ
(33 to 110) MΩ 0.039 % + 35 kΩ
(110 to 330) MΩ 0.23 % + 80 kΩ
(0.33 to 1.1) GΩ 1.2 % + 2600 kΩ

Electrical Simulation of
Thermocouples
Indicating Devices –
Generate & Measure3

Type E (-250 to -100) C 0.39 C Fluke 5520A/SC1100

(-100 to -25) C 0.14 C
(-25 to 350) C 0.12 C
(350 to 650) C 0.14 C
(650 to 1000) C 0.17 C

Type J (-210 to -100) C 0.22 C

(-100 to -30) C 0.14 C
(-30 to 150) C 0.12 C
(150 to 760) C 0.14 C
(760 to 1200) C 0.19 C

Type K (-200 to -100) C 0.27 C

(-100 to -25) C 0.16 C
(-25 to 120) C 0.14 C
(120 to 1000) C 0.21 C
(1000 to 1372) C 0.32 C

Type T (-250 to -150) C 0.50 C

(-150 to 0) C 0.20 C
(0 to 120) C 0.14 C
(120 to 400) C 0.12 C

(A2LA Cert. No. 1395.06) 10/08/2024 Page 5 of 15

 Parameter/Equipment Range CMC2, 4 () Comments

Electrical Simulation of (-200 to -80) C 0.13 °C Fluke 5520A/SC1100

RTD3 – Pt 385, 100 Ω (-80 to 0) C 0.10 °C
(0 to 100) C 0.13 °C
(100 to 300) C 0.11 °C
(300 to 400) C 0.15 °C
(400 to 630) C 0.15 °C
(630 to 800) C 0.25 °C

Oscilloscopes3 –

Leveled Sine Wave:

5 mV to 5.5 V(p-p) 50 kHz reference 1.8 % + 250 V Fluke 5520A/SC1100,
See RF power/flatness
Leveled Sine Flatness: – generate for
5 mV to 5.5 V(p-p) (0.05 to 100) MHz 1.8 % + 110 V oscilloscopes above
Relative to 50 kHz (100 to 300) MHz 2 % + 110 V 1 GHz
Reference (300 to 600) MHz 3.4 % + 110 V
(600 to 1100) MHz 4.1 % + 110 V

DC Signal:
50 , (0.01 to 10) kHz (1 to 24.999) mV 0.049 mV + 40 V
(25 to 109.99) mV 0.21 mV + 40 V
110 mV to 2.1999 V 0.0043 V + 40 V
(2.2 to 10.999) V 0.021 V to 40 V

1 M, (0.01 to 10) kHz (1 to 24.999) mV 0.015 mV + 40 V

(25 to 109.99) mV 0.047 mV + 40 V
110 mV to 2.1999 V 0.00089 V + 40 V
(2.2 to 10.999) V 0.0046 V + 40 V
(11 to 130) V 0.052 V + 40 V

Square Wave Signal:

50 , (0.01 to 10) kHz 1 mV to 6.599 V(p-p) 0.19 % + 40 V
1 M, (1 to 10) kHz 1 mV to 130 V(p-p) 0.078 % + 40 V

Time Marker Output:

Into 50  2 ns to 20 ms 11 x 106 s
50 ms to 5 s 120 x 106 s

Pulse Rise Time –

Generate:

Rep Rate: 1 kHz to 10 <350 ps 85 ps

MHz

(A2LA Cert. No. 1395.06) 10/08/2024 Page 6 of 15

 Parameter/Range Frequency CMC2, 4, 5, 7, 8 () Comments

AC Current – Measure3

(10 to 100) µA 45 Hz to 1 kHz 0.069 % + 0.035 µA Agilent 3458A

OPT-2
(0.1 to 1) mA (45 to 100) Hz 0.069 % + 230 nA
(0.1 to 5) kHz 0.035 % + 230 nA

(1 to 10) mA (45 to 100) Hz 0.069 % + 2.3 µA

(0.1 to 5) kHz 0.035 % + 2.3 µA

(10 to 100) mA (45 to 100) Hz 0.069 % + 23 µA

(0.1 to 5) kHz 0.035 % + 23 µA

(0.1 to 1) A (45 to 100) Hz 0.092 % + 240 µA Valhalla Scientific

(0.1 to 5) kHz 0.12 % + 240 µA 2575A & Agilent
3458A
(1 to 2) A (0.4 to 1) kHz 0.042 %
(>2 to 100) A (0.4 to 1) kHz 0.12 %

AC Current – Generate3

(0.22 to 2.2) mA (>40 to 1000) Hz 0.014 % + 53 nA Fluke 5700A/EP,

(1 to 5) kHz 0.06 % + 400 nA 5725A

(2.2 to 22) mA (>40 to 1000) Hz 0.014 % + 810 nA

(1 to 5) kHz 0.06 % + 4100 nA

(22 to 220) mA (>40 to 1000) Hz 0.014 % + 7.9 µA

(1 to 5) kHz 0.06 % + 41 µA

(0.22 to 2.2) A (>40 to 1000) Hz 0.065 % + 87 µA

(1 to 5) kHz 0.075 % + 110 µA

(2.2 to 11) A (>40 to 1000) Hz 0.046 % + 710 µA

(1 to 5) kHz 0.095 % + 780 µA
(5 to 10) kHz 0.36 % + 1000 µA

(33 to 330) µA (>45 to 1000) Hz 0.099 % + 0.078 µA Fluke

(1 to 5) kHz 0.23 % + 0.12 µA 5520A/SC1100
LCOMP OFF
(11 to 20.5) A (>0.1 to 1) kHz 0.12 % + 3.9 mA
(1 to 5) kHz 2.3 % + 3.9 mA

(10 to 100) A (10 to 60) Hz 0.12 % Valhalla 2575A,

Agilent 3458A

(A2LA Cert. No. 1395.06) 10/08/2024 Page 7 of 15

 Parameter/Range Frequency CMC2, 5, 7 () Comments

AC Current – Generate3
(cont)

Clamp Meters to 1000 A (45 to 400) Hz 1.5 % + 0.36 A Fluke 5500A/coil

(20.5 to 1000) A & 5520A/SC1100
LCOMP OFF

AC Voltage – Generate3

(0.22 to 2.2) mV (10 to 20) Hz 0.055 % + 5 µV Fluke 5700A/EP &

(20 to 40) Hz 0.021 % + 5 µV 5725A
40 Hz to 20 kHz 0.011 % + 5 µV
(20 to 50) kHz 0.037 % + 5.4 µV
(50 to 100) kHz 0.085 % + 8 µV
(100 to 300) kHz 0.11 % + 15 µV
(300 to 500) kHz 0.17 % + 27 µv
(0.5 to 1) MHz 0.34 % + 28 µV

(2.2 to 22) mV (10 to 20) Hz 0.055 % + 8 µV

(20 to 40) Hz 0.021 % + 7 µV
40 Hz to 20 kHz 0.011 % + 12 µV
(20 to 50) kHz 0.037 % + 12 µV
(50 to 100) kHz 0.085 % + 11 µV
(100 to 300) kHz 0.11 % + 20 µV
(300 to 500) kHz 0.17 % + 32 µV
(0.5 to 1) MHz 0.34 % + 42 µV

(22 to 220) mV (10 to 20) Hz 0.055 % + 21 µV

(20 to 40) Hz 0.021 % + 18 µV
40 Hz to 20 kHz 0.011 % + 11 µV
(20 to 50) kHz 0.032 % + 17 µV
(50 to 100) kHz 0.085 % + 41 µV
(100 to 300) kHz 0.11 % + 55 µV
(300 to 500) kHz 0.17 % + 78 µV
(0.5 to 1) MHz 0.34 % + 190 µV

(0.22 to 2.2) V (10 to 20) Hz 0.05 % + 140 µV

(20 to 40) Hz 0.016 % + 49 µV
40 Hz to 20 kHz 0.0075 % + 42 µV
(20 to 50) kHz 0.012 % + 78 µV
(50 to 100) kHz 0.025 % + 130 µV
(100 to 300) kHz 0.043 % + 330 µV
(300 to 500) kHz 0.11 % + 560 µV
(0.5 to 1) MHz 0.22 % + 1700 µV

(2.2 to 22) V (10 to 20) Hz 0.05 % + 1.4 mV

(20 to 40) Hz 0.016 % + 0.54 mV
40 Hz to 20 kHz 0.0075 % + 0.48 mV
(20 to 50) kHz 0.012 % + 0.8 mV
(50 to 100) kHz 0.025 % + 1.3 mV
(100 to 300) kHz 0.05 % + 3.7 mV

(A2LA Cert. No. 1395.06) 10/08/2024 Page 8 of 15

 Parameter/Range Frequency CMC2, 5, 7 () Comments

AC Voltage – Generate3
(cont)

(2.2 to 22) V (300 to 500) kHz 0.13 % + 7.7 mV Fluke 5700A/EP &
(0.5 to 1) MHz 0.27 % + 21 mV 5725A
(22 to 220) V (10 to 20) Hz 0.05 % + 14 mV
(20 to 40) Hz 0.016 % + 6.5 mV
40 Hz to 20 kHz 0.008 % + 6.1 mV* *Subject to 2.2 x
(20 to 50) kHz 0.022 % + 12 mV 107 V Hz limitation
(50 to 100) kHz 0.05 % + 18 mV
(220 to 1100) V (15 to 50) Hz 0.04 % + 42 mV
(40 to 1000) Hz 0.008 % + 39 mV
(1 to 20) kHz 0.017 % + 12 mV
(20 to 30) kHz 0.06 % + 16 mV

(250 to 750) V (30 to 50) kHz 0.06 % + 42 mV

(50 to 100) kHz 0.23 % + 100 mV

AC Voltage – Measure3
(1 to 10) mV (1 to 40) Hz 0.035 % + 3.5 µV Agilent 3458A
(40 to 1000) Hz 0.023 % + 1.3 µV OPT-2
(1 to 20) kHz 0.035 % + 1.3 µV
(20 to 50) kHz 0.12 % + 1.3 µV
(50 to 100) kHz 0.58 % + 1.3 µV
(100 to 300) kHz 4.6 % + 2.3 µV

(10 to 100) mV (1 to 40) Hz 0.0081 % + 5.2 µV

(40 to 1000) Hz 0.0081 % + 3.3 µV
(1 to 20) kHz 0.016 % + 3.2 µV
(20 to 50) kHz 0.035 % + 3.2 µV
(50 to 100) kHz 0.092 % + 3.2 µV
(100 to 300) kHz 0.35 % + 12 µV
(0.3 to 1) MHz 1.2 % + 13 µV
(0.1 to 1) V (1 to 40) Hz 0.0081 % + 48 µV
(40 to 1000) Hz 0.0081 % + 26 µV
(1 to 20) kHz 0.016 % + 24 µV
(20 to 50) kHz 0.035 % + 28 µV
(50 to 100) kHz 0.092 % + 30 µV
(100 to 300) kHz 0.35 % + 120 µV
(0.3 to 1) MHz 1.2 % + 280 µV

(1 to 10) V (1 to 40) Hz 0.0081 % + 0.50 mV

(40 to 1000) Hz 0.0081 % + 0.27 mV
(1 to 20) kHz 0.016 % + 0.27 mV
(20 to 50) kHz 0.035 % + 0.31 mV
(50 to 100) kHz 0.092 % + 0.32 mV
(100 to 300) kHz 0.35 % + 1.2 mV
(0.3 to 1) MHz 1.2 % + 3.1 mV

(A2LA Cert. No. 1395.06) 10/08/2024 Page 9 of 15

 Parameter/Range Frequency CMC2, 5, 8 () Comments

AC Voltage – Measure3
(cont)

(10 to 100) V (1 to 40) Hz 0.023 % + 4.8 mV Agilent 3458A

(40 to 1000) Hz 0.023 % + 2.7 mV OPT-2
(1 to 20) kHz 0.023 % + 2.8 mV
(20 to 50) kHz 0.04 % + 3.1 mV
(50 to 100) kHz 0.14 % + 3.7 mV

(100 to 700) V (1 to 40) Hz 0.046 % + 48 mV

(0.04 to 20) kHz 0.069 % + 27 mV

(700 to 10 000) V (50 to 60) Hz 0.60 % Ross VD60-6.2-A-

(10 000 to 42 000) V (50 to 60) Hz 0.62 % KB-AL & HP
34401A

Capacitance – Generate3

2-Wire

(0.19 to <3.3) nF (0.01 to 10) kHz 0.58 % + 13 pF Fluke 5520A/

SC1100
(3.3 to <11) nF (0.01 to 1) kHz 0.29 % + 13 pF
(11 to 110) nF (0.01 to 1) kHz 0.29 % + 150 pF
(110 to <330) nF (0.01 to 1) kHz 0.29 % + 510 pF
(0.33 to <1.1) µF (10 to 600) kHz 0.29 % + 1.2 nF
(1.1 to <3.3) µF (10 to 300) kHz 0.29 % + 6.8 nF
(3.3 to <11) µF (10 to 150) Hz 0.29 % + 13 nF
(11 to <33) µF (10 to 120) Hz 0.46 % + 55 nF
(33 to <110) µF (10 to 80) Hz 0.52 % + 130 nF
(110 to <330) µF (10 to 50) Hz 0.52 % + 350 nF
(0.33 to <1.1) mF (0 to 20) Hz 0.52 % + 1.2 µF
(1.1 to <3.3) mF (0 to 6) Hz 0.52 % + 3.5 µF
(3.3 to <11) mF (0 to 2) Hz 0.52 % + 12 µF
(11 to <33) mF (0 to 0.6) Hz 0.87 % + 35 µF
(33 to <110) mF (0 to 0.2) Hz 1.3 % + 120 µF

(A2LA Cert. No. 1395.06) 10/08/2024 Page 10 of 15

III. Electrical – RF/Microwave

Parameter/Range Frequency CMC2, 10 () Comments

RF Power3 – Generate

(+20 to -100) dBm 9 kHz to 3200 MHz 1.2 dB HP 8648D OPT-1E2, 1E5,
(>3200 to 4000) MHz 2.3 dB 1EA

(<-100 to -127) dBm (9 to <100) kHz 3.5 dB HP 8648D OPT-1E2, 1E5,

(0.1 to 2500) MHz 1.2 dB 1EA
(>2500 to 4000) MHz 3.5 dB

RF Power/Flatness3 –
Generate

(+20 to -20) dBm (100 to 300) kHz 0.2 dB HP 8648D, 11667B, 8482A
(0.3 to 1) MHz 0.19 dB & E4419B
(0.001 to 4.2) GHz 0.19 dB

RF Power3 – Measure

(+20 to -20) dBm (100 to 300) kHz 0.083 dB HP 8482A & E4419B
(0.3 to 1) MHz 0.068 dB
(0.001 to 4.2) GHz 0.067 dB

Distortion3 – Measure

≤ -80 dB 20 Hz to 20 kHz 1.2 dB HP 8903B

≤ -65 dB (20 to 100) kHz 2.3 dB

IV. Mechanical

Parameter/Equipment Range CMC2, 6, 8 () Comments

Scales & Balances3 (1 to 50) mg 0.0059 mg + 0.58R Ultra Class weights

2g 0.04 mg + 0.58R
20 g 0.052 mg + 0.58R
50 g 0.086 mg + 0.58R
100 g 0.15 mg + 0.58R
(0.2 to 10) kg 0.000 29 % + 0.58R Class 1 weights
(10 to 20) kg 83 mg + 0.58R
(20 to 35) kg 88 mg + 0.58R

Up to 500 lb 0.18 % + 0.58R Class F weights

(A2LA Cert. No. 1395.06) 10/08/2024 Page 11 of 15

 Parameter/Equipment Range CMC2, 6, 8, 10 () Comments

Torque Wrenches & (5 to 50) ozfꞏin 0.75 % + 0.58R AWS torque system
Screwdrivers3 – (1 to 10) lbfꞏin 0.6 % + 0.58R
Measure (10 to 50) lbfꞏin 0.65 % + 0.58R
(15 to 150) lbfꞏft 0.67 % + 0.58R Mountz torque system
(150 to 1000) lbfꞏft 0.64 % + 0.58R

Torque Transducers & (0 to 250) lbf∙in 0.11 % + 0.58R Class F weights & torque
Analyzers – Measuring wheels
Equipment3

Force3 – Measuring (0 to 300) lbf 0.031 % + 0.58R Class F weights

Equipment, Tension &
Compression

Pressure & Vacuum3 – (0.9 to 3.16) psia 0.00038 psia + 0.58R Fluke PPC4
Measuring Equipment (3.16 to 7.53) psia 0.011 % + 0.58R
(7.53 to 23) psia 0.012 % + 0.58R
(23 to 97) psia 0.01 psia + 0.58R
(97 to 300) psia 0.011 % + 0.58R

(-14.7 to -12.3) psig 0.001 psig + 0.58R

(-12.3 to -7.9) psig 0.011 % + 0.58R
(-7.9 to 8) psig 0.012 % + 0.58R
(8 to 86.7) psig 0.01 psig + 0.58R
(86.7 to 300) psig 0.012 % + 0.58R

(300 to 1000) psig 1.2 psig + 0.58R Druck DPI705

(1000 to 10 000) psig 6.3 psig + 0.58R

(2 to 10 000) psi 0.039 % + 0.58R Pressurements M2200-3-P

Pipettes (2 to 10) µL 0.099 µL Gravimetric calibration

(10 to 100) µL 0.37 µL using A&D AD-4212B-PT
(100 to 500) µL 0.55 µL & Mettler AT200
(500 to 1000) µL 1.6 µL
(1000 to 5000) µL 2 µL

(A2LA Cert. No. 1395.06) 10/08/2024 Page 12 of 15

V. Thermodynamic

Parameter/Equipment Range CMC2, 6, 10 () Comments

Temperature – (-70 to 100) oC 0.028 oC + 0.58R Hart Scientific 1502A, 5628

Measuring Equipment3 (100 to 175) oC 0.026 oC + 0.58R w/ environmental chamber
(-5 to 100) oC 0.035 oC + 0.58R Hart Scientific 1502A, 5628
(100 to 125) oC 0.068 oC + 0.58R w/ oil bath
(-15 to 350) oC 0.12 oC + 0.58R Hart Scientific 1502A, 5628
w/ drywell

Temperature – Measure3 (-196 to 0) oC 0.025 oC Hart Scientific 1502A, 5628

(0 to 100) oC 0.013 oC
(100 to 500) oC 0.024 oC

Relative Humidity – (10 to 76) % RH 1.9 % RH Vaisala HM40/HM46 w/

Measuring Equipment3 (0 to 40) oC humidity chamber

Relative Humidity – (10 to 90) % RH 1.9 % RH Vaisala HM40/HM46

Measure3 (90 to 95) % RH 3.0 % RH

VI. Time & Frequency

Parameter/Equipment Range CMC2, 6, 10 () Comments

Timers & Stopwatches3 Up to 86 400 s

Totalize 64 ms HP 53132A, HP 33220A
phase locked to GPS
Stopwatch to 84 ms Stopwatch comparison
Stopwatch

(0 to 19.99) s/day 0.038 s/day Timometer

Frequency Reference 10 MHz 1.5 pHz/Hz + 0.58R Fluke 910R GPS

Frequency – Measuring 0.01 Hz to 600 MHz 1.5 pHz/Hz + 0.58R Fluke 910R GPS & HP
Equipment3 53132A

9 kHz to 4 GHz 30 pHz/Hz + 0.58R HP 8648D phase locked to

GPS

(A2LA Cert. No. 1395.06) 10/08/2024 Page 13 of 15

 Parameter/Equipment Range CMC2, 6, 8,. 10 () Comments

Frequency3 – Measure 0.1 Hz to 3 GHz 1.5 pHz/Hz + 0.58R Fluke 910R GPS & HP
53132A

RPM – Measure (0 to 100 000) rpm 0.012 % + 0.58R Monarch PLT200

Tachometers (10 to 200 000) rpm 1.9 µrpm/rpm + 0.58R HP 33220A phase locked to
GPS
________________________________________________________________
1
This laboratory offers commercial calibration service and field calibration service.
2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
3
Field calibration service is available for this calibration. Please note the actual measurement uncertainties
achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA
Scope. Allowance must be made for aspects such as the environment at the place of calibration and for
other possible adverse effects such as those caused by transportation of the calibration equipment. The
usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must
also be considered and this, on its own, could result in the actual measurement uncertainty achievable on
a customer’s site being larger than the CMC.
4
Based on using the standard at the temperature the Fluke 5520A with SC1100 was calibrated (tcal ± 5 oC)
and assuming the instrument is zeroed at least every seven days or when the ambient temperature changes
more than 5 oC. For resistance, a zero calibration is performed at least every 12 hours within ± 1 oC of
use. For AC Current, CMC are determined with LCOMP Off. CMC is based upon 1-year specifications
and is read as ppm (parts per million) or percent output plus floor specification where defined.
5
Based on using the standard at the temperature the Agilent 3458A was calibrated (tcal ± 5 oC) and an auto-
calibration (ACAL) was performed within the previous 24 hours (± 1 oC of ambient temperature). CMC
is based upon 1-year specifications and is read as ppm (parts per million) or percent output plus floor
specification where defined.
6
In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches;
R is the numerical value of the resolution of the device, DL is the diagonal length of the surface plate
measured in inches.
7
Based on using the Fluke 5700A/5725A within 5 oC of the temperature noted at the time of cal (tcal ± 5
o
C) and assuming the zero calibration is performed every 30 days. CMC is based upon 1-year
specifications and is read as ppm (parts per million, V/V) or percent of output plus floor specification
where defined. Includes stability. Resistance specifications apply only to the displayed resistance value
using 4-wire configuration (except for 100 MΩ). Uncertainty specifications for 220 mA and 2.2 mA
ranges are increased by a factor of 1.3 when supplied through 5725A terminals.

(A2LA Cert. No. 1395.06) 10/08/2024 Page 14 of 15

8
When percent (%) is present in the statement of CMC; the value is defined as the percentage of reading
unless otherwise noted.
9
This scope meets A2LA’s P112 Flexible Scope Policy.
10
The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated
for the listed measurement parameter.

(A2LA Cert. No. 1395.06) 10/08/2024 Page 15 of 15

 Accredited Laboratory
A2LA has accredited

SIMCO ELECTRONICS
San Diego, CA
for technical competence in the field of

Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General
requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of
ANSI/NCSL Z540-1-1994 and R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation
demonstrates technical competence for a defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).

Presented this 8th day of October 2024.

_______________________
Mr. Trace McInturff, Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1395.06
Valid to September 30, 2026

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.