IS/IEC 61196-1-101 : 2005

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Indian Standard
COAXIAL COMMUNICATION CABLES
PART 1-101 ELECTRICAL TEST METHODS — TEST FOR CONDUCTOR
d.c. RESISTANCE OF CABLE

ICS 33.120.10

© BIS 2011
B U R E A U O F I N D I A N S TA N D A R D S
MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG
NEW DELHI 110002
June 2011 Price Group 2
Wires, Cables, Waveguides and Accessories Sectional Committee, LITD 06

NATIONAL FOREWORD

This Indian Standard (Part 1-101) which is identical with IEC 61196-1-101 : 2005 ‘Coaxial communication
cables — Part 1-101: Electrical test methods — Test for conductor d.c. resistane of cable’ issued by the
International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the
recommendation of the Wires, Cables, Waveguides and Accessories Sectional Committee and approval of
the Electronics and Information Technology Division Council.

The text of IEC Standard has been approved as suitable for publication as an Indian Standard without
deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is
particularly drawn to the following:

a) Wherever the words ‘International Standard’ appear referring to this standard, they should be read as
‘Indian Standard’.

b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to
use a point (.) as the decimal marker.

In this adopted standard, reference appear to the following International Standard for which Indian Standard
also exists. The corresponding Indian Standard which is to be substituted in its place is listed below along
with its degree of equivalence for the edition indicated:

International Standard Corresponding Indian Standard Degree of Equivalence

IEC 61196-1 : 2005 Coaxial IS/IEC 61196-1 : 2005 Coaxial Identical

communication cables — Part 1: communication cables: Part 1 Generic
Generic specification — General, specification — General, definitions and
definitions and requirements requirements

Only English language text has been retained while adopting it in this Indian Standard and as such the
page numbers given here are not the same as in the IEC Publication.

For the purpose of deciding whether a particular requirement of this standard is complied with, the final
value, observed or calculated, expressing the result of a test or analysis, shall be rounded off in
accordance with IS 2 : 1960 ‘Rules for rounding off numerical values (revised)’. The number of significant
places retained in the rounded off value should be the same as that of the specified value in this
standard.
 IS/IEC 61196-1-101 : 2005

Indian Standard
COAXIAL COMMUNICATION CABLES
PART 1-101 ELECTRICAL TEST METHODS — TEST FOR CONDUCTOR
d.c. RESISTANCE OF CABLE

1 Scope

This part of IEC 61196 applies to coaxial communications cables. It specifies test methods for
determining the conductor d.c. resistance of coaxial cables.

2 Normative references

The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.

IEC 61196-1, Coaxial communication cables – Part 1: Generic specification – General,

definitions and requirements

3 Terms and definitions

For the purposes of this document, the terms and definitions given in IEC 61196-1 apply.

4 Test method

4.1 Equipment

The d.c. resistance shall be measured by means of equipment capable of measuring d.c.
resistance accurately to within ±0,5 % of the value to be determined. A bridge circuit or a
current source in conjunction with a voltmeter is used. Depending on the magnitude of the d.c.
resistance value, a two or four terminal method may be applied. The measurement current
density shall not exceed 1 A/mm 2 of conductor to avoid any significant increase in
temperature during the test.

4.2 Test sample

The length of the Cable Under Test (CUT) shall be ≥  1 00 m and known to within ≤1 %. If the
length of the CUT is shorter than 100 m, it should be noted in the test report. Both ends of the
CUT shall be prepared, such that the current flows through all elements of the circuit under
test and that the contact resistance can be neglected with respect to the result. The CUT shall
be pre-conditioned at a constant temperature between 15 ºC and 35 ºC for such time as to
allow the specimen temperature to stabilize.

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IS/IEC 61196-1-101 : 2005

4.3 Procedure

Measure the d.c. resistance of the leads connected to the bridge short – circuited to
themselves and record this value as R L .

Connect one bridge lead, ensure good connection, to the inner conductor on one end of the
cable, and the other directly to the same conductor on the opposite end. Measure d.c.
resistance. Record this value as R 1 .

Following the same procedure, connect one bridge lead to the outer conductor of the cable,
and the other directly to the same conductor on the opposite end. Measure d.c. resistance.
Record this value as R 2 .

The current density shall not exceed 1 A/mm 2 of conductor to avoid any significant increase of
temperature during the test.

The ambient temperature shall be recorded.

5 Expression of test results

5.1 Calculation of loop resistance

R cc = R 1 – R L

R oc = R 2 – R L

R LOOP = R cc + R oc

where
R cc is the centre conductor d.c. resistance;
R oc is the outer conductor d.c. resistance;
R LOOP is the loop d.c. resistance;
RL is the lead d.c. resistance.

5.2 Normalization

The test results should be normalised to the reference length N.

Rm
R= N (Ω/N)
L
where
R is the d.c. resistance of reference length at measuring temperature;
Rm is the measured d.c. resistance value of the CUT in Ω;
L is the length of sample in m;
N is the reference length in m.

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 IS/IEC 61196-1-101 : 2005

5.3 Temperature correction

The measured value shall be corrected to the standard temperature of 20 ºC. The d.c.
resistance shall be corrected to the standard temperature by multiplying the measured values
(R cc , R oc ) by the factor k:

1
k=
1 + C T (T − 20 °C )

where
T is the temperature in degrees Celsius of the CUT during the measurement;
CT is the temperature coefficient of resistivity for conductor material.

Typical values are [1/°C]:

Copper (annealed) 0,003 85

Copper (drawn) 0,003 93
Aluminum 0,003 96
Copper-clad aluminum 0,004 13
Copper-clad Steel 0,003 78

For other conductor materials, the factor k or CT shall be indicated in the sectional or detail
specification.

6 Test report

The test report shall give the test conditions:

• ambient temperature (°C),

• CUT length (m),

and record the corrected values for the reference length at 20 °C

• inner conductor d.c. resistance (Ω/reference length),

• outer conductor d.c. resistance (Ω/reference length),
• loop d.c. resistance (Ω/reference length),

as required in the relevant sectional or detail specification.

3
IS/IEC 61196-1-101 : 2005
Bibliography

IEC 60050 (all parts), International Electrotechnical Vocabulary (IEV)

___________

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This Indian Standard has been developed from Doc No.: LITD 06 (2070).

Amendments Issued Since Publication

Amend No. Date of Issue Text Affected

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