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EE1102_PPT_Optics Summary (Spring 2024)

The document covers fundamental concepts of wave optics, including reflection, refraction, total internal reflection, and the behavior of light through lenses and mirrors. It explains laws such as Snell's Law, the thin lens equation, and interference patterns, as well as diffraction and polarization of light. Key equations and principles are presented to aid in understanding optical phenomena and their applications.

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0% found this document useful (0 votes)
11 views

EE1102_PPT_Optics Summary (Spring 2024)

The document covers fundamental concepts of wave optics, including reflection, refraction, total internal reflection, and the behavior of light through lenses and mirrors. It explains laws such as Snell's Law, the thin lens equation, and interference patterns, as well as diffraction and polarization of light. Key equations and principles are presented to aid in understanding optical phenomena and their applications.

Uploaded by

crtve
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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EE1002: Physics Foundation for EEE

SUMMARY
Wave Optics OF
OPTICS

1
EE1002: Physics Foundation for EEE

SUMMARY
Wave Optics OF
OPTICS -1

2
EE1102: Physics Foundation for EEE

Light Basics
The normal, incident ray, reflected, and refracted ray all lie in a
plane perpendicular to the reflecting surface – plane of incidence.

1. Reflection

2. Refraction
3. Total Internal
Reflection

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EE1102: Physics Foundation for EEE

Law of Reflection
The angle of reflection is equal to the angle of incidence.

θi θ r

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EE1102: Physics Foundation for EEE

Law of Refraction (Snell’s Law)

Incident Ray
Normal sin θ 2 n1
=
θ1
Angle of
sin θ1 n2

n1 sin θ1 = n2 sin θ 2
incident

Refracted Ray

Angle of refraction θ2 This equation is known as the Snell’s


Law of Refraction named after
Willebrord Snell.

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EE1102: Physics Foundation for EEE
EE1002: Physics Foundation for EEE

Total Internal Reflection- Critical Angle


Total Internal Reflection : θ2 =90deg

n1 sin θ c = n2 sin 90 = n2


n2
sin θ c = (for n1 > n2 )
n1
n2
θ c = arcsin
n1

If 𝜃𝜃1 ≥ 𝜃𝜃c, the TIR occurs.

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EE1002: Physics Foundation for EEE

SUMMARY
Wave Optics OF
OPTICS -2

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EE1002: Physics Foundation for EEE

Concave and Convex Mirrors

Concave
f & R positive
p – positive p – negative
LEFT q – negative RIGHT
q – positive
REAL VIRTUAL
Light Convex No light
f & R negative
p – positive p – negative
LEFT q – negative RIGHT
q – positive
REAL VIRTUAL 9
EE1002: Physics Foundation for EEE

Focal Point, F, and Focal Length, f

• The distance from the mirror to the


focal point is called the focal
length.
• The focal length is ½ the radius of
curvature.

1 1 2 1 2 R
+ = , let, p → ∞ , = , or q = = f
p q R q R 2

then, 1 1 1
+ =
p q f
EE1002: Physics Foundation for EEE

Sign Conventions in Lens (Ray Travels Left to Right)

LEFT RIGHT

p – positive p – negative
q – negative q – positive

Light Light
R1 (Convex)– positive
R2 (Concave) – negative
Converging surface (Convex) – f is positive
Diverging surface (Concave) – f is negative
As before, we will follow real rays to determine the signs of p and q.
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EE1002: Physics Foundation for EEE

Thin Lens Equation


• Focal length f of a thin lens is the image distance that
corresponds to an infinite object distance.
1 1 1 1  1 1 1 1 
+ = (n − 1) −  when p ∞, = = (n − 1) − 
p q  R1 R2  q f  R1 R2 

1 1 1 1  1 1 1 
+ = (n − 1) −  = (n − 1) − 

p q  R1 R2  f  R1 R2 

1 1 1
+ = Thin-lens equation
p q f
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EE1002: Physics Foundation for EEE

Lateral Magnification of Thin Lens

h
q
p h’

• Lateral Magnification
h' q
M = =−
h p
• if M<0, image is inverted, or image and object are in the opposite orientation.

• if M>0, image is upright, or image and object are in the same orientation.
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EE1002: Physics Foundation for EEE

Compound Microscope

1/p1 + 1/q1 = 1/f1


M= M1 x M2
1/p2 + 1/q2 = 1/f2
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EE1002: Physics Foundation for EEE

SUMMARY
Wave Optics OF
OPTICS -3

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EE1002: Physics Foundation for EEE

Light as Wave- Each Light has its own Phase


Phase is the fraction of the wave cycle which has elapsed relative
to the origin.

Phase contains the information of position and moving direction


180° degrees = 𝜋𝜋 radian
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Interference
1. When incident light passes through a tiny structure, an optical
path length (OPL) difference is created.
2. Phase difference between two waves caused by OPL.
3. This phase difference therefore creates interference.

Transmittance Reflection
structure structure

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How to obtain ΔL?
The two slits S1 and S2 are separated by a distance d and the
viewing screen is located a distance L from the two slits. (D >> d)

∆L = r2 − r1 = d sin θ
 This assumes the
paths are parallel.
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EE1002: Physics Foundation for EEE

How to obtain ΔL?


 OPL difference= 2 nt
 2nt is the additional path from Ray 2, which equals to a round-trip
distance in the film.

• ΔL = 2nt = mλ : Bright fringes  ΔL = 2nt = mλ : Dark fringes


• ΔL = 2nt = (m+1/2)λ : Dark fringes  ΔL = 2nt = (m+1/2)λ : Bright fringes 19
E1002: Physics Foundation for EEE

Tips to Solve
 1. Identify the thin gap and two interfaces

 2. Find the phase φ1 for Interface 1


n1>n2 or n1<n2 ?
 3. Find the phase φ2 for Interface 2

 4. Calculate the phase difference Δφ = Δφ1- Δφ2

Δφ =π or
Δφ =0 or 2 π
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EE1002: Physics Foundation for EEE

Summary on the Interference Pattern (Not exhaustive)

Interference Optical path length Bright fringe Dark fringe


difference (ΔL)
Young’s double slits d sinθ ±mλ ±(m+1/2)λ

Thin film involving π phase 2nt ±(m+1/2)λ ±mλ


change by reflection

Thin film involving no or 2π 2nt ±mλ ±(m+1/2)λ


phase change by reflection

m = 0, 1, 2, 3, ...
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EE1002: Physics Foundation for EEE

SUMMARY
Wave Optics OF
OPTICS -4

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EE1102: Physics Foundation for EEE

Diffraction by a Single Slit


A single slit generates the dark fringes at,
L
L mλ
The position of dark fringes are found by,

L
L

L L

𝜆𝜆𝜆𝜆
𝑦𝑦𝑚𝑚 = ± 𝑚𝑚 (m=0,1,2,3….)
𝑎𝑎
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EE1002: Physics Foundation for EEE

Diffraction by Double Slit Interference


 The two slits S1 and S2 are separated by a distance d and the
viewing screen is located a distance L from the two slits.

L1
S1 y
𝜃𝜃 L2 small angle d
d
S2
L Δ𝐿𝐿
Bright fringes Dark fringes
∆L = d sin θ = ± mλ ∆L = d sin θ = ±(m + 12 )λ
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EE1002:
EE1102: Physics
Physics Foundation
Foundation for EEE
for EEE

Multi-Slit Interference
• Positions of the bright fringes are fix by slit spacing d and wavelength λ

𝑑𝑑 𝑠𝑠𝑠𝑠𝑠𝑠 𝜃𝜃 = ±𝑚𝑚𝑚𝑚

m = 0, 1, 2, 3, …

• The total number of slits (N) has a great impact!


• Peak linewidth decreases as the number of slits
increases.

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EE1002: Physics Foundation for EEE

Resolving Power
• For two nearly equal wavelengths λ1 and λ2 between which the
diffraction grating can just barely distinguish, the resolving power
R is defined as:

λ λ
R= = λ2
λ2 − λ1 ∆λ
1

where λ = (λ1 + λ2)/2


∆ λ = λ2 - λ1 .

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EE1002: Physics Foundation for EEE

Polarisation of Light Waves

• Unpolarized light is light with a random, time-


varying polarization. More than one vibrational
planes.
• Polarized light is light waves which vibrations
only occur in a particular single plane.

• How to control light polarizations?


• Absorption, Reflection, Refraction

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EE1002: Physics Foundation for EEE

Polarisation by Reflection- Brewster Angle


θ p + 90° + θ 2 = 180°
θ 2 = 90° − θ p
n2 sin θ p
= = tan θ p
n1 cos θ p

( )
Since sin θ 2 = sin 90° − θ p = cosθ p

n2 sin θ p
= = tan θ p
n1 cos θ p

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EE1002: Physics Foundation for EEE

Please support my teaching through


Teaching Feedback this week!

Asst. Prof. Chen Yu-Cheng

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