NI-DAQmx User

Manual

2025-01-28
 NI-DAQmx User Manual

Contents
NI-DAQmx User Manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
New Features and Changes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
NI-DAQmx Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
LabVIEW . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Creating an Application with LabWindows/CVI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Measurement Studio with Visual C++, Visual C#, or Visual Basic .NET . . . . . . . . . . . . . . . 26
ANSI C Application without LabWindows/CVI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Creating a .NET Application without Measurement Studio . . . . . . . . . . . . . . . . . . . . . . . . 27
SignalExpress . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Getting Started with NI-DAQmx . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Finding Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Troubleshooting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Common Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Measuring Acceleration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Measuring Acceleration Programming Flowchart. . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Measuring Analog Frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Measuring Analog Frequency Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . 37
Hysteresis with Analog Frequency Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Measuring Angular Displacement. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Measuring Position with Encoders Programming Flowchart . . . . . . . . . . . . . . . . . . 39
Measuring Position with an RVDT or LVDT Programming Flowchart . . . . . . . . . . . 40
Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Event Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Control Loops . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
Edge Counting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Edge Counting Programming Flowchart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Measuring Charge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Measuring Charge Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Measuring and Generating Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Measuring Current Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Tips on Measuring AC Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Generating Current Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51

2 ni.com
 NI-DAQmx User Manual

Measuring and Generating Digital Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51

Measuring a Digital Value Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . 52
Generating a Digital Value Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . 52
Measuring Duty Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Measuring Pulses Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Measuring Force . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
Measuring Force with a Bridge-Based Sensor Programming Flowchart . . . . . . . . 55
Measuring Force with a Piezoelectric Sensor Programming Flowchart . . . . . . . . . 57
Measuring Digital Frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Measuring Pulses Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Measuring Digital Frequency and Period Programming Flowchart . . . . . . . . . . . . 59
Generic Programming Flowcharts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Analog Input Programming Flowcharts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Single Sample Analog Input Programming Flowchart. . . . . . . . . . . . . . . . . . . 61
Finite Analog Input Programming Flowchart. . . . . . . . . . . . . . . . . . . . . . . . . . . 62
Continuous Analog Input Programming Flowchart . . . . . . . . . . . . . . . . . . . . . 63
Analog Output Programming Flowcharts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
Single Sample Analog Output Programming Flowchart . . . . . . . . . . . . . . . . . 65
Finite Analog Output Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . 65
Continuous Analog Output Programming Flowchart . . . . . . . . . . . . . . . . . . . 66
Counter Programming Flowcharts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
Single Point Counter Input Programming Flowchart . . . . . . . . . . . . . . . . . . . . 68
Finite Counter Input Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . 68
Continuous Counter Input Programming Flowchart . . . . . . . . . . . . . . . . . . . . 69
Digital Input Programming Flowcharts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Single Sample Digital Input Programming Flowchart . . . . . . . . . . . . . . . . . . . 71
Finite Digital Input Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
Continuous Digital Input Programming Flowchart . . . . . . . . . . . . . . . . . . . . . 73
Digital Output Programming Flowcharts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
Single Sample Digital Output Programming Flowchart . . . . . . . . . . . . . . . . . 75
Finite Digital Output Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . 75
Continuous Digital Output Programming Flowchart . . . . . . . . . . . . . . . . . . . . 76
Triggered Acquisition Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Measuring GPS Timestamp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
GPS Timestamp Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
Measuring Linear Displacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80

© National Instruments 3
 NI-DAQmx User Manual

Measuring Position with Encoders Programming Flowchart . . . . . . . . . . . . . . . . . . 81

Measuring Position with an RVDT or LVDT Programming Flowchart . . . . . . . . . . . 82
Measuring Period, Semi-Period, Pulse Width, and Two-Edge Separation . . . . . . . . . . . . 84
Measuring Pulses Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
Measuring Digital Frequency and Period Programming Flowchart . . . . . . . . . . . . 86
Measuring Semi-Period, Two-Edge Separation, and Pulse Width Programming
Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
Measuring Pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
Measuring Pressure Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
Measuring Proximity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
Measuring Proximity Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
Generating Pulses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
Generating a Pulse Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92
Generating a Finite Pulse Train Programming Flowchart . . . . . . . . . . . . . . . . . . . . . 92
Generating a Continuous Pulse Train Programming Flowchart . . . . . . . . . . . . . . . 93
Measuring Resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
Measuring Resistance Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
Measuring Sound Pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96
Measuring Sound Pressure Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . 96
Measuring Strain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
Measuring Strain Programming Flowchart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
Measuring Torque . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
Measuring Torque Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
Measuring Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
Measuring Temperature with an RTD Programming Flowchart . . . . . . . . . . . . . . 102
Measuring Temperature with a Thermistor Programming Flowchart . . . . . . . . . 104
Measuring Temperature with a Thermocouple Programming Flowchart . . . . . . 105
Measuring Velocity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106
Measuring Velocity with an IEPE Velocity Transducer . . . . . . . . . . . . . . . . . . . . . . . 106
Measuring Velocity Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . 106
Measuring Angular Velocity (Encoder). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107
Measuring Linear Velocity (Encoder) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108
Generating Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108
Generating Voltage Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109
Measuring Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
Measuring Voltage Programming Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113

4 ni.com
 NI-DAQmx User Manual

NI-DAQmx Key Concepts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115

Channels and Tasks in NI-DAQmx. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
Channels: Physical, Virtual, Local Virtual, and Global Virtual . . . . . . . . . . . . . . . . 115
Creating Virtual Channels with the API . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
Types of Virtual Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
Physical Channel Syntax . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
Digital Lines, Ports, and Port Width . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
Channel Name Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121
Naming Channels, Tasks, and Scales . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121
Cold-Junction Compensation Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122
Tasks in NI-DAQmx . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122
Creating Tasks with the API . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123
Using the Start Task function/VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124
Aborting a Task . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 126
Using Is Task Done . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127
Using Wait Until Done . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127
When Is A Task Done? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128
Task State Model. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128
Unverified State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 129
Verified State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 129
Reserved State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 130
Committed State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 130
Running State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131
Running to Committed State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131
Committed to Verified State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131
Explicit Versus Implicit State Transitions . . . . . . . . . . . . . . . . . . . . . . . . 132
Implicit Task State Transitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 133
Task Moves Through Multiple States at the Same Time. . 133
Operations That Require State Transitions . . . . . . . . . . . . . 134
Transitioning the State Backwards . . . . . . . . . . . . . . . . . . . . 135
Creating Channels and Tasks with the DAQ Assistant . . . . . . . . . . . . . . . . . . . . . . . 136
Choosing Whether to Use the API or the DAQ Assistant. . . . . . . . . . . . . . . . . . . . . . 137
Timing and Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 137
Timing, Hardware Versus Software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 138
Clocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 138
Sample Timing Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 143

© National Instruments 5
 NI-DAQmx User Manual

Sample Clock. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 144

Handshaking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 145
Burst Handshaking Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 146
Handshaking Signals for Devices That Emulate the 8255
Protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 146
Handshaking Signals for 8255-Based Devices . . . . . . . . . . . . . . . 147
Hardware-Timed Single Point Sample Mode . . . . . . . . . . . . . . . . . . . . . . . . . . 148
Multiplexed Versus Simultaneous Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . 149
Setup and Hold Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 150
Simultaneous Analog Output On-Demand Timing . . . . . . . . . . . . . . . . . . . . . 150
Timing Response Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 150
Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 151
Advance Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 151
Arm Start Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 151
Expiration Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 152
Handshake Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 152
Pause Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 152
Reference Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 152
Start Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 153
Trigger Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 153
Analog Edge Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 153
Analog Level Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 155
Analog Multi Edge Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 155
Analog Window Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 155
Digital Edge Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 156
Digital Level Triggers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 157
Digital Pattern Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 157
Software Triggers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 158
Time Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 158
Synchronization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 159
Types of Synchronization, Lockstep and Handshaked . . . . . . . . . . . . . . . . . 160
Master and Slave Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 161
Sources of Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 162
Jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 162
Stability. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 162
Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 162

6 ni.com
 NI-DAQmx User Manual

Skew . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 163
Methods of Synchronization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 163
Start Trigger Synchronization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 163
Sample Clock Synchronization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 164
Reference Clock Synchronization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 164
Master Timebase Synchronization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 166
Sample Clock Timebase Synchronization . . . . . . . . . . . . . . . . . . . . . . . 167
Mixed-Clock Synchronization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 168
Counter Synchronization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 169
Trigger Skew Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 169
Subsystem . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 170
Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 170
Events . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 172
Exported Signal Behaviors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 173
Software Events . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 174
Reading and Writing Data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 176
Selecting Read and Write Data Format and Organization . . . . . . . . . . . . . . . . . . . . 176
Data Formats in NI-DAQmx. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 176
Data Organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 179
Digital Data (Integer Format) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 180
Interleaving . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 182
Raw Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 183
Unscaled Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 183
Waveform Timing Limitations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 184
Buffering. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 184
How Is Buffer Size Determined? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 185
Continuous Acquisition and Generation with Finite Buffer Size . . . . . . . . . 187
Reference Triggering Impact on Buffers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 188
Controlling Where in the Buffer to Read Samples. . . . . . . . . . . . . . . . . . . . . . 188
Read Status Attributes/Properties and Buffers . . . . . . . . . . . . . . . . . . . . . . . . 189
Controlling Where in the Buffer to Write Samples . . . . . . . . . . . . . . . . . . . . . 189
Write Status Attributes/Properties and Buffers . . . . . . . . . . . . . . . . . . . . . . . . 189
Glitching . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 190
Data Transfer Mechanisms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 191
Regeneration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 193
TDMS Logging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 193

© National Instruments 7
 NI-DAQmx User Manual

Logging Across Multiple Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 194

On-Demand Logging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 195
Pausing Logging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 195
Signal Routing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 196
Specifying a Route . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 196
Single-Device Routing Versus Multi-Device Routing . . . . . . . . . . . . . . . . . . . . . . . . 196
Creating Multi-Device Routes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197
Plugging in and Registering Your RTSI Cable in MAX . . . . . . . . . . . . . . . . . . . . . . . . 197
Dynamically Selecting Trigger Bus Lines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197
Task-Based Routing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197
Immediate Routing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 198
Logical Inversion of Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 198
Routing and Hardware Sharing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 198
Line Tristating Issues . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 199
Lazy Line Transitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 200
Device Resetting and Interactions with Routing . . . . . . . . . . . . . . . . . . . . . . . . . . . . 201
Device Routing in MAX. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 201
Counters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 202
Paired Counters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 202
Two Counter Measurement Method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 202
High Frequency Two-Counter Measurement Method . . . . . . . . . . . . . . . . . . 203
Large-Range Two Counter Measurement Method . . . . . . . . . . . . . . . . . . . . . 203
Quantization Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 205
Dynamic Averaging Method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 210
Counter Parts in NI-DAQmx . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 213
Configuring a Time-Based Measurement in NI-DAQmx . . . . . . . . . . . . . . . . . . . . . . 216
Configuring a Displacement Measurement with NI-DAQmx . . . . . . . . . . . . . . . . . . 218
Buffered Pulse Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 219
Configuring Triggers for Pulse Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 220
Generating Single Pulses, Finite Pulse Trains, and Continuous Pulse Trains . . . 221
Setting Pulse Train Polarity and the Initial Delay State . . . . . . . . . . . . . . . . . . . . . . 222
Counter Frequency Coercion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 222
Terminals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 223
Signal Versus Terminal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 223
Terminal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 224
Analog Input Accessory Terminal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 230

8 ni.com
 NI-DAQmx User Manual

Analog Output Accessory Terminal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . 231

Counter Accessory Terminal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 231
Digital Accessory Terminal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 232
Syntax for Terminal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 232
Coercion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 233
Input Limit Coercion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 233
Clock Frequency Coercion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 234
Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 234
Device Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 234
Channel Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 236
Control in NI-DAQmx . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 236
NI-DAQmx Single-Point Real-Time Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 237
Hardware-Timed Simultaneously Updated I/O . . . . . . . . . . . . . . . . . . . . . . . . 237
Hardware-Timed Simultaneously Updated I/O with Data Exchanges between
Time-Critical and Non-Time-Critical Loops . . . . . . . . . . . . . . . . . . . . . . . . . . . 240
Hardware-Timed Input, Software-Timed Output . . . . . . . . . . . . . . . . . . . . . . 243
Hardware-Timed Counter Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 245
Hardware-Timed Simultaneously Updated I/O Using the Timed Loop
(LabVIEW Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 249
Software-Timed I/O . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 253
Timing Control Loops . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 255
Control Algorithms. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 256
Synchronizing Analog Input and Output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 256
Setting Priorities for Control Applications in LabVIEW . . . . . . . . . . . . . . . . . . . . . . 256
I/O Cycles . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 257
NI-DAQmx Simulated Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 257
Timing and Triggering with NI-DAQmx Simulated Devices . . . . . . . . . . . . . . . . . . . 257
Task Behavior of NI-DAQmx Simulated Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . 258
Reading and Writing Data with NI-DAQmx Simulated Devices. . . . . . . . . . . . . . . . 258
Distributed Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 259
Deployment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 259
DAQmx I/O Server and Virtual Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 261
Functions, VIs, Properties, and Attributes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 261
External Reference Sources for Generating Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 262
Custom Scales. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 262
NI-DAQmx Versus Traditional NI-DAQ (Legacy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 265

© National Instruments 9
 NI-DAQmx User Manual

NI-DAQmx Device Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 267

Device Groups in NI-DAQmx . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 267
Analog Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 275
Valid Analog Trigger Sources for DSA Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 276
Analog Triggering Considerations for TestScale Modules and C Series, E Series, M
Series, and S Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 276
Triggering Considerations for NI ELVIS II Family Devices. . . . . . . . . . . . . . . . . . . . . 279
Analog Triggering Considerations for SC Express Devices . . . . . . . . . . . . . . . . . . . 280
Device Calibration Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 280
AO Series Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 281
C Series Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 282
Virtual Channel Calibration Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 283
DSA Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 283
E Series Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 284
FieldDAQ Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 286
M Series, NI 6010, NI 9204, NI 9205, NI 9206, and TS-15100 Calibration . . . . . . . 286
NI 6154 Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 287
NI 6614 Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 288
NI PXI-6608 Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 288
S Series Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 289
SC Express Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 289
SCXI-1600 Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 290
X Series Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 290
Signal Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 291
Device Calibration Signal Connections for AO Series Devices . . . . . . . . . . . 291
Device Calibration Signal Connections for E Series Devices . . . . . . . . . . . . . 292
Device Calibration Signal Connections for S Series Devices . . . . . . . . . . . . . 293
Device Calibration Signal Connections for M Series and NI 6010 Devices . . . . .
294
Device Calibration Signal Connections for the NI 6154 . . . . . . . . . . . . . . . . . 294
Device Calibration Signal Connections for NI 6614. . . . . . . . . . . . . . . . . . . . . 295
Device Calibration Signal Connections for X Series Devices . . . . . . . . . . . . . 295
Counters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 296
Averaging Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 296
C Series Counter Modules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 296
Connecting Counter Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 297

10 ni.com
 NI-DAQmx User Manual

Bus-Powered M Series Signal Connections for Counters . . . . . . . . . . . . . . . 298

C Series and TestScale Module Signal Connections for Counters . . . . . . . . 301
AO Series, E Series, and S Series Signal Connections for Counters. . . . . . . 305
myDAQ Signal Connections for Counters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 306
NI ELVIS II Family Signal Connections for Counters . . . . . . . . . . . . . . . . . . . . 307
NI mioDAQ Signal Connections for Counters . . . . . . . . . . . . . . . . . . . . . . . . . . 308
TIO Signal Connections for Counters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 309
X Series Signal Connections for Counters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 311
37-Pin DSUB Signal Connections for Counters . . . . . . . . . . . . . . . . . . . . . . . . 312
68-Pin M Series Signal Connections for Counters . . . . . . . . . . . . . . . . . . . . . . 313
Counter Internal Routing Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 315
AO Series, E Series, S Series Counter Internal Routing Diagram . . . . . . . . . 315
X Series Counter Internal Routing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . 315
Counter Internal Routing Diagrams for C Series Devices with NI cDAQ-91xx
Chassis and TestScale Modules with TestScale Chassis . . . . . . . . . . . . . . . . 317
NI 661x Counter Internal Routing Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 319
Counter Input Error Reporting with C Series, M Series USB, and NI ELVIS II
Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 319
Duplicate Count Prevention . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 320
Incomplete Sample Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 322
Prescaling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 323
Pulse Measurement Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 323
Sample Clock Timing Support for Time-Based Measurements . . . . . . . . . . . . . . . 324
Digital Filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 325
Digital Filtering Considerations for C Series Devices or or TestScale Modules . . 325
Digital Filtering Considerations for DIO Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . 328
Digital Filtering Considerations for TIO-Based Devices . . . . . . . . . . . . . . . . . . . . . . 329
Digital Filtering Considerations for X Series and NI 661x Devices . . . . . . . . . . . . . 331
Digital Filtering Considerations for SC Express Devices. . . . . . . . . . . . . . . . . . . . . . 333
FieldDAQ Filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 334
NI 9202, NI 9252, and NI 9253 Filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 334
Digital I/O . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 334
Change Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 334
Change Detection Considerations for NI 6527 Devices . . . . . . . . . . . . . . . . . 335
Change-Detection Considerations for C Series and M Series Devices . . . . 335
Digital I/O Considerations for C Series and TestScale Devices . . . . . . . . . . . . . . . . 335

© National Instruments 11
 NI-DAQmx User Manual

Sample Clock Timing for Digital I/O . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 336

Handshake Timing Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 338
Burst Handshaking Timing Defaults for NI 653x Devices . . . . . . . . . . . . . . . . . . . . . 339
Burst Handshake Timing for Digital I/O . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 340
Handshaking Line Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 340
Handshake Timing Defaults . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 340
Watchdog Timers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 341
Pause Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 342
Pause Trigger Considerations for AO Series Devices . . . . . . . . . . . . . . . . . . . . . . . . 342
Pause Trigger Considerations for C Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . 343
Pause Trigger Considerations for DSA Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 344
Pause Trigger Considerations for E Series and M Series Devices . . . . . . . . . . . . . . 344
Pause Trigger Considerations for S Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . 346
Pause Trigger Considerations for TIO Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 347
Pause Trigger Considerations for SC Express Devices . . . . . . . . . . . . . . . . . . . . . . . 348
Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 350
AO Series Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 351
C Series and TestScale Module Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . 352
CompactRIO Single-Board Controller Physical Channels . . . . . . . . . . . . . . . . . . . . 361
E Series Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 365
FieldDAQ Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 366
M Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 369
M Series Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 369
Bus-Powered M Series Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . 371
NI 6221 (37-Pin) Device Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . 375
NI 623x Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 377
myDAQ Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 380
NI 6010 Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 381
NI 6154 Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 383
NI 6533/6534 Device Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 385
NI 6535/6536/6537 Physical Channels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 386
NI ELVIS II Family Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 388
NI mioDAQ Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 391
S Series Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 392
SCXI and SCC Physical Channels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 393
SC Express Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 395

12 ni.com
 NI-DAQmx User Manual

SensorDAQ Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 396

TIO Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 397
USB DAQ Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 399
X Series Physical Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 401
Internal Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 404
C Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 404
DSA Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 408
E Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 410
FieldDAQ devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 412
M Series and NI 6010 Devices. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 412
NI ELVIS II Family . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 414
NI PXI-42xx . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 416
NI USB-TC01 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 417
S Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 417
SC Express Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 420
SCXI Internal Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 423
USB DAQ Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 424
X Series Multiplexed Sampling Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 424
X Series Simultaneous Sampling Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 427
Default Input/Output Terminal Configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 429
Terminal Configurations (Analog Input Ground Reference Settings) for Isolated
Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 431
Routing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 432
Routing Considerations for AO Series Devices. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 433
Routing Considerations for E Series and S Series Devices . . . . . . . . . . . . . . . . . . . 433
Routing Considerations for TIO Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 434
Switches . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 434
API Support for Switch Modules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 435
Switching Capacity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 452
Switching Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 453
Switching Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 453
Switching Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 453
Synchronization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 454
Synchronizing cDAQ Chassis and FieldDAQ Devices . . . . . . . . . . . . . . . . . . . . . . . . 454
Synchronizing DSA Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 454
Synchronizing DSA Devices with Multifunction DAQ Devices . . . . . . . . . . . . . . . . . 455

© National Instruments 13
 NI-DAQmx User Manual

Synchronizing X Series, M Series, and SC Express Devices . . . . . . . . . . . . . . . . . . . 455

Synchronizing E Series, S Series, and AO Series Devices. . . . . . . . . . . . . . . . . . . . . 456
PXI_CLK 10 with the NI 6608 and the NI 6614 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 456
Synchronization with M Series USB and NI ELVIS II Family Devices . . . . . . . . . . . 457
Supported Devices for Trigger Skew Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 457
Timing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 457
Timing Considerations for AO Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 458
Timing Considerations for C Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 458
Timing Considerations for DSA Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 464
Timing Considerations for E Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 464
Timing Considerations for FieldDAQ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 465
Hardware-Timed Non-Buffered Sample Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 466
Timing Considerations with NI ELVIS II Family and M Series USB Devices . . . . . 467
Non-Buffered Change Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 467
Timing Considerations for S Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 467
Timing Considerations for SC Express Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 469
Timing Considerations with Standalone NI CompactDAQ Systems . . . . . . . . . . . 470
Sample Rate Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 470
Sample Clock-Timed Pulse Train Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 471
Device-Specific Sampling Methods . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 471
Timing Considerations for X Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 472
Timestamps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 472
Using Wait for Valid Timestamp VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 474
First Sample Timestamp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 474
Configurable ADC Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 474
Configurable Timing for SC Express Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 475
Multiple Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 475
NI 4302, 4303, 4304, 4305 Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 476
NI 4339, 4463, 4464 Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 477
NI 4340 Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 478
NI 4466 and 4467 Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 479
NI 4480, 4481 Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 480
NI 6533, 6534 Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 481
cDAQ-91xx and TestScale Chassis Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . 482
CompactRIO Timing Engines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 483
DSA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 485

14 ni.com
 NI-DAQmx User Manual

Alias Rejection (DSA, C Series, and NI 433x) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 485

Alias Rejection at Low Sample Rates (DSA, C Series, and NI 4330/1) . . . . . 485
Enhanced Alias Rejection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 486
Channel Order . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 487
DSA, C Series, and the DAQmx I/O Server . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 487
Filter Delay Removal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 487
Filter Delay (DSA, C Series, and NI 433x) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 488
Gain for DSA Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 488
Hardware Data Compression (DSA and NI 433x) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 489
Integrated Electronic Piezoelectric Excitation (IEPE) . . . . . . . . . . . . . . . . . . . . . . . . 489
Input Coupling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 490
Overload Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 491
Simultaneous Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 492
NI 4302, 4303, 4304, 4305 Simultaneous Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 493
NI 4339, 4463, and 4464 Simultaneous Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 493
NI 4340 Simultaneous Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 494
NI 4480 and 4481 Simultaneous Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 494
NI 6533/6534 Simultaneous Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 494
CompactDAQ, CompactRIO, and TestScale Simultaneous Tasks . . . . . . . . . . . . . 494
Multidevice Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 499
C Series Multidevice Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 499
DSA, SC Express, and X Series Multidevice Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . 501
FieldDAQ Multidevice Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 504
S Series Multidevice Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 504
Bridge Measurement Type Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 505
C Series Device Groupings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 505
Common-Mode Over-Range Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 507
Connecting Analog Voltage Input Signals for Isolated Devices . . . . . . . . . . . . . . . . . . . . 508
CompactRIO Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 509
Devices That Support Multi-Counter Tasks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 513
Digital AI Filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 513
Excitation Fault Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 514
External Overvoltage Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 515
External Reference Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 516
FD-11637 Signal Conditioning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 516
Initialized States for Terminals and Output Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . 517

© National Instruments 15
 NI-DAQmx User Manual

Input Limits Fault Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 517

Internal PLL Unlock Status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 518
NI 9775 Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 518
NI USB-TC01 Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 521
Open Channel Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 521
Open Current Loop Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 522
Open Thermocouple Detection (OTD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 523
Overcurrent Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 524
Overtemperature Detection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 525
Remote and Local Sensing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 525
Power Supply and Power Channel Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 525
Power Supply Fault Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 528
Push-Pull and Open Collector Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 529
Querying Device Capabilities with C Series Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 529
Reading Available Samples on USB or Ethernet DAQ. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 529
RTSI Triggering with M Series USB and NI ELVIS II Family Devices . . . . . . . . . . . . . . . . . 530
SC Express Smart Accessory Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 530
SCC Signal Conditioning Device Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 530
Self-Powered Compared to Bus-Powered USB Devices . . . . . . . . . . . . . . . . . . . . . . . . . . 532
Setting Power-Up States for M Series, NI 670x, and Software-Timed Digital I/O Devices .
532
Supported Device ID Numbers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 533
Sync Lock Lost Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 554
Taking Custom Voltage Measurements with the PXIe-4339 . . . . . . . . . . . . . . . . . . . . . . . 555
Time-Based Features for Network-Synchronized Devices . . . . . . . . . . . . . . . . . . . . . . . . 556
Using Chopping to Remove Offset Voltages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 557
Using the RM-4339 with the PXIe-4339 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 557
X Series Device Groupings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 558
Measurement Fundamentals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 560
Measurement System Overview—Hardware and NI-DAQmx . . . . . . . . . . . . . . . . . . . . . . 560
Signal Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 562
Analog Connection Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 562
Connecting Analog Input Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 562
Floating Signal Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 563
Grounded Signal Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 564
Measurement System Types and Signal Sources . . . . . . . . . . . . . . . . . 565

16 ni.com
 NI-DAQmx User Manual

Differential Measurement System . . . . . . . . . . . . . . . . . . . . . . . . . 567

Rejecting Common-Mode Voltages . . . . . . . . . . . . . . . . . . . 568
Referenced and Nonreferenced Single-Ended Measurement
Systems. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 569
Pseudodifferential Measurement System . . . . . . . . . . . . . . . . . . . 570
Connecting Analog Output Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 571
Sampling Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 571
Device Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 572
Input Limits (Maximum and Minimum Values) . . . . . . . . . . . . . . . . . . . 573
Sampling Rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 574
Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 574
Calculating the Smallest Detectable Change—Code Width . . . . . . . . 575
Digital Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 577
Connecting Digital I/O Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 578
Counters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 578
Digital Logic States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 579
Duty Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 579
Signal Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 580
Filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 580
Windowing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 581
Signal Conditioning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 582
Amplification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 582
Linearization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 583
Transducer Excitation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 583
Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 584
Common Sensors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 584
2-Wire Resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 584
3-Wire Resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 585
4-Wire Resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 586
Bridge-Based Sensors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 587
Bridge Measurement Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 587
Bridge Sensor Scaling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 588
Bridge Configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 589
Signal Conditioning Requirements for Bridge-Based Sensors. . . . . . . . . . . 589
Bridge Completion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 590
Signal Amplification. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 590

© National Instruments 17
 NI-DAQmx User Manual

Bridge Excitation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 591

Bridge-Based Sensor Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 592
Offset Nulling (Bridge Balancing) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 592
Shunt Calibration (Gain Adjustment) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 593
Bridge-Based Force, Pressure, and Torque Sensors . . . . . . . . . . . . . . . . . . . . 593
Bridge Scaling Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 594
Strain Gages. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 595
Strain Gage Bridge Configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 596
Quarter-Bridge Type I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 597
Quarter-Bridge Type II . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 598
Half-Bridge Type I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 600
Half-Bridge Type II . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 602
Full-Bridge Type I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 604
Full-Bridge Type II . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 606
Full-Bridge Type III . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 607
Strain Rosette . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 609
Eddy Current Proximity Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 610
Encoders . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 611
Quadrature Encoders . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 612
Two-Pulse Encoders . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 613
Z Indexing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 613
IEPE and Charge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 613
Accelerometers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 614
Force Sensors (Piezoelectric). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 615
Microphones . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 616
Velocity Transducers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 617
Overview of Temperature Sensor Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 618
RTDs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 618
Platinum RTD Types. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 619
Callendar-Van Dusen Equation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 621
Thermistors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 621
Signal Conditioning Requirements for Thermistors and RTDs . . . . . 622
Thermocouples. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 623
Signal Conditioning Requirements for Thermocouples . . . . . . . . . . . 624
LVDTs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 625
RVDTs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 627

18 ni.com
 NI-DAQmx User Manual

TEDS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 627
Writing Data to TEDS Sensors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 628
Control Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 628
Proportional-Integral-Derivative (PID) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 629
Real Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 630
Loop Cycle Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 630
Jitter Overview for Control Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 630
Event Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 631

© National Instruments 19
 NI-DAQmx User Manual

NI-DAQmx User Manual

The NI-DAQmx User Manual provides detailed descriptions of the product functionality
and the step by step processes for use.

Looking for Something Else?

For information not found in the User Manual for your product, such as specifications
and API reference, browse Related Information.

Related information:

• Download NI-DAQmx
• NI-DAQmx Release Notes
• License Setup and Activation
• Dimensional Drawings
• Product Certifications
• Letter of Volatility
• Discussion Forums
• NI Learning Center
• NI-DAQmx LabVIEW API Reference
• NI-DAQmx Properties Reference

20 ni.com
 New Features and Changes

New Features and Changes

Learn about updates—including new features and behavior changes—introduced in
each version of the NI-DAQmx.

NI-DAQmx 2024 Q3.1 Changes

Learn about new features, behavior changes, and other updates in NI-DAQmx 2024
Q3.1.

New Features
Added support for the following NI mioDAQ devices.

• USB-6421
• USB-6423
• USB-6451
• USB-6453

NI-DAQmx 2024 Q3 Changes

Learn about new features, behavior changes, and other updates in NI-DAQmx 2024 Q3.

Behavior Changes
• Support for VB6 has been removed.

NI-DAQmx 2024 Q2 Changes

Learn about new features, behavior changes, and other updates in NI-DAQmx 2024 Q2.

Behavior Changes
NI-DAQmx support for VB6 is expected to be removed in NI-DAQmx 2024 Q3. NI-DAQmx
2024 Q2 will be the last release to support VB6.

© National Instruments 21
 New Features and Changes

NI-DAQmx 2022 Q4 Changes

Learn about new features, behavior changes, and other updates in DAQmx 2022 Q4.

New Features
Support has been added for the following devices:

• TS-15050 DIO P0
• TS-15100
• TS-15110
• TS-15120
• TS-15130
• TS-15200

22 ni.com
 NI-DAQmx Overview

NI-DAQmx Overview
What is DAQmx?
NI-DAQmx is the driver software you use to communicate with and control your NI data
acquisition (DAQ) devices. It includes an extensive library of functions and VIs you can
call from your application software, such as LabVIEW or LabWindows/CVI, to program
your devices.

For information on getting started, refer to Getting Started with NI-DAQmx. Refer to
Device Support in NI-DAQmx in the NI-DAQmx Readme for a list of devices supported in
NI-DAQmx.

What is Measurement & Automation Explorer (MAX)?

MAX is an application that automatically installs with the NI-DAQmx driver. MAX
informs other programs which devices you have in your system and how they are
configured. With MAX, you can:

• Configure your NI hardware and software

• Create and edit channels, tasks, interfaces, scales, and virtual instruments
• Execute system diagnostics
• View devices and instruments connected to your system
• Update your NI software

For more information, refer to the Measurement & Automation Explorer Help for NI-
DAQmx or Getting Started.

What is DAQ Assistant?

The DAQ Assistant is an application that automatically installs with the NI-DAQmx
driver. You can launch the DAQ Assistant from MAX, or from your NI application
software such as LabVIEW, SignalExpress, LabWindows/CVI, or Measurement Studio.
With DAQ Assistant you can:

• Create and edit tasks and virtual channels

© National Instruments 23
 NI-DAQmx Overview

• Add virtual channels to tasks

• Create and edit scales
• Test your configuration
• Save your configuration
• Generate code in your NI application software for use in your application
• View connection diagrams for your sensors

For more information, refer to the DAQ Assistant Help or Getting Started.

How does DAQmx Work Together with Other Applications and

Text Based Programming Environments?
DAQmx has an application programming interface (API), which is a library of VIs,
functions, classes, attributes, and properties for creating applications for your device.
For information on getting started, refer to Getting Started. For a brief description of
using DAQmx with these applications, refer to the following topics.

• LabVIEW
• LabWindows/CVI
• Measurement Studio with Visual C++, Visual C#, or Visual Basic .NET
• ANSI C Application without LabWindows/CVI
• .NET Application without Measurement Studio
• SignalExpress

Related concepts:

• Getting Started with NI-DAQmx

• LabVIEW
• Creating an Application with LabWindows/CVI
• Measurement Studio with Visual C++, Visual C#, or Visual Basic .NET
• ANSI C Application without LabWindows/CVI
• Creating a .NET Application without Measurement Studio
• SignalExpress
• Finding Examples
• Troubleshooting

Related information:

24 ni.com
 NI-DAQmx Overview

• Using the DAQ Assistant in Measurement Studio

LabVIEW
If you program your NI-DAQmx-supported device in LabVIEW, you can interactively
create virtual channels—both global and local—and tasks by launching the DAQ
Assistant from MAX or from within LabVIEW. You also can create local virtual channels
and tasks, and write your own applications using the NI-DAQmx API.

To learn about which NI-DAQmx VIs are most commonly used when creating a NI-
DAQmx data acquisition application, see Learn 10 Functions in NI-DAQmx and Handle
80% of your Data Acquisition Applications.

For help with NI-DAQmx VIs, refer to DAQmx - Data Acquisition VIs and Functions.

For general help with programming in LabVIEW, refer to LabVIEW Help.

For help with using the DAQ Assistant with LabVIEW, refer to Using the DAQ Assistant to
Automatically Generate LabVIEW Code.

Creating an Application with LabWindows/CVI

If you program your NI-DAQmx-supported device in LabWindows/CVI, you can
interactively create global or local virtual channels and tasks by launching the DAQ
Assistant from MAX or from within LabWindows/CVI. You can generate the
configuration code based on your task or channel in LabWindows/CVI. Refer to the
DAQ Assistant Help for additional information about generating code. You also can
create local virtual channels and tasks, and write your own applications using the NI-
DAQmx API.

For help with NI-DAQmx functions, refer to NI-DAQmx C Function Reference Help. For
general help with programming in LabWindows/CVI, refer to LabWindows/CVI Help,
accessible through Start»All Programs»National Instruments»LabWindows
CVI»LabWindows CVI Help.

For help with using the DAQ Assistant with LabWindows/CVI, refer to Using the DAQ
Assistant in NI LabWindows/CVI.

© National Instruments 25
 NI-DAQmx Overview

Related information:

• Using the DAQ Assistant in NI LabWindows™/CVI™

Measurement Studio with Visual C++, Visual C#, or Visual

Basic .NET
If you program your NI-DAQmx-supported device in Measurement Studio using Visual
C++, Visual C#, or Visual Basic .NET, you can interactively create channels and tasks by
launching the DAQ Assistant from MAX or from within Visual Studio .NET. You can
generate the configuration code based on your task or channel in Measurement
Studio. Refer to the DAQ Assistant Help for additional information about generating
code. You also can create channels and tasks, and write your own applications in your
ADE using the NI-DAQmx API.

For help with NI-DAQmx methods and properties, refer to the NI-DAQmx .NET Class
Library or the NI-DAQmx Visual C++ Class Library included in the NI Measurement
Studio Help. For general help with programming in Measurement Studio, refer to the
NI Measurement Studio Help, which is fully integrated with the Microsoft Visual Studio
.NET help. To view this help file in Visual Studio. NET, select Measurement Studio»NI
Measurement Studio Help.

For help with using the DAQ Assistant with Measurement Studio, refer to Using the DAQ
Assistant in Measurement Studio.

Related information:

• Using the DAQ Assistant in Measurement Studio

ANSI C Application without LabWindows/CVI

NI-DAQmx has a C API that you can use to create applications. To create an application,
follow these general steps:

1. Create a new project.

2. Open existing or new source files (.c), and add them to the project. Make sure you

26 ni.com
 NI-DAQmx Overview

include the NI-DAQmx header file, nidaqmx.h, in your source code files. You can
find this header file at NI-DAQ\DAQmx ANSI C Dev\include.
3. Add the NI-DAQmx import library, nidaqmx.lib, to the project. The import
library files are located under NI-DAQ\DAQmx ANSI C Dev\lib\.
4. To view examples of NI-DAQmx applications, go to the NI-DAQ\Examples\
DAQmx ANSI C directory.
5. Build your application.

For help with NI-DAQmx functions, refer to the NI-DAQmx C Reference Help, which is
installed by default at Start»All Programs»National Instruments»NI-DAQ»Text-Based
Code Support»NI-DAQmx C Reference Help.

For help with using the DAQ Assistant with ANSI C, refer to Using NI-DAQmx in Text
Based Programming Environments.

Creating a .NET Application without Measurement

Studio
With the Microsoft .NET Framework version 1.1 or later, you can use NI-DAQmx to
create applications using Visual C# and Visual Basic .NET without Measurement Studio.
You need at least Microsoft Visual Studio .NET 2003 or Microsoft Visual Studio 2005 for
the API documentation to be installed.

The installed documentation contains the NI-DAQmx API overview, measurement tasks
and concepts, and function reference. This help is fully integrated into the Visual
Studio .NET documentation. To view the NI-DAQmx .NET documentation, go to
Start»All Programs»National Instruments»NI-DAQ»NI-DAQmx .NET Reference Help.
Expand NI Measurement Studio Help»Measurement Studio Support for NI-DAQmx
Overview» NI-DAQmx .NET class library to view the function reference. Expand NI
Measurement Studio Help»NI Measurement Studio .NET Class Library»Using the
Measurement Studio .NET Class Libraries to view conceptual topics for using NI-
DAQmx with Visual C# and Visual Basic .NET.

To get to the same help topics from within Visual Studio, go to Help»Contents. Select
Measurement Studio from the Filtered By drop-down list and follow the previous
instructions.

© National Instruments 27
 NI-DAQmx Overview

For help with using the DAQ Assistant with Visual Studio .NET, refer to Using NI-DAQmx
in Text Based Programming Environments.

SignalExpress
If you use your NI-DAQmx-supported device in SignalExpress, you can create a project
that includes NI-DAQmx steps. With SignalExpress, you can log and analyze data. You
can also add global virtual channels that you created in MAX to your NI-DAQmx steps in
SignalExpress. Refer to the DAQ Assistant Help for additional information.

For help with using the DAQ Assistant with SignalExpress, refer to Taking an NI-DAQmx
Measurement in SignalExpress. For general help with programming in SignalExpress,
refer to SignalExpress Help.

Related information:

• Using the DAQ Assistant in Measurement Studio

28 ni.com
 Getting Started with NI-DAQmx

Getting Started with NI-DAQmx

The National Instruments Getting Started with NI-DAQmx Series on ni.com is aimed at
helping you learn NI-DAQmx programming fundamentals. Through video and text
tutorials, this series will take you from verifying your device's operation in
Measurement & Automation Explorer (MAX) to programming data acquisition
applications using LabVIEW. It is intended for both the beginner who wants to learn
how to use the DAQ Assistant, as well as the experienced user who wishes to take
advantage of advanced NI-DAQmx functionality.

Go to Getting Started with NI-DAQmx: Main Page on ni.com.

The series includes:

• NI-DAQmx Frequently Asked Questions

• NI-DAQmx Software and Hardware Installation
• Basic Programming with NI-DAQmx
• Advanced Programming with NI-DAQmx

Related concepts:

• NI-DAQmx Overview
• Finding Examples
• Troubleshooting

Finding Examples
Each API includes a collection of programming examples to help you get started
developing an application. You can modify example code and save it in an application.
You can use examples to develop a new application or add example code to an existing
application.

To run examples without hardware installed, you can use an NI-DAQmx simulated
device. In MAX, refer to the Measurement & Automation Explorer Help for NI-DAQmx by
selecting Help»Help Topics» NI-DAQmx for information on NI-DAQmx simulated
devices.

© National Instruments 29
 Getting Started with NI-DAQmx

To find the locations of examples for your software application, refer to the following
table.

Software Application Example Location

LabVIEW or LabWindows/CVI Help»Find Examples
Program Files\National Instruments\
SignalExpress
SignalExpress\Examples
ANSI C *...NI-DAQ\Examples\DAQmx ANSI C
MFC 7.0 C++ *...NI-DAQ\Examples\MStudioVC2003
Visual Basic .NET and C# for Visual
*...NI-DAQ\Examples\DotNET1.1
Studio 2003
MFC 8.0 C++ *...NI-DAQ\Examples\MStudioVC2005
MFC 9.0 C++ *...NI-DAQ\Examples\MStudioVC2008
Visual Basic .NET and C# for Visual
*...NI-DAQ\Examples\DotNET2.0
Studio 2005
Visual Basic .NET and C# for Visual
*...NI-DAQ\Examples\DotNET3.5
Studio 2008

Note * For Windows, the default path is <drive>:\Users\Public\

Public Documents\National Instruments\NI-DAQ\
Examples\... .

Note Visual Studio 2003 and later do not require Measurement Studio.

Troubleshooting
Installation and Configuration

Refer to the DAQ Getting Started Guide for general installation and configuration
instructions.

Use the following resources if you have problems installing your DAQ hardware and/or
software:

30 ni.com
 Getting Started with NI-DAQmx

• Refer to NI DAQ Setup and Support on ni.com for information on getting started
with NI DAQ, support, drivers and code, and other resources.
• Refer to ni.com/kb for documents on troubleshooting common installation and
programming problems and for answering frequently asked questions about NI
products.
• If you think you have damaged your device and need to return your NI hardware
for repair or calibration, refer to sending a NI board in for repair or calibration.

For LabWindows/CVI users, if the Data Acquisition function panel is disabled, you may
need to uninstall NI-DAQmx and reinstall it, making sure that you add support for
LabWindows/CVI. If you have installed LabWindows/CVI support and Data Acquisition
is still dimmed, select Library»Customize. In the Customize Library Menu dialog box,
check Data Acquisition, and restart LabWindows/CVI. You might also need to verify
that the dataacq.lib is in the bin directory.

Programming

To help you get started programming, you can use the shipping examples for your ADE.

You can also visit NI's extensive library of technical support resources at ni.com/
support.

You can interactively configure global virtual channels and tasks with the DAQ
Assistant. For NI application software such as LabVIEW, you can use the DAQ Assistant
to generate code.

You can use NI I/O Trace to analyze the functions you have called in the API with NI
application software. With NI I/O Trace, you can watch the order of execution of the
application and locate errors as they happen.

Note I/O Trace is not supported by the NI-DAQmx .NET API.

Finally, the NI-DAQmx Help contains programming flowcharts for common

applications such as measuring temperature, current, strain, position, and
acceleration.

© National Instruments 31
 Getting Started with NI-DAQmx

External Connections

In addition to the information on making signal connections in this help file, the
Connection Diagram tab in the DAQ Assistant within MAX shows you how to connect
signals.

Calibration

• For information on externally calibrating your device, including step-by-step

calibration procedures, refer to ni.com/calibration.
• For an overview of calibration, including the difference between self-calibration
and external calibration, refer to Device Calibration.
• For device-specific information required for calibration with NI-DAQmx, refer to
Device-Specific Calibration.
• For information on channel calibration, refer to What Is Channel Calibration?

CPU Usage

NI-DAQmx tasks use 100% of the CPU if no other processes are running. However, as
soon as another process requires the CPU, the NI-DAQmx task yields to that process.

Related concepts:

• Finding Examples

32 ni.com
 Common Applications

Common Applications
Measuring Acceleration
Acceleration is a change in velocity with respect to time. An accelerometer is a
transducer that represents acceleration as a voltage. Accelerometers also can measure
vibration and shock. Accelerometers typically convert acceleration measured in g's to
voltage. For example, a sensor with a rated output of 10 mV/g should produce 50 mV
when subjected to 5 g of acceleration.

Related concepts:

• Measuring Acceleration Programming Flowchart

• Finding Examples

Measuring Acceleration Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure acceleration. Alternatively, you can configure a task for measuring
acceleration using the DAQ Assistant.

© National Instruments 33
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring acceleration is an example of an analog input measurement. Refer to

Analog Input Programming Flowcharts for additional flowcharts that can help you
create an application.

Related concepts:

• Analog Input Programming Flowcharts

Measuring Analog Frequency

Some devices can measure analog frequency directly using frequency-to-voltage
circuitry. Many devices, however, only measure voltage, and you must use software
algorithms to convert those measurements to frequency.

Devices that measure analog frequency, such as DSA devices and the SCXI-1126, have

34 ni.com
 Common Applications

circuitry that produces triggers of the same frequency as the measured signal. Every
time the signal passes from threshold level minus hysteresis to threshold level, a
trigger occurs. A pulse generator uses these triggers and produces a pulse once every
frequency cycle. The input frequency range sets the width of this pulse. As the input
frequency range increases, the pulse width grows smaller. This pulse train is then
converted to a DC signal that has a level proportional to the duty cycle of the pulse
train. The duty cycle is the fraction of a period of the pulse train when the pulse is
occurring. The DC signal has a voltage that is proportional to the input frequency and
can therefore be scaled to that frequency value.

For devices that cannot measure frequency directly, you need to use software
algorithms, such as the Fast Fourier Transform (FFT), to convert voltage to frequency.
LabVIEW Full and Professional Development Systems contains advanced analysis VIs
that handle these transformations. The LabWindows™/CVI™ full development system
also contains advanced analysis functions to help you measure analog frequency.
Regardless of whether you use existing VIs or functions or create your own, you need to
sample at least twice as fast as the highest frequency component in the signal you are
acquiring.

Analog Frequency, Sample Rate, and the Nyquist Theorem

The Nyquist Theorem states that the highest frequency you can accurately represent is
half the sampling rate. For instance, to measure the frequency of a 100 Hz signal, you
need a sampling rate of at least 200 S/s. In practice, you should use sampling rates of 5
to 10 times the expected frequencies to improve accuracy of measurements.

In addition to sample rate, you need to determine the number of samples to acquire.
You must sample a minimum of three cycles of the analog signal. For example, you
need to collect at least 15 samples, or points, if you use a sampling rate of 500 S/s to
measure the frequency of a 100 Hz signal. Because you sample about five times faster
than the signal frequency, you sample about five points per cycle of the signal. You
need data from three cycles, so 5 points x 3 cycles = 15 points. In practice, however,
you should acquire 10 or more cycles to improve accuracy of measurements, so you
should acquire 50 or more samples.

The number of points you collect determines the number of frequency bins that the
samples fall into. The size of each bin is the sampling rate divided by the number of
points you collect. For example, if you sample at 500 S/s and collect 100 points, you

© National Instruments 35
 Common Applications

have bins at 5 Hz intervals.

The Nyquist frequency is the bandwidth of the sampled signal and is equal to half the
sampling frequency. Frequency components below the Nyquist frequency appear
normally. Frequency components above the Nyquist frequency appear aliased
between 0 and the Nyquist frequency. The aliased component is the absolute value of
the difference between the actual component and the closest integer multiple of the
sampling rate. For example, if you have a signal with a component at 800 Hz and you
sample at 500 S/s, that component appears aliased at 200 Hz because |800–(2 x 500)| =
200(Hz).

One way to eliminate aliased components is to use an analog hardware filter before
you digitize and analyze the frequency information. If you want to perform all the
filtering in software, you must first sample at a rate fast enough to correctly represent
the highest frequency component the signal contains. For example, with the highest
component at 800 Hz, the minimum sampling rate is 1,600 Hz, but you should sample
5 to 10 times faster than 800 Hz. If the frequency you want to measure is around 100
Hz, you can use a lowpass Butterworth filter with a cutoff frequency (fc) of 250 Hz to
filter out frequencies above 250 Hz and pass frequencies below 250 Hz.

Note LabVIEW includes Butterworth filters with the LabVIEW Full and
Professional Development Systems.

Measuring Frequency with Filtering

The following figure shows a lowpass filter.

Lowpass Filter

The Ideal Filter in the figure is optimal. All frequencies above the Nyquist frequency are

36 ni.com
 Common Applications

rejected. The Real Filter in the figure is what you might actually be able to accomplish
with a Butterworth filter. The passband is where Vout/Vin is close to 1. The stopband
occurs where Vout/Vin is close to 0. The frequencies gradually attenuate on the
transition region between 1 and 0.

Related concepts:

• Measuring Analog Frequency Programming Flowchart

• Finding Examples

Measuring Analog Frequency Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure analog frequency. Alternatively, you can configure a task for measuring
analog frequency using the DAQ Assistant.

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring frequency is an example of analog input measurement. Refer to Analog

© National Instruments 37
 Common Applications

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

Hysteresis with Analog Frequency Measurements

For waveform repetitions, hysteresis adds a window below the threshold level.
Hysteresis is typically used to avoid erroneous measurements due to noise or jitter in
the signal. The signal must drop below the threshold level minus the hysteresis before
NI-DAQmx recognizes a waveform repetition at the threshold level.

Measuring Angular Displacement

Angular displacement is movement around an axis, such as the angular motion of the
shaft of a motor. An angular displacement sensor is a device whose output signal
represents the rotation of the shaft; it cannot measure the physical displacement of
the whole shaft. One type of sensor used to measure angular displacement is a rotary
variable differential transformer (RVDT). Another type of sensor used to measure
angular displacement is a resolver, which is a rotating transformer that can measure
360° of rotation.

On M Series devices, C Series devices, and NI-TIO-based devices, you can use the
counters to perform displacement measurements with quadrature encoders, or
angular encoders. You can measure angular position with X1, X2, and X4 angular
encoders. You can choose to do either a single-point or a buffered sample clock
displacement measurement.

You also can measure velocity with angular encoders, but you need to use a sample
clock with a fixed frequency. To measure velocity, use the following formula:

38 ni.com
 Common Applications

V = D/T

where V is the average velocity, D is the distance, and T is time.

The counter measures the position of the encoder using the A and B signals, which are
offset by 90°. The counter also supports the Z index, which provides a precise reference
point and is available on some encoders.

Related concepts:

• Measuring Position with an RVDT or LVDT Programming Flowchart

• Measuring Position with Encoders Programming Flowchart
• Finding Examples

Measuring Position with Encoders Programming Flowchart

The following flowchart depicts the main steps you must complete for measuring
position with an encoder in an NI-DAQmx application. If you prefer, you can configure a
task using the DAQ Assistant.

© National Instruments 39
 Common Applications

Measuring position with an encoder is an example of a counter measurement. Refer to

Counter Programming Flowcharts for additional flowcharts that can help you create
an application.

Related concepts:

• Counter Programming Flowcharts

Measuring Position with an RVDT or LVDT Programming

Flowchart
The following flowchart depicts the main steps required in an NI-DAQmx application to
measure position with an RVDT or LVDT. Alternatively, you can configure a task for
measuring position using the DAQ Assistant.

40 ni.com
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring position is an example of an analog input measurement. Refer to Analog

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

© National Instruments 41
 Common Applications

Control
You can create an event response or control loop application in any operating system
supported by NI-DAQmx. However, your application can only be deterministic if you
have the LabVIEW Real-Time module and use your application on a real-time
controller. This section assumes that you are using LabVIEW with NI-DAQmx to create a
control application. It does not assume that you have the LabVIEW Real-Time module
or the real-time controller.

Related concepts:

• Control Loops

Event Response
In a control application, an event is the same as an occurrence. This occurrence leads
to an action, or a response. An example is monitoring the temperature of an engine.
When the temperature rises too high, the engine slows down. The event, in this case,
would be the temperature rising above a predetermined level, and the response would
be the engine slowing down. Another example comes from manufacturing. In a
manufacturing line, a system senses when a part is in front of a station (the event) and
takes a reading or manipulates the part (the response). If the system does not sense
and respond to the presence of that part in a set amount of time, the manufacturing
line creates defective parts.

When creating an event response application, make sure you consider the amount of
time needed to respond to the event. For example, if the device controls the
temperature of your home, the time to react to events (changes in temperature) is less
critical than if the device controls a nuclear reactor. If the application is not time
critical, the application does not need to be deterministic, meaning that you do not
need the LabVIEW Real-Time Module or a real-time controller.

The relative priority of the task is important as well. Because LabVIEW is multi-
threaded, you can separate the application into tasks, each with its own priority. By
setting priorities, time-critical tasks can take precedence over non-time-critical tasks.
The time-critical task must periodically yield processor resources to the lower-priority
tasks so they can execute. By properly separating the time-critical task from lower

42 ni.com
 Common Applications

priority tasks, you can reduce application jitter. Refer to the LabVIEW Real-Time
Module Concepts book in the LabVIEW Help for more information about assigning
priorities to tasks.

Related concepts:

• Finding Examples

Control Loops
A control application monitors and controls a system. The application continuously
loops by reading samples, processing data, and adjusting the output. You can use NI-
DAQmx and DAQ devices to create a control application. With the LabVIEW Real-Time
Module, you can create deterministic control applications.

Creating a Control Loop Application with NI-DAQmx

The following block diagram shows a typical deterministic control loop application.
First, an analog value is read. This value corresponds to the process variable. This
value is compared to the set point, which is specified in the Ctrl Algrthm VI in the
diagram, and adjusted as necessary within the while loop, possibly using a PID
algorithm. The adjusted value is then written. This value corresponds to the actuator
output.

In the block diagram, the sampling rates are the same for analog input and output.
Because the example shown assumes a single DAQ device, the Start Trigger
synchronizes the analog input and analog output tasks. For multiple devices,
synchronization works differently. Refer to Synchronization for more information.
Notice also that the slave task—the analog output task—starts before the analog input
task. Finally, within the loop, the Wait for Next Sample Clock VI checks to make sure
that the loop executes within the specified sampling rate. If it does not, this VI returns
an error.

© National Instruments 43
 Common Applications

Related concepts:

• Finding Examples

Edge Counting
Edge counting is when a device counts rising or falling edges using a counter channel.
You can choose to do either single point or buffered sample clock edge counting.

The following figure shows an example of edge counting in which the counter in a
device counts five edges on the input terminal.

With buffered edge counting, the device latches the number of edges counted onto
each active edge of the sample clock and stores the number in the buffer. There is no
built-in clock for buffered edge counting, so you must supply an external sample clock.

44 ni.com
 Common Applications

In NI-DAQmx, when doing on-demand edge counting, you first arm the counter by
calling the Start function/VI. Each subsequent read returns the number of edges
counted since the counter was started. If you perform multiple reads without first
starting the counter, the counter implicitly starts and stops with each Read function/VI
call, and the number of counted edges is not cumulative between read calls.

On devices that support gate configuration along with timing engine pause triggering,
use the CI.CountEdges.Gate.Enable attribute/property to enable gate functionality.

With the exception of the NI 9361, you also can pause counting with on-demand edge
counting in NI-DAQmx by configuring a pause trigger. To configure a pause trigger, use
the trigger attributes/properties to set the source terminal of the digital trigger as well
as the level on which to pause.

Related concepts:

• Edge Counting Programming Flowchart

• Finding Examples

Edge Counting Programming Flowchart

The following flowchart depicts the main steps you must complete for counting edges
in an NI-DAQmx application. If you prefer, you can configure a task for counting edges
using the DAQ Assistant.

© National Instruments 45
 Common Applications

Edge counting is an example of a counter measurement. Refer to Counter

Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Counter Programming Flowcharts

Measuring Charge
Electrical charge is a fundamental property of matter. Charge is a measurement of the
net effect of protons and electrons being unequally distributed. Piezoelectric
transducers produce a charge from physical stress, deformation, acceleration, or force.
Charge is measured in coulombs.

Related concepts:

• Measuring Charge Programming Flowchart

• Finding Examples

46 ni.com
 Common Applications

Measuring Charge Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure charge. Alternatively, you can configure a task for measuring charge using the
DAQ Assistant.

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

You can use charge sensors to measure physical phenomenon such as acceleration
and sound pressure with charge mode accelerometers and microphones. These
measurements can be converted from coulombs to the appropriate engineering units
using custom scales.

Measuring charge is an example of analog input measurement. Refer to Analog Input

Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

© National Instruments 47
 Common Applications

Measuring and Generating Current

Many measurement devices can measure and generate current. To measure or
generate current with a DAQ device, you need a resistor. Current then can be measured
through an analog input connector or generated through an analog output connector.
The resistance must be placed in parallel with the connector and the current source. To
measure voltage dropped across the resistor and convert it to current, use Ohm's Law.

I(A) = V(V)/ R(Ω)

where I is the current, V is the voltage, and R is the resistance.

4 to 20 mA Loops

4 to 20 milliamp (4-20 mA) loops are commonly used in measurement systems. 4-20
mA loops couple a dynamic range with a live zero of 4 mA for open circuit detection in
a system that does not produce sparks. Other advantages include a variety of
compatible hardware, a long operating range, and low cost. 4-20 mA loops have a
variety of uses, including digital communications, control applications, and reading
remote sensors.

The purpose of the 4-20 mA current loop is for the sensor to transmit a signal in the
form of a current. In the following figure, the Level Sensor and Remote Sensor
Electronics are typically built into a single unit. An external 24 VDC supply powers the
sensor. The sensor regulates the current, which represents the value of what the
sensor measures, in this case, the fluid level in a tank.

Current Loop Wiring

The DAQ device reads the voltage drop across the 249 Ω resistor Rp, using Ohm's Law.

48 ni.com
 Common Applications

Because the current is 4-20 mA and Rp is 249 Ω, V ranges from 0.996 V to 4.98 V, which
is within the range that DAQ devices can read. Although the equation is useful for
calculating the current, the current typically represents a physical quantity you want
to measure. In the following figure, the tank level measures 0 to 50 feet. 4 mA
represents 0 feet, and 20 mA represents 50 feet. L is the tank level, and I is the current.

Linear Relationship between Tank Level and Current

Using the Ohm's Law equation and substituting 0.249 for the value of Rp, you can
derive L in terms of measured voltage:

Related concepts:

• Measuring Current Programming Flowchart

• Generating Current Programming Flowchart
• Finding Examples
• Tips on Measuring AC Current

Measuring Current Programming Flowchart

The following flowchart illustrates the main steps required in an NI-DAQmx application
to measure current. Alternatively, you can configure a task for measuring current using
the DAQ Assistant.

© National Instruments 49
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring current is an example of an analog input measurement. Refer to Analog

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

Tips on Measuring AC Current

To measure AC current, insert a precisely calibrated, low-value resistor into the signal
path and measure the voltage drop across the resistor. You must then perform high-
pass filtering on the resulting signal to remove the DC component. You can perform
this filtering using an analog filter or digital signal processing techniques, such as the
filtering tools in the analysis library of LabVIEW.

50 ni.com
 Common Applications

Generating Current Programming Flowchart

The following flowchart illustrates the main steps required in an NI-DAQmx application
to generate current. Alternatively, you can configure a task for generating current using
the DAQ Assistant.

Tip To increase performance, especially when multiple samples are written,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just after you write
samples, and Stop would come just before you clear the task.

Generating current is an example of an analog output measurement. Refer to Analog

Output Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Output Programming Flowcharts

Measuring and Generating Digital Values

Signals that are read or measured are called input signals. Those signals that are
generated are called output, or standard output. Some specialized devices also
support a Wired-OR output. Refer to the device documentation for more information
about the types of input and output the device supports.

© National Instruments 51
 Common Applications

This section covers software-timed digital input/output operations—or unstrobed

operations. These signals are controlled by software timing.

Measuring and generating digital values are used in a number of applications,

including controlling relays and monitoring alarm states. Generally, measuring and
generating digital values is used in laboratory testing, production testing, and
industrial process monitoring and control.

Related concepts:

• Measuring a Digital Value Programming Flowchart

• Generating a Digital Value Programming Flowchart
• Finding Examples

Measuring a Digital Value Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure digital values. If you prefer, you can configure a task for acquiring digital
values using the DAQ Assistant.

Generating a Digital Value Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
generate digital values. If you prefer, you can configure a task for generating digital
values using the DAQ Assistant.

52 ni.com
 Common Applications

Measuring Duty Cycle

You can use the counters on your measurement device to measure duty cycle. Duty
Cycle measurements measure the active time of a signal. Use the following equation to
calculate the duty cycle of a pulse:

Duty Cycle = High Time/Pulse Period

where Pulse Period is high time plus low time.

The duty cycle of a pulse is between 0 and 1 and is often expressed as a percentage.
Refer to the following figure for examples of duty cycles. A pulse with a high time equal
to the low time has a duty cycle of 0.5, or 50%. A duty cycle less than 50% indicates
that the low time is greater than the high time, and a duty cycle greater than 50%
indicates that the high time is greater than the low time.

© National Instruments 53
 Common Applications

Creating a Program

Measuring Pulses Programming Flowchart

Related concepts:

• Measuring Pulses Programming Flowchart

Measuring Pulses Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure the frequency/duty cycle, high/low ticks, or high/low time of digital pulses.
Alternatively, you can configure a task for measuring digital pulses using the DAQ
Assistant.

54 ni.com
 Common Applications

Digital frequency and period are examples of counter measurements. Refer to Counter
Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Counter Programming Flowcharts

Measuring Force
Force is an influence that changes the motion, size, or shape of an object. Many types
of sensors exist for measuring force. Some are piezoelectric sensors, typically used for
dynamic force measurements, such as impact testing. Others are bridge-based
sensors, typically used for measuring static or slow-changing loads.

Note NI-DAQmx supports only IEPE force and bridge-based sensors.

Related concepts:

• Measuring Force with a Piezoelectric Sensor Programming Flowchart

• Measuring Force with a Bridge-Based Sensor Programming Flowchart
• Finding Examples

Measuring Force with a Bridge-Based Sensor Programming

Flowchart
The following flowchart depicts the main steps required in an NI-DAQmx application to
measure force with a bridge-based sensor. Alternatively, you can configure a task for
measuring force using the DAQ Assistant.

© National Instruments 55
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

When selecting the scaling type, choose the one that best matches the specifications
for your sensor.

Measuring force is an example of analog input measurement. Refer to Analog Input

Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

56 ni.com
 Common Applications

Measuring Force with a Piezoelectric Sensor Programming

Flowchart
The following flowchart depicts the main steps required in an NI-DAQmx application to
measure force with a piezoelectric force sensor. Alternatively, you can configure a task
for measuring force using the DAQ Assistant.

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring force is an example of analog input measurement. Refer to Analog Input

Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

© National Instruments 57
 Common Applications

Measuring Digital Frequency

The digital frequency of a signal is the inverse of the period of a signal. To get the
frequency of the signal, take the inverse of the period. The formula for frequency is
Frequency (in Hz) = Counter Timebase Rate (in Hz) / Count.

The Counter Timebase Rate is a known frequency and is usually a built-in time source.
If the counter timebase rate is unknown, you only can make measurements only in
terms of ticks of the counter timebase. This may be the case if you are using an
external signal for the counter timebase, and the frequency of the external signal is
unknown or aperiodic.

Digital frequency is an example of a time measurement. Refer to Configuring a Time

Measurement in NI-DAQmx and Two Counter Measurement Method for more
information about measuring time.

Related concepts:

• Measuring Digital Frequency and Period Programming Flowchart

• Finding Examples

Measuring Pulses Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure the frequency/duty cycle, high/low ticks, or high/low time of digital pulses.
Alternatively, you can configure a task for measuring digital pulses using the DAQ
Assistant.

58 ni.com
 Common Applications

Digital frequency and period are examples of counter measurements. Refer to Counter
Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Counter Programming Flowcharts

Measuring Digital Frequency and Period Programming

Flowchart
The following flowchart depicts the main steps required in an NI-DAQmx application to
measure digital frequency or period. Alternatively, you can configure a task for
measuring digital frequency using the DAQ Assistant.

© National Instruments 59
 Common Applications

Digital frequency and period are examples of counter measurements. Refer to Counter
Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Counter Programming Flowcharts

Generic Programming Flowcharts

This section contains general programming flowcharts that you can use when creating
an application. You also can find programming flowcharts for typical
applications—such as measuring temperature, measuring current, and measuring
strain—in the Common Applications section of this help file.

In the programming flowcharts, many applications also include explicit control

functions to start, stop, and clear the task. For instance, for applications that use your
counter/timer, such as finite counter input, you need to call the Start function/VI to
arm the counter. In LabVIEW, clearing occurs automatically. For other ADEs, you must
include these functions in your application.

Functions and VIs produce the core functionality of the NI-DAQmx API. For instance, NI-
DAQmx includes functions for timing, triggering, reading, and writing samples.

60 ni.com
 Common Applications

However, for advanced functionality, Visual C++, Visual C#, Visual Basic .NET, and
LabVIEW require properties. ANSI C and LabWindows/CVI employ the Get and Set
Attribute functions. For more information, refer to the programming reference help for
your ADE.

Analog Input Programming Flowcharts

This section contains general programming flowcharts that you can use when creating
an application. You also can find programming flowcharts for typical
applications—such as measuring temperature, measuring current, and measuring
strain—in the Common Applications section of this help file.

Functions and VIs provide the core functionality of the NI-DAQmx API. For instance, NI-
DAQmx includes functions for timing, triggering, reading, and writing samples.
However, for advanced functionality, Visual C++, Visual C#, Visual Basic .NET, and
LabVIEW require properties. ANSI C and LabWindows/CVI employ the Get and Set
Attribute functions. For more information, refer to the programming reference help for
your ADE.

Related concepts:

• Single Sample Analog Input Programming Flowchart

• Finite Analog Input Programming Flowchart
• Continuous Analog Input Programming Flowchart
• Triggered Acquisition Programming Flowchart

Single Sample Analog Input Programming Flowchart

Acquiring a single sample is an on-demand operation. In other words, NI-DAQmx

acquires one value from an input channel and immediately returns the value. This
operation does not require any buffering or hardware timing. For example, if you
periodically needed to monitor the fluid level in a tank, you acquire single data points.
You can connect the transducer that produces a voltage representing the fluid level to
a single channel on your measurement device and initiate a single-channel, single-
point acquisition when you want to know the fluid level.

With NI-DAQmx, you also can gather data from multiple channels. For instance, you

© National Instruments 61
 Common Applications

might want to monitor the fluid level in the tank as well as the temperature. In this
case, you need two transducers connected to two channels on your device. The
following flowchart depicts the steps to programmatically create a single sample
analog input application. If you prefer, you can configure a task for acquiring a single
sample using the DAQ Assistant.

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Finite Analog Input Programming Flowchart

One way to acquire multiple samples for one or more channels is to acquire single
samples in a repetitive manner. However, acquiring a single sample on one or more
channels over and over is inefficient and time consuming. Moreover, you do not have
accurate control over the time between each sample or channel. Instead, you can use
hardware timing, which uses a buffer in computer memory to acquire data more
efficiently. Programmatically, you need to include the timing function, specifying the
sample rate and the sample mode (finite). As with other functions, you can acquire
multiple samples for a single channel or multiple channels. You can configure a task
for finite analog input using the DAQ Assistant.

62 ni.com
 Common Applications

Continuous Analog Input Programming Flowchart

If you want to view, process, or log a subset of the samples as they are being acquired,
you need to continually acquire samples. For these types of applications, set the
sample mode to continuous. The following flowchart depicts the main steps required
in an NI-DAQmx application for measuring voltage. Instead, you can configure a task
for continuous analog input using the DAQ Assistant.

© National Instruments 63
 Common Applications

Analog Output Programming Flowcharts

This section contains general programming flowcharts that you can use when creating
an application. You also can find programming flowcharts for typical
applications—such as generating voltage and generating current—in the Common
Applications section of this help file.

In the programming flowcharts, many applications also include explicit control

functions to start, stop, and clear the task. In LabVIEW, clearing occurs automatically.
For other ADEs, you must include these functions in your application.

Functions and VIs provide the core functionality of the NI-DAQmx API. For instance, NI-
DAQmx includes functions for timing, triggering, reading, and writing samples.
However, for advanced functionality, Visual C++, Visual C#, Visual Basic .NET, and

64 ni.com
 Common Applications

LabVIEW require properties. ANSI C and LabWindows/CVI employ the Get and Set
Attribute functions. For more information, refer to the programming reference help for
your ADE.

Related concepts:

• Generating Voltage
• Measuring and Generating Current

Single Sample Analog Output Programming Flowchart

Generating a single sample is an on-demand operation. In other words, NI-DAQmx

generates one value from an input channel and immediately returns the value. This
operation does not require any buffering or hardware timing.

With NI-DAQmx, you also can generate samples from multiple channels. If you prefer,
you can configure a task for generating a single sample using the DAQ Assistant.

Tip To increase performance, especially when multiple samples are written,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you write
samples, and Stop would come just before you clear the task.

Finite Analog Output Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to

© National Instruments 65
 Common Applications

generate a finite number of voltage samples in a buffered generation. If you prefer, you
can configure this task using the DAQ Assistant.

Continuous Analog Output Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
continuously generate voltage samples. If you prefer, you can configure this task using
the DAQ Assistant.

66 ni.com
 Common Applications

Counter Programming Flowcharts

This section contains general programming flowcharts that you can use when creating
an application. You also can find programming flowcharts for typical
applications—such as counting edges and generating pulses—in the Common
Applications section of this help file.

In the programming flowcharts, many applications also include explicit control

functions to start, stop, and clear the task. For instance, for applications that use your
counter, such as counting edges or measuring period, you need to call the Start
function/VI to arm the counter. In LabVIEW, clearing occurs automatically. For other
ADEs, you must include these functions in your application.

Functions and VIs provide the core functionality of the NI-DAQmx API. For instance, NI-
DAQmx includes functions for timing, triggering, reading, and writing samples.

© National Instruments 67
 Common Applications

However, for advanced functionality, Visual C++, Visual C#, Visual Basic .NET, and
LabVIEW require properties. ANSI C and LabWindows/CVI employ the Get and Set
Attribute functions. For more information, refer to the programming reference help for
your ADE.

Related concepts:

• Edge Counting
• Generating Pulses

Single Point Counter Input Programming Flowchart

The following flowchart depicts the main steps you must complete for an on-demand
counting application. If you prefer, you can configure this task using the DAQ Assistant.

Finite Counter Input Programming Flowchart

The following flowchart depicts the main steps you must complete for finite counter
input in an NI-DAQmx application. If you prefer, you can configure this task using the
DAQ Assistant.

68 ni.com
 Common Applications

1
Time-based measurements include period, semi-period, pulse width, two-edge
separation, and digital frequency.

2
Edge counting-based measurements include edge counting, encoder-based position
measurements, and GPS timestamp measurements.

Continuous Counter Input Programming Flowchart

The following flowchart depicts the main steps you must complete for continuous
counting in an NI-DAQmx application. If you prefer, you can configure this task using
the DAQ Assistant.

© National Instruments 69
 Common Applications

1
Time-based measurements include period, semi-period, pulse width, two-edge
separation, and digital frequency.

2
Edge counting-based measurements include edge counting, encoder-based position
measurements, and GPS timestamp measurements.

Digital Input Programming Flowcharts

This section contains general programming flowcharts that you can use when creating
an application. You also can find programming flowcharts for typical
applications—such as measuring a digital value—in the Common Applications section
of this help file.

In the programming flowcharts, many applications also include explicit control

functions to start, stop, and clear the task. In LabVIEW, clearing occurs automatically.
For other ADEs, you must include these functions in your application.

Functions and VIs provide the core functionality of the NI-DAQmx API. For instance, NI-

70 ni.com
 Common Applications

DAQmx includes functions for timing, triggering, reading, and writing samples.
However, for advanced functionality, Visual C++, Visual C#, Visual Basic .NET, and
LabVIEW require properties. ANSI C and LabWindows/CVI employ the Get and Set
Attribute functions. For more information, refer to the programming reference help for
your ADE.

Related concepts:

• Measuring and Generating Digital Values

Single Sample Digital Input Programming Flowchart

Acquiring a single sample is an on-demand operation. In other words, NI-DAQmx

acquires one value from an input channel and immediately returns the value. This
operation does not require any buffering or hardware timing. For example, if you
periodically needed to monitor the fluid level in a tank, you acquire single data points.
You can connect the transducer that produces a voltage representing the fluid level to
a single channel on your measurement device and initiate a single-channel, single-
point acquisition when you want to know the fluid level.

With NI-DAQmx, you also can gather data from multiple channels. For instance, you
might want to monitor the fluid level in the tank as well as the temperature. In this
case, you need two transducers connected to two channels on your device. The
following flowchart depicts the steps to programmatically create an application to
measure digital values. If you prefer, you can configure a task for acquiring a single
sample using the DAQ Assistant.

© National Instruments 71
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Finite Digital Input Programming Flowchart

One way to acquire multiple samples for one or more channels is to acquire single
samples in a repetitive manner. However, acquiring a single data sample on one or
more channels over and over is inefficient and time consuming. Moreover, you do not
have accurate control over the time between each sample or channel. Instead, you can
use hardware timing, which uses a buffer in computer memory to acquire data more
efficiently. Programmatically, you need to include the timing function, specifying the
sample rate and the sample mode (finite). As with other functions, you can acquire
multiple samples for a single channel or multiple channels. You can configure a task
for measuring digital values using the DAQ Assistant.

72 ni.com
 Common Applications

Note Triggering and Sample Clock timing for Digital I/O are not supported
on all devices.

Related concepts:

• Single Sample Digital Input Programming Flowchart

Continuous Digital Input Programming Flowchart

If you want to view, process, or log a subset of the samples as they are being acquired,
you need to continually acquire samples. For these types of applications, set the
sample mode to continuous. The following flowchart depicts the main steps required
in an NI-DAQmx application for acquiring digital signals. You can configure a task for
continuously acquiring digital values using the DAQ Assistant.

© National Instruments 73
 Common Applications

Note Sample clock timing for Digital I/O is not supported on all devices.

Digital Output Programming Flowcharts

This section contains general programming flowcharts that you can use when creating
an application. You also can find programming flowcharts for typical applications in
the Common Applications section of this help file.

In the programming flowcharts, many applications also include explicit control

functions to start, stop, and clear the task. For instance, for applications that use your
counter/timer, such as counting edges or measuring period, you need to call the Start
function/VI to arm the counter. In LabVIEW, clearing occurs automatically. For other
ADEs, you must include these functions in your application.

74 ni.com
 Common Applications

Functions and VIs provide the core functionality of the NI-DAQmx API. For instance, NI-
DAQmx includes functions for timing, triggering, reading, and writing samples.
However, for advanced functionality, Visual C++, Visual C#, Visual Basic .NET, and
LabVIEW require properties. ANSI C and LabWindows/CVI employ the Get and Set
Attribute functions. For more information, refer to the programming reference help for
your ADE.

Single Sample Digital Output Programming Flowchart

Generating a single sample is an on-demand operation. In other words, NI-DAQmx

generates one value on an output channel immediately after the Write function/VI is
called. This operation does not require any buffering or hardware timing.

With NI-DAQmx, you also can generate samples from multiple channels. If you prefer,
you can configure a task for generating a single sample using the DAQ Assistant.

Tip To increase performance, especially when multiple samples are written,

include the Start function/VI and Stop function/VI in your application. In the
preceding flowchart, the Start function/VI would come just before you write
samples, and Stop would come just before you clear the task.

Finite Digital Output Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
generate a finite number of digital values in a buffered generation. If you prefer, you
can configure a task for generating digital values using the DAQ Assistant.

© National Instruments 75
 Common Applications

Note Sample clock timing for Digital I/O is not supported on all devices.

Continuous Digital Output Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
continuously generate digital values. If you prefer, you can configure a task for
generating digital values using the DAQ Assistant.

76 ni.com
 Common Applications

Note Sample clock timing for Digital I/O is not supported on all devices.

Triggered Acquisition Programming Flowchart

The following flowchart depicts the main steps you follow for adding triggering to an
acquisition. If you prefer, you can configure triggering with the DAQ Assistant.

© National Instruments 77
 Common Applications

Measuring GPS Timestamp

You can take a GPS timestamp measurement with the NI PXI-6608. In a GPS timestamp
measurement, the NI PXI-6608 determines the precise time of year using a specialized
onboard counter. You can select a single point (on-demand) timestamp or a buffered
(sample clock) timestamp.

You can synchronize the GPS timestamp counter to a GPS receiver signal by using a

78 ni.com
 Common Applications

pulse per second (PPS) or an IRIG-B (timecode TTL) synchronization signal from the
GPS receiver. PPS does not include any timing information; rather, the PPS accurately
reports when the beginning of a second occurs. IRIG-B, on the other hand, has the time
encoded in the signal from the beginning of the current year. The GPS counter can
latch on the current time upon receiving a hardware gate signal. GPS does not provide
year information; however, the time is stored in a 64-bit floating-point number that
can be converted to seconds since January 1 of the current year.

When doing an on-demand GPS timestamp measurement, you must first arm the
counter by calling the Start function/VI. Each subsequent read returns the number of
seconds counted.

When doing a buffered GPS timestamp measurement, the current time is latched on
each active edge of the sample clock and stored in the buffer. There is no built-in clock
for buffered GPS timestamp measurements, so you must supply an external sample
clock.

Related concepts:

• GPS Timestamp Programming Flowchart

• Finding Examples

GPS Timestamp Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
take a GPS timestamp measurement with an NI PXI-6608.

© National Instruments 79
 Common Applications

GPS timestamp is an example of a counter measurement. Refer to Counter

Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Counter Programming Flowcharts

Measuring Linear Displacement

Linear displacement is movement and direction along a single axis. A position or linear
displacement sensor is a device whose output signal represents the distance an object
has traveled from a reference point. The linear variable differential transformer (LVDT)
is a sensor that measures linear displacement.

On M Series devices, C Series devices, and NI-TIO-based devices, you can use the
counters to perform displacement measurements with two-pulse encoders. Linear
position can be measured with two-pulse encoders. You can choose to do either a
single point or a buffered sample clock displacement measurement.

You also can measure velocity with two-pulse encoders, but you need to use a sample
clock with a fixed frequency. To measure velocity, use the following formula:

V = D/T

80 ni.com
 Common Applications

where V is the average velocity, D is the distance, and T is time.

The counter measures the position of the encoder using the A and B signals, which are
offset by 90°. The counter also supports the Z index, which provides a precise reference
point and is available on some encoders.

Related concepts:

• Measuring Position with an RVDT or LVDT Programming Flowchart

• Measuring Position with Encoders Programming Flowchart
• Finding Examples

Measuring Position with Encoders Programming Flowchart

The following flowchart depicts the main steps you must complete for measuring
position with an encoder in an NI-DAQmx application. If you prefer, you can configure a
task using the DAQ Assistant.

© National Instruments 81
 Common Applications

Measuring position with an encoder is an example of a counter measurement. Refer to

Counter Programming Flowcharts for additional flowcharts that can help you create
an application.

Related concepts:

• Counter Programming Flowcharts

Measuring Position with an RVDT or LVDT Programming

Flowchart
The following flowchart depicts the main steps required in an NI-DAQmx application to
measure position with an RVDT or LVDT. Alternatively, you can configure a task for
measuring position using the DAQ Assistant.

82 ni.com
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring position is an example of an analog input measurement. Refer to Analog

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

© National Instruments 83
 Common Applications

Measuring Period, Semi-Period, Pulse Width, and Two-

Edge Separation
You can measure period, semi-period, pulse width, and two-edge separation using
counters, such as on a DAQ device, to determine the duration of an event or to
determine the interval time between two events.

Period measurements measure the time between consecutive rising or falling edges of
a pulse. Semi-period measurements measure the time between consecutive edges.
Pulse width measurements measure the time between either a rising and falling edge,
or a falling and rising edge. Two-edge separation measurements measure the time
between the rising or falling edge of one digital signal and the rising or falling edge of
another digital signal.

The formula for period, semi-period, pulse width, and two-edge separation is as
follows:

Period, Semi-Period, Pulse Width, or Two-Edge Separation (in seconds) = Count /

Counter Timebase Rate (in Hz).

where Count is the number of counter timebase ticks that elapse during one period,
semi-period, pulse width, or two-edge separation of the measured input signal or
signals.

The Counter Timebase Rate is a known frequency and is usually a built-in time source.
If the counter timebase rate is unknown, you only can make measurements only in
terms of ticks of the counter timebase. This may be the case if you are using an
external signal for the counter timebase, and the frequency of the external signal is

84 ni.com
 Common Applications

unknown or aperiodic.

Period, semi-period, pulse width, and two-edge separation are examples of time
measurements. Refer to Configuring a Time Measurement in NI-DAQmx and Two
Counter Measurement Method for more information about measuring time.

Related concepts:

• Generating Pulses
• Measuring Semi-Period, Two-Edge Separation, and Pulse Width Programming
Flowchart
• Measuring Digital Frequency and Period Programming Flowchart
• Measuring Pulses Programming Flowchart
• Finding Examples

Measuring Pulses Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure the frequency/duty cycle, high/low ticks, or high/low time of digital pulses.
Alternatively, you can configure a task for measuring digital pulses using the DAQ
Assistant.

Digital frequency and period are examples of counter measurements. Refer to Counter
Programming Flowcharts for additional flowcharts that can help you create an
application.

© National Instruments 85
 Common Applications

Related concepts:

• Counter Programming Flowcharts

Measuring Digital Frequency and Period Programming

Flowchart
The following flowchart depicts the main steps required in an NI-DAQmx application to
measure digital frequency or period. Alternatively, you can configure a task for
measuring digital frequency using the DAQ Assistant.

Digital frequency and period are examples of counter measurements. Refer to Counter
Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Counter Programming Flowcharts

86 ni.com
 Common Applications

Measuring Semi-Period, Two-Edge Separation, and Pulse

Width Programming Flowchart
The following flowchart demonstrates the main steps required in an NI-DAQmx
application to measure semi-period and pulse width. Alternatively, you can configure a
task for measuring semi-period and pulse width using the DAQ Assistant.

Period, semi-period, two-edge separation, and pulse width is an example of a counter

measurement. Refer to Counter Programming Flowcharts for additional flowcharts
that can help you create an application.

Related concepts:

• Counter Programming Flowcharts

Measuring Pressure
Pressure is a measure of force per unit area. You can use bridge-based sensors to
measure pressure.

© National Instruments 87
 Common Applications

Related concepts:

• Measuring Pressure Programming Flowchart

• Finding Examples

Measuring Pressure Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure pressure. Alternatively, you can configure a task for measuring pressure using
the DAQ Assistant.

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

When selecting the scaling type, choose the one that best matches the specifications
for your sensor.

88 ni.com
 Common Applications

Measuring pressure is an example of analog input measurement. Refer to Analog Input

Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

Measuring Proximity
Proximity is the distance between two objects. An eddy current proximity probe is a
transducer that uses changes in voltage to measure proximity. Eddy current proximity
probes use a high-frequency radio signal to convert voltage to a proximity
measurement. Measurements are recorded as milimeters, microns, mVolts/mil and
Volts/mil where a mil is 1/1000 of an inch.

Related concepts:

• Measuring Proximity Programming Flowchart

• Finding Examples

Measuring Proximity Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure proximity using an eddy current proximity probe. Alternatively, you can
configure a task for measuring proximity using the DAQ Assistant.

© National Instruments 89
 Common Applications

Measuring proximity is an example of an analog input measurement. Refer to Analog

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

Generating Pulses
A pulse is a rapid change in the amplitude of a signal from its idle value to an active
value for a short period of time. Pulses can have high or low idle states. A pulse with a
low idle state starts at the low value (typically zero), pulses high, and returns to low. A
pulse with a high idle state starts high, pulses to low, and returns to high.

A pulse train is more than one pulse. You can use a pulse or pulse train as a clock
signal, a gate, or a trigger for a measurement or a pulse generation. You can use a
single pulse of known duration to determine an unknown signal frequency or to trigger
an analog acquisition. You can use a pulse train of known frequency to determine an
unknown pulse width.

90 ni.com
 Common Applications

Each pulse or pulse train consists of three parts:

• High Time—The amount of time the pulse is at a high level.

• Low Time—The amount of time the pulse is at a low level.
• Initial Delay—The amount of time the output remains at the idle state before
generating the pulse. The idle state always replaces high time or low time for the
first pulse of a generation, depending on the idle state.

The pairing of high time and low time pair is a pulse specification.

The period of the pulse is the sum of the high time and the low time. The frequency is
the reciprocal of the period, 1/period.

The following illustration shows the parts of a pulse.

The following illustration shows the parts of a pulse train.

Before you generate a pulse, you need to determine if you want to output the pulse or
pulse train in terms of frequency, time, or number of ticks of the counter timebase. For
frequency, you need to determine the duty cycle. For time, you specify the high time
and the low time. Use the number of ticks if you are using a counter timebase with an
unknown rate. When you configure a pulse generation, the output appears at the
counter output terminal.

Related concepts:

© National Instruments 91
 Common Applications

• Generating a Pulse Programming Flowchart

• Generating a Finite Pulse Train Programming Flowchart
• Generating a Continuous Pulse Train Programming Flowchart
• Finding Examples

Generating a Pulse Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
generate a pulse. If you prefer, you can configure a task to generate a pulse using the
DAQ Assistant.

Generating a Finite Pulse Train Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application
for generating a finite pulse train. Alternatively, you can configure a task for generating
the pulse train using the DAQ Assistant.

92 ni.com
 Common Applications

Generating a Continuous Pulse Train Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application
for generating a continuous pulse train. Alternatively, you can configure a task for
generating the pulse train using the DAQ Assistant.

© National Instruments 93
 Common Applications

Measuring Resistance
Resistance is the opposition to passage of an electric current. One Ohm (Ω) is the
resistance through which one volt (V) of electric force causes one ampere (A) to flow.
Two common methods for measuring resistance are the 2-wire method and the 4-wire
method. Both methods send a current through a resistor with a measurement device
measuring the voltage drop from the signal before and after it crosses the resistor. The
2-wire method is easier to implement, but this method is less accurate than the 4-wire
method for resistances below 100 Ω. For 3-wire resistors, there is also a 3-wire method.
To calculate resistance, use the following equation.

R(Ω) = V(V) / I(A)

where R is the resistance, V is the voltage, and I is the current.

Related concepts:

• Measuring Resistance Programming Flowchart

94 ni.com
 Common Applications

• Finding Examples

Measuring Resistance Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure resistance. Alternatively, you can configure a task for measuring resistance
using the DAQ Assistant.

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
preceding flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring resistance is an example of an analog input measurement. Refer to Analog

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

© National Instruments 95
 Common Applications

Measuring Sound Pressure

Sound pressure is the dynamic variation of the static pressure of air and is measured in
force per unit area (Pa). The instantaneous sound pressure is typically averaged over a
certain duration to give sound pressure level. Sound pressure level is usually
represented on a logarithmic amplitude scale, which is similar to the human
perception of hearing. Typical values on this logarithmic scale are a sound level of 0
dB, which is the average threshold of human hearing, 60 to 70 dB for normal
conversation, 110 dB at an extremely loud concert, and 150 dB for the noise of a rocket
takeoff or a jet engine at close range.

The Sound Pressure Level (SPL or LP) in decibels is defined by the following equation.

SPL = 20 log10 (p/pref)

where p is the instantaneous sound pressure in Pa and pref is 20 µPa, the

internationally accepted reference for sound pressure measurements, which roughly
corresponds to the threshold of human hearing.

You use a microphone to measure sound pressure. The microphone acts as a

transducer, creating a voltage signal that is proportional to the instantaneous sound
pressure.

Related concepts:

• Measuring Sound Pressure Programming Flowchart

• Finding Examples

Measuring Sound Pressure Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure sound pressure. Alternatively, you can configure a task for measuring sound
pressure using the DAQ Assistant.

96 ni.com
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring sound pressure is an example of an analog input measurement. Refer to

Analog Input Programming Flowcharts for additional flowcharts that can help you
create an application.

Related concepts:

• Analog Input Programming Flowcharts

Measuring Strain
Strain (ε) is the amount of deformation of a body due to an applied force. Specifically,
strain is the fractional change in length, as shown in the following figure.

© National Instruments 97
 Common Applications

Strain can be positive (tensile) or negative (compressive). Although dimensionless,

strain is sometimes expressed in units such as in./in. or mm/mm. In practice, the
magnitude of measured strain is very small. Therefore, strain is often expressed as
microstrain (µε).

When a uniaxial force strains a bar, as in the preceding figure, a phenomenon known as
Poisson Strain causes the girth of the bar, D, to contract in the transverse direction,
which is perpendicular to the force. The magnitude of this transverse contraction is a
material property indicated by its Poisson's Ratio. The Poisson's Ratio of a material is
the negative ratio of the strain in the transverse direction to the strain in the axial
direction, which is parallel to the force. Poisson's Ratio for steel, for example, ranges
from 0.25 to 0.3.

To measure strain, you can use one or more strain gages in a Wheatstone bridge in one
of several bridge configurations. Refer to Signal Conditioning Requirements for Bridge-
Based Sensors for more information about strain gages and bridge configurations.

Related concepts:

• Measuring Strain Programming Flowchart

• Finding Examples

Measuring Strain Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure strain. Alternatively, you can configure a task to measure strain with a strain
gage using the DAQ Assistant.

98 ni.com
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring strain is an example of an analog input measurement. Refer to Analog Input

Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

© National Instruments 99
 Common Applications

Measuring Torque
Torque is a measure of the tendency of a force to rotate an object. Torque is the cross
product of a force and the distance of the force from the fulcrum. You can use bridge-
based sensors to measure torque.

Related concepts:

• Measuring Torque Programming Flowchart

• Finding Examples

Measuring Torque Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure torque. Alternatively, you can configure a task for measuring torque using the
DAQ Assistant.

100 ni.com
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

When selecting the scaling type, choose the one that best matches the specifications
for your sensor.

Measuring torque is an example of analog input measurement. Refer to Analog Input

Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

Measuring Temperature
Note Temperature measurements may require you to condition the signal.
The conditioning requirements depend on your sensor. Refer to the Overview
of Temperature Sensor Types for an explanation of sensor types and
conditioning requirements.

Using a Thermocouple to Measure Temperature

A popular way to measure temperature with a DAQ device is to use a thermocouple, as

shown in the following figure, because thermocouples are inexpensive, easy to use,
and easy to obtain. Thermocouples produce a voltage that varies based on
temperature. Using a thermocouple, you can measure a voltage and use a formula to
convert the voltage measurement to temperature.

© National Instruments 101

 Common Applications

The typical wiring for a thermocouple, as shown in the following figure, uses a resistor,
R, only if the thermocouple is not grounded at any other point. If, for example, the
thermocouple tip were already grounded, using a resistor would cause a ground loop
and result in erroneous readings.

You also can measure temperature using Resistance Temperature Detectors (RTD) and
Thermistors.

Related concepts:

• Measuring Temperature with an RTD Programming Flowchart

• Measuring Temperature with a Thermistor Programming Flowchart
• Measuring Temperature with a Thermocouple Programming Flowchart
• Finding Examples

Measuring Temperature with an RTD Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure temperature with an RTD. Alternatively, you can configure a task for
measuring temperature using the DAQ Assistant.

102 ni.com
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring temperature is an example of analog input measurement. Refer to Analog

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

© National Instruments 103

 Common Applications

Measuring Temperature with a Thermistor Programming

Flowchart
The following flowchart depicts the main steps required in an NI-DAQmx application to
measure temperature with a thermistor. Alternatively, you can configure a task for
measuring temperature using the DAQ Assistant.

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

104 ni.com
 Common Applications

Measuring temperature is an example of analog input measurement. Refer to Analog

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

Measuring Temperature with a Thermocouple Programming

Flowchart
The following flowchart depicts the main steps required in an NI-DAQmx application to
measure temperature with a thermocouple. Alternatively, you can configure a task for
measuring temperature using the DAQ Assistant.

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

© National Instruments 105

 Common Applications

Measuring temperature is an example of analog input measurement. Refer to Analog

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

Measuring Velocity
Velocity is the rate of change in position with respect to time.

Measuring Velocity with an IEPE Velocity Transducer

A velocity transducer is an IEPE sensor that converts velocity to voltage. Velocity
transducers are typically used to measure vibration.

Related concepts:

• Measuring Velocity Programming Flowchart

• Finding Examples

Measuring Velocity Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure velocity with a piezoelectric sensor. Alternatively, you can configure a task for
measuring velocity using the DAQ Assistant.

106 ni.com
 Common Applications

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring velocity is an example of analog input measurement. Refer to Analog Input

Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Input Programming Flowcharts

Measuring Angular Velocity (Encoder)

On devices that support it, you can use the counters to perform velocity
measurements with encoders. An encoder is a device that converts linear or rotary
displacement into digital or pulse signals. Angular velocity can be measured with X1,
X2, and X4 quadrature encoders. You can choose to do either single-point (on-demand)

© National Instruments 107

 Common Applications

velocity measurement or buffered (sample clock) velocity measurement.

The counter measures the velocity of the encoder using the A and B signals, which are
offset by 90°. The velocity is calculated using the A and B input signal transitions and
the amount of time that elapses between the changes in the encoder count value.

The decoding type attribute/property specifies how to count and interpret the pulses
the encoder generates on signal A and signal B.

Measuring Linear Velocity (Encoder)

On devices that support it, you can use the counters to perform velocity
measurements with encoders. An encoder is a device that converts linear or rotary
displacement into digital or pulse signals. Linear velocity can be measured with X1, X2,
and X4 quadrature encoders. You can choose to do either single-point (on-demand)
velocity measurement or buffered (sample clock) velocity measurement.

The counter measures the velocity of the encoder using the A and B signals, which are
offset by 90°. The velocity is calculated using the A and B input signal transitions and
the amount of time that elapses between the changes in the encoder count value.

The pulse in the distance per pulse attribute/property is one full period of both signal A
and signal B in the units specified by the length portion of the Units input. The
decoding type attribute/property specifies how to count and interpret the pulses the
encoder generates on signal A and signal B.

Generating Voltage
You can generate single sample DC signals or time-varying multiple sample signals.

Single Samples—Including Steady Signals

Use single samples if the signal level is more important than the generation rate. For
instance, generate one sample at a time if you need to generate a constant, or DC,
signal. You can use software or hardware timing if the device supports hardware
timing to control when the device generates a signal.

108 ni.com
 Common Applications

Time-Varying Multiple Samples

Use multiple samples if the generation rate is just as important as the signal level, as in
an AC sine wave. Function generators are a common type of device that you can
program to produce certain types of waveforms, such as sine, triangle, and square
waves. You also can use a DAQ device as a function generator. You do this by
generating one cycle of a sine wave, such as with the Sine Generation VI in LabVIEW,
storing one cycle of sine wave data in a waveform, and programming the device to
generate the values continuously from the waveform one point at a time at a specified
rate.

Also called buffered analog output, generating multiple samples involves the following
steps:

1. Your application writes multiple samples into a buffer.

2. All the samples in the buffer are then sent to your device according to the timing
you specify. You can use software or hardware timing (if your device supports
hardware timing) to control when your device generates a signal.

Related concepts:

• Generating Voltage Programming Flowchart

• Finite Analog Output Programming Flowchart
• Finding Examples

Generating Voltage Programming Flowchart

The following flowchart illustrates the main steps required in an NI-DAQmx application
to generate voltage. Alternatively, you can configure a task for generating voltage using
the DAQ Assistant.

© National Instruments 109

 Common Applications

Tip To increase performance, especially when multiple samples are written,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just after you write
samples, and Stop would come just before you clear the task.

Generating voltage is an example of an analog output measurement. Refer to Analog

Output Programming Flowcharts for additional flowcharts that can help you create an
application.

Related concepts:

• Analog Output Programming Flowcharts

Measuring Voltage
Most measurement devices can measure, or read, voltage. Two common voltage
measurements are direct current (DC) and alternating current (AC).

110 ni.com
 Common Applications

Measuring DC Voltage

DC voltage is useful for measuring phenomena that change slowly with time, such as
temperature, pressure, or strain. With DC signals, you want to accurately measure the
amplitude of a signal at a given point in time.

Wind Speed Example

The following figure shows a typical wiring diagram for an anemometer with an output
range of 0 to 10 V, which corresponds to wind speed of 0 to 200 mph. Use the following
equation to scale the data:

Using this equation, a measurement of 3 V would correspond to a wind speed of 60

mph (3 V × 20 mph/V = 60 mph).

Notice that the wiring diagram in the following figure uses a resistor, R, because an
anemometer is usually not a grounded signal source. If the anemometer transducer
were already grounded, using a resistor would cause a ground loop and result in
erroneous readings.

Averaging

Averaging can improve measurement accuracy for noisy and rapidly changing signals.

The following figure shows what an actual wind speed might look like over time. Due
to gusting winds, the speed values look noisy. Notice that the wind speed reading of 29
mph is a peak speed that might give the impression that the wind is holding at 29 mph.
A better representation might be to take the average speed over a short period of time.

© National Instruments 111

 Common Applications

One common reason for averaging is to eliminate 50 or 60 Hz power line noise. The
oscillating magnetic field around power lines can introduce noise voltages on
unshielded transducer wiring. Because power line noise is sinusoidal, or shaped like a
sine wave, the average over one period is zero. If you use a scan rate that is an integer
multiple of the noise and average data for an integer multiple of periods, you can
eliminate the line noise. One example that works for both 50 and 60 Hz is to sample at
300 samples per second and average 30 points. Notice that 300 is an integer multiple
of both 50 and 60. One period of the 50 Hz noise is 300/50 = 6 points. One period of the
60 Hz noise is 300/60 = 5 points. Averaging 30 points is an integer multiple of both
periods, so you can ensure that you average whole periods.

Measuring AC Voltage

AC voltage is a waveform that constantly increases, decreases, and reverses polarity.

AC voltage is common in household, lab, and industrial devices because most power
lines deliver AC voltage. You can measure AC voltages to determine the maximum,
minimum, and peak-to-peak values of a signal. The peak-to-peak value of a signal is
the maximum voltage swing, from maximum to minimum.

AC Voltage and Root Mean Square (RMS)

Voltage, current, and power are not constant values because AC signals alternate.
However, you can use Vrms (root mean square) to measure voltage, current, and power
such that a load connected to a 120 volts AC (VAC) source develops the same amount
of power as that same load connected to a 120 volts DC (VDC) source. With RMS, the
power formula for DC also works for AC. For sinusoidal waveforms, Vrms = Vpeak/
square root of 2. Because voltmeters read Vrms, the 120 VAC of a typical U.S. wall outlet
actually has a peak value of about 170 V.

Related concepts:

112 ni.com
 Common Applications

• Measuring Voltage Programming Flowchart

• Finding Examples

Measuring Voltage Programming Flowchart

The following flowchart depicts the main steps required in an NI-DAQmx application to
measure voltage. Alternatively, you can configure a task for measuring voltage using
the DAQ Assistant.

Tip To increase performance, especially when multiple samples are read,

include the Start function/VI and Stop function/VI in your application. In the
previous flowchart, the Start function/VI would come just before you read
samples, and Stop would come just before you clear the task.

Measuring voltage is an example of an analog input measurement. Refer to Analog

Input Programming Flowcharts for additional flowcharts that can help you create an
application.

To measure AC voltages, you generally use a hardware timed acquisition, such as the
ones shown in Finite Voltage Measurements and Continuous Voltage Measurements.
To measure DC voltages, you often do not need a buffer or hardware timing, so you can
use a simple application such as the one shown in Acquiring a Single Sample.

Related concepts:

• Analog Input Programming Flowcharts

© National Instruments 113

 Common Applications

• Finite Analog Input Programming Flowchart

• Continuous Analog Input Programming Flowchart
• Single Sample Analog Input Programming Flowchart

114 ni.com
 NI-DAQmx Key Concepts

NI-DAQmx Key Concepts

NI-DAQmx Key Concepts covers important concepts in NI-DAQmx such as channels and
tasks. The ways that NI-DAQmx handles timing, triggering, buffering, and signal
routing are also central in the NI-DAQmx API.

Channels and Tasks in NI-DAQmx

Virtual channels and tasks are fundamental components of NI-DAQmx.

Virtual channels, or sometimes referred to generically as channels, are software

entities that encapsulate the physical channel along with other channel specific
information—range, terminal configuration, and custom scaling—that formats the
data. Tasks are collections of one or more virtual channels with timing, triggering, and
other properties.

Related concepts:

• Channels: Physical, Virtual, Local Virtual, and Global Virtual

• Tasks in NI-DAQmx

Channels: Physical, Virtual, Local Virtual, and Global Virtual

A physical channel is a terminal or pin at which you can measure or generate an analog
or digital signal. A single physical channel can include more than one terminal, as in
the case of a differential analog input channel or a digital port of eight lines. Every
physical channel on a device has a unique name (for instance, SC1Mod4/ai0,
Dev2/ao5, and Dev6/ctr3) that follows the NI-DAQmx physical channel naming
convention.

Virtual channels are software entities that encapsulate the physical channel along with
other channel specific information—range, terminal configuration, and custom
scaling—that formats the data. To create virtual channels, use the DAQmx Create
Virtual Channel function/VI or the DAQ Assistant.

Virtual channels created with the DAQmx Create Virtual Channel function/VI are called

© National Instruments 115

 NI-DAQmx Key Concepts

local virtual channels and can only be used within the task. With this function/VI, you
choose the name to assign for the virtual channel, which is used in the rest of the NI-
DAQmx software framework to refer to the physical channel.

If you create virtual channels with the DAQ Assistant, you can use them in other tasks
and reference them outside the context of a task. Because these channels can apply to
multiple tasks, they are called global virtual channels. You can select global virtual
channels with the NI-DAQmx API or DAQ Assistant and add them to a task. If you add a
global virtual channel to several tasks and modify that global virtual channel with the
DAQ Assistant, the change applies to all tasks that use that global virtual channel. You
must save the changes before they become globally available.

Related concepts:

• Physical Channel Syntax

• Tasks in NI-DAQmx
• Creating Channels and Tasks with the DAQ Assistant
• Physical Channels
• Internal Channels

Related tasks:

• Creating Virtual Channels with the API

Creating Virtual Channels with the API

The following example illustrates the difference between physical and virtual channels
and demonstrates how to create virtual channels with the API.

Problem

Create an NI-DAQmx virtual channel to measure temperature in the range 50° C to 200°
C using a J-type thermocouple wired to channel 0 on an M Series device configured as
Device 1. Use LabVIEW or LabWindows™/CVI™ to write your application.

Solution

1. Call the AI Temp TC instance of the DAQmx Create Virtual Channel VI in LabVIEW

116 ni.com
 NI-DAQmx Key Concepts

(DAQmxCreateAIThrmcplChan function in LabWindows/CVI).

2. Use Dev1/ai0 as the physical channel on the device to which the thermocouple
signal is connected.
3. Specify myThermocoupleChannel as the name to assign to your virtual
channel.
4. Select the appropriate values for the thermocouple type and range inputs. NI-
DAQmx applies these attributes to the virtual channel.

You have now created a virtual channel.

Related concepts:

• Choosing Whether to Use the API or the DAQ Assistant

• Physical Channels
• Internal Channels

Types of Virtual Channels

You can create a number of different types of virtual channels, depending on the signal
type—analog, digital, or counter—and direction (input or output). These channels can
be either global virtual channels or local virtual channels. For information on specific
functions/VIs, refer to the NI reference help for your ADE.

• Analog Input Channels—Analog input channels measure different physical

phenomena using a variety of sensors. The type of channel to create depends on
the type of sensor and/or phenomenon you want to read. For instance, you can
create channels for measuring temperature with a thermocouple, measuring
current, measuring voltage, and measuring voltage with excitation.
• Analog Output Channels—NI-DAQmx supports two types of phenomena, voltage
and current. You can use custom scales if the output from the device relates to
another unit of measure.
• Counter Input/Output Channels—NI-DAQmx supports several types of counter
input and output channels for different types of counter measurements and
generations. To find out more about counter measurements and terminals used for
common applications, refer to Counter Parts in NI-DAQmx.
• Digital Input/Output Channels—For digital channels, you can create both line-
based and port-based digital channels. A line-based channel can contain one or
more digital lines from one or more ports on a device. Reading or writing to a line-

© National Instruments 117

 NI-DAQmx Key Concepts

based channel does not affect other lines on the hardware. You can split lines in a
particular port among multiple channels and use those channels simultaneously
within one or multiple tasks, but the lines in a given channel must all be input lines
or all be output lines. Additionally, all channels in a task must be either input
channels or output channels. Some devices also require that the lines of a given
port all be input lines or output lines. Check your device documentation for the
capabilities of your device.

A port-based channel represents a fixed collection of lines on the device. Reading

or writing to a port affects all the lines on the port. The number of lines in the port
(commonly referred to as port width) is hardware dependent and typically varies
from 8 lines (MIO device) to 32 lines (SCXI digital modules).

• Power Channels—Power channels source voltage and current and also provide
measurements of those sources. You can change the voltage and current setpoints
dynamically at runtime. You can use a power channel to control (enable or disable)
the power output as well as to detect various error states that impact power
output.
Related concepts:

• Channels: Physical, Virtual, Local Virtual, and Global Virtual

• Digital Lines, Ports, and Port Width
• Tasks in NI-DAQmx
• Counter Parts in NI-DAQmx

Physical Channel Syntax

Use this syntax to refer to physical channels and groups of physical channels in NI-
DAQmx.

Related concepts:

• Physical Channels
• Internal Channels
• Multidevice Tasks

118 ni.com
 NI-DAQmx Key Concepts

Physical Channel Names

Physical channel names consist of a device identifier and a slash (/) followed by a
channel identifier. For example, if the physical channel is Dev1/ai1, the device
identifier is Dev1, and the channel identifier is ai1. MAX assigns device identifiers to
devices in the order they are installed in the system, such as Dev0 and Dev1. You also
can assign arbitrary device identifiers with MAX.

For analog I/O and counter I/O, channel identifiers combine the type of the channel,
such as analog input (ai), analog output (ao), and counter (ctr), with a channel number
such as the following:

ai1

ctr0

For digital I/O, channel identifiers specify a port, which includes all lines within a port:

port0

Or, the channel identifier can specify a line within a port:

port0/line1

All lines have a unique identifier. Therefore, you can use lines without specifying which
port they belong to. For example, line31 is equivalent to port3/line7 on a
device with four 8-bit ports.

Physical Channel Ranges

To specify a range of physical channels, use a colon between two channel numbers or
two physical channel names:

Dev1/ai0:4

Dev1/ai0:Dev1/ai4

For digital I/O, you can specify a range of ports with a colon between two port
numbers:

© National Instruments 119

 NI-DAQmx Key Concepts

Dev1/port0:1

You also can specify a range of lines:

Dev1/port0/line0:4

Dev1/line0:31

You can specify channel ranges in reverse order:

Dev1/ai4:0

Dev1/ai4:Dev1/ai0

Dev1/port1/line3:0

Physical Channel Lists

Use commas to separate physical channel names and ranges in a list as follows:

Dev1/ai0, Dev1/ai3:6

Dev1/port0, Dev1/port1/line0:2

Digital Lines, Ports, and Port Width

Digital lines and ports are important parts of a digital input/output system.

• Line—A line is an individual signal. It refers to a physical terminal. The data that
the line carries are called bits, binary values that are either 1 or 0. The terms line
and bit are fairly interchangeable. For example, an 8-bit port is the same as a port
with eight lines.
• Port—A port is a collection of digital lines. Usually, the lines are grouped into an
8-bit or 32-bit port.
• Port Width—The port width refers to the number of lines in a port. For example, a
device with one port with eight lines has a port width of eight.

120 ni.com
 NI-DAQmx Key Concepts

Output Lines
Output Port
Data Latches
and Drivers

Data Latches Input Port

and Drivers
Input Lines
Device or Module

Channel Name Generation

NI-DAQmx assigns names to local virtual channels that you create programmatically
with the NI-DAQmx API when you do not provide a name for each local virtual channel.

Generated Local Virtual

Physical Channel Names Name To Assign
Channel Names
Dev1/ai0:1 — Dev1/ai0, Dev1/ai1
Dev1/ai0:7 "foo" foo0, foo1, ..., foo7
Dev1/ai0:7 "foo31" foo31, foo32, ..., foo38
Dev1/ai0:7 "foo 123" foo123, foo124, ..., foo130
Dev1/ai0:7 "a0:3, b" a0, a1, a2, a3, b0, b1, b2, b3

Naming Channels, Tasks, and Scales

Use the following guidelines to name your channels, tasks, and scales:

• Use any alphanumeric characters.

• Do not use nonalphanumeric characters with the following exceptions:
◦ In NI-DAQmx 7.4 or later, dashes are allowed in channel, task, and scale names.
◦ Spaces are allowed.
◦ You can use underscores within the channel, task, or scale name, but you
cannot use leading underscores, such as _Dev1.

Note You can use other nonalphanumeric characters when creating

channels, tasks, and scales, but exporting that configuration to another
system might not work correctly, especially if the operating system is in a
different language.

• You must use no more than 256 characters.

© National Instruments 121

 NI-DAQmx Key Concepts

Cold-Junction Compensation Channels

On devices with built-in cold-junction compensation (CJC) channels, the CJC channel
is read once per sample clock edge.

Related concepts:

• Sample Clock

Tasks in NI-DAQmx
A task is a collection of one or more virtual channels with timing, triggering, and other
properties. Conceptually, a task represents a measurement or generation you want to
perform. All channels in a task must be of the same I/O type, such as analog input or
counter output. However, a task can include channels of different measurement types,
such as an analog input temperature channel and an analog input voltage channel. For
most devices, only one task per subsystem can run at once, but some devices can run
multiple tasks simultaneously. With some devices, you can include channels from
multiple devices in a task. To perform a measurement or a generation with a task,
follow these steps:

1. Create or load a task. You can create tasks interactively with the DAQ Assistant or
programmatically in your ADE such as LabVIEW or LabWindows/CVI.
2. Configure the channel, timing, and triggering properties as necessary.
3. Optionally, perform various task state transitions to prepare the task to perform
the specified operation.
4. Read or write samples.
5. Clear the task.

If appropriate for your application, repeat steps 2 through 4. For instance, after reading
or writing samples, you can reconfigure the virtual channel, timing, or triggering
properties and then read or write additional samples based on this new configuration.

If properties need to be set to values other than their defaults for your task to be
successful, your program must set these properties every time it executes. For
example, if you run a program that sets property A to a nondefault value and follow
that with a second program that does not set property A, the second program uses the

122 ni.com
 NI-DAQmx Key Concepts

default value of property A. The only way to avoid setting properties programmatically
each time a program runs is to use virtual channels and/or tasks created in the DAQ
Assistant.

Related concepts:

• Simultaneous Tasks
• Multidevice Tasks
• Task State Model
• Creating Channels and Tasks with the DAQ Assistant

Related tasks:

• Creating Tasks with the API

Creating Tasks with the API

The following example illustrates how to create a task with the API:

Problem

Create an NI-DAQmx task to measure temperature in the range 50°C to 200°C using a J-
type thermocouple that is wired to channel 0 on an M Series device configured as
Device 1. Sample the temperature 10 times per second, and acquire 10,000 samples.
Use LabVIEW or LabWindows/CVI to write your application.

Solution

1. Call the AI Temp TC instance of the DAQmx Create Virtual Channel VI in LabVIEW
(DAQmxCreateAIThrmcplChan function in LabWindows/CVI).
2. Specify Dev1/ai0 as the physical channel for the device connected to the
thermocouple signal.
3. Specify myThermocoupleChannel as the name to assign to your virtual
channel.
4. Select the appropriate values for the thermocouple type and range inputs. NI-
DAQmx applies these attributes to the virtual channel.
5. Call the Sample Clock instance of DAQmx Timing VI in LabVIEW (or
DAQmxCfgSampClkTiming function in LabWindows/CVI), specifying a rate of 10

© National Instruments 123

 NI-DAQmx Key Concepts

Hz and a sample mode of finite.

6. Call the DAQmx Start Task VI (DAQmxStartTask in LabWindows/CVI).
7. Call the Analog 1D DBL 1Chan NSamp instance of DAQmx Read VI
(DAQmxReadAnalogF64 in LabWindows/CVI), specifying number of samples
per channel as 10,000.
8. Call the DAQmx Stop Task VI (DAQmxStopTask function in LabWindows/CVI) after
the desired number of samples have been acquired.
9. Call the DAQmx Clear Task VI (DAQmxClearTask function in LabWindows/CVI).

You have now created a task called myTemperatureTask that uses a local virtual
channel called myThermocoupleChannel.

Note You also can use the DAQ Assistant to create the same task and
generate the code to run the task.

Related concepts:

• Creating Channels and Tasks with the DAQ Assistant

• Choosing Whether to Use the API or the DAQ Assistant

Using the Start Task function/VI

To explicitly start a task, call the Start Task function/VI. You auto-start a task when you
perform some other operation that implicitly starts the task. For instance, calling a
Read function/VI or a Write function/VI might implicitly start the task if one is not
already started. How to specify this behavior depends on the operation that your task
performs. By default, the Read function/VI and the Write function/VI for a single
sample automatically starts a task.

Related concepts:

• Committed State
• Running State
• Task State Model
• Verified State

124 ni.com
 NI-DAQmx Key Concepts

Starting a Finite Measurement Task

If you have specified a task to perform a finite measurement, you do not need to call
the Start Task function/VI, nor do you need to change the default behavior of the
DAQmx Read function/VI. Calling the Read function/VI starts your task, performs the
finite measurement, and stops the task after the last sample is read. The task returns
to its state before you called the read operation. However, if you need to perform
additional read operations after the task has been stopped (in other words, if you want
to read earlier locations in the buffer), the default behavior is insufficient for two
reasons:

1. The task is returned to the Verified state and the samples are no longer accessible.
2. Future calls of the Read function/VI start new read operations rather than reading
from the completed operation.

For this situation, explicitly commit the task by calling the Control Task function/VI
with the Action parameter set to Commit. Then, after performing the initial read
operation and before performing the subsequent read operations, set the Auto-Start
Read attribute/property to False.

Starting a Continuous Measurement Task

For a continuous measurement, explicitly call the Start Task function/VI, perform the
desired read operations, and call the Stop Task function/VI to stop the continuous
measurement. When you perform a read operation in a loop—regardless if the read
operation performs a single-sample, on-demand read, or a multiple-sample,
hardware-timed read—call the Start Task function/VI before entering the loop and call
the Stop Task function/VI after leaving the loop.

Starting an Analog Output Task

The behavior of the Write function/VI is more complicated. Calling the Write function/
VI always results in the task transitioning to at least the Committed state. Whether the
task transitions to the Running state depends on the value of the Auto-Start
parameter.

For single-sample write operation, call a single-sample version of the Write function/
VI. This call implicitly starts the task, writes the single sample, and stops the task. For a

© National Instruments 125

 NI-DAQmx Key Concepts

multiple-sample, on-demand write operation, call the Write function/VI, but also set
the Auto-Start parameter to True, which by default is set to False. This call
implicitly starts the task, writes the multiple samples, and stops the task.

For a multiple-sample, hardware-timed write operation, first call the Write function/VI
to write the samples to generate, explicitly call the Start Task function/VI, wait for the
samples to be generated by calling the Wait Until Done function/VI, and then explicitly
call the Stop Task function/VI.

If you attempt to perform a hardware-timed generation with the Auto-Start

parameter of the Write function/VI set to True either because you explicitly set it to
true or because you are using a single-sample Write function/VI, the operation might
fail because the samples that you write are not transferred to the device in time to
generate the waveform. As a result, when performing hardware-timed generations,
always write at least part of the waveform to generate before starting the task.

Improving Performance with the Start Task function/VI

There are other situations in which you should explicitly call the DAQmx Start Task
function/VI and the DAQmx Stop Task function/VI, even though you are not required to
do so. When you call the Read function/VI or the Write function/VI in a loop, you can
significantly improve performance if you explicitly call the Start Task function/VI
before entering the loop and call the Stop Task function/VI after exiting the loop.
Without explicitly calling the Start Task function/VI before entering the loop, the task
must implicitly transition from its current state to the Running state before performing
the read or write operation. After the read or write operation is complete, the task must
implicitly transition from the Running state back to its previous state. These implicit
state transitions occur for every iteration of the loop, which is inefficient.

Aborting a Task
Several conditions cause a task to abort:

• To explicitly abort a task, call the DAQmx Control Task function/VI with the
Action parameter set to Abort. In general, aborting a task is not a normal
operation. It is intended for exceptional situations.
• In LabVIEW, you also can abort a task by clicking the Abort Execution button.
Doing so results in all tasks created in that VI hierarchy to be aborted and then

126 ni.com
 NI-DAQmx Key Concepts

cleared.
• If you remove a device from the system, all tasks currently using the resources of
that device are aborted.
• If you call the DAQmx Reset Device function/VI to restore a device to its initial
configuration, all tasks currently utilizing the resources of that device are aborted.

When a task is aborted, it is returned to the Verified state. If the task is running, it is
stopped as soon as possible and is then unreserved. After a task has been aborted, you
can continue to use the task. However, you might need to transition the task back to its
previous state before continuing the specified operation.

Related concepts:

• Verified State

Using Is Task Done

You can use the Is Task Done function/VI for applications in which you need to monitor
the progress of a task running in one section of your application from another section
of your application.

In general, use the Is Task Done function/VI with continuous measurements and
generations when you are not actively reading or writing samples but want to monitor
for errors.

Related concepts:

• When Is A Task Done?

Using Wait Until Done

You might need to call the Wait Until Done function/VI to ensure that the specified
operation is complete before you stop the task.

The most common example is a finite generation. If you start a task that performs a
finite generation and then immediately stop the task, the generation probably has not
completed when you stop the task. As a result, the generation does not complete as
expected. To ensure that the finite generation completes as expected, call the Wait

© National Instruments 127

 NI-DAQmx Key Concepts

Until Done function/VI before stopping the task. After the Wait Until Done function/VI
executes, the finite generation has been completed, and you can stop the task.

In general, use the Wait Until Task Done function/VI with finite measurements and
generations.

Related concepts:

• When Is A Task Done?

When Is A Task Done?

If the measurement or generation is finite, the task is done when you acquire or
generate the final sample or when you call the Stop Task function/VI. If the
measurement or generation is continuous (including on-demand timing), or if
retriggering is enabled, the task is not done until you call the Stop Task function/VI. In
addition, the task is done if a fatal error is generated while performing the
measurement or generation, or you abort the measurement or generation. Check for
errors and warnings to verify the task completed successfully.

Task State Model

NI-DAQmx uses a task state model to improve ease of use and speed up driver
performance.

The task state model consists of five states—Unverified, Verified, Reserved,

Committed, and Running. You call the Start Task function/VI, Stop Task function/VI,
and Control Task function/VI to transition the task from one state to another. The task
state model is very flexible. You can choose to interact with as little or as much of the
task state model as your application requires.

Create Verify or Get Reserve Commit Start

Unverified Verified Reserved Committed Running
Set Unreserve Stop
Clear
Abort
Abort
Abort

If you explicitly invoke a state transition that has already occurred, it is not repeated

128 ni.com
 NI-DAQmx Key Concepts

and an error is not returned. For example, if the task has already reserved its resources
and, therefore, is in the Reserved state, calling the Control Task function/VI with the
Action parameter set to Reserve does not reserve the resources again.

Sometimes, calling a function/VI may require multiple state transitions, such as calling
the Start Task function/VI while in the Verified state. In these cases, the task will
implicitly transition between each of the necessary states to get to the final desired
state, as shown in the following diagram.
Create Verify or Get Reserve Commit Start
Unverified Verified Reserved Committed Running
Set Unreserve Stop
Clear
Abort
Abort
Abort

Transitioning backwards in the Task State Model will undo any implicit forwards
transitions in addition to the requested explicit transition. Continuing with the
example above, calling the Stop Task function/VI after implicitly transitioning to the
Running State from the Verified State will cause the task to return to the Verified State,
as shown in the following diagram.
Create Verify or Get Reserve Commit Start
Unverified Verified Reserved Committed Running
Set Unreserve Stop
Clear
Abort
Abort
Abort

Unverified State

When a task is created or loaded, either explicitly or implicitly, it is in the Unverified

state. In this state, you configure the timing, triggering, and channel attributes/
properties of the task.

Verified State

NI-DAQmx checks the timing, triggering, and channel attributes/properties for

correctness when the task transitions from the Unverified to the Verified state. You can
explicitly perform this transition by calling the Control Task function/VI with Action
set to Verify. While NI-DAQmx detects and verifies some invalid values for attributes/
properties immediately when you set the attribute/property, NI-DAQmx cannot verify
other values immediately because they depend on other attributes/properties and the

© National Instruments 129

 NI-DAQmx Key Concepts

devices being used. NI-DAQmx checks the value of these attributes/properties during
the verify transition and reports any invalid values at that time. If NI-DAQmx finds no
invalid values, the task is successfully verified and transitions to the Verified state.
Otherwise, it remains in the Unverified state.

In certain cases, NI-DAQmx will coerce the values of attributes/properties when

successfully verifying a task rather than generating an error. This is done when the
value set on the attribute/property cannot be met exactly as specified and coercing it
to a legal value has little functional impact on the task.

Related concepts:

• Coercion

Reserved State

The resources a task uses to perform the specified operation are acquired exclusively
when the task transitions from the Verified state to the Reserved state. These resources
can be clocks or channels on a device, trigger lines on a PXI chassis, or buffer memory
in the computer. Reserving these resources prevents other tasks from using these
resources, which interferes with this task performing the specified operation. You can
explicitly perform this transition by calling the Control Task function/VI with Action
set to Reserve. This transition fails if some task resources are currently reserved by
another task. If the task can gain access to all the resources it uses, the task is
successfully reserved and transitions to the Reserved state. Otherwise, it remains in
the Verified state.

Committed State

NI-DAQmx programs some of the settings for the resources when the task is
committed. These settings might be the rate of a clock or the input limits of a channel
on a device, the direction of a trigger line on a PXI chassis, or the size of the buffer
memory in the computer. Other settings, such as the sample counter, cannot be
programmed when the task is committed because they need to be programmed every
time the task is started. When a task is committed, it transitions from the Reserved
state to the Committed state. You can explicitly perform this transition by invoking the
Control Task function/VI with Action set to Commit. In general, the commit
transition should not fail. If it does, it is an exceptional condition and the task remains

130 ni.com
 NI-DAQmx Key Concepts

in the Reserved state. If the settings for the resources used by the task are
programmed, the task is successfully committed and transitions to the Committed
state.

Running State

When the task begins to perform the specified operation, the task transitions from the
Committed state to the Running state. You can explicitly perform this transition by
invoking the Start Task function/VI. Notice that starting a task does not necessarily
start acquiring samples or generating a waveform. You might have specified the timing
and triggering attributes/properties such that a sample is not acquired until you call
the Read function/VI or a waveform is not generated until a trigger is detected. In
general, the start transition does not fail. If it does, it is an exceptional condition, and
the task remains in the Committed state. If the task begins to perform the specified
operation, the task is successfully started and transitions to the Running state.

Running to Committed State

The task ceases to perform the specified operation when the task transitions from the
Running state to the Committed state. To explicitly perform this transition, call the
Stop Task function/VI. Notice that you might have specified the timing and triggering
attributes/properties such that all the samples are acquired before this transition
occurs. For output operations, the last value written will typically continue to be
generated after the task is stopped. In this situation, despite the fact that no additional
samples are acquired, the task is still in the Running state until this transition occurs.
In general, the stop transition does not fail. If it does, it is an exceptional condition, and
the task is returned to the Reserved state. If the task is stopped, the task successfully
transitions back to the Committed state.

Committed to Verified State

When the task resources that perform the specified operation are released, the task
transitions from the Committed state to the Verified state. These resources may be
clocks or channels on a device, trigger lines on a PXI chassis, or buffer memory in the
computer. To explicitly perform this transition, call the Control Task function/VI with
Action set to Unreserve. After the task releases all of its resources, it successfully
transitions back to the Verified state.

© National Instruments 131

 NI-DAQmx Key Concepts

Explicit Versus Implicit State Transitions

When should you perform explicit state transitions, and when should you rely on the
task to perform implicit state transitions? The answer depends on your application.
The following list identifies instances in which you should use explicit state transitions:

• Verify—If in your application users interactively configure a task by setting various

channel, timing, and triggering attributes/properties, explicitly verify the task
occasionally to inform the users if they have set an attribute/property to an invalid
value.
• Reserve—If the following is true, explicitly reserve a task: your application contains
many different tasks that use the same set of resources, one of these tasks
repeatedly performs its operation, and you want to ensure that none of the other
tasks acquires these resources after the task begins its sequence of operations.
Reserving the task exclusively acquires the resources that the task uses, ensuring
that other tasks cannot acquire these resources. For example, if your application
contains two tasks that each perform a sequence of measurements and you want
to ensure that each sequence is completed before the other sequence begins, you
can explicitly reserve each task before it begins its sequence of measurements.
• Commit—If your application performs multiple measurements or generations by
repeatedly starting and stopping a task, explicitly commit a task. Committing the
task exclusively acquires the resources that the task uses and programs some of
the settings for these resources. By explicitly committing the task, these operations
are performed once, not each time the task is started, which can considerably
decrease the time needed to start your task. For example, if your application
repeatedly performs finite, hardware-timed measurements, the time required to
start the task can dramatically decrease if you explicitly commit the task before
repeatedly performing these measurements. Explicitly committing a task also is
required if you need to perform additional read operations of the samples
acquired by the task after stopping the task. For more information, refer to Using
the Start Task Function/VI.
• Start—If your application repeatedly performs read or write operations, explicitly
start a task. Starting the task reserves the resources that the task uses, programs
some of the settings for these resources, and begins to perform the specified
operation. By explicitly starting the task, these operations are performed once, not
each time the read or write operation is performed. This process can considerably
decrease the time required to perform each read or write operation. For example,

132 ni.com
 NI-DAQmx Key Concepts

if your application repeatedly performs single-sample, software-timed read

operations, the time required for each read operation can dramatically decrease if
you explicitly start the task before repeatedly performing these read operations.
Related concepts:

• Using the Start Task function/VI

Implicit Task State Transitions

Although you can explicitly transition a task through each of its states as described in
Task State Model, you rarely need this level of detailed control. Two scenarios exist in
which a task is implicitly transitioned from one state to another:

• Moving the task through multiple states at the same time

• Operations that require state transitions

Related concepts:

• Task State Model

• Task Moves Through Multiple States at the Same Time
• Operations That Require State Transitions

Task Moves Through Multiple States at the

Same Time
Some state transitions require the task to move through one or more states to reach
the specified state. For example, if the task is in the Unverified state, and you call the
Control Task function/VI, setting Action to Reserve, the task is verified and reserved.
The task transitions from the Unverified state to the Verified state and to the Reserved
state. In most applications, it is not helpful to explicitly transition the task to each
state. Instead, invoke only those transitions that are necessary, and the task implicitly
handles the rest.

© National Instruments 133

 NI-DAQmx Key Concepts

Operations That Require State Transitions

You implicitly transition the task to a new state when you perform an operation that
requires that the task be in a specific state and it is not. If this occurs, the task is
implicitly transitioned to the required state. Some operations that require state
transitions include the following:

• Querying the value of an attribute/property implicitly verifies the task. This

verification is required to return accurate coerced values of attributes/properties.
Because the coerced value of a attribute/property often depends on the values of
other attributes/properties, the task as a whole must be verified to calculate the
value. Because the task might be implicitly verified when you query the value of an
attribute/property, NI-DAQmx may return an error specifying that the value of
attribute/property is invalid.
• Calling the Read function/VI implicitly commits the task if the task is not already
committed. If the value of the DAQmx Read Auto Start attribute/property is
True and the task has not been started, the task also is implicitly started. For more
information regarding the auto-start behavior of read operations, refer to Using the
Start Task Function/VI.
• Calling the Write function/VI commits the task. If the value of the Auto-Start
parameter is True, the task also is started. For more information regarding the
auto-start behavior of write operations, refer to Using the Start Task Function/VI.

For example, if the task is in the Reserved state, the value of the DAQmx Read Auto
Start attribute/property is True, and you call the Read function/VI, the task is
implicitly committed and started. The task transitions from the Reserved state to the
Committed state and to the Running state before the read operation is performed.

In some applications, it is not necessary to explicitly transition the task to any state.
Instead, invoke the desired operation and the task implicitly handles everything else.

Related concepts:

• Using the Start Task function/VI

134 ni.com
 NI-DAQmx Key Concepts

Transitioning the State Backwards

When a task is implicitly transitioned backwards, it returns to the state of the task prior
to the last operation that resulted in a forward state transition. For example, if the task
was in the Verified state and you called the Start Task function/VI to start the task, the
task is reserved, committed, and started, transitioning to the Reserved state and to the
Committed state before transitioning to the Running state. When you invoke the Stop
Task function/VI, the task is not just stopped and transitioned from the Running state
to the Committed state. If this were the case, the result is unexpected because the task
still has its resources reserved despite the fact that you never explicitly reserved them.
Instead, the task is stopped, uncommitted, and unreserved, returning to the Verified
state, its state immediately before you performed the last operation that resulted in
the state transition, calling the Start Task function/VI.

As another example, suppose the task is in the Reserved state, and you call the Read
function/VI to perform a finite measurement. This results in the task implicitly
transitioning from the Reserved state to the Committed state and then to the Running
state before performing the read operation. When the read operation completes, the
task does not remain in the running state. If this were the case, the result is
unexpected behavior, because you need to stop the task and unreserve its resources
despite the fact you never explicitly reserved the resources or started the task. Instead,
after the finite read operation completes, the task is implicitly transitioned from the
Running state to the Committed state to the Reserved state. This results in the task
returning to the state before you performed the read operation.

Keep in mind that setting the value of a channel, timing, or triggering attribute/
property does not implicitly transition the task back to the Unverified state. Instead,
the task remains in its current state and is implicitly verified when the next state
transition occurs. For example, if the task is in the Reserved state and you set the value
of timing attribute/property, the task remains in the Reserved state. The next time the
task, either implicitly or explicitly, is committed, the task is verified. Because the task is
implicitly verified when the next state transition occurs, NI-DAQmx can return an error
specifying that the value of attribute/property is invalid.

© National Instruments 135

 NI-DAQmx Key Concepts

Creating Channels and Tasks with the DAQ Assistant

You can launch the DAQ Assistant from your NI application software or from MAX. The
DAQ Assistant is a graphical interface for configuring channels, tasks, and scales.

After you launch the DAQ Assistant, follow the wizard instructions to create your new
task or channel. When the wizard is done, you can configure measurement-specific
settings, scaling, and, if necessary, timing and triggering.

Related concepts:

• Choosing Whether to Use the API or the DAQ Assistant

LabVIEW

In LabVIEW, there are several ways to open the DAQ Assistant. A couple of common
ones are the following:

• Drop the DAQ Assistant Express VI from the Express Input palette.
• Use the DAQmx Task Name control to open the DAQ Assistant.
• Open the DAQ Assistant from within a LabVIEW Project as described in Using NI-
DAQmx with LabVIEW Project in the LabVIEW Help.

LabWindows/CVI

In LabWindows/CVI, select Tools»Create/Edit DAQmx Tasks. You also can launch the
DAQ Assistant by clicking the Task Name control of the DAQmx LoadTask function
panel and selecting New Task.

Measurement Studio

In Measurement Studio, open Visual Studio .NET and select Project»Add New Item to
open the Add New Item dialog box. In the Categories pane, select Measurement
Studio»Assistants. In the Templates pane, select DAQmx Task Class.

136 ni.com
 NI-DAQmx Key Concepts

MAX

In MAX, right-click Data Neighborhood, and select Create New from the shortcut
menu. Select NI-DAQmx Task or NI-DAQmx Global Virtual Channel in the Create New
window, and click Next.

Signal Express

In SignalExpress, add a DAQmx Acquire or DAQmx Generate step.

Choosing Whether to Use the API or the DAQ Assistant

When creating a new application, you can choose to use DAQ Assistant or the API.

Advantages of Using the DAQ Assistant:

• The DAQ Assistant requires no programming. You can configure channels, timing,
triggering, and scales interactively.
• The DAQ Assistant can decrease development time. You can create a complete
application in a matter of minutes.
• If you create your application using the DAQ Assistant and later need functionality
that it doesn't expose, you can easily generate the equivalent API code from your
DAQ Assistant task if you use an NI ADE such as LabVIEW, LabWindows/CVI, or
Measurement Studio.

Advantages of Using the API:

• The API contains advanced features not exposed by the DAQ Assistant.
• The API provides additional flexibility, allowing you to customize your application
to suit your needs.
• The API gives you tighter control over the performance of your application.

Timing and Triggering

Timing and triggering are important in NI-DAQmx. The clocks section explains clocks
and handshaking. The triggering section goes over the triggers—such as a Start Trigger
and a Reference Trigger—and common trigger types—such as an analog edge trigger

© National Instruments 137

 NI-DAQmx Key Concepts

or a digital edge trigger.

Related concepts:

• Clocks
• Triggering

Timing, Hardware Versus Software

You can use software timing or hardware timing to control when a signal is generated.
With hardware timing, a digital signal, such as a clock on your device, controls the rate
of generation. With software timing, the rate at which the samples are generated is
determined by the software and operating system instead of by the measurement
device. A hardware clock can run much faster than a software loop. A hardware clock is
also more accurate than a software loop.

In NI-DAQmx, select hardware timing with the Sample Clock Timing function/VI or by
setting the Sample Timing Type attribute/property to Sample Clock. If you do neither
of these things, or you set the Sample Timing Type attribute/property to On Demand,
you are selecting software timing.

Note Some devices do not support hardware timing. Refer to your device
documentation if you are unsure whether your device supports hardware
timing.

Clocks

Periodic digital edges measure time and are called clocks. Clocks such as a sample
timebase clock and the 20 MHz timebase clock mark the passing of time or are used to
align other signals in time. Clocks usually do not cause actions in the sense that
triggers do. The names of clocks usually do not refer to actions. The sample clock is a
notable exception.

The following are some common clocks used by DAQ devices. Refer to your device
documentation for all the clocks on your device.

• AI Convert Clock—The clock on a multiplexed device that directly causes ADC

138 ni.com
 NI-DAQmx Key Concepts

conversions. The default AI Convert Clock rate uses 10 µs of additional settling

time between channels, compared to the fastest AI Convert Clock rate for the
device. When the Sample Clock rate is too high to allow for 10 µs of additional
settling time, the default AI Convert Clock rate uses as much settling time as is
allowed by the Sample Clock rate. If there are multiple devices in the same task,
the same amount of additional settling time is used for all devices in the task, even
if their maximum AI Convert Clock rates differ.
• AI Convert Clock Timebase—The clock that is divided down to produce the AI
convert clock.
• AI Sample Clock—The clock that controls the time interval between samples. Each
time the sample clock ticks (produces a pulse), one sample per channel is
acquired.
• AI Sample Clock Timebase—The onboard clock used as the source of the AI
sample clock. The AI Sample Clock Timebase is divided down to produce the AI
sample clock.
• Counter Timebase—The clock connected to the source terminal of a counter
(Ctr0Source, for example).
• DI Sample Clock—The clock that controls the time interval between samples. Each
time the sample clock ticks (produces a pulse), one sample per channel is
acquired.
• DO Sample Clock—The clock that controls the time interval between samples.
Each time the sample clock ticks (produces a pulse), one sample per channel is
acquired.
• DO Sample Clock Timebase—The onboard clock used as the source of the DO
sample clock. The DO Sample Clock Timebase is divided down to produce the DO
sample clock.
• Master Timebase—An onboard clock used by other counters on the device. The
master timebase is divided down to produce a slower clock or to measure elapsed
time. This timebase is the onboard clock used as the source of the AI Sample Clock
timebase, the AO Sample Clock timebase, and the counter timebases, for example.
• 12.8 MHz Timebase—The onboard clock source for the master timebase from
which other timebases are derived. This timebase is often used to synchronize
tasks across chassis.
• 13.1072 MHz Timebase—The onboard clock source for the master timebase from
which other timebases are derived. This timebase is often used to synchronize
tasks across chassis.
• 20 MHz Timebase—The onboard clock source for the master timebase from which

© National Instruments 139

 NI-DAQmx Key Concepts

other timebases are derived, if the device does not support an 80 MHz Timebase.
Otherwise, the clock produced by dividing the 80 MHz Timebase by 4.
• 80 MHz Timebase—The onboard clock source for the master timebase from which
other timebases are derived.
• 100 MHz Timebase—The onboard clock source for the master timebase from
which other timebases are derived.
• 100 kHz Timebase —The clock produced by dividing the 20 MHz Timebase by 200.

Note M Series, C Series, and X Series devices do not have a master timebase
of an arbitrary frequency. These devices use the 20 MHz/80 MHz/100 kHz
timebase directly.

The following diagram illustrates the M Series clocks that comprise analog input and
analog output timing. The black circles in the diagram represent terminals.

Onbrd Clk
RTSI (via RTSI) 80
10 MHz 0 MHz 80 MHz
RefClk RTSI 0-7 Ref PLL Timebase
1 Clock
80 MHz 20 MHz
Oscillator 8 2
PXI_CLK10 PLL Timebase
7 4
PXI_STAR

AnlgCmpEvent
AnlgCmpEvent PXI_STAR
PXI_CLK10 AnalogCompEvent
PXI_STAR Ctr1InternalOutput
PFI 0 - 15 Ctr0InternalOutput
RTSI 0 - 7 PFI 0 - 15
ai/SampleClk RTSI 0 - 7
Onbrd Timebase Onbrd
Clk Clk ai/SampleClk

200 Divisor

Onbrd
Clk
ai/ConvertClk
Divisor
ai/ConvertClock PFI 0 - 15
Timebase RTSI 0 - 7
Ctr0InternalOutput
PXI_STAR

PXI_STAR
PXI_CLK10 AnalogCompEvent
PXI_STAR Ctr1InternalOutput
PFI 0 - 15 Ctr0InternalOutput
RTSI 0 - 7 PFI 0 - 15
ao/SampleClock RTSI 0 - 7
Onbrd Timebase Onbrd
Clk Clk ao/SampleClock

200 Divisor

The following diagram illustrates the C Series clocks that comprise analog input and
analog output timing.

140 ni.com
 NI-DAQmx Key Concepts

80 MHz
80 MHz Timebase
Oscillator 20 MHz
Timebase
4 Ctr0 Internal Output
Ctr1 Internal Output
ModN/AnlgCmpEvent
ModN/AnlgCmpEvent ModN/PFI0
ModN/PFI0 Mod5/PFI0–7
Mod5/PFI0–7 Mod6/PFI0–6
Mod6/PFI0–7 ModN/ai/SampleClk

Onbrd ai/SampleClk Onbrd

Clk Timebase Clk ai/SampleClk

200 Divisor

Onbrd
Clk Mod1/ai/ConvertClk

Divisor
Mod1 Mod8
Onbrd
Clk Mod8/ai/ConvertClk

Divisor

Ctr0InternalOutput
Ctr1InternalOutput
ModN/AnlgCmpEvent ModN/AnlgCmpEvent
ModN/PFI0 ModN/PFI0
Mod5/PFI0–7 Mod5/PFI0–7
Mod6/PFI0–7 Mod6/PFI0–7
Onbrd ai/SampleClk Onbrd
Clk Timebase Clk ao/SampleClock

200 Divisor

The following diagram illustrates the X Series clocks that comprise analog input,
analog output, digital input, and digital output timing. The black circles in the diagram
represent terminals.

© National Instruments 141

 NI-DAQmx Key Concepts

RTSI 0-7
PFI 0-15
(RefClk)
100 MHz ÷ 10
Oscillator

PXIe_CLK100
Star_Trigger 100 MHz
RTSI 0-7 (RefClk) PLL
PFI 0-15 (RefClk) 100 MHz Timebase

20 MHz Timebase
÷5
100 KHz Timebase
÷ 200

Analog_Trigger
Analog_Trigger ai/ao/di/do/ReferenceTrigger
Star_Trigger ai/ao/di/do/SampleClk
ai/ao/di/do/
RTSI 0-7 (RefClk) ai/ConvertClk
SampleClkTimbase
PFI 0-15 (RefClk) ctrN/InternalOutput
100 MHz Timebase di/ChangeDetectEvent ai/ao/di/do/SampleClk
20 MHz Timebase ai/AnalogCompEvent
100 KHz Timebase
Divisor
÷ ai/HoldCompleteEvent
Star_Trigger
RTSI 0-7 (RefClk)
PFI 0-15 (RefClk)

Onboard Clk

Analog_Trigger
ai/ao/di/do/SampleClk
ctrN/InternalOutput
100 MHz
Divisor
÷ di/ChangeDetectEvent ai/ConvertClk
Timebase RTSI 0-7 (RefClk)
PFI 0-15 (RefClk)

Convert Clk

The following diagram illustrates the E Series clocks that comprise analog input and
analog output timing. The black circles in the diagram represent terminals.

PFI 0–9, Ctr0InternalOutput

RTSI 7 PFI 0–9,
Master Onboard RTSI 0–6 ai/SampleClock
Timebase Clock Timebase Onboard RTSI 0–6 ai/SampleClock
Clock
÷
20 MHz ÷200 Divisor
Timebase

Onboard
Clock ai/Convert
÷ Clock
Divisor

ai/ConvertClock PFI 0–9,

Timebase RTSI 0–6
Ctr0InternalOutput

PFI 0–9, Ctr1InternalOutput

Onboard RTSI 0–6 ao/SampleClock PFI 0–9, ao/SampleClock
Clock Timebase Onboard RTSI 0–6
Clock
÷
÷200
Divisor

Related concepts:

142 ni.com
 NI-DAQmx Key Concepts

• Multiplexed Versus Simultaneous Sampling

Trigger and Clock Distinction

The distinction between triggers and clocks is blurred when the digital edges used as a
trigger are periodic. In such a case, a clock causes the device to perform an action. The
sample clock is the primary example. The stimulus for the action of producing a
sample is so often a clock that NI-DAQmx configures the sample clock instead of the
sample trigger. The distinction is made clear when you consider the sample clock is in
fact just one way of providing the source of a sample trigger.

Sample Timing Types

NI-DAQmx introduces the concept of a sample timing type. Each sample timing
type is a different stimulus for triggering the action of producing a sample. When you
select a Timing function/VI, you select your sample timing type. There also is an
attribute/property for setting the following sample timing types:

• Sample Clock—A digital edge produces each sample. Nearly all devices have an
onboard clock that is dedicated to producing these edges periodically. Even when
the edges are not periodic, as they might be when the clock source is something
other than the dedicated onboard clock, you still use sample clock timing. Sample
clock timing is a type of hardware timing.
• On Demand—Every time the Read or Write function/VI executes, the device
produces the requested samples as fast as possible. In this mode, the Sample
Quantity attributes/properties are ignored. On-demand timing is a type of
software timing.
• Change Detection—Change detection timing captures samples from digital
physical channels when NI-DAQmx detects a change-a rising edge, a falling edge,
or both rising and falling edges-on one or more digital lines or ports. Change
detection timing reduces the digital data an application has to process. One issue
to be aware of with change detection on some devices is overflow. Overflow occurs
when NI-DAQmx cannot read a sample prior to the next change detection event.
The effect is that one or more samples can be missed.

Programmatically, you include the Change Detection Timing function/VI,

specifying the physical channels for rising and falling edges on which to detect

© National Instruments 143

 NI-DAQmx Key Concepts

changes. You can query for an overflow by using the Overflow attribute/property in
your application after the task starts.

• Handshake—The handshake sample timing type is used to acquire or generate

digital data with the 8255 protocol. Many devices have an 8255 chip, and other
devices emulate the 8255 protocol by default with the handshake timing type.
• Burst Handshake—Burst handshake timing acquires or generates digital data on
the data lines with a clocked protocol. This timing type involves three control
signals: the sample clock, the Pause Trigger, and the Ready for Transfer Event. Data
is transferred on each active sample clock edge if the peripheral device deasserts
the Pause Trigger and the DAQ device asserts the Ready for Transfer Event.

There are separate Burst Handshake Timing functions/VIs based on whether you
import or export a sample clock. Using the appropriate function/VI is important
because there are timing restrictions (such as setup and hold times) when sharing
a clock between the two devices.

• Implicit—The implicit sample timing type is used for acquiring period or frequency
samples using counters. It is also used for generating pulses. This timing type is
called implicit because the signal being measured is itself the timing signal or the
timing is implicit in the rate of the generated pulse train.
Related concepts:

• Timing, Hardware Versus Software

• Change Detection Considerations for NI 6527 Devices
• Sample Clock
• Pause Trigger
• Events
• Setup and Hold Times

Sample Clock

Your device uses a sample clock to control the rate at which samples are acquired and
generated. This sample clock sets the time interval between samples. Each tick of this
clock initiates the acquisition or generation of one sample per channel. You also can
connect an outside source as your clock. In software, you can specify the interval (how
fast the clock acquires or generates signals) by specifying the sample rate. You can
limit the sample rate by the signal conditioning you apply to the signals or the number

144 ni.com
 NI-DAQmx Key Concepts

of channels in your application. However, the number of channels affects your

measurement only if you are sampling close to the maximum sample rate for your
device.

Note Sample clock timing for digital I/O is not supported on all devices.
Related reference:

• Sample Clock Timing for Digital I/O

Handshaking

If you want to communicate with an external device using an exchange of signals to

request and acknowledge each data transfer, use handshaking.

For example, you might want to acquire an image from a scanner. The process involves
the following steps:

1. The scanner sends a pulse to your measurement device after it scans the image
and is ready to transfer the data.
2. Your measurement device reads an 8-, 16-, or 32-bit digital sample.
3. Your measurement device then sends a pulse to the scanner to inform the scanner
that the digital sample has been read.
4. The scanner sends out another pulse when the scanner is ready to send another
digital sample.
5. After your measurement device receives this digital pulse, the device reads the
sample.

This process repeats until all the samples are transferred.

Note Not all devices support handshaking. Refer to your device

documentation to see if handshaking is supported on your device. For E
Series devices, only those devices with more than eight digital lines—those
devices that have an additional 8255 chip onboard—support handshaking.

Related concepts:

© National Instruments 145

 NI-DAQmx Key Concepts

• Handshaking Signals for Devices That Emulate the 8255 Protocol

Burst Handshaking Signals

For devices that support burst handshake timing, three signals are used:

• Pause Trigger (formerly called REQ)

• Ready for Transfer Event (formerly called ACK)
• sample clock

For digital input tasks, when the Pause Trigger signal is logic low and the Ready for
Transfer Event is logic high, the samples are sent to the measurement device. For
digital output tasks, when the Pause Trigger signal is logic low and the Ready for
Transfer Event is logic high, the NI-DAQmx device sends the samples to a peripheral
device. The sample clock, either onboard or external, controls the timing. Data is
transferred or acquired on either the rising or falling edge of the sample clock.

The default terminals used for burst handshaking signals vary from device to device.

Related concepts:

• Burst Handshaking Timing Defaults for NI 653x Devices

Handshaking Signals for Devices That

Emulate the 8255 Protocol
Devices that emulate the 8255 protocol support two handshaking signals:

• Handshake Trigger—Also called Strobe Input (STB) and Acknowledge Input (ACK)
• Handshake Event—Also called Input Buffer Full (IBF) and Output Buffer Full (OBF)

For input tasks, when the Handshake Trigger signal is low, the samples are sent to the
measurement device. After the samples have been sent, Handshake Event is high,
which tells the peripheral device that the data has been read. For digital output,
Handshake Event is low while the NI-DAQmx device sends the samples to a peripheral

146 ni.com
 NI-DAQmx Key Concepts

device. After the peripheral device receives the samples, it sends a low pulse back on
the Handshake Trigger line. Refer to your device documentation to determine which
digital ports you can configure for handshaking signals.

The default terminals used for handshaking signals vary from device to device.

Related concepts:

• Handshake Timing Defaults

Handshaking Signals for 8255-Based Devices

8255-based devices that perform handshaking support four handshaking signals:

• Strobe Input (STB)

• Input Buffer Full (IBF)
• Output Buffer Full (OBF)
• Acknowledge Input (ACK)

Use the STB and IBF signals for digital input operations and the OBF and ACK signals
for digital output operations. When the STB line is low, the samples are sent to the
measurement device. After the samples have been sent, IBF is high, which tells the
peripheral device that the data has been read. For digital output, OBF is low while the
software sends the samples to a peripheral device. After the peripheral device receives
the samples, it sends a low pulse back on the ACK line. Refer to your device
documentation to determine which digital ports you can configure for handshaking
signals.

Digital Data on Multiple Ports

For 8255-based devices, the ports in the task affect which handshaking lines are used.
Always use the handshaking lines associated with the highest order port in the task.
For instance, if you want to group ports 1 and 2 into a single task, use the handshaking
lines associated with port 2.

Connect all the STB lines together if you are grouping ports for digital input, as shown
in the following figure. Connect only the IBF line of the highest order port in the task to

© National Instruments 147

 NI-DAQmx Key Concepts

the other device. No connection is needed for the IBF signals for the other ports.

STB*
Port x 1
IBF

STB*
Port x 2
IBF

STB*
External
Port x n
Device
IBF
(Highest Order Port)

If you group ports for digital output on an 8255-based device, connect only the
handshaking signals of the last port in the port list, as shown in the following figure.

ACK*
Port x 1
OBF

ACK*
Port x 2
OBF

ACK*
External
Port x n
Device
OBF
(Highest Order Port)

When performing handshaking, some lines are automatically reserved for control
purposes and are unavailable for use. The control lines used depend on the ports you
are using and whether you are handshaking with input or output channels. The
remaining lines in the port not used for control are still available for use. If you are
transferring data across any line in a port in a handshaking task, the entire port is
reserved for handshaking data and the remaining lines in the port are unavailable for
use.

Hardware-Timed Single Point Sample Mode

In hardware-timed single-point sample mode, samples are acquired or generated

continuously using hardware timing and no buffer. You must use the sample clock or
change detection timing types. No other timing types are supported.

148 ni.com
 NI-DAQmx Key Concepts

Use hardware-timed single-point sample mode if you need to know if a loop executes
in a given amount of time, such as in a control application.

Because there is no buffer if you use hardware-timed single-point sample mode,

ensure that reads or writes execute fast enough to keep up with hardware timing. If a
read or write executes late, it returns a warning.

Continuous Pulses (HW Timed Updates) is hardware-timed single point for counter
output.

Related concepts:

• Timing, Hardware Versus Software

• Hardware-Timed Counter Tasks

Multiplexed Versus Simultaneous Sampling

Devices use either multiplexed or simultaneous sampling. Simultaneous sampling

devices have an ADC for each analog channel and can sample from all channels at the
same time, as shown in the following figure.

Sample Clock
Ch1 Ch1
Ch2 Ch2
Ch3 Ch3

Multiplexed sampling devices have a single ADC for all analog input channels. These
devices use both a sample clock and a convert clock. The sample clock initiates the
acquisition of a sample from all channels in the scan list. The convert clock causes the
ADC conversion for each individual channel. The following figure depicts a three-
channel analog input task on a device that uses multiplexed sampling. Notice that,
unlike S Series devices, the samples are not digitized simultaneously.

Sample Clock

Convert Clock
Ch1 Ch2 Ch3 Ch1 Ch2 Ch3

The convert clock must run faster than the sample clock to achieve the specified
sample rate. For instance, if you specify a sample rate of 10 S/s for 8 analog input

© National Instruments 149

 NI-DAQmx Key Concepts

channels, the convert clock must run at least eight times the sample rate (80 Hz) to
ensure that each channel is sampled 10 times a second. At faster sampling rates, you
must also take settling time between channels into account.

Related concepts:

• Clocks
• Device-Specific Sampling Methods

Setup and Hold Times

When a DAQ device samples a digital signal, the signal must remain stable for a period
of time before and after the assertion of the clock edge used for timing. The amount of
time before the assertion of the clock is called the setup time. The amount of time
after the assertion of the clock edge is called the hold time. Refer to your device
documentation for minimum setup and hold times.

Simultaneous Analog Output On-Demand Timing

Typically, when you use software timing to output samples on multiple AO channels,
NI-DAQmx writes a sample to the first DAC, and the sample is generated. Then, NI-
DAQmx writes a sample to the second DAC, and that sample is generated, and so on.
However, with the simultaneous single-point on-demand timing, all of the data is
generated at the same time after NI-DAQmx writes to each DAC. You set this timing
with the Simultaneous Analog Output Enable attribute/property.

Timing Response Modes

Digital I/O and DAQ devices typically use the single-cycle timing response mode,
meaning the device responds to an external signal by the next active sample clock
edge.

Devices that support the pipelined timing response mode, such as the PCIe-6536 and
PCIe-6537, can respond to an external signal a few sample clock edges later. This mode
uses a source-synchronous clock scheme, which simultaneously returns the clock and
data to the acquiring device. With a source-synchronous data transfer, you can acquire
and generate data at much higher rates than with single-cycle timing response mode.

150 ni.com
 NI-DAQmx Key Concepts

With the pipelined timing response mode, you can configure external sample clocks,
but the sample clock must be free-running and started before the task commits. If you
export the sample clock, the export occurs during a task commit. As with other events,
when the task uncommits, the signal remains exported.

Triggering
When a device controlled by NI-DAQmx does something, it performs an action. Two
very common actions are producing a sample and starting a waveform acquisition.
Every NI-DAQmx action needs a stimulus or cause. When the stimulus occurs, the
action is performed. Causes for actions are called triggers. Triggers are named after the
actions they cause:

• Advance Trigger
• Expiration Trigger
• Handshake Trigger
• Pause Trigger
• Reference Trigger
• Start Trigger
• Arm Start Trigger

In addition to specifying the action you want a trigger to cause, you must select the
type of trigger to use, which determines how the trigger is produced.

Advance Trigger

An Advance Trigger causes a switch device to execute the next entry in its instruction
(scan) list. You can configure this trigger to occur on a digital edge or when the Send
Software Trigger function/VI runs.

Arm Start Trigger

When you configure an Arm Start Trigger, a counter task does not respond to any Start
Triggers until after the Arm Start Trigger occurs. You can configure this trigger to occur
on a digital edge or at a specified time (for devices that support time triggering). The
Arm Start Trigger is separate from a Start Trigger and is typically used in advanced
counter/timer applications. You might use an Arm Start Trigger to synchronize multiple

© National Instruments 151

 NI-DAQmx Key Concepts

tasks, such as counting edges and pulse generation. The Start Trigger then would be
used to start the acquisition or generation.

Expiration Trigger

An Expiration Trigger expires a watchdog task. You can use this trigger instead of the
watchdog timer to signal an expiration. You can configure this trigger to occur on a
digital edge.

Related concepts:

• Watchdog Timers

Handshake Trigger

A Handshake Trigger is a control signal from a peripheral device. The peripheral device
asserts the Handshake Trigger to indicate to the DAQ device that it has acquired a
sample (for output tasks) or generated a sample (for input tasks). For input tasks, the
DAQ device latches data, by default, at the trigger position specified by the Sample
Input Data When attribute/property, or when the peripheral device asserts the
Handshake Trigger.

Pause Trigger

With sample clock timing or burst handshake timing, the Pause Trigger pauses an
ongoing acquisition or generation. Deasserting this trigger resumes an acquisition or
generation. Depending on your device, there are some additional issues you need to
remember.

Related concepts:

• Pause Triggering

Reference Trigger

A Reference Trigger establishes the reference point in a set of input samples. You can
configure this trigger to occur on a digital edge, a digital pattern, an analog edge, or

152 ni.com
 NI-DAQmx Key Concepts

when an analog signal enters or leaves a window. Data acquired up to the reference
point is pretrigger data. Data acquired after this reference point is posttrigger data.

Pretrigger Posttrigger
Samples Samples

Start Trigger

A Start Trigger begins an acquisition or generation. You can configure this trigger to
occur on a digital edge, a digital pattern, an analog edge, when an analog signal enters
or leaves a window, or at a specified time (for devices that support time triggering).

Trigger Types

In addition to specifying the action you want a trigger to cause, you must select the
type of trigger to use, which determines how the trigger is produced. If you need to
trigger off an analog signal, use an analog edge trigger or an analog window trigger. If
the trigger signal is digital, choose a digital edge trigger with the source typically being
one of the PFI pins.

Analog Edge Triggering

For analog edge triggering, you configure the measurement device to look for a certain
signal level and slope (either rising or falling). After the device identifies the trigger
condition, the device performs the specified action associated with the trigger, such as
starting the measurement or marking which sample was acquired when the trigger
occurred. You connect analog trigger signals to any analog input channel or terminal
capable of accepting analog signals. Refer to the device-specific analog triggering
considerations for your device for additional information.

In the following figure, the trigger is set to capture data for a rising edge signal when
the signal reaches 3.2.

© National Instruments 153

 NI-DAQmx Key Concepts

3.2

Level and Slope of

Signal Initiates Data Capture
0

Hysteresis adds a window above or below the trigger level and often is used to reduce
false triggering due to noise or jitter in the signal. When using hysteresis with a rising
slope, the trigger asserts when the signal starts below level (or threshold
level) minus hysteresis and then crosses above level. The trigger deasserts
when the signal crosses below level minus hysteresis.

For example, if you add a hysteresis of 1 to the previous example, which used a
level of 3.2, the signal must start at or drop below 2.2 for triggering to occur. The
trigger then asserts as the signal rises above 3.2 and deasserts when it falls below 2.2.

Level

Level–Hysteresis

Trigger

When using hysteresis with a falling slope, the trigger asserts when the signal starts or
rises above level (or threshold level) plus hysteresis and then crosses below
level. The trigger deasserts when the signal crosses above level plus
hysteresis. If you instead trigger on a falling edge at 3.2 with a hysteresis of 1, the
signal must start at or rise above 4.2 and then fall below 3.2 for triggering to occur. The
trigger will then assert as the signal falls below 3.2 and deassert when it rises above
4.2.

Hysteresis+Level

Level

Trigger

154 ni.com
 NI-DAQmx Key Concepts

Related concepts:

• Analog Triggering

Analog Level Triggering

An analog level trigger is similar to an analog edge trigger. With both trigger types, you
specify the edge—rising or falling—and the trigger level. With an analog edge trigger,
you are interested in the point at which the trigger condition is met. With an analog
level trigger, on the other hand, you are interested in the duration that the signal
remains above or below the trigger level. An analog level trigger is typically used with a
Pause Trigger. The Pause Trigger asserts or deasserts when the trigger condition is met.
In the following illustration, a trigger asserts when the signal crosses above the trigger
level and deasserts when it drops below it. The deassertion of the trigger could
correspond to a Pause Trigger.

Trigger Level

Trigger

Analog Multi Edge Triggering

An analog multi edge trigger functions similar to an analog edge trigger. The analog
multi edge trigger differs in that you can configure multiple channel sources acquiring
in the same task to each have their own analog trigger condition. When any of the
multiple channel sources satisfy their respective condition, a trigger is generated and
the device will perform the specified action associated with the trigger.

Analog Window Triggering

A window trigger occurs when an analog signal either passes into (enters) or passes
out of (leaves) a window defined by two voltage levels. Specify the levels by setting the
window top value and the window bottom value. The following image demonstrates a
trigger that acquires data when the signal enters the window.

© National Instruments 155

 NI-DAQmx Key Concepts

Window Top

Window Bottom

Trigger Trigger

The following image demonstrates a trigger that acquires data when the signal leaves
the window.

Window Top

Window Bottom

Trigger Trigger

Related concepts:

• Analog Triggering Considerations for TestScale Modules and C Series, E Series, M

Series, and S Series Devices
• Analog Triggering Considerations for SC Express Devices

Digital Edge Triggering

A digital trigger is usually a TTL signal with two discrete levels: a high and a low level.
When the signal moves from high to low or from low to high, a digital edge is created.
There are two types of edges: rising and falling. You can produce Start or Reference
Triggers from the rising or falling edge of your digital signal.

In the following figure, the acquisition begins after the falling edge of the digital trigger
signal. Usually, digital trigger signals are connected to PFI pins on your measurement
device.

156 ni.com
 NI-DAQmx Key Concepts

TTL Signal

Falling Edge of Signal Data Capture Initiated

Digital Level Triggers

Digital level triggering starts, stops, or pauses an acquisition or measurement based on

the value read on a digital line.

Digital Pattern Triggering

For digital pattern triggering, you configure the device to detect a specific digital
pattern on specific physical channels. After detecting this condition, the device
performs the action associated with the trigger, such as starting the task or marking
which sample was acquired when the trigger occurred.

The digital pattern is specified using the following characters:

• X: ignore the physical channel

• 0: Match on a logic low level on the physical channel
• 1: Match on a logic high level on the physical channel
• R: Match on rising edge on the physical channel
• E: Match on either rising or falling edge on the physical channel
• F: Match on falling edge on the physical channel

For instance, if you specify a pattern of "X11100" and a source of "dev1/line0:4,dev1/

line6," the pattern match occurs when physical channels "dev1/line1," "dev1/line2,"
and "dev1/line3" are logic high and when physical channels "dev1/line4" and "dev1/
line6" are logic low. "dev1/line0" is ignored.

© National Instruments 157

 NI-DAQmx Key Concepts

Requested
State Channel

x dev1/line0

1 dev1/line1

1 dev1/line2

1 dev1/line3

0 dev1/line4

0 dev1/line6

Pattern Matched

For pattern triggers on ports, the pattern match occurs in reverse order. For instance, if
you specify a pattern of "11000000" and a source of "dev1/port0," the pattern match
occurs when physical channels "dev1/line0" and "dev1/line1" are logic high and the
other six lines are logic low.

Software Triggers

Software triggering starts, stops, or pauses an acquisition or measurement or

advances a scan list based on a software trigger command being sent. You generate a
software trigger command with the DAQmx Send Software Trigger function/VI.

Time Triggering

For devices that support it, a time trigger starts an acquisition or measurement at a
specific time. If the specified time has already elapsed, you will get an error message
indicating the time has already elapsed.

The timestamp timescale can be configured using the Timestamp.Timescale attribute/

property. Time triggers and timestamps can be specified in I/O Device Time or Host
Time, depending on the needs of your application.

• I/O Device Time

Shared by all network-synchronized devices on your 802.1AS subnet. I/O Device

Time is most useful for synchronizing events across multiple chassis or correlating
timestamps from multiple chassis, because even though it may be in an obscure
time scale (for example, related to a point in the distant past, such as the Linux
1970 epoch), it removes other sources of skew related to Windows system time or
other systems that are not network-synchronized to the same 802.1AS subnet. In

158 ni.com
 NI-DAQmx Key Concepts

that way, the I/O Device Time provides the best precision and relative accuracy but
may reduce usability if it is not correlated to a recognizable global time. I/O Device
Time also has the advantage of being monotonically increasing, so time triggers
and timestamps spread across multiple devices or tasks accurately maintain their
offsets from each other.

• Host Time

The timescale your PC or NI Linux Real-Time controller uses. In cases where the NI
Linux Real-Time controller is the Grand Master of your 802.1AS subnet, Host Time
and I/O Device Time are the same. However, Host Time is typically synchronized to
a local Real Time Clock or a Network Time Protocol server, and it is usually
traceable to global time. Using Host Time is more intuitive because triggers and
timestamps on the chassis are specified in times that are easily correlated to your
local system time. However, this usability comes at the cost of reduced relative
accuracy between time triggers and timestamps that are spread across multiple
devices or tasks, because using the calculated offset between the two timescales is
not as accurate as using I/O Device Time directly. To help account for this loss of
accuracy in a specific and common use-case, NI-DAQmx guarantees that two
events that are scheduled for the same Host Time are guaranteed to start at the
same I/O Device Time, preserving precise synchronization between chassis.

Whether a device supports time triggers or not can be queried using

TimeTrigSupported attribute/property.

Network-synchronized devices include the cDAQ-9185, 9189; FD-11601, FD-11603,

FD-11605, FD-11613, FD-11614, FD-11634, FD-11637; cRIO-9040, 9041, 9042, 9043,
9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, 9058; and sbRIO-9603,
9608, 9609, 9628, 9629, and 9638.

Related concepts:

• Time-Based Features for Network-Synchronized Devices

Synchronization
Synchronized operations are created by routing timing and control signals.
Synchronization can be within a single device—for instance, synchronizing analog

© National Instruments 159

 NI-DAQmx Key Concepts

input and analog output on an M Series device—or on multiple devices. Timing and
control signals that synchronize operations fall into three categories: clocks, triggers,
and events.

These timing and control signals are routed by connecting two terminals together.
Selecting a terminal as the source of a clock or a trigger constructs a route. On PCI
devices, the RTSI bus provides the pathways for signal routing. On PXI devices, the PXI
trigger bus provides the same pathways. For NI-DAQmx to find a free PXI trigger line,
you must perform a PXI chassis identification in MAX. For NI-DAQmx to find a free RTSI
line, you must create a RTSI cable in MAX and populate it with the devices connected
by the cable. You can discover what routes are possible by referencing a table of
possible routes in MAX.

On some devices, you synchronize analog input, analog output, and digital input/
output channels from multiple modules by including those channels in the same task.
All channels within a task must be of the same channel type, such as analog input or
counter output.

Related concepts:

• Clocks
• Triggering
• Events
• Multidevice Tasks

Types of Synchronization, Lockstep and Handshaked

Lockstep synchronization involves two or more similar devices sharing the same
timing and triggering and essentially acting as a single device. Sharing a sample clock
between analog input and analog output operations on a single device is also
considered lockstep synchronization. The goal of lockstep synchronization is to
eliminate skew as much as possible. In lockstep synchronization, clocks and triggers
are typically shared.

Handshaked synchronization (or stimulus/response) is two or more devices acting in

sequence. In handshaked synchronization, triggers and events are typically shared. A
simplified DAC test is an example of this type of synchronization. A digital device sends
a digital pattern to the DAC and a signal causing the DAC to create a voltage in

160 ni.com
 NI-DAQmx Key Concepts

response to this pattern. At the same time or soon after, the digital device sends a
signal to a DMM causing the DMM to measure the voltage output by the DAC. When the
DMM has finished the measurement, it sends a signal back to the digital device causing
the digital device to send the next pattern to the DAC.

In lockstep synchronization, the operations involved all use a clock or trigger for the
same purpose. In handshaked synchronization, the roles of the trigger or event are
typically reversed between the operations (for example a Sample Complete Event from
a DMM is used as a Sample Clock by the digital device that receives it).

Related concepts:

• Skew

Master and Slave Devices

Most synchronization applications involve using a signal from another device. For
example, when performing Sample Clock synchronization, a device or set of devices
use the Sample Clock from another device. Even for Reference Clock synchronization,
where devices lock their onboard oscillators to a shared clock rather than use that
clock directly, the synchronized devices use the Start Trigger from one of the devices.

The device that provides the signal is called the master device, and all other devices in
the application that use that signal are called slave devices. Because the master device
provides all the signals, it begins acquiring or generating samples immediately when
the task starts. The slave devices, however, cannot acquire or generate data until
receiving the signals from the master. Therefore, you must start any tasks on slave
devices before starting the task on the master device. When you start the tasks on the
slave devices, they wait for the signals from the master device. Then, when the task
starts on the master device, that device emits the synchronized signals, ensuring all
devices start acquiring or generating samples simultaneously. If you start the task on
the master device before starting the tasks on slave devices, the master device will
acquire or generate data for a non-deterministic amount of time before the tasks start
on the slave devices. The application is not truly synchronized in such cases, and can
result in errors.

Related concepts:

© National Instruments 161

 NI-DAQmx Key Concepts

• Sample Clock Synchronization

• Reference Clock Synchronization

Sources of Error

There are several sources of error when synchronizing measurements:

Jitter

Jitter is small variations in the period of the clock (from sample to sample). It shows up
as noise in the digitized signal and affects higher-frequency signals more. Each
component added to the clock's path adds additional jitter. You can control jitter but
not eliminate it by using an accurate clock source.

Stability

Stability describes how well the clock frequency resists fluctuations. Factors that can
cause the frequency to fluctuate include variations in temperature, time (aging),
supply voltage, shock, vibration, and capacitive load that the clock must drive.
Temperature is often the dominant factor that affects crystal oscillator stability.

Some oscillators are housed inside small ovens with controlled temperature to provide
stability that can be orders of magnitude better than with other techniques. These
oscillators are known as oven controlled crystal oscillators (OCXOs). For example, the
NI 6608 contains an OCXO.

Accuracy

Clock accuracy describes how well the actual frequency of the clock matches the
specified frequency. An oscillator generates a clock. However, an oscillator never
generates a perfect frequency. The accuracy of the oscillator-generated clock is
affected by the quality of the crystal and the oscillator's assembly.

You can describe timing errors in several different ways. Some common units of timing
error are parts per million (ppm) and parts per billion (ppb). Parts per million gives you
a fractional value of error. For example, to find the error in Hertz of an 80 MHz oscillator
with 5 ppm error, you multiply the frequency of the oscillator—80,000,000—by 5
divided by 1,000,000 or [80,000,000 Hz (5 Hz/1,000,000 Hz) = 400 Hz].

162 ni.com
 NI-DAQmx Key Concepts

From this equation, you see that the oscillator can be off by as much as 400 Hz.
Therefore, the actual frequency of the oscillator can be anywhere between 79,999,600
Hz and 80,000,400 Hz. Parts per billion is similar to parts per million, and it is used to
describe more accurate clocks.

Skew

Skew is a propagation delay that is caused when a signal arrives at two places at
different times. For instance, a signal is sent by a controlling device at time T0. A
receiving device A acts upon the signal at time T1. A receiving device B acts upon the
signal at time T2. If T1 is not equal to T2, the difference between T1 and T2 is the skew.
The distance between devices and the cabling between your devices and signal paths
within the devices themselves all affect signal arrival times.

Methods of Synchronization

Several methods exist for synchronizing devices, depending on the devices involved
and the requirements of the application.

Start Trigger Synchronization

For synchronizing multiple tasks on a single device, even at different rates and on
different subsystems, you do not need to synchronize any clocks. Because the device
derives those clocks from the same internal oscillator, you need to share only the Start
Trigger among the tasks so the clocks start at the same time.

To perform Start Trigger synchronization, configure start triggering on all slave tasks,
setting the trigger source to the internal Start Trigger terminal from the master task,
such as ai/StartTrigger. You do not have to configure start triggering on the master
task. All tasks include an implicit Start Trigger, which occurs immediately when the
task starts.

Note You must start any tasks on slave devices before starting the task on
the master device.

Related concepts:

© National Instruments 163

 NI-DAQmx Key Concepts

• Master and Slave Devices

Sample Clock Synchronization

Sample Clock synchronization allows you to synchronize tasks on multiple devices at

the same rate.

When using Sample Clock synchronization, slave devices replace the Sample Clock for
a given subsystem with the Sample Clock from another device.

To perform Sample Clock synchronization, configure all devices to use Sample Clock
timing. Set the source of the Sample Clock on all slave devices to the internal Sample
Clock terminal from the master device. For example, the name of the Sample Clock
terminal from the AI subsystem is ai/SampleClock.

Note You must start any tasks on slave devices before starting the task on
the master device.

Sample Clock synchronization results in skew due to the time required for the clock to
travel between devices. On multiplexed devices, Sample Clock synchronization results
in jitter because, even though you synchronized the Sample Clock, the devices do not
synchronize the AI Convert Clock.

Use Master Timebase synchronization or Reference Clock synchronization to

synchronize devices at different rates.

Related concepts:

• Skew
• Jitter
• Master Timebase Synchronization
• Reference Clock Synchronization
• Master and Slave Devices

Reference Clock Synchronization

Reference Clock synchronization is the most flexible and powerful synchronization

164 ni.com
 NI-DAQmx Key Concepts

method available on supported devices. Reference Clock synchronization allows you

to synchronize all timing for the synchronized devices, even at different rates and
regardless of subsystem, in that clocks derived from the Reference Clock start and
remain in phase. Derived clocks with a slower frequency than the Reference Clock are
not in phase. For counter operations, Reference Clock synchronization ensures the
counter timebases remain synchronized without drift, or in phase if the application
requires different counter timebase frequencies.

When using Reference Clock synchronization, a device does not directly use a clock
from another device in place of an onboard clock. Instead, all devices synchronize their
onboard oscillators to a common reference signal using a phase-locked loop. Each
device then derives other clocks from the synchronized oscillators. You must share a
Start Trigger for the derived clocks to start in phase.

For PXI devices, the reference signal is typically a 10 MHz clock on the chassis
backplane ( PXI_Clk10). For PXI Express devices, the reference signal is typically a 100
MHz clock on the chassis backplane ( PXIe_Clk100).

Note Always use one of the PXI or PXI Express chassis backplane clocks, if
possible. Using a clock from another device results in skew due to the time
required for the signal to travel from one device to the other.

PXI or PXI Express chassis backplane clocks might provide different accuracy than the
onboard oscillator of a device. For example, the PXIe-1062Q chassis has 25 ppm clock
accuracy, while the PXI-6259 has 50 ppm clock accuracy.

For PCI and PCI Express devices, that reference signal is a clock from another device
(typically 10MHzRefClk). Use the RefClk.Src attribute/property to specify the terminal
of the reference signal for a given task. Set RefClk.Src to OnboardClock on the
master device to lock to the onboard oscillator, rather than use it directly. Locking to
the onboard oscillator helps to equalize skew between the master and slave devices.

Even though Reference Clock synchronization minimizes or eliminates skew in the

clocks, the shared Start Trigger must travel from the master device to the slave
devices, resulting in skew. Some devices allow you to correct for that skew.

Some devices use a Master Timebase instead of a Reference Clock, thus they use

© National Instruments 165

 NI-DAQmx Key Concepts

Master Timebase synchronization. Reference Clock synchronization also requires you

to share multiple signals and reserve multiple RTSI or PXI trigger lines for those
signals. For Sample Clock-timed applications where all devices run at the same rate,
you can use Sample Clock synchronization to eliminate the need for a shared Start
Trigger, thus the additional RTSI/PXI line. You can also use Sample Clock
synchronization to synchronize devices that use a Master Timebase with devices that
use a Reference Clock.

Related concepts:

• Synchronization
• Skew
• Accuracy
• Trigger Skew Correction
• Master Timebase Synchronization
• Sample Clock Synchronization
• Master and Slave Devices

Master Timebase Synchronization

Master Timebase synchronization is the most flexible and powerful synchronization

method available on supported devices. It allows you to synchronize all timing for the
synchronized devices, even at different rates and regardless of subsystem, in that
clocks derived from the Master Timebase start and remain in phase. For counter
operations, Master Timebase synchronization ensures the counter timebases remain
synchronized without drift, or in phase if the application requires different counter
timebase frequencies.

When using Master Timebase synchronization, slave devices replace their onboard
oscillator (the Master Timebase) with the Master Timebase from a master device. Each
device then derives other clocks from the synchronized oscillators. You must share a
Start Trigger for the derived clocks to start in phase.

Note You must start any tasks on slave devices before starting the task on
the master device.

You must set two properties on the slave devices to synchronize the Master Timebase.

166 ni.com
 NI-DAQmx Key Concepts

Use the MasterTimebase.Src attribute/property on the slave devices to specify the

terminal of the Master Timebase from the master device. Because the slave devices
then use an external timebase, you must also use the MasterTimebase.Rate property
to specify the rate of the Master Timebase. Instead of hard-coding those values, you
can query the Master Timebase rate and source from the master device and set the
rate and source on the slave devices to the same values.

Master Timebase synchronization results in skew due to the time required for the clock
to travel between devices.

Most devices use a Reference Clock instead of a Master Timebase, thus they use
Reference Clock synchronization. Master Timebase synchronization also requires you
to share multiple signals and reserve multiple RTSI or PXI trigger lines for those
signals. For Sample Clock-timed applications where all devices run at the same rate,
you can use Sample Clock synchronization to eliminate the need for a shared Start
Trigger, thus the additional RTSI/PXI line. You can also use Sample Clock
synchronization to synchronize devices that use a Master Timebase with devices that
use a Reference Clock.

Related concepts:

• Synchronization
• Skew
• Reference Clock Synchronization
• Sample Clock Synchronization
• Master and Slave Devices

Sample Clock Timebase Synchronization

Sample Clock Timebase synchronization allows you to synchronize devices at different

rates. Use Sample Clock Timebase synchronization to synchronize a combination of
devices for which Reference Clock, Master Timebase, or Sample Clock synchronization
is not an option.

When using Sample Clock Timebase synchronization, slave devices replace the Sample
Clock Timebase for a given subsystem with the Sample Clock Timebase from another
device. Each device derives its Sample Clock from the synchronized Sample Clock
Timebase. You must share a Start Trigger for the derived clocks to start in phase.

© National Instruments 167

 NI-DAQmx Key Concepts

Note You must start any tasks on slave devices before starting the task on
the master device.

You must set two properties on the slave devices to synchronize the Sample Clock
Timebase. Use the SampClk.Timebase.Src attribute/property to specify the terminal of
the Sample Clock Timebase from the master device. Because the slave devices then
use an external timebase, you must also use the SampClk.Timebase.Rate property to
specify the rate of that timebase. Instead of hard-coding those values, you can query
the Sample Clock Timebase rate and source from the master device and set the rate
and source on the slave devices to the same values.

Sample Clock Timebase synchronization results in skew due to the time required for
the clock to travel between devices.

Related concepts:

• Skew
• Master and Slave Devices

Mixed-Clock Synchronization

For some applications, the other synchronization methods might not be sufficient. In
such cases, you might be able to synchronize by using a clock from one device as a
different clock on another device. For example, to synchronize devices that use a
Reference Clock with devices that use a Master Timebase, such as to synchronize X
Series devices with E Series devices, you can perform Reference Clock synchronization,
but instead of locking the X Series reference clock to a PXI backplane clock, lock it to
the Master Timebase of the E Series device.

Mixing clocks in this manner is often much more complicated than using the same
clocks. You might have to manually configure several other timing parameters, such as
delays, active edges, or clock divisors. Use mixed-clock synchronization only as a last
resort if the other synchronization methods are not an option.

Related concepts:

• Methods of Synchronization

168 ni.com
 NI-DAQmx Key Concepts

Counter Synchronization

You cannot synchronize counter input applications using implicit timing in the same
sense as analog input or output applications. These types of counter input
applications cannot be programmed to make their measurements at the same time
because the signals being measured themselves determine when the measurements
are made, and there is no reason to set up multiple devices to measure the same
signal. You also cannot use Start Triggers for these applications.

You can, however, ensure that all counters are using the same timebase for their input
measurements by sharing the CI Counter Timebase signal. Program all devices to use
the same signal (usually the 20MHzTimebase from one of the devices) as their CI
Counter Timebase. More generally, one device can be queried for its CI Counter
Timebase source and that terminal can be set as the source of the CI Counter
Timebase for the other devices.

To synchronize Sample Clock-timed buffered counter input applications, use Sample

Clock synchronization. The Sample Clock must be externally supplied to one of your
devices. The other synchronized devices are programmed to use as their Sample Clock
the CtrnGate signal, where n is the number of the counter.

To synchronize pulse generation counter output applications, share the CO Counter

Timebase and Start Trigger signal. Program all devices to use the same signal (usually
the 20MHzTimebase from one of the devices) as their CO Counter Timebase. More
generally, one device can be queried for its CO Counter Timebase source and that
terminal can be set as the source of the CO Counter Timebase for the other devices.
Program all devices to use the same signal as their Digital Edge Start Trigger. This is
typically the CtrnGate signal from one of the devices, where n is the number of the
counter.

Related concepts:

• Sample Clock Synchronization

Trigger Skew Correction

When sharing a trigger across multiple devices, the master device must respond to and
export the trigger, and the trigger signal must travel from the master device to slave

© National Instruments 169

 NI-DAQmx Key Concepts

devices. This results in skew in the trigger signal. On some devices using Reference
Clock synchronization, you can compensate for that skew by locking the trigger to the
Reference Clock or to a clock derived from the Reference Clock. When you lock triggers
to a clock, the device responds to those triggers on a subsequent edge of that clock,
rather than immediately. Therefore, skew correction results in increased latency.

To enable trigger skew correction for an application, specify which device is the master
and which devices are slaves using the SyncType DAQmx Trigger property.

Related concepts:

• Reference Clock Synchronization

Subsystem

A subsystem is the circuitry (ADCs, DACs, clocks, triggers, timing signals, timing
engines, and so on) that a device uses to acquire or generate samples. On DAQ devices,
there are separate subsystems for analog input, analog output, each counter, and
digital I/O. A subsystem is not synonymous with I/O type, however. For instance, each
counter's input and output circuitry make up one subsystem. The trigger bus can also
function as a subsystem.

Timing Engines
A timing engine is the circuitry a device uses to control an acquisition or generation.
Controlling an acquisition or generation includes:

• Utilizing timing signals to control when the device acquires or generates each
sample.
• Determining when to start and stop the acquisition or generation, using triggers
and other control signals.
• Producing clocks, triggers, and other control signals.
• Routing those signals to other devices or other parts of the same device.

Timing engines for different devices and subsystems provide different functionality.
The timing engine for an analog input or output subsystem uses a timebase to
produce a Sample Clock. The capabilities of a digital I/O timing engine depend on the

170 ni.com
 NI-DAQmx Key Concepts

device. Some can use change detection and/or handshaking for sample timing, while
others can also produce a Sample Clock. Some timing engines cannot produce a
Sample Clock, but can perform Sample Clock timing if the clock comes from an
external source, such as from another subsystem or from a source external to the
device. For example, counters produce no inherent timing signals, but can utilize a
Sample Clock from an external source. Some devices can perform Sample Clock timing
for digital I/O, but require an external clock.

All timing engines can respond to and route control signals, such as triggers. Not all
triggers are supported by all devices and measurement types.

Most devices have a single timing engine per subsystem. When a task reserves
resources from a timing engine, another task cannot reserve those same resources.
However, another task can use signals routed by that timing engine. For example, a
counter task can use the Sample Clock from an analog input task. One task can use the
Start Trigger from another task to synchronize when the tasks start. Reserving one part
of a timing engine reserves the entire timing engine. For example, if an analog input
task uses the Sample Clock from an analog output task, the analog input task must
reserve the analog input timing engine to utilize that external Sample Clock. As a
result, another task can not use the Sample Clock from the analog input timing engine.

Note On-demand analog input tasks must reserve resources from a timing
engine.

Some devices have multiple timing engines available for some subsystems. Multiple
timing engines allow a device to run multiple tasks simultaneously on the same
subsystem or to use different terminals for handshaking.

Related concepts:

• Multiple Timing Engines

• Simultaneous Tasks
• Handshaking Line Configuration

Related reference:

• Sample Clock Timing for Digital I/O

© National Instruments 171

 NI-DAQmx Key Concepts

Events
Triggers and clocks are input signals. Exportable triggers and clocks, such as the
sample clock, also can be output signals. Output signals that do not have a trigger or
clock counterpart are called events. Events are emitted to signify a device state
change, the arrival of a certain kind of sample, the production of a certain amount of
samples, or the passage of time.

NI-DAQmx includes the following events:

• Advance Complete Event—A signal emitted by a switch when it has finished

executing an instruction in its scan list.
• AI Hold Complete Event—A signal emitted by a multiplexed analog input circuit
when the analog signal at the physical channel being measured has been latched
or held. The AI Hold Complete Event is designed to signal an external multiplexer
to switch to the next channel. This signal was previously known as SCANCLK,
which is the legacy name of the external terminal where this signal can be emitted.
• Change Detection Event—A signal a DIO device generates after it detects a change-
a rising edge, a falling edge, or both rising and falling edges-on the data lines.
• Counter Output Event—A signal produced by a counter when it reaches terminal
count.
• Handshake Event—A signal generated by a DAQ device that is used for
handshaking. The assertion and deassertion times for this event are configurable
within a handshaking cycle for some devices. For these devices, the default
configuration is to mimic the 8255 protocol, which means that for input tasks, this
event asserts after the device has space available in its FIFO; for output tasks, it
asserts after valid data has been driven on the data lines; and in both input and
output tasks, the event deasserts after the Handshake Trigger has been asserted.
• Ready For Start Event—A signal produced when a device is ready to accept a Start
Trigger.
• Ready For Transfer Event—A signal sent to the peripheral device. The signal
indicates that the DAQ device is ready for a transfer. For burst handshake output
tasks, this means that the data is on the data lines. For input tasks, this means that
there is space available in the device FIFO. This event is used by devices that
support burst handshake timing.
• Sample Complete Event—A signal produced when the device acquires a sample
from every channel in a task.

172 ni.com
 NI-DAQmx Key Concepts

• Watchdog Timer Expired Event—A signal produced when a watchdog timer

expires. Watchdog timers are hardware features that can detect failures in the
software controlling the device.

Note The Sample Complete Event is not exportable.

Note Some event signals might be missed when you run an application. This
typically happens with high-speed event sources. NI-DAQmx does not
generate an error if this occurs.

Related concepts:

• Handshake Trigger
• Start Trigger

Related reference:

• Burst Handshake Timing for Digital I/O

Exported Signal Behaviors

You can export clocks, triggers, and events. The exported signal can exhibit one of
three behaviors. It can rapidly change from its current state and then back again
(pulse), change from its current state and remain at that state (toggle), or change from
its current state and remain at that new state for a period of time determined by the
configuration of the task before reverting back to the initial state (level). Most exported
signals have pulse behavior, but some signals have programmable output behavior.
For example, the Counter Output Event supports toggle as well as pulse behaviors. The
Sample Clock supports pulse and level behaviors. You specify the behavior through
the Output Behavior attribute/property for the exported signal.

Most exported signals exhibit the pulse behavior. When the event occurs, a finite pulse
is generated. The pulse width of some exported triggers and events is configurable.
The polarity of a signal exported as a pulse is also sometimes configurable. In the
following illustration, the polarity is set to active high, meaning the initial state change
of the signal is from low to high. When an event is exported as a pulse, each time the
event occurs, the exported signal pulses.

© National Instruments 173

 NI-DAQmx Key Concepts

When an event is exported as a toggle, each time the event occurs the exported signal
changes state just once and remains at its new state until the next occurrence of the
event. You can also set the initial state. In the following illustration, the initial state is
set to high. The Counter Output Event is an example of a signal that can toggle.

For level behavior, the signal changes state and remains at that state for a period of
time that is dependent on some configurable aspect of your task. If you are exporting
the Sample Clock, the exported signal goes high at the beginning of the sample and
goes low when the last AI Convert Clock pulse begins, as shown in the illustration.

Exported Sample Clock

Convert Clock

Note On some devices, the exported signal can go low at the beginning of
the sample and then high when the last AI Convert Clock pulse begins. Refer
to your device documentation for additional information.

Software Events
Software events provide an asynchronous notification mechanism for a set of DAQ
events. Unlike hardware events, software events do not require you to use a thread to
wait until data is available. Using event-based programming, you can write an
application that continues to perform work while waiting for data without resorting to
developing a multi-threaded application.

NI-DAQmx includes the following software events:

• Every N Samples Acquired Into Buffer Event—Occurs when the user-defined

number of samples is written from the device to the PC buffer. This event works
only with devices that support buffered tasks.

174 ni.com
 NI-DAQmx Key Concepts

Note Some devices—such as AO Series, E Series, and M Series

devices—require that the sample interval divide evenly into the buffer
size when using DMA as your data transfer mechanism. For instance, if
the buffer size is 1,000 samples, specifying 102 for this software event
generates an error. Specifying 100, however, would not generate an error.
If you are using IRQ as the data transfer method, the value does not need
to be evenly divisible. With IRQ, however, the Data Transfer Request
Condition attribute/property can affect when this software event occurs.

• Every N Samples Transferred From Buffer Event—Occurs when the user-defined

number of samples is written from the PC buffer to the device. This event works
only with devices that support buffered tasks.

Note Some devices—such as AO Series, E Series, and M Series

devices—require that the sample interval divide evenly into the buffer
size when using DMA as your data transfer mechanism. For instance, if
the buffer size is 1,000 samples, specifying 102 for this software event
generates an error. Specifying 100, however, would not generate an error.
If you are using IRQ as the data transfer method, the value does not need
to be evenly divisible. With IRQ, however, the Data Transfer Request
Condition attribute/property can affect when this software event occurs.

• Done Event—Occurs when the task completes execution or when an error causes
the task to finish. Recoverable errors that do not cause the task to finish do not
cause this event to fire. Calling the Stop Task function/VI to complete execution
similarly does not cause this event to fire.
• Signal Event—Occurs when the specified hardware signal occurs. Supported
signals include the counter output event, change detection event, sample
complete event, and the sample clock.
Related concepts:

• Events
• Buffering
• How Is Buffer Size Determined?
• Data Transfer Mechanisms
• When Is A Task Done?
• Sample Clock

© National Instruments 175

 NI-DAQmx Key Concepts

Reading and Writing Data

This section covers buffering and selecting data formats and organization.

Related concepts:

• Buffering
• Selecting Read and Write Data Format and Organization

Selecting Read and Write Data Format and Organization

NI-DAQmx provides multiple VIs and functions for reading and writing data. In many
cases, you can use multiple options. This section outlines the options and provides
some guidelines to follow to select the best option. Some data formats and
organizations are not supported in all ADEs.

The read and write VIs have two major selection criteria: data format and data
organization. Data format deals with the type of the data that is returned. For example,
counter reads can return integers or floating-point formats. The second category, data
organization, deals with the structure the data is returned in. For example, analog
reads have a variety of array and scalar organizations.

Related concepts:

• Data Formats in NI-DAQmx

• Data Organization

Data Formats in NI-DAQmx

Data format deals with the type of the data that is read or written.

Related concepts:

• Waveform Timing Limitations

• Digital Data (Integer Format)
• Raw Data

176 ni.com
 NI-DAQmx Key Concepts

Analog and Power Channel Data Formats

• Waveform —The waveform data format includes the channel name, timing, and
unit information with the actual 64-bit scaled floating-point data. Your ADE
provides a mechanism for extracting and setting individual parts of the waveform.

For input tasks, you can use the additional information for a variety of purposes.
For example, you can update graphs to show the timing information and include
labels with the channel names. Analysis routines can use the timing information
for calculations such as FFTs. Because there is overhead associated with including
this additional information, NI-DAQmx allows you to configure the information you
want to include.

For output tasks, the timing information is the primary field that is useful. A
waveform generated by a library may include timing information that you can use
to set up the timing for your output task.

When reading data, the waveform data includes the time when the first sample in
the waveform was acquired, t0, and the amount of time that elapsed between
each sample, dt. However, there are limitations on these two values.

• 64-Bit Floating-Point Numbers—The 64-bit floating-point number format allows

you to read or write scaled data with no additional information. Use this format to
work with scaled data that requires higher performance than the waveform format
provides. You might also use this format because it is a better match for the
libraries you plan to use.
• Unsigned and Signed Integers —The unsigned and signed integer format reads or
writes data in the native format of the device. Use this format for maximum
performance. The tradeoff is that your application has to understand how to
interpret and manipulate data that is not in engineering units.
Digital Channel Data Formats
• Waveform—The waveform data format includes the channel name and timing
information with the actual data represented in a dedicated digital format. Your
ADE provides a mechanism for extracting and setting individual parts of the
waveform.

The dedicated digital format represents digital data similar to logic analyzers and

© National Instruments 177

 NI-DAQmx Key Concepts

digital simulation tools. Each channel has no limits on the number of lines. In
addition, the digital format allows for additional states beyond basic 1s and 0s.
The ADE can take advantage of this format by tailoring data and graph displays for
the digital data.

For input tasks, you can use the additional information for a variety of purposes.
For example, you can update graphs to show the timing information and include
labels with the channel names. Because there is overhead associated with
including this additional information, NI-DAQmx allows you to configure the
information you want to include.

For output tasks, the timing information is the primary field that is useful. A
waveform generated by a library may include timing information that you can use
to set up the timing for your output task.

When reading data, the waveform data includes the time when the first sample in
the waveform was acquired, t0, and the amount of time that elapsed between
each sample, dt. However, there are limitations on these two values.

• Line Format (Boolean)—The line format represents each line within a channel as a
single Boolean value (a single byte). The states of the data are limited to 1s (true)
and 0s (false). Line formats are only provided for single sample reads and writes.

Use the line format when it is convenient for manipulating or displaying the digital
data. A typical application is controlling or reading back relay states. For high-
speed digital applications, you should generally not use the line format.

• Port Format (Integer)—The port format matches the native format of digital
devices that can represent only two digital states and organize individual lines into
collections known as ports. For more information, refer to Digital Data-Integer
Format.

The port format is the most efficient in terms of space, as it requires only a bit of
memory per line. In addition, the port format is often the most efficient in time as
it matches the native format of many devices.

The largest integer supported is 32 bits; therefore, you can read and write digital
channels with no more than 32 lines when using the port format.

178 ni.com
 NI-DAQmx Key Concepts

Counter Channel Data Formats

• 64-Bit Floating-Point Numbers—The 64-bit floating-point number format reads
scaled data. This format is best when you want to work with data in engineering
units.
• Unsigned Integers—The unsigned integer format reads data in the native format of
the device. Use this format for maximum performance. The tradeoff is that your
application will have to understand how to interpret and manipulate data that is
not in engineering units.
Raw Data Formats

The raw data format is defined by the native data format of the device.

Data Organization

The number of channels and the number of samples being read generally affect data
organization. For example, if 100 samples are read for eight analog channels using
64-bit floating-point format, a two-dimensional array is used with one index selecting
the channel and the second index selecting the sample. On the other hand, a simple
floating-point scalar value is sufficient to read one sample for one analog channel
using the 64-bit floating-point format. In general, the data organization for a particular
read or write call is the simplest reasonable format that can handle the number of
channels and samples requested.

There are often multiple legal data organizations to choose from. The main tradeoff to
consider for data organization is difficulty in manipulation of the data. You can use
data organizations that can handle multiple channels and multiple samples, but they
are generally the most complicated to manipulate.

Performance is similar for equivalent operations used to read or write data with
different data organizations.

• Waveform Data Organization—A waveform can contain one or more samples.

• 1D Waveform Array Data Organization—The single dimension of a waveform array
selects the channel. Each waveform can contain multiple samples, so a second
dimension is not required.
• Scalar Data Organization—Use scalars when you read or write a single sample on
a single channel. Scalar data is easy to manipulate. It is a good match when data is

© National Instruments 179

 NI-DAQmx Key Concepts

read and/or written to individual channels as needed.

Scalar data is generally not a good match for high-speed multiple sample
applications.

Scalar data also is not a good choice if multiple channels are acquired or generated
simultaneously. Using a multiple channel organization is easier and in the case of
output operations is actually a requirement.

• Array Data Organization—Array formats allow you to read or write data for
multiple channels and/or multiple samples at the same time. If you acquire or
generate on multiple channels simultaneously, reading and writing them at the
same time is easiest. Reading and writing multiple samples in one call is more
efficient than reading and writing samples one at a time.
• Raw Data Organization—The raw data organization is defined by the native
organization of the device.
Related concepts:

• Raw Data

Digital Data (Integer Format)

You typically use an integer format to read or write entire ports. In integer format, each
digital channel you read or write must fit into one integer. For example, if the largest
channel in a task consists of one 8-line port, you can use the 8-bit, 16-bit, or 32-bit
format. If you have more than one 8-line port or a port with more than eight lines in
any channel within a task, you must use the 32-bit format.

Each byte in the integer maps to a port in the channel, in the order in which you added
the ports to the channel. The least significant byte maps to the first port added to the
channel, with all unused bytes zeroed out. Therefore, if a channel contains two 8-line
ports, port0 and port1, and you added port0 to the channel before port1, the
channel uses a 32-bit representation:

unused unused port1 port0

Within a particular byte, each bit in the integer maps to a line in the corresponding

180 ni.com
 NI-DAQmx Key Concepts

port. NI-DAQmx orders the bits by line number, with the least significant bit mapping
to the lowest line number. Therefore, with these values assigned to the lines in the
channel, you might get the following:

port0/line0 0
port0/line1 0
port0/line2 1
port0/line3 0
port0/line4 1
port0/line5 1
port0/line6 0
port0/line7 1
port1/line0 1
port1/line1 1
port1/line2 1
port1/line3 0
port1/line4 1
port1/line5 0
port1/line6 0
port1/line7 1

The 32-bit binary representation of the channel is the following:

with an integer value of 38836.

If you specify only certain lines in a port to read or write, the full length of the integer is
still used, but all unused bits are zeroed out. Therefore, the following lines and values:

port0/line0 1

© National Instruments 181

 NI-DAQmx Key Concepts

port0/line3 1

yield the following 8-bit representation:

with an integer value of 9.

Interleaving

Interleaved samples prioritize samples before channels, such that the array lists the
first sample from every channel in the task, then the second sample from every
channel, up to the last sample from every channel.

Channel 0—Sample 1
Channel 1—Sample 1
Channel 2—Sample 1
Channel 0—Sample 2
Channel 1—Sample 2
Channel 2—Sample 2
...
Channel 0—Sample N
Channel 1—Sample N
Channel 2—Sample N

Non-interleaved samples prioritize channels before samples, such that the array lists
all samples from the first channel in the task, then all samples from the second
channel, up to all samples from the last channel.

Channel 0—Sample 1
Channel 0—Sample 2
...
Channel 0—Sample N
Channel 1—Sample 1
Channel 1—Sample 2
...
Channel 1—Sample N
Channel 2—Sample 1

182 ni.com
 NI-DAQmx Key Concepts

Channel 2—Sample 2
...
Channel 2—Sample N

Raw Data

Raw data is in the native format and organization of the device, read directly from the
device or buffer without scaling or reordering. The native format of a device can be an
8-, 16-, or 32-bit integer, signed or unsigned.

If you use a different integer size than the native format of the device, one integer can
contain multiple samples or one sample can stretch across multiple integers. For
example, if you use 32-bit integers, but the device uses 8-bit samples, one integer
contains up to four samples. If you use 8-bit integers, but the device uses 16-bit
samples, a sample might require two integers. This behavior varies from device to
device. Refer to your device documentation for more information.

NI-DAQmx does not separate raw data into channels. It returns data in an interleaved
or non-interleaved 1D array, depending on the raw ordering of the device. Refer to
your device documentation for more information.

Note If your device supports software calibration, NI-DAQmx does not

calibrate raw samples. Refer to calibration to find out if your device uses
software or hardware calibration.

Related concepts:

• Interleaving
• Device Calibration Considerations

Unscaled Data

Unscaled data is in the native format of the device, read directly from the device or
buffer without scaling. The native format of a device can be an 8-, 16-, or 32-bit integer,
signed or unsigned.

© National Instruments 183

 NI-DAQmx Key Concepts

Note If your device supports software calibration, NI-DAQmx does not

calibrate unscaled samples. Refer to calibration to find out if your device uses
software or hardware calibration.

Related concepts:

• Device Calibration Considerations

Waveform Timing Limitations

The limitation on t0 is that NI-DAQmx calculates the starting time for the task when
data is read the first time. At this time, NI-DAQmx calculates the starting time for the
task by reading the current system time and subtracting the number of samples
acquired × dt from the system. Therefore, if you call read after the acquisition is
complete, the calculated start time for the task is not accurate. This inaccuracy is
reflected in the t0 returned with the waveform data.

The limitation on dt is that for certain timing types, NI-DAQmx cannot calculate the
value of dt. When you use sample clock timing, NI-DAQmx calculates dt based on the
rate of the clock. Because NI-DAQmx does not know the rate when handshake,
implicit, on demand, or change detection timing is specified, NI-DAQmx returns dt as
0. Waveforms with a dt of 0 often do not work with the waveform analysis functions.
However, you can always update the value of dt in your application if you know the
expected rate of the timing source. Your ADE has an interface to update the value of dt.

Note The waveform data only supports symmetric timing between samples.
If your timing is not symmetric such as if each sample has a time stamp, the
waveform data format cannot contain the timing information. However, you
can use your ADE's analysis library to resample the data using a constant dt.
You can the use the resampled data with the waveform based analysis
library.

Buffering
A buffer is a temporary storage in computer memory for acquired or to-be-generated
samples. Typically this storage is allocated from your computer's memory and is also

184 ni.com
 NI-DAQmx Key Concepts

called the task buffer. For input operations, a data transfer mechanism transfers
samples from your device into the buffer where they wait for a call to the Read
function/VI to copy the samples to your application. For output operations, the Write
function/VI copies samples into the buffer where they wait for the data transfer
mechanism to transfer them to your device.

When Is a Buffer Created?

If you use the Timing function/VI and set the sample mode to finite or continuous,
NI-DAQmx creates a buffer. If you set sample mode to Hardware Timed Single Point,
NI-DAQmx does not create a buffer.

If you set the Data Transfer Mechanism to Programmed I/O or set the buffer size to zero
by using either the Input or Output Buffer Config function/VIs, NI-DAQmx does not
create a buffer (even if you also used the Timing function/VI). A data transfer
mechanism of programmed I/O means there is no buffer.

Related concepts:

• Data Transfer Mechanisms

• How Is Buffer Size Determined?
• Reference Triggering Impact on Buffers
• Continuous Acquisition and Generation with Finite Buffer Size
• Controlling Where in the Buffer to Read Samples
• Read Status Attributes/Properties and Buffers
• Controlling Where in the Buffer to Write Samples
• Write Status Attributes/Properties and Buffers

How Is Buffer Size Determined?

Input Tasks

If your acquisition is finite (sample mode on the Timing function/VI set to Finite
Samples), NI-DAQmx allocates a buffer equal in size to the value of the samples per
channel attribute/property. For example, if you specify samples per channel of 1,000
samples and your application uses two channels, the buffer size would be 2,000
samples. Thus, the buffer is exactly big enough to hold all the samples you want to
acquire. If the acquisition is continuous (sample mode on the Timing function/VI set

© National Instruments 185

 NI-DAQmx Key Concepts

to Continuous Samples), NI-DAQmx allocates a buffer equal in size to the value of the
samples per channel attribute/property, unless that value is less than the value listed
in the following table. If the value of the samples per channel attribute/property is less
than the value in the table, NI-DAQmx uses the value in the table.

Sample Rate Buffer Size

No rate specified 10 kS
0-100 S/s 1 kS
101-10,000 S/s 10 kS
10,001-1,000,000 S/s 100 kS
>1,000,000 S/s 1 MS

Note For performance reasons, the default buffer size for continuous
acquisitions differs slightly when logging is enabled.

You can override the default buffer size by calling the Input Buffer Config function/VI.

NI-DAQmx does not create a buffer when the sample mode on the Timing function/
VI is set to Hardware Timed Single Point.

Note Using very large buffers may result in diminished system performance
due to excessive reading and writing between memory and the hard disk.
Reducing the size of the buffer or adding more memory to the system can
reduce the severity of these problems.

Output Tasks

For generations, the amount of data you write before starting a generation determines
the size of the buffer. The first call to a Multiple Samples version of the Write function/
VI creates a buffer and determines its size.

You also can use the Output Buffer Config function/VI to create an output buffer. If you
use this function/VI, you must use it before writing any data.

186 ni.com
 NI-DAQmx Key Concepts

The samples per channel attribute/property on the Timing function/VI does not
determine the buffer size for output. Instead it is the total number of samples to
generate. If n is your buffer size, setting samples per channel to 3×n generates the data
in the buffer exactly three times. To generate the data exactly once, set samples per
channel to n.

NI-DAQmx does not create a buffer when the sample mode on the Timing function/
VI is set to Hardware Timed Single Point.

Continuous Acquisition and Generation with Finite Buffer Size

The NI-DAQmx API uses circular buffers as shown in the following figure. For input
operations, portions of data are read from the buffer while the buffer is filled. Likewise
for output operations, portions of the buffer can be written to while the buffer is
emptied. Using a circular buffer, you can set up your device to continuously acquire
data in the background while NI-DAQmx retrieves the acquired data.

Incoming Data
from the device End of Data Current Read Mark End of Data
to the PC

Data transferred from PC

buffer to your application

Current Read Mark End of Data End of Data Current Read Mark

When a continuous operation reaches the end of the buffer, it returns to the beginning
and fills up (or in the case of output operations, reads from) the same buffer again.
Your input application must retrieve data in blocks, from one location in the buffer,
while the data enters the circular buffer at a different location, so newer data does not
overwrite unread data.

While a circular buffer works well in many applications, two possible problems can
occur with this type of acquisition: Your application might try to retrieve data from the
buffer faster than data is placed into it, or your application might not retrieve data

© National Instruments 187

 NI-DAQmx Key Concepts

from the buffer before NI-DAQmx overwrites the data into the buffer. When your
application tries to read data from the buffer that has not yet been collected, NI-
DAQmx waits for the data to be acquired and then returns the data. If your application
does not read the data from the circular buffer fast enough, you receive an error,
stating that some data has been overwritten and lost. If losing data in this way is not
important to you, change the setting of the OverWrite Mode attribute/property.

Reference Triggering Impact on Buffers

Even though you have set the sample mode parameter on the Timing function/VI to
Finite Samples, the acquisition runs continuously until the Reference Trigger occurs.
The number of posttrigger samples in your buffer after the acquisition has finished is
equal to the value of the samples per channel parameter from the Timing
function/VI minus the number of pretrigger samples from the Trigger function/VI.
When using a Reference Trigger, the default read position is Relative To First Pretrigger
Sample with a read Offset of 0.

Controlling Where in the Buffer to Read Samples

Default read behavior depends on if a Reference Trigger is configured. If there is no

Reference Trigger, NI-DAQmx reads samples beginning with the first sample acquired
with each subsequent read beginning where the previous one left off. If there is a
Reference Trigger, NI-DAQmx reads samples beginning with the first pretrigger sample
and cannot begin reading until the acquisition has finished. This default behavior can
be changed by using the Relative To and Offset attributes/properties.

The place where a read begins is called the Current Read Position. Each time data is
read, the Current Read Position is computed based on the settings of the Relative To
and Offset attributes/properties. When there is no Reference Trigger, the default for
Relative To is Current Read Position. When there is a Reference Trigger, the default for
Relative To is First Pretrigger Sample. In either case, the default for Offset is 0.
Changing the settings of these two attributes/properties controls where in the buffer
data is read.

During a continuous acquisition, for example, you can always read the most recent
1000 points by setting Relative To to Most Recent Sample and Offset to -1000. Even
when a Reference Trigger is configured, you can begin reading samples immediately by

188 ni.com
 NI-DAQmx Key Concepts

setting Relative To to First Sample.

Read Status Attributes/Properties and Buffers

The three Read Status attributes/properties are useful for observing the progress of
your acquisition.

• The Current Read Position is the place in the buffer where the next read begins if
the Relative To attribute/property is Current Read Position and the Offset is 0. In
any case, the Current Read Position is always where the last read left it.
• Total Samples per Channel Acquired is the total number of samples per channel
acquired by the device and transferred into the buffer.
• Available Samples per Channel is computed by first calculating the Current Read
Position based on the settings of the Relative To and Offset attributes/properties
and then subtracting this number from Total Samples per Channel Acquired.

Controlling Where in the Buffer to Write Samples

By default, NI-DAQmx writes samples sequentially beginning with the first sample in
the buffer, and each write begins where the previous one left off. The sample where a
write begins is called the Current Write Position. Each time data is written, the Current
Write Position is computed based on the settings of the Relative To and Offset
attributes/properties. The default write behavior results from the default settings of
these two attributes/properties. The default for Relative To is Current Write Position
and the default for Offset is 0. Changing the settings of these two attributes/properties
controls where in the buffer data is written.

Write Status Attributes/Properties and Buffers

The three Write Status attributes/properties are useful for observing the progress of
your generation.

• The Current Write Position is the place in the buffer where the next write begins if
the Relative To attribute/property is Current Write Position and the Offset is 0. In
any case, the Current Write Position is always where the last write left it.
• Total Samples per Channel Generated is the total number of samples per channel
generated by your device since the task started.

© National Instruments 189

 NI-DAQmx Key Concepts

• Space Available in Buffer is computed by first calculating the Current Write Position
based on the settings of the Relative To and Offset attributes/properties and then
subtracting this number from the sum of Total Samples per Channel Generated
and the buffer size. If regeneration is allowed, the Space Available in Buffer value is
capped at the buffer size and grows from 0 to the buffer size repeatedly.

Glitching

Glitching refers to the generation of a waveform in which, when transitioning from

old samples in the buffer to new samples, a mixture of old and new samples is
generated rather than just the new samples. This situation may occur when
continuously generating samples if the Regeneration Mode write attribute/property is
set to Allow Regeneration. Glitching occurs when, while you write new samples, a
subset of these new samples are generated and then, since you have not finished
writing all of the new samples, a subset of the old samples is generated. After your
write operation completes, only the new samples are generated.

NI-DAQmx reduces the likelihood of glitching by ensuring that the writing of new
samples does not overtake the generation. This glitching protection works by pausing
the write until the total samples generated is more than one buffer ahead of the
current write position. However, NI-DAQmx does not ensure that the generation does
not overtake the new samples being written. If this occurs, a glitch results, and NI-
DAQmx reports the kWarningPotentialGlitchDuringWrite warning (error 200015). The
following suggestions can help you to avoid generating glitches:

• Write new samples that are almost one buffer ahead of the total samples
generated. By writing the new samples almost one buffer ahead of the total
samples generated, there is less of a chance that the generation overtakes the new
samples that are being written. If you are updating the entire buffer at a time, wait
to write the new samples until the total samples generated attribute/property is
one sample greater than an integral number of buffer sizes. For example, if the
buffer size is 1000 samples, wait to write new samples until the total samples
generated is either 1001, 2001, 3001, and so on.
• Increase the buffer size. If the buffer size is larger, there is less of a chance that the
generation overtakes the new samples that are being written.
• Decrease the sample clock rate. If the sample clock rate is slower, there is less of a
chance that the generation overtakes the new samples that are being written.

190 ni.com
 NI-DAQmx Key Concepts

In the following graphs, the sine wave is generated from old samples and the square
wave is generated from the new samples. The first graph depicts glitching.

10.0
7.5
5.0
2.5
Amplitude

0
–2.5
–5.0
–7.5
Glitching
–10.0
0.0E+0 6.0E+0
Time

The second graph depicts the same waveforms without glitching.

10.0
7.5
5.0
2.5
Amplitude

0
–2.5
–5.0
–7.5
–10.0
0.0E+0 6.0E+0
Time

Data Transfer Mechanisms

There are four primary ways to transfer data across the PCI bus: Direct Memory Access
(DMA), Interrupt Request (IRQ), Programmed I/O, and USB Bulk.

Direct Memory Access (DMA)

DMA is a mechanism to transfer data between the device and computer memory
without the involvement of the CPU. This mechanism makes DMA the fastest available
data transfer mechanism. NI uses DMA hardware and software technology to achieve
high throughput rates and to increase system utilization. DMA is the default method of
data transfer for DAQ devices that support it.

Note DAQCard and USB devices do not support DMA .

© National Instruments 191

 NI-DAQmx Key Concepts

Interrupt Request (IRQ)

IRQ transfers rely on the CPU to service data transfer requests. The device notifies the
CPU when it is ready to transfer data. The data transfer speed is tightly coupled to the
rate at which the CPU can service the interrupt requests. If you are using interrupts to
acquire data at a rate faster than the rate the CPU can service the interrupts, your
systems may start to freeze.

Programmed I/O

Programmed I/O is a data transfer mechanism in which a buffer is not used and instead
the computer reads and writes directly to the device. Software-timed (on-demand)
operations typically use programmed I/O.

USB Bulk

USB Bulk is a buffered, message-based streaming mechanism for data transfer. This
high-speed method is the default transfer mechanism for USB devices.

Memory Mapping

Memory mapping is a technique for reading and writing to a device directly from your
program, which avoids the overhead of delegating the reads and writes to kernel-level
software. Delegation to the kernel is safer, but slower. Memory mapping is less safe
because an entire 4 KB page of memory must be exposed to your program for this to
work, but it is faster. Memory mapping is set by default if your device supports it.

Changing Data Transfer Mechanisms between DMA and IRQ

There are a limited number of DMA channels per device (refer to your device
documentation). Each operation (AI, AO, and so on) that requires a DMA channel uses
that mechanism until all of the DMA channels are used. After all of the DMA channels
are used, you receive an error if you try to run another operation requesting a DMA
channel. If appropriate, you can change one of the operations to use interrupts. For NI-
DAQmx, use the Data Transfer Mechanism channel attribute/property.

192 ni.com
 NI-DAQmx Key Concepts

Regeneration
Generating the same data more than once is called regeneration. You can configure NI-
DAQmx to allow or disallow regeneration by setting the Regeneration Mode attribute/
property. By default, NI-DAQmx allows regeneration for sample clock timing and
disallows it for handshaking or burst handshaking timing. When regeneration is
disallowed, new data must be continuously written to the device.

Allowing Regeneration and Using Onboard Memory

When the Use Only Onboard Memory attribute/property is true, NI-DAQmx transfers
data only once to the device and that data is continually regenerated from there.
Attempting to write new data to the device after starting the task returns an error. In
addition, the amount of data written to the device before starting the task must fit in
the onboard memory of the device.

When the Use Only Onboard Memory attribute/property is false, NI-DAQmx

continuously transfers data from the host memory buffer to the device even though
this data is not changing. Thus, if you write new data to the device after starting the
task, that new data is generated and regenerated until you write more new data. This
type of regeneration is sometimes called PC memory or user buffer regeneration.

When this attribute/property is false, you can also set the Data Transfer Request
Condition attribute/property to specify when to transfer data from the host buffer to
the device.

TDMS Logging
Technical Data Management Streaming (TDMS) is a binary file format that allows for
high-speed data logging. When you enable TDMS data logging, NI-DAQmx can stream
data directly from the device buffer to the hard disk. NI-DAQmx improves performance
and reduces the disk footprint by writing raw data to the TDMS file, including the
scaling information separately for use when reading back the TDMS file. You can also
read data while logging to disk.

For optimal performance, follow these tips:

© National Instruments 193

 NI-DAQmx Key Concepts

• Use a PCI Express or PXI Express device with a RAID array.

• Log data only. For very high-speed acquisitions, logging and reading data can slow
performance.
• If logging and reading data, ensure the number of samples per channel to read is
evenly divisible by the sector size of the hard disk.
• If manually configuring the buffer size, choose a multiple of eight times the sector
size of the hard disk. For instance, if your sector size is 512 bytes, your buffer size
might be 4,096 samples.

NI provides a number of mechanisms for reading TDMS files, including software

support in LabVIEW, LabWindows/CVI, ANSI C, DIAdem, and Measurement Studio. In
addition, NI provides a Microsoft Excel plug in. Refer to ni.com/tdms for additional
information. For information about high-speed data streaming, refer to ni.com/
streaming.

Related information:

• The NI TDMS File Format

• Streaming Architecture of the Industry’s Highest Performance PXI Express Platform

Logging Across Multiple Files

You can split TDMS logs across multiple files by using either the DAQmx Start New File
function/VI or the Logging.SampsPerFile attribute/property.

Start New File

The DAQmx Start New File function/VI starts a new TDMS file with the specified file
name the next time data is written to disk. If the logging mode is set to Log, data is
written to disk on multiples of the Logging.FileWriteSize attribute/property. For
example, if Logging.FileWriteSize is set to 150 when you use this function/VI, a new
TDMS file is created at the next 150 sample interval. If the logging mode is set to
Log and Read, data is written to disk when you call the DAQmx Read function/VI.

Samples Per File

The Logging.SampsPerFile attribute/property specifies the number of samples to log

to a TDMS file before creating a new file. New files are named with the convention of

194 ni.com
 NI-DAQmx Key Concepts

<filename>_####.tdms, where #### starts at 0001 and increments

automatically with each new file.

You can set the Logging.FilePath attribute/property while the task is running to change
the file path. The change takes place with the next file created. If you change the log
name, the numbering of the files resets to 0001. You can also change the directory to
save log files to by specifying a name ending in a back slash (for example, D:\). If you
specify a directory, the log file name remains the same and file numbering continues
off of the old directory. For example, if you change the directory from C:\ to D:\
while logging to testlog_0003.tdms, testlog_0003.tdms is written to C:\,
and testlog_0004.tdms is written to D:\.

Note If the Logging.LoggingMode attribute/property is set to Log Only,

Logging.SampsPerFile must be divisible by the Logging.FileWriteSize
attribute/property, which is based, by default, on the buffer size.

To change a file immediately, you can also use the DAQmx Start New File function/VI
while the Logging.SampsPerFile attribute/property is active.

On-Demand Logging

For on-demand logging, NI-DAQmx creates a Time channel in the TDMS file that
contains timestamp data. The Time channel can be omitted with the WfmAttr Read
attribute/property, which specifies the data to return. To disable the Time channel, set
WfmAttr to Samples.

Pausing Logging

You can pause or resume logging by setting the Logging.Pause attribute/property. This
can be used if you do not want to initially log data but want to begin when a certain
condition is met. You can also use this attribute/property to temporarily disable
logging.

If you re-enable logging after disabling logging in an application, a new group is

created in the log file. This group is denoted by the name <group name> #1, where
the number is automatically incremented.

© National Instruments 195

 NI-DAQmx Key Concepts

Before you resume logging data in Log and Read mode, you can set the Offset
attribute/property to log data that was previously read while logging was paused. For
example, if you set Offset to -1000 and resume logging, NI-DAQmx logs the 1000
samples read before Logging.Pause is enabled. After resuming logging, Offset is
automatically reset to 0.

Signal Routing
A single routing API now controls all the digital routing for NI measurements devices.
Signal routing controls the mapping of digital signals or triggers across hardware such
as digital multiplexers or public trigger buses.

Here is a basic list of features in the signal routing API:

• A single unified signal routing API for all devices supported in NI-DAQmx
• Multi-device routing: a single route will be able to span two devices
• Logical inverter support
• Double driving prevention across public trigger buses

Specifying a Route
A route is a connection between a pair of terminals. The source and destination
terminals make a terminal pair. Any time the source or destination terminal of a signal
is specified, a route is created. Usually, you specify only one terminal for the route. For
example, if you export a signal to the I/O connector, you set the destination terminal,
but the source terminal is predetermined by the name of the signal. If you import a
hardware trigger for a task, you can set the source terminal, but the destination
terminal is predetermined by the name of the trigger.

Single-Device Routing Versus Multi-Device Routing

A single-device route is a connection between two terminals on the same physical
device. Before NI-DAQmx, all routes were single-device routes. NI-DAQmx introduces
multi-device routing. An example is specifying a terminal on a device as the source of a
Start Trigger for a second device.

196 ni.com
 NI-DAQmx Key Concepts

Creating Multi-Device Routes

NI-DAQmx supports multi-device routing. You simply specify the source terminal and
destination terminal. If the two terminals are on different devices, NI-DAQmx uses the
trigger bus to route the signal from the source device to the destination device. NI-
DAQmx also selects and reserves an available trigger line on the trigger bus.

Plugging in and Registering Your RTSI Cable in MAX

To create a multi-device route, the source and destination devices must share a trigger
bus both physically and logically in MAX. For PCI devices, you must register your RTSI
cable in MAX. For more information on how to register (or add) a RTSI cable in MAX,
refer to Measurement & Automation Explorer Help for NI-DAQmx. If you do
not register your RTSI cable, NI-DAQmx fails to create a route. PXI trigger backplanes
are automatically registered when you identify your chassis type in MAX.

Dynamically Selecting Trigger Bus Lines

Management of trigger lines is another feature of NI-DAQmx routing. If you hard-code
two measurement tasks to the same trigger line for different signals, at least one of the
measurement tasks causes a resource conflict. Multi-device routing allows you to
dynamically select trigger lines at run time. This means that NI-DAQmx selects any
available trigger line. You can still select a specific trigger bus line by splitting your
multi-device route into two single-device routes. However, the two static routes lose
the ability to dynamically choose an available trigger at run time.

Task-Based Routing
Task-based routing is the most common form of routing. When you create a hardware
trigger or export a hardware signal, you create a task-based route. These routes are
embedded in a task. You can use Export Signal function/VI to explicitly make a task-
based route. When the task is committed, the route is committed. When the task is
cleared, the route is unreserved. Clearing the task does not always clear the route.
Refer to Lazy Line Transitions for more information.

Related concepts:

© National Instruments 197

 NI-DAQmx Key Concepts

• Lazy Line Transitions

Immediate Routing
Immediate routing is not associated with any task. An immediate route is a pair of fully
qualified terminal names specifying the source and destination of the route. When an
immediate route is created, the route gets committed to hardware immediately.
Because an immediate route does not have a task governing its lifetime, you need to
actively destroy the route. Create an immediate route with the Connect Terminals
function/VI and destroy it with the Disconnect Terminals function/VI. Also, if you make
an immediate route multiple times with several calls to Connect Terminals, only one
call to Disconnect Terminals releases the route. There are other ways to destroy routes
such as resetting the device. Refer to Device Resetting and Interactions with Routing
for more information.

Related concepts:

• Syntax for Terminal Names

• Device Resetting and Interactions with Routing

Logical Inversion of Signals

If you route a signal to or from an external device, you might need to invert the polarity
of the signal. For example, you may need to change a high gating signal to a low gating
one or look at falling edges instead of rising edges. With routing in NI-DAQmx, you can
invert a signal during the routing. If there is an inverter available along the route, the
inversion of the signal takes place. Inversion could fail if an overlapping route has
previously reserved the inverter with an incompatible configuration.

Routing and Hardware Sharing

Two or more routes might overlap in a compatible fashion—especially if these two
routes have the same source and destination. When routes overlap in a compatible
fashion, the routing software handles this situation.

As an example, assume that two separate tasks make the same route. The resources
associated with the routes are not released until both tasks have been unreserved.

198 ni.com
 NI-DAQmx Key Concepts

Mixing task-based and immediate routes is acceptable, too. However, the hardware
resources are not released until all task-based routes have been released and the
immediate route has been disconnected.

Releasing a task-based route using the Disconnect Terminals function/VI is not

possible. You must release task-based routes by unreserving or clearing the task. In
LabVIEW, if you explicitly create your task with the Create Task VI, you must clear it
with the Clear Task VI. Otherwise, LabVIEW clears your task for you when the top level
VI of your program stops executing.

Line Tristating Issues

During device initialization, all terminals on the I/O connector and trigger buses are
tristated. Tristated means the terminal is floating or at high impedance. For the
terminal to be driven from the device, the tristate buffer associated with the terminal
must be enabled.

For instance, assume that you have a device with a single bidirectional terminal on the
I/O connector. The terminal on the I/O connector is called the trigger terminal for
reference purposes. Also, the trigger terminal of the device is bidirectional because it
can accept an external trigger signal or export the internal trigger signal. The exported
internal trigger signal could be different from the external trigger signal.

Scenario Usage and Consequences

This is a common case for triggering an
operation from an external source. As a result of
The trigger terminal is being driven by an this operation, you must disable the tristate
external trigger signal only. buffer associated with the trigger terminal so
that the internal trigger signal does not drive the
trigger terminal, too.
In this case, an internally generated trigger is
starting the device. This signal could be useful
for other devices, too. To export this trigger
The trigger terminal is being driven by the signal, you must enable the tristate buffer
internal device trigger only. associated with the trigger terminal, so the
device can drive the pin with the trigger signal. It
is important that there is no external signal
hooked up to the trigger terminal. If it is

© National Instruments 199

 NI-DAQmx Key Concepts

Scenario Usage and Consequences

inconvenient to unhook the external signal, you
must make sure the external signal is at least
tristated.
Driving the trigger terminal both internally and
externally is called double driving. If the internal
and external sources drive the signal in opposite
The trigger terminal is being driven by both the
directions, it signals problems. Usually the
internal device trigger AND an external trigger
driving hardware is damaged, but more extreme
signal.
consequences can occur as well. Remember to
be very careful to avoid double driving any
terminals on your I/O connectors.

Lazy Line Transitions

When a task-based route gets created and released, it does not necessarily go away.
The hardware resources associated with the route are released, but the configuration
might remain so that glitches are minimized.

By default, all tristate buffers associated with I/O connector terminals are disabled.
When a task-based route with a destination on the I/O connector is released, the
tristate buffer associated with the I/O connector terminal is not disabled. This means
that even though the route was released, glitches are minimized on the destination
terminal on the I/O connector. If you do not want this behavior, you can disable the
tristate buffer associated with the I/O terminal with the Tri-State Output Terminal
function/VI. Or, if you initially created the route by exporting a signal with the Export
Signal function/VI, you can also disable the tristate buffer by calling the Export Signal
function/VI with the same signal name but with an empty string as the output
terminal. Putting the terminal back into a tristate mode is necessary if an external
signal must be connected to the I/O terminal. If the terminal is not tristated first,
double driving the terminal damages the hardware.

All other connectors, such as the RTSI connector, use a different rule. When the task-
based route associated with the RTSI connector is released, the tristate buffer
associated with the RTSI terminal is disabled. The RTSI bus is a public bus that is
shared by multiple devices. All drivers using the RTSI bus assume that all devices on
the bus are tristated. The I/O connector is different because you have full control of it.

200 ni.com
 NI-DAQmx Key Concepts

You must keep track of which terminals are tristated or being driven by internal or
external signals.

Device Resetting and Interactions with Routing

When you reset a device in NI-DAQmx, every immediate route and task associated with
the device is invalidated. When the task is invalidated, all the routes are invalidated,
too. If a task-based route is invalidated using a device reset, its parent task also is
invalidated.

For instance, device A is running a task that performs an analog input operation. This
same analog input operation receives its Start Trigger from device B. This task spans
across device A and B due to the multi-device routing. If device B gets reset, all routes
on device B are destroyed. The invalidation of the task-based route on device B causes
its parent task on device A to be invalidated, too. You must consider these possible
consequences when issuing a device reset. If the route between device A and B is an
immediate route, there is not a relationship between the immediate route and the
task. This could result in the task not being invalidated. You need to decide if you need
to preserve the task.

Device Routing in MAX

To find the device routing table for your device, launch MAX and select Devices and
Interfaces. Click a device to open a tabbed window in the middle pane. Click the
Device Routes tab at the bottom of the pane to display the device routing table.

Note MAX does not display the device routing table for SCXI chassis, SCC
connector blocks, or RTSI cable devices.

Each cell in the table is an index with the valid source and destination terminal for the
device. These are the same terminal names you can find in the Terminal Name I/O
control in LabVIEW.

If a route is possible between a source and destination terminal, the intersecting cell is
colored green or yellow. A green cell indicates the route can be made without
consuming any important resource of your device. A yellow cell indicates that

© National Instruments 201

 NI-DAQmx Key Concepts

although the route is possible, something important must be consumed to create the
route. Placing the cursor over a yellow square reveals the resource used in the
subsystem used indicator. Usually, the sacrificed resource is a counter.

When you display the device routing table for a cDAQ chassis or a C Series device, the
table contains all of the terminals for the chassis and all devices installed in the
chassis.

Counters
This section provides an overview of counters in NI-DAQmx and the two counter
measurement method for period and frequency measurements.

Related concepts:

• Counter Parts in NI-DAQmx

• Two Counter Measurement Method

Paired Counters
For more complex and accurate measurements and generations, a counter is paired
with another counter with dedicated connections to and from each counter. This
pairing allows you to perform such operations as finite pulse-train generations, higher
accuracy frequency and period measurements, and cascaded edge counting. Paired
counters are generally numbered sequentially. For example, ctr0 and ctr1 are a pair,
ctr2 and ctr3 are a pair, and so on.

Two Counter Measurement Method

For period and frequency measurements, you also can use a second counter. For most
applications, the low frequency with one counter method is sufficient and desirable
because it uses fewer resources. However, if you have a high-frequency or widely
varying signal, you can use one of the two counter measurement methods—the high-
frequency measurement method or the large-range measurement method. Depending
on the rate of your input signal and measurement method used, your measurement is
subject to different amounts of quantization error. In two counter applications, you
only need to call the Create Channel function/VI once, specifying only the counter

202 ni.com
 NI-DAQmx Key Concepts

channel to which you want to connect your input signal. NI-DAQmx automatically
takes care of making the internal routes necessary to perform the measurement across
paired counters.

Related concepts:

• High Frequency Two-Counter Measurement Method

• Large-Range Two Counter Measurement Method
• Quantization Error
• Paired Counters

High Frequency Two-Counter Measurement Method

Use this high-frequency measurement method if you measure a digital frequency or

period of a signal with a high frequency component. To perform measurements using
this method in NI-DAQmx, a paired counter generates a pulse train with a period
specified using the measurement time attribute/property. The measurement time is
generally much larger than the period of the input signal being measured to reduce
quantization error. However, the measurement time must be small enough to keep the
counter from rolling over. The measurement counter counts the number of periods of
the input signal that occur during the measurement time, averages the results, and
returns the averaged value in the Read function/VI. The value returned is calculated as
follows:

Period (in seconds) = Measurement Time / Number of Periods Counted

Frequency (in Hz) = Number of Periods Counted / Measurement Time

To determine if you should use the high-frequency measurement method, refer to the
quantization error tables. If the quantization error listed for the one-counter method is
too high, use the high-frequency measurement method instead.

Related concepts:

• Paired Counters
• Quantization Error

Large-Range Two Counter Measurement Method

© National Instruments 203

 NI-DAQmx Key Concepts

If you measure the digital frequency or the period of a counter signal, you can use this
two-counter method to measure signals with large ranges. This method is useful when
you have a widely varying signal to measure and would like increased accuracy
throughout the entire range. Refer to the quantization error section for more
information on increasing measurement accuracy with the large-range measurement
method. You can also use this method to measure signal frequencies that are faster
than your counter timebase rate as long as the input signal does not exceed the
maximum input frequency supported by the counter.

To perform measurements using this method in NI-DAQmx, a paired counter is used to

divide the input signal by a value specified using the Divisor attribute/property.
However, you need to be careful the Divisor you choose does not cause the counter to
roll over. This divisor has the effect of shifting the measurable frequency range
upward. The Divisor scales the measured period and returns data according to the
following equations:

Period = Measured Period / Divisor

Frequency = Divisor × Measured Period

For example, if you use a 24-bit counter and the Counter Timebase Rate is 100 kHZ, the
measurable frequency range is approximately 0.006 Hz to 50 kHz because

Counter Timebase
Frequency = × Divisor
Count

100 kHz 100 kHz

Frequency = × 1 = 0.006 Hz and × 1 = 50 kHz
224 2

However, with a divisor of 4, the measurable frequency range is 0.024 Hz to 200 kHz
because

Counter Timebase Rate

Frequency = × Divisor
Count

100 kHz 100 kHz

Frequency = × 4 = 0.024 Hz and × 4 = 200 kHz
224 2

To determine if you should use the large-range measurement method, refer to the
quantization error tables. If the quantization error listed for the one-counter method in

204 ni.com
 NI-DAQmx Key Concepts

that section is too high, use the large-range measurement method instead.

Related concepts:

• Quantization Error
• Paired Counters

Quantization Error

Quantization error is the inherent uncertainty in digitizing an analog value as a result

of the finite resolution of the conversion process. Quantization error depends on the
number of bits in the converter, along with its errors, noise, and nonlinearities.
Quantization error occurs due to phase differences between the input signal and the
counter timebase. Depending on how the phase of the input signal and counter
timebase align, the count measured has three possibilities:

• Miss Both Edges—The counter recognizes neither the first rising edge nor the last
rising edge of the counter timebase, giving a count of one less than the expected
value.
• Miss One, Catch One—The counter only recognizes the first rising edge or the last
rising edge of the counter timebase, giving the expected value.
• Catch Both Edges—The counter recognizes both the first rising edge and the last
rising edge of the counter timebase, giving a count of one more than the expected
value.

GATE
SOURCE
Miss Both Edges 0 1 2 3 3

Miss One, Catch One 0 1 2 3 4

Catch Both Edges 1 2 3 4 5

For example, if the counter timebase rate is 20 MHz, and the frequency of the input
signal is 5 MHz, the measured value can be 3, 4, or 5 due to quantization error. This
corresponds to a measured frequency of 6.67 MHz, 5 MHz, or 4 MHz, resulting in a
quantization error of as much as 33%.

Quantization Error with One Counter Time Measurements

For one counter time measurements, the following equation gives the quantization

© National Instruments 205

 NI-DAQmx Key Concepts

error.

ErrQuantization = Actual Frequency / (Counter Timebase Rate - Actual Frequency)

You can reduce the quantization error for single counter time measurements by
increasing the counter timebase rate. The following table shows the quantization error
for various timebase rates with given input signal frequencies:

Actual Frequency of Input Signal Counter Timebase Rate Quantization Error

10 Hz 100 kHz 0.01%
100 Hz 100 kHz 0.10%
1 kHz 100 kHz 1.01%
10 kHz 100 kHz 11.11%
10 kHz 20 MHz 0.05%
100 kHz 20 MHz 0.50%
1 MHz 20 MHz 5.26%
2 MHz 20 MHz 11.11%
5 MHz 20 MHz 33.33%

For period and frequency measurements, if the quantization error is too large for your
input signal, you might consider using one of the two counter period and frequency
measurements.

Quantization Error with High Frequency Two Counter Method

For two counter high-frequency measurements, the following equations give the
quantization error.

ErrQuantization = Actual Period / Measurement Time

ErrQuantization = 1 / (Measurement Time × Actual Frequency)

Increasing the measurement time reduces the quantization error. The quantization
error also decreases with higher frequency input signals. The following table shows

206 ni.com
 NI-DAQmx Key Concepts

the quantization error for various measurement times and input signal frequencies:

Actual Frequency of Input Signal Measurement Time Quantization Error

10 kHz 1 ms 10.00%
100 kHz 1 ms 1.00%
1 MHz 1 ms 0.10%
5 MHz 1 ms 0.02%
10 MHz 1 ms 0.01%
10 kHz 10 ms 1.00%
100 kHz 10 ms 0.10%
1 MHz 10 ms 0.01%
5 MHz 10 ms 0.002%
10 MHz 10 ms 0.001%
10 kHz 100 ms 0.10%
100 kHz 100 ms 0.010%
1 MHz 100 ms 0.001%
5 MHz 100 ms 0.0002%
10 MHz 100 ms 0.0001%
10 kHz 1s 0.010%
100 kHz 1s 0.0010%
1 MHz 1s 0.0001%
5 MHz 1s 0.00002%
10 MHz 1s 0.00001%

As the table shows, quantization error is reduced at higher frequencies of the input
signal. However, the advantage of this measurement method disappears at lower
frequency input signals because you need to measure longer to gain accuracy, and you
use up more resources.

© National Instruments 207

 NI-DAQmx Key Concepts

Quantization Error with Large Range Two-Counter Measurement Method

For two counter large-range measurements, the following equations give the
quantization error.

ErrQuantization = 1 / (Divisor × Counter Timebase Rate × Actual Period - 1)

ErrQuantization = Actual Frequency / (Divisor × Counter Timebase Rate - Actual

Frequency)

Increasing the divisor, increasing the counter timebase rate, or lowering the input
signal frequency reduces the quantization error. The table lists the quantization error
for various divisors and input signal frequencies assuming a counter timebase rate of
20 MHz.

Actual Frequency of Input Signal Divisor Quantization Error

1 kHz 4 0.00125%
100 kHz 4 0.125%
1 MHz 4 1.266%
1 kHz 10 0.0005%
100 kHz 10 0.05%
1 MHz 10 0.5%
1 kHz 100 0.00005%
100 kHz 100 0.005%
1 MHz 100 0.05%

Notice that the use of a divisor reduces the quantization error. Although the high
frequency two-counter measurement method is more accurate at higher frequencies,
the large range two-counter measurement method is more accurate throughout the
range in a shorter amount of time. For example, if the input signal varies between 1
kHz and 1 MHz and you require a maximum quantization error of 2.0% at any signal
range, you need a minimum measurement time of 50 ms using the high frequency
two-counter measurement method. To gain the same accuracy using the large range
two-counter method requires a maximum measurement time of 4 ms for any one

208 ni.com
 NI-DAQmx Key Concepts

measurement.

Quantization Error with Dynamic Averaging Method

For dynamic averaging method, the following equation gives the quantization error.

ErrQuantization = Actual Frequency / (Number of Signal Periods x Counter Timebase

Rate - Actual Frequency)

To calculate the quantization error, this equation uses the Number of Signal Periods of
the input signal that have been measured and averaged. The number of periods is
dynamically adjusted based on a combination of the measurement time and divisor
settings, plus the period of the input signal being measured as shown in the following
equation.

Number of Signal Periods = Max(1, Min( Divisor, Floor(Measurement Time / Signal

Period)))

Increasing the divisor or measurement time results in a larger number of signal

periods being averaged, and more signal periods in turn reduces the quantization
error.

The following table shows examples of quantization error for various divisor and
measurement time settings for different input signal frequencies. The counter
timebase rate is 100 MHz.

Actual Property Used

Measurement Number of Quantization
Frequency of Divisor for Frequency
Time Signal Periods Error
Input Signal Measurement
1 0s Divisor 1 0.0001%
Measurement
0 200 ms 20 0.000005%
Time
10 200 ms Divisor 10 0.00001%
100 Hz
Measurement
10 50 ms 5 0.00002%
Time
Measurement
100 50 ms 5 0.00002%
Time

© National Instruments 209

 NI-DAQmx Key Concepts

Actual Property Used

Measurement Number of Quantization
Frequency of Divisor for Frequency
Time Signal Periods Error
Input Signal Measurement
1 0s Divisor 1 0.001%
Measurement
0 20 ms 20 0.00005%
Time
10 20 ms Divisor 10 0.0001%
1 kHz
Measurement
10 5 ms 5 0.0002%
Time
Measurement
100 50 ms 50 0.0002%
Time
1 0s Divisor 1 0.1%
Measurement
0 200 µs 20 0.005%
Time
100 kHz 10 200 µs Divisor 10 0.01%
Measurement
10 50 µs 5 0.02%
Time
100 50 ms Divisor 100 0.001%
1 0s Divisor 1 1%
Measurement
0 20 µs 20 0.05%
Time
1 MHz 10 20 µs Divisor 10 0.1%
Measurement
10 5 µs 5 0.2%
Time
100 50 ms Divisor 100 0.01%

Related concepts:

• Dynamic Averaging Method

Dynamic Averaging Method

The dynamic averaging method for frequency and period measurements provides

210 ni.com
 NI-DAQmx Key Concepts

configuration options that can be set before the start of an acquisition. These options
affect the amount of averaging or filtering applied to the counter measurements
allowing for tradeoffs in measurement accuracy and noise versus latency. During the
acquisition, the counter continuously measures and filters the input signal periods to
produce frequency or period measurements. The NI 9326 and 9361 use this method.

Related reference:

• Quantization Error with Dynamic Averaging Method

Related information:

• ni.com/docs

With Counter Filtering Enabled

The NI 9326 can enable low pass filtering of counter signals to give accurate
measurement of in-band frequencies while rejecting higher frequency noise. Set the
CI.Filter.Enable attribute/property to true to enable filtering. Filtering is enabled by
default and is recommended as the easiest way to achieve accurate, low-noise counter
measurements.

With filtering enabled, you can then specify the filter cutoff frequency using the
CI.Filter.Freq attribute/property to control amount of filtering applied. Lower cutoffs
provide lower noise but longer latency. The latency of the filter can be queried using
the CI.FilterDelay attribute/property. Each counter can be configured with
independent settings.

Note The measurement time, divisor, and maximum measurable period

parameters are ignored when filtering is enabled.

With Counter Filtering Disabled

If CI.Filter.Enable is set to false or if counter filtering is not supported on your device,

then the dynamic averaging method produces measurements by averaging one or
more periods of the input signal. The amount of averaging performed is controlled by
the following:

© National Instruments 211

 NI-DAQmx Key Concepts

• Divisor—Specifies the number of periods of the input signals to measure and

average. Use a larger divisor to get more averaging and lower noise
measurements.
• Measurement Time—Specifies the amount of time over which to measure periods
of the input signal to get the average value of the input signal period. Use a longer
measurement time to get more averaging and lower noise measurements.
• Maximum Measurable Period—Specifies the duration to wait for the input signal
transitions before a no valid measurement found state is indicated. Set this to be
longer than the slowest frequency you wish to measure.

Note The input divisor and measurement time settings wired into DAQmx
Create Virtual Channel VI are ignored. Instead, DAQmx calculates default
values for these settings based on the minimum and maximum values wired
to the DAQmx Create Virtual Channel VI. You can use a channel property node
to override these defaults allows for better control over the amount of
averaging applied to your application.

During an acquisition, the dynamic averaging method will average between 1 period
and divisor periods of the input signal to determine the input signal's frequency. The
measurement time property sets an upper limit to the amount of time that is used for
this averaging. As a result, the dynamic averaging method balances measurement
accuracy vs. measurement latency throughout the input signal range as shown in the
following table.

Signal Frequency Counter Behavior

High
Measures divisor periods
(Divisor*Input Signal Period < Measurement Time) of signal.

Measures between 1 and

Medium Divisor periods of the
signal, depending on the
(Input Signal Period < Measurement Time < Divisor*Input Signal Period) number of periods that fit
within the Measurement
Time.
Measure 1 period of
Low
signal.

212 ni.com
 NI-DAQmx Key Concepts

Signal Frequency Counter Behavior

(Input Signal Period >= Measurement Time)

Very Low Input signal is slower than

the maximum measurable
(Input Signal Period > Maximum Measurable Period)
period. 0 Hz returned.

The measurement time and divisor can also be set manually using the property node
before the acquisition starts if the auto measurement settings are not desired. The
measurement time or divisor can be disabled by setting it to zero.

Measurement
Divisor Notes
Time
Measure 1 period of the input signal, similar to the 1 Counter (Low
0 1
Frequency) method.
Input
Counts the number of periods of the input signal that occur during input
measurement 0
measurement time, similar to the 2 Counters (High Frequency) method.
time
Input Counts how long it takes for the input divisor periods of the signal to
0
divisor elapse, similar to the 2 Counters (Large Range) method.

You can view examples of the dynamic averaging method in the NI 9361 datasheet,
which you can find at ni.com/manuals.

Counter Parts in NI-DAQmx

A counter contains several advanced terminals that you can use to perform time
measurements and generate pulses. For most applications, NI-DAQmx automatically
makes the proper routes from the terminal connector block to the correct advanced
terminal with no additional routing required. For advanced applications, you might
need to make explicit routes to the internal counter terminals

Related concepts:

© National Instruments 213

 NI-DAQmx Key Concepts

• Line Tristating Issues

Advanced Terminals and Common Counter Applications

The following list identifies the names of the advanced terminals as well as their
common uses:

• CtrnGate—The signal at this advanced terminal is used as the Start Trigger, pause
trigger, sample clock, or the input signal being measured. The following table lists
how this terminal is used in various applications:

Application Purpose of Gate Terminal

Pulse Generation Pause or Start Trigger
One Counter Time Measurements Input Signal
Two Counter Time Measurements Unused
Nonbuffered Edge Counting Pause Trigger
Buffered Edge Counting Sample Clock
Two-Edge Separation Second Input Terminal
Position Z Input Terminal

• CtrnSource—The signal at this advanced terminal is either the input terminal for
the measurement or the counter timebase. The following table lists how this
terminal is used in various applications:

Application Purpose of Source Terminal

Pulse Generation Counter Timebase
One Counter Time Measurements Counter Timebase
Two Counter Time Measurements Input Terminal
Nonbuffered Edge Counting Input Terminal
Buffered Edge Counting Input Terminal
Two-Edge Separation Counter Timebase
Position A Input Terminal

214 ni.com
 NI-DAQmx Key Concepts

• CtrnInternalOutput—The signal at this advanced terminal is where the pulsed or

toggled output of the counter appears. The output of a counter pulses or toggles
when the counter reaches terminal count. When counting down, the counter
reaches terminal count when the count reaches zero. When counting up, the
counter reaches terminal count when the counter rolls over. To configure the
counter to toggle or generate pulses, use the Export Signal function/VI with
Counter Output Event as the signal name.

For the output of a counter to appear at the I/O connector (Ctr0Out, for example),
the signal on the internal output terminal must be routed to a terminal on the I/O
connector. For pulse generations, this route is automatically made to the
dedicated counter output terminal on the I/O connector. For measurements, if you
are interested in observing this signal, you need to manually make this route to the
appropriate pin on the I/O connector using the Export Signal function/VI with
Counter Output Event as the signal name. After you route the internal output of a
counter to the I/O connector, the signal remains on the I/O connector until the
device is reset or you explicitly tristate the terminal.

• CtrnAux—The following table lists how this terminal is used in various

applications:

Application Purpose of Aux Terminal

Pulse Generation Unused
One Counter Time Measurements Unused
Two Counter Time Measurements Unused
Nonbuffered Edge Counting Optional Count Direction Terminal
Buffered Edge Counting Optional Count Direction Terminal
Two-Edge Separation First Input Terminal
Position B Input Terminal

• CtrnSampleClock—You can connect a sample clock in or export it through this

terminal.

© National Instruments 215

 NI-DAQmx Key Concepts

Counter Parts

The main parts of a counter include the following:

A GATE input terminal controls when counting occurs. A GATE input is similar to a
trigger because it starts or stops a count.

A SOURCE (CLK) input terminal is the timebase for a measurement or the signal to
count.

A count register increments or decrements the number of edges to count. If the count
register decrements, it counts down to zero. The count register size is the number of
bits in the counter, and you calculate it as Count Register = 2no. of bits.

An OUT signal terminal can output a pulse or a pulse train, which is a series of pulses.

GATE OUT

Count Register

SOURCE
(CLK)

Configuring a Time-Based Measurement in NI-DAQmx

To configure a measurement, you specify the expected range of the input signal. Based
on this range, NI-DAQmx automatically picks the internal timebase that provides the
highest resolution for your measurement and uses it as the counter timebase. You also
can explicitly specify the source of the counter timebase by setting the Counter
Timebase Source attribute/property and the rate of the timebase by setting the
Counter Timebase Rate attribute/property. For more information on where to connect
input signals, refer to Connecting Counter Signals.

For non-buffered time-based measurements, calling the Read function/VI initiates the
measurement and returns the next valid sample. Calling the Read function/VI
repeatedly does not return consecutive measurements of the input signal.

To perform buffered time-based measurements, you must use Implicit or Sample

Clock timing, configured using the DAQmx Timing function/VI.

216 ni.com
 NI-DAQmx Key Concepts

Related concepts:

• Connecting Counter Signals

Implicit Timing

After the acquisition begins, NI-DAQmx measures each consecutive sample of the input
signal and stores the measurement in the input buffer. Due to this consecutive
measurement, the rate of the input signal implicitly determines the rate of the
acquisition.

Sample Clock Timing

Some devices support Sample Clock timing for buffered time-based measurements.
After the acquisition begins, your device measures each consecutive sample of the
input signal, but does not store it to the input buffer until an active edge of the Sample
Clock occurs. Using this timing type, the Sample Clock rate determines the acquisition
rate rather than the input signal. When using Sample Clock timing, all measurements
returned are a valid, complete cycle of your input signal. Using this method, you can
measure signals that are much faster than your sample rate, which minimizes the
amount of data transferred from your device to NI-DAQmx.

Related concepts:

• Sample Clock Timing Support for Time-Based Measurements

Averaging

For frequency and period measurements using Sample Clock timing, some devices can
return an averaged measurement of all periods since the previous Sample Clock pulse,
instead of measuring only the period immediately preceding the current Sample Clock
pulse. Use the EnableAveraging DAQmx Channel property/attribute, associated with
each of those measurement types, to enable averaging.

Related concepts:

• Averaging Support

© National Instruments 217

 NI-DAQmx Key Concepts

Invalid Initial Samples

Depending on the phase of the input signal in relation to the start of the measurement,
the first sample of a buffered measurement is often invalid. For instance, if you are
performing a buffered period measurement, and you start the measurement when the
input signal is halfway through its current cycle, the measured period for the first
sample is half its expected value. Subsequent samples indicate the correct values
because they are guaranteed to be taken after a full period of the input signal. For this
reason, the first sample of buffered period, pulse width, and semi-period
measurements often indicates a smaller value than the actual value. For buffered
frequency measurements, the first sample often indicates a higher frequency than the
actual frequency. Some devices detect these incomplete samples and discard them.

Related concepts:

• Incomplete Sample Detection

Pulse Measurement

Some devices support measuring individual pulses, returning each sample as a tuple
of frequency/duty cycle, high/low time, or high/low ticks.

Related concepts:

• Pulse Measurement Support

Configuring a Displacement Measurement with NI-DAQmx

To configure a measurement, specify the initial sensor position through the Initial
Angle attribute/property. You also can specify if the Z Input Terminal is used with the Z
Index Enable attribute/property. You can configure the reload position on a Z index,
and when a Z index position should cause a reload to occur in relation to the A and B
signals, by using the Z Index Phase and Z Index Value attributes/properties,
respectively.

When performing a single point, or on-demand, displacement measurement, you first

arm the counter by calling the Start Task function/VI. Each subsequent read returns
the current position of the encoder. If you perform multiple reads without first starting

218 ni.com
 NI-DAQmx Key Concepts

the counter, the counter implicitly starts and stops with each Read function/VI call, and
the position is not recorded properly between read calls.

With a buffered displacement measurement, the device latches the current position
onto each active edge of the sample clock and stores the position in the buffer. There
is no onboard clock for buffered displacement measurement, so you must supply an
external sample clock.

Buffered Pulse Generation

You can specify the size of the buffer by calling the DAQmx Configure Buffer function/
VI, by specifying the buffer size attribute/property in the buffer property node, or by
writing a number of pulse specifications using the DAQmx Write Counter MultiPoint
function/VI before starting the task. This is ideal for applications that require pulse-
width modulation, such as proportional integral derivative (PID) loop control
applications. An example of an Implicit buffered generation would look like the
following:

Counter Generation
Starts Complete

Initial Delay
High Low High Low High
Time Time Time Time Time
1 2 2 3 3

The high and low times provided in the Create Channel function/VI are ignored in this
case.

If you do not use a software buffer, all pulses generated will be the same, unless you
update the high time and low time while the application is running. This will cause the
pulse specifications to be software timed and change on-demand.

You can use the same attributes/properties that create the channel to update the pulse
specifications of the pulse train generation. Because you need two attributes/
properties to specify the pulse specifications of the pulse train, the specifications only
update when you set one of the two. For example, if you specify the pulse generation
in terms of frequency, the frequency and duty cycle control the specifications of

© National Instruments 219

 NI-DAQmx Key Concepts

the generation. However, the pulse specifications only update when you set the
frequency attribute/property. The same is true when you specify pulse generation in
terms of time or ticks; the low time and low ticks control when the pulse
specifications update. When updating the pulse specifications of the pulse generation,
a complete period of the current specification generates before the new pulse
specification takes effect. Updating the pulse specifications while running is not
supported on buffered pulse train generation.

In some devices, such as M Series, E Series, and S Series devices, generating finite
pulse trains requires the use of paired counters. In devices that require paired counters
on a finite pulse train generation, the first counter (for example, Counter 0) generates a
pulse of desired width. The second counter (Counter 1) generates the pulse train,
which is gated by the pulse of the first counter. The routing is done internally. The
following illustration shows a two counter finite pulse train timing diagram.

Counter 0
(Paired Counter)

Counter 1
Generation
Complete

Note STC3-based devices, such as X Series devices, do not require paired

counters.

Configuring Triggers for Pulse Generation

You can configure a variety of triggers with pulse generations. All pulse generations
support Start Triggers. Single pulse generation and finite pulse train generation also
support the Retriggerable attribute/property, or attribute, for Start Triggers. To
determine if a pulse is complete and the hardware is ready for another Start Trigger,
query the Pulse Done attribute/property. Continuous pulse train generations also
support pause triggers. However, you cannot use both the start and the pause trigger
at the same time.

220 ni.com
 NI-DAQmx Key Concepts

Generating Single Pulses, Finite Pulse Trains, and Continuous

Pulse Trains
When generating pulses, you can generate either a single pulse, a finite pulse train, or a
continuous pulse train. By default, single pulses are generated unless you use the
Timing function/VI with the Implicit or Sample Clock timing types.

In Implicit mode, the Samples per Channel input to the Timing function/VI
determines the number of pulses to generate for finite pulse trains. In the following
illustration, three pulses are generated:

Counter Generation
Starts Complete

Initial Delay
High Low High Low High
Time Time Time Time Time
1 2 2 3 3

In Sample Clock mode, which uses a software buffer, the Samples per Channel
input determines the number of distinct pulse specification (High Time/Low Time)
transitions to generate. In the following example, Samples per Channel is set to
three. Notice that the counter increments after the sample clock pulses and the
counter signal transitions from high to low. The device generates the high and low
values specified in the Create Channel function/VI until the first sample clock arrives.

Counter Generation
Starts Complete

Initial Delay

High Low High Low High Low High Low High Low High Low High Low High Low High Low High Low High
Time Time Time Time Time Time Time Time Time Time Time Time Time Time Time Time Time Time Time Time Time
0 0 0 0 0 1 1 1 1 2 2 2 2 2 2 3 3 3 3 3 3

Sample Clock

As illustrated previously, to output pulse trains in which pulse specifications are

hardware timed and change deterministically, you must use a software buffer, if
supported by your device.

© National Instruments 221

 NI-DAQmx Key Concepts

Setting Pulse Train Polarity and the Initial Delay State

The idle state, which controls the pulse train polarity, is applied to the signal when a
task transitions to the Committed state (which happens automatically when the task
starts). The idle state polarity also determines the state of the initial delay.

When you set the idle state to low, the generation starts low for the initial delay, then
transitions to high for the high time. The low time is ignored for the first pulse, but will
be repeated before the high time for each subsequent pulse, as shown in the following
illustration.

Counter Generation
Starts Complete

Initial High Low High

Delay Time Time Time

When you set the idle state to high, the generation starts high for the initial delay, then
transitions to low for the low time. The high time is ignored for the first pulse, but is
repeated after the low time for each subsequent pulse. In both cases, the output rests
at the idle state after the pulse generation completes.

Counter Generation
Starts Complete

Initial Low High

Delay Time Time

Counter Frequency Coercion

The frequency of the counter output must be evenly divisible into the frequency of its
timebase. The resulting period is further divided by the duty cycle, which defines how
long the signal stays high and how long it stays low for each period. If the requested
frequency and duty cycle combination can't be produced exactly, then DAQmx will
coerce the signal to the closest frequency and duty cycle that is possible. If you want to
define exactly how long the signal stays high and low, use ticks instead.
Related concepts:

222 ni.com
 NI-DAQmx Key Concepts

• Clock Frequency Coercion

Terminals
A terminal is a named location where a signal is either generated (output or
produced) or acquired (input or consumed). A terminal that can output only one signal
is often named after that signal. A terminal with an input that can be used only for one
signal is often named after the clock or trigger that the signal is used for. Terminals
that are used for many signals have generic names such as RTSI, PXITrig, or PFI.

Related concepts:

• Signal Versus Terminal

• Terminal Names
• Specifying a Route

Signal Versus Terminal

A signal is a means of conveying information. An analog waveform and a digital edge
are both examples of signals. The word signal, in this section, refers to the digital edge
variety, also known as hardware signals. A terminal, on the other hand, is a named
location where a signal is either generated (output or produced) or acquired (input or
consumed).

When a terminal shares a name with a signal, it is not always clear which is being
referred to—the terminal or the signal. The sample clock provides a good example.

Within most devices, there is a terminal such that the signal at that terminal is always
used as the sample clock. So when you refer to the sample clock signal, you refer to
this terminal. For instance, for M Series analog input tasks, this terminal is named the
ai/SampleClock terminal. For analog output tasks, this terminal is named the ao/
SampleClock terminal.

When you use the Timing function/VI to select the source of the sample clock signal for
your analog input task on an M Series device, you choose a signal at some other
terminal to act as the source for the ai/SampleClock terminal. In other words, NI-
DAQmx connects your chosen terminal (a PFI terminal pin, for instance) to the ai/

© National Instruments 223

 NI-DAQmx Key Concepts

SampleClock terminal. Selecting the ai/SampleClock terminal as the sample clock

source returns an error because a terminal cannot be connected to itself.

Terminal Names
Terminal Names Explanation
An alias for the terminal within a device where the default source for a
clock can be found. If your application does not set the source of a clock
OnboardClock (or uses an empty string as the source), the clock's particular onboard
clock is used. For example, the onboard clock for the ai sample clock is
the ai Sample Clock Timebase.
Programmable Function Interface—general-purpose input
PFIn terminals, fixed-purpose output terminals. The name of the fixed output
signal is often placed on the I/O connector next to the terminal as a hint.
PXI_Trign PXI Trigger bus—general-purpose input/output lines.
Real Time System Integration bus—general-purpose input/
RTSIn output lines. RTSI7 is the exception. It is the only line to use for the 20
MHz Timebase signal.
A terminal within a device where the analog input sample clock can be
ai/SampleClock
found.
A terminal within a device where the analog input Start Trigger can be
ai/StartTrigger
found.
A terminal within a device where the analog input Reference Trigger can
ai/ReferenceTrigger
be found.
A terminal within a device where the analog output sample clock can be
ao/SampleClock
found.
A terminal within a device where the analog output Start Trigger can be
ao/StartTrigger
found.
A terminal within a device where the onboard clock source for the
20MHzTimebase
master timebase can be found.
A terminal within a device where the digital input sample clock can be
di/SampleClock
found.
A terminal within a device where the digital output sample clock can be
do/SampleClock
found.
di/ReferenceTrigger A terminal within a device where the digital input Reference Trigger can

224 ni.com
 NI-DAQmx Key Concepts

Terminal Names Explanation

be found.
A terminal within a device where the onboard clock source for the
80MHzTimebase
master timebase can be found.
A terminal within a device where the onboard clock source for the
100MHzTimebase
master timebase can be found.
A terminal within a device where the master timebase signal can be
found. This signal originates either from the 20MHzTimebase terminal or
MasterTimebase the RTSI7 terminal. This signal is the onboard source for the Sample
Clock Timebases and is one of the possible sources for the AI convert
clock timebase.
A terminal within a device where the 100 kHz Timebase signal can be
found. This signal is created by dividing the signal at the 20MHzTimebase
100kHzTimebase
terminal by 200 and is one of the possible sources for the Sample Clock
Timebases.
ai/ConvertClock A terminal within a device where the AI Convert Clock can be found.
ai/ A terminal within a device where the AI Convert Clock Timebase can be
ConvertClockTimebase found. This is the onboard clock source for the AI convert clock.
A terminal within a device where the AI Hold Complete Event signal can
ai/HoldCompleteEvent
be found.
The terminal at the I/O connector (external to the device) where the AI
AIHoldComplete
Hold Complete Event signal can be emitted.
A terminal within a device where the analog input pause trigger can be
ai/PauseTrigger
found.
ai/ A terminal within a device where the AI Sample Clock Timebase can be
SampleClockTimebase found. This is the onboard clock source for the AI sample clock.
A terminal within a device where the output of the analog comparison
AnalogComparisonEvent circuit, the Analog Comparison Event signal, can be found. This circuit is
active whenever an analog edge or window trigger is configured.
A terminal within a device where the analog output pause trigger can be
ao/PauseTrigger
found.
ao/ A terminal within a device where the AO Sample Clock Timebase can be
SampleClockTimebase found. This is the onboard clock source for the AO sample clock.
di/ A terminal within a device where the DI Sample Clock Timebase can be
SampleClockTimebase found. This is the onboard clock source for the DI sample clock.

© National Instruments 225

 NI-DAQmx Key Concepts

Terminal Names Explanation

do/ A terminal within a device where the DO Sample Clock Timebase can be
SampleClockTimebase found. This is the onboard clock source for the DO sample clock.
Terminals at the I/O connector where the output of counter 0, counter 1,
Ctr0Out, Ctr1Out,
counter 2, or counter 3 can be emitted. You also can use Ctr0Out as a
Ctr2Out, Ctr3Out
terminal for driving an external signal onto the RTSI bus.
Terminals within a device whose purpose depends on the application.
Ctr0Gate, Ctr1Gate,
Refer to Counter Parts in NI-DAQmx for more information on how the
Ctr2Gate, Ctr3Gate
gate terminal is used in various applications.
Terminals within a device whose purpose depends on the application.
Ctr0Source, Ctr1Source,
Refer to Counter Parts in NI-DAQmx for more information on how the
Ctr2Source, Ctr3Source
source terminal is used in various applications.
Ctr0InternalOutput,
Terminals within a device where you can choose the pulsed or toggled
Ctr1InternalOutput,
output of the counters. Refer to Counter Parts in NI-DAQmx for more
Ctr2InternalOutput,
information on internal output terminals.
Ctr3InternalOutput
A terminal within a device that chains counters together, creating a
paired counter without using any external connections. If your
PairedCtrInternalOutput application uses counter 0, PairedCtrInternalOutput refers to the output
of counter 1. If your application uses counter 1, PairedCtrInternalOutput
refers to the output of counter 0.
A terminal within a device that chains counters together without using
any external connections. If you configure counter 0,
PairedCtrOutputPulse refers to the pulsed output of counter 1. If you
configure counter 1, PairedCtrOutputPulse refers to the pulsed output of
counter 0. Refer to Paired Counters for more information. When the
PairedCtrOutputPulse counter reaches terminal count (zero when counting down, its maximum
count when counting up), the output of the PairedCtrOutputPulse
pulses. By using this terminal, you can chain counters together to create
a wider counter, perform buffered edge counting using the other counter
as your clock source, perform finite pulse-train generation, and create
other custom applications.
di/
A terminal within a device where the change detection event occurs.
ChangeDetectionEvent
A terminal within a device where the Frequency Output signal, which is
FrequencyOutput
used to generate a pulse train, is found.
A terminal within a device where the Sync Pulse signal can be found. This
SyncPulse
signal is used to synchronize DSA devices.

226 ni.com
 NI-DAQmx Key Concepts

Terminal Names Explanation

Ctr0StartArmTrigger A terminal within a device where the Arm Start Trigger can be found.
Terminals within a device whose purpose depends on the application.
Ctr0Aux, Ctr1Aux Refer to Counter Parts in NI-DAQmx for more information on how the aux
terminal is used in various applications.
Ctr0A, Ctr1A, Ctr2A,
Terminals within a device that are used for position measurements.
Ctr3A
Ctr0B, Ctr1B, Ctr2B,
Terminals within a device that are used for position measurements.
Ctr3B
Ctr0Z, Ctr1Z, Ctr2Z,
Terminals within a device that are used for position measurements.
Ctr3Z
Terminals within a C Series device used for triggers, clocks, and timebase
port[0..2]line[0..3]
routing. These terminals are not available for digital I/O.
te0/StartTrigger, te1/ A terminal within a device where the timing engine Start Trigger can be
StartTrigger found.
te0/ReferenceTrigger, A terminal within a device where the timing engine Reference Trigger can
te1/ReferenceTrigger be found.
te0/SyncPulse, te1/ A terminal within a device where the timing engine Sync Pulse signal can
SyncPulse be found. This signal is used to synchronize DSA devices.
te0/SampleClock, te1/ A terminal within a device where the timing engine Sample Clock can be
SampleClock found.
it0/SampleClock, it1/
SampleClock, it2/
SampleClock, it3/
SampleClock, it4/ A terminal within a device where the input timing engine Sample Clock
SampleClock, it5/ can be found.
SampleClock, it6/
SampleClock, it7/
SampleClock
it0/StartTrigger, it1/
StartTrigger, it2/
StartTrigger, it3/
A terminal within a device where the input timing engine Start Trigger
StartTrigger, it4/
can be found.
StartTrigger, it5/
StartTrigger, it6/
StartTrigger, it7/

© National Instruments 227

 NI-DAQmx Key Concepts

Terminal Names Explanation

StartTrigger
it0/ReferenceTrigger, it1/
ReferenceTrigger, it2/
ReferenceTrigger, it3/
ReferenceTrigger, it4/ A terminal within a device where the input timing engine Reference
ReferenceTrigger, it5/ Trigger can be found.
ReferenceTrigger, it6/
ReferenceTrigger, it7/
ReferenceTrigger
it0/PauseTrigger, it1/
PauseTrigger, it2/
PauseTrigger, it3/
PauseTrigger, it4/
A terminal within a device where the input Pause Trigger can be found.
PauseTrigger, it5/
PauseTrigger, it6/
PauseTrigger, it7/
PauseTrigger
it0/
SampleClockTimebase,
it1/
SampleClockTimebase,
it2/
SampleClockTimebase,
it3/
SampleClockTimebase, A terminal within a device where the input Sample Clock Timebase can
it4/ be found. This is the onboard clock source for the input sample clock.
SampleClockTimebase,
it5/
SampleClockTimebase,
it6/
SampleClockTimebase,
it7/
SampleClockTimebase
ot0/SampleClock, ot1/
SampleClock, ot2/
SampleClock, ot3/ A terminal within a device where the output timing engine Sample Clock
SampleClock, ot4/ can be found.
SampleClock, ot5/
SampleClock, ot6/

228 ni.com
 NI-DAQmx Key Concepts

Terminal Names Explanation

SampleClock, ot7/
SampleClock
ot0/StartTrigger, ot1/
StartTrigger, ot2/
StartTrigger, ot3/
StartTrigger, ot4/ A terminal within a device where the output timing engine Start Trigger
StartTrigger, ot5/ can be found.
StartTrigger, ot6/
StartTrigger, ot7/
StartTrigger
ot0/PauseTrigger, ot1/
PauseTrigger, ot2/
PauseTrigger, ot3/
PauseTrigger, ot4/
A terminal within a device where the output Pause Trigger can be found.
PauseTrigger, ot5/
PauseTrigger, ot6/
PauseTrigger, ot7/
PauseTrigger
ot0/
SampleClockTimebase,
ot1/
SampleClockTimebase,
ot2/
SampleClockTimebase,
ot3/
SampleClockTimebase, A terminal within a device where the output Sample Clock Timebase can
ot4/ be found. This is the onboard clock source for the input sample clock.
SampleClockTimebase,
ot5/
SampleClockTimebase,
ot6/
SampleClockTimebase,
ot7/
SampleClockTimebase
cRIO_Trig0, cRIO_Trig1,
cRIO_Trig2, cRIO_Trig3, cRIO Trigger bus—general-purpose input/output lines for sharing
cRIO_Trig4, cRIO_Trig5, signals between NI-DAQmx tasks and FPGA IO on a cRIO chassis.
cRIO_Trig6, cRIO_Trig7

© National Instruments 229

 NI-DAQmx Key Concepts

Note M Series, C Series, and X Series devices do not have a master timebase
of an arbitrary frequency. These devices use the 20 MHz/80 MHz/100 kHz
timebase directly.

Related concepts:

• Counter Parts in NI-DAQmx

• Paired Counters
• Analog Input Accessory Terminal Names
• Analog Output Accessory Terminal Names
• Counter Accessory Terminal Names
• Digital Accessory Terminal Names
• Syntax for Terminal Names

Analog Input Accessory Terminal Names

The following table lists the revised names for analog input terminal names.

Original Revised
Terminal Terminal Explanation
Names Names
AIGND, The reference point for referenced single-ended measurements and
AIGND
ACHGND the bias current return point for differential measurements
ACH# AI# AI0, AI1, and so on; the analog input channels
AISENSE AISENSE The reference point for NRSE measurements using channels 0-15
AISENSE2 AISENSE2 The reference point for NRSE measurements using channels 16-79
AISENSE3 AISENSE3 The reference point for NRSE measurements using channels 80-143
AISENSE4 AISENSE4 The reference point for NRSE measurements using channels 144-207
AI HOLD
SCANCLK The terminal where the AI Hold Complete Event signal appears
COMP
AI START Placed as a hint next to the PFI terminal where the AI Start Trigger can
TRIG1
TRIG be emitted
Placed as a hint next to the PFI terminal where the AI Reference
TRIG2 AI REF TRIG
Trigger can be emitted

230 ni.com
 NI-DAQmx Key Concepts

Original Revised
Terminal Terminal Explanation
Names Names
Placed as a hint next to the PFI terminal where the AI Convert Clock
CONVERT* AI CONV CLK
can be emitted
Placed as a hint next to the PFI terminal where the AI Sample Clock
STARTSCAN AI SAMP CLK
can be emitted

Related concepts:

• Change Detection Considerations for NI 6527 Devices

Analog Output Accessory Terminal Names

The following table lists the revised names for analog output terminal names.

Original Terminal Revised Terminal

Explanation
Names Names
DAC0OUT AO0 An analog output channel
DAC1OUT AO1 An analog output channel
EXTREF AO EXT REF AO external reference
AOGND AO GND The analog output ground
Placed as a hint next to the PFI terminal where the AO
UPDATE* AO SAMP CLK
Sample Clock can be emitted
Placed as a hint next to the PFI terminal where the AO Start
WFTRIG AO START TRIG
Trigger can be emitted

Counter Accessory Terminal Names

The following table lists the revised names for counter terminal names.

Original Terminal Revised Terminal

Explanation
Names Names
GPCTR1_SOURCE CTR1SOURCE Placed as a hint next to the PFI terminal where the

© National Instruments 231

 NI-DAQmx Key Concepts

Original Terminal Revised Terminal

Explanation
Names Names
Ctr1Source signal can be emitted
Placed as a hint next to the PFI terminal where the Ctr1Gate
GPCTR1_GATE CTR1GATE
signal can be emitted
GPCTR1_OUT CTR1OUT The name of the terminal where the Ctr1Out signal appears
Placed as a hint next to the PFI terminal where the
GPCTR0_SOURCE CTR0SOURCE
Ctr0Source signal can be emitted
Placed as a hint next to the PFI terminal where the Ctr0Gate
GPCTR0_GATE CTR0GATE
signal can be emitted
GPCTR0_OUT CTR0OUT The name of the terminal where the Ctr0Out signal appears
The name of the terminal where the output of the 4-bit
FREQ_OUT FREQ OUT
clock divider signal appears

Digital Accessory Terminal Names

The following table lists the revised names for digital terminal names.

Original Revised
Terminal Terminal Explanation
Names Names
Ports on devices are referred to by a number. Port A is called port 0,
DIO# P0.#
for instance. The # symbol refers to a single digital line
PA#, PB#, and P0.#, P1.#, Ports on devices are referred to by a number. Port A is called port 0,
so on and so on for instance. The # symbol refers to a single digital line
P0.#, P1.#,
DIOA#, DIOB# The # symbol refers to a single digital line
and so on

Syntax for Terminal Names

The syntax for terminal names is a unique identifier that refers to a physical terminal in
your system. To guarantee the uniqueness of a terminal name across multiple devices,
terminal names begin with a forward slash, followed by the name of the device as
configured in MAX, such as Dev1. A forward slash and the name of the terminal follow

232 ni.com
 NI-DAQmx Key Concepts

the device identifier, such as PFI3. For example, the fully qualified terminal name for
PFI3 on Dev1 is /Dev1/PFI3.

For terminals that exist on multiple subsystems or timing engines, the name of the
subsystem or timing engine precedes the terminal name. For example, the output
terminal of the Start Trigger for the analog input subsystem on Dev1 is /Dev1/ai/
StartTrigger.

Related concepts:

• Timing Engines

Coercion
When a value you set cannot be met exactly, NI-DAQmx sometimes adjusts—or
coerces—that value to a valid one. Coercion often occurs when an attribute/property
supports a set of discrete ranges.

After you set an attribute/property, you can query that attribute/property to determine
its actual value after coercion.

Related concepts:

• Input Limit Coercion

• Clock Frequency Coercion
• Counter Frequency Coercion

Input Limit Coercion

Some devices support only a discrete set of device ranges. When you specify input
limits, NI-DAQmx coerces those values to fit within one of the supported device ranges.

For instance, suppose your device only supports ranges of 0 to 10 V, -5 to 5 V, and -10 to
0 V. If you set a maximum value of 8 V, NI-DAQmx coerces the maximum value to 10 V.
NI-DAQmx also coerces scaled values, including custom scaling. If you have a
temperature sensor that outputs 100 mV for every 1 °C, NI-DAQmx coerces a maximum
value of 80 °C to 100 °C.

© National Instruments 233

 NI-DAQmx Key Concepts

Because NI-DAQmx coerces input limits, code width is calculated based on the coerced
values, which can be outside the minimum and maximum values you expect to
measure.

Related concepts:

• Device Range
• Input Limits (Maximum and Minimum Values)
• Coercion
• Custom Scales
• Calculating the Smallest Detectable Change—Code Width

Clock Frequency Coercion

Frequencies of clocks must be evenly divisible into the frequency of their timebase.
For example, the rate of the Sample Clock must be evenly divisible into the frequency
of the Sample Clock Timebase. If you specify a Sample Clock rate that is not evenly
divisible into the frequency of the Sample Clock Timebase, NI-DAQmx coerces the
Sample Clock rate to one that is valid.

Related concepts:

• Coercion
• Counter Frequency Coercion

Calibration
There are two types of calibration, channel calibration and device calibration.

Related concepts:

• Channel Calibration
• Device Calibration

Device Calibration

234 ni.com
 NI-DAQmx Key Concepts

What Is Device Calibration?

Device calibration consists of verifying the measurement accuracy of a device and

adjusting for any measurement error. Verification consists of measuring the
performance of the device and comparing these measurements to the published
specifications. During calibration, you supply and read voltage levels or other signals
using external standards, then you adjust the device calibration constants. The new
calibration constants are stored in the EEPROM. These calibration constants are loaded
from memory as needed to adjust for the error in the measurements taken by the
device. There are two kinds of calibration, external and self. For more information on
calibrating your device with NI-DAQmx, refer to Device Calibration Considerations. For
detailed external calibration procedures, refer to ni.com/calibration.

Related concepts:

• Device Calibration Considerations

Related information:

• Calibration Services

External Calibration

External calibration, which is typically performed by a metrology lab, requires using a

high-precision voltage source to verify and adjust calibration constants. This
procedure replaces all calibration constants in the EEPROM and is equivalent to a
factory calibration. Because the external calibration procedure changes all EEPROM
constants, it invalidates the original calibration certificate. If an external calibration is
done with a NIST-certified voltage source, a new NIST traceability certificate can be
issued.

Self-Calibration (Internal Calibration)

Self-calibration adjusts the calibration constants with respect to an onboard reference

stored on the device. The new calibration constants are defined with respect to the
calibration constants created during an external calibration to ensure that the
measurements are traceable to these external standards. The new calibration
constants do not affect the constants created during an external calibration because

© National Instruments 235

 NI-DAQmx Key Concepts

they are stored in a different area of the device memory. You can perform a self-
calibration at any time to adjust the device for use in environments other than those in
which the device was externally calibrated. You use the DAQmx Self Calibrate (or
DAQmxSelfCal) function/VI to perform a self-calibration.

Note Self-calibration does not require any external connections.

Channel Calibration
Channel calibration is a technique used to achieve higher measurement accuracy. In
most applications, device calibration provides sufficient accuracy. However, in
applications where the highest degree of accuracy is critical, channel calibration is
necessary, but it does not replace device calibration. Channel calibration compensates
for various errors, including those introduced by cabling, wiring, and sensors.

Related concepts:

• Device Calibration

Control in NI-DAQmx
This section explains control concepts as implemented in NI-DAQmx. Timing control
loops, synchronizing analog input and output, using control algorithms, single-point
real-time applications, and setting priorities for control applications in LabVIEW are
described.

For a general introduction to control, independent of the software you are using, refer
to the control overview.

Related concepts:

• Timing Control Loops

• Synchronizing Analog Input and Output
• Control Algorithms
• NI-DAQmx Single-Point Real-Time Applications
• Setting Priorities for Control Applications in LabVIEW
• Control Overview

236 ni.com
 NI-DAQmx Key Concepts

NI-DAQmx Single-Point Real-Time Applications

This section describes sample applications that demonstrate the functionality for
hardware-timed single-point operations on real-time platforms.

Most of these applications use the Wait For Next Sample Clock function/VI, which
guarantees tight synchronization between the hardware layer and the software layers
for hardware-timed single-point tasks. Wait For Next Sample Clock provides an
accurate way to correlate application execution to hardware signals, such as the
sample clock for the given task, while providing feedback on the overall real-time
execution of the control loop.

The following sections present common control applications:

• Hardware-Timed Simultaneously Updated I/O

• Hardware-Timed Simultaneously Updated I/O with Data Exchanges between Time-
Critical and Non-Time-Critical Loops
• Hardware-Timed Input, Software-Timed Output
• Hardware-Timed Counter Tasks
• Software-Timed I/O
• Hardware-Timed Simultaneously Updated I/O Using the Timed Loop (LabVIEW
Only)

Related concepts:

• Hardware-Timed Simultaneously Updated I/O

• Hardware-Timed Simultaneously Updated I/O with Data Exchanges between Time-
Critical and Non-Time-Critical Loops
• Hardware-Timed Input, Software-Timed Output
• Hardware-Timed Counter Tasks
• Software-Timed I/O
• Hardware-Timed Simultaneously Updated I/O Using the Timed Loop (LabVIEW
Only)

Hardware-Timed Simultaneously Updated I/O

• Requirement—The I/O must be hardware-timed. All output values need to
simultaneously update at the arrival of the sample clock edge.

© National Instruments 237

 NI-DAQmx Key Concepts

• Solution—Use the DAQmx Wait For Next Sample Clock function/VI to verify that a
new sample clock edge has not yet occurred.

Advantages

• The current iteration's output samples are guaranteed to be aligned with the
next iteration's input samples.
• NI-DAQmx returns an error if the DAQmx Wait For Next Sample Clock function/
VI does not start before the next sample clock edge occurs.
• I/O jitter is confined to the jitter of the hardware clock, which is on the order of
a few nanoseconds.

Restrictions

Read, process, and write operations are confined to the time available between the
moment the device starts acquiring data and the moment the next sample clock
edge arrives.

Sample Application—Hardware-Timed Simultaneously Updated I/O

An example of this kind of application is an analog control loop that reads samples
from a specific number of analog input channels, processes the data using a control
algorithm (such as PID), and writes new control values to the analog output channels.

Normal
Idle Time Idle Time Idle Time Idle Time
Priority

Application
Read Waiting

Read Waiting

Read Waiting

Read Waiting
Wait for SC

Wait for SC

Wait for SC
Process

Process

Process

Process

Time-
Read

Read

Read

Read
Write

Write

Write

Critical

Software Layer

Hardware Layer

Input Hardware Sample 1 Sample 2 Sample 3 Sample 4

(Analog Input) In In In In

Output Hardware Sample 1 Sample 2 Sample 3

(Analog Output) Out Out Out
Sample
Clock (SC) Sample Period Sample Period Sample Period Sample Period

Sample 1 Sample 2 Sample 3 Sample 4

Time

238 ni.com
 NI-DAQmx Key Concepts

LabVIEW Example—Hardware-Timed Simultaneously Updated I/O

Note Although this example is written for LabVIEW users, the principles
apply if you are using another ADE, such as LabWindows/CVI.

LabVIEW Example

• Wire the DAQmx Wait For Next Sample Clock VI to one of the hardware-timed tasks.
Use dataflow wiring to guarantee that the DAQmx Wait For Next Sample Clock VI
executes after the AO Write call.
• If the DAQmx Wait For Next Sample Clock VI does not start before the arrival of the
next sample clock edge, it returns an error.

Sample Block Diagram

Note

• Use only one DAQmx Wait For Next Sample Clock VI within a LabVIEW
loop. If you have multiple hardware-timed single-point I/O tasks within
the same LabVIEW loop, you can connect the DAQmx Wait For Next
Sample Clock VI to any one hardware-timed single-point task within
that loop.
• If, when a cycle overflow occurs, you want to receive a warning rather
than an error, set the DAQmx Real-Time»Convert Late Errors to
Warnings property to True.
• The DAQmx Wait For Next Sample Clock VI has two modes of operation:

© National Instruments 239

 NI-DAQmx Key Concepts

Polling and Wait For Interrupt. To change these values, use the DAQmx
Real-Time»Wait For Next Sample Clock Wait Mode property. Wait For
Interrupt mode, which is the default, allows lower priority processes to
execute while the time-critical loop waits for the next sample clock.
Polling mode allows for higher sampling rates, but it prevents lower
priority processes in the system from executing while the time-critical
loop waits for the next sample clock.
• The analog instance of DAQmx Read calls have two modes of operation:
Polling and Wait For Interrupt. To change these values, use the DAQmx
Read»Advanced»Wait Mode property. Wait For Interrupt mode allows
lower priority processes to execute while the time-critical loop waits for
all the requested samples to be converted. Polling mode allows for
higher sampling rates, but it prevents lower priority processes in the
system from executing while the time-critical loop waits for the
converted analog samples.
• The specific application shown in this section assumes the use of Wait
For Interrupt mode for both the DAQmx Wait For Next Sample Clock VI
and the analog instance of the DAQmx Read VI. To change these values,
use the DAQmx Read»Advanced»Wait Mode and/or DAQmx Real-
Time»Wait For Next Sample Clock Wait Mode properties.

Hardware-Timed Simultaneously Updated I/O with Data Exchanges

between Time-Critical and Non-Time-Critical Loops
• Requirement—The I/O needs to be hardware-timed. All output values need to
simultaneously update at the arrival of the sample clock edge. Data needs to be
exchanged between a time-critical loop and lower-priority processes.
• Solution— Use the Wait For Next Sample Clock function/VI to verify that a new
sample clock edge has not yet occurred. Place the communication code (usually
real-time FIFOs in LabVIEW or a thread-safe queue in LabWindows/CVI) after the
Wait For Next Sample Clock function/VI.

Advantages

• The current iteration's output samples are guaranteed to be aligned with the

240 ni.com
 NI-DAQmx Key Concepts

next iteration's input samples.

• NI-DAQmx returns an error if the Wait For Next Sample Clock function/VI does
not start before the next sample clock edge occurs.
• I/O jitter is confined to the jitter of the hardware clock, which is on the order of
a few nanoseconds.
• Hardware-timed counter input operations have no conversion period similar to
that of multiplexed analog input. Therefore, you can place the real-time FIFO,
or the thread-safe queue, anywhere within the loop.

Restrictions

Read, process, and write operations are confined to the amount of time available
between the moment the device starts acquiring data and the moment the next
sample clock edge arrives.
Sample Application—Hardware-Timed Simultaneously Updated I/O with Data
Exchanges between Time-Critical and Non-Time-Critical Loops

An example of this kind of application is an analog control loop that reads samples
from a specific number of analog input channels, processes the data using a control
algorithm (such as PID), and writes the new control values to the analog output
channels. The application uses a real-time FIFO to stop the control loop based on a
Boolean value provided by a lower-priority process. A similar approach can employ the
use of real-time FIFOs to vary the PID parameters on the fly, or to transfer acquired and
control output values to lower-priority processes for data logging and remote
monitoring.

Timing Diagram

© National Instruments 241

 NI-DAQmx Key Concepts

Idle Time

Idle Time

Idle Time

Idle Time

Idle Time

Idle Time
Normal
Idle Time
Priority

Application

RT-FIFO Comm

RT-FIFO Comm

RT-FIFO Comm
Read Waiting

Read Waiting

Read Waiting

Read Waiting
Wait for SC

Wait for SC

Wait for SC
Process

Process

Process

Process
Time-

Read

Read

Read

Read
Write

Write

Write
Critical

Software Layer

Hardware Layer

Input Hardware Sample 1 Sample 2 Sample 3 Sample 4

(Analog Input) In In In In
Output Hardware Sample 1 Sample 2 Sample 3
(Analog Output) Out Out Out

Sample
Clock (SC) Sample Period Sample Period Sample Period Sample Period

Sample 1 Sample 2 Sample 3 Sample 4

Time

LabVIEW Example—Hardware-Timed Simultaneously Updated I/O with Data

Exchanges between Time-Critical and Non-Time-Critical Loops

Note Although this example is written for LabVIEW users, the principles
apply if you are using another ADE, such as LabWindows/CVI.

• Wire the Wait For Next Sample Clock VI to one of the hardware-timed tasks. Use
dataflow wiring to guarantee that the Wait For Next Sample Clock VI executes after
the AO Write call.
• Use dataflow wiring to guarantee that the real-time FIFO operations execute after
the Wait For Next Sample Clock VI executes.
• If the Wait For Next Sample Clock VI does not execute before the arrival of the next
sample clock edge, it returns an error.

Sample Block Diagram

242 ni.com
 NI-DAQmx Key Concepts

Note

• Use only one Wait For Next Sample Clock VI within a LabVIEW loop. If
you have multiple hardware-timed I/O tasks within the same LabVIEW
loop, you can connect the Wait For Next Sample Clock VI to any one
hardware-timed single-point task within that loop.
• If, when a cycle overflow occurs, you want to receive a warning rather
than an error, set the DAQmx Real-Time»Convert Late
Errors to Warnings property to True.
• Although you do not have to place the real-time FIFO code after the
Wait For Next Sample Clock VI, it is highly recommended that you do so
when dealing with multiple-channel analog input operations on
multiplexed devices (such as E and M Series). Because the device can
spend up to 50% of the sample period converting samples on the
analog input channels, executing the FIFO code during this conversion
period has the advantage of using up otherwise idle time.
• You can increase the Analog Input Conversion Rate manually through
the DAQmx Timing Property Node. This reduces the total amount of
time spent converting the requested number of samples. It is important
to consider the minimum settling time specifications for the complete
data acquisition system to avoid signal degradation and interference.

Hardware-Timed Input, Software-Timed Output

• Requirement—An analog input task must be hardware-timed. The output task

does not need hardware synchronization with the sample clock edge.
• Solution—Use the DAQmx real-time Report Missed Samples attribute/property,
which returns an error if new samples are available before the read operation
finishes converting samples from the previous iteration.

Advantages

• Input samples are hardware-timed.

• Read, process, and write operations can overflow into the next sample period,
as long as enough time remains for the subsequent read operation to complete
on the next set of input samples. An application that acquires data from

© National Instruments 243

 NI-DAQmx Key Concepts

multiple channels on multiplexed devices (such as E Series and M Series) has

to wait for the device to convert input samples before the read operation can
return. By allowing process and write operations to overflow into the next
sample period, the application takes advantage of otherwise idle time. This
enables the application to achieve higher control-loop rates.

Restrictions

Output updates suffer from software jitter because they are not hardware-timed.

Sample Application—Hardware-Timed Input, Software-Timed Output

An example of this kind of application is an analog control loop that reads samples
from a specific number of multiplexed analog input channels, processes the data using
a control algorithm (such as PID), and writes the new control values to the analog
output channels using a software-timed task.

Timing Diagram
Idle Time

Idle Time

Idle Time

Normal Idle Time

Priority

Application
Read Waitng

Read Waitng

Read Waitng

Read Waitng
Read

Read

Read

Read
Write

Write

Write

Time-
Process Process Process
Critical

Software Layer

Hardware Layer

Input Hardware Sample 1 Sample 2 Sample 3 Sample 4

(Analog Input) In In In In
Output Hardware Sample 1 Sample 2 Sample 3
(Analog Output) Out Out Out
Sample
Clock (SC) Sample Period Sample Period Sample Period Sample Period

Sample 1 Sample 2 Sample 3 Sample 4

Time

LabVIEW Example—Hardware-Timed Input, Software-Timed Output

Note Although this example is written for LabVIEW users, the principles
apply if you are using another ADE, such as LabWindows/CVI.

244 ni.com
 NI-DAQmx Key Concepts

• Set the Report Missed Samples property for the analog input operation to True.
• The analog input operation returns an error if new samples are available before
the read operation finishes converting samples from the previous iteration.

Sample Block Diagram

Note

• If, when an Analog Input Read overflow error occurs, you prefer to
receive a warning rather than an error, set the Convert Late Errors to
Warnings property to True.
• Do not use the Wait For Next Sample Clock VI and the Report Missed
Samples property within the same LabVIEW loop.
• Only hardware-timed single-point analog input tasks support the
Report Missed Samples property.
• Because the analog output task is software timed, the value is written
out as soon as the write call is initiated. It does not wait for a hardware
clock to output the data.

Hardware-Timed Counter Tasks

• Requirement—Use hardware-timed counter input operations to drive a control

loop.
• Solution—Use the Wait For Next Sample Clock function/VI to synchronize the
counter operations with the counter's sample clock.

Advantages

• Counter tasks allow for flexible timing and event detection operations that can

© National Instruments 245

 NI-DAQmx Key Concepts

drive the software processing of the control loop. In other words, the control
loop can have a dynamic clock rate.
• NI-DAQmx returns an error if the Wait For Next Sample Clock function/VI does
not start before the next sample clock edge arrives.

Restrictions

Read, process, and write operations are confined to the time available between the
moment the device starts acquiring data and the moment the next sample clock
edge arrives.

Related concepts:

• LabVIEW Example—Hardware-Timed Counter Tasks

Sample Application—Hardware-Timed Counter Tasks

An example of this kind of application is a control loop that uses a counter input task,
such as count edges, while controlling digital lines based on some predefined control
logic. This sample application performs communication through the use of real-time
FIFOs. In LabWindows/CVI, you can use a thread-safe queue instead of real-time FIFOs.

Timing Diagram
Idle Time

Idle Time

Idle Time

Normal
Priority

Application
RT-FIFO Comm

RT-FIFO Comm

RT-FIFO Comm

RT-FIFO Comm
Wair for SC
Wait for SC

Wait for SC

Time-
Process

Process

Process

Process
Read

Read

Read

Read
Write

Write

Write

Write

Critical

Software Layer

Hardware Layer

Input Hardware Sample 1 Sample 2 Sample 3 Sample 4

(Counter Input) In In In In

Output Hardware Sample 1 Sample 2 Sample 3 Sample 4

(Digital Output) Out Out Out Out

Sample Period Sample Period Sample Period Sample Period

Sample
Clock (SC)

Sample 1 Sample 2 Sample 3 Sample 4

Time

246 ni.com
 NI-DAQmx Key Concepts

Sample Application 2—Hardware-Timed Counter Tasks

Another example application is a control loop that monitors discrete inputs and uses
the values to update a counter output task, using pulse frequency mode to generate
pulse-width modulation control signals. This example application performs
communication through the use of real-time FIFOs. In LabWindows/CVI, you can use a
thread-safe queue instead of real-time FIFOs.

Timing Diagram
Idle Time

Idle Time

Idle Time
Normal
Priority

Application
RT-FIFO Comm

RT-FIFO Comm

RT-FIFO Comm
Wait for SC

Wait for SC

Wait for SC
Process

Process
Process

Process

Time-
Read

Read

Read

Read
Write

Write

Write
Critical

Software Layer

Hardware Layer

Input Hardware Sample 1 Sample 2 Sample 3 Sample 4

(Digital Input) In In In In

Output Hardware Sample 1 Sample 2 Sample 3

(Counter Output) Out Out Out

Sample Period Sample Period Sample Period Sample Period

Sample
Clock (SC)

Sample 1 Sample 2 Sample 3 Sample 4

Time

LabVIEW Example—Hardware-Timed Counter Tasks

Note Although this example is written for LabVIEW users, the principles
apply if you are using another ADE, such as LabWindows/CVI.

• Wire the Wait For Next Sample Clock VI to the counter input task.
• If the Wait For Next Sample Clock VI does execute before the arrival of the next
sample clock edge, it returns an error.

Sample Block Diagram

© National Instruments 247

 NI-DAQmx Key Concepts

Example 2

• Wire the Wait For Next Sample Clock VI to the counter output task.
• If the Wait For Next Sample Clock VI does not execute before the arrival of the next
sample clock edge, it returns an error.

Sample Block Diagram

Note

• Use only one Wait For Next Sample Clock VI within a LabVIEW loop. If
you have multiple hardware-timed I/O tasks within the same LabVIEW
loop, you can connect the Wait For Next Sample Clock VI to any one
hardware-timed single-point task within that loop.
• If, when a cycle overflow occurs, you want to receive a warning rather
than an error, set the DAQmx Real-Time»Convert Late Errors to
Warnings property to True.
• Hardware-timed counter operations have no conversion period similar
to that of multiplexed analog input. Therefore, the real-time FIFO can
be placed anywhere within the LabVIEW loop.
• NI-DAQmx provides a mechanism to recover after missing a sample
clock edge when performing counter writes. If this write recovery

248 ni.com
 NI-DAQmx Key Concepts

mechanism is not successful, NI-DAQmx returns an error, and

subsequent operations on that task are no longer hardware timed.
• The DAQmx Real-Time»Write Recovery Mode property allows you to
choose between Wait For Interrupt or Polling mode for the recovery
mechanism. Wait For Interrupt, which is the default, allows lower
priority processes to execute while NI-DAQmx attempts to recover.
Polling mode, on the other hand, allows for higher sampling rates.

Hardware-Timed Simultaneously Updated I/O Using the Timed Loop

(LabVIEW Only)

• Requirement—I/O needs to be hardware-timed. All output values need to

simultaneously update at the arrival of the sample clock edge. The application
uses the Timed Loop.
• Solution—Use the DAQmx Create Timing Source function/VI to create a timing
source that drives a Timed Loop that contains the I/O operations and the control
algorithm.

Advantages

• Using a timing source allows you to specify an I/O signal (for example, the
sample clock signal) to trigger the execution of Timed Loop iterations.
• Timing sources such as the Control Loop From Task provide strict lateness
checking and allow other threads to execute while several analog channels are
being multiplexed and sampled.
• The Timed Loop provides feedback as to whether the iterations complete in
time.
• Multi-rate applications, using distinct I/O hardware subsystems, are possible
by extending this approach to multiple Timed Loops.

Restrictions

• Minor increase in overhead when compared to a regular LabVIEW While Loop

• Requires additional code to handle warm-up iterations

© National Instruments 249

 NI-DAQmx Key Concepts

Sample Application—Hardware-Timed Simultaneously Updated I/O Using the Timed

Loop (LabVIEW Only)

An example of this kind of application is an analog control loop that reads samples
from a specific number of analog input channels, processes the data using a control
algorithm (such as PID), and writes the new control values to the analog output
channels.

You can create such an application with the Control Loop From Task timing source. The
Control Loop From Task timing source uses the sample clock signal from the analog
input task, which allows strict lateness-checking of all tasks associated with that
sample clock.

The Control Loop From Task timing source also allows you to specify a delay between
the time the sample clock event is handled and the time the Timed Loop starts
executing. This delay, or sleep time, keeps the DAQmx Read function/VI inside the
Timed Loop from using 100% of the CPU time available while waiting for the analog
input samples to be multiplexed and digitized.

Timing Diagram
Idle Time
Idle Time

Idle Time

Normal Idle Time Idle Time Idle Time

Priority

Application
Clock

Sample Clock
Sample Clock

Timed
Process

Process

Process
Read
Read

Read

Read
Write

Write

Write

Loop Timed Timed Timed

Sample

Loop Loop Loop

Start Start Start
Software Layer
Hardware Layer

Input Hardware Sample 1 Sample 2 Sample 3

(Analog Input) In In In

Output Hardware Sample 1 Sample 2

(Analog Output) Out Out

Sample Clock Sample Period

Sample 1 Sample 2 Sample 3

Time

LabVIEW Example—Hardware-Timed Simultaneously Updated I/O Using the Timed

Loop

• Create a Control Loop From Task timing source for the Timed Loop. This signal

250 ni.com
 NI-DAQmx Key Concepts

serves as the timebase that drives the execution of the Timed Loop.
• The Timed Loop provides feedback to the application as to whether the previous
iteration completed in time. It does this through the "Finished Late [i-1]" node.
• Allow a few warm-up iterations to account for the effects of processor-caching and
other events that may occur during the first iterations of the loop.

Sample Block Diagram

Note

• The DAQmx Read VI is implicitly configured to polling mode when using

the Control Loop From Task timing source. Polling mode avoids the
additional scheduling overhead associated with interrupts inside the
Timed Loop.
• You can increase the Analog Input Conversion Rate manually through
DAQmx Timing properties. This reduces the total amount of time spent
converting the requested number of samples. It is important to
consider the minimum settling time specifications for the complete
data acquisition system to avoid signal degradation and interference.
• Do not use the Wait For Next Sample Clock VI for any of these tasks.
• Lower-priority processes, including other Timed Loops with lower
priorities, can execute while the Timed Loop waits until its next
iteration.
• To optimize multi-channel control applications in which lower-priority

© National Instruments 251

 NI-DAQmx Key Concepts

threads might require additional processing time, provide a non-zero

value for the sleep time (us) parameter of the DAQmx Create Timing
Source VI. This non-zero value allows other threads to use the time
spent converting analog input samples to perform other tasks such as
communication or logging to disk.
• The maximum amount of sleep time you can set without impacting the
overall rate of the application depends on several factors, including the
number of analog channels being acquired, the sample conversion
rate, and the system's specifications.

The following diagram shows, for multiple channel configurations, the effect of the
amount of sleep over the maximum achievable rate and the amount of work lower-
priority threads can execute at such rates.

*See benchmark configuration below.

The graph shows that, when acquiring 8 channels using a specific hardware and
software configuration, the maximum achievable rate decreases as soon as the
amount of sleep time increases from 0 to 5 µs. This is not, however, the case for the 12-
and 16-channel configurations, for which increasing the amount of sleep up to 10 and
15 µs respectively has no visible effect on the maximum achievable I/O rates. In the 12-
and 16-channel case, the additional sleep interval allows other threads to execute

252 ni.com
 NI-DAQmx Key Concepts

more work (refer to definition below) without affecting the overall I/O rate of the
application.

Benchmark Configuration

• Hardware Configuration:
◦ NI PXI-8196 RT Controller
◦ NI PXI-6070 E Series MIO device
◦ NI PXI-6723 Analog Output device
• Software Configuration:
◦ LabVIEW Real-Time 8.0
◦ NI-DAQmx 8.0
◦ Ethernet driver set to polling mode
• Benchmark details:
◦ A work unit is defined as the number of times a normal-priority loop can
increment an unsigned 64-bit number while the I/O Timed Loop, depicted in
the sample block diagram above, runs in parallel with it.
◦ The analog input conversion is not explicitly configured. This means that the
DAQmx driver auto-calculates it based on the number of channels and desired
sample clock rate.

Software-Timed I/O

• Requirement—The I/O tasks do not support hardware-timed operations.

• Solution—Apply software timing to your time-critical loop by using the Timed
Loop in LabVIEW or asynchronous timers in LabWindows/CVI. Configure your NI-
DAQmx tasks to use on-demand timing.

Advantages

• You can perform I/O control loops with operations that are not hardware-
timed.
• Read, process, and write operations are confined to the software timing period
that you define with the Timed Loop or asynchronous timers.

Restrictions

I/O samples suffer from software jitter.

© National Instruments 253

 NI-DAQmx Key Concepts

Sample Application—Software-Timed I/O

An example of this kind of application is a digital I/O control loop. The application
monitors the state of several discrete inputs and toggles the corresponding output
based on the control algorithm. Hardware timing is not available for single-point
digital I/O tasks in NI-DAQmx.

Timing Diagram

Software Timer Tick

Idle Time

Idle Time

Idle Time
Normal
Priority

Application
Process

Process

Process

Process
Read

Read

Read

Read
Write

Write

Write

Write
Timed
Loop

Software Layer

Hardware Layer

Input Hardware Sample 1 Sample 2 Sample 3 Sample 4

(Digital Input) In In In In

Output Hardware Sample 1 Sample 2 Sample 3 Sample 4

(Counter Output) Out Out Out Out

Sample 1 Sample 2 Sample 3 Sample 4

Time

LabVIEW Example—Software-Timed I/O

Note Although this example is written for LabVIEW users, the principles
apply if you are using another ADE, such as LabWindows/CVI.

• A Timed Loop running off the system's time sources (millisecond or microsecond
resolution) accomplishes the task. Configure the Timed Loop to run at the desired
rate.
• Configure all tasks to be software-timed (on demand).
• The Timed Loop provides feedback to the application as to whether the previous
iteration completed in time. It does this through the "Finished Late [i-1]" node.

Sample Block Diagram

254 ni.com
 NI-DAQmx Key Concepts

Note

• The Timed Loop allows the application to adjust its period from within
the loop, allowing the implementation of dynamic timing algorithms
for control.
• Lower-priority processes can execute while the Timed Loop waits until
its next iteration.
• Other software timing methods include the use of the Wait and Wait
Until next multiple VIs (with microsecond or milliseconds resolution).
These methods provide no feedback when the application falls behind.

Timing Control Loops

You can time control loops using software timing or hardware timing. You can also use
the Timed Loop structure.

For software timing, the software and operating system determines the rate at which
the loop executes. Software timing is not deterministic. Controlling a while loop and
using the Wait Until Next ms Multiple VI to handle timing is an example of a software-
timed loop. Hardware timing uses the DAQ device internal clock or an external clock to
control when a read executes within a loop. The example block diagram shown in
Control Loops in the Common Applications section uses hardware timing.

The Timed Loop structure is hardware timed. It is ideal for multirate applications. By
default, the Timed Loop uses the 1 kHz clock of the Windows operating system as its
timing source. Refer to your LabVIEW Help for more information about the Timed

© National Instruments 255

 NI-DAQmx Key Concepts

Loop structure.

Related concepts:

• Real Time

Control Algorithms
There are many data processing algorithms to consider when creating a control
application. You can create custom control algorithms using LabVIEW. You also can use
VIs, such as the LabVIEW Control Design and Simulation Module VIs and Functions, to
process control application data. This module offers several libraries that you can use
to design, analyze, simulate, and deploy dynamic system models, including
controllers.

Synchronizing Analog Input and Output

You can time analog output events and synchronize the events to the analog input
clock. You can share a common clock for A/D and D/A conversions to ensure that both
occur simultaneously. The advantage of this method is that, so long as your software
completes in time, you mask out jitter. One caveat is that outputs are always one loop
cycle behind the inputs, as shown in the following figure.

Input Input
(first point) (second point)

Time
Processing

Output Delay Output

(irrelevant) (response to first point)
Shared
Clock

Related concepts:

• Synchronization

Setting Priorities for Control Applications in LabVIEW

The relative priority of parallel processes is important in a control application. Because
LabVIEW is multi-threaded, you can separate your application into individual tasks,

256 ni.com
 NI-DAQmx Key Concepts

each with its own priority. By setting priorities, time-critical tasks can take precedence
over non-time-critical tasks. The time-critical task must periodically yield processor
resources to the lower-priority tasks so they can execute. By properly separating the
time-critical task from lower priority tasks, you can reduce application jitter. Refer to
the LabVIEW Real-Time Module Help for details on assigning priorities to tasks.

Related concepts:

• Jitter Overview for Control Applications

I/O Cycles
The input and output operations along with any processing performed during a single
sample clock period are called I/O cycles. I/O cycles can consist of reads or writes
only, but an I/O cycle in a typical control application consists of reading data,
processing that data, then writing a result.

NI-DAQmx Simulated Devices

This section includes information about timing and triggering, task behavior, and
reading and writing data with NI-DAQmx simulated devices.

Refer to the Measurement & Automation Explorer Help for NI-DAQmx for
detailed instructions on creating NI-DAQmx simulated devices and importing NI-
DAQmx simulated device configurations onto physical devices.

Related concepts:

• Timing and Triggering with NI-DAQmx Simulated Devices

• Task Behavior of NI-DAQmx Simulated Devices
• Reading and Writing Data with NI-DAQmx Simulated Devices

Timing and Triggering with NI-DAQmx Simulated Devices

With NI-DAQmx simulated devices, the following timing and triggering considerations
exist:

© National Instruments 257

 NI-DAQmx Key Concepts

• NI-DAQmx simulated devices simulate timing for continuous analog input, digital
input, and all output tasks. Timing is not simulated for counter tasks.
• NI-DAQmx simulated devices do not cause a timed loop to execute.
• NI-DAQmx simulated devices support software events. However, events that rely
on the hardware, such as a sample clock event, are not supported.
• Triggers always occur immediately.
• Watchdog timers do not expire.

Task Behavior of NI-DAQmx Simulated Devices

NI-DAQmx tasks using NI-DAQmx simulated devices are verified just as tasks are on
physical devices. If a property is set to an invalid value, the error returned for an NI-
DAQmx simulated device is identical to the error returned for a real device. All
resources necessary for the task are reserved for NI-DAQmx simulated devices. RTSI
lines, PXI Trigger lines, DMA channels, counters, and so on are counted and reserved
just as on physical devices.

Note NI-DAQmx simulated devices cannot be included in the same task with
physical devices.

Reading and Writing Data with NI-DAQmx Simulated Devices

NI-DAQmx simulated devices will show up in NI MAX as the appropriate icon ( For
example, USB, PXI, PCIe, cDAQ Chassis, C Series Module), but will be colored yellow to
indicate that the device is simulated. The naming convention for these devices is the
same as for real hardware. Data written to an NI-DAQmx simulated device is scaled as if
the device were real.

Reading Data

All NI-DAQmx simulated devices return analog input data in the form of a full-scale sine
wave with 3% of full-scale noise.

When multiple channels are in the task, the data for each channel is offset 5° in time.

Setting the minimum and maximum signal input range determines the amplitude of
the simulated signal. If you decrease the minimum and maximum values the

258 ni.com
 NI-DAQmx Key Concepts

amplitude of the simulated sine wave decreases. However, on real hardware , your
analog input signal clips at the maximum and minimum signal input range that is set.

For simulated AO data, set the minimum and maximum values for Signal Output
Range. The range cannot exceed the specifications for the real hardware. Set the Test
Signal Type to Sine Wave, Square Wave, or Triangle Wave. If you are using a Test Panel,
there are options for DC and Sinewave generation.

Digital data is always returned as if each eight-bit port were a binary counter for both
digital input and output.

Counter data is always returned as 0.

Writing Data

Data written to an NI-DAQmx simulated device is scaled as if the device were real. So,
any custom scales implemented in a task would affect the simulated data
appropriately.

Distributed Applications
This section includes information about deploying applications and using the DAQmx
I/O Server for distributed applications.

Related concepts:

• Deployment
• DAQmx I/O Server and Virtual Channels

Deployment

Deployment refers to developing an application so that it can be distributed, or

deployed, on a different computer than the one on which the application was
developed. To deploy an application, you need the saved application and any
configuration information the application and system requires.

When deploying an application, you must coordinate the use of configuration items

© National Instruments 259

 NI-DAQmx Key Concepts

that can be shared among multiple tasks. This includes devices, scales, and global
virtual channels.

Developing Applications for Deployment

You can deploy NI-DAQmx applications in several ways:

• You can use the MAX Export Wizard to deploy an entire setup to another computer,
including tasks, channels, scales, and devices.
• You can use the MAX Export Wizard to deploy an entire setup, except the device
configurations, to another computer. You might choose to do this if the target
computer already has tasks that rely on existing device configurations. In this case,
you might have to make modifications after deployment so that your tasks and
channels refer to the device configurations on the target computer.
• You can use the MAX Export Wizard initially to deploy a fixed set of device, scale,
and global virtual channel configurations among a group of users. Each member of
the group can create tasks that rely on the shared configurations, then create
applications that use these tasks, and finally share the applications within the
group. In some cases, the tasks deploy with the applications automatically. In
other cases, you must deploy the tasks separately from the applications. Refer to
the Deploying Tasks and Channels section for more information.

Deploying Tasks and Channels

Your tasks and channels deploy automatically with your application under the
following circumstances:

• You use LabVIEW Express VIs for your DAQ applications, and the tasks use local
channels only.
• You save your tasks within a LabWindows/CVI or Measurement Studio project, and
the tasks use local channels only.
• You create your tasks and channels programmatically using the NI-DAQmx API.

You must deploy your tasks and channels using the MAX Export Wizard if you create
your tasks and channels in the following ways:

• You create your tasks and channels directly in MAX.

• You create your tasks and channels in LabVIEW from the Task Name and Channel

260 ni.com
 NI-DAQmx Key Concepts

Name controls and do not generate configuration code.

• You create your tasks in LabWindows/CVI and neither generate configuration code
nor copy the tasks to your project.
• You create a SignalExpress project that includes a global virtual channel.
• You use LabVIEW Express VIs for your DAQ applications with tasks that use global
virtual channels, but do not use code generation.

Note If your project uses global virtual channels that were added, not
copied, generating a LabVIEW diagram from SignalExpress still requires
deployment of channels using the MAX Export Wizard.

DAQmx I/O Server and Virtual Channels

In NI-DAQmx 8.0 or later, you can set up distributed applications to combine remote
data applications using the NI-DAQmx I/O Server. For instance, you can configure a
central computer to monitor other computers that control hardware sensors by using
shared variables. You can connect to the NI-DAQmx I/O Server through LabVIEW 8.0 or
later, but LabVIEW is not required. If you use a third-party OPC client, you also can
access DAQ channels.

Note You must have at least one global virtual channel defined either in the
project or in Measurement & Automation Explorer (MAX) to use the NI-DAQmx
I/O Server. Global virtual channels of any I/O type can be bound to shared
variables, but tasks cannot.

When using a third-party OPC client, connect to the variable engine server to access
DAQ channels on the network.

Refer to the LabVIEW Help for information about binding to a DAQ channel using a
shared variable in a LabVIEW Project.

Functions, VIs, Properties, and Attributes

You program your device primarily with the functions (or VIs in LabVIEW) that make up
the NI-DAQmx API. The functions contain the core functionality of the API, but for

© National Instruments 261

 NI-DAQmx Key Concepts

advanced or uncommon functionality, you can use the following:

• Properties for LabVIEW, Visual C++, Visual Basic .NET, and Visual C#
• Get and Set Attribute functions for ANSI C and LabWindows/CVI

Refer to your function or VI reference help for detailed information on available

attributes and properties.

External Reference Sources for Generating Voltage

Devices that support an external voltage reference enable you to maximize the
resolution of your device. If the voltages you want to generate do not exceed a certain
level and you can supply an external reference voltage at that level, you achieve your
device's maximum resolution. The external reference voltage settings are available as
a Channel property in the Analog Output»General Properties»DAC»Reference
Voltage.

You also can use external reference voltages to apply a gain to a DC voltage or to a
time-varying waveform. For example, set your external reference voltage level to 1.0,
and write a sine wave buffer with values from -1.0 to +1.0 V. When you apply an actual
reference voltage of 2.0 V, your signal jumps to ±2 V in amplitude. Increasing the
reference voltage level to 3.0 again jumps the signal to ±3 V. Applying a reference
voltage level of 0.0 V immediately flat-lines your time-varying voltage signal at 0.0 V.

The terminal you use for external reference sources varies depending on your device.

Related concepts:

• External Reference Sources

Custom Scales
You can create scales to specify a conversion from the prescaled units measured by a
channel to the scaled units associated with your transducer or actuator. For input
channels, the scale converts samples read to the final scaled units. For example, a
scale could convert a voltage to a linear position. For output channels, the scale
converts samples written to the prescaled units of the channel. For example, a scale

262 ni.com
 NI-DAQmx Key Concepts

could convert a linear position to a voltage. You also can use scales to calibrate
samples read or written so that the final scaled units are identical to the prescaled
units of the channel.

Often, you do not need to create a scale because NI-DAQmx has explicit support for
many of the most common transducers, sensors, and actuators. For example, when
creating an analog input temperature channel, you can specify the type of transducer
(for example, thermistor, RTD, or thermocouple) used to make the measurement when
creating the channel. However, if NI-DAQmx does not explicitly support your
transducer or actuator, you can create a scale that specifies how to convert from the
prescaled units to the scaled units. You can associate the same scale with multiple
channels. You do not need to create a scale for each channel if the scale is the same.
After a scale is assigned to a channel, the scale applies to all attributes normally
expressed in the prescaled units of the channel. For example, if a custom scale, which
converts volts to meters, is assigned to a voltage channel, the channels minimum and
maximum attributes are expressed in meters.

Prescaled Versus Scaled Units

Prescaled refers to values expressed in the unit of the channel prior to the custom
scale being applied. Usually, these prescaled units are volts or amps since scales are
most often associated with channels that natively measure or generate signals using
these units. However, it is possible to associate a scale with a channel that contains a
transducer explicitly supported by NI-DAQmx. In this case, the prescaled units are the
units of the channel including the explicitly supported transducer. For example, you
can create a analog input resistance channel and associate a scale with this channel. In
this example, the prescaled units would be ohms and the scale would specify how to
convert from ohms to the desired scaled units.

Scaled refers to values expressed in the final unit after NI-DAQmx applies the custom
scale. For example, a linear-position-to-voltage scale is assigned to a voltage output
channel. In this case, the prescaled samples are in volts while the scaled samples
could be specified in meters. Scaled units are the units that are most convenient for
your application. You have complete control over the scaled units when specifying
your scale. The scale specifies the conversion from the prescaled units of the signal
measured or generated by the channel to your specified scaled units. When you read
samples from a channel associated with a scale, the samples are in scaled units.

© National Instruments 263

 NI-DAQmx Key Concepts

Likewise, when you write samples to a channel associated with a scale, the samples
are in scaled units.

You can create scales in the DAQ Assistant or programmatically. When you
programmatically associate a scale with a channel, you must set the custom scale
name attribute/property to the name of the scale and set the units attribute/property
to From Custom Scale.

Note Unscaled data is not synonymous with prescaled units. Unscaled data
refers to an 8-, 16-, or 32-bit integer in the native format of the device.
Prescaled refers to the units of measurement, such as volts or amps, before a
custom scale is applied.

Related concepts:

• Unscaled Data

Example—Converting Volts to Revolutions/Minute

Imagine that you have connected an analog output voltage channel to a motor whose
speed is proportional to the generated voltage, and you want to create a scale that
specifies this conversion. The prescaled units in this case would be volts and the
scaled units could be revolutions/minute. You would then specify the equation, table,
or map that converts from volts to revolution/minute. After you have created this
scale, you would associate the scale with an analog output voltage channel. Now,
rather than having to convert between volts and revolutions/minute when operating
your application or having to develop additional code in your application to perform
this conversion, you can simply write samples in units of revolutions/minute directly to
the channel associated with the scale and NI-DAQmx automatically performs the
specified conversions. Scales can simplify your code and improve the usability of your
application.

Applying Scales That Do Not Monotonically Increase or Decrease

Some scale types allow scales that do not monotonically increase or decrease. This is
problematic because application of the scale may not produce the desired results. For
example, if multiple prescaled values map to the same scaled value, the conversion

264 ni.com
 NI-DAQmx Key Concepts

from the scaled value to the prescaled values is ambiguous. The conversion is well
defined and predictable even in these cases. While not disallowed, non-monotonically
increasing scales should be avoided or used with caution.

NI-DAQmx Versus Traditional NI-DAQ (Legacy)

NI-DAQmx replaced Traditional NI-DAQ (Legacy) in 2003. NI-DAQmx and Traditional NI-
DAQ (Legacy) have their own APIs, hardware configurations, and software
configurations.

NI DAQmx
NI-DAQmx has the following advantages over Traditional NI-DAQ (Legacy):

• DAQ Assistant—a graphical way to configure virtual channels and measurement

tasks for your device, and to generate NI-DAQmx code based on your virtual
channels and tasks, for use in LabVIEW, SignalExpress, LabWindows/CVI, and
Measurement Studio.
• Increased performance, including faster single-point analog I/O and
multithreading.
• NI-DAQmx simulated devices for testing and modifying applications without
plugging in hardware.
• Simpler, more intuitive APIs for creating DAQ applications using fewer functions
and VIs than earlier versions of NI-DAQ.
• Expanded functionality for LabVIEW, including property nodes and waveform data
type support.
• Similar APIs and functionality for ANSI C, LabWindows/CVI, and Measurement
Studio, including native .NET and C++ interfaces.
• Improved support and performance for the LabVIEW Real-Time Module.

Who Can Use NI-DAQmx

Install and use NI-DAQmx if the following situations apply:

• You are a new user.

• You are using devices supported by NI-DAQmx; refer to the NI-DAQmx Readme for a
list of supported devices.

© National Instruments 265

 NI-DAQmx Key Concepts

• You are using an OS supported by NI-DAQmx; refer to the NI-DAQmx Readme for a
list of supported OSes.

If you are using NI application software with NI-DAQmx, you must use supported
versions of LabVIEW, LabWindows/CVI, Measurement Studio, NI SignalExpress, or the
LabVIEW Real-Time Module. Refer to the NI-DAQmx Readme for specific versions of NI
application software supported in your version of NI-DAQmx.

If you use one of the Microsoft .NET languages, Visual C# and/or Visual Basic .NET, or a
device supported only by NI-DAQmx, such as an M Series device, you must use NI-
DAQmx.

You also can use NI-DAQmx with a supported compiler, such as an ANSI C compiler.

Who Must Use Traditional NI-DAQ (Legacy)

Install and use Traditional NI-DAQ (Legacy) if one of the following situations apply:

• You have a device that is not supported by NI-DAQmx, such as the AT E Series
multifunction DAQ devices.
• You are using an unsupported version of LabVIEW, LabWindows/CVI, or
Measurement Studio.
• You are upgrading from NI-DAQ 6.9.x and have existing applications that you do
not want to port to NI-DAQmx now.

266 ni.com
 NI-DAQmx Device Considerations

NI-DAQmx Device Considerations

This help file contains information specific to analog output (AO) Series devices, B
Series devices, C Series devices, digital I/O (DIO) devices, DSA devices, E Series devices,
FieldDAQ Devices, M Series devices, S Series devices, SCC devices, SC Express, SCXI
devices, switches, timing I/O (TIO) devices, USB DAQ devices, and X Series devices that
might help you as you create applications with NI-DAQmx.

Device Groups in NI-DAQmx

Refer to the following list to see how devices are grouped in NI-DAQmx.

FieldDAQ

• FD-11601
• FD-11603
• FD-11605
• FD-11613
• FD-11614
• FD-11634
• FD-11637

CompactRIO Single-Board Controllers

• sbRIO-9603
• sbRIO-9608
• sbRIO-9609
• sbRIO-9628
• sbRIO-9629
• sbRIO-9638

CompactRIO Controllers

• cRIO-9040
• cRIO-9041
• cRIO-9042

© National Instruments 267

 NI-DAQmx Device Considerations

• cRIO-9043
• cRIO-9045
• cRIO-9046
• cRIO-9047
• cRIO-9048
• cRIO-9049
• cRIO-9053
• cRIO-9054
• cRIO-9055
• cRIO-9056
• cRIO-9057
• cRIO-9058

X Series DAQ (Multifunction I/O)

• NI 6320
• NI 6321
• NI 6323
• NI 6341
• NI 6343
• NI 6345
• NI 6346
• NI 6349
• NI 6351
• NI 6353
• NI 6355
• NI 6356
• NI 6358
• NI 6361
• NI 6363
• NI 6365
• NI 6366
• NI 6368
• NI 6374
• NI 6375
• NI 6376
• NI 6378

268 ni.com
 NI-DAQmx Device Considerations

• NI 6386
• NI 6396

M Series DAQ (Multifunction I/O)

• NI 6210/11/12/15/16/18
• NI 6220
• NI 6221
• NI 6224
• NI 6225
• NI 6229
• NI 6230/32/33/36/38/39
• NI 6250
• NI 6251
• NI 6254
• NI 6255
• NI 6259
• NI 6280
• NI 6281
• NI 6284
• NI 6289

S Series DAQ

• NI 6110
• NI 6111
• NI 6115
• NI 6120
• NI 6122
• NI 6123
• NI 6124
• NI 6132
• NI 6133
• NI 6143
• NI 6154

© National Instruments 269

 NI-DAQmx Device Considerations

SC Express

• NI 4300
• NI 4302
• NI 4303
• NI 4304
• NI 4305
• NI 4309
• NI 4310
• NI 4322
• NI 4330
• NI 4331
• NI 4339
• NI 4340
• NI 4353
• NI 4357

C Series, Network DAQ, and USB DAQ

• NI 9201
• NI 9202
• NI 9203
• NI 9204
• NI 9205
• NI 9206
• NI 9207
• NI 9208
• NI 9209
• NI 9210
• NI 9211
• NI 9212
• NI 9213
• NI 9214
• NI 9215
• NI 9216
• NI 9217
• NI 9218

270 ni.com
 NI-DAQmx Device Considerations

• NI 9219
• NI 9220
• NI 9221
• NI 9222
• NI 9223
• NI 9224
• NI 9225
• NI 9226
• NI 9227
• NI 9228
• NI 9229
• NI 9230
• NI 9231
• NI 9232
• NI 9234
• NI 9235
• NI 9236
• NI 9237
• NI 9237 (DSUB)
• NI 9238
• NI 9239
• NI 9242
• NI 9244
• NI 9246
• NI 9247
• NI 9250
• NI 9251
• NI 9252
• NI 9253
• NI 9260
• NI 9262
• NI 9263
• NI 9264
• NI 9265
• NI 9266
• NI 9269
• NI 9326

© National Instruments 271

 NI-DAQmx Device Considerations

• NI 9344
• NI 9361
• NI 9375
• NI 9401
• NI 9402
• NI 9403
• NI 9411
• NI 9421
• NI 9422
• NI 9423
• NI 9425
• NI 9426
• NI 9435
• NI 9436
• NI 9437
• NI 9469
• NI 9472
• NI 9474
• NI 9475
• NI 9476
• NI 9477
• NI 9478
• NI 9481
• NI 9482
• NI 9485
• NI 9775

CompactDAQ Chassis

• NI cDAQ-9171
• NI cDAQ-9174
• NI cDAQ-9178
• NI cDAQ-9179
• NI cDAQ-9181
• NI cDAQ-9184
• NI cDAQ-9185
• NI cDAQ-9188

272 ni.com
 NI-DAQmx Device Considerations

• NI cDAQ-9189
• NI cDAQ-9188XT
• NI cDAQ-9191

CompactDAQ Controllers

• NI cDAQ-9132
• NI cDAQ-9133
• NI cDAQ-9134
• NI cDAQ-9135
• NI cDAQ-9136
• NI cDAQ-9137

AO Series

• NI 6703
• NI 6704
• NI 6711
• NI 6713
• NI 6722
• NI 6723
• NI 6731
• NI 6733
• NI 6738
• NI 6739

Digital I/O

• NI 6501
• NI 6503
• NI 6508
• NI 6509
• NI 6510
• NI 6511
• NI 6512
• NI 6513
• NI 6514
• NI 6515

© National Instruments 273

 NI-DAQmx Device Considerations

• NI 6516
• NI 6517
• NI 6518
• NI 6519
• NI 6520
• NI 6521
• NI 6525
• NI 6527
• NI 6528
• NI 6529
• NI 6533
• NI 6534
• NI 6535
• NI 6535B
• NI 6536
• NI 6536B
• NI 6537
• NI 6537B
• NI DIO-32HS
• NI DIO-96

TIO Series

• NI 6601
• NI 6602
• NI 6608
• NI 6612
• NI 6614
• NI 6624

Dynamic Signal Acquisition (DSA)

• NI 4431
• NI 4432
• NI 4461
• NI 4462
• NI 4463

274 ni.com
 NI-DAQmx Device Considerations

• NI 4464
• NI 4466
• NI 4472/B
• NI 4474
• NI 4480
• NI 4481
• NI 4492
• NI 4495
• NI 4496
• NI 4497
• NI 4498
• NI 4499
• NI 4610

Academic Devices

• NI ELVIS II
• NI ELVIS II+
• NI myDAQ

Low-Cost USB

• NI 6000
• NI 6001
• NI 6002
• NI 6003
• NI 6008
• NI 6009
• NI TC01

Analog Triggering
This section contains information about analog triggering for C Series, NI ELVIS II
Family, DSA, E Series, M Series, S Series, and SC Express devices.

© National Instruments 275

 NI-DAQmx Device Considerations

Valid Analog Trigger Sources for DSA Devices

The analog trigger source must be a channel included in your physical channel list. PFI
0 is not a valid analog trigger source. PFI 0 is reserved for digital triggers.

Analog Triggering Considerations for TestScale Modules and C

Series, E Series, M Series, and S Series Devices

Note Not all E Series, M Series, S Series, and C Series devices support analog
triggering. Refer to the specifications for your device to determine if your
device supports analog triggering.

Certain C Series, E Series, M Series, S Series devices and TestScale modules contain a
single analog trigger circuit that you can configure for analog triggering. The analog
trigger circuitry is a shared resource for the device, and any of the subsystems can use
it. This trigger circuitry supports level and slope triggering with hysteresis as well as
analog window triggering. After it is configured, the output of this circuitry appears as
the Analog Comparison Event, which can be the source for various triggers and clocks
within the analog input, analog output, and counter subsystems.

Sharing an Analog Trigger for C Series, E Series, M Series, and S Series

Devices

Even though the analog trigger is a shared resource, only one analog input or analog
output task at a time can configure and reserve it. If you want to share the analog
trigger among multiple tasks, configure and reserve it in one task, and use the trigger
in subsequent tasks by referring to the source of your trigger, clock, or signal of
interest as the Analog Comparison Event. For tasks that support multiple types of
analog triggers within the same task, all triggers must share the same configuration
settings, or you receive an error. For instance, if you want to use an analog trigger for
both your Start and Reference Trigger within an analog input task, the configuration
settings for the start and Reference Trigger must be identical.

E Series and S Series Valid Sources for the Analog Trigger

• PFI 0

276 ni.com
 NI-DAQmx Device Considerations

Typically, when configuring an analog trigger, you connect your analog signal to
the PFI 0 terminal. Because PFI 0 is the trigger source for both analog and digital
signals, NI-DAQmx automatically tristates this terminal when a task exporting a
signal on the terminal is not in the committed or running state. This behavior when
exporting a signal on PFI 0 differs from typical task-based routing with other PFI
lines. It prevents accidental connections of an analog signal directly to digital
circuitry, which could permanently damage the device. Also, notice that when
connecting an analog signal to PFI 0, the terminal configuration is referenced
single-ended.

Even when PFI 0 is not the source of your analog trigger, you cannot use PFI 0 for
other digital signal routes because the analog trigger takes over the PFI 0 terminal
internal to the device when it is enabled. If you try to use the analog trigger and PFI
0 for digital signals at the same time, you receive a routing error.

Note On PXI-6132/6133 and PXIe-6124 devices, you cannot use PFI 0 as

the source of an analog trigger. On PXI-6132/6133, the analog triggering
circuitry still reserves PFI 0 for internal routing.

• Analog Input Channel

In addition to PFI 0, analog input tasks can trigger off of one of the analog input
channels being sampled. Because E Series devices use a scanning architecture,
many restrictions are placed on how you can use an analog trigger when the
source is one of the channels you are sampling. When you use an analog Start
Trigger, the trigger channel must be the first channel in the channel list. When you
use an Analog Reference or Pause Trigger, and the analog channel is the source of
the trigger, there can be only one channel in the channel list. If you have more than
one channel for Pause or Reference Triggers, you must use PFI 0. Since S Series
devices do not use a scanning architecture, none of these restrictions apply.
Therefore, for an S Series device, you can use any analog input channel as the
source of the trigger regardless of how many channels are being sampled or the
order of the trigger channel in the sequence.

• Scaling with PFI 0 and Analog Input Channels

Scaling, including custom scales, is not applied if PFI 0 is the trigger source. For
instance, you would specify the DAQmx Trigger Analog Edge Level

© National Instruments 277

 NI-DAQmx Device Considerations

attribute/property in volts. However, if you use an analog input channel as the

trigger source, you could use scaled units.

M Series Valid Sources for the Analog Trigger

• APFI 0 and APFI 1

When configuring an analog trigger, connect your analog signal to either the APFI 0
or APFI 1 terminal and specify APFI 0 or APFI 1 as your trigger source.

• Analog Input Channel

In addition to APFI 0 and APFI 1, analog input tasks can trigger off of one of the
analog input channels being sampled. Because M Series devices use a scanning
architecture, many restrictions are placed on how you can use an analog trigger
when the source is one of the channels you are sampling. When you use an Analog
Start Trigger, the trigger channel must be the first channel in the channel list. When
you use an Analog Reference or Pause Trigger, and the analog channel is the source
of the trigger, there can be only one channel in the channel list. If you have more
than one channel for Pause or Reference Triggers, you must use APFI 0 or APFI 1.

• Scaling with APFI 0, APFI 1, and Analog Input Channels

Scaling, including custom scales, is not applied if APFI 0 or APFI 1 is the trigger
source. For instance, you would specify the DAQmx Trigger Analog Edge Level
attribute/property in volts. However, if you use an analog input channel as the
trigger source, you could use scaled units.

Device Calibration and Accuracy of the Analog Trigger for E Series, M

Series, C Series, or S Series Devices

The trigger DACs in the analog trigger circuitry on an E Series, M Series, C Series, or S
Series device typically contain four less bits of accuracy than the ADC of the device. No
hardware calibration is provided for the analog trigger circuitry. In addition, the
propagation delay from when a valid trigger condition is met to when the analog
trigger circuitry emits the Analog Comparison Event may have an impact on your
measurements if the trigger signal has a high slew rate. If you find these conditions
have a noticeable impact on your measurements, you can perform software calibration

278 ni.com
 NI-DAQmx Device Considerations

on the analog trigger circuitry by configuring your task as normal and applying a
known signal for your analog trigger. Comparing the observed results against the
expected results, you can calculate the necessary offsets to apply in software to fine
tune the desired triggering behavior.

C Series and TestScale Module Valid Sources for the Analog Trigger

The NI 9204, NI 9205, and TS-15100 have no APFI 0 or APFI 1 terminal. Analog input
tasks using the NI 9204, NI 9205, or TS-15100 can trigger off one of the analog input
channels being sampled. When you use an Analog Start Trigger, the trigger channel
must be the first channel from the NI 9204, NI 9205, or TS-15100 in the channel list, but
channels from other C Series devices can come first. When you use an Analog
Reference or Pause Trigger, you can use only one channel from the NI 9204, NI 9205, or
TS-15100 in the channel list, but you can use channels from other C Series devices. You
can combine Analog Start, Reference, and Pause Triggers with different configuration
settings by using multiple NI 9204 or NI 9205 devices. All analog triggers on the same
device must share the same configuration settings.

The NI 9775 can only use an analog trigger that is an active channel. See NI 9775
Considerations for further restrictions on analog trigger usage. When you use a
trigger with the NI 9775 in Analog Multi Edge, all of the trigger channels must come
from the same device. When using multiple NI 9775 modules, those modules can be in
the same task as long as the trigger source comes from one of the NI 9775 modules.

Related concepts:

• NI 9775 Considerations

Triggering Considerations for NI ELVIS II Family Devices

On NI ELVIS II Family devices, APFI 0 and APFI 1 are not valid analog trigger sources.
When using a Reference Trigger, supported trigger types are analog edge, analog
window, and digital edge. When using a Start Trigger, digital edge is the only supported
trigger type. Valid digital trigger sources are PFI 15 and SYNC terminals. NI ELVIS II+
also supports analog reference triggering with multiple channels for oscilloscope
channels.

© National Instruments 279

 NI-DAQmx Device Considerations

Analog Triggering Considerations for SC Express Devices

Analog triggering on SC Express devices uses one of the device's ADCs to sample the
trigger signal. If the frequency of the trigger signal is higher than the ADC's Nyquist
frequency (half of the sampling rate), aliasing may prevent triggers from being
detected reliably.

Note Analog trigger condition thresholds are reverse-calibrated internally by

NI-DAQmx, so it is recommended that you self-calibrate your SC Express
device (if self-calibration is supported on your device) prior to running an
analog triggered acquisition.

The frequency of the trigger signal is also limited by lowpass filtering on the device's
analog front end. On the NI 4300 and NI 4310, the lowpass filter can be controlled
using the AI.Lowpass.Enable and AI.Lowpass.CutoffFreq channel attributes/properties.
On the NI 433x devices, the lowpass filter cutoff frequency is determined by the
sampling rate. The analog trigger source can be set to any one of the channels on the
device.

Analog triggering on SC Express devices supports only Reference Triggers, not Start
and Pause Triggers. Digital triggering on SC Express devices does not have this
restriction.

Note Analog triggers are not supported on the NI 4309, NI 4322, NI 4353, or
NI 4357.

Note The NI 4302/4303/4304/4305, NI 4310 and NI 4340 support only analog

reference triggering.

Device Calibration Considerations

Device calibration consists of verifying the measurement accuracy of a device and
adjusting for any measurement error. Verification consists of measuring the
performance of the device and comparing these measurements to the published
specifications. During calibration, you supply and read voltage levels or other signals

280 ni.com
 NI-DAQmx Device Considerations

using external standards, then you adjust the device calibration constants. The new
calibration constants are stored in the EEPROM. These calibration constants are loaded
from memory as needed to adjust for the error in the measurements taken by the
device.

AO Series Calibration
Your device uses software calibration to fine-tune the analog output circuitry. The
software must be programmed (or loaded) with certain numbers called calibration
constants. Those constants are stored in nonvolatile memory (EEPROM) on your device
or are maintained by NI-DAQmx. To achieve specification accuracy, you should self-
calibrate your device just before a measurement session but after your computer and
the device have been powered on and warmed up for at least 15 minutes. You should
allow this same warm-up time before performing any calibration of your system.
Frequent calibration produces the most stable and repeatable measurement
performance. The device is not harmed in any way if you recalibrate it often.

Static AO devices, such as the NI 6703 and NI 6704, do not self-calibrate or

automatically calibrate. You must use a manual procedure to calibrate static AO
devices. Refer to the calibration procedure for your device.

Note

• Calibrating your AO device takes some time. Do not be alarmed if the

Self-Calibrate or Adjust AO Series Calibration function/VI takes several
seconds to execute.
• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.

NI-DAQmx automatically loads calibration constants into the software whenever you
call functions/VIs that depend on them.

Related concepts:

• Device Calibration Signal Connections for AO Series Devices

© National Instruments 281

 NI-DAQmx Device Considerations

Related information:

• Calibration Procedures

C Series Calibration
Your device uses software calibration to adjust the software scaling of signals read
from and produced by your device. Using a precise reference signal, your device
measures and calculates scaling constants for analog input and analog output. The
scaling constants are stored in nonvolatile memory (EEPROM) on your device. NI
recommends that you calibrate your device just before a measurement session but
after your module has been powered on and warmed up for at least 15 minutes. You
should allow this same warm-up time before performing any calibration of your
system. Frequent calibration produces the most stable and repeatable measurement
performance. The device is not harmed in any way if you recalibrate it often.

Note

• Calibrating your device takes some time. Do not be alarmed if the

Adjust C Series Calibration function/VI takes several seconds to
execute.
• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.
• The NI 9204, NI 9205, and NI 9206 are calibrated using the M Series
calibration process.

C Series devices do not self-calibrate or automatically calibrate. You must use a

manual procedure to calibrate these devices.

Related information:

• Calibration Procedures

282 ni.com
 NI-DAQmx Device Considerations

Virtual Channel Calibration Support

The following devices do not support NI-DAQmx virtual channel calibration:

• NI DAQPad-6015
• NI DAQPad-6016
• NI PCI-6010
• NI PCI-6013
• NI PCI-6014
• NI USB-6000
• NI USB-6001
• NI USB-6002
• NI USB-6003
• NI USB-6008
• NI USB-6009
• SensorDAQ

DSA Calibration
Your device contains digital correction circuitry to compensate for gain and offset
errors in the analog and ADC circuitry. The gain and offset calibration constants are
stored in nonvolatile memory (EEPROM) on your device. NI-DAQmx writes these
calibration constants to the digital correction circuitry.

To achieve the maximum accuracy, you should perform external calibration at least
once per year (the recommended external calibration interval) and perform self-
calibration prior to measurement sessions or otherwise, as desired. You should
calibrate your device only after your computer and the device have been powered on
and warmed up for at least 15 minutes.

Self-Calibration

Self-calibration is executed with the Self Calibrate VI/function. When you self-calibrate
a DSA device, you do not need signal connections. However, for devices with analog
output channels, values generated on those output channels can change during the
calibration process. If you have external equipment connected to the AO channels and
changing the AO voltage could damage the external equipment, you should

© National Instruments 283

 NI-DAQmx Device Considerations

disconnect the external equipment before performing the self-calibration.

Note Some DSA devices do not support self-calibration.

External Calibration

External calibration is performed using a customized calibration program and external

test equipment that has itself been calibrated to the required accuracy or standard.
This operation is usually performed by a specialized metrology laboratory. The
equipment and connections required to externally calibrate a device varies depending
on the device category. For devices that support DC coupling, you need a stable and
accurate DC voltage signal to calibrate the AI subsystem. For devices that support AC
coupling, a sinusoidal source may be required for the calibration procedure instead of
the DC source. NI 4461, 4462, 4463, 4464, 4480, and 4481 devices also include an
adjustable frequency timebase. You need a stable sinusoidal frequency source to
calibrate this timebase. The PCI-4461, PXI-4461, PXIe-4463, and USB-4431 devices also
support analog output. You need a digital multimeter (DMM) to calibrate the AO
subsystem. The DC voltage, frequency source, and DMM can be manually or
automatically controlled and switched between channels, depending on the nature of
the customized calibration program.

E Series Calibration
Your device uses hardware calibration to adjust the analog circuitry. This calibration is
done with calibration digital-to-analog converters, called calDACs, that fine-tune the
analog circuitry. The calDACs must be programmed (or loaded) with certain numbers
called calibration constants. Those constants are stored in nonvolatile memory
(EEPROM) on your device or are maintained by NI-DAQmx. NI recommends that you
self-calibrate your device just before a measurement session but after your computer
and the device have been powered on and warmed up for at least 15 minutes. You
should allow this same warm-up time before performing any calibration of your
system. Frequent calibration produces the most stable and repeatable measurement
performance. The device is not harmed in any way if you recalibrate it often.

Note

284 ni.com
 NI-DAQmx Device Considerations

• Calibrating your MIO or AI device takes some time. Do not be alarmed if

the Self-Calibrate or Adjust E Series Calibration function/VI takes
several seconds to execute.
• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.

Calibration Constant Loading by NI-DAQmx

NI-DAQmx automatically loads calibration constants into calDACs whenever you call
functions/VIs that depend on them. The following conditions apply:

• 12-bit E Series devices

◦ 12-bit devices use a single set of calibration constants for both unipolar and
bipolar modes of analog input.
◦ One set of constants is valid for unipolar, and another set is valid for bipolar
configuration of the analog output channels. When you change the polarity of
an analog output channel, NI-DAQmx reloads the calibration constants for that
channel.
• 16-bit E Series devices
◦ Calibration constants required by the 16-bit E Series devices for unipolar
analog input channels are different from those for bipolar analog input
channels. If you are acquiring data from one channel, or if all of the channels
you are acquiring data from are configured for the same polarity, NI-DAQmx
selects the appropriate set of calibration constants for you. If you are scanning
several channels, and you mix channels configured for unipolar and bipolar
mode in your scan list, NI-DAQmx loads the calibration constants that
correspond to the first channel in the scan list.
◦ NI 6025E devices use a single set of calibration constants for both unipolar and
bipolar modes of analog input.
◦ One set of constants is valid for unipolar, and another set is valid for bipolar
configuration of the analog output channels. When you change the polarity of
an analog output channel, NI-DAQmx reloads the calibration constants for that
channel.

Related concepts:

© National Instruments 285

 NI-DAQmx Device Considerations

• Device Calibration Signal Connections for E Series Devices

FieldDAQ Calibration
FieldDAQ devices use software calibration to adjust the software scaling of signals read
from and produced by your device. Using a precise reference signal, your device
measures and calculates scaling constants for analog input. The scaling constants are
stored in nonvolatile memory (EEPROM) on your device. Frequent calibration produces
the most stable and repeatable measurement performance. The device is not harmed
in any way if you recalibrate it often.

Note

• Calibrating your device takes some time. Do not be alarmed if the

Adjust FieldDAQ Calibration function/VI takes several seconds to
execute.
• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.

FieldDAQ devices do not self-calibrate or automatically calibrate. You must use a

manual procedure to calibrate these devices.

FieldDAQ devices include the FD-11601, FD-11603, FD-11605, FD-11613, FD-11614,

FD-11634, and FD-11637.

Related information:

• Calibration Procedures

M Series, NI 6010, NI 9204, NI 9205, NI 9206, and TS-15100

Calibration
Your device uses software calibration to adjust the software scaling of signals read
from and produced by your device. Using calibration pulse width modulated (PWM)
sources with a reference voltage, your device measures and calculates scaling

286 ni.com
 NI-DAQmx Device Considerations

constants for analog input and analog output. The scaling constants are stored in
nonvolatile memory (EEPROM) on your device. NI recommends that you self-calibrate
your device just before a measurement session but after your computer and the device
have been powered on and warmed up for at least 15 minutes. You should allow this
same warm-up time before performing any calibration of your system. Frequent
calibration produces the most stable and repeatable measurement performance. The
device is not harmed in any way if you recalibrate it often.

Note

• Calibrating your device takes some time. Do not be alarmed if the Self-
Calibrate or Adjust M Series Calibration function/VI takes several
seconds to execute.
• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.

NI 6154 Calibration
Your device uses software calibration to adjust the software scaling of signals read
from and produced by your device. Using calibration pulse-width modulated (PWM)
sources with a reference voltage, your device measures and calculates scaling
constants for analog input and analog output. The scaling constants are stored in
nonvolatile memory (EEPROM) on your device. NI recommends that you self-calibrate
your device just before a measurement session but after your computer and the device
have been powered on and warmed up for at least 15 minutes. You should allow this
same warm-up time before performing any calibration of your system. Frequent
calibration produces the most stable and repeatable measurement performance. The
device is not harmed in any way if you recalibrate it often.

Note

• Calibrating your device takes some time. Do not be alarmed if the Self-
Calibrate or Adjust S Series Calibration function/VI takes several
seconds to execute.

© National Instruments 287

 NI-DAQmx Device Considerations

• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.

NI 6614 Calibration
Only external calibration, not self-calibration, is supported for NI 6614 devices. You
should allow 15 minutes of warm-up time before performing any calibration of your
system. Frequent calibration produces the most stable and repeatable measurement
performance. The device is not harmed in any way if you recalibrate it often.

Note

• Calibrating your device takes some time. Do not be alarmed if the

DAQmx Adjust TIO Timebase Calibration function/VI takes several
minutes to execute.
• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.

NI PXI-6608 Calibration
You cannot calibrate the PXI-6608 in NI-DAQmx. The device must be calibrated using
the Traditional NI-DAQ (Legacy) driver. To use the NI PXI-6608 in NI-DAQmx after
calibrating it in Traditional NI-DAQ (Legacy), you must do one of the following:

• Call the Traditional NI-DAQ (Legacy) Device Reset function/VI.

—or—

• Right-click the Traditional NI-DAQ (Legacy) Devices folder in MAX and select Reset
Driver for Traditional NI-DAQ.

288 ni.com
 NI-DAQmx Device Considerations

S Series Calibration
Your device uses hardware calibration to adjust the analog circuitry. This calibration is
done with calibration digital-to-analog converters, called calDACs, that fine-tune the
analog circuitry. The calDACs must be programmed (or loaded) with certain numbers
called calibration constants. Those constants are stored in nonvolatile memory
(EEPROM) on your device or are maintained by NI-DAQmx. NI recommends that you
self-calibrate your device just before a measurement session but after your computer
and the device have been powered on and warmed up for at least 15 minutes. You
should allow this same warm-up time before performing any calibration of your
system. Frequent calibration produces the most stable and repeatable measurement
performance. The device is not harmed in any way if you recalibrate it often.

Note

• Calibrating your MIO or AI device takes some time. Do not be alarmed if

the DAQmx Self-Calibrate or Adjust S Series Calibration function/VI
takes several seconds to execute.
• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.

Related concepts:

• Device Calibration Signal Connections for S Series Devices

SC Express Calibration
The NI 4300, NI 4309, NI 4310, and NI 4340 use software calibration to adjust the
software scaling of signals read from and produced by your device. Using onboard
calibration pulse-width modulated (PWM) sources and an external reference voltage,
your device calculates scaling constants for analog input. The scaling constants are
stored in nonvolatile memory (EEPROM) on your device. NI recommends that you self-
calibrate your device just before a measurement session but after your computer and
the device have been powered on and warmed up for at least 15 minutes. You should
allow this same warm-up time before performing any calibration of your system.
Frequent calibration produces the most stable and repeatable measurement

© National Instruments 289

 NI-DAQmx Device Considerations

performance. The device is not harmed in any way if you recalibrate it often.

Note

• Calibrating your device takes some time. Do not be alarmed if the Self-
Calibrate or Adjust 4300 Calibration function/VI takes several minutes
to execute.
• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.

The NI 4302/4303/4304/4305, NI 4322, NI 433x, NI 4353, and NI 4357 do not self-

calibrate or automatically calibrate. You must use a manual procedure to calibrate NI
4302/4303/4304/4305, NI 4322, NI 433x, NI 4353, and NI 4357 devices.

Related information:

• Calibration Procedures

SCXI-1600 Calibration
The external calibration process for the SCXI-1600 module is nearly identical to the E
Series devices. However, when applying a precision voltage to the module, you must
connect the signal to the EXTCAL BNC connector on the front of the SCXI-1600, instead
of the AI0 analog input channel. In LabVIEW, use the Adjust E-Series Calibration VI,
instead of the Adjust SC Baseboard Calibration VI.

X Series Calibration
Your device uses software calibration to adjust the software scaling of signals read
from and produced by your device. Using calibration pulse width modulated (PWM)
sources with a reference voltage, your device measures and calculates scaling
constants for analog input and analog output. The scaling constants are stored in
nonvolatile memory (EEPROM) on your device. NI recommends that you self-calibrate
your device just before a measurement session but after your computer and the device
have been powered on and warmed up for at least 15 minutes. You should allow this

290 ni.com
 NI-DAQmx Device Considerations

same warm-up time before performing any calibration of your system. Frequent
calibration produces the most stable and repeatable measurement performance. The
device is not harmed in any way if you recalibrate it often.

Note

• Calibrating your device takes some time. Do not be alarmed if the Self-
Calibrate or Adjust X Series Calibration function/VI takes several
seconds to execute.
• For best results, stop any ongoing tasks and disconnect any
unnecessary external connections before running calibration.

Signal Connections
This section contains information about calibration signal connections for AO Series, E
Series, M Series, NI 6010, NI 6154, S Series, and X Series devices.

Related concepts:

• Device Calibration Signal Connections for AO Series Devices

• Device Calibration Signal Connections for E Series Devices
• Device Calibration Signal Connections for M Series and NI 6010 Devices
• Device Calibration Signal Connections for the NI 6154
• Device Calibration Signal Connections for NI 6614
• Device Calibration Signal Connections for S Series Devices
• Device Calibration Signal Connections for X Series Devices

Device Calibration Signal Connections for AO Series Devices

When you self-calibrate your AO Series device, no signal connections are necessary.
However, values generated on the analog output channels change during the
calibration process.

When externally calibrating your AO Series device, connect the signals as described
below for the type of AO Series device you are calibrating. Set the reference voltage
between +6.000 V and +9.999 V. Typically, you use a calibrator or other stable voltage

© National Instruments 291

 NI-DAQmx Device Considerations

source for the reference voltage. Do not use a power supply as its signals are not very
stable.

Follow these steps for AO Series devices:

1. Connect the positive output of your reference voltage source to the EXT REF
terminal.
2. Connect the negative output of your reference voltage source to the AO GND
terminal.

Related information:

• Calibration Procedures

Device Calibration Signal Connections for E Series Devices

When you self-calibrate your E Series device, no signal connections are necessary.
However, values generated on the analog output channels change during the
calibration process. If you have external circuitry connected to the analog output
channels and you do not want changes on these channels, you should disconnect the
circuitry before beginning the self-calibration.

When externally calibrating your E Series device, connect the signals as described
below for the type of E Series device you are calibrating. Set the reference voltage
between +6.000 V and +9.999 V. Typically, you use a calibrator or other stable voltage
source for the reference voltage. Do not use a power supply as its signals are not very
stable.

• 12-Bit E Series Devices

Follow these steps for 12-bit E Series devices:

1. Connect the positive output of your reference voltage source to physical

channel ai8.
2. Connect the negative output of your reference voltage source to the AI SENSE
terminal.
3. Connect physical channel ao0 to physical channel ai0.
4. If your reference voltage source and your computer are floating with respect to

292 ni.com
 NI-DAQmx Device Considerations

each other, connect the AI SENSE terminal to the AI GND terminal as well as to
the negative output of your reference voltage source.

• 16-Bit E Series Devices

Follow these steps for 16-bit E Series devices:

1. Connect the positive output of your reference voltage source to physical

channel ai0.
2. Connect the negative output of your reference voltage source to physical
channel ai8.
3. If your reference voltage source and your computer are floating with respect to
each other, connect the negative output of your reference voltage source to the
AI GND terminal as well as to physical channel ai8.

Device Calibration Signal Connections for S Series Devices

When you self-calibrate your S Series device, no signal connections are necessary.
However, values generated on the analog output channels change during the
calibration process. If you have external circuitry connected to the analog output
channels that is sensitive to these changes, you should disconnect the circuitry before
beginning self-calibration.

When externally calibrating your S Series device, connect the signals as described
below. Set the reference voltage to the following:

• NI PCI/PXI 6143: between 3.0 V and 4.998 V

• NI PCI/PXI 6115: between 4.995 V and 5.005 V
• NI PCI/PXI 6120: between 4.995 V and 5.005 V
• All other S Series Devices: between 6.0 V and 9.998 V

Typically, you should use a calibrator or other stable voltage source for calibration. Do
not use a power supply as its signals are not very stable.

For external calibration, make the following signal connections:

1. Connect the positive output of your reference voltage source to ACH0+.

2. Connect the negative output of your reference voltage source to ACH0-.

© National Instruments 293

 NI-DAQmx Device Considerations

Device Calibration Signal Connections for M Series and NI 6010

Devices

When you self-calibrate your M Series or NI 6010 device, no signal connections are
necessary. However, values generated on the analog output channels change during
the calibration process. If you have external circuitry connected to the analog output
channels and you do not want changes on these channels, you should disconnect the
circuitry before beginning the self-calibration.

When externally calibrating your M Series or NI 6010 device, connect the signals as
described below for the type of device you are calibrating. Set the reference voltage
between +6.0 V and +8.5 V for M Series devices, between +3.5 V and 4.0 V for NI 6010
devices. Typically, you use a calibrator or other stable voltage source for the reference
voltage. Do not use a power supply as its signals are not very stable.

Follow these steps:

1. Disconnect any external connections or circuitry to your device.

2. Connect the positive output of your reference voltage source to physical channel
ai0.
3. Connect the negative output of your reference voltage source to physical channel
ai8.
4. If your reference voltage source and your computer are floating with respect to
each other, connect the negative output of your reference voltage source to the AI
GND terminal as well as to physical channel ai8.

Device Calibration Signal Connections for the NI 6154

When you self-calibrate your NI 6154 device, no signal connections are necessary.
However, values generated on the analog output channels change during the
calibration process.

When externally calibrating your NI 6154 device, connect the signals as described
below for the type of device you are calibrating. Set the reference voltage between +6.0
V and +9.998 V. Typically, you use a calibrator or other stable voltage source for the
reference voltage. Do not use a power supply as its signals are not very stable.

294 ni.com
 NI-DAQmx Device Considerations

Follow these steps:

1. Disconnect any external connections or circuitry to your device.

2. Connect the positive output of your reference voltage source to physical channel
AI0+.
3. Connect the negative output of your reference voltage source to physical channel
AI0-.

Device Calibration Signal Connections for NI 6614

For signal connections needed to externally calibrate your NI 6614, refer to the
calibration procedure for the NI 6614.

Device Calibration Signal Connections for X Series Devices

When you self-calibrate your X Series device, no signal connections are necessary.
However, values generated on the analog output channels change during the
calibration process. If you have external circuitry connected to the analog output
channels and you do not want changes on these channels, you should disconnect the
circuitry before beginning the self-calibration.

When externally calibrating (or adjusting) your X Series device, connect the signals as
described below for the type of device you are calibrating. Set the reference voltage
between +6.0 V and +8.5 V for X Series devices. You should use a calibrator or other
stable voltage source for the reference voltage. Do not use a power supply as its signals
are not very stable.

Follow these steps:

1. Disconnect any external connections or circuitry to your device.

2. Connect the positive output of your reference voltage source to physical channel
ai0.
3. Connect the negative output of your reference voltage source to physical channel
ai8.
4. If your reference voltage source and your computer are floating with respect to
each other, connect the negative output of your reference voltage source to the AI
GND terminal as well as to physical channel ai8.

© National Instruments 295

 NI-DAQmx Device Considerations

Counters
This section contains information on counter signal connections and routing diagrams
that illustrate the internal counter routing.

Averaging Support
The following devices support averaging digital frequency and period measurements:

• Parallel digital I/O modules connected to CompactDAQ chassis1, TestScale

chassis2, CompactDAQ controllers3, CompactRIO controllers4 and CompactRIO
Single-Board controllers5. Refer to Digital I/O Considerations for C Series
Devices.
• NI 661x devices
• X Series devices

Related concepts:

• Digital I/O Considerations for C Series and TestScale Devices

• Configuring a Time-Based Measurement in NI-DAQmx

C Series Counter Modules

The NI 9361 counter input module supports the following measurement types:

• Duty cycle
• Event counting
• Encoder position
• Frequency
• Period
• Pulse width

1. cDAQ-9171, 9174, 9178, 9179, 9181, 9184, 9185, 9188, 9188XT, 9189, and 9191
2. TS-15000 and TS-15010
3. cDAQ-9132, 9133, 9134, 9135, 9136, and 9137
4. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058
5. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638

296 ni.com
 NI-DAQmx Device Considerations

• Velocity

The NI 9361 has eight counters and supports adding multiple counter channels to the
same task. A single task can have different measurement types. Multiple counter
module channels can be added to the same task.

Note

• You cannot mix module and chassis counters in the same task.
• You cannot use the chassis counter through the counter module.
• You cannot create multiple counter tasks with a single NI 9361.
• You cannot have more than two NI 9361 with different timing/triggering
configuration in a single chassis.

Connecting Counter Signals

The default terminals used for counter measurements and generations vary from
device to device. Follow the links below for information specific to your device. To
override the default input terminal, set the DAQmx Channel Input Terminal attribute/
property for the measurement type. For instance, if you are counting edges, you would
use CI.CountEdges.Term. To override the default output terminal, set the DAQmx
Channel Output Terminal attribute/property to the desired value.

Related reference:

• AO Series, E Series, and S Series Signal Connections for Counters

• Bus-Powered M Series Signal Connections for Counters
• C Series and TestScale Module Signal Connections for Counters
• myDAQ Signal Connections for Counters
• NI ELVIS II Family Signal Connections for Counters
• TIO Signal Connections for Counters
• X Series Signal Connections for Counters
• 37-Pin DSUB Signal Connections for Counters
• 68-Pin M Series Signal Connections for Counters
• C Series Signal Connections for Counters

© National Instruments 297

 NI-DAQmx Device Considerations

Bus-Powered M Series Signal Connections for Counters

The following table lists the default input terminals for various counter measurements
on bus-powered M Series devices. You can use a different PFI line for any of the input
terminals. To change the PFI input for a measurement, use the NI-DAQmx channel
attributes/properties.

16-PFI Line Devices (NI 6218)

Edges: PFI 0 Count Edges: PFI 3 Count

Count Edges
Direction: PFI 9 Direction: PFI 10
Pulse Width Measurement PFI 1 PFI 2
Period/Frequency Measurement (Low
PFI 1 PFI 2
Frequency with One Counter)
Period/Frequency Measurement (High
PFI 0 PFI 3
Frequency with Two Counters)
Period/Frequency Measurement (Large Range
PFI 0 PFI 3
with Two Counters)
Semiperiod Measurement PFI 1 PFI 2

• Start: PFI 9 • Start: PFI 10

Two-Edge Separation Measurement
• Stop: PFI 1 • Stop: PFI 2

• A: PFI 0 • A: PFI 3
Position Measurement • B: PFI • B: PFI 10
• Z: PFI 1 • Z: PFI 2

The following table lists the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

Ctr0 Ctr1
PFI 4 PFI 5

298 ni.com
 NI-DAQmx Device Considerations

16-PFI Line Devices (NI 6212/6216)

Measurement Ctr0 Ctr1

• Edges: PFI 8 • Edges: PFI 3

Count Edges • Count Direction: • Count Direction:
PFI 10 PFI 11

Pulse Width Measurement PFI 9 PFI 4

Period/Frequency Measurement (Low Frequency with
PFI 9 PFI 4
One Counter)
Period/Frequency Measurement (High Frequency
PFI 8 PFI 3
with Two Counters)
Period/Frequency Measurement (Large Range with
PFI 8 PFI 3
Two Counters)
Semiperiod Measurement PFI 9 PFI 4

• Start: PFI 10 • Start: PFI 11

Two-Edge Separation Measurement
• Stop: PFI 9 • Stop: PFI 4

• A: PFI 8 • A: PFI 3
Position Measurement • B: PFI 10 • B: PFI 11
• Z: PFI 9 • Z: PFI 4

The following table lists the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

Ctr0 Ctr1
PFI 12 PFI 13

© National Instruments 299

 NI-DAQmx Device Considerations

8-PFI Line Devices (Such as the NI 6210/6211/6215)

Measurement Ctr0 Ctr1

• Edges: PFI 0 • Edges: PFI 3

Count Edges • Count • Count
Direction: PFI 0 Direction: PFI 3

Pulse Width Measurement PFI 1 PFI 2

Period/Frequency Measurement (Low Frequency with
PFI 1 PFI 2
One Counter)
Period/Frequency Measurement (High Frequency with
PFI 0 PFI 3
Two Counters)
Period/Frequency Measurement (Large Range with
PFI 0 PFI 3
Two Counters)
Semiperiod Measurement PFI 1 PFI 2

• Start: PFI 0 • Start: PFI 3

Two-Edge Separation Measurement
• Stop: PFI 1 • Stop: PFI 2

• A: PFI 0 • A: PFI 3
Position Measurement • B: PFI 1 • B: PFI 2
• Z: PFI 2 • Z: PFI 1

The following table lists the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

Ctr0 Ctr1
PFI 4 PFI 5

Related concepts:

• Self-Powered Compared to Bus-Powered USB Devices

• Self-Powered Versus Bus-Powered M Series USB Devices

300 ni.com
 NI-DAQmx Device Considerations

C Series and TestScale Module Signal Connections for Counters

The following tables lists the default input terminals for various counter
measurements. You can use a different PFI line for any of the input terminals. To
change the PFI input for a measurement, use the NI-DAQmx channel attributes/
properties.

For information about counters on CompactRIO Single-Board controllers, refer to the

Counter input and Output section in CompactRIO Single-Board Controller
Physical Channels.

NI 9401, NI 9421, NI 9422, NI 9423, NI 9436, NI 9437 (8-Channel), and

TS-15050 DIO P0

Measurement Ctr0 Ctr1 Ctr2 Ctr3

• Edges: • Edges: • Edges: • Edges:

PFI 0 PFI 4 PFI 3 PFI 7
Count Edges • Count • Count • Count • Count
Direction: Direction: Direction: Direction:
PFI 2 PFI 6 PFI 0 PFI 4

Pulse Width Measurement PFI 1 PFI 5 PFI 2 PFI 6

Period/Frequency Measurement
PFI 1 PFI 5 PFI 2 PFI 6
(Low Frequency with One Counter)
Period/Frequency Measurement
(High Frequency with Two PFI 0 PFI 4 PFI 3 PFI 7
Counters)
Period/Frequency Measurement
PFI 0 PFI 4 PFI 3 PFI 7
(Large Range with Two Counters)
Semiperiod Measurement PFI 1 PFI 5 PFI 2 PFI 6

• Start: PFI • Start: PFI • Start: PFI • Start: PFI

2 6 0 4
Two-Edge Separation Measurement
• Stop: PFI • Stop: PFI • Stop: PFI • Stop: PFI
1 5 2 6

© National Instruments 301

 NI-DAQmx Device Considerations

Measurement Ctr0 Ctr1 Ctr2 Ctr3

• A: PFI 0 • A: PFI 4 • A: PFI 3 • A: PFI 7

Position Measurement • B: PFI 2 • B: PFI 6 • B: PFI 0 • B: PFI 4
• Z: PFI 1 • Z: PFI 5 • Z: PFI 2 • Z: PFI 6

NI 9402 and NI 9435 (4-Channel)

Measurement Ctr0 Ctr1 Ctr2 Ctr3

• Edges: • Edges: • Edges: • Edges:

PFI 0 PFI 3 PFI 1 PFI 2
Count Edges • Count • Count • Count • Count
Direction: Direction: Direction: Direction:
PFI 2 PFI 1 PFI 0 PFI 3

Pulse Width Measurement PFI 1 PFI 2 PFI 3 PFI 0

Period/Frequency Measurement
PFI 1 PFI 2 PFI 3 PFI 0
(Low Frequency with One Counter)
Period/Frequency Measurement
(High Frequency with Two PFI 0 PFI 3 PFI 1 PFI 2
Counters)
Period/Frequency Measurement
PFI 0 PFI 3 PFI 1 PFI 2
(Large Range with Two Counters)
Semiperiod Measurement PFI 1 PFI 2 PFI 3 PFI 0

• Start: PFI • Start: PFI • Start: PFI • Start: PFI

2 1 0 3
Two-Edge Separation Measurement
• Stop: PFI • Stop: PFI • Stop: PFI • Stop: PFI
1 2 3 0

• A: PFI 0 • A: PFI 3 • A: PFI 1 • A: PFI 2

Position Measurement • B: PFI 2 • B: PFI 1 • B: PFI 0 • B: PFI 3
• Z: PFI 1 • Z: PFI 2 • Z: PFI 3 • Z: PFI 0

302 ni.com
 NI-DAQmx Device Considerations

NI 9411 (6-Channel)

Measurement Ctr0 Ctr1 Ctr2 Ctr3

• Edges: • Edges: • Edges: • Edges:

PFI 0 PFI 3 PFI 2 PFI 5
Count Edges • Count • Count • Count • Count
Direction: Direction: Direction: Direction:
PFI 2 PFI 5 PFI 1 PFI 4

Pulse Width Measurement PFI 1 PFI 4 PFI 0 PFI 3

Period/Frequency Measurement
PFI 1 PFI 4 PFI 0 PFI 3
(Low Frequency with One Counter)
Period/Frequency Measurement
(High Frequency with Two PFI 0 PFI 3 PFI 2 PFI 5
Counters)
Period/Frequency Measurement
PFI 0 PFI 3 PFI 2 PFI 5
(Large Range with Two Counters)
Semiperiod Measurement PFI 1 PFI 4 PFI 0 PFI 3

• Start: PFI • Start: PFI • Start: PFI • Start: PFI

2 5 1 4
Two-Edge Separation Measurement
• Stop: PFI • Stop: PFI • Stop: PFI • Stop: PFI
1 4 0 3

• A: PFI 0 • A: PFI 3 • A: PFI 2 • A: PFI 5

Position Measurement • B: PFI 2 • B: PFI 5 • B: PFI 1 • B: PFI 4
• Z: PFI 1 • Z: PFI 4 • Z: PFI 0 • Z: PFI 3

The following tables list the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

© National Instruments 303

 NI-DAQmx Device Considerations

NI 9401, NI 9472, NI 9474, NI 9475, NI 9485 (8-Channel), and TS-15050 DIO

P0

Ctr0 Ctr1 Ctr2 Ctr3 FreqOut

PFI 3 PFI 7 PFI 1 PFI 5 PFI 2

NI 9481, NI 9482, and NI 9402 (4-Channel)

Ctr0 Ctr1 Ctr2 Ctr3 FreqOut

PFI 0 PFI 3 PFI 1 PFI 2 PFI 1

NI 9361 (8-Counters)

Measurement Ctr0 Ctr1 Ctr2 Ctr3 Ctr4 Ctr5

• Edges: • Edges: • Edges: • Edges: • Edges: • Edges:

PFI 0 PFI 1 PFI 2 PFI 3 PFI 4 PFI 5
• Count • Count • Count • Count • Count • Count
Count Edges Direction: Direction: Direction: Direction: Direction: Direction:
PFI 7 PFI 6 PFI 5 PFI 4 PFI 3 PFI 2
• Reset: • Reset: • Reset: • Reset: • Reset: • Reset:
PFI4 PFI5 PFI6 PFI7 PFI0 PFI1

Duty Cycle
PFI 0 PFI 1 PFI 2 PFI 3 PFI 4 PFI 5
Measurement
Pulse Width
PFI 0 PFI 1 PFI 2 PFI 3 PFI 4 PFI 5
Measurement
Period/
Frequency
Measurement PFI 0 PFI 1 PFI 2 PFI 3 PFI 4 PFI 5
(Dynamic
Averaging)

• A: PFI 0 • A: PFI 1 • A: PFI 2 • A: PFI 3 • A: PFI 4 • A: PFI 5

Position
• B: PFI 4 • B: PFI 5 • B: PFI 6 • B: PFI 7 • B: PFI 0 • B: PFI 1
Measurement
• Z: PFI 7 • Z: PFI 6 • Z: PFI 5 • Z: PFI 4 • Z: PFI 3 • Z: PFI 2

304 ni.com
 NI-DAQmx Device Considerations

Measurement Ctr0 Ctr1 Ctr2 Ctr3 Ctr4 Ctr5

• A: PFI 0 • A: PFI 1 • A: PFI 2 • A: PFI 3 • A: PFI 4 • A: PFI 5

Velocity
• B: PFI 4 • B: PFI 5 • B: PFI 6 • B: PFI 7 • B: PFI 0 • B: PFI 1

Related concepts:

• CompactRIO Single-Board Controller Physical Channels

AO Series, E Series, and S Series Signal Connections for Counters

The following table lists the default input terminals for various counter measurements.
You can use a different PFI line for any of the input terminals, with the exception of the
count direction terminal for edge counting. To change the PFI input for a
measurement, use the NI-DAQmx channel attributes/properties.

Measurement Ctr0 Ctr1

• Edges: PFI 8 • Edges: PFI 3

Count Edges • Count Direction[1]6: • Count Direction[1]:
port0/line6 port0/line7

Pulse Width Measurement PFI 9 PFI 4

Period/Frequency Measurement (Low
PFI 9 PFI 4
Frequency with One Counter)
Period/Frequency Measurement (High
PFI 8 PFI 3
Frequency with Two Counters)
Period/Frequency Measurement (Large Range
PFI 8 PFI 3
with Two Counters)
Semiperiod Measurement PFI 9 PFI 4

The following table lists the default output terminals for counter output. You must use
the default output terminal, with the exception that for Ctr0, you can select a RTSI line.
6. The count direction terminal must be tristated to use an external signal. Reset the device to ensure
the terminal is tristated

© National Instruments 305

 NI-DAQmx Device Considerations

Ctr0 Ctr1
CTR 0 OUT CTR 1 OUT

myDAQ Signal Connections for Counters

The following table lists the default input terminals for various counter measurements
on myDAQ. You can use a different PFI line for any of the input terminals. To change
the PFI input for a measurement, use the NI-DAQmx channel attributes/properties.

Measurement Ctr0

• Edges: PFI 0
Count Edges
• Count Direction: PFI 2

Pulse Width Measurement PFI 1

Period/Frequency Measurement (Low Frequency with One Counter) PFI 1
Pulse Measurement PFI 1
Semiperiod Measurement PFI 1

• Start: PFI 2
Two-Edge Separation Measurement
• Stop: PFI 1

• A: PFI 0
Position Measurement • B: PFI 2
• Z: PFI 1

The following table lists the output terminals for counter output. You can use a
different PFI line for the output terminal.

Ctr0
PFI 3

306 ni.com
 NI-DAQmx Device Considerations

NI ELVIS II Family Signal Connections for Counters

The following table lists the default input terminals for various counter measurements.
You can use a different PFI line for any of the input terminals. To change the PFI input
for a measurement, use the NI-DAQmx channel attributes/properties.

Measurement Ctr0 Ctr1

• Edges: PFI 8 • Edges: PFI 3

Count Edges • Count Direction: • Count Direction:
PFI 10 PFI 11

Pulse Width Measurement PFI 9 PFI 4

Period/Frequency Measurement (Low Frequency with
PFI 9 PFI 4
One Counter)
Period/Frequency Measurement (High Frequency
PFI 8 PFI 3
with Two Counters)
Period/Frequency Measurement (Large Range with
PFI 8 PFI 3
Two Counters)
Semiperiod Measurement PFI 9 PFI 4

• Start: PFI 10 • Start: PFI 11

Two-Edge Separation Measurement
• Stop: PFI 9 • Stop: PFI 4

• A: PFI 8 • A: PFI 3
Position Measurement • B: PFI 10 • B: PFI 11
• Z: PFI 9 • Z: PFI 4

The following table lists the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

Ctr0 Ctr1
PFI 12 PFI 13

© National Instruments 307

 NI-DAQmx Device Considerations

NI mioDAQ Signal Connections for Counters

The following table lists the default input terminals for various counter measurements
on mioDAQ devices. You can use a different PFI line for any of the input terminals. To
change the PFI input for a measurement, use the NI-DAQmx channel attributes/
properties.

Measurement Ctr0 Ctr1 Ctr2 Ctr3

• Edges: • Edges: • Edges: • Edges:

PFI 0 PFI 1 PFI 2 PFI 3
Count Edges • Count • Count • Count • Count
Direction: Direction: Direction: Direction:
PFI 4 PFI 5 PFI 6 PFI 7

Pulse Width Measurement PFI 8 PFI 9 PFI 10 PFI 11

Period/Frequency Measurement
PFI 8 PFI 9 PFI 10 PFI 11
(Low Frequency with One Counter)
Period/Frequency Measurement
(High Frequency with Two PFI 0 PFI 1 PFI 2 PFI 3
Counters)
Period/Frequency Measurement
PFI 0 PFI 1 PFI 2 PFI 3
(Large Range with Two Counters)
Pulse Measurement PFI 8 PFI 9 PFI 10 PFI 11
Semiperiod Measurement PFI 8 PFI 9 PFI 10 PFI 11

• Start: PFI • Start: PFI • Start: PFI • Start: PFI

4 5 6 7
Two-Edge Separation Measurement
• Stop: PFI • Stop: PFI • Stop: PFI • Stop: PFI
8 9 10 11

• A: PFI 0 • A: PFI 1 • A: PFI 2 • A: PFI 3

Position Measurement • B: PFI 4 • B: PFI 5 • B: PFI 6 • B: PFI 7
• Z: PFI 8 • Z: PFI 9 • Z: PFI 10 • Z: PFI 11

308 ni.com
 NI-DAQmx Device Considerations

The following table lists the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

Ctr0 Ctr1 Ctr2 Ctr3 FreqOut

PFI 0 PFI 1 PFI 2 PFI 3 PFI 15

TIO Signal Connections for Counters

The following table lists the default input terminals for various counter measurements.
You can use a different PFI line for any of the input terminals. To change the PFI input
for a measurement, use the NI-DAQmx channel properties/attributes.

Note You cannot change the default PFI lines for quadrature encoder-based
position measurements on NI 660x devices.

Measurement Ctr0 Ctr1 Ctr2 Ctr3 Ctr4 Ctr5 Ctr6

• Edges: • Edges: • Edges: • Edges: • Edges: • Edges: • Edges:

PFI 39 PFI 35 PFI 31 PFI 27 PFI 23 PFI 19 PFI 15
Count Edges • Count • Count • Count • Count • Count • Count • Count
Direction: Direction: Direction: Direction: Direction: Direction: Directi
PFI 37 PFI 33 PFI 29 PFI 25 PFI 21 PFI 17 PFI 13

Pulse Width
PFI 38 PFI 34 PFI 30 PFI 26 PFI 22 PFI 18 PFI 14
Measurement
Period/
Frequency
Measurement
(Low PFI 38 PFI 34 PFI 30 PFI 26 PFI 22 PFI 18 PFI 14
Frequency
with One
Counter)
Period/
Frequency
Measurement
PFI 39 PFI 35 PFI 31 PFI 27 PFI 23 PFI 19 PFI 15
(High
Frequency
with Two

© National Instruments 309

 NI-DAQmx Device Considerations

Measurement Ctr0 Ctr1 Ctr2 Ctr3 Ctr4 Ctr5 Ctr6

Counters)
Period/
Frequency
Measurement
PFI 39 PFI 35 PFI 31 PFI 27 PFI 23 PFI 19 PFI 15
(Large Range
with Two
Counters)
Semiperiod
PFI 38 PFI 34 PFI 30 PFI 26 PFI 22 PFI 18 PFI 14
Measurement

• Start: PFI • Start: PFI • Start: PFI • Start: PFI • Start: PFI • Start: PFI • Start: P
Two-Edge
37 33 29 25 21 17 13
Separation
• Stop: PFI • Stop: PFI • Stop: PFI • Stop: PFI • Stop: PFI • Stop: PFI • Stop: P
Measurement
38 34 30 26 22 18 14

• A: PFI 39 • A: PFI 35 • A: PFI 31 • A: PFI 27 • A: PFI 23 • A: PFI 19 • A: PFI 1

Position
• B: PFI 37 • B: PFI 33 • B: PFI 29 • B: PFI 25 • B: PFI 21 • B: PFI 17 • B: PFI 1
Measurement
• Z: PFI 38 • Z: PFI 34 • Z: PFI 30 • Z: PFI 26 • Z: PFI 22 • Z: PFI 18 • Z: PFI 1

GPS
Timestamp N/A N/A N/A N/A N/A N/A N/A
Measurement

Note The NI 6601 has only four counters (ctr0-ctr3). The entries in the
previous table for cntr4, cntr5, cntr6, and cntr7 do not apply for that device.

The following table lists the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

Ctr0 Ctr1 Ctr2 Ctr3 Ctr4 Ctr5 Ctr6 Ctr7

PFI 36 PFI 32 PFI 28 PFI 24 PFI 20 PFI 16 PFI 12 PFI 8

Note The NI 6601 has only four counters (ctr0-ctr3). The entries in the

310 ni.com
 NI-DAQmx Device Considerations

previous table for cntr4, cntr5, cntr6, and cntr7 do not apply for that device.

NI 6624 Issues

The eight PFI lines listed as the defaults for counter output are dedicated for output,
and they are the only terminals you can use for counter output. For example, you can
use PFI 8 (the default for Ctr7) as the output terminal for any counter, but you cannot
use it as an input terminal.

When using counter output, if the Idle State attribute/property is low, the optocouplers
on the NI 6624 will still be driving your output load. Set the Idle State attribute/
property to high to prevent driving the output after your task completes.

X Series Signal Connections for Counters

The following table lists the default input terminals for various counter measurements
on X Series devices. You can use a different PFI line for any of the input terminals. To
change the PFI input for a measurement, use the NI-DAQmx channel attributes/
properties.

Measurement Ctr0 Ctr1 Ctr2 Ctr3

• Edges: • Edges: • Edges: • Edges:

PFI 8 PFI 3 PFI 0 PFI 5
Count Edges • Count • Count • Count • Count
Direction: Direction: Direction: Direction:
PFI 10 PFI 11 PFI 2 PFI 7

Pulse Width Measurement PFI 9 PFI 4 PFI 1 PFI 6

Period/Frequency Measurement
PFI 9 PFI 4 PFI 1 PFI 6
(Low Frequency with One Counter)
Period/Frequency Measurement
(High Frequency with Two PFI 8 PFI 3 PFI 0 PFI 5
Counters)
Period/Frequency Measurement
PFI 8 PFI 3 PFI 0 PFI 5
(Large Range with Two Counters)

© National Instruments 311

 NI-DAQmx Device Considerations

Measurement Ctr0 Ctr1 Ctr2 Ctr3

Pulse Measurement PFI 9 PFI 4 PFI 1 PFI 6
Semiperiod Measurement PFI 9 PFI 4 PFI 1 PFI 6

• Start: PFI • Start: PFI • Start: PFI • Start: PFI

10 11 2 7
Two-Edge Separation Measurement
• Stop: PFI • Stop: PFI • Stop: PFI • Stop: PFI
9 4 1 6

• A: PFI 8 • A: PFI 3 • A: PFI 0 • A: PFI 5

Position Measurement • B: PFI 10 • B: PFI 11 • B: PFI 2 • B: PFI 7
• Z: PFI 9 • Z: PFI 4 • Z: PFI 1 • Z: PFI 6

The following table lists the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

Ctr0 Ctr1 Ctr2 Ctr3

PFI 12 PFI 13 PFI 14 PFI 15

37-Pin DSUB Signal Connections for Counters

The following table lists the default input terminals for various counter measurements
for devices that use the 37-Pin DSUB connector such as the NI 6010, NI 6154, and NI
623x. You can use a different PFI line for any of the input terminals. To change the PFI
input for a measurement, use the NI-DAQmx channel attributes/properties.

Measurement Ctr0 Ctr1

• Edges: PFI 0 • Edges: PFI 3

Count Edges • Count • Count
Direction: PFI 2 Direction: PFI 5

Pulse Width Measurement PFI 1 PFI 4

312 ni.com
 NI-DAQmx Device Considerations

Measurement Ctr0 Ctr1

Period/Frequency Measurement (Low Frequency with
PFI 1 PFI 4
One Counter)
Period/Frequency Measurement (High Frequency with
PFI 0 PFI 3
Two Counters)
Period/Frequency Measurement (Large Range with
PFI 0 PFI 3
Two Counters)
Semiperiod Measurement PFI 1 PFI 4

• Start: PFI 2 • Start: PFI 5

Two-Edge Separation Measurement
• Stop: PFI 1 • Stop: PFI 4

The following table lists the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

Ctr0 Ctr1
PFI 6 PFI 7

68-Pin M Series Signal Connections for Counters

The following table lists the default input terminals for various counter measurements
on M Series devices, including M Series USB devices, such as the NI USB 6259 screw
terminal and NI USB-6229 BNC devices. You can use a different PFI line for any of the
input terminals. To change the PFI input for a measurement, use the NI-DAQmx
channel attributes/properties.

Measurement Ctr0 Ctr1

• Edges: PFI 8 • Edges: PFI 3

Count Edges • Count Direction: • Count Direction:
PFI 10 PFI 11

Pulse Width Measurement PFI 9 PFI 4

© National Instruments 313

 NI-DAQmx Device Considerations

Measurement Ctr0 Ctr1

Period/Frequency Measurement (Low Frequency with
PFI 9 PFI 4
One Counter)
Period/Frequency Measurement (High Frequency
PFI 8 PFI 3
with Two Counters)
Period/Frequency Measurement (Large Range with
PFI 8 PFI 3
Two Counters)
Semiperiod Measurement PFI 9 PFI 4

• Start: PFI 10 • Start: PFI 11

Two-Edge Separation Measurement
• Stop: PFI 9 • Stop: PFI 4

• A: PFI 8 • A: PFI 3
Position Measurement • B: PFI 10 • B: PFI 11
• Z: PFI 9 • Z: PFI 4

The following table lists the output terminals for counter output. You can use a
different PFI line for any of the output terminals.

Ctr0 Ctr1
PFI 12 PFI 13

Some M Series devices, including the NI 6010, NI 6154, NI 6221 (37-pin), and NI 623x,
use the 37-pin DSUB connector. These devices have different counter terminal
defaults. Refer to the 37-Pin DSUB Signal Connections for Counters for the
default input terminals on these devices. Bus-powered M Series devices, such as the NI
USB-621x devices, also have different counter terminal defaults. Refer to the Bus-
Powered M Series Signal Connections for Counters for the default input
terminals on these devices.

Related reference:

• 37-Pin DSUB Signal Connections for Counters

• Bus-Powered M Series Signal Connections for Counters

314 ni.com
 NI-DAQmx Device Considerations

Counter Internal Routing Diagrams

This section contains routing diagrams that illustrate the internal counter routing for
AO Series, C Series with CompactDAQ chassis, E Series, M Series, S Series, TIO, X Series,
and TestScale devices.

Related concepts:

• AO Series, E Series, S Series Counter Internal Routing Diagram

• Counter Internal Routing Diagrams for C Series Devices with NI cDAQ-91xx Chassis
and TestScale Modules with TestScale Chassis
• NI 661x Counter Internal Routing Diagram
• X Series Counter Internal Routing Diagram

AO Series, E Series, S Series Counter Internal Routing Diagram

The following figure shows the internal routing for DAQ devices with the STC counter/
timer such as E Series devices. The black circles represent terminals.

PFI, RTSI
20 MHz, 100 kHz Ctr 0
Timebase Pulsed Ctr0OutputPulse Ctr0InternalOutput
Ctr0Source
Output
Ctr0Out
PFI, RTSI Toggled
Ctr0Gate
ai/Reference Trigger Output
ai/Start Trigger

Ctr 1
PFI, RTSI
Pulsed
20 MHz, 100 kHz Ctr1Source
Output
Timebase Ctr1OutputPulse
Ctr1Out
Toggled
Ctr1Gate Ctr1InternalOutput
Output
PFI, RTSI
ai/Reference Trigger
ai/Start Trigger

X Series Counter Internal Routing Diagram

The following figure shows the internal routing for DAQ devices with the STC III
counter/timer such as X Series devices. The black circles represent terminals.

© National Instruments 315

 NI-DAQmx Device Considerations

PFI 0-15, RTSI 0-7, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
100 MHz Timebase, PXI_CLK10, Star_Trigger, Ctr 0
DStar_A, DStar_B, di/ChangeDetectEvent, Analog_Trigger
Ctr0Source
Pulsed
Output
Ctr0OutputPulse
PFI 0-15, RTSI 0-7, Star_Trigger, DStar_A, DStar_B,
ai/di/Start Trigger, di/ChangeDetectEvent, Analog_Trigger, SampleClk
ai/ao/di/do/SampleClk, ai/ConvertClk, ai/Reference Trigger

di/ChangeDetectEvent, PFI 0-15, RTSI 0-7,

di/ai/ReferenceTrigger, Star_Trigger,
Ctr0Gate
ai/ao/di/do/StartTrigger, PairedCtrOutputPulse,
PairedCtrSource, Analog_Trigger, DStar_A, DStar_B
PFI
Toggled Ctr0InternalOutput
Ctr0Aux Output
PFI 0-15, RTSI 0-7, PairedCtrOutputPulse,
ctr0/Gate, aiReference Trigger, PairedCtrGate,
Star_Trigger, ai/StartTrigger, di/ChangeDetectEvent,
Analog_Trigger, PairedCtrSource

PFI 0-15, RTSI 0-7, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
100 MHz Timebase, PXI_CLK10, Star_Trigger, Ctr 1
DStar_A, DStar_B, di/ChangeDetectEvent, Analog_Trigger
Ctr1Source

PFI 0-15, RTSI 0-7, Star_Trigger, DStar_A, DStar_B,

ai/di/Start Trigger, di/ChangeDetectEvent, Analog_Trigger, SampleClk
ai/ao/di/do/SampleClk, ai/ConvertClk, ai/Reference Trigger

di/ChangeDetectEvent, PFI 0-15, RTSI 0-7,

di/ai/ReferenceTrigger, Star_Trigger, ai/ao/di/do/StartTrigger, Pulsed
Ctr1Gate Output
PairedCtrOutputPulse, PairedCtrSource, Ctr1OutputPulse
PFI
Analog_Trigger, DStar_A, DStar_B Toggled Ctr1InternalOutput
Output

Ctr1Aux
PFI 0-15, RTSI 0-7, PairedCtrOutputPulse,
ctr1/Gate, aiReference Trigger, PairedCtrGate,
Star_Trigger, ai/StartTrigger, di/ChangeDetectEvent,
Analog_Trigger, PairedCtrSource

PFI 0-15, RTSI 0-7, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
100 MHz Timebase, PXI_CLK10, Star_Trigger, Ctr 2
DStar_A, DStar_B, di/ChangeDetectEvent, Analog_Trigger
Ctr2Source
Pulsed
Output
PFI 0-15, RTSI 0-7, Star_Trigger, DStar_A, DStar_B, Ctr0OutputPulse
ai/di/Start Trigger, di/ChangeDetectEvent, Analog_Trigger, SampleClk
ai/ao/di/do/SampleClk, ai/ConvertClk, ai/Reference Trigger

di/ChangeDetectEvent, PFI 0-15, RTSI 0-7,

di/ai/ReferenceTrigger, Star_Trigger,
Ctr2Gate
ai/ao/di/do/StartTrigger, PairedCtrOutputPulse,
PairedCtrSource, Analog_Trigger, DStar_A, DStar_B
PFI
Toggled Ctr2InternalOutput
Ctr2Aux Output

PFI 0-15, RTSI 0-7, PairedCtrOutputPulse,

ctr2/Gate, aiReference Trigger, PairedCtrGate,
Star_Trigger, ai/StartTrigger, di/ChangeDetectEvent,
Analog_Trigger, PairedCtrSource

PFI 0-15, RTSI 0-7, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
100 MHz Timebase, PXI_CLK10, Star_Trigger, Ctr 3
DStar_A, DStar_B, di/ChangeDetectEvent, Analog_Trigger
Ctr3Source

PFI 0-15, RTSI 0-7, Star_Trigger, DStar_A, DStar_B,

ai/di/Start Trigger, di/ChangeDetectEvent, Analog_Trigger, SampleClk
ai/ao/di/do/SampleClk, ai/ConvertClk, ai/Reference Trigger

di/ChangeDetectEvent, PFI 0-15, RTSI 0-7,

di/ai/ReferenceTrigger, Star_Trigger, ai/ao/di/do/StartTrigger, Pulsed
Ctr3Gate Output
PairedCtrOutputPulse, PairedCtrSource, Ctr1OutputPulse
PFI
Analog_Trigger, DStar_A, DStar_B Toggled Ctr3InternalOutput
Output

Ctr3Aux
PFI 0-15, RTSI 0-7, PairedCtrOutputPulse,
ctr3/Gate, aiReference Trigger, PairedCtrGate,
Star_Trigger, ai/StartTrigger, di/ChangeDetectEvent,
Analog_Trigger, PairedCtrSource

316 ni.com
 NI-DAQmx Device Considerations

Counter Internal Routing Diagrams for C Series Devices with NI

cDAQ-91xx Chassis and TestScale Modules with TestScale Chassis

The following figure shows the internal routing for C Series devices used with a NI
cDAQ-91xx7 or TestScale modules connected to a TestScale chassis8. The figure shows
direct routes available. Indirect routes are available as well, but use extra internal
resources. The black circles represent terminals.

7. cDAQ-9132, 9133, 9134, 9135, 9136, 9137, 9171, 9174, 9178, 9179, 9181, 9184, 9185, 9188, 9188XT,
9189, and 9191
8. TS-15000 and TS-15010

© National Instruments 317

 NI-DAQmx Device Considerations

PFIs, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
80 MHz Timebase, di/ChangeDetectEvent, AnalogComparisonEvent Ctr 0

Ctr0Source
Pulsed
Output
Ctr0OutputPulse
ai/di/Start Trigger, PFIs,
di/ChangeDetectEvent, AnalogComparisonEvent, SampleClk
te0/te1/ai/ao/di/do/SampleClk, ai/Reference Trigger

di/ChangeDetectEvent, PFIs,
di/ai/ReferenceTrigger, ai/ao/di/do/StartTrigger,
Ctr0Gate
PairedCtrOutputPulse, PairedCtrSource,
AnalogComparisonEvent, te0/te1//SampleClk

Toggled Ctr0InternalOutput
Ctr0Aux Output
ctr0/Gate, ai/ReferenceTrigger, PFIs,
PairedCtrOutputPulse, te0/te1//SampleClock,
PairedCtrGate, ai/StartTrigger, di/ChangeDetectEvent,
AnalogComparisonEvent, PairedCtrSource

PFIs, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
80 MHz Timebase, di/ChangeDetectEvent, AnalogComparisonEvent Ctr 1

Ctr1Source

ai/di/Start Trigger, PFIs,

di/ChangeDetectEvent, AnalogComparisonEvent, SampleClk
te0/te1/ai/ao/di/do/SampleClk, ai/Reference Trigger

di/ChangeDetectEvent, PFIs,
di/ai/ReferenceTrigger, ai/ao/di/do/StartTrigger, Pulsed
Ctr1Gate Output
PairedCtrOutputPulse, PairedCtrSource, Ctr1OutputPulse
AnalogComparisonEvent, te0/te1//SampleClk Toggled Ctr1InternalOutput
Output

Ctr1Aux
ctr1/Gate, ai/ReferenceTrigger, PFIs,
PairedCtrOutputPulse, te0/te1//SampleClock,
PairedCtrGate, ai/StartTrigger, di/ChangeDetectEvent,
AnalogComparisonEvent, PairedCtrSource

PFIs, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
80 MHz Timebase, di/ChangeDetectEvent, AnalogComparisonEvent Ctr 2

Ctr0Source
Pulsed
Output
Ctr0OutputPulse
ai/di/Start Trigger, PFIs,
di/ChangeDetectEvent, AnalogComparisonEvent, SampleClk
te0/te1/ai/ao/di/do/SampleClk, ai/Reference Trigger

di/ChangeDetectEvent, PFIs,
di/ai/ReferenceTrigger, ai/ao/di/do/StartTrigger,
Ctr0Gate
PairedCtrOutputPulse, PairedCtrSource,
AnalogComparisonEvent, te0/te1//SampleClk

Toggled Ctr0InternalOutput
Ctr0Aux Output
ctr0/Gate, ai/ReferenceTrigger, PFIs,
PairedCtrOutputPulse, te0/te1//SampleClock,
PairedCtrGate, ai/StartTrigger, di/ChangeDetectEvent,
AnalogComparisonEvent, PairedCtrSource

PFIs, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
80 MHz Timebase, di/ChangeDetectEvent, AnalogComparisonEvent Ctr 3

Ctr1Source

ai/di/Start Trigger, PFIs,

di/ChangeDetectEvent, AnalogComparisonEvent, SampleClk
te0/te1/ai/ao/di/do/SampleClk, ai/Reference Trigger

di/ChangeDetectEvent, PFIs,
di/ai/ReferenceTrigger, ai/ao/di/do/StartTrigger, Pulsed
Ctr1Gate Output
PairedCtrOutputPulse, PairedCtrSource, Ctr1OutputPulse
AnalogComparisonEvent, te0/te1//SampleClk Toggled Ctr1InternalOutput
Output

Ctr1Aux
ctr1/Gate, ai/ReferenceTrigger, PFIs,
PairedCtrOutputPulse, te0/te1//SampleClock,
PairedCtrGate, ai/StartTrigger, di/ChangeDetectEvent,
AnalogComparisonEvent, PairedCtrSource

318 ni.com
 NI-DAQmx Device Considerations

NI 661x Counter Internal Routing Diagram

The following figure shows the internal routing for NI 661x devices. The black circles
represent terminals. These devices have eight counters which are paired together.
Only counters 0 and 1 are shown in the illustration, but the remaining pairs (counters 2
and 3, counters 4 and 5, and counters 6 and 7) are routed identically.

PFI 0-39, PXI_Trig/RTSI 0-7, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
100 MHz Timebase, PXI_CLK10, Star_Trigger, Ctr 0
DStar_A, DStar_B, di/ChangeDetectEvent
Ctr0Source
Pulsed
Output
Ctr0OutputPulse
PFI 0-39, PXI_Trig/RTSI 0-7, Star_Trigger, DStar_A, DStar_B,
SampleClk
di/Start Trigger, di/ChangeDetectEvent, di/do/SampleClk

di/ChangeDetectEvent, PFI 0-39, PXI_Trig/RTSI 0-7,

di/ReferenceTrigger, Star_Trigger, di/do/StartTrigger,
Ctr0Gate
PairedCtrOutputPulse, PairedCtrSource,
DStar_A, DStar_B
PFI
Toggled Ctr0InternalOutput
Ctr0Aux Output
PFI 0-39, PXI_Trig/RTSI 0-7,
PairedCtrOutputPulse, ctr0/Gate, PairedCtrGate,
Star_Trigger, di/ChangeDetectEvent,
PairedCtrSource

PFI 0-39, PXI_Trig/RTSI 0-7, 100 kHz Timebase,

PairedCtrOutputPulse, PairedCtrGate, 20 MHz Timebase,
100 MHz Timebase, PXI_CLK10, Star_Trigger, Ctr 1
DStar_A, DStar_B, di/ChangeDetectEvent
Ctr1Source

PFI 0-39, PXI_Trig/RTSI 0-7, Star_Trigger, DStar_A, DStar_B,

di/Start Trigger, di/ChangeDetectEvent, di/do/SampleClk SampleClk

di/ChangeDetectEvent, PFI 0-39, RTSI 0-7,

di/ReferenceTrigger, Star_Trigger, di/do/StartTrigger, Pulsed
Ctr1Gate Output
PairedCtrOutputPulse, PairedCtrSource, Ctr1OutputPulse
PFI
DStar_A, DStar_B Toggled Ctr1InternalOutput
Output

Ctr1Aux
PFI 0-39, PXI_Trig/RTSI 0-7,
PairedCtrOutputPulse, ctr1/Gate, PairedCtrGate,
Star_Trigger, di/ChangeDetectEvent,
PairedCtrSource

To see a complete list of available

counter input routes, use the
NI 661x routes in MAX.

Counter Input Error Reporting with C Series, M Series USB, and

NI ELVIS II Devices
With C Series, NI ELVIS II Family, and M Series USB devices (except bus-powered M
Series devices), buffered counter input error reporting occurs every 128 samples for
high-speed USB and every 16 samples for full-speed USB. When an error is detected,

© National Instruments 319

 NI-DAQmx Device Considerations

the task stops. To prevent the acquisition of incorrect samples, only data within either
the 128- or 16-sample group is reported. For instance, if you attempt to acquire 256
samples, and an error occurs after sample 250, the task returns 128 samples instead of
249. If you attempt to acquire a number of samples less than or equal to 128 or 16 and
an error occurs, the task returns no samples.

Related concepts:

• Self-Powered Compared to Bus-Powered USB Devices

• Self-Powered Versus Bus-Powered M Series USB Devices

Duplicate Count Prevention

Duplicate count prevention (or synchronous counting mode) ensures that a counter
returns correct data in applications that use a slow or non-periodic external source.
Duplicate count prevention applies to any counter application such as measuring
frequency or period. In such applications, the counter should store the number of
times an external Source pulses between rising edges on the Gate signal.

Example Application That Works Correctly (No Duplicate Counting)

The following figure shows a buffered period measurement that uses an external
signal as the Source.

Rising Edge
of Gate
Counter detects rising edge
of Gate on the next rising
edge of Source.
Gate

Source

Counter Value 6 7 1 2 1

Buffer 7 2
7

On the first rising edge of the Gate, the current count of 7 is stored. On the next rising
edge of the Gate, the counter stores a 2 since two Source pulses occurred after the
previous rising edge of Gate.

320 ni.com
 NI-DAQmx Device Considerations

The counter synchronizes or samples the Gate signal with the Source signal. So the
counter does not detect a rising edge in the Gate until the next Source pulse. In this
example, the counter stores the values in the buffer on the first rising Source edge after
the rising edge of Gate.

Example Application That Works Incorrectly (Duplicate Counting)

In the following figure, after the first rising edge of Gate, no Source pulses occur. So the
counter does not write the correct data to the buffer.

No Source edge, so no
value written to buffer.

Gate

Source

Counter Value 6 7 1

Buffer 7

Example Application That Prevents Duplicate Counting

With duplicate count prevention enabled, the counter synchronizes both the Source
and Gate signals to the maximum timebase. By synchronizing to the timebase, the
counter detects edges on the Gate even if the Source does not pulse. This enables the
correct current count to be stored in the buffer even if no Source edges occur in
between Gate signals. Refer to the following example.

Counter detects
rising Gate edge. Counter value
increments only
Gate one time for each
Source pulse.
Source

80 MHz Timebase

Counter Value 6 7 0 1

Buffer 7 0
7

Even if the Source pulses are long, the counter increments only once for each Source
pulse.

© National Instruments 321

 NI-DAQmx Device Considerations

Normally, the counter value and Counter n Internal Output signals change
synchronously to the Source signal. With duplicate count prevention, the counter
value and Counter n Internal Output signals change synchronously to the maximum
timebase.

When To Use Duplicate Count Prevention

You should use duplicate count prevention if the following conditions are true.

• You are making a counter measurement

• You are using an external signal (such as PFI x) as the counter Source
• The frequency of the external Source is 25% of your maximum timebase or less
• You can have counter value and output to change synchronously with the
maximum timebase

In all other cases, you should not use duplicate count prevention.

Enabling and Disabling Duplicate Count Prevention in NI-DAQmx

NI-DAQmx enables duplicate count prevention by default except in the following cases:

• The input terminal is an onboard timebase.

• Prescaling is enabled.
• The timing type is on demand.
• The CtrOutEvent.OutputTerm attribute/property is used in your application.

You can enable and disable duplicate count prevention in NI-DAQmx with the
CI.DupCountPrevention attribute/property.

Incomplete Sample Detection

When performing a buffered time measurement of a digital signal, the initial sample is
often invalid. The following devices detect such samples and discard them.

• Bus-powered M Series USB devices

• Parallel digital I/O modules connected to CompactDAQ chassis9, TestScale
chassis10, CompactDAQ controllers11, CompactRIO controllers12 and CompactRIO

9. cDAQ-9171, 9174, 9178, 9179, 9181, 9184, 9185, 9188, 9188XT, 9189, and 9191

322 ni.com
 NI-DAQmx Device Considerations

Single-Board controllers13. Refer to Digital I/O Considerations for C Series

Devices.
• NI 661x devices
• X Series devices

Related concepts:

• Configuring a Time-Based Measurement in NI-DAQmx

• Digital I/O Considerations for C Series and TestScale Devices

Prescaling
Prescaling allows the counter to count a signal that is faster than the maximum
timebase of the counter. The TIO counters offer 8X and 2X prescaling on each counter.
You can disable prescaling. Each prescaler consists of a small, simple counter that
counts to eight (or two) and rolls over. This counter is specifically designed for this
application and can count signals that are faster than the general purpose counters.
The CtrN source signal on the general purpose counter is the divided signal from the
simple counter.

Prescaling is for two-counter period and frequency measurements in which the

measurement is made on a continuous, repetitive signal. The prescaling counter
cannot be read; therefore, you cannot determine how many edges have occurred since
the previous roll-over. Prescaling can be also used for counting edges provided it is
acceptable to have an error of up to seven counts when using 8X prescaling or one
count when using 2X prescaling.

Pulse Measurement Support

The following devices support pulse measurements:

• Parallel digital I/O modules connected to CompactDAQ chassis14, TestScale

10. TS-15000 and TS-15010
11. cDAQ-9132, 9133, 9134, 9135, 9136, and 9137
12. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058
13. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638
14. cDAQ-9171, 9174, 9178, 9179, 9181, 9184, 9185, 9188, 9188XT, 9189, and 9191

© National Instruments 323

 NI-DAQmx Device Considerations

chassis15, CompactDAQ controllers16, CompactRIO controllers17 and CompactRIO

Single-Board controllers18. Refer to Digital I/O Considerations for C Series
Devices.
• NI 661x devices
• X Series devices

Related concepts:

• Pulse Measurement
• Configuring a Time-Based Measurement in NI-DAQmx
• Digital I/O Considerations for C Series and TestScale Devices

Sample Clock Timing Support for Time-Based Measurements

The following devices support Sample Clock timing for time-based measurements of
digital signals, such as frequency, period, and two-edge separation measurements.

• Bus-powered M Series USB devices

• Parallel digital I/O modules connected to CompactDAQ chassis19, TestScale
chassis20, CompactDAQ controllers21, CompactRIO controllers22 and CompactRIO
Single-Board controllers23. Refer to Digital I/O Considerations for C Series
Devices.
• PXIe-6612 and 6614 devices.
• PXIe-6738 and 6739 devices.
• X Series Devices

Note You cannot use Sample Clock timing for semi-period measurements on
15. TS-15000 and TS-15010
16. cDAQ-9132, 9133, 9134, 9135, 9136, and 9137
17. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058
18. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638
19. cDAQ-9171, 9174, 9178, 9179, 9181, 9184, 9185, 9188, 9188XT, 9189, and 9191
20. TS-15000 and TS-15010
21. cDAQ-9132, 9133, 9134, 9135, 9136, and 9137
22. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058
23. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638

324 ni.com
 NI-DAQmx Device Considerations

X Series devices.

Related concepts:

• Configuring a Time-Based Measurement in NI-DAQmx

• Digital I/O Considerations for C Series and TestScale Devices

Digital Filtering
Digital filtering rejects state transitions that do not stay at a state for a specified
amount of time. For example, for an edge counting measurement with digital filtering,
the device does not count an edge if the pulse width is not at least the specified time.
For digital input tasks, the device does not recognize that a signal changed from one
state to another unless the signal remains at that state for the specified amount of
time.

This section contains information about digital filtering for C Series, DIO, M Series, SC
Express, TIO, and X Series devices.

Digital Filtering Considerations for C Series Devices or or

TestScale Modules
For C Series devices or or TestScale Modules, you can filter digital I/O lines and digital
input signals.

Timing and Triggering Filters for Digital I/O Lines

You can configure digital filters on the device by choosing three fixed values (112.5 nS,
6.4 µS, 2.56 mS) or a custom filter value. The custom filter value must be the same for
all lines across the device. For example, if you choose a filter value of 2 µS for PFI 0, any
other filterable line on the device can only choose from the three fixed values and the 2
µs value selected for the custom filter. For each digital line or input terminal, there are
four attributes/properties associated with these digital filters: Digital Filter Enable,
Digital Filter Minimum Pulse Width, Digital Filter Timebase Source, and Digital Filter
Timebase Rate.

© National Instruments 325

 NI-DAQmx Device Considerations

When you set the Digital Filter Enable to true, you must also configure the Digital Filter
Minimum Pulse Width attribute/property. When you select a filter value with the Digital
Filter Minimum Pulse Width attribute/property, the device uses an internal 32-bit
utility counter to generate the desired filter value. If you would like to generate the
filter clock using your own external signal, you can use the Digital Filter Timebase
Source and Digital Filter Timebase Rate attributes/properties. You must configure both
to use an external signal as the source for the digital filter. The Digital Filter Minimum
Pulse Width attribute/property represents the minimum value that is guaranteed to be
passed into the device. The maximum pulse width guaranteed to be blocked by the
device is one filter clock tick smaller than the minimum pulse width guaranteed to
pass the filter.

The following table lists the attributes/properties for terminals that can be digitally
filtered.

Type Attribute/Property
Frequency Input Terminal
Period Input Terminal
Count Edges Input Terminal
Count Edges Count Direction
Position A Input Terminal
Position B Input Terminal
Position Z Input Terminal
Channel
Pulse Input Terminal (Time, Ticks, and Frequency)
Pulse Width Input Terminal
Two-Edge First Input Terminal
Two-Edge Second Input Terminal
Semi-Period Input Terminal
Counter Input Timebase Source (External Only)
Counter Output Timebase Source (External Only)
Timing Sample Clock Source
Triggering Arm Start Digital Edge Source

326 ni.com
 NI-DAQmx Device Considerations

Type Attribute/Property
Pause Analog Level Source
Pause Analog Window Source
Pause Digital Level Source
Reference Analog Edge Source
Reference Analog Window Source
Reference Digital Edge Source
Start Analog Edge Source
Start Analog Window Source
Start Digital Edge Source

Filters for Digital Input Signals

Filters are also available on digital input lines, such as cDAQ1Mod1/port0/line0, but
the filters do not support the fixed values mentioned previously or external timebase
sources. The minimum filter pulse width for digital input lines is 50 nS and can be set
in increments of 25 nS. All digital input lines on a module must use the same minimum
filter pulse width. The maximum pulse width guaranteed to be rejected by the filter is
half the pulse width guaranteed to pass the filter.

This filtering circuitry exists on the chassis and is available for all digital lines that exist
on parallel digital modules. With a parallel digital module, input or output data is
communicated in parallel between the module and the chassis backplane rather than
being communicated serially.

Parallel Digital Input Modules for C Series Devices and TestScale Modules

• NI 9344
• NI 9401
• NI 9402
• NI 9411
• NI 9421
• NI 9422
• NI 9423

© National Instruments 327

 NI-DAQmx Device Considerations

• NI 9435
• NI 9436
• NI 9437
• TS-15050 DIO P0

Note The NI 9361 also performs digital filtering, but its filtering is done on
the module rather than on the chassis. Refer to the NI 9361 Datasheet for
more information about its filtering capabilities.

Digital Filtering Considerations for DIO Devices

Digital filtering is enabled by default on all isolated DIO devices that support digital
filtering. The default minimum pulse width is 0.1 ms or 100 µs. Refer to the following
table for a list of devices and their digital filtering settings.

Digital Filtering Setting Devices

• PCI-6510
• PCI-6511
• PCI-6514
• PCI-6515
• PCI-6518
• PCI-6519
• PCI-6527
Digital Filtering Enabled by Default • PCI-6528
• PXI-6511
• PXI-6514
• PXI-6515
• PXI-6527
• PXI-6528
• PXI-6529
• USB-6525

• PCI-6509
• PCIe-6509
Digital Filtering Disabled by Default
• PXI-6509
• PXIe-6509

328 ni.com
 NI-DAQmx Device Considerations

Digital Filtering Setting Devices

• PCI-6503
• PCI-6512
• PCI-6513
• PCI-6516
• PCI-6517
Digital Filtering Not Supported
• PCI-DIO-96
• PXI-6508
• PXI-6512
• PXI-6513
• USB-6501

Digital Filtering Considerations for TIO-Based Devices

Note For digital filtering with NI 661x devices, refer to Digital Filtering
Considerations for X Series and NI 661x Devices.

There are two methods for filtering and synchronizing digital signals. One method is to
synchronize the input signal to the maximum onboard timebase on the device. To do
this, set Digital Synchronization Enable to true.

The other method is to pass the input of any PFI line through a digital debouncing
filter. Each PFI line can independently select from four fixed values (5 µs, 1 µs, 500 ns,
100 ns) and one custom filter value. The custom filter value must be the same for each
PFI line. That is, if you choose a filter value of 2 µs for a PFI line, other PFI lines on the
device at the same time can only choose from the four fixed values and the 2 µs value
selected as the custom filter value. For each counter input property, there are four
attributes/properties associated with digital debounce filtering: Digital Filter Enable,
Digital Filter Minimum Pulse Width, Digital Filter Timebase Source, and Digital Filter
Timebase Rate.

When you set the Digital Filter Enable to true, you must also configure the Digital Filter
Minimum Pulse Width attribute/property. This value represents the minimum value
that is guaranteed to pass into the TIO. The minimum pulse width guaranteed to be
blocked is one-half of the Digital Filter Minimum Pulse Width attribute/property. When

© National Instruments 329

 NI-DAQmx Device Considerations

you select a custom filter value with the Minimum Pulse Width attribute/property, NI-
DAQmx uses an internal 32-bit utility counter to generate the desired filter value. If you
would like to generate the filter clock using your own external signal, you can use the
Digital Filter Timebase Source and Digital Filter Timebase Rate attributes/properties.
You must configure both to use an external signal as the source for the digital filter.

You cannot set both Digital Filter Enable and Digital Synchronization Enable to true at
the same time. You can use only one of these digital filtering methods at a time.

The following table lists the counter input terminals that can be digitally filtered.

Type Attribute/Property
Frequency Input Terminal
Period Input Terminal
Count Edges Input Terminal
Count Edges Count Direction
Position A Input Terminal
Position B Input Terminal
Channel Position Z Input Terminal
Pulse Width Input Terminal
Two-Edge First Input Terminal
Two-Edge Second Input Terminal
Semi-Period Input Terminal
Counter Input Timebase Source
Counter Output Timebase Source
Timing Sample Clock Source
Start Trigger Source
Triggering Pause Trigger Source
Arm Start Trigger Source

330 ni.com
 NI-DAQmx Device Considerations

Digital Filtering Considerations for X Series and NI 661x

Devices
For X Series and NI 661x devices, you can filter digital I/O lines and input signals.

You can configure digital filters on the device by choosing three fixed values (90 nS,
5.12 µS, 2.56 mS). For each digital line or input terminal, there are four attributes/
properties associated with these digital filters: Digital Filter Enable, Digital Filter
Minimum Pulse Width, Digital Filter Timebase Source, and Digital Filter Timebase Rate.

When you set the Digital Filter Enable to true, you must also configure the Digital Filter
Minimum Pulse Width attribute/property. This value represents the minimum value
that is guaranteed to be passed into the device. The maximum pulse guaranteed to be
blocked by the device varies by digital line. Refer to your device documentation for
details. When you select a custom filter value with the Minimum Pulse Width attribute/
property, NI-DAQmx uses an internal 32-bit utility counter to generate the desired filter
value. If you would like to generate the filter clock using your own external signal, you
can use the Digital Filter Timebase Source and Digital Filter Timebase Rate attributes/
properties. You must configure both to use an external signal as the source for the
digital filter.

When using digital filtering on port 0, you can enable bus mode using the Enable Bus
Mode attribute/property. When enabled, the device observes changes to multiple lines
as a single change if these conditions are met:

• The skew between them is less than the minimum pulse width of the filter.
• The lines remain stable for an additional minimum pulse width of the filter.

When using any other signal on the device that supports filtering (excluding port 0),
you can select a custom filter value in addition to the three fixed values mentioned
previously. The custom filter value must be the same for all lines across the device. For
example, if you choose a filter value of 2 µS for PFI 0, any other filterable line on the
device can only choose from the three fixed values and the 2 µs value selected for the
custom filter.

The following table lists the attributes/properties for terminals that can be digitally
filtered.

© National Instruments 331

 NI-DAQmx Device Considerations

Type Attribute/Property
Digital Input Channel
Frequency Input Terminal
Period Input Terminal
Count Edges Input Terminal
Count Edges Count Direction
Position A Input Terminal
Position B Input Terminal
Channel Position Z Input Terminal
Pulse Input Terminal
Pulse Width Input Terminal
Two-Edge First Input Terminal
Two-Edge Second Input Terminal
Semi-Period Input Terminal
Counter Input Timebase Source
Counter Output Timebase Source
Sample Clock Source
Timing
AI Convert Clock Source
Arm Start Trigger Source
Pause Analog Level Source
Pause Analog Window Source
Pause Trigger Source
Reference Analog Edge Source
Triggering
Reference Analog Window Source
Reference Digital Edge Source
Start Analog Edge Source
Start Analog Window Source
Start Trigger Source

332 ni.com
 NI-DAQmx Device Considerations

Digital Filtering Considerations for SC Express Devices

For SC Express devices, you can filter timing/triggering input signals.

You can configure digital filters on the device by choosing three fixed values (90 ns,
5.12 µs, 2.56 ms). For each digital line or input terminal, there are four attributes/
properties associated with these digital filters: DI.DigFltr.Enable,
DI.DigFltr.MinPulseWidth, DI.DigFltr.TimebaseSrc, and DI.DigFltr.TimebaseRate.

When you set the DI.DigFltr.Enable to true, you must also configure the
DI.DigFltr.MinPulseWidth attribute/property. This value represents the minimum value
that is guaranteed to be passed into the device. When you select a custom filter value
with the DI.DigFltr.MinPulseWidth attribute/property, NI-DAQmx uses an internal 32-bit
utility counter to generate the desired filter value.

You can select a custom filter value in addition to the three fixed values mentioned
previously. The custom filter value must be the same for all lines across the device. For
example, if you choose a filter value of 2 µs for PFI 0, any other filterable line on the
device can only be set to one of the three fixed values or the 2 µs value selected for the
custom filter.

The following table lists the attributes/properties for terminals that can be digitally
filtered.

Type Attribute/Property
Timing Sample Clock Source (SampClk.Src)
Pause Digital Level Source (Pause.DigLvl.Src)
Reference Analog Edge Source (Ref.AnlgEdge.Src)
Triggering Reference Analog Window Source (Ref.AnlgWin.Src)
Reference Digital Edge Source (Ref.DigEdge.Src)
Start Digital Edge Source (Start.DigEdge.Src)

© National Instruments 333

 NI-DAQmx Device Considerations

FieldDAQ Filtering
The FD-11601, FD-11603, FD-11605, FD-11634, and FD-11637 can use filtering to
provide an accurate representation of in-band signals while rejecting out-of-band
signals. The filters discriminate between signals based on the frequency range, or
bandwidth, of the signal. Use the AI.Filter.Enable DAQmx Channel property to enable
or disable a filter. You can then specify the center or cutoff frequency (AI.Filter.Freq),
the filter order (AI.Filter.Order), and choose a Brickwall, Butterworth, or Comb filter
response (AI.Filter.Response). The filter selection applies to all channels on a bank.

Refer to your device user guide for additional information on filtering.

NI 9202, NI 9252, and NI 9253 Filtering

The NI 9202, NI 9252, and NI 9253 use a combination of analog and digital filtering to
provide an accurate representation of in-band signals while rejecting out-of-band
signals. The filters discriminate between signals based on the frequency range, or
bandwidth, of the signal. The filtering is always enabled and the filter configuration
applies to all channels on the module.

In NI-DAQmx, you can specify the center or cutoff frequency (AI.Filter.Freq), the filter
order (AI.Filter.Order), and choose a Comb filter response (AI.Filter.Response). The NI
9252/9253 also provide a Butterworth filter.

Refer to the hardware datasheets for additional details on filtering for these devices.

Digital I/O
This section contains information specific to DIO devices.

Change Detection
This section contains information about change detection for C Series, DIO, and M
Series devices.

Related concepts:

334 ni.com
 NI-DAQmx Device Considerations

• Change-Detection Considerations for C Series and M Series Devices

• Change Detection Considerations for NI 6527 Devices

Change Detection Considerations for NI 6527 Devices

The ChangeDetect.Overflowed attribute/property uses the change detection overflow

circuitry on a DIO device to determine if an overflow occurred. The NI 6527 change
detection overflow circuitry does not detect an overflow if a single rising edge and a
single falling edge are detected prior to reading a sample. It will detect overflows if two
rising edges or two falling edges occur prior to reading a sample.

Change-Detection Considerations for C Series and M Series Devices

When performing a buffered change-detection task with an M Series device or an NI

CompactDAQ system, the parallel digital input circuitry is automatically reserved and
used for the task. Non-buffered tasks, including hardware-timed single point, do not
reserve or use the parallel digital input circuitry.

Digital I/O Considerations for C Series and TestScale Devices

Digital I/O module capabilities depend on the type of digital signals that the module
can measure or generate and the chassis the module is used in.

Serial digital I/O modules: NI 9375, NI 9403, NI 9425, NI 9426, NI 9476, NI 9477, NI 9478,
TS-15120, and TS-15130.

Parallel digital I/O modules: NI 9344, NI 9401, NI 9402, NI 9411, NI 9421, NI 9422, NI
9423, NI 9435, NI 9436, NI 9437, NI 9472, NI 9474, NI 9475, NI 9481, NI 9482, NI 9485, and
TS-15050 DIO P0.

Onboard parallel digital I/O modules on sbRIO-9628 and 9638: DIO 0-3, DIO 4-11, DIO
12-19, and DIO 20-27.

The modules can perform the following tasks.

Serial and parallel modules:

© National Instruments 335

 NI-DAQmx Device Considerations

• Software and hardware-timed digital input/output tasks24

Parallel modules:

• Counter/timer tasks
• Accessing PFI signal tasks (can be used in up to two slots)

Related concepts:

• Software-Timed Tasks

Sample Clock Timing for Digital I/O

You can use sample clock timing for digital I/O on the following devices. 25
AO Series 1

• NI 673x

CompactDAQ

• cDAQ-9132
• cDAQ-9133
• cDAQ-9134
• cDAQ-9135
• cDAQ-9136
• cDAQ-9137
• cDAQ-9138/9139
• cDAQ-9171
• cDAQ-9174
• cDAQ-9178

24. Timed digital input/output restrictions:

◦ You cannot use parallel and serial modules together on the same hardware timed task, unless
they are in separate cDAQ chassis using multichassis device tasks.
◦ You cannot use serial modules for triggering.
◦ You cannot do both static and timed tasks at the same time on a single serial module.
◦ You can only do hardware timing in one direction at a time on a serial module.
25. There is no dedicated onboard sample clock for digital I/O on these devices. You must use a different
clock, typically the AI or AO Sample Clock.

336 ni.com
 NI-DAQmx Device Considerations

• cDAQ-9179
• cDAQ-9181
• cDAQ-9184
• cDAQ-9185
• cDAQ-9188
• cDAQ-9188XT
• cDAQ-9189
• cDAQ-9191

CompactRIO

• cRIO-9040
• cRIO-9041
• cRIO-9042
• cRIO-9043
• cRIO-9045
• cRIO-9046
• cRIO-9047
• cRIO-9048
• cRIO-9049
• cRIO-9053
• cRIO-9054
• cRIO-9055
• cRIO-9056
• cRIO-9057
• cRIO-9058
• sbRIO-9603
• sbRIO-9608
• sbRIO-9609
• sbRIO-9628
• sbRIO-9629
• sbRIO-9638

M Series 1

• NI 622x
• NI 625x
• NI 628x

© National Instruments 337

 NI-DAQmx Device Considerations

S Series 1

• NI 6115
• NI 6120
• NI 6132
• NI 6133

NI 653x

• PCI-6533 (DIO-32HS)
• PXI-6533
• PCI-6534
• PXI-6534
• PCIe-6535
• PXIe-6535
• PCIe-6536
• PXIe-6536
• PCIe-6537
• PXIe-6537

NI 661x Devices

• NI 6612
• NI 6614

X Series Devices

All X Series devices support sample clock timing for digital I/O.

Related concepts:

• Digital I/O Considerations for C Series and TestScale Devices

• Digital I/O Considerations for C Series Devices

Handshake Timing Devices

You can use handshake timing for digital I/O on the following devices:

338 ni.com
 NI-DAQmx Device Considerations

• PCI-6025E
• PCI-6533 (DIO-32HS)
• PCI-6534
• PCI-DIO-24
• PCI-DIO-96
• PCIe-6535
• PCIe-6536
• PCIe-6537
• PXI-6025E
• PXI-6508
• PXI-6533
• PXI-6534
• PXIe-6535
• PXIe-6536
• PXIe-6537

Burst Handshaking Timing Defaults for NI 653x Devices

The following table lists the default terminals used for burst handshake timing.

Note The NI 6533 and NI 6534 have two timing engines, Timing Engine 1 and
Timing Engine 0. Each timing engine is associated with PFI lines. The timing
engine you use is determined by the digital lines you use. If the least
significant port is Port 0, NI-DAQmx picks Timing Engine 0. If the least
significant port is Port 2, NI-DAQmx picks Timing Engine 1.

Ready for Transfer Event

Device Pause Trigger Default
Default
PCI-6533 (DIO-32HS), PXI-6533, PFI 2 (Timing Engine 0), PFI PFI 6 (Timing Engine 0), PFI
PCI-6534, PXI-6534 3 (Timing Engine 1) 7 (Timing Engine 1)
PCIe-6535, PXIe-6535, PCIe-6536,
PFI 0 PFI 1
PXIe-6536, PCIe-6537, PXIe-6537

The recommended sample clock terminal for burst handshake timing is PFI 4 (Timing
Engine 0) or PFI 5 (Timing Engine 1).

© National Instruments 339

 NI-DAQmx Device Considerations

Burst Handshake Timing for Digital I/O

You can use burst handshake timing for digital I/O on the following devices:

• PCI-6533 (DIO-32HS)
• PCI-6534
• PCIe-6535
• PCIe-6536
• PCIe-6537
• PXI-6533
• PXI-6534
• PXIe-6535
• PXIe-6536
• PXIe-6537

Handshaking Line Configuration

NI 6533/6534 devices have two timing engines, each of which use a set of default lines
for handshaking and burst handshaking. You can specify a different timing engine to
use the handshaking lines associates with that timing engine.

Related concepts:

• NI 6533, 6534 Timing Engines

• Handshake Timing Defaults
• Burst Handshaking Timing Defaults for NI 653x Devices

Handshake Timing Defaults

The following table lists the default terminals used for handshake timing for NI 653x
devices.

Note The NI 6533 and NI 6534 have two timing engines, Timing Engine 1 and
Timing Engine 0. Each timing engine is associated with PFI lines. The timing
engine you use is determined by the digital lines you use. If the least
significant port is Port 0, NI-DAQmx picks Timing Engine 0. If the least

340 ni.com
 NI-DAQmx Device Considerations

significant port is Port 2, NI-DAQmx picks Timing Engine 1.

Handshake Trigger Source Handshake Event Output

Device
Terminal Default Terminal Default
PCI-6533 (DIO-32HS), PXI-6533, PFI 2 (Timing Engine 0), PFI PFI 6 (Timing Engine 0), PFI
PCI-6534, PXI-6534 3 (Timing Engine 1) 7 (Timing Engine 1)
PCIe-6535, PXIe-6535, PCIe-6536,
PFI 0 PFI 1
PXIe-6536, PCIe-6537, PXIe-6537

The recommended sample clock terminal for burst handshake timing is PFI 4 (Timing
Engine 0) or PFI 5 (Timing Engine 1).

Watchdog Timers
Watchdog timers are a hardware feature that you can use to detect a failure in the
software controlling the device. Software failures could include a system crash or a
loop rate that is slower than you intend. To use a watchdog timer, you must use a
watchdog timer task. When you create a watchdog timer task, you specify the timeout
value for the watchdog timer and a set of expiration states for output physical
channels on the device. The channels go to those expiration states if the watchdog
timer expires. In addition, you cannot perform any actions with the task until you reset
it.

Your application must continuously reset the watchdog timer to prevent it from
expiring. For example, if you have a digital I/O application, and you expect a loop in the
application to acquire and analyze data 10 times per second, you should set the
watchdog timer to expire in 100 ms and reset the timer inside the digital I/O loop. If the
loop does not execute once every 100 ms, the watchdog timer expires and the device
goes into the expired state. You must then clear the expiration or reset the device.

Also, you can use the Expiration Trigger to cause the watchdog timer to expire. Set the
timeout of the watchdog timer task to -1 to disable expiration due to timeout if you
want the Expiration Trigger to be the only mechanism to cause expiration.

Note For X Series devices, PFI lines used for routing either by the Connect

© National Instruments 341

 NI-DAQmx Device Considerations

Terminals function/VI or by a task and also guarded by a watchdog timer will

go to their assigned safe states if the watchdog timer expires. The routes or
tasks using the PFI lines will not necessarily be notified of the expiration.

Note For the NI 9260, all channels on a watchdog task must use the same
expiration state. If the expiration state is set to Voltage, you can specify
different voltage levels for each channel. If the expiration state is set to No
Change, the channels revert to their idle output behavior on expiration.

Pause Triggering
This section contains information about Pause Triggering for AO Series, DSA, E Series,
M Series, S Series, SC Express, and TIO devices.

Pause Trigger Considerations for AO Series Devices

The source of your sample clock can affect when your generation resumes after the
deassertion of a Pause Trigger.

Analog Output

When you generate analog output signals, the generation pauses as soon as the Pause
Trigger is asserted. If the source of your sample clock is the onboard clock, the
generation resumes as soon as the Pause Trigger is deasserted. The NI 6733 and NI
6251 behave as if an external clock is being used, even if the source of the sample clock
is the onboard clock. For these devices, the generation resumes as soon as the Pause
Trigger is deasserted and another edge of the sample clock is received.

Pause Trigger

Sample Clock

If you are using any signal other than the onboard clock as the source of your sample
clock, the generation resumes as soon as the Pause Trigger is deasserted and another
edge of the sample clock is received, as shown in the following figure.

342 ni.com
 NI-DAQmx Device Considerations

Pause Trigger

Sample Clock

Counters

Continuous pulse-train generation: The pulse-train generation pauses as soon as the

Pause Trigger is asserted, not at the end of a pulse. The pulse train resumes after the
Pause Trigger is deasserted. A Pause Trigger elongates either the high or low pulse
depending on which one was being generated at the time the Pause Trigger was
asserted.

Pause Trigger

Pulse Train

Nonbuffered edge counting: The counter stops counting edges as soon as the Pause
Trigger is asserted and resumes counting edges after the Pause Trigger is deasserted.

Pause Trigger

Counter Source

Counter Value 1 2 3 4 5

Pause Trigger Considerations for C Series Devices

The source of your sample clock often can affect when your acquisition or generation
pauses and resumes with the assertion and deassertion of a Pause Trigger.

Counter Input for the NI 9361

When you acquire counter input signals, the acquisition pauses as soon as Pause
Trigger is asserted. If the source of your sample clock is the onboard clock, the
acquisition resumes after the Pause Trigger is deasserted, and the leftover period (A)
elapses. The leftover period is the unknown time in the sample clock period in which
the pause trigger occurred. In the following image, T represents the signal period and
A represents the unknown time between the clock pulse and the pause trigger.

© National Instruments 343

 NI-DAQmx Device Considerations

A
T T–A

Sample Clock

Pause Trigger

If you are using any signal other than the onboard clock as the source of your sample
clock, the acquisition resumes as soon as the Pause Trigger is deasserted and another
edge of the sample clock is received as shown in the following figure.

Pause Trigger

Sample Clock

To pause an edge counting task, use the CountEdges.Gate attributes/properties.

Counter Gate

Counter Source

Counter Value 1 2 3 4 5

Pause Trigger Considerations for DSA Devices

DSA devices do not support Pause Triggering.

Pause Trigger Considerations for E Series and M Series Devices

The source of your sample clock often can affect when your acquisition or generation
pauses and resumes with the assertion and deassertion of a Pause Trigger.

Analog Input

When you measure analog input signals and the Pause Trigger is asserted, the current
sample across all channels finishes before pausing. For instance, if you are sampling
four channels and the second channel is being sampled at the time the Pause Trigger is
asserted, the second, third, and fourth channels complete their sample before the
acquisition pauses. If you are using the onboard clock as the source of your sample
clock, the acquisition resumes as soon as the Pause Trigger is deasserted.

344 ni.com
 NI-DAQmx Device Considerations

Pause Trigger

Sample Clock

Convert Clock

If you are using any signal other than the onboard clock as the source of your sample
clock, the acquisition resumes as soon as the Pause Trigger is deasserted and another
edge of the sample clock is received as shown in the following figure.

Pause Trigger

Sample Clock

Convert Clock

Analog Output

When you generate analog output signals, the generation pauses as soon as the Pause
Trigger is asserted. If the source of your sample clock is the onboard clock, the
generation resumes as soon as the Pause Trigger is deasserted.

Pause Trigger

Sample Clock

If you are using any signal other than the onboard clock as the source of your sample
clock, the generation resumes as soon as the Pause Trigger is deasserted and another
edge of the sample clock is received as shown in the following figure.

Pause Trigger

Sample Clock

Counters

Continuous pulse-train generation: The pulse-train generation pauses as soon as the

Pause Trigger is asserted, not at the end of a pulse. The pulse train resumes after the
Pause Trigger is deasserted. A Pause Trigger elongates either the high or low pulse
depending on which one was being generated at the time the Pause Trigger was
asserted.

© National Instruments 345

 NI-DAQmx Device Considerations

Pause Trigger

Pulse Train

Nonbuffered edge counting: The counter stops counting edges as soon as the Pause
Trigger is asserted and resumes counting edges after the Pause Trigger is deasserted.

Pause Trigger

Counter Source

Counter Value 1 2 3 4 5

Pause Trigger Considerations for S Series Devices

The source of your sample clock often can affect when your acquisition or generation
pauses and resumes with the assertion and deassertion of a Pause Trigger.

Analog Input and Analog Output

When you generate analog output signals or acquire analog input signals, the
generation/acquisition pauses as soon as the Pause Trigger is asserted. If the source of
your sample clock is the onboard clock, the generation/acquisition resumes as soon as
the Pause Trigger is deasserted.

Pause Trigger

Sample Clock

If you are using any signal other than the onboard clock as the source of your sample
clock, the generation/acquisition resumes as soon as the Pause Trigger is deasserted
and another edge of the sample clock is received as shown in the following figure.

Pause Trigger

Sample Clock

Pause triggers also require special consideration when used on a device with a
pipelined ADC. See Timing Considerations for S Series for how pipelined ADCs

346 ni.com
 NI-DAQmx Device Considerations

and Pause Triggers can affect your measurement.

Related concepts:

• Timing Considerations for S Series

Counters

Continuous pulse-train generation: The pulse-train generation pauses as soon as the

Pause Trigger is asserted, not at the end of a pulse. The pulse train resumes after the
Pause Trigger is deasserted. A Pause Trigger elongates either the high or low pulse
depending on which one was being generated at the time the Pause Trigger was
asserted.

Pause Trigger

Pulse Train

Nonbuffered edge counting: The counter stops counting edges as soon as the Pause
Trigger is asserted and resumes counting edges after the Pause Trigger is deasserted.

Pause Trigger

Counter Source

Counter Value 1 2 3 4 5

Note The NI 6154 does not support pause triggering.

Pause Trigger Considerations for TIO Devices

Counters

Nonbuffered Edge Counting

The counter stops counting edges as soon as the Pause Trigger is asserted and
resumes counting edges after the Pause Trigger is deasserted.

© National Instruments 347

 NI-DAQmx Device Considerations

Pause Trigger

Counter Source

Counter Value 1 2 3 4 5

Continuous Pulse-Train Generation

The pulse-train generation pauses as soon as the Pause Trigger is asserted, not at the
end of a pulse. The pulse train resumes after the Pause Trigger is deasserted. A Pause
Trigger elongates either the high or low pulse depending on which one was being
generated at the time the Pause Trigger was asserted.

Pause Trigger

Pulse Train

Pause Trigger Considerations for SC Express Devices

Note NI 433x devices and the NI 4340 do not support pause triggering.

The source of your sample clock often can affect when your acquisition pauses and
resumes with the assertion and deassertion of a Pause Trigger.

Analog Input and Analog Output for Simultaneous Sampling SC Express

Devices

When you generate analog output signals or acquire analog input signals on a
simultaneous sampling SC Express device, such as the NI 4322 or NI 4300, the
generation/acquisition pauses as soon as the Pause Trigger is asserted. If the source of
your sample clock is the onboard clock, the generation/acquisition resumes as soon as
the Pause Trigger is deasserted.

Pause Trigger

Sample Clock

If you are using any signal other than the onboard clock as the source of your sample
clock, the generation/acquisition resumes as soon as the Pause Trigger is deasserted

348 ni.com
 NI-DAQmx Device Considerations

and another edge of the sample clock is received, as shown in the following figure.

Pause Trigger

Sample Clock

Analog Input for the NI 4353

The NI 4353 has three ADCs. There is ADC0, which is for the even analog input channels
(for instance, ai4, ai6, and ai10), ADC1, which is for the odd analog input channels (for
instance, ai1, ai3, and ai5), and ADC2, which is for the cold-junction compensation
channels.

If the Pause Trigger is asserted, and you sample from multiple cold-junction
compensation channels, multiple odd-numbered analog input channels, or multiple
even-numbered analog output channels, the current sample across all channels
finishes before pausing. For instance, if you are sampling eight channels, ai0:7, and ai4
is being sampled when the Pause Trigger is asserted, the remaining four channels
complete their sample before the acquisition pauses. If you are using the onboard
clock as the source of your sample clock, the acquisition resumes as soon as the Pause
Trigger is deasserted.

Pause Trigger

Sample Clock

ADC0 (Convert Clk for Even Channels)

ADC1 (Convert Clk for Odd Channels)

If you are using any signal other than the onboard clock as the source of your sample
clock, the acquisition resumes as soon as the Pause Trigger is deasserted and another
edge of the sample clock is received, as shown in the following figure.

Pause Trigger

Sample Clock

ADC0 (Convert Clk for Even Channels)

ADC1 (Convert Clk for Odd Channels)

© National Instruments 349

 NI-DAQmx Device Considerations

Analog Input for the NI 4357

The NI 4357 has five ADCs. The ADCs are staggered in the following ways:

• ADC0 maps to the analog input channels ai0, ai5, ai10, ai15
• ADC1 maps to the analog input channels ai1, ai6, ai11, ai16
• ADC2 maps to the analog input channels ai2, ai7, ai12, ai17
• ADC3 maps to the analog input channels ai3, ai8, ai13, ai18
• ADC4 maps to the analog input channels ai4, ai9, ai14, ai19

If the Pause Trigger is asserted, and you sample from multiple channels on the same
ADC, the current sample across all channels finishes before pausing. For instance, if
you are sampling eight channels, ai0:7, and ai4 is being sampled when the Pause
Trigger is asserted, the remaining four channels complete their sample before the
acquisition pauses. If you are using the onboard clock as the source of your sample
clock, the acquisition resumes as soon as the Pause Trigger is deasserted.

Pause Trigger

Sample Clock

ADC0

ADC1

If you are using any signal other than the onboard clock as the source of your sample
clock, the acquisition resumes as soon as the Pause Trigger is deasserted and another
edge of the sample clock is received, as shown in the following figure.

Pause Trigger

Sample Clock

ADC0

ADC1

Physical Channels
This section contains information about physical channels for AO Series, bus-powered
M Series, C Series, E Series, M Series, NI 6010, NI 6154, NI 6221 (37-pin), NI 623x, NI
6533/6534, NI 6535/6536/6537, NI ELVIS II Family, S Series, SC Express, SCXI, SCC, TIO,
USB DAQ, and X Series devices.

350 ni.com
 NI-DAQmx Device Considerations

AO Series Physical Channels

Dev1 in physical channel names is the default device name for AO Series devices. You
can change these names in MAX.

Related reference:

• AO Series, E Series, and S Series Signal Connections for Counters

Analog Output

An AO Series device has between four and 64 analog output physical channels named
Dev1/ao0 to Dev1/ao63.

For more detailed information on the device physical AO characteristics, refer to your
device user manual and specifications.

Digital Input and Output

All AO Series devices have eight lines of digital input and output named Dev1/
port0/line0 through Dev1/port0/line7. These lines belong to a single port,
and the physical channel Dev1/port0 refers to all eight lines at once.

Counter Input and Output

All AO Series devices have two counter/timers referred to by the physical channel
names Dev1/ctr0 and Dev1/ctr1. Unlike the other I/O types, these physical
channel names do not refer to terminals on the I/O connector but instead to circuits
within the device. There are three primary terminals associated with each counter.
These are the terminals used as the SOURCE, GATE and OUT functions. NI-DAQmx has
default values for these terminals. For counter input tasks, if you know whether your
signal provides the SOURCE or GATE function and wire your signal to the default, you
do not have to set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default OUT Default

Dev1/ctr0 PFI 8 PFI 9 CTR 0 OUT

© National Instruments 351

 NI-DAQmx Device Considerations

Counter SOURCE Default GATE Default OUT Default

Dev/ctr1 PFI 3 PFI 4 CTR 1 OUT

C Series and TestScale Module Physical Channels

In physical channel names:

• cDAQ1Mod1 is the default device name for a C Series device plugged into a USB or
Standalone CompactDAQ chassis, where cDAQ1 is the default chassis device name,
and Mod1 refers to the slot number
• TS1Mod1 is the default device name for a TestScale module plugged into a
Standalone TestScale chassis, where TS1 is the default chassis device name, and
Mod1 refers to the slot number

For C Series devices plugged into a network CompactDAQ chassis, such as the NI
cDAQ-9188, the default chassis device name is the host name of the chassis. You can
change these names in MAX. For C Series devices plugged into a supported
CompactRIO26 or CompactRIO Single-Board27 controller, Mod1 is the default device
name.

Related concepts:

• Digital I/O Considerations for C Series and TestScale Devices

• CompactRIO Single-Board Controller Physical Channels
• Digital I/O Considerations for C Series Devices

Related reference:

• C Series and TestScale Module Signal Connections for Counters

• C Series Signal Connections for Counters

Analog Input

The following table lists the number and naming of analog input physical channels for
C Series devices and TestScale modules.
26. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058.
27. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638.

352 ni.com
 NI-DAQmx Device Considerations

Number
Device of Naming
Channels
cDAQ1Mod1/ai0 to
NI 9218, NI 9250, NI 9251 2
cDAQ1Mod1/ai1
cDAQ1Mod1/ai0 to
NI 9225, NI 9230, NI 9232, NI 9246, NI 9247 3
cDAQ1Mod1/ai2
NI 9210, NI 9211, NI 9215, NI 9217, NI 9219, NI 9222, NI
cDAQ1Mod1/ai0 to
9223, NI 9227, NI 9229, NI 9234, NI 9237, NI 9238, NI 4
cDAQ1Mod1/ai3
9239, NI 9775
cDAQ1Mod1/ai0 to
NI 9242, NI 9244 4 cDAQ1Mod1/ai2,
cDAQ1Mod1/neutral
NI 9201, NI 9203, NI 9212, NI 9216, NI 9221, NI 9226, NI
cDAQ1Mod1/ai0 to
9224, NI 9228, NI 9231, NI 9235, NI 9236, NI 9252, NI 8
cDAQ1Mod1/ai7
9253
NI 9202, NI 9204, NI 9207, NI 9208, NI 9209, NI 9213, NI cDAQ1Mod1/ai0 to
16
9214 , NI 9220 cDAQ1Mod1/ai15
cDAQ1Mod1/ai0 to
NI 9205, NI 9206 32
cDAQ1Mod1/ai31
TS1Mod1/ai0 to TS1Mod1/
TS-15100 32
ai31

On the NI 9204, you can configure channels 0-7 as the positive channel of a differential
pair. On the NI 9205 and NI 9206, you can configure channels 0-7 and 16-23 as the
positive channel of a differential pair. If N is this channel, channel N + 8 is the negative
input of the pair. For instance, if you configure channel 1 in differential mode, the
positive input is channel 1, and channel 9 is the negative input. Use only the physical
channel name of the positive channel (not both) when creating a differential channel.

You can use channels from multiple analog input C Series devices in the same NI-
DAQmx task.

• Up to three analog input tasks can run at a given time per chassis in a cDAQ-91xx28
or TestScale29 chassis.
28. cDAQ-9132, 9133, 9134, 9135, 9136, 9137, 9174, 9178, 9179, 9184, 9185, 9188, 9188XT, and 9189

© National Instruments 353

 NI-DAQmx Device Considerations

• Up to eight analog input tasks can run a given time in a CompactRIO controller or a
CompactRIO Single-Board controller.
• Up to two analog input tasks with a C Series Delta-Sigma device can run at a given
time per chassis in a cDAQ-91xx30 or TestScale31 chassis.
• Up to eight analog input tasks with a C Series Delta-Sigma device can run at a
given time in a CompactRIO controller or a CompactRIO Single-Board controller.

Related concepts:

• C Series Device Groupings

Strain and Wheatstone Bridge Measurements

The NI 9235, NI 9236, and NI 9237 support only the AI Strain Gage, AI Force Bridge, AI
Pressure Bridge, AI Torque Bridge, AI Bridge (V/V), and AI Custom Voltage With
Excitation channel types.

When using the NI 9218, NI 9219, NI 9235, NI 9236, or NI 9237 with an AI Custom Voltage
With Excitation channel, you must set the AI.Excit.UseForScaling attribute/property to
true. This attribute/property causes the channel to return ratiometric data: Vin/Vex.
The NI 9219, NI 9235, NI 9236, and NI 9237 modules perform this division in hardware.

For the NI 9219, NI-DAQmx requires the AI.Excit.Val attribute/property to be set to 2.5 V
for AI Strain Gage and AI Custom Voltage With Excitation channel types and to 500 µA
for resistance and RTD measurements. The actual excitation voltage or current output
by the NI 9219 varies with the sensor resistance or the load being measured.

For the NI 9218, NI-DAQmx requires the AI.Excit.Val attribute/property to be set to 3.3 V
or 2 V for AI Strain Gage and AI Custom Voltage With Excitation (bridge mode), to 12 V
for AI Custom Voltage With Excitation (no bridge mode) for powered sensors, and to 2
mA for IEPE.

NI 9218, NI 9219, NI 9235, NI 9236, and NI 9237 devices return a voltage ratio rather
than a voltage. Therefore, use the AI.Bridge.InitialRatio attribute/property to specify
the initial voltage ratio, or set the AI.Bridge.InitialVoltage attribute/property to the

29. TS-15000 and TS-15010

30. cDAQ-9132, 9133, 9134, 9135, 9136, 9137, 9174, 9178, 9179, 9184, 9185, 9188, 9188XT, and 9189
31. TS-15000 and TS-15010

354 ni.com
 NI-DAQmx Device Considerations

ratio Vin/Vex returned by the device, multiplied by Vex.

The NI 9219 does not have quarter bridge completion circuitry, which affects AI Strain
Gage Quarter Bridge I channels and AI Custom Voltage With Excitation Quarter Bridge
channels (but not AI Strain Gage Quarter Bridge II channels). With these channels, the
NI 9219 performs a 2-wire resistance measurement on the active gage element, then
NI-DAQmx uses software scaling to convert the resistance measurement into a bridge
ratio. For these channels, the polynomial coefficients specified by the
AI.DevScalingCoeff attribute/property convert unscaled data into Ohms, not into V/V.
Likewise, the AI.Rng.High/AI.Rng.Low attributes/properties should be specified in units
of Ohms, not V/V.

When the NI 9219 is in quarter bridge mode, you need to use the
AI.Bridge.NomResistance attribute/property to control whether the channel uses the
120 Ω range or the 350 Ω range.

The NI 9218 has an internal full bridge. However, it can support quarter-bridge and
half-bridge measurements with the proper accessories.

NI 9218 Powered Sensor Measurements

The NI 9218 supports powered sensor measurements. For voltage powered sensor
measurements, you can use either the DAQmx Create Channel function/VI (the AI
Custom Voltage with Excitation measurement type) with the Bridge Configuration set
to No Bridge, or you can use the DAQmx Create Channel function/VI (voltage
measurement type) with the AI.Excit.Val attribute/property. For current powered
sensor measurements, you have to use the DAQmx Create Channel function/VI (current
measurement type) with the AI.Excit.Val attribute/property.

Analog Output

The following table lists the number and naming of analog output physical channels
for C Series devices.

Device Number of Channels Naming

NI 9260 2 cDAQ1Mod1/ao0 to cDAQ1Mod1/ao1
NI 9263, NI 9265 4 cDAQ1Mod1/ao0 to cDAQ1Mod1/ao3

© National Instruments 355

 NI-DAQmx Device Considerations

Device Number of Channels Naming

TS-15110 4 TS1Mod1/ao0 to TS1Mod1/ao3
NI 9262 6 cDAQ1Mod1/ao0 to cDAQ1Mod1/ao5
NI 9266 8 cDAQ1Mod1/ao0 to cDAQ1Mod1/ao7
NI 9264 16 cDAQ1Mod1/ao0 to cDAQ1Mod1/ao15

You can use channels from multiple analog output C Series devices in the same analog
output task. With certain cDAQ-91xx32 or TestScale33 chassis, if the task is hardware-
timed and uses only onboard memory, there is a limit of 16 channels per task, but if
the task is software-timed or does not use only onboard memory, the number of
channels is limited only by the number of devices. Only one hardware-timed analog
output task per CompactDAQ chassis can run at a given time. With a CompactRIO
controller or CompactRIO single-board controller, up to eight hardware-timed analog
output tasks can run at a given time.

When using the NI 9262, NI 9263, NI 9264, NI 9265, NI 9266, or TS-15110 you can run
only one type of timing at a time. You can have one software-timed task per channel or
one hardware-timed task running on a device at one time, but you cannot have a
combination of timing on that device. For instance, you can run up to four software-
timed tasks on the NI 9265 concurrently, but running one hardware-timed task with
one software-timed task generates an error.

When using the NI 9260, if you start a task that uses a different channel than the one
you are currently using, the channel no longer in use reverts to the calibrated 0 V value.

Digital Input and Output

The following table lists the number, type, and naming of digital input/output lines for
C Series devices.

Device Lines Type Naming

cDAQ1Mod1/port0/line0 to
NI 9344 4 digital input
cDAQ1Mod1/port0/line3

32. cDAQ-9132, 9133, 9134, 9135, 9136, 9137, 9174, 9178, 9179, 9184, 9185, 9188, 9188XT, and 9189
33. TS-15000 and TS-15010

356 ni.com
 NI-DAQmx Device Considerations

Device Lines Type Naming

cDAQ1Mod1/port1/line0 to
4 digital output
cDAQ1Mod1/port1/line3
digital input cDAQ1Mod1/port0/line0 to
NI 9402, NI 9435, NI 9481, 9482 4
and/or output cDAQ1Mod1/port0/line3
cDAQ1Mod1/port0/line0 to
NI 9411 6 digital input
cDAQ1Mod1/port0/line5
NI 9401, NI 9421, NI 9422, NI 9423, NI digital input cDAQ1Mod1/port0/line0 to
8
9472, NI 9474, NI 9475, NI 9485 and/or output cDAQ1Mod1/port0/line7
digital input TS1Mod1/port0/line0 to
TS-15050 DIO P0 8
and/or output TS1Mod1/port0/line7
cDAQ1Mod1/port0/line0 to
NI 9436, NI 9437 8 digital input
cDAQ1Mod1/port0/line7
cDAQ1Mod1/port0/line0 to
16 digital input
cDAQ1Mod1/port0/line15
NI 9375
cDAQ1Mod1/port1/line0 to
16 digital output
cDAQ1Mod1/port1/line15
cDAQ1Mod1/port0/line0 to
NI 9478 16 digital output
cDAQ1Mod1/port0/line15
NI 9403, NI 9425, NI 9426, NI 9476, NI digital input cDAQ1Mod1/port0/line0 to
32
9477 and/or output cDAQ1Mod1/port0/line31
digital input TS1Mod1/port0/line0 to
TS-15120, TS-15130 32
and/or output TS1Mod1/port0/line31

Note Digital I/O module capabilities depend on the type of digital signals
that the module can measure or generate and the chassis the module is used
in. Refer to Digital I/O Considerations for C Series for more
information.

Chassis Counter Input and Output

The CompactDAQ chassis, CompactDAQ controllers, CompactRIO controllers, and

CompactRIO single-board controllers have four counters. You can use counters/timers
with a C Series device in any slot. CompactRIO single-board controllers feature

© National Instruments 357

 NI-DAQmx Device Considerations

onboard I/O connectors in addition to C Series device access through the RMC
connector. See CompactRIO Single-Board Controller Physical Channels for
more information and counter terminal default configuration of CompactRIO single-
board controller onboard I/O connectors.

These chassis also have a 4-bit frequency output generator, referred to as

cDAQ1Modx/freqout, where x is the slot in which the module is located.

Each counter has four primary terminals associated with it. These are the terminals
used as the SOURCE, GATE, AUX, and OUT functions. NI-DAQmx has default values for
these terminals. For counter input tasks, if you know whether your signal provides the
SOURCE, AUX, or GATE function and wire your signal to the default, you do not have to
set the Input Terminal attribute/property.

Counter/timers are only supported on parallel digital I/O modules. Refer to Digital
I/O Considerations for C Series for more information.

The following table shows the counter terminal defaults for 8-channel DIO/DI/DO C
Series devices.

PFI Signal Physical Channel Name

PFI 0 ctr0 src/ctr2 aux
PFI 1 ctr0 gate/ctr2 out
PFI 2 ctr0 aux/ctr2 gate/freqout
PFI 3 ctr0 out/ctr2 src
PFI 4 ctr1 src/ctr3 aux
PFI 5 ctr1 gate/ctr3 out
PFI 6 ctr1 aux/ctr3 gate
PFI 7 ctr1 out/ctr3 src

The following table shows the counter terminal defaults for 6-channel DIO/DI/DO C
Series devices.

358 ni.com
 NI-DAQmx Device Considerations

PFI Signal Physical Channel Name

PFI 0 ctr0 src/ctr2 gate
PFI 1 ctr0 gate/ctr2 aux/ctr2 out/freqout
PFI 2 ctr0 aux/ctr0 out/ctr2 src
PFI 3 ctr1 src/ctr3 gate
PFI 4 ctr1 gate/ctr3 aux/ctr3 out
PFI 5 ctr1 aux/ctr1 out/ctr3 src

The following table shows the counter terminal defaults for 4-channel DIO/DI/DO C
Series devices.

PFI Signal Physical Channel Name

PFI 0 ctr0 src/ctr0 out/ctr2 aux/ctr3 gate
PFI 1 ctr0 gate/ctr1 aux/ctr2 src/ctr2 out/freqout
PFI 2 ctr0 aux/ctr1 gate/ctr3 src/ctr3 out
PFI 3 ctr1 src/ctr1 out/ctr2 gate/ctr3 aux

Module Counter Input and Output

The following table lists the number, type, and naming of counter input lines for C
Series counter modules.

Device Counter Type Names

cDAQ1Mod1/ctr0 to
NI 9361 8 Counter input
cDAQ1Mod1/ctr7

There are 8 PFI lines, from PFI0 to PFI7. Each counter can use any of the input PFI lines
to perform measurements. Two counters can use the same PFI line as inputs for their
measurements, as long as the input configurations are the same for both counters.

The following table shows the terminal defaults for edge counting measurements for C
Series counter modules.

© National Instruments 359

 NI-DAQmx Device Considerations

Counter Input terminal Reset Direction

ctr0 PFI0 PFI4 PFI7
ctr1 PFI1 PFI5 PFI6
ctr2 PFI2 PFI6 PFI5
ctr3 PFI3 PFI7 PFI4
ctr4 PFI4 PFI0 PFI3
ctr5 PFI5 PFI1 PFI2
ctr6 PFI6 PFI2 PFI1
ctr7 PFI7 PFI3 PFI0

The following table shows the terminal defaults for position measurements for C
Series counter modules.

Counter A B Z
ctr0 PFI0 PFI4 PFI7
ctr1 PFI1 PFI5 PFI6
ctr2 PFI2 PFI6 PFI5
ctr3 PFI3 PFI7 PFI4
ctr4 PFI4 PFI0 PFI3
ctr5 PFI5 PFI1 PFI2
ctr6 PFI6 PFI2 PFI1
ctr7 PFI7 PFI3 PFI0

The following table shows the terminal defaults for velocity measurements for C Series
counter modules that support velocity measurements.

Counter A B
ctr0 PFI0 PFI4
ctr1 PFI1 PFI5

360 ni.com
 NI-DAQmx Device Considerations

Counter A B
ctr2 PFI2 PFI6
ctr3 PFI3 PFI7
ctr4 PFI4 PFI0
ctr5 PFI5 PFI1
ctr6 PFI6 PFI2
ctr7 PFI7 PFI3

The following table shows the terminal defaults for frequency, period, duty cycle, and
pulse width measurements for C Series counter modules.

Counter Input Terminal

ctr0 PFI0
ctr1 PFI1
ctr2 PFI2
ctr3 PFI3
ctr4 PFI4
ctr5 PFI5
ctr6 PFI6
ctr7 PFI7

Connections for PFI lines should be based on the terminal configuration property. PFI
+ and PFI- should be connected in differential mode, and PFI + and COM should be
connected for RSE. The default terminal configuration for all counter input terminals is
RSE.

CompactRIO Single-Board Controller Physical Channels

The sbRIO-9603, 9608, and 9609 controllers do not have onboard physical channels.
The sbRIO-9628, 9629, and 9638 controllers have the following onboard IO
characteristics.

© National Instruments 361

 NI-DAQmx Device Considerations

Analog Input

Number of
Device Naming
Channels
sbRIO-9628, sbRIO-9629, Conn0_AI/ai0 to Conn0_AI/
16
sbRIO-9638 ai15

Analog Output

Device Number of Channels Naming

sbRIO-9628, sbRIO-9629, sbRIO-9638 4 Conn0_AO/ao0 to Conn0_AO/ao3

Digital Input and Output

Device Lines Type Naming

sbRIO-9628, digital input and/ Conn0_DIO0-3/port0/line0 to
4
sbRIO-9629 or output Conn0_DIO0-3/port0/line3
digital input and/ Conn0_DIO0-3/port0/line0 to
4
or output Conn0_DIO0-3/port0/line3
Conn1_DIO4-11/port0/line4 to
Conn1_DIO4-11/port0/line11
sbRIO-9638 Conn1_DIO12-19/port0/line12 to
digital input and/
8 Conn1_DIO12-19/port0/line19
or output
Conn1_DIO20-27/port0/line20 to
Conn1_DIO20-27/port0/line27

Chassis Counter Input and Output

The sbRIO-9628, 9629, and 9638 have four counters. You can use counters/timers with
a C Series device using the RMC connector or with onboard I/O on models where these
I/O connectors are available. The following information applies to CompactRIO Single-
Board controller onboard I/O. See C Series Physical Channels for more
information and counter terminal default configuration of C Series device I/O using the
RMC connector.

362 ni.com
 NI-DAQmx Device Considerations

These chassis also have a 4-bit frequency output generator, referred to as

devicename/freqout, where devicename is the onboard IO module name. For
example, Conn1_DIO4-11/freqout.

Each counter has four primary terminals associated with it. These are the terminals
used as the SOURCE, GATE, AUX, and OUT functions. NI-DAQmx has default values for
these terminals. For counter input tasks, if you know whether your signal provides the
SOURCE, AUX, or GATE function and wire your signal to the default, you do not have to
set the Input Terminal attribute/property.

Counter/timers are supported on the DIO 0-3, DIO 4-11, DIO 12-19 and DIO 20-27
onboard DIO devices and on parallel digital I/O modules. Refer to Digital I/O
Considerations for C Series and the counter section in C Series Physical
Channels for more information about C Series device specific behavior.

The following table shows the counter terminal defaults for the DIO 0-3 onboard
device.

Table 1. DIO 0-3 onboard device

PFI Signal Physical Channel Name
PFI 0 ctr0 src/ctr0 out/ctr2 aux/ctr3 gate
PFI 1 ctr0 gate/ctr1 aux/ctr2 src/ctr2 out/freqout
PFI 2 ctr0 aux/ctr1 gate/ctr3 src/ctr3 out
PFI 3 ctr1 src/ctr1 out/ctr2 gate/ctr3 aux

The following table shows the counter terminal defaults for the DIO 4-11 onboard
device.

Table 2. DIO 4-11 onboard device

PFI Signal Physical Channel Name
PFI 4 ctr0 src/ctr2 aux
PFI 5 ctr0 gate/ctr2 out
PFI 6 ctr0 aux/ctr2 gate/freqout
PFI 7 ctr0 out/ctr2 src

© National Instruments 363

 NI-DAQmx Device Considerations

PFI Signal Physical Channel Name

PFI 8 ctr1 src/ctr3 aux
PFI 9 ctr1 gate/ctr3 out
PFI 10 ctr1 aux/ctr3 gate
PFI 11 ctr1 out/ctr3 src

The following table shows the counter terminal defaults for the DIO 12-19 onboard
device.

Table 3. DIO 12-19 onboard device.

PFI Signal Physical Channel Name
PFI 12 ctr0 src/ctr2 aux
PFI 13 ctr0 gate/ctr2 out
PFI 14 ctr0 aux/ctr2 gate/freqout
PFI 15 ctr0 out/ctr2 src
PFI 16 ctr1 src/ctr3 aux
PFI 17 ctr1 gate/ctr3 out
PFI 18 ctr1 aux/ctr3 gate
PFI 19 ctr1 out/ctr3 src

The following table shows the counter terminal defaults for the DIO 20-27 onboard
device

Table 4. DIO 20-27 onboard device

PFI Signal Physical Channel Name
PFI 20 ctr0 src/ctr2 aux
PFI 21 ctr0 gate/ctr2 out
PFI 22 ctr0 aux/ctr2 gate/freqout
PFI 23 ctr0 out/ctr2 src
PFI 24 ctr1 src/ctr3 aux

364 ni.com
 NI-DAQmx Device Considerations

PFI Signal Physical Channel Name

PFI 25 ctr1 gate/ctr3 out
PFI 26 ctr1 aux/ctr3 gate
PFI 27 ctr1 out/ctr3 src

E Series Physical Channels

Dev1 in physical channel names is the default device name for E Series devices. You
can change these names in MAX.

Related reference:

• AO Series, E Series, and S Series Signal Connections for Counters

Analog Input

A 16-channel E Series device has physical channels ranging from Dev1/ai0 to Dev1/
ai15. You can configure only channels 0 through 7 in differential mode. When you
configure a channel in differential mode, the channel is the positive input and channel
plus eight is the negative input. For instance, if you configure channel 1 in differential
mode, the positive input is channel 1, and channel 9 is the negative input.

A 64-channel E Series device has physical channels ranging from Dev1/ai0 to Dev1/
ai63. You can configure channels in banks of every other eight beginning with 0
through 7 as the positive channel of a differential pair (0-7, 16-23, 32-39, and 48-55). If
N is this channel, channel N + 8 is the negative input of the pair.

Use only the physical channel name of the positive channel when creating a
differential channel (not both).

Analog Output

An E Series device that supports analog output has two analog output physical
channels named Dev1/ao0 and Dev1/ao1.

© National Instruments 365

 NI-DAQmx Device Considerations

Digital Input and Output

All E Series devices except the NI 6025E have eight lines of digital input and output
named Dev1/port0/line0 through Dev1/port0/line7. These lines belong to
a single port, and the physical channel Dev1/port0 refers to all eight lines at once.

The NI 6025E has 32 lines of digital input and output with eight lines belonging to one
of four ports. The names are of the form Dev1/portP/line0 through Dev1/
portP/line7, where P ranges from 0 through 3. There are also four physical channel
names that refer to all eight lines in a port at once of the form Dev1/portP, where P
ranges from 0 through 3. There are two more physical channel names that refer to all
the lines in multiple consecutive ports. They are both of the form Dev1/portP_N,
where P is the port number of the lowest numbered port, and N is the total number of
lines. All 32 lines at once can be configured as a single virtual channel with the physical
channel name Dev1/port0_32. You can configure the two ports that can be
handshaked as a single virtual channel by using the physical channel name Dev1/
port1_16.

Counter Input and Output

All E Series devices have two counter/timers referred to by the physical channel names
Dev1/ctr0 and Dev1/ctr1. Unlike the other I/O types, these physical channel
names do not refer to terminals on the I/O connector but instead to circuits within the
device. There are three primary terminals associated with each counter. These are the
terminals used as the SOURCE, GATE and OUT functions. NI-DAQmx has default values
for these terminals. For counter input tasks, if you know whether your signal provides
the SOURCE or GATE function and wire your signal to the default, you do not have to
set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default OUT Default

Dev1/ctr0 PFI 8 PFI 9 CTR 0 OUT
Dev/ctr1 PFI 3 PFI 4 CTR 1 OUT

FieldDAQ Physical Channels

In physical channel names, <product name>-<serial#> is the default device name. For

366 ni.com
 NI-DAQmx Device Considerations

example, an FD-11613 with serial number 1C6A39C shows up in MAX as

FD11613-1C6A39C. MAX also appends the bank number. For example,
FD11613-1C6A39C-Bank1. You can change these names in MAX.

FieldDAQ devices include the FD-11601, FD-11603, FD-11605, FD-11613, FD-11614,

FD-11634, and FD-11637.

Analog Input

The following table lists the number and naming of analog input physical channels for
FieldDAQ devices.

Number of
Device Naming
Channels
FD-11601-xxxxxxx-Bank1/ai0 to
FD-11601-xxxxxxx-Bank1/ai3
FD-11601 8
FD-11601-xxxxxxx-Bank2/ai0 to
FD-11601-xxxxxxx-Bank2/ai3

FD-11603-xxxxxxx-Bank1/ai0 to
FD-11603-xxxxxxx-Bank1/ai3
FD-11603 8
FD-11603-xxxxxxx-Bank2/ai0 to
FD-11603-xxxxxxx-Bank2/ai3

FD-11605-xxxxxxx-Bank1/ai0 to
FD-11605-xxxxxxx-Bank1/ai3
FD-11605 8
FD-11605-xxxxxxx-Bank2/ai0 to
FD-11605-xxxxxxx-Bank2/ai3

FD-11613-xxxxxxx-Bank1/ai0 to
FD-11613 8
FD-11613-xxxxxxx-Bank1/ai7
FD-11614-xxxxxxx-Bank1/ai0 to
FD-11614-xxxxxxx-Bank1/ai7
FD-11614 16
FD-11614-xxxxxxx-Bank2/ai0 to

© National Instruments 367

 NI-DAQmx Device Considerations

Number of
Device Naming
Channels

FD-11614-xxxxxxx-Bank2/ai7

FD-11634-xxxxxxx-Bank1/ai0 to
FD-11634-xxxxxxx-Bank1/ai3
FD-11634 8
FD-11634-xxxxxxx-Bank2/ai0 to
FD-11634-xxxxxxx-Bank2/ai3

FD-11637-xxxxxxx-Bank1/ai0 to
FD-11637-xxxxxxx-Bank1/ai3
FD-11637 8
FD-11637-xxxxxxx-Bank2/ai0 to
FD-11637-xxxxxxx-Bank2/ai3

Strain and Wheatstone Bridge Measurements FD-11637

The FD-11637 supports only the AI Strain Gage, AI Rosette Strain Gage, AI Force Bridge,
AI Pressure Bridge, AI Torque Bridge, AI Bridge (V/V), and AI Custom Voltage With
Excitation channel types.

When using the FD-11637 with an AI Custom Voltage With Excitation channel, you must
set the AI.Excit.UseForScaling attribute/property to true. This attribute/property
causes the channel to return ratiometric data: Vin/Vex.

The FD-11637 returns a voltage ratio rather than a voltage. Therefore, use the
AI.Bridge.InitialRatio attribute/property to specify the initial voltage ratio, or set the
AI.Bridge.InitialVoltage attribute/property to the ratio Vin/Vex returned by the device,
multiplied by Vex.

When the FD-11637 is in quarter bridge mode, you need to use the
AI.Bridge.NomResistance attribute/property to control whether the channel uses the
120 Ω range or the 350 Ω range.

The FD-11637 has internal half-bridge completion, and quarter-bridge completion for
120 Ω and 350 Ω strain gauges.

368 ni.com
 NI-DAQmx Device Considerations

M Series
The section contains information about M Series Physical Channels, Bus-Powered M
Series Physical Channels, NI 6221 (37-Pin) Device Physical Channels, and NI 623x
Physical Channels.

Related concepts:

• M Series Physical Channels

• Bus-Powered M Series Physical Channels
• NI 6221 (37-Pin) Device Physical Channels
• NI 623x Physical Channels
• Self-Powered Compared to Bus-Powered USB Devices
• Self-Powered Versus Bus-Powered M Series USB Devices

M Series Physical Channels

In physical channel names, Dev1 is the default device name for M Series devices. You
can change these names in MAX.

Related reference:

• 68-Pin M Series Signal Connections for Counters

Analog Input

Depending on your M Series device, you can have from 16 to 80 analog input channels.
A 16-channel M Series device has physical channels ranging from Dev1/ai0 to
Dev1/ai15, a 32-channel device from Dev1/ai0 to Dev1/ai31, and so on. You
can configure the first eight channels as the positive channel of a differential pair. If N
is this channel, channel N + 8 is the negative input of the pair. For instance, if you
configure channel 1 in differential mode, the positive input is channel 1, and channel 9
is the negative input. For devices with more than 16 AI channels, 16-23, 32-39, 48-55,
and 64-71 are also positive channels of a differential pair.

Use only the physical channel name of the positive channel (not both) when creating a
differential channel.

© National Instruments 369

 NI-DAQmx Device Considerations

Analog Output

An M Series device that supports two analog outputs has analog output physical
channels named Dev1/ao0 and Dev1/ao1.

An M Series device that supports four analog outputs has analog output physical
channels named Dev1/ao0, Dev1/ao1, Dev1/ao2, and Dev1/ao3.

Digital Input and Output

All M Series devices have eight, 16, or 32 lines of digital input and output named
Dev1/port0/line0 through Dev1/port0/line7, Dev1/port0/line0
through Dev1/port0/line15, or Dev1/port0/line0 through Dev1/port0/
line31. These lines belong to a single port, and the physical channel Dev1/port0
refers to all eight or 32 lines at once. Port 0 can perform both hardware-timed and
static digital operations.

M Series devices have two more ports, port 1 and port 2. Port 1 has eight digital I/O
lines, Dev1/port1/line0 through Dev1/port1/line7. Port 2 has eight digital
I/O lines, Dev1/port2/line0 through Dev1/port2/line7. Port 1 and port 2 can
be used as static digital I/O lines or PFI lines, PFI 0..15. When any of PFI lines 0..15 is
used as a digital I/O signal, it uses the physical channel name shown in the following
table.

PFI Signal Physical Channel Name

PFI 0 Dev1/port1/line0
PFI 1 Dev1/port1/line1
PFI 2 Dev1/port1/line2
PFI 3 Dev1/port1/line3
PFI 4 Dev1/port1/line4
PFI 5 Dev1/port1/line5
PFI 6 Dev1/port1/line6
PFI 7 Dev1/port1/line7
PFI 8 Dev1/port2/line0

370 ni.com
 NI-DAQmx Device Considerations

PFI Signal Physical Channel Name

PFI 9 Dev1/port2/line1
PFI 10 Dev1/port2/line2
PFI 11 Dev1/port2/line3
PFI 12 Dev1/port2/line4
PFI 13 Dev1/port2/line5
PFI 14 Dev1/port2/line6
PFI 15 Dev1/port2/line7

Physical channel Dev1/port2 refers to all eight lines, Dev1/port2/line0:7, at

once.

Counter Input and Output

All M Series devices have two counter/timers referred to by the physical channel
names Dev1/ctr0 and Dev1/ctr1 . Unlike the other I/O types, these physical
channel names do not refer to terminals on the I/O connector but instead to circuits
within the device. There are four primary terminals associated with each counter.
These are the terminals used as the SOURCE, GATE, AUX, and OUT functions. NI-
DAQmx has default values for these terminals. For counter input tasks, if you know
whether your signal provides the SOURCE, AUX, or GATE function and wire your signal
to the default, you do not have to set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

Counter SOURCE Default GATE Default AUX Default OUT Default
Dev1/ctr0 PFI 8 PFI 9 PFI 10 PFI 12
Dev1/ctr1 PFI 3 PFI 4 PFI 11 PFI 13

Bus-Powered M Series Physical Channels

In physical channel names, Dev1 is the default device name for M Series devices. You
can change these names in MAX.

© National Instruments 371

 NI-DAQmx Device Considerations

Related concepts:

• Self-Powered Compared to Bus-Powered USB Devices

• Self-Powered Versus Bus-Powered M Series USB Devices

Related reference:

• Bus-Powered M Series Signal Connections for Counters

Analog Input

Depending on your M Series device, you can have from 16 to 32 analog input channels.
A 16-channel M Series device has physical channels ranging from Dev1/ai0 to
Dev1/ai15, a 32-channel device from Dev1/ai0 to Dev1/ai31, and so on. You
can configure the first eight channels as the positive channel of a differential pair. If N
is this channel, channel N + 8 is the negative input of the pair. For instance, if you
configure channel 1 in differential mode, the positive input is channel 1, and channel 9
is the negative input. For devices with more than 16 AI channels, 16-23, 32-39, 48-55,
and 64-71 are also positive channels of a differential pair.

Use only the physical channel name of the positive channel (not both) when creating a
differential channel.

Analog Output

An M Series device that supports two analog outputs has analog output physical
channels named Dev1/ao0 and Dev1/ao1.

An M Series device that supports four analog outputs has analog output physical
channels named Dev1/ao0, Dev1/ao1, Dev1/ao2, and Dev1/ao3.

Digital Input and Output

Most bus-powered M Series devices have two ports, port 0 and port 1. For devices with
eight PFI lines, Port 0 has four digital input lines, Dev1/port0/line0 through
Dev1/port0/line3, and port 1 has four digital output lines, Dev1/port1/
line0 through Dev1/port1/line3. For devices with 16 PFI lines such as the NI
6218, Port 0 has eight digital input lines, Dev1/port0/line0 through Dev1/

372 ni.com
 NI-DAQmx Device Considerations

port0/line7, and port 1 has eight digital output lines, Dev1/port1/line0

through Dev1/port1/line7. You can use port 0 as static digital input lines or input
PFI lines. You can use port 1 as static digital output lines or output PFI lines. When any
of PFI lines 0..15 is used as a digital I/O signal, it uses the physical channel name shown
in the following table.

PFI Signal Physical Channel Name

PFI 0 Dev1/port0/line0
PFI 1 Dev1/port0/line1
PFI 2 Dev1/port0/line2
PFI 3 Dev1/port0/line3
PFI 4 Dev1/port1/line0
PFI 5 Dev1/port1/line1
PFI 6 Dev1/port1/line2
PFI 7 Dev1/port1/line3
PFI 8 Dev1/port0/line4
PFI 9 Dev1/port0/line5
PFI 10 Dev1/port0/line6
PFI 11 Dev1/port0/line7
PFI 12 Dev1/port1/line4
PFI 13 Dev1/port1/line5
PFI 14 Dev1/port1/line6
PFI 15 Dev1/port1/line7

Physical channel Dev1/port0 refers to all four or eight lines, Dev1/port1/

line0:3 or Dev1/port1/line0:7, at once. Physical channel Dev1/port1
refers to all four or eight lines, Dev1/port1/line0:3 or Dev1/port1/line0:7,
at once.

The NI 6212 and NI 6216 have 16 lines of digital input and output named Dev1/
port0/line0 through Dev1/port0/line15. These lines belong to a single port,

© National Instruments 373

 NI-DAQmx Device Considerations

and the physical channel Dev1/port0 refers to all 16 lines at once. Port 0 can
perform static digital I/O operations only.

The NI 6212 and NI 6216 have two more ports, port 1 and port 2. Port 1 has eight digital
I/O lines, Dev1/port1/line0 through Dev1/port1/line7. Port 2 has eight
digital I/O lines, Dev1/port2/line0 through Dev1/port2/line7. Port 1 and
port 2 can be used as static digital I/O lines or PFI lines, PFI 0..15. When any of PFI lines
0..15 is used as a digital I/O signal, it uses the physical channel name shown in the
following table.

PFI Signal Physical Channel Name

PFI 0 Dev1/port1/line0
PFI 1 Dev1/port1/line1
PFI 2 Dev1/port1/line2
PFI 3 Dev1/port1/line3
PFI 4 Dev1/port1/line4
PFI 5 Dev1/port1/line5
PFI 6 Dev1/port1/line6
PFI 7 Dev1/port1/line7
PFI 8 Dev1/port2/line0
PFI 9 Dev1/port2/line1
PFI 10 Dev1/port2/line2
PFI 11 Dev1/port2/line3
PFI 12 Dev1/port2/line4
PFI 13 Dev1/port2/line5
PFI 14 Dev1/port2/line6
PFI 15 Dev1/port2/line7

Physical channel Dev1/port1 refers to all eight lines, Dev1/port1/line0:7, at

once. Physical channel Dev1/port2refers to all eight lines, Dev1/port2/
line0:7, at once.

374 ni.com
 NI-DAQmx Device Considerations

Counter Input and Output

All M Series devices have two counter/timers referred to by the physical channel
names Dev1/ctr0 and Dev1/ctr1. Unlike the other I/O types, these physical channel
names do not refer to terminals on the I/O connector but instead to circuits within the
device. There are four primary terminals associated with each counter. These are the
terminals used as the SOURCE, GATE, AUX, and OUT functions. NI-DAQmx has default
values for these terminals. For counter input tasks, if you know whether your signal
provides the SOURCE, AUX, or GATE function and wire your signal to the default, you
do not have to set the Input Terminal attribute/property.

16-PFI Line Devices (NI 6218)

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 0 PFI 1 PFI 9 PFI 4
Dev1/ctr1 PFI 3 PFI 2 PFI 10 PFI 5

16-PFI Line Devices (NI 6212/6216)

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 8 PFI 9 PFI 10 PFI 12
Dev1/ctr1 PFI 3 PFI 4 PFI 11 PFI 13

8-PFI Line Devices (Such as the NI 6210/6211/6215)

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 0 PFI 1 PFI 0 PFI 4
Dev1/ctr1 PFI 3 PFI 2 PFI 3 PFI 5

NI 6221 (37-Pin) Device Physical Channels

In physical channel names, Dev1 is the default device name for NI 6221 (37-pin)
devices. You can change these names in MAX.

© National Instruments 375

 NI-DAQmx Device Considerations

Analog Input

A 16-channel NI 6221 (37-pin) device has physical channels ranging from Dev1/ai0 to
Dev1/ai15. You can configure only channels 0 through 7 in differential mode. When
you configure a channel in differential mode, the channel is the positive input and
channel plus eight is the negative input. For instance, if you configure channel 1 in
differential mode, the positive input is channel 1, and channel 9 is the negative input.

Analog Output

NI 6221 (37-pin) devices have two analog outputs corresponding to two analog output
physical channels named Dev1/ao0 and Dev1/ao1.

Digital Input and Output

NI 6221 (37-pin) devices have two ports, port 0 and port 1. Port 0 has two digital I/O
lines, Dev1/port0/line0 and Dev1/port0/line1. Port 1 has eight digital I/O
lines, Dev1/port1/line0 through Dev1/port1/line7. Port 1 can be used as
static digital I/O lines or input PFI lines, PFI 0..7. When any of PFI lines 0..7 is used as a
digital I/O signal, it uses the physical channel name shown in the following table.

PFI Signal Physical Channel Name

PFI 0 Dev1/port1/line0
PFI 1 Dev1/port1/line1
PFI 2 Dev1/port1/line2
PFI 3 Dev1/port1/line3
PFI 4 Dev1/port1/line4
PFI 5 Dev1/port1/line5
PFI 6 Dev1/port1/line6
PFI 7 Dev1/port1/line7

Physical channel Dev1/port0 refers to both lines, Dev1/port0/line0:1, at

once. Physical channel Dev1/port1 refers to all eight lines, Dev1/port1/
line0:7, at once.

376 ni.com
 NI-DAQmx Device Considerations

Counter Input and Output

NI 6221 (37-pin) devices have two counter/timers referred to by the physical channel
names Dev1/ctr0 and Dev1/ctr1. Unlike the other I/O types, these physical
channel names do not refer to terminals on the I/O connector but instead to circuits
within the device. There are four primary terminals associated with each counter.
These are the terminals used as the SOURCE, GATE, AUX, and OUT functions. NI-
DAQmx has default values for these terminals. For counter input tasks, if you know
whether your signal provides the SOURCE, AUX, or GATE function and wire your signal
to the default, you do not have to set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 0 PFI 1 PFI 2 PFI 6
Dev1/ctr1 PFI 3 PFI 4 PFI 5 PFI 7

In addition, the NI 6221 (37-pin) has one frequency generator. The output terminal of
the frequency generator is FREQOUT. The default for FREQOUT is PFI 5. When using
FREQOUT, you can continue to use both ctr0 and ctr1 to perform other operations.

NI 623x Physical Channels

In physical channel names, Dev1 is the default device name for NI 623x devices. You
can change these names in MAX.

Related reference:

• 37-Pin DSUB Signal Connections for Counters

Analog Input

Refer to the following table for the physical channel naming conventions for each 623x
device.

© National Instruments 377

 NI-DAQmx Device Considerations

Differential RSE
Device
+ - + -
NI 6230 Dev1/ai n Dev1/ai (n+4) Dev1/ai0..Dev1/ai n, where n=0..3 AI Gnd
NI 6232 Dev1/ai n Dev1/ai (n+8) Dev1/ai0..Dev1/ai n, where n=0..7 AI Gnd
NI 6233 Dev1/ai n Dev1/ai (n+8) Dev1/ai0..Dev1/ai n, where n=0..7 AI Gnd
NI 6236 Dev1/ai n+ Dev1/ai n- Dev1/ai0..Dev1/ai n, where n=0..3 AI Gnd
NI 6238 Dev1/ai n+ Dev1/ai n- Dev1/ai0..Dev1/ai n, where n=0..7 AI Gnd
NI 6239 Dev1/ai n+ Dev1/ai n- Dev1/ai0..Dev1/ai n, where n=0..7 AI Gnd

Analog Output

NI 623x devices have m analog outputs corresponding to m analog output physical

channels ranging from Dev1/ao0 to Dev1/ao(m-1). Refer to the hardware
documentation for the number of analog outputs for your device.

Digital Input and Output

NI 623x devices have two ports, port 0 and port 1. Port 0 has six digital input lines,
Dev1/port0/line0 through Dev1/port0/line5. Port 1 has four digital output
lines, Dev1/port1/line0 through Dev1/port1/line3. You can use port 0 as
static digital input lines or input PFI lines, PFI 0..5. You can use port 1 as static digital
output lines or output PFI lines, PFI 6..9. When any of PFI lines 0..9 is used as a digital
I/O signal, it uses the physical channel name shown in the following table.

PFI Signal Physical Channel Name Direction

PFI 0 Dev1/port0/line0 Input
PFI 1 Dev1/port0/line1 Input
PFI 2 Dev1/port0/line2 Input
PFI 3 Dev1/port0/line3 Input
PFI 4 Dev1/port0/line4 Input
PFI 5 Dev1/port0/line5 Input
PFI 6 Dev1/port1/line0 Output

378 ni.com
 NI-DAQmx Device Considerations

PFI Signal Physical Channel Name Direction

PFI 7 Dev1/port1/line1 Output
PFI 8 Dev1/port1/line2 Output
PFI 9 Dev1/port1/line3 Output

Physical channel Dev1/port0 refers to all six input lines, Dev1/port0/line0:5,

at once. Physical channel Dev1/port1 refers to all four output lines, Dev1/port1/
line0:3, at once.

Tristating Digital Output Channels (NI 6230/6236)

NI 6230/6236 devices support tristating for port 1, the four digital output lines. The
power-on state default is to tristate port 1. Tristating is supported only for the entire
port at a time, not on a per-line basis. For instance, port 1 remains tristated as long as
no lines on port 1 are toggled to generate a value. After a line on port 1 is toggled, all
lines on the port are driven to logic high or logic low depending on what you choose.
The default is logic low.

Counter Input and Output

NI 623x devices have two counter/timers referred to by the physical channel names
Dev1/ctr0 and Dev1/ctr1. Unlike the other I/O types, these physical channel
names do not refer to terminals on the I/O connector but instead to circuits within the
device. There are four primary terminals associated with each counter. These are the
terminals used as the SOURCE, GATE, AUX, and OUT functions. NI-DAQmx has default
values for these terminals. For counter input tasks, if you know whether your signal
provides the SOURCE, AUX, or GATE function and wire your signal to the default, you
do not have to set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 0 PFI 1 PFI 2 PFI 6
Dev1/ctr1 PFI 3 PFI 4 PFI 5 PFI 7

In addition, NI 623x devices have one frequency generator. The output terminal of the
frequency generator is FREQOUT. The default for FREQOUT is PFI 8. When using

© National Instruments 379

 NI-DAQmx Device Considerations

FREQOUT, you can continue to use both ctr0 and ctr1 to perform other operations.

NI 623x devices use the same default terminals for common counter applications as
other 37-Pin DSUB devices.

myDAQ Physical Channels

In physical channel names, myDAQ1 is the default device name for myDAQ. You can
change these names in MAX.

Related reference:

• myDAQ Signal Connections for Counters

Analog Input

myDAQ has two analog input channels, myDAQ1/ai0 and myDAQ1/ai1. These
channels support only the differential terminal configuration. You can configure the
first channel, myDAQ1/ai0, as the positive channel of a differential pair. Use only the
physical channel name of the positive channel (not both) when creating a differential
channel.

myDAQ also has a DMM physical channel, myDAQ1/dmm, available from the device.
On myDAQ, the DMM physical channels cannot be used in the same task with other
channels. There are also two audio input channels, myDAQ1/audioInputLeft and
myDAQ1/audioInputRight. These channels support only the referenced signal-ended
terminal configuration. Analog input tasks do not work simultaneously with audio
input.

Analog Output

myDAQ has two analog outputs with analog output physical channels named
myDAQ1/ao0 and myDAQ1/ao1. myDAQ also has two audio output channels,
myDAQ1/audioOutputLeft and myDAQ1/audioOutputRight. Analog output
tasks do not work simultaneously with audio out.

380 ni.com
 NI-DAQmx Device Considerations

Digital Input and Output

myDAQ has eight lines of digital input and output named myDAQ1/port0/line0
through myDAQ1/port0/line7. These lines belong to a single port, and the
physical channel myDAQ1/port0 refers to all 8 lines at once.

Counter Input and Output

myDAQ has one counter/timer referred to by the physical channel name myDAQ1/
ctr0. Unlike the other I/O types, these physical channel names do not refer to
terminals on the I/O connector but instead to circuits within the device. There are four
primary terminals associated with each counter. These are the terminals used as the
SOURCE, GATE, AUX, and OUT functions. NI-DAQmx has default values for these
terminals. For counter input tasks, if you know whether your signal provides the
SOURCE, AUX, or GATE function and wire your signal to the default, you do not have to
set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

myDAQ1/ctr0 PFI 0 (DIO 0) PFI 1 (DIO 1) PFI 2 (DIO 2) PFI 3 (DIO 3)

NI 6010 Physical Channels

In physical channel names, Dev1 is the default device name for NI 6010 devices. You
can change these names in MAX.

Related reference:

• 37-Pin DSUB Signal Connections for Counters

Analog Input

A 16-channel NI 6010 device has physical channels ranging from Dev1/ai0 to Dev1/
ai15. You can configure only channels 0 through 7 in differential mode. When you
configure a channel in differential mode, the channel is the positive input and channel
plus eight is the negative input. For instance, if you configure channel 1 in differential
mode, the positive input is channel 1, and channel 9 is the negative input.

© National Instruments 381

 NI-DAQmx Device Considerations

Use only the physical channel name of the positive channel (not both) when creating a
differential channel.

Analog Output

NI 6010 devices have two analog outputs corresponding to two analog output physical
channels named Dev1/ao0 and Dev1/ao1.

Digital Input and Output

NI 6010 devices have two ports, port 0 and port 1. Port 0 has six digital input lines,
Dev1/port0/line0 through Dev1/port0/line5. Port 1 has four digital output
lines, Dev1/port1/line0 through Dev1/port1/line3. You can use port 0 as
static digital input lines or input PFI lines, PFI 0..5. You can use port 1 as static digital
output lines or output PFI lines, PFI 6..9. When any of PFI lines 0..9 is used as a digital
I/O signal, it uses the physical channel name shown in the following table.

PFI Signal Physical Channel Name

PFI 0 Dev1/port0/line0
PFI 1 Dev1/port0/line1
PFI 2 Dev1/port0/line2
PFI 3 Dev1/port0/line3
PFI 4 Dev1/port0/line4
PFI 5 Dev1/port0/line5
PFI 6 Dev1/port1/line0
PFI 7 Dev1/port1/line1
PFI 8 Dev1/port1/line2
PFI 9 Dev1/port1/line3

Physical channel Dev1/port0 refers to all six input lines, Dev1/port0/line0:5,

at once. Physical channel Dev1/port1 refers to all four output lines, Dev1/port1/
line0:3, at once.

382 ni.com
 NI-DAQmx Device Considerations

Counter Input and Output

NI 6010 devices have two counter/timers referred to by the physical channel names
Dev1/ctr0 and Dev1/ctr1. Unlike the other I/O types, these physical channel
names do not refer to terminals on the I/O connector but instead to circuits within the
device. There are four primary terminals associated with each counter. These are the
terminals used as the SOURCE, GATE, AUX, and OUT functions. NI-DAQmx has default
values for these terminals. For counter input tasks, if you know whether your signal
provides the SOURCE, AUX, or GATE function and wire your signal to the default, you
do not have to set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 0 PFI 1 PFI 2 PFI 6
Dev1/ctr1 PFI 3 PFI 4 PFI 5 PFI 7

NI 6154 Physical Channels

In physical channel names, Dev1 is the default device name for NI 6154 devices. You
can change these names in MAX.

Related reference:

• 37-Pin DSUB Signal Connections for Counters

Analog Input

A 4-channel NI 6154 device has physical channels ranging from Dev1/ai0 to Dev1/
ai3.

Analog Output

NI 6154 devices have four analog outputs corresponding to four analog output
physical channels ranging from Dev1/ao0 to Dev1/ao3.

© National Instruments 383

 NI-DAQmx Device Considerations

Digital Input and Output

NI 6154 devices have two ports, port 0 and port 1. Port 0 has six digital input lines,
Dev1/port0/line0 through Dev1/port0/line5. Port 1 has four digital output
lines, Dev1/port1/line0 through Dev1/port1/line3. You can use port 0 as
static digital input lines or input PFI lines, PFI 0..5. You can use port 1 as static digital
output lines or output PFI lines, PFI 6..9. When any of PFI lines 0..9 is used as a digital
I/O signal, it uses the physical channel name shown in the following table.

PFI Signal Physical Channel Name Direction

PFI 0 Dev1/port0/line0 Input
PFI 1 Dev1/port0/line1 Input
PFI 2 Dev1/port0/line2 Input
PFI 3 Dev1/port0/line3 Input
PFI 4 Dev1/port0/line4 Input
PFI 5 Dev1/port0/line5 Input
PFI 6 Dev1/port1/line0 Output
PFI 7 Dev1/port1/line1 Output
PFI 8 Dev1/port1/line2 Output
PFI 9 Dev1/port1/line3 Output

Physical channel Dev1/port0 refers to all six input lines, Dev1/port0/line0:5,

at once. Physical channel Dev1/port1 refers to all four output lines, Dev1/port1/
line0:3, at once.

Counter Input and Output

NI 6154 devices have two counter/timers referred to by the physical channel names
Dev1/ctr0 and Dev1/ctr1. Unlike the other I/O types, these physical channel
names do not refer to terminals on the I/O connector but instead to circuits within the
device. There are four primary terminals associated with each counter. These are the
terminals used as the SOURCE, GATE, AUX, and OUT functions. NI-DAQmx has default
values for these terminals. For counter input tasks, if you know whether your signal

384 ni.com
 NI-DAQmx Device Considerations

provides the SOURCE, AUX, or GATE function and wire your signal to the default, you
do not have to set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 0 PFI 1 PFI 2 PFI 6
Dev1/ctr1 PFI 3 PFI 4 PFI 5 PFI 7

In addition, the NI 6154 has one frequency generator. The output terminal of the
frequency generator is FREQOUT. The default for FREQOUT is PFI 8. When using
FREQOUT, you can continue to use both ctr0 and ctr1 to perform other operations.

The NI 6154 uses the same default terminals for common counter applications as other
37-Pin DSUB devices.

NI 6533/6534 Device Physical Channels

Digital Input and Output

All NI 6533/6534 devices have 32 individually configurable lines of digital input and
output that are grouped into four 8-bit ports.

NI-DAQmx Physical Channel Name

Port NI-DAQmx Physical Channel Name (Lines)
(Ports)34
Port Dev1/port0/line0 — Dev1/port0/
Dev1/port0
0 line7
Port Dev1/port1/line0 — Dev1/port1/
Dev1/port1
1 line7
Port Dev1/port2/line0 — Dev1/port2/
Dev1/port2
2 line7
Port Dev1/port3/line0 — Dev1/port3/
Dev1/port3
3 line7

For Ports 0 through 3, you can configure a port width of eight, 16, or 32 bits. To
configure a 32-bit port, use the physical channel name Dev1/port0_32. To configure a
34. This physical channel name refers to all eight lines in a port at once.

© National Instruments 385

 NI-DAQmx Device Considerations

16-bit port, use channel names that refer to all the lines in multiple consecutive ports:
Dev1/portP_N, where P is the port number of the lowest numbered port, and N is
the total number of lines. For instance, combining Port 2 and 3 into a 16-bit port, you
would specify Dev1/port2_16 as the physical channel.

NI 6533/6534 devices also have eight fixed-direction lines, grouped into two ports, that
use PFI lines. Port 4 is used for input operations; Port 5 is for output.

Port 4 and port 5 can be used as static digital I/O lines or PFI lines. When any of these
PFI lines is used as a digital I/O signal, it uses the physical channel name shown in the
following table.

PFI Signal Physical Channel Name

PFI0 Dev1/port4/line0
PFI1 Dev1/port4/line1
PFI2 Dev1/port4/line2
PFI3 Dev1/port4/line3
PFI4 Dev1/port5/line2
PFI5 Dev1/port5/line3
PFI6 Dev1/port5/line0
PFI7 Dev1/port5/line1

NI 6535/6536/6537 Physical Channels

The 32 individually configurable lines of digital input and output on the NI 6535/6536/
6537 are grouped into four 8-bit ports, as shown in the following table. You can choose
to configure an entire port for a particular task or only a particular physical channel.

The following table shows the channel names you can use to configure your task in NI-
DAQmx. Dev1 in physical channel names is the default device name for NI 6535/6536/
6537 devices. You can change the device name in MAX.

386 ni.com
 NI-DAQmx Device Considerations

NI-DAQmx Physical Channel Name

Port NI-DAQmx Physical Channel Name (Lines)
(Ports)35
Dev1/port0/line0 — Dev1/port0/
Port 0 Dev1/port0
line7
Dev1/port1/line0 — Dev1/port1/
Port 1 Dev1/port1
line7
Dev1/port2/line0 — Dev1/port2/
Port 2 Dev1/port2
line7
Dev1/port3/line0 — Dev1/port3/
Port 3 Dev1/port3
line7
Port Dev1/port4/line0 — Dev1/port4/
Dev1/port4
436 line5

For Ports 0 through 3, you can configure a port width of 8, 16, or 32 bits. To configure a
32-bit port, use the physical channel name Dev1/port0_32. To configure a 16-bit
port, use channel names that refer to all the lines in multiple consecutive ports:
Dev1/portP_N, where P is 0 or 2 (whichever port number is lower) and N is the total
number of lines. For example, to combine Port 2 and 3 into a 16-bit port, specify
Dev1/port2_16 as the physical channel.

Using NI-DAQmx, you can configure each physical channel individually by inverting or
tristating the physical channel.

Related concepts:

• Sample Timing Types

PFI Lines

The NI 6535/6536/6537 has six PFI lines. These bidirectional digital lines allow you to
route synchronization and timing signals to and from the I/O connector. The following
table lists the PFI lines and their timing function.

PFI 0 General-purpose PFI line

35. This physical channel name refers to all eight lines in a port at once.
36. Port 4 is composed of the six PFI lines.

© National Instruments 387

 NI-DAQmx Device Considerations

PFI 1 General-purpose PFI line

PFI 2 General-purpose PFI line
PFI 3 General-purpose PFI line
PFI 4 General-purpose PFI or the generation Sample clock terminal
PFI 5 General-purpose PFI or the acquisition Sample clock terminal

You can use control lines as extra data lines while using the On Demand sample timing
type.

Related concepts:

• Sample Timing Types

NI ELVIS II Family Physical Channels

In physical channel names, Dev1 is the default device name for the NI ELVIS II Family
device. You can change these names in MAX.

Related reference:

• NI ELVIS II Family Signal Connections for Counters

Analog Input

NI ELVIS II Family devices have 16 analog input channels, ranging from Dev1/ai0 to
Dev1/ai15. You can configure the first eight channels as the positive channel of a
differential pair. If N is this channel, channel N + 8 is the negative input of the pair. For
instance, if you configure channel 1 in differential mode, the positive input is channel
1, and channel 9 is the negative input.

Use only the physical channel name of the positive channel (not both) when creating a
differential channel.

NI ELVIS II Family devices have two oscilloscope physical channels, Dev1/scopeCh0

and Dev1/scopeCh1, available from the NI ELVIS II Family benchtop workstation.
The NI ELVIS II Family benchtop workstation also has a DMM physical channel, Dev1/

388 ni.com
 NI-DAQmx Device Considerations

dmm. On the NI ELVIS II Family devices, the DMM and oscilloscope physical channels
cannot be used in the same task with other channels. However, scopeCh0 and
scopeCh1 can be used together.

Analog Output

NI ELVIS II Family devices have two analog outputs with analog output physical
channels named Dev1/ao0 and Dev1/ao1. NI ELVIS II Family devices also have two
function generator channels, Dev1/fgen and Dev1/fgenBNC, and two variable
power supply channels, Dev1/vpsPos (the positive variable power supply) and
Dev1/vpsNeg (the negative variable power supply). The function generator
channels, Dev1/fgen and Dev1/fgenBNC, use the FGEN Create Channel function/
VI. These function generator terminals also share the same resource.

Digital Input and Output

NI ELVIS II Family devices have 24 lines of digital input and output named Dev1/
port0/line0 through Dev1/port0/line23. These lines belong to a single port,
and the physical channel Dev1/port0 refers to all 24 lines at once. Port 0 can
perform static digital operations.

NI ELVIS II Family devices have two more ports, port 1 and port 2. Port 1 has eight
digital I/O lines, Dev1/port1/line0 through Dev1/port1/line7. Port 2 has
seven digital I/O lines, Dev1/port2/line0 through Dev1/port2/line6. Port 1
and port 2 can be used as static digital I/O lines or PFI lines, PFI 0..14. When any of PFI
lines 0..14 is used as a digital I/O signal, it uses the physical channel name shown in
the following table.

PFI Signal Physical Channel Name

PFI 0 Dev1/port1/line0
PFI 1 Dev1/port1/line1
PFI 2 Dev1/port1/line2
PFI 3 Dev1/port1/line3
PFI 4 Dev1/port1/line4
PFI 5 Dev1/port1/line5

© National Instruments 389

 NI-DAQmx Device Considerations

PFI Signal Physical Channel Name

PFI 6 Dev1/port1/line6
PFI 7 Dev1/port1/line7
PFI 8 Dev1/port2/line0
PFI 9 Dev1/port2/line1
PFI 10 Dev1/port2/line2
PFI 11 Dev1/port2/line3
PFI 12 Dev1/port2/line4
PFI 13 Dev1/port2/line5
PFI 14 Dev1/port2/line6

Physical channel Dev1/port1 refers to all eight lines, Dev1/port1/line0:7, at

once. Physical channel Dev1/port2 refers to all seven lines, Dev1/port2/line0:6,
at once.

Counter Input and Output

NI ELVIS II Family devices have two counter/timers referred to by the physical channel
names Dev1/ctr0 and Dev1/ctr1. Unlike the other I/O types, these physical
channel names do not refer to terminals on the I/O connector but instead to circuits
within the device. There are four primary terminals associated with each counter.
These are the terminals used as the SOURCE, GATE, AUX, and OUT functions. NI-
DAQmx has default values for these terminals. For counter input tasks, if you know
whether your signal provides the SOURCE, AUX, or GATE function and wire your signal
to the default, you do not have to set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 8 PFI 9 PFI 10 PFI 12
Dev1/ctr1 PFI 3 PFI 4 PFI 11 PFI 13

390 ni.com
 NI-DAQmx Device Considerations

Note PFI 15 refers to the same terminal as dev1/fgenBNC and both

cannot be used at the same time. PFI 15 is used as an external clock, as a
trigger, and for counter input operations.

NI mioDAQ Physical Channels

In physical channel names, Dev1 is the default device name for mioDAQ devices. You
can change these names in MAX.

Analog Input

Depending on your mioDAQ device, you can have from 16 to 32 analog input channels.
A 16-channel mioDAQ device has physical channels ranging from Dev1/ai0 to
Dev1/ai15, a 32-channel device from Dev1/ai0 to Dev1/ai31.

Use only the physical channel name of the positive channel (not both) when creating a
differential channel.

Analog Output

A mioDAQ device that supports two analog outputs has analog output physical
channels named Dev1/ao0 and Dev1/ao1.

A mioDAQ device that supports four analog outputs has analog output physical
channels named Dev1/ao0, Dev1/ao1, Dev1/ao2, and Dev1/ao3.

Digital Input and Output

All mioDAQ devices have 16 lines of digital input and output named Dev1/port0/
line0 through Dev1/port0/line15. These lines belong to a single port, and the
physical channel Dev1/port0 refers to all 16 lines at once. Port 0 can perform both
hardware-timed and static digital operations.

The mioDAQ device digital lines can also be used as pins for Counter/Timer operations
and Trigger routing. Such pins are sometimes referred to as Programmable Function

© National Instruments 391

 NI-DAQmx Device Considerations

Interface (PFI) pins. On the mioDAQ devices, the same physical pins can be used as
either digital I/O or PFI. The channel name mapping of PFI pins to digital I/O physical
channels is shown in the following table.

PFI Signal Physical Channel Name

PFI 0:15 Dev1/port0/line0:15

Counter Input and Output

All mioDAQ devices have four counter/timers referred to by the physical channel
names Dev1/ctr0, Dev1/ctr1, Dev1/ctr2, and Dev1/ctr3. Unlike the other
I/O types, these physical channel names do not refer to terminals on the I/O connector
but instead to circuits within the device. There are five primary signals associated with
each counter: SOURCE, GATE, AUX, OUT, and sample clock. NI-DAQmx has default
terminals for these signals, except for the sample clock.

For counter input tasks, if you know whether your signal provides the SOURCE, AUX, or
GATE function and wire your signal to the default, you do not have to set the Input
Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 0 PFI 8 PFI 4 PFI 0
Dev1/ctr1 PFI 1 PFI 9 PFI 5 PFI 1
Dev1/ctr2 PFI 2 PFI 10 PFI 6 PFI 2
Dev1/ctr3 PFI 3 PFI 11 PFI 7 PFI 3

S Series Physical Channels

Dev1 in physical channel names is the default device name for S Series devices. You
can change these names in MAX.

Related reference:

• AO Series, E Series, and S Series Signal Connections for Counters

392 ni.com
 NI-DAQmx Device Considerations

Analog Input

An S Series device has between two and eight analog input physical channels named
Dev1/ai0 to Dev1/ai7.

Analog Output

An S Series device that supports analog output has two analog output physical
channels named Dev1/ao0 and Dev1/ao1.

Digital Input and Output

All S Series devices have eight lines of digital input and output named Dev1/port0/
line0 through Dev1/port0/line7. These lines belong to a single port, and the
physical channel Dev1/port0 refers to all eight lines at once.

Counter Input and Output

All S Series devices have two counter/timers referred to by the physical channel names
Dev1/ctr0 and Dev1/ctr1. Unlike the other I/O types, these physical channel
names do not refer to terminals on the I/O connector but instead to circuits within the
device. There are three primary terminals associated with each counter. These are the
terminals used as the SOURCE, GATE and OUT functions. NI-DAQmx has default values
for these terminals. For counter input tasks, if you know whether your signal provides
the SOURCE or GATE function and wire your signal to the default, you do not have to
set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default OUT Default

Dev1/ctr0 PFI 8 PFI 9 CTR 0 OUT
Dev/ctr1 PFI 3 PFI 4 CTR 1 OUT

SCXI and SCC Physical Channels

SC1Mod1 is the default device name for an SCXI module, where SC1 is the default
chassis ID, and Mod1 refers to the slot number. These names can be changed in MAX.

© National Instruments 393

 NI-DAQmx Device Considerations

Analog Input

An SCXI module usually has eight or 32 analog input channels; refer to your device
documentation to be sure. These physical channel names are of the form
SC1Mod<slot#>/ai0 to SC1Mod<slot#>/aiN, where <slot#> is the chassis slot
number of the module, and N equals the number of analog input channels on the
module minus one. For example, SCI1Mod1/ai31 is the highest numbered physical
channel for a module with 32 analog input channels.

An SCC module has either one or two physical channels named SCC1Mod<J
connector#>aiN, where <J connector#> is the number of the J connector where the
SCC module resides, and N is the channel number. SCC1 is the SCC connector block ID
(for example, SCC1Mod1/ai0).

NI PXI-4224 Only—You cannot scan channel ai7 and the CJC channel simultaneously in
a task, since the CJC channel is multiplexed to channel 7. However, when you make a
thermocouple measurement on ai0:7 with internal CJC, NI-DAQmx automatically reads
the CJC channel at the beginning of the measurement and then scans the rest of the
channels correctly.

Analog Output

An SCXI module has some number of output channels for voltage or current. These
physical channel names are of the form SC1Mod<slot#>/ao0 to
SC1Mod<slot#>/aoN, where <slot#> is the chassis slot number of the module, and N
equals the number of analog output channels on the module minus one. For example,
SC1Mod1/ao5 is the highest numbered physical channel on a module with six
channels.

Digital Input and Output

An SCXI digital module has eight, 16, or 32 lines named SC1Mod<slot#>/port0/

line0 through SC1Mod<slot#>/port0/lineN, where <slot#> is the chassis slot
number of the module, and N is the number of digital lines minus one. For example,
SC1Mod1/port0/line31 is the highest numbered line for a module with 32 lines. These
lines belong to a single port and the physical channel named SC1Mod<slot#>/port0
refers to all the lines at once.

394 ni.com
 NI-DAQmx Device Considerations

An SCC module has either one digital input line or one digital output line with names
of the form SCC1Mod<J connector#>diN or SCC1Mod<J connector#>doN, where <J
connector#> is the number of the J connector where the SCC module resides, and N is
the channel number. SCC1 is the SCC connector block ID (for example, SCC1Mod1/
di0).

SC Express Physical Channels

In physical channel names, PXI1Slot1 is the default device name for SC Express
devices, where PXI1 is the chassis number, and Slot1 refers to the slot number. You can
change these names in MAX.

Analog Input

SC Express Devices have from four to 32 analog input channels. A 4-channel device has
physical channels ranging from PXISlot1/ai0 to PXISlot1/ai3, an 8-channel
device has physical channels ranging from PXISlot1/ai0 to PXISlot1/ai7, and
a 32-channel device has channels ranging from PXISlot1/ai0 to PXISlot1/
ai31.

You can use channels from multiple analog input SC Express devices in the same NI-
DAQmx task.

Analog Output

NI 4322 devices have eight analog output channels ranging from PXI1Slot1/ao0 to
PXISlot1/ao7. You can use channels from multiple analog output SC Express
devices in the same NI-DAQmx task.

Strain and Wheatstone Bridge Measurements

The NI 4330 and 4331 devices support only the AI Strain Gage, AI Force Bridge, AI
Pressure Bridge, AI Torque Bridge, AI Bridge (V/V), and AI Custom Voltage With
Excitation channel types. The NI 4339 supports AI Voltage in addition to the previously
mentioned measurement types.

When using NI 4330 and 4331 devices with an AI Custom Voltage With Excitation

© National Instruments 395

 NI-DAQmx Device Considerations

channel, you must set the AI.Excit.UseForScaling attribute/property to true. This

attribute/property causes the channel to return ratiometric data: Vin/Vex. These
devices perform this division in hardware. The NI 4339 does not require the
AI.Excit.UseForScaling attribute/property. Disabling this property allows for the NI
4339 to perform voltage measurements while providing voltage excitation.

NI 4330 and 4331 devices return a voltage ratio rather than a voltage. Therefore, use
the AI.Bridge.InitialRatio attribute/property to specify the initial voltage ratio, or set
the AI.Bridge.InitialVoltage attribute/property to the ratio Vin/Vex returned by the
device, multiplied by Vex.

SensorDAQ Physical Channels

SensorDAQ has analog input, analog output, digital I/O, and counter channels. It also
has three analog sensor channels (labeled Ch. 1, Ch. 2, and Ch. 3 on the device) and
one digital sensor channel (labeled DIG on the device) for use with Vernier sensors.
Please contact Vernier for additional information on the analog and digital sensor
channels.

Analog Input

SensorDAQ has two AI physical channels, Dev1/ai0 and Dev1/ai1. When you
configure a channel in differential mode, Dev1/ai0 is the positive input and Dev1/
ai1 is the negative input.

Analog Output

SensorDAQ has two AO physical channels, Dev1/ao0 and Dev1/ao1.

Digital Input/Output

SensorDAQ has four digital I/O physical channels.

Counter Input and Output

There is one counter channel referred to by the physical channel name Dev1/ctr0.
pfi0 is the terminal used for this physical channel.

396 ni.com
 NI-DAQmx Device Considerations

TIO Physical Channels

Counter Input and Output

TIO devices have up to eight counter/timers referred to by the physical channel names
Dev1/ctr0 to Dev1/ctr7. Unlike the other I/O types, these physical channel
names do not refer to terminals on the I/O connector but instead to circuits within the
device.

There are four primary terminals associated with each TIO counter. These are the
terminals used as the SOURCE, GATE, AUX, and OUT functions. NI-DAQmx has default
values for these terminals. For counter input tasks, if you know whether your signals
provide the SOURCE, GATE, or AUX functions and wire your signal to the default input,
you do not have to set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 39 PFI 38 PFI 37 PFI 36
Dev1/ctr1 PFI 35 PFI 34 PFI 33 PFI 32
Dev1/ctr2 PFI 31 PFI 30 PFI 29 PFI 28
Dev1/ctr3 PFI 27 PFI 26 PFI 25 PFI 24
Dev1/ctr4 PFI 23 PFI 22 PFI 21 PFI 20
Dev1/ctr5 PFI 19 PFI 18 PFI 17 PFI 16
Dev1/ctr6 PFI 15 PFI 14 PFI 13 PFI 12
Dev1/ctr7 PFI 11 PFI 10 PFI 9 PFI 8

Note The NI 6601 has only four counters (ctr0–ctr3). The entries in the
previous table for cntr4, cntr5, cntr6, and cntr7 do not apply for that device.

Digital Input and Output

NI 661x devices have two ports, port 0 and port 1. Port 0 has 32 lines of digital input
and output named Dev1/port0/line0 through Dev1/port0/line31. Port 1
has 8 lines of digital input and output named Dev1/port1/line0 through Dev1/

© National Instruments 397

 NI-DAQmx Device Considerations

port1/line7. The physical channel Dev1/port0 refers to all 32 lines at once, and the
physical channel Dev1/port1 refers to all 8 lines at once. Port 0 can perform hardware-
timed and static digital operations, while port 1 can perform only static digital
operations.

Port 0 and port 1 can be used as static PFI lines, PFI 0..39. When any of PFI lines 0..39 is
used as a digital I/O signal, it uses the physical channel name shown in the following
table.

PFI Signal Physical Channel Name

PFI 0 Dev1/port0/line0
PFI 1 Dev1/port0/line1
PFI 2 Dev1/port0/line2
PFI 3 Dev1/port0/line3
PFI 4 Dev1/port0/line4
PFI 5 Dev1/port0/line5
PFI 6 Dev1/port0/line6
PFI 7 Dev1/port0/line7
PFI 8 Dev1/port0/line8
PFI 9 Dev1/port0/line9
PFI 10 Dev1/port0/line10
PFI 11 Dev1/port0/line11
PFI 12 Dev1/port0/line12
PFI 13 Dev1/port0/line13
PFI 14 Dev1/port0/line14
PFI 15 Dev1/port0/line15
PFI 16 Dev1/port0/line16
PFI 17 Dev1/port0/line17
PFI 18 Dev1/port0/line18
PFI 19 Dev1/port0/line19

398 ni.com
 NI-DAQmx Device Considerations

PFI Signal Physical Channel Name

PFI 20 Dev1/port0/line20
PFI 21 Dev1/port0/line21
PFI 22 Dev1/port0/line22
PFI 23 Dev1/port0/line23
PFI 24 Dev1/port0/line24
PFI 25 Dev1/port0/line25
PFI 26 Dev1/port0/line26
PFI 27 Dev1/port0/line27
PFI 28 Dev1/port0/line28
PFI 29 Dev1/port0/line29
PFI 30 Dev1/port0/line30
PFI 31 Dev1/port0/line31
PFI 32 Dev1/port1/line1
PFI 33 Dev1/port1/line2
PFI 34 Dev1/port1/line3
PFI 35 Dev1/port1/line4
PFI 36 Dev1/port1/line5
PFI 37 Dev1/port1/line6
PFI 38 Dev1/port1/line7
PFI 39 Dev1/port1/line8

USB DAQ Physical Channels

Dev1 in physical channel names is the default device name for USB Series DAQ
devices. You can change these names in MAX.

Analog Input

The following table lists the number and naming of analog input physical channels for

© National Instruments 399

 NI-DAQmx Device Considerations

USB DAQ devices.

Number of
Device Naming
Channels
NI USB-9211A, NI USB-9215A, NI USB-9219, NI USB-9229, cDAQ1Mod1/ai0 to
4
NI USB-9234, NI USB-9237, NI USB-9239 cDAQ1Mod1/ai3
cDAQ1Mod1/ai0 to
NI USB-9201, NI USB-9221 8
cDAQ1Mod1/ai7
cDAQ1Mod1/ai0 to
NI USB-9213 16
cDAQ1Mod1/ai15

Strain and Wheatstone Bridge Measurements

The NI 9235, NI 9236, and NI 9237 support only the AI Strain Gage, AI Force Bridge, AI
Pressure Bridge, AI Torque Bridge, AI Bridge (V/V), and AI Custom Voltage With
Excitation channel types.

When using the NI USB-9219 or I USB-9237 with an AI Custom Voltage With Excitation
channel, you must set the AI.Excit.UseForScaling attribute/property to true. This
attribute/property causes the channel to return ratiometric data: Vin/Vex. The NI
USB-9219 and NI USB-9237 modules perform this division in hardware.

For the NI USB-9219, NI-DAQmx requires the AI.Excit.Val attribute/property to be set to

2.5 V for AI Strain Gage and AI Custom Voltage With Excitation channel types and to 500
µA for resistance and RTD measurements. The actual excitation voltage or current
output by the NI USB-9219 varies with the sensor resistance or the load being
measured.

NI USB-9219 and NI USB-9237 devices return a voltage ratio rather than a voltage.
Therefore, use the AI.Bridge.InitialRatio attribute/property to specify the initial voltage
ratio, or set the AI.Bridge.InitialVoltage attribute/property to the ratio Vin/Vex returned
by the device, multiplied by Vex.

The NI USB-9219 does not have quarter bridge completion circuitry, which affects AI
Strain Gage Quarter Bridge I channels and AI Custom Voltage With Excitation Quarter
Bridge channels (but not AI Strain Gage Quarter Bridge II channels). With these
channels, the NI USB-9219 performs a 2-wire resistance measurement on the active

400 ni.com
 NI-DAQmx Device Considerations

gage element, then NI-DAQmx uses software scaling to convert the resistance
measurement into a bridge ratio. For these channels, the polynomial coefficients
specified by the AI.DevScalingCoeff attribute/property convert unscaled data into
Ohms, not into V/V. Likewise, the AI.Rng.High/AI.Rng.Low attributes/properties should
be specified in units of Ohms, not V/V.

When the NI USB-9219 is in quarter bridge mode, you need to use the
AI.Bridge.NomResistance attribute/property to control whether the channel uses the
120 Ω range or the 350 Ω range.

Analog Output

The following table lists the number and naming of analog output physical channels
for USB DAQ devices.

Device Number of Channels Naming

NI USB-9263, NI USB-9265 4 cDAQ1Mod1/ao0 to cDAQ1Mod1/ao3
NI USB-9264 16 cDAQ1Mod1/ao0 to cDAQ1Mod1/ao15

When using the NI USB-9263, NI-USB 9264, or NI USB-9265, you can run only one type
of timing at a time. You can have one software-timed task per channel or one
hardware-timed task running on a device at one time, but you cannot have a
combination of timing on that device. For instance, you can run up to four software-
timed tasks on an the NI USB-9263 concurrently, but running one hardware-timed task
with one software-timed task generates an error. Additionally, the NI USB-9263, NI-USB
9264, and NI USB-9265 can run only one hardware-timed analog output task per
device at a given time.

X Series Physical Channels

In physical channel names, Dev1 is the default device name for X Series devices. You
can change these names in MAX.

Related reference:

• X Series Signal Connections for Counters

© National Instruments 401

 NI-DAQmx Device Considerations

Analog Input

Depending on your X Series device, you can have from eight to 208 analog input
channels. An 8-channel X Series device has physical channels ranging from Dev1/ai0
to Dev1/ai7, a 208-channel device from Dev1/ai0 to Dev1/ai207.

Use only the physical channel name of the positive channel (not both) when creating a
differential channel.

Analog Output

An X Series device that supports two analog outputs has analog output physical
channels named Dev1/ao0 and Dev1/ao1.

An X Series device that supports four analog outputs has analog output physical
channels named Dev1/ao0, Dev1/ao1, Dev1/ao2, and Dev1/ao3.

Digital Input and Output

All X Series devices have eight or 32 lines of digital input and output named Dev1/
port0/line0 through Dev1/port0/line7 or Dev1/port0/line0 through
Dev1/port0/line31. These lines belong to a single port, and the physical channel
Dev1/port0 refers to all eight or 32 lines at once. Port 0 can perform both hardware-
timed and static digital operations.

X Series devices have two more ports, port 1 and port 2. Port 1 has eight digital I/O
lines, Dev1/port1/line0 through Dev1/port1/line7. Port 2 has eight digital
I/O lines, Dev1/port2/line0 through Dev1/port2/line7. Port 1 and port 2 can
be used as static digital I/O lines or PFI lines, PFI 0..15. When any of PFI lines 0..15 is
used as a digital I/O signal, it uses the physical channel name shown in the following
table.

PFI Signal Physical Channel Name

PFI 0 Dev1/port1/line0
PFI 1 Dev1/port1/line1
PFI 2 Dev1/port1/line2

402 ni.com
 NI-DAQmx Device Considerations

PFI Signal Physical Channel Name

PFI 3 Dev1/port1/line3
PFI 4 Dev1/port1/line4
PFI 5 Dev1/port1/line5
PFI 6 Dev1/port1/line6
PFI 7 Dev1/port1/line7
PFI 8 Dev1/port2/line0
PFI 9 Dev1/port2/line1
PFI 10 Dev1/port2/line2
PFI 11 Dev1/port2/line3
PFI 12 Dev1/port2/line4
PFI 13 Dev1/port2/line5
PFI 14 Dev1/port2/line6
PFI 15 Dev1/port2/line7

Physical channel Dev1/port1 refers to all eight lines, Dev1/port1/line0:7, at

once. Physical channel Dev1/port2 refers to all eight lines, Dev1/port2/
line0:7, at once.

Counter Input and Output

All X Series devices have four counter/timers referred to by the physical channel names
Dev1/ctr0, Dev1/ctr1, Dev1/ctr2, and Dev1/ctr3. Unlike the other I/O
types, these physical channel names do not refer to terminals on the I/O connector but
instead to circuits within the device. There are five primary signals associated with
each counter: SOURCE, GATE, AUX, OUT, and sample clock. NI-DAQmx has default
terminals for these signals, except for the sample clock. For counter input tasks, if you
know whether your signal provides the SOURCE, AUX, or GATE function and wire your
signal to the default, you do not have to set the Input Terminal attribute/property.

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr0 PFI 8 PFI 9 PFI 10 PFI 12

© National Instruments 403

 NI-DAQmx Device Considerations

Counter SOURCE Default GATE Default AUX Default OUT Default

Dev1/ctr1 PFI 3 PFI 4 PFI 11 PFI 13
Dev1/ctr2 PFI 5 PFI 6 PFI 7 PFI 15
Dev1/ctr3 PFI 0 PFI 1 PFI 2 PFI 14

Internal Channels
On some devices, you can either acquire a signal present on the I/O connector or
acquire a signal that is being generated from the internal multiplexer (an internal
channel). The internal channels available on the multiplexer are typically used for
calibration purposes, but you can also sample them as you would a physical signal
present on the I/O connector. To read from one of these internal channels, you must
use the internal channel as the device's physical channel (for example,
Dev1/_aignd_vs_aignd) when creating the virtual channel.

Related concepts:

• Internal Channels for C Series Devices and TestScale Modules

• Internal Channels for DSA Devices
• Internal Channels for E Series Devices
• Internal Channels for FieldDAQ devices
• Internal Channels for M Series and NI 6010 Devices
• Internal Channels for NI ELVIS II Family
• Internal Channels for NI USB-TC01
• Internal Channels for the NI PXI-42xx
• Internal Channels for S Series Devices
• Internal Channels for SC Express Devices
• SCXI Internal Channels
• Internal Channels for USB DAQ Devices
• Internal Channels for X Series Multiplexed Sampling Devices
• Internal Channels for X Series Simultaneous Sampling Devices
• Internal Channels for C Series Devices

Internal Channels for C Series Devices and TestScale Modules

404 ni.com
 NI-DAQmx Device Considerations

Internal Channels for the NI 9210 Device

Internal
Description
Channel Name
A referenced single-ended terminal with the positive and negative terminals
_aignd_vs_aignd
both connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to the internal
_calref_vs_aignd calibration reference voltage and the negative terminal connected to the ground
reference for analog input.
A referenced single-ended terminal with the positive terminal connected to the
_cjtemp onboard temperature sensor and the negative terminal connected to the ground
reference for analog input. This channel is used for cold-junction compensation.

Internal Channels for the NI 9211 Device

Internal
Description
Channel Name
A differential terminal with the positive and negative terminals both connected
_aignd_vs_aignd
to the ground reference for analog input.
A differential terminal with the positive terminal connected to the internal
_calref_vs_aignd calibration reference voltage and the negative terminal connected to the ground
reference for analog input.
A differential terminal with the positive terminal connected to the onboard
_cjtemp temperature sensor and the negative terminal connected to the ground
reference for analog input. This channel is used for cold-junction compensation.

Internal Channels for the NI 9212 Device

Internal
Channel Description
Name
A differential terminal with the positive terminal connected to the onboard temperature
_cjtemp0 sensor and the negative terminal connected to the ground reference for analog input.
This channel is used for cold-junction compensation.
_cjtemp1 This channel is used for cold-junction compensation.

© National Instruments 405

 NI-DAQmx Device Considerations

Internal Channels for the NI 9213 Device

Internal
Description
Channel Name
A differential terminal with the positive and negative terminals both connected
_aignd_vs_aignd
to the ground reference for analog input.
A differential terminal with the positive terminal connected to the onboard
_cjtemp temperature sensor and the negative terminal connected to the ground
reference for analog input. This channel is used for cold-junction compensation.

Internal Channels for the NI 9214 Device

Internal
Description
Channel Name
A differential terminal with the positive and negative terminals both connected
_aignd_vs_aignd
to the ground reference for analog input.
A differential terminal with the positive terminal connected to the onboard
_cjtemp0 temperature sensor and the negative terminal connected to the ground
reference for analog input. This channel is used for cold-junction compensation.
_cjtemp1 This channel is used for cold-junction compensation.
_cjtemp2 This channel is used for cold-junction compensation.

Internal Channels for the NI 9204, NI 9205, NI 9206, and TS-15100 Devices

Internal Channel Name Description

A differential terminal with the positive and negative terminals both
_aignd_vs_aignd
connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_calref_vs_aignd internal calibration reference voltage and the negative terminal
connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_aignd_vs_aisense ground reference for analog input and the negative terminal
connected to physical channel AI SENSE.
A differential terminal with the positive terminal connected to the
_calSrcHi_vs_aignd
calibration PWM and the negative terminal connected to the ground

406 ni.com
 NI-DAQmx Device Considerations

Internal Channel Name Description

reference for analog input.
A differential terminal with the positive terminal connected to the
_calref_vs_calSrcHi internal calibration reference voltage and the negative terminal
connected to the calibration PWM.
A differential terminal with the positive and negative terminals
_calSrcHi_vs_calSrcHi
connected to the calibration PWM.
A differential terminal with the positive terminal connected to the
_aignd_vs_calSrcHi ground reference for analog input and the negative terminal
connected to the calibration PWM..
A differential terminal with the positive terminal connected to the
calibration PWM and the negative terminal connected to the ground
_calSrcMid_vs_aignd
reference for analog input. _calSrcMid is the divided down version
of _calSrcHi.
A differential terminal with the positive terminal connected to the
_boardTempSensor_vs_aignd onboard temperature sensor and the negative terminal connected
to the ground reference for analog input.
A differential terminal with the positive terminal connected to
_ai0_vs_calSrcHi physical channel ai0 and the negative terminal connected to the
calibration PWM.
A differential terminal with the positive terminal connected to
_ai8_vs_calSrcHi physical channel ai8 and the negative terminal connected to the
calibration PWM.

Internal Channels for the NI 9219 Device

Internal
Channel Description
Name
A differential terminal with the positive terminal connected to the onboard temperature
_cjtemp0 sensor and the negative terminal connected to the ground reference for analog input.
This channel is used for cold-junction compensation for analog input channel 0.
_cjtemp1 This channel is used for cold-junction compensation for analog input channel 1.
_cjtemp2 This channel is used for cold-junction compensation for analog input channel 2.
_cjtemp3 This channel is used for cold-junction compensation for analog input channel 3.

© National Instruments 407

 NI-DAQmx Device Considerations

Internal Channels for the CompactDAQ and CompactRIO Systems*

Internal
Channel Description
Name
This physical channel name does not refer to a terminal on the I/O connector but instead
to a circuit within the device. You must set the Input Terminal or Output Terminal
_ctr0
attributes/properties that are appropriate for the measurement/generation being
performed.
This physical channel name does not refer to a terminal on the I/O connector but instead
to a circuit within the device. You must set the Input Terminal or Output Terminal
_ctr1
attributes/properties that are appropriate for the measurement/generation being
performed.
This physical channel name does not refer to a terminal on the I/O connector but instead
to a circuit within the device. You must set the Input Terminal or Output Terminal
_ctr2
attributes/properties that are appropriate for the measurement/generation being
performed.
This physical channel name does not refer to a terminal on the I/O connector but instead
to a circuit within the device. You must set the Input Terminal or Output Terminal
_ctr3
attributes/properties that are appropriate for the measurement/generation being
performed.
This physical channel name does not refer to a terminal on the I/O connector but instead
_freqout to a circuit within the device. You must set the Output Terminal attribute/property that is
appropriate for the generation being performed.

* CompactDAQ chassis, TestScale chassis, CompactDAQ controller, CompactRIO

controllers and CompactRIO Single-Board controllers:

• cDAQ-9132, 9133, 9134, 9135, 9136, 9137, 9171, 9174, 9178, 9179, 9181, 9184, 9185,
9188, 9188XT, 9189, and 9191
• cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056,
9057, and 9058
• TS-15000 and TS-15010
• sbRIO-9603, 9608, 9609, 9628, 9629, and 9638

Internal Channels for DSA Devices

On a DSA device, you can either acquire a signal present on the I/O connector, or you

408 ni.com
 NI-DAQmx Device Considerations

can acquire a signal that is generated from the internal calibration multiplexer. The
channels available on this multiplexer are typically used for calibration purposes, but
you can also sample them as you would a physical signal present on the I/O connector.
To read from one of these internal channels, you must use one of the device's AI
physical channels (for instance, Dev1/ai0) when creating the channel to select which
ADC to use, then set the appropriate string value on the Input Source channel
attribute/property.

The following table lists internal channels for DSA devices.

Internal Channel Supported

Description
Name Devices
All DSA The source of the AI channel is the device input connector, or
_external_channel
devices an accessory connected to the device connector.
4461/
The source of the AI channel is the onboard reference signal
_5Vref_vs_aignd 4462/
(for example, +5V).
4464, 447x
The source of the AI channel is the onboard reference signal
_pos10V_vs_aignd 4464
(for example, +10V).
The source of the AI channel is the onboard reference signal
_neg10V_vs_aignd 4464
(for example, -10V).
The source of the AI channel is the onboard reference signal
_pos1V_vs_aignd 4464
(for example, +1V).
The source of the AI channel is the onboard reference signal
_pos316mV_vs_aignd 4464
(for example, +316mV).
The source of the AI channel is the onboard reference signal
_aignd_vs_pos10V 4464 (for example, +10V). The negative terminal is connected to the
ground reference for analog input.
The source of the AI channel is the onboard reference signal
_aignd_vs_neg10V 4464 (for example, -10V). The negative terminal is connected to the
ground reference for analog input.

_ao0_vs_ao0neg [1] 4461 only

The source of the AI channel is the onboard analog output
37 channel 0.

The source of the AI channel is the onboard analog output

_ao1_vs_ao1neg [1] 4461 only
channel 1.
37. The AO internal channels are valid only for devices with AO physical channels.

© National Instruments 409

 NI-DAQmx Device Considerations

Internal Channel Supported

Description
Name Devices
4461/
4462/
_aignd_vs_aignd The source of the AI channel is the onboard ground signal.
4464,
447x, 449x
The source of the AI channel is the onboard reference square
_ref_sqwv_vs_aignd 449x
wave signal.

For all DSA devices, only one internal channel can be read at a time, although the same
internal channel can be read on multiple physical channels (with additional
restrictions for NI 447x devices). For example, you cannot simultaneously read the
internal 5 V reference on one physical channel and the analog ground on another
physical channel.

The NI 447x AI physical channels are grouped into pairs, for instance {ai0, ai1}, {ai2,
ai3}, and so on. NI 447x devices cannot read an internal channel on more than one
physical channel group, and when reading an internal channel, both physical channels
in the group are connected to the internal channel source. For example, if the Input
Source for channel ai0 is set to 5Vref_vs_aignd and the Input Source for channel ai1 is
left at the default value of _external_channel, ai1 still reads the internal channel
5Vref_vs_aignd since ai0 and ai1 are in the same physical channel group.

Internal Channels for E Series Devices

The following table is a list of internal physical channels for all E Series devices.
Different E Series devices have different subsets of channels. These channels are
typically for self-calibration, and you can sample them as you would a physical
channel present on the I/O connector.

Internal Channel Name Description

A differential terminal with the positive and negative terminals
_aognd_vs_aognd
both connected to the ground reference for analog output.
A differential terminal with the positive terminal connected to the
_aognd_vs_aignd ground reference for analog output and the negative terminal
connected to the ground reference for analog input.

410 ni.com
 NI-DAQmx Device Considerations

Internal Channel Name Description

A differential terminal with the positive terminal connected to
_ao0_vs_aognd physical channel ao0 and the negative terminal connected to the
ground reference for analog output.
A differential terminal with the positive terminal connected to
_ao1_vs_aognd physical channel ao1 and the negative terminal connected to the
ground reference for analog output.
A differential terminal with the positive terminal connected to the
_calref_vs_calref onboard 5 V reference and the negative terminal connected to the
onboard 5 V reference.
A differential terminal with the positive terminal connected to the
_calref_vs_aignd onboard 5 V reference and the negative terminal connected to the
ground reference for analog input.
A differential terminal with the positive terminal connected to
_ao0_vs_calref physical channel ao0 and the negative terminal connected to the
onboard 5 V reference.
A differential terminal with the positive terminal connected to
_ao1_vs_calref physical channel ao1 and the negative terminal connected to the
onboard 5 V reference.
A differential terminal with the positive terminal connected to
_ao1_vs_ao0 physical channel ao1 and the negative terminal connected to
physical channel ao0.
A differential terminal with the positive terminal connected to the
_boardTempSensor_vs_aignd onboard temperature sensor and the negative terminal connected
to the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_aignd_vs_aignd ground reference for analog input and the negative terminal
connected the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_caldac_vs_aignd onboard calibration DAC and the negative terminal connected to
the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_caldac_vs_calref onboard calibration DAC and the negative terminal connected to
the onboard 5 V reference.
A terminal where a signal being conditioned by a SCXI module is
_PXI_SCXIbackplane_vs_aignd
measured across the PXI/SCXI backplane and not the I/O

© National Instruments 411

 NI-DAQmx Device Considerations

Internal Channel Name Description

connector. Reading from this channel is valid only on PXI devices
inserted in the rightmost PXI slot of a PXI/SCXI combination
chassis.

Internal Channels for FieldDAQ devices

Internal channels for the FD-11613

The following internal channels are available.

Internal Channel Name Description

FD11613-xxxxxxx-Bank1/_cjtemp0 This channel is used for cold-junction compensation.
FD11613-xxxxxxx-Bank1/_cjtemp1 This channel is used for cold-junction compensation.

Internal channels for the FD-11614

The following internal channels are available.

Internal Channel Name Description

FD11614-xxxxxxx-Bank1/_cjtemp0 This channel is used for cold-junction compensation.
FD11614-xxxxxxx-Bank1/_cjtemp1 This channel is used for cold-junction compensation.
FD11614-xxxxxxx-Bank2/_cjtemp0 This channel is used for cold-junction compensation.
FD11614-xxxxxxx-Bank2/_cjtemp1 This channel is used for cold-junction compensation.

Internal Channels for M Series and NI 6010 Devices

Internal Channel Name Description

A differential terminal with the positive and negative terminals
_aignd_vs_aignd
both connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to
_ao0_vs_aognd physical channel ao0 and the negative terminal connected to the
ground reference for analog output.

412 ni.com
 NI-DAQmx Device Considerations

Internal Channel Name Description

A differential terminal with the positive terminal connected to
_ao1_vs_aognd physical channel ao1 and the negative terminal connected to the
ground reference for analog output.
(For M Series devices only.) A differential terminal with the positive
_ao2_vs_aognd terminal connected to physical channel ao2 and the negative
terminal connected to the ground reference for analog output.
(For M Series devices only.) A differential terminal with the positive
_ao3_vs_aognd terminal connected to physical channel ao3 and the negative
terminal connected to the ground reference for analog output.
A differential terminal with the positive terminal connected to the
_calref_vs_aignd internal calibration reference voltage and the negative terminal
connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_aignd_vs_aisense ground reference for analog input and the negative terminal
connected to physical channel AI SENSE.
A differential terminal with the positive terminal connected to the
_aignd_vs_aisense2 ground reference for analog input and the negative terminal
connected to physical channel AI SENSE2.
A differential terminal with the positive terminal connected to the
_calSrcHi_vs_aignd calibration PWM and the negative terminal connected to the
ground reference for analog input.
A differential terminal with the positive terminal connected to the
_calref_vs_calSrcHi internal calibration reference voltage and the negative terminal
connected to the calibration PWM.
A differential terminal with the positive and negative terminals
_calSrcHi_vs_calSrcHi
connected to the calibration PWM.
A differential terminal with the positive terminal connected to the
_aignd_vs_calSrcHi ground reference for analog input and the negative terminal
connected to the calibration PWM.
A differential terminal with the positive terminal connected to the
calibration PWM and the negative terminal connected to the
_calSrcMid_vs_aignd
ground reference for analog input. _calSrcMid is the divided down
version of _calSrcHi.
A differential terminal with the positive terminal connected to the
_calSrcLo_vs_aignd
calibration PWM and the negative terminal connected to the

© National Instruments 413

 NI-DAQmx Device Considerations

Internal Channel Name Description

ground reference for analog input. _calSrcLo is the divided down
version of _calSrcHi.
A differential terminal with the positive terminal connected to
_ai0_vs_calSrcHi physical channel ai0 and the negative terminal connected to the
calibration PWM.
A differential terminal with the positive terminal connected to
_ai8_vs_calSrcHi physical channel ai8 and the negative terminal connected to the
calibration PWM.
A differential terminal with the positive terminal connected to the
_boardTempSensor_vs_aignd onboard temperature sensor and the negative terminal connected
to the ground reference for analog input..
A terminal where a signal being conditioned by a SCXI module is
measured across the PXI/SCXI backplane and not the I/O
_PXI_SCXIbackplane_vs_aignd connector. Reading from this channel is valid only on PXI devices
inserted in the rightmost PXI slot of a PXI/SCXI combination
chassis.

Internal Channels for NI ELVIS II Family

Internal Channel Name Description

A differential terminal with the positive and negative terminals both
_aignd_vs_aignd
connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to
_ao0_vs_aognd physical channel ao0 and the negative terminal connected to the
ground reference for analog output.
A differential terminal with the positive terminal connected to
_ao1_vs_aognd physical channel ao1 and the negative terminal connected to the
ground reference for analog output.
A differential terminal with the positive terminal connected to the
_calref_vs_aignd internal calibration reference voltage and the negative terminal
connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_aignd_vs_aisense ground reference for analog input and the negative terminal
connected to physical channel AI SENSE.
_aignd_vs_aisense2 A differential terminal with the positive terminal connected to the

414 ni.com
 NI-DAQmx Device Considerations

Internal Channel Name Description

ground reference for analog input and the negative terminal
connected to physical channel AI SENSE2.
A differential terminal with the positive terminal connected to the
_calSrcHi_vs_aignd calibration PWM and the negative terminal connected to the ground
reference for analog input.
A differential terminal with the positive terminal connected to the
_calref_vs_calSrcHi internal calibration reference voltage and the negative terminal
connected to the calibration PWM.
A differential terminal with the positive and negative terminals
_calSrcHi_vs_calSrcHi
connected to the calibration PWM.
A differential terminal with the positive terminal connected to the
_aignd_vs_calSrcHi ground reference for analog input and the negative terminal
connected to the calibration PWM.
A differential terminal with the positive terminal connected to the
calibration PWM and the negative terminal connected to the ground
_calSrcMid_vs_aignd
reference for analog input. _calSrcMid is the divided down version
of _calSrcHi.
A differential terminal with the positive terminal connected to the
calibration PWM and the negative terminal connected to the ground
_calSrcLo_vs_aignd
reference for analog input. _calSrcLo is the divided down version of
_calSrcHi.
A differential terminal with the positive terminal connected to
_ai0_vs_calSrcHi physical channel ai0 and the negative terminal connected to the
calibration PWM.
A differential terminal with the positive terminal connected to
_ai8_vs_calSrcHi physical channel ai8 and the negative terminal connected to the
calibration PWM.
A differential terminal with the positive terminal connected to the
_boardTempSensor_vs_aignd onboard temperature sensor and the negative terminal connected
to the ground reference for analog input..
A differential or RSE terminal used to access internally connected AI
_ai16:31
terminals.
A differential terminal connected to the shunt resistor on the
_vpsPosCurrent
variable power supply.
_vpsNegCurrent A differential terminal connected to the shunt resistor on the

© National Instruments 415

 NI-DAQmx Device Considerations

Internal Channel Name Description

variable power supply.
A differential terminal connected to a voltage divider on the
_vpsPos_vs_gnd
variable power supply.
A differential terminal connected to a voltage divider on the
_vpsNeg_vs_gnd
variable power supply.
_dutNeg Reads the voltage equivalent of Current into the DUT- pin.
_base Reads the voltage at the base pin (base voltage for 3-wire analyzer).
_dutPos Reads the voltage at the DUT+ pin.
Internally routes the function generator to the impedance analyzer
_fgenImpedance
circuit.
Internally routes AO 0 to the impedance analyzer for Three-Wire
_ao0Impedance
Current-Voltage Analyzer measurements.

Internal Channels for the NI PXI-42xx

The following table is a list of internal physical channels for the PXI-42xx devices. The
subset of channels present on your device depends on the specific E Series device
being used. These channels are typically for self-calibration, and you can sample them
as you would a physical channel present on the I/O connector

Internal Channel Name Description

A cold-junction compensation channel for measuring the
_cjTemp temperature at the I/O connector when making thermocouple
measurements.
A differential terminal with the positive terminal connected to the
_aignd_vs_aignd ground reference for analog input and the negative terminal
connected the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_caldac_vs_aignd onboard calibration DAC and the negative terminal connected to
the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_calref_vs_aignd onboard 5 V reference and the negative terminal connected to the
ground reference for analog input.

416 ni.com
 NI-DAQmx Device Considerations

Internal Channel Name Description

A differential terminal with the positive terminal connected to the
_boardTempSensor_vs_aignd onboard temperature sensor and the negative terminal connected
to the ground reference for analog input.
A terminal where a signal being conditioned by a SCXI module is
measured across the PXI/SCXI backplane and not the I/O connector.
PXI_SCXIbackplane_vs_aignd
Reading from this channel is valid only on PXI devices inserted in
the rightmost PXI slot of a PXI/SCXI combination chassis.
A differential terminal with the positive terminal connected to the
_extcal_vs_aignd external calibration input and the negative terminal connected to
the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_pod_calrefPos_vs_aignd internal positive reference voltage and the negative terminal
connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_pod_calrefNeg_vs_aignd internal negative reference voltage and the negative terminal
connected to the ground reference for analog input.

Internal Channels for NI USB-TC01

Internal
Channel Description
Name
A differential terminal with the positive terminal connected to the onboard temperature
_cjtemp sensor and the negative terminal connected to the ground reference for analog input.
This channel is used for cold-junction compensation.

Internal Channels for S Series Devices

On an S Series device, you can either acquire a signal present on the I/O connector, or
you can acquire a signal that is being generated from the internal calibration
multiplexer. The channels available on this multiplexer are typically used for
calibration purposes, but you can also sample them as you would a physical signal
present on the I/O connector. To read from one of these internal channels, you must
use one of the device's AI physical channels ( Dev1/ai0 through Dev1/ai7) when
creating the virtual channel. The physical channel specifies the ADC for the internal

© National Instruments 417

 NI-DAQmx Device Considerations

channel. You can then set the appropriate string value on the Input Source channel
attribute/property.

Note All S Series devices must have the same Input Source setting on all
channels. The NI PCI-6110 and NI PCI-6111 devices cannot acquire from more
than one ADC at a time when using an internal channel.

• NI PCI-6110, NI PCI-6111, NI 6115, NI 6120 Internal Channels

◦ _external_channel
◦ _aognd_vs_aognd
◦ _aognd_vs_aignd
◦ _ao0_vs_aognd
◦ _ao1_vs_aognd
◦ _calref_vs_calref
◦ _calref_vs_aignd
◦ _ao0_vs_calref
◦ _ao1_vs_calref
• NI PCI-6143 Internal Channels
◦ _external_channel
◦ _aignd_vs_aignd
◦ _calref_vs_aignd
◦ _calSrcHi_vs_aignd
◦ _calref_vs_calSrcHi
◦ _calSrcHi_vs_calSrcHi
◦ _aignd_vs_calSrcHi
• NI PXI-6132/6133 Internal Channels
◦ _external_channel
◦ _aignd_vs_aignd
◦ _calref_vs_aignd
◦ _calSrcMid_vs_aignd
◦ _calSrcHi_vs_aignd
◦ _calref_vs_calSrcHi
◦ _calSrcMid_vs_calSrcHi
◦ _calSrcHi_vs_calSrcHi
◦ _aignd_vs_calSrcHi
• NI PCI-6154 Internal Channels

418 ni.com
 NI-DAQmx Device Considerations

◦ _external_channel
◦ _aignd_vs_aignd
◦ _calref_vs_aignd
◦ _calSrcHi_vs_aignd
◦ _aignd_vs_calSrcHi
◦ _calref_vs_calSrcHi
◦ _calSrcHi_vs_calSrcHi
◦ _aox_vs_aognd

The following table describes all S Series internal channels.

Internal Channel
Description
Name
The differential terminal on the I/O connector that is typically used for
_external_channel
acquiring data.
A differential terminal with the positive and negative terminals both
_aignd_vs_aignd
connected to the ground reference for analog input.
A differential terminal with the positive and negative terminals both
_aognd_vs_aognd
connected to the ground reference for analog output.
A differential terminal with the positive terminal connected to the ground
_aognd_vs_aignd reference for analog output and the negative terminal connected to the
ground reference for analog input.
A differential terminal with the positive terminal connected to the analog
_aox_vs_aognd output physical channel, such as ao0, and the negative terminal
connected to the ground reference for analog output.
A differential terminal with the positive terminal connected to physical
_ao1_vs_aognd channel ao1 and the negative terminal connected to the ground reference
for analog output.
A differential terminal with the positive terminal connected to the internal
_calref_vs_calref calibration reference voltage and the negative terminal connected to the
internal calibration reference voltage.
A differential terminal with the positive terminal connected to the internal
_calref_vs_aignd calibration reference voltage and the negative terminal connected to the
ground reference for analog input.
A differential terminal with the positive terminal connected to physical
_ao0_vs_calref
channel ao0 and the negative terminal connected to the internal

© National Instruments 419

 NI-DAQmx Device Considerations

Internal Channel
Description
Name
calibration reference voltage.
A differential terminal with the positive terminal connected to physical
_ao1_vs_calref channel ao1 and the negative terminal connected to the internal
calibration reference voltage.
A differential terminal with the positive terminal connected to the
_calSrcHi_vs_aignd calibration PWM and the negative terminal connected to the ground
reference for analog input.
A differential terminal with the positive terminal connected to the internal
_calref_vs_calSrcHi calibration reference voltage and the negative terminal connected to the
calibration PWM.
A differential terminal with the positive and negative terminals connected
_calSrcHi_vs_calSrcHi
to the calibration PWM.
A differential terminal with the positive terminal connected to the ground
_aignd_vs_calSrcHi reference for analog input and the negative terminal connected to the
calibration PWM.
A differential terminal with the positive terminal connected to the
calibration PWM and the negative terminal connected to the ground
_calSrcMid_vs_aignd
reference for analog input. _calSrcMid is the divided down version of
_calSrcHi.
A differential terminal with the positive and negative terminals connected
_calSrcMid_vs_calSrcHi to the calibration PWM. _calSrcMid is the divided down version of
_calSrcHi.

Internal Channels for SC Express Devices

On an NI 4300 or NI 433x device, you can either acquire a signal present on the I/O
connector, or you can acquire an onboard signal, via an internal multiplexer. The
channels available on this multiplexer are typically used for calibration purposes, but
you can also sample them as you would a physical signal present on the I/O connector.
To read from one of these internal channels, you must use one of the device's AI
physical channels (Dev1/ai0 through Dev1/ai7) when creating the virtual channel. The
physical channel specifies the ADC for the internal channel. You can then set the
appropriate string value on the Input Source channel attribute/property.

420 ni.com
 NI-DAQmx Device Considerations

On the NI 4353, you can acquire internal channels by specifying their names for the
physical channels input of the DAQmx Create Channel VI/function.

Internal Channels for the NI 4302 and 4303

Input Source Description

The temperature read by a digital temperature
_cjtemp sensor located on the TB-4302 accessory. This
channel is used for cold-junction compensation.

Input Sources for the NI 4300 and 4310

Input Source Description

The source of the AI channel is the device input connector, or an accessory
_external_channel
connected to the device connector.
_aignd_vs_aignd The source of the AI channel is the onboard ground signal.
_calref_vs_aignd The source of the AI channel is the onboard reference signal.
The source of the AI channel has the positive terminal connected to the
_calSrcHi_vs_aignd onboard calibration PWM and the negative terminal connected to the onboard
ground reference.
The source of the AI channel has the positive terminal connected to the
_aignd_vs_calSrcHi onboard ground reference and the negative terminal connected to the
onboard calibration PWM.
The source of the AI channel has the positive terminal connected to the
_calref_vs_calSrcHi onboard reference signal and the negative terminal connected to the onboard
calibration PWM.
The source of the AI channel has the positive terminal connected to the
_aipos_vs_calSrcHi positive terminal of the device input connector and the negative terminal
connected to the onboard calibration PWM.
The source of the AI channel has the positive terminal connected to the
_aineg_vs_calSrcHi negative terminal of the device input connector and the negative terminal
connected to the onboard calibration PWM.

Internal Channels for the NI 4309

On the NI 4309, you can acquire internal channels by specifying their names for the

© National Instruments 421

 NI-DAQmx Device Considerations

physical channels input of the DAQmx Create Channel VI/function.

Input Source Description

A differential terminal with the positive and negative terminals both
_aignd_vs_aignd<0..7> connected to the ground reference; using the specified ADC <0..7>. This
channel is used to measure the autozero offset of individual ADCs.
A differential terminal with the positive terminal connected to the
calibration PWM and the negative terminal connected to the ground
_calSrcLo_vs_aignd<0..7>
reference; using the specified ADC <0..7>. _calSrcLo is the divided down
version of _calSrcHi.
A differential terminal with the positive terminal connected to the
_7VRef_vs_aignd<0..7> onboard 7V reference signal and the negative terminal connected to the
ground reference; using the specified ADC <0..7>.
A differential terminal with the positive terminal connected to the
_calSrcHi_vs_aignd<0..7> onboard calibration PWM and the negative terminal connected to the
ground reference; using the specified ADC <0..7>.

Input Sources for the NI 4330 and 4331

Input Source Description

The source of the AI channel is the device input connector, or an accessory
_external_channel
connected to the device connector.
_aignd_vs_aignd The source of the AI channel is the onboard ground signal.

Input Sources for the NI 4339

Input Source Description

The source of the AI channel is the device input connector, or an
_external_channel
accessory connected to the device connector.
The source of the AI channel is the paired channel's internal
_paired_channel_excitation excitation. The channel pairs are ai0 and ai1, ai2 and ai3, ai4 and ai5,
ai6 and ai7.
_aignd_vs_aignd The source of the AI channel is the onboard signal ground.

422 ni.com
 NI-DAQmx Device Considerations

Internal Channels for the NI 4353

On the NI 4353, you can acquire internal channels by specifying their names for the
physical channels input of the DAQmx Create Channel VI/function.

Input Source Description

A differential terminal with the positive and negative terminals connected to a
_cjtemp0 through temperature sensor located on the accessory. These channels are used for cold-
_cjtemp7 junction compensation. The mapping between analog input channels and cold-
junction compensation channels depends on the type of installed accessory.
A differential terminal with the positive and negative terminals both connected
to the ground reference, using the ADC that is used for even-numbered
_aignd_vs_aignd0
channels (ai0, ai2, ai4, and so on). This channel is used to measure the autozero
offset of even-numbered channels.
A differential terminal with the positive and negative terminals both connected
to the ground reference, using the ADC that is used for odd-numbered channels
_aignd_vs_aignd1
(ai1, ai3, ai5, and so on). This channel is used to measure the autozero offset of
odd-numbered channels.

SCXI Internal Channels

Some SCXI modules also have internal channels. These are physical channels that are
not accessible from an I/O connector. To measure the signals present at these internal
physical channels, use them to create virtual channels. The SCXI-1100, SCXI-1102,
SCXI-1120, SCXI-1121, SCXI-1122, and SCXI-1125 modules have an internal physical
channel called _cjTemp channel. It is the cold-junction compensation channel for
measuring the temperature at the connector for thermocouples.

The SCXI-1112 has internal channels _cjTemp0, _cjTemp1, _cjTemp2, _cjTemp3,

_cjTemp4, _cjTemp5, _cjTemp6, and _cjTemp7. These are the cold-junction
compensation channels for each analog input channel on the SCXI-1112.

The SCXI-1520 has eight pairs of internal channels _pPos0 and _pNeg0 through _pPos7
and _pNeg7. These channels read back the excitation on the corresponding analog
input channel. The pPos half of the pair is the positive side of the excitation, and the
pNeg half is the negative side of the excitation. The real excitation value is the pPos
value minus the pNeg value.

© National Instruments 423

 NI-DAQmx Device Considerations

The SCXI-1521/B has 24 voltage excitation internal channels _Vex0 through _Vex23.
These channels read back the excitation on the corresponding analog input channel.
In addition, the SCXI-1521/B has 24 pairs of internal channels _IexPos0 and _IexNeg0
through _IexPos23 and _IexNeg23. The current through a sensor connected to channel
x is the _IexPosx value minus the _IexNegx value.

Internal Channels for USB DAQ Devices

The following table lists the internal channel for the USB-9211 device.

Internal
Channel Description
Name
A differential terminal with the positive terminal connected to the onboard temperature
_cjtemp sensor and the negative terminal connected to the ground reference for analog input.
This channel is used for cold-junction compensation.

The following table lists the internal channels for the USB-9219 device.

Internal
Channel Description
Name
A differential terminal with the positive terminal connected to the onboard temperature
_cjtemp0 sensor and the negative terminal connected to the ground reference for analog input.
This channel is used for cold-junction compensation for analog input channel 0.
_cjtemp1 This channel is used for cold-junction compensation for analog input channel 1.
_cjtemp2 This channel is used for cold-junction compensation for analog input channel 2.
_cjtemp3 This channel is used for cold-junction compensation for analog input channel 3.

Internal Channels for X Series Multiplexed Sampling Devices

On an X Series device, you can either acquire a signal present on the I/O connector, or
you can acquire a signal that is being generated from the internal calibration
multiplexer. The channels available on this multiplexer are typically used for
calibration purposes, but you can also sample them as you would a physical signal

424 ni.com
 NI-DAQmx Device Considerations

present on the I/O connector. To read from one of these internal channels on a X Series
multiplexed sampling device, you must use the internal channel as the device's
physical channel (for example, Dev1/_aignd_vs_aignd) when creating the virtual
channel.

The following table describes all internal channels for X Series multiplexed sampling
devices.

Internal Channel Name Description

A single-ended terminal with the positive and negative terminals
_aignd_vs_aignd
both connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to
_ao0_vs_aognd physical channel ao0 and the negative terminal connected to the
ground reference for analog output.
A differential terminal with the positive terminal connected to
_ao1_vs_aognd physical channel ao1 and the negative terminal connected to the
ground reference for analog output.
A differential terminal with the positive terminal connected to
_ao2_vs_aognd physical channel ao2 and the negative terminal connected to the
ground reference for analog output.
A differential terminal with the positive terminal connected to
_ao3_vs_aognd physical channel ao3 and the negative terminal connected to the
ground reference for analog output.
A single-ended terminal with the positive terminal connected to the
_calref_vs_aignd internal calibration reference voltage and the negative terminal
connected to the ground reference for analog input.
A differential terminal with the positive terminal connected to the
_aignd_vs_aisense ground reference for analog input and the negative terminal
connected to physical channel AI SENSE.
A differential terminal with the positive terminal connected to the
_aignd_vs_aisense2 ground reference for analog input and the negative terminal
connected to physical channel AI SENSE2.
A differential terminal with the positive terminal connected to the
_aignd_vs_aisense3 ground reference for analog input and the negative terminal
connected to physical channel AI SENSE3.
_aignd_vs_aisense4 A differential terminal with the positive terminal connected to the

© National Instruments 425

 NI-DAQmx Device Considerations

Internal Channel Name Description

ground reference for analog input and the negative terminal
connected to physical channel AI SENSE4.
A single-ended terminal with the positive terminal connected to the
_calSrcHi_vs_aignd calibration PWM and the negative terminal connected to the ground
reference for analog input.
A differential terminal with the positive terminal connected to the
_calref_vs_calSrcHi internal calibration reference voltage and the negative terminal
connected to the calibration PWM.
A differential terminal with the positive and negative terminals
_calSrcHi_vs_calSrcHi
connected to the calibration PWM.
A differential terminal with the positive terminal connected to the
_aignd_vs_calSrcHi ground reference for analog input and the negative terminal
connected to the calibration PWM.
A single-ended terminal with the positive terminal connected to the
calibration PWM and the negative terminal connected to the ground
_calSrcMid_vs_aignd
reference for analog input. _calSrcMid is the divided down version
of _calSrcHi.
A single-ended terminal with the positive terminal connected to the
calibration PWM and the negative terminal connected to the ground
_calSrcLo_vs_aignd
reference for analog input. _calSrcLo is the divided down version of
_calSrcHi.
A differential terminal with the positive terminal connected to
_ai0_vs_calSrcHi physical channel ai0 and the negative terminal connected to the
calibration PWM.
A differential terminal with the positive terminal connected to
_ai8_vs_calSrcHi physical channel ai8 and the negative terminal connected to the
calibration PWM.
A single-ended terminal with the positive terminal connected to the
_boardTempSensor_vs_aignd onboard temperature sensor and the negative terminal connected
to the ground reference for analog input.

Related concepts:

• X Series Device Groupings

426 ni.com
 NI-DAQmx Device Considerations

Internal Channels for X Series Simultaneous Sampling Devices

On an X Series device, you can either acquire a signal present on the I/O connector, or
you can acquire a signal that is being generated from the internal calibration
multiplexer. The channels available on this multiplexer are typically used for
calibration purposes, but you can also sample them as you would a physical signal
present on the I/O connector. To read from one of these internal channels on a X Series
simultaneous sampling device, you must use one of the device's AI physical channels
(for example, Dev1/ai0) when creating the virtual channel. The physical channel
specifies the ADC for the internal channel. You can then set the appropriate string
value on the Input Source channel attribute/property.

Note All X Series simultaneous sampling devices must have the same Input
Source setting on all channels.

Internal Channel
Description
Name
The differential terminal on the I/O connector that is typically used for
_external_channel
acquiring data.
A differential terminal with the positive terminal connected to physical
_ai0_vs_calSrcHi
channel ao0 and the negative terminal connected to the calibration PWM.
A differential terminal with the positive terminal connected to physical
_ai1_vs_calSrcHi
channel ao1 and the negative terminal connected to the calibration PWM
A differential terminal with the positive terminal connected to physical
_ai0_vs_aignd channel ai0 and the negative terminal connected to the ground reference
for analog input
A differential terminal with the positive terminal connected to the
_ai8_vs_aignd negative terminal of ai0 and the negative terminal connected to the
ground reference for analog input.
A differential terminal with the positive terminal connected to the
_ai8_vs_calSrcHi negative terminal of ai0 and the negative terminal connected to the
calibration PWM.
A single-ended terminal with the positive and negative terminals both
_aignd_vs_aignd
connected to the ground reference for analog input.
_aignd_vs_calSrcHi A differential terminal with the positive terminal connected to the ground

© National Instruments 427

 NI-DAQmx Device Considerations

Internal Channel
Description
Name
reference for analog input and the negative terminal connected to the
calibration PWM.
A differential terminal with the positive terminal connected to physical
_ao0_vs_aognd channel ao0 and the negative terminal connected to the ground reference
for analog output.
A differential terminal with the positive terminal connected to physical
_ao0_vs_calSrcHi
channel ao0 and the negative terminal connected to the calibration PWM.
A differential terminal with the positive terminal connected to physical
_ao1_vs_aognd channel ao1 and the negative terminal connected to the ground reference
for analog output.
A differential terminal with the positive terminal connected to physical
_ao1_vs_calSrcHi
channel ao1 and the negative terminal connected to the calibration PWM.
A differential terminal with the positive terminal connected to physical
_ao2_vs_aognd channel ao2 and the negative terminal connected to the ground reference
for analog output.
A differential terminal with the positive terminal connected to physical
_ao3_vs_aognd channel ao3 and the negative terminal connected to the ground reference
for analog output.
A single-ended terminal with the positive terminal connected to the
_calref_vs_aignd internal calibration reference voltage and the negative terminal
connected to the ground reference for analog input.
A single-ended terminal with the positive terminal connected to the
_calSrcHi_vs_aignd calibration PWM and the negative terminal connected to the ground
reference for analog input.
A differential terminal with the positive and negative terminals connected
_calSrcHi_vs_calSrcHi
to the calibration PWM.
A differential terminal with the positive terminal connected to the internal
_calref_vs_calSrcHi calibration reference voltage and the negative terminal connected to the
calibration PWM.
A single-ended terminal with the positive terminal connected to the
calibration PWM and the negative terminal connected to the ground
_calSrcMid_vs_aignd
reference for analog input. _calSrcMid is the divided down version of
_calSrcHi.
_calSrcMid_vs_calSrcHi A differential terminal with the positive and negative terminals connected

428 ni.com
 NI-DAQmx Device Considerations

Internal Channel
Description
Name
to the calibration PWM. _calSrcMid is the divided down version of _
calSrcHi .
A differential terminal with the positive terminal connected to the
_calSrcHi_vs_ai0 calibration PWM and the negative terminal connected to physical channel
ai0.
A differential terminal with the positive terminal connected to the
_calSrcHi_vs_ai8 calibration PWM and the negative terminal connected to physical channel
ai8.

Related concepts:

• X Series Device Groupings

Default Input/Output Terminal Configurations

If you do not explicitly specify the input or output terminal configuration when you
create a channel, NI-DAQmx automatically determines the default terminal
configuration at run time. The following table lists the default terminal configurations
for devices.

Default
Output
Device Default Input Terminal Configuration
Terminal
Configuration
Referenced
AO Series N/A
single-ended
DSA Pseudodifferential Differential
For devices with eight channels:
differential for the first four channels,
NI 60xx (E Series), NI 62xx (M Series), NI referenced single-ended for the next
63xx (X Series), NI ELVIS II, NI PCI-6010, NI four channels. For devices with 16 Referenced
USB-6001, NI USB-6002, NI USB-6003, NI channels or more: differential for eight single-ended
USB-6008, NI USB-6009, and NI TC01 channels followed by referenced single-
ended for eight channels. For instance,
channels 0-7, 16-23, and 32-39 are

© National Instruments 429

 NI-DAQmx Device Considerations

Default
Output
Device Default Input Terminal Configuration
Terminal
Configuration
differential. Channels 8-15, 24-31, and
40-47 are referenced-single ended.
Differential for the analog input
Referenced
myDAQ channels, referenced single-ended for
single-ended
the audio input channels.
Referenced single-ended for scopeCh0
and scopeCh1. For other analog input
Referenced
NI ELVIS II+ channels: differential for channels 0-7,
single-ended
referenced single-ended for channels
8-15.
NI USB-6000 Referenced single-ended N/A
NI PXI-6132, NI PXI-6133, NI PXI-6143 Differential N/A
Referenced
NI PCI-6110, NI PCI-6111, NI 6115, NI 6120 Pseudodifferential
single-ended
NI PXI-42xx Differential N/A
Referenced
SCC Non-referenced single-ended
single-ended
Differential. On the NI 4353, the cold-
SC Express junction compensation channels are N/A
referenced single ended by default.
SCXI Differential Differential
NI 9201, NI USB-9201, NI 9203, NI 9208, NI
9217, NI 9221, NI USB-9221, NI 9253, NI Referenced single-ended N/A
[1]38
9775
Differential for voltage channels,
NI 9207 referenced single-ended for current N/A
channels
For devices with 16 channels or more:
NI 9204, NI 9205, NI 9206, NI 9209, and AI
differential for eight channels followed
0-15 on CompactRIO single-board N/A
by referenced single-ended for eight
controllers
channels. For instance, channels 0-7,
38. All listed devices have a fixed terminal configuration

430 ni.com
 NI-DAQmx Device Considerations

Default
Output
Device Default Input Terminal Configuration
Terminal
Configuration
16-23, and 32-39 are differential.
Channels 8-15, 24-31, and 40-47 are
referenced-single ended.
FD-11601, FD-11603, FD-11605, FD-11613,
FD-11614, FD-11637, NI 9202, NI 9210, NI
9211, NI USB-9211A, NI 9212, NI 9213, NI
USB-9213, NI 9215, NI USB-9215A, NI
9216, NI 9218, NI 9219, NI USB-9219, NI
9220, NI 9224, NI 9225, NI 9226, NI 9227, Differential N/A
NI 9229, NI USB-9229, NI 9235, NI 9236, NI
9237, NI 9228, NI USB-9237, NI 9238, NI
9239, NI USB-9239, NI 9246, NI 9247, NI
9250, NI 9251, NI 9252 [1]
FD-11634, NI 9230, NI 9231, NI 9232, NI
Pseudodifferential N/A
9234, NI USB-9234
Nonreferenced single-ended for ai0,
NI 9242, NI 9244 ai1, and ai2. Referenced single-ended
for neutral.
NI 9262, NI 9263, NI USB-9263, NI 9264, NI
USB-9264, NI 9265, NI USB-9265, NI 9266, Referenced
N/A
and AO 0-3 on CompactRIO single-board single-ended
controllers
NI 9269 N/A Differential

Terminal Configurations (Analog Input Ground Reference

Settings) for Isolated Devices
You can use differential, referenced single-ended (RSE), or nonreferenced single-ended
(NRSE) terminal configurations (or analog input ground reference settings) for isolated
devices.

The following figure shows a differential measurement system. For illustrations of

other terminal configurations, refer to your device documentation.

© National Instruments 431

 NI-DAQmx Device Considerations

AI +

Isolation
Barrier
Ground- +
Referenced Instrumentation
Vs Amplifier
Signal +
Source –
PGIA +
Digital
AI –
Measured Isolators
– Vm
Voltage
Common- –
Mode +
Noise and Vcm
Ground
Potential –
Input Multiplexers

AI GND

I/O Connector
M Series Isolated Device Configured in DIFF Mode

RSE and NRSE measurement systems are the same for isolated devices in that the
measurement is made with respect to a floating or isolated ground, AI GND. AI GND is
the floating reference for all RSE and NRSE channels. AI GND is isolated from earth
ground through an isolation barrier on the device.

It is important to keep within the specifications of your device to avoid hazardous

conditions. It is considered improper use of the device to surpass the specifications,
and the device is no longer considered to be in safe use. Isolated devices specify a
continuous working isolation voltage that specifies the maximum voltage difference
allowed between any of the input signals to the chassis/earth ground. For example, a
product rated for 60 VDC of continuous working isolation that has a voltage difference
of +51 VDC between AIGND and the chassis/earth ground cannot have a signal greater
than +9 VDC when referenced to a AIGND or 60 VDC when reference to chassis/earth
ground at its input terminals.

Routing
This section contains information about routing for AO Series, E Series, S Series, and
TIO devices.

432 ni.com
 NI-DAQmx Device Considerations

Routing Considerations for AO Series Devices

The counters on these devices are very versatile and in many cases can route signals
across subsystems. They can also be used to route signals to/from the I/O connector.
However, when a counter is used as part of a route, you may not be able to use the
counter for other applications while the route remains reserved. Most routes do not
require an internal counter terminal, but many advanced routes do. For example, if
you want to use the signal present at PFI 4 on Dev1 as the Start Trigger for an
acquisition on Dev2, you simply need to specify /Dev1/PFI4 as the source of the
trigger. However, to make the route, the signal is internally routed from /Dev1/PFI4
to /Dev1/Ctr0Source to a RTSI bus line or PXI_Trig to Dev2/ai/
StartTrigger. These terminals need not be explicitly specified when programming
the route. In this case, it is not obvious that a counter terminal is used to make the
route. Subsequent attempts at using the counter while it is in use result in a routing
reservation error. To see if the route you are making uses counter resources, consult
the table displayed under the Device Routes tab in MAX.

Routing Considerations for E Series and S Series Devices

• PFI 0—When exporting a signal through task-based routing to most PFI terminals,
the route is reserved and committed with the task. When the task goes back to a
verified state, software resources for the route are released, but the route remains
in place in hardware. It remains in place to prevent glitching on the PFI terminal
and to prevent any unexpected effects on external circuitry monitoring the signal.
However, PFI 0 is an exception to this rule. Because PFI 0 can accept both analog
and digital signals, it tristates when the task is not in the committed or running
state. This behavior is intended to prevent accidental connections of an analog
signal directly to digital circuitry that could damage the device.

Note PFI 0 accepts only digital signals on the NI 6154.

When in use, the analog trigger circuitry takes over the PFI 0 terminal internal to
the device. Because of this, you cannot use PFI 0 to route any digital signals when
using the analog trigger, regardless of whether you are triggering off of PFI 0 or an
analog input channel. If you try to use PFI 0 for digital signals and the analog
trigger at the same time, you receive a routing error.
• Counters— The counters on these devices are very versatile and in many cases can

© National Instruments 433

 NI-DAQmx Device Considerations

route signals across subsystems. They can also be used to route signals to/from
the I/O connector. However, when a counter is used as part of a route, you may not
be able to use the counter for other applications while the route remains reserved.
Most routes do not require an internal counter terminal, but many advanced
routes do. For example, if you want to use the signal present at PFI 4 on Dev1 as
the Start Trigger for an acquisition on Dev2, you simply need to specify /Dev1/
PFI4 as the source of the trigger. However, to make the route, the signal is
internally routed from /Dev1/PFI4 to /Dev1/Ctr0Source to a RTSI bus line
or PXI_Trig to Dev2/ai/StartTrigger. These terminals need not be explicitly
specified when programming the route. In this case, it is not obvious that a counter
terminal is used to make the route. Subsequent attempts at using the counter
while it is in use result in a routing reservation error. To see if the route you are
making uses counter resources, consult the table displayed under the Device
Routes tab in MAX.

Routing Considerations for TIO Devices

Though TIO counters can receive signals from any of the PFI lines, NI-DAQmx uses
internal resources to connect some PFIs to counter inputs. There are some PFI lines
that do not use internal resources that are preferred for use with different counter
signals.

• CtrnAux —PFI 37, PFI 33, PFI 29, PFI 25, PFI 21, PFI 17, PFI 13, PFI 9
• CtrnGate—PFI 38, PFI 34, PFI 30, PFI 26, PFI 22, PFI 18, PFI 14, PFI 10
• CtrnSource—PFI 39, PFI 35, PFI 31, PFI 27, PFI 23, PFI 19, PFI 15, PFI 11

For output, the same rules apply. Though the counter can output on any PFI line, there
are a subset of preferred PFIs that do not use internal resources to make the routes.

• CtrnInternalOutput—PFI 36, PFI 32, PFI 28, PFI 24, PFI 20, PFI 16, PFI 12, PFI 8

To see if the route you are making uses internal resources, consult the table displayed
under the Device Routes tab in MAX.

Switches
This section contains information specific to switch devices about API support and

434 ni.com
 NI-DAQmx Device Considerations

switching capacity, including switching voltage, switching current, and switching

power.

API Support for Switch Modules

Switch modules can support any of four different ways to control their relays. You may
use the APIs interchangeably, but NI recommends using a single API for each
application.

• Digital Output—Create your tasks, either programmatically with the Create

Channel Digital Output function/VI or interactively through the DAQ Assistant,
using the digital output physical channels. Use the digital versions of the Write
function/VI to control the relays. Each digital port consists of 32 digital lines, and
each line represents a relay on the switch. For example, if a module contains 64
relays, the first 32 are on port 0, and the rest will be on port 1. Writing a 0 to a
digital line opens the relay and writing a 1 closes it.
• Immediate—The immediate API, supported by all switches, provides a switch
channel-based interaction recommended for nonscanning operations. Functions/
VIs such as DAQmx Switch Connect and DAQmx Switch Disconnect are considered
part of the immediate API.
• Relay—The relay API provides a relay-based interaction. Functions/VIs like DAQmx
Switch Open Relays and DAQmx Switch Close Relays are considered part of the
relay API.
• Scanning—Scanning is a method of connecting channels and is often used when
connecting instruments and devices under test (DUTs) in a specific order. In this
operation mode, the switch cycles through each entry in a scan list downloaded to
the switch. The triggers the switch receives initiate this cycling. Create scanning
tasks using DAQmx Switch Create Scan List and control tasks using functions/VIs
like DAQmx Start, DAQmx Stop, and so on.

Supported Topologies

Every switch module supports one or more topologies. Changing the topology alters
the functionality of the switch and, in many cases, changes the list of supported
channel names.

© National Instruments 435

 NI-DAQmx Device Considerations

Special Considerations

Some switch modules have specific behaviors that you must consider when
developing applications. These are described in the following table.

Supported
Device Supported Topologies
APIs

• NI 2810A/B • Immediate
2810/1-Wire 4×43 Matrix
• Reed Matrix for NI SwitchBlock • Relay

• NI 2811A/B • Immediate
2811/1-Wire 8×21 Matrix
• Reed Matrix for NI SwitchBlock • Relay

• NI 2812A/B • Immediate
2812/1-Wire 16x9 Matrix
• Reed Matrix for NI SwitchBlock • Relay

• NI 2813A/B • Immediate
2813/2-Wire 4x21 Matrix
• Reed Matrix for NI SwitchBlock • Relay

• NI 2814A/B • Immediate
2814/2-Wire 8x9 Matrix
• Reed Matrix for NI SwitchBlock • Relay

• NI 2815A/B • Immediate
2815/1-Wire 4×86 Matrix
• Reed Matrix for NI SwitchBlock • Relay

• NI 2816A/B • Immediate
2816/1-Wire 8×46 Matrix
• Reed Matrix for NI SwitchBlock • Relay

• NI 2817A/B • Immediate
2817/1-Wire 16x22 Matrix
• Reed Matrix for NI SwitchBlock • Relay

436 ni.com
 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• NI 2833
• Immediate
• Electromechanical Latching Matrix for NI 2833/2-Wire 4x71 Matrix
• Relay
SwitchBlock

• NI 2834
• Immediate
• Electromechanical Latching Matrix for NI 2834/2-Wire 8x34 Matrix
• Relay
SwitchBlock

• NI 2865
• Immediate
• Matrix with Analog Bus Protection for NI 2865/1-Wire 4x84 Matrix
• Relay
SwitchBlock

• 2501/1-Wire 48x1 Mux

• 2501/1-Wire 48x1
Amplified Mux
• 2501/2-Wire 24x1 Mux
• 2501/2-Wire 24x1
• PXI-2501 • Immediate
Amplified Mux
• 24-Channel FET • Relay
• 2501/2-Wire Dual 12x1
• Multiplexer/Matrix • Scanning
Mux
• 2501/2-Wire Quad 6x1
Mux
• 2501/2-Wire 4x6 Matrix
• 2501/4-Wire 12x1 Mux

• 2503/1-Wire 48x1 Mux

• 2503/2-Wire 24x1 Mux
• 2503/2-Wire Dual 12x1
• PXI-2503 • Immediate
Mux
• 24-Channel Relay • Relay
• 2503/2-Wire Quad 6x1
• Multiplexer/Matrix • Scanning
Mux
• 2503/2-Wire 4x6 Matrix
• 2503/4-Wire 12x1 Mux

© National Instruments 437

 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Immediate
• PXI-2510
• Relay Independent
• 68-Channel 2A Fault Insertion Unit
• Scanning

• Immediate
• PXI-2512, PXIe-2512
• Relay Independent
• 7-Channel 10A Fault Insertion Unit
• Scanning

• Immediate
• PXI-2514, PXIe-2514
• Relay Independent
• 7-Channel 40A Fault Insertion Unit
• Scanning

• PXI-2515, PXIe-2515 • Immediate

• High-Speed Digital I/O Signal Insertion • Relay Independent
Switch • Scanning

• Immediate
• PXI-2520
• Relay • 80-SPST Switch
• 80-Channel SPST Relay Module
• Scanning

• Immediate
• PXI-2521
• Relay • 40-DPST Switch
• 40-Channel DPST Relay Module
• Scanning

• Immediate
• PXI-2522
• Relay 53-SPDT Switch
• 53-Channel SPDT Relay Module
• Scanning

• PXI-2523 • Immediate 26-DPDT Switch

438 ni.com
 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Relay
• 26-Channel DPDT Relay Module
• Scanning

• 2527/1-Wire 64x1 Mux

• 2527/1-Wire Dual 32x1
Mux
• Immediate
• PXI-2527 • 2527/2-Wire 32x1 Mux
• Relay
• 32-Channel 300 V Multiplexer • 2527/2-Wire Dual 16x1
• Scanning
Mux
• 2527/4-Wire 16x1 Mux
• 2527/Independent

• 2529/2-Wire 8x16 Matrix

• Immediate
• PXI-2529 • 2529/2-Wire 4x32 Matrix
• Relay
• 128-Crosspoint Relay Matrix • 2529/2-Wire Dual 4x16
• Scanning
Matrix

• 2530/1-Wire 128x1 Mux

• 2530/1-Wire Dual 64x1
Mux
• 2530/2-Wire 64x1 Mux
• 2530/4-Wire 32x1 Mux
• 2530/1-Wire 4x32 Matrix
• 2530/1-Wire 8x16 Matrix
• 2530/1-Wire Octal 16x1
• PXI-2530 • Immediate
Mux
• 128-Channel Reed Relay • Relay
• 2530/1-Wire Quad 32x1
• Multiplexer/Matrix • Scanning
Mux
• 2530/2-Wire 4x16 Matrix
• 2530/2-Wire Dual 32x1
Mux
• 2530/2-Wire Quad 16x1
Mux
• 2530/4-Wire Dual 16x1
Mux

© National Instruments 439

 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• 2530/Independent

• 2531/1-Wire 4x128 Matrix

• 2531/1-Wire 8x64 Matrix
• Immediate
• PXI-2531, PXIe-2531 • 2531/1-Wire Dual 4x64
• Relay
• 512-Crosspoint Matrix Matrix
• Scanning
• 2531/1-Wire Dual 8x32
Matrix

• 2532/1-Wire 16x32 Matrix

• 2532/1-Wire 4x128 Matrix
• 2532/1-Wire 8x64 Matrix
• 2532/1-Wire Dual 16x16
Matrix
• 2532/1-Wire Dual 4x64
• Immediate
• PXI-2532 Matrix
• Relay
• 512-Crosspoint Matrix • 2532/1-Wire Dual 8x32
• Scanning
Matrix
• 2532/1-Wire Sixteen 2x16
Matrix
• 2532/2-Wire 16x16 Matrix
• 2532/2-Wire 4x64 Matrix
• 2532/2-Wire 8x32 Matrix

• Immediate
• PXI-2533
• Relay 2533/1-Wire 4x64 Matrix
• 256-Crosspoint SSR Matrix
• Scanning

• Immediate
• PXI-2534
• Relay 2534/1-Wire 8x32 Matrix
• 256-Crosspoint SSR Matrix
• Scanning

440 ni.com
 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Immediate
• PXI-2535
• Relay 2535/1-Wire 4x136 Matrix
• 544-Crosspoint FET Matrix
• Scanning

• Immediate
• PXI-2536
• Relay 2536/1-Wire 8x68 Matrix
• 544-Crosspoint FET Matrix
• Scanning

• Immediate
• PXI-2542, PXIe-2542 2542/Quad 2x1 Terminated
• Relay
• Quad Terminated 2x1 Multiplexer Mux
• Scanning

• Immediate
• PXI-2543, PXIe-2543
• Relay 2543/Dual 4x1 Terminated Mux
• Dual Terminated 4x1 Multiplexer
• Scanning

• Immediate
• NI PXI-2544, PXIe-2544
• Relay 2544/8x1 Terminated Mux
• Terminated 8x1 Multiplexer
• Scanning

• Immediate
• PXI-2545
• Relay 2545/4x1 Terminated Mux
• 2.7 GHz 4x1 Terminated 50 Ohm Multiplexer
• Scanning

• Immediate
• PXI-2546
• Relay 2546/Dual 4x1 Mux
• 2.7 GHz Dual 4x1 50 Ohm Multiplexer
• Scanning

• PXI-2547 • Immediate 2547/8x1 Mux

© National Instruments 441

 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Relay
• 2.7 GHz 8x1 50 Ohm Multiplexer
• Scanning

• Digital
Output
• PXI-2548
• Immediate 2548/4-SPDT
• 2.7 GHz 4-SPDT 50 Ohm Relay Module
• Relay
• Scanning

• Digital
• PXI-2549 Output
• 2.7 GHz Terminated 2-SPDT 50 Ohm Relay • Immediate 2549/Terminated 2-SPDT
Module • Relay
• Scanning

• Immediate
• PXI-2554
• Relay 2554/4x1 Mux
• 2.5 GHz 4x1 75 Ohm Multiplexer
• Scanning

• Immediate
• PXI-2555
• Relay 2555/4x1 Terminated Mux
• 2.5 GHz 4x1 Terminated 75 Ohm Multiplexer
• Scanning

• Immediate
• PXI-2556
• Relay 2556/Dual 4x1 Mux
• 2.5 GHz Dual 4x1 75 Ohm Multiplexer
• Scanning

• Immediate
• PXI-2557
• Relay 2557/8x1 Mux
• 2.5 GHz 8x1 75 Ohm Multiplexer
• Scanning

442 ni.com
 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Digital
Output
• PXI-2558
• Immediate 2558/4-SPDT
• 2.5 GHz 4-SPDT 75 Ohm Relay Module
• Relay
• Scanning

• Digital
• PXI-2559 Output
• 2.5 GHz Terminated 2-SPDT 75 Ohm Relay • Immediate 2559/Terminated 2-SPDT
Module • Relay
• Scanning

• Digital
Output
• PXI-2564 • 2564/8-DPST
• Immediate
• 16-SPST Relay Module • 2564/16-SPST
• Relay
• Scanning

• Digital
Output
• PXI-2565
• Immediate 2565/16-SPST
• 16-SPST Power Relay Module
• Relay
• Scanning

• Digital
Output
• PXI-2566 • 2566/8-DPDT
• Immediate
• 16-SPDT Relay Module • 2566/16-SPDT
• Relay
• Scanning

• PXI-2567 • Digital
2567/Independent
• 64-Channel Relay Driver Module Output

© National Instruments 443

 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Immediate
• Relay
• Scanning

• Digital
Output
• PXI-2568 • 2568/15-DPST
• Immediate
• 31-Channel SPST Relay Module • 2568/31-SPST
• Relay
• Scanning

• Digital
Output
• PXI-2569 • 2569/50-DPST
• Immediate
• 100-Channel SPST Relay Module • 2569/100-SPST
• Relay
• Scanning

• Digital
Output
• PXI-2570 • 2570/20-DPDT
• Immediate
• 40-Channel SPDT Relay Module • 2570/40-SPDT
• Relay
• Scanning

• Digital
Output
• PXI-2571
• Immediate 2571/66-SPDT
• 66-Channel SPDT Relay Module
• Relay
• Scanning

• Immediate • 2575/1-Wire 196x1 Mux

• PXI-2575
• Relay • 2575/2-Wire 98x1 Mux
• 196x1 Relay Multiplexer
• Scanning • 2575/2-Wire 95x1 Mux

444 ni.com
 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Immediate • 2576/2-Wire Octal 8x1 Mux

• PXI-2576
• Relay • 2576/2-Wire Sixteen 4x1
• Multi-Bank Multiplexer
• Scanning Mux

• 2584/Independent
• Immediate
• PXI-2584 • 2584/1-Wire 12x1 Mux
• Relay
• High-Voltage Multiplexer • 2584/1-Wire Dual 6x1 Mux
• Scanning
• 2584/2-Wire 6x1 Mux

• Immediate
• PXI-2585
• Relay 2585/1-Wire 10x1 Mux
• 10-Channel Multiplexer
• Scanning

• Digital
Output
• PXI-2586 • 2586/5-DPST
• Immediate
• 10-Channel SPST Relay Module • 2586/10-SPST
• Relay
• Scanning

• Immediate
• PXI-2590
• Relay 2590/4x1 Mux
• 1.3 GHz 4x1 50 Ohm Multiplexer
• Scanning

• PXI-2591 • Immediate
2591/4x1 Mux
• 4 GHz 4x1 50 Ohm Multiplexer • Scanning

• 2593/16x1 Mux
• Immediate • 2593/Dual 8x1 Mux
• PXI-2593
• Relay • 2593/8x1 Terminated Mux
• 500 MHz Dual 8x1 50 Ohm Multiplexer
• Scanning • 2593/Dual 4x1 Terminated
Mux

© National Instruments 445

 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• 2593/Independent

• Immediate
• PXI-2594
• Relay 2594/4x1 Mux
• 1x4 2.5 GHz Multiplexer
• Scanning

• Immediate
• PXI-2595
• Relay 2595/4x1 Mux
• 1x4 5.5 GHz Multiplexer
• Scanning

• Immediate
• PXI-2596
• Relay 2596/Dual 6x1 Mux
• Dual 1x6 26.5 GHz Multiplexer
• Scanning

• Immediate
• PXI-2597
• Relay 2597/6x1 Terminated Mux
• 1x6 26.5 GHz Terminated Multiplexer
• Scanning

• Immediate
• PXI-2598
• Relay 2598/Dual Transfer
• Dual 26.5 GHz Transfer Switch
• Scanning

• Immediate
• PXI-2599
• Relay 2599/2-SPDT
• Dual 26.5 GHz SPDT
• Scanning

• Immediate
• PXIe-2720
• Relay Independent
• Ten 8-Bit Channel Resistor Module
• Scanning

446 ni.com
 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Immediate
• PXIe-2722
• Relay Independent
• Five 16-Bit Channel Resistor Module
• Scanning

• Immediate
• PXIe-2725
• Relay Independent
• Eighteen 8-Bit Channel Resistor Module
• Scanning

• Immediate
• PXIe-2727
• Relay Independent
• Nine 16-bit Channel Resistor Module
• Scanning

• Immediate
• PXIe-2790
• Relay Independent
• RF Power Combiner and Switch
• Scanning

• Immediate
• PXIe-2796
• Relay 2796/Dual 6x1 Mux
• Dual 6x1 40 GHz Multiplexer
• Scanning

• Immediate
• PXIe-2797
• Relay 2797/6x1 Terminated Mux
• 6x1 40 GHz Terminated Multiplexer
• Scanning

• Immediate
• PXIe-2798
• Relay 2798/Dual Transfer
• Dual 40 GHz Transfer Switch
• Scanning

• PXIe-2799 • Immediate 2799/2-SPDT

© National Instruments 447

 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Relay
• Dual 40 GHz SPDT
• Scanning

• 1127/1-Wire 64x1 Mux

• SCXI-1127 • Immediate
• 1127/2-Wire 32x1 Mux
• 32-Channel Relay Multiplexer/Matrix • Relay
• 1127/4-Wire 16x1 Mux
• See SCXI-1127 Considerations • Scanning
• 1127/2-Wire 4x8 Matrix

• 1128/1-Wire 64x1 Mux

• SCXI-1128
• Immediate • 1128/2-Wire 32x1 Mux
• 32-Channel Solid-State Relay (SSR)
• Relay • 1128/4-Wire 16x1 Mux
• Multiplexer/Matrix
• Scanning • 1128/2-Wire 4x8 Matrix
• See SCXI-1128 Considerations
• 1128/Independent

• 1129/2-Wire 16x16 Matrix

• 1129/2-Wire 8x32 Matrix
• 1129/2-Wire 4x64 Matrix
• Immediate • 1129/2-Wire Dual 8x16
• SCXI-1129
• Relay Matrix
• 256-Crosspoint Relay Matrix
• Scanning • 1129/2-Wire Dual 4x32
Matrix
• 1129/2-Wire Quad 4x16
Matrix

• 1130/1-Wire 256x1 Mux

• 1130/1-Wire Dual 128x1
Mux
• SCXI-1130 • Immediate • 1130/2-Wire 128x1 Mux
• 256-Channel Reed Relay • Relay • 1130/4-Wire 64x1 Mux
• Multiplexer/Matrix • Scanning • 1130/1-Wire 4x64 Matrix
• 1130/1-Wire 8x32 Matrix
• 1130/1-Wire Octal 32x1
Mux

448 ni.com
 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• 1130/1-Wire Quad 64x1

Mux
• 1130/1-Wire Sixteen 16x1
Mux
• 1130/2-Wire 4x32 Matrix
• 1130/2-Wire Octal 16x1
Mux
• 1130/2-Wire Quad 32x1
Mux
• 1130/4-Wire Quad 16x1
Mux
• 1130/Independent

• Digital
• SCXI-1160 Output
1160/16-SPDT
• 16-SPDT General-Purpose Relay Module • Immediate
• Relay

• Digital
• SCXI-1161 Output
1161/8-SPDT
• 8-SPDT Power Relay Module • Immediate
• Relay

• Digital
• SCXI-1163R Output
1163R/Octal 4x1 Mux
• 32-Channel SSR • Immediate
• Relay

• Digital
Output
• SCXI-1166 • 1166/16-DPDT
• Immediate
• 32-SPDT Relay Module • 1166/32-SPDT
• Relay
• Scanning

© National Instruments 449

 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

• Digital
Output
• SCXI-1167
• Immediate 1167/Independent
• 64-Channel Relay Driver Module
• Relay
• Scanning

• Digital
Output
• SCXI-1169 • 1169/50-DPST
• Immediate
• 100-Channel SPST Relay Module • 1169/100-SPST
• Relay
• Scanning

• Immediate • 1175/1-Wire 196x1 Mux

• SCXI-1175
• Relay • 1175/2-Wire 98x1 Mux
• 196x1 Relay Multiplexer
• Scanning • 1175/2-Wire 95x1 Mux

• SCXI-1190
• Immediate 1190/Quad 4x1 Mux
• 1.3 GHz Quad 4x1 50 Ohm Multiplexer

• SCXI-1191
• Immediate 1191/Quad 4x1 Mux
• 4 GHz Quad 4x1 50 Ohm Multiplexer

• Digital
• SCXI-1192 Output
1192/8-SPDT
• 18 GHz 8-SPDT 50 Ohm Relay Module • Immediate
• Relay

• 1193/32x1 Mux
• Immediate
• SCXI-1193 • 1193/Dual 16x1 Mux
• Relay
• 500 MHz Quad 8x1 50 Ohm Multiplexer • 1193/Quad 8x1 Mux
• Scanning
• 1193/16x1 Terminated

450 ni.com
 NI-DAQmx Device Considerations

Supported
Device Supported Topologies
APIs

Mux
• 1193/Dual 8x1 Terminated
Mux
• 1193/Quad 4x1
Terminated Mux
• 1193/Independent

• Immediate
• SCXI-1194
• Relay 1194/Quad 4x1 Mux
• Quad 1x4 2.5 GHz Multiplexer
• Scanning

• Immediate
• SCXI-1195
• Relay 1195/Quad 4x1 Mux
• Quad 1x4 5.5 GHz Multiplexer
• Scanning

SCXI-1127 Considerations

To route signals to the analog bus backplane, you must enable the switch device
property AutoConnAnlgBus. As a result, if you connect a channel (ch1) to the common
channel (com0), the signal is automatically routed from com0 to the analog bus (ab0).

The device supports only continuous scanning.

If you have used immediate or relay operations to change relay states before starting a
scan, all of those relays are opened when the scan starts. After the scan completes, the
relays are returned to their previous state prior to the scan.

Early revisions of this hardware reserve the SCXI_TRIG1 line. If you place an older
revision of this hardware (earlier than revision E) into an SCXI chassis that also
contains an SCXI analog input module that performs track and hold (such as the
SCXI-1140 or SCXI-1520), you may get reservation errors when trying to use the SCXI
analog input module.

© National Instruments 451

 NI-DAQmx Device Considerations

SCXI-1128 Considerations

To route signals to the analog bus backplane, you must enable the switch device
property AutoConnAnlgBus. As a result, if you connect a channel (ch1) to the common
channel (com0), the signal is automatically routed from com0 to the analog bus (ab0).

The device supports only continuous scanning.

If you have used immediate or relay operations to change relay states before starting a
scan, all of those relays are opened when the scan starts. After the scan completes, the
relays are returned to their previous state prior to the scan.

Switching Capacity
Signal levels through a switch must account for the following specifications:

• Switching voltage
• Switching current
• Switching power

The following figure shows the valid operating range defined by these limits.

Maximum Switching Voltage

M
ax
im
um
Sw
itc
hi
ng
Po
w
er

V
Maximum Switching Current

Valid Operating Range

I
Related concepts:

• Switching Voltage
• Switching Current

452 ni.com
 NI-DAQmx Device Considerations

• Switching Power

Switching Current

Switching current is the maximum rated current that can flow through the switch
as it makes or breaks a contact. Switching active currents higher than those specified
in the switch documentation can result in arcing that can damage the contacts of
electromechanical relays. A minimum current specification indicates the smallest
current that can reliably flow through the switch.

Switches can also have carry current. Carry current is the maximum rated current
that can pass through a closed switch, or the current that a switch can carry. Carry
current can be larger than switching current. However, since carry current can only
flow while the switch is closed, the current needs to be stopped while the switch
operates.

Switching Power

Switching power is the limit on the combined open-contact voltage and closed-
contact current of a signal in the switch.

Switching Power = Switching Voltage * Switching Current

Switching high-power signals causes high-energy arcing at the electromechanical

contacts during actuation, reducing the useful life of the switch.

Switching Voltage

Switching voltage refers to the maximum signal voltage that the switch module can
safely maintain. Switching voltage is defined from channel-to-ground and from
channel-to-channel. Channel-to-ground is the voltage potential between the signal
line and the grounded chassis. Channel-to-channel is the voltage potential between
any pair of signal lines within the module. This voltage includes voltages across open
relay contacts, as well as voltages between adjacent connection terminals.

Note CE marking for measurement and control devices requires compliance

© National Instruments 453

 NI-DAQmx Device Considerations

to the IEC 61010-1 standard. Switch modules intended for high-voltage

signals (> 60 VDC / 30 Vrms ) are rated for Measurement Categories as defined
in this standard. Measurement Categories describe the acceptable transient
overvoltages and fault protection necessary for safe operation. Refer to the
NI Switches Getting Started Guide for more information on
Measurement Categories.

Synchronization
This section contains information on synchronizing multiple devices.

Synchronizing cDAQ Chassis and FieldDAQ Devices

If you have multiple devices that support the IEEE 802.1AS standard, you can use Start
Trigger synchronization to trigger at a specific time. These devices must either be
connected through a daisy chain or a switch that supports IEEE 802.1AS.

Note If the devices are connected to the network through a real-time host,
you must discover these devices in MAX through the real-time host. Refer to
the MAX Help for NI-DAQmx for more information on how to discover devices
remotely.

For a detailed tutorial on synchronizing FieldDAQ devices, refer to Synchronizing

Analog Input FieldDAQ Devices with NI-DAQmx in LabVIEW on ni.com.

Related information:

• Synchronizing Analog Input FieldDAQ Devices with NI-DAQmx in LabVIEW

Synchronizing DSA Devices

You can synchronize the analog input and output operations on two or more DSA
devices to extend the channel count of DSA measurements. Refer to the NI Dynamic
Signal Acquisition User Manual, which you can find at ni.com/manuals, for

454 ni.com
 NI-DAQmx Device Considerations

additional DSA synchronization information.

Synchronizing DSA Devices with Multifunction DAQ Devices

You can use Sample Clock synchronization to synchronize DSA devices with
Multifunction DAQ devices. However, synchronization creates phase delay between the
devices.

Related concepts:

• Sample Clock Synchronization

Synchronizing X Series, M Series, and SC Express Devices

Note To synchronize analog input tasks on multiple X Series and SC Express

devices at the same sampling rate, you can use channels from those devices
within the same task.

X Series, M Series, and SC Express devices support the following synchronization

methods:

• Start Trigger synchronization

• Reference Clock synchronization
• Sample Clock synchronization

Refer to the Device Routes tab in MAX to determine which PXI and RTSI lines can route
synchronization signals.

Note You cannot use a RTSI cable to connect multiple USB X Series devices.

Note The NI 4302/4303/4304/4305, NI 4330/4331, and NI 4339 only support

exporting their sample clock. They do not support importing a sample clock.

Note The NI 4340 supports importing a sample clock only in hardware-

timed single-point sample mode.

© National Instruments 455

 NI-DAQmx Device Considerations

Related concepts:

• Multidevice Tasks
• Start Trigger Synchronization
• Reference Clock Synchronization
• Sample Clock Synchronization

Synchronizing E Series, S Series, and AO Series Devices

E Series, S Series, and AO Series devices support the following synchronization
methods:

• Start Trigger synchronization

• Master Timebase synchronization
• Sample Clock synchronization

NI PCI-6154 and PXIe-6124 devices support the following synchronization methods:

• Start Trigger synchronization

• Reference Clock synchronization
• Sample Clock synchronization

Refer to the Device Routes tab in MAX to determine which PXI and RTSI lines can route
synchronization signals.

Related concepts:

• Start Trigger Synchronization

• Master Timebase Synchronization
• Sample Clock Synchronization
• Reference Clock Synchronization

PXI_CLK 10 with the NI 6608 and the NI 6614

When NI-DAQmx detects that an NI 6608 is installed in slot 2 (or when an NI 6614 is
installed in the system timing slot), NI-DAQmx automatically overrides the chassis
PXI_CLX10 with the more stable oven controlled oscillator (OCXO) from the NI 6608 or
NI 6614. This allows all devices in the chassis to inherit the OCXO accuracy and stability

456 ni.com
 NI-DAQmx Device Considerations

via the PXI_CLK10 signal. In a PXIe chassis, the PXIe_Clk100 signal is phase-locked to
the PXI_CLK10, so PXIe_Clk100 will also inherit the OCXO accuracy and stability.

Refer to the NI 6608 documentation for more information about the stability of the
OCXO.

Note For the automatic override to occur in NI-DAQmx, you must put the NI
6608 in slot 2 or the NI 6614 in the system timing slot. For more information
about configuring your PXI chassis, refer to the Measurement &
Automation Explorer Help for PXI.

Synchronization with M Series USB and NI ELVIS II Family

Devices
M Series USB and NI ELVIS II Family devices do not support reference clock
synchronization.

Supported Devices for Trigger Skew Correction

The following devices support locking synchronized triggers to a clock to compensate
for skew.

• SC Express devices
• X Series devices

Related concepts:

• Trigger Skew Correction

Timing
This section contains information about timing for AO Series, C Series, DSA, E Series,
FieldDAQ, M Series USB, NI ELVIS II Family, S Series, and SC Express devices.

© National Instruments 457

 NI-DAQmx Device Considerations

Timing Considerations for AO Series Devices

When using an external ao/SampleClock for finite generations, you need to provide
one more sample clock pulse than the number of samples in the generation. The Wait
Until Done function/VI uses the extra sample clock to indicate the task is complete. For
example, if you want to generate 1000 samples using an external sample clock, the
first 1000 samples clocks you provide generates all of the samples, but you need to
provide 1001 sample clock pulses for the Wait Until Done function/VI to indicate the
task is done. If you are trying to synchronize an analog output generation with another
acquisition or generation by sharing a common clock, use the ao/SampleClock as the
master clock, or key off of the generation or acquisition providing the master clock to
determine when the generation is complete.

Static AO devices, such as the NI 6703 and NI 6704, do not have hardware timing and
have multiplexed output. Refer to your device documentation for specifics concerning
your device.

Timing Considerations for C Series Devices

Note C Series devices do not support hardware-timed single-point sample

mode or Wait for Next Sample Clock.

Related concepts:

• C Series Delta-Sigma Devices

• C Series Scanned Devices
• C Series Slow Sample Devices
• Digital I/O Considerations for C Series and TestScale Devices
• Digital I/O Considerations for C Series Devices

Analog Input Timing Considerations for C Series Devices

You can use multiple analog input devices of different types in the same task, and NI-
DAQmx automatically synchronizes them.

NI-DAQmx supports:

458 ni.com
 NI-DAQmx Device Considerations

• Only one analog input task at a time per NI cDAQ-9171, 9181, and 9191 chassis.
• Up to three analog input tasks at a time per cDAQ-9132, 9133, 9134, 9135, 9136,
9137, 9174, 9178, 9179, 9184, 9185, 9188, 9188XT, and 9189 chassis.
• Up to eight analog input tasks at a time per supported CompactRIO39 controller.
• One analog input task at a time per slot or onboard IO module, per CompactRIO
Single-Board40 controller.

Related concepts:

• CompactRIO Timing Engines

AI Convert Clock Considerations

C Series Scanned devices, such as the NI 9201, NI 9204, NI 9205, and NI 9221, use
multiplexed sampling controlled by a per-slot AI Convert Clock.

If you have multiple devices in one task, their AI Convert Clocks run in parallel, which
may cause channels on multiple devices to be sampled at the same time. You can set
the AI Convert Rate and the Delay From Sample Clock differently on each device. When
setting AI Convert instances of the DAQmx Timing attribute/property, you must use the
ActiveDev attribute/property to specify the device to which you are referring. External
clocking of the AI Convert Clock is not supported.

Reference Clock Considerations

Devices with a reference clock, such as the NI 9775, do not support on-demand timing.

These devices require hardware timing from a continuous clock. This clock
synchronizes the onboard oscillators using a phase-locked loop and serves as the
Sample Clock Timebase. When devices with reference clocks are in a task, you cannot
set an external SampClk.Src or SampClkTimebase. Similar to DSA devices, devices with
a reference clock do not support external sample clocks from arbitrary signal sources.

For the NI 9775, the reference clock must be 12.8 MHz.

39. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058.
40. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638

© National Instruments 459

 NI-DAQmx Device Considerations

Sampling Rate Considerations

The default AI Convert Clock rate for the C Series Scanned devices uses 10 µs of
additional settling time between channels, compared to the fastest AI Convert Clock
rate for the device. When the Sample Clock rate is too high to allow for 10 µs of
additional settling time, the default AI Convert Clock rate uses as much settling time as
is allowed by the Sample Clock rate. If there are multiple C Series Scanned devices in
the same task, the same amount of additional settling time is used for all devices in
the task, even if their maximum AI Convert Clock rates differ.

In a CompactDAQ chassis with C Series Slow Sample devices, such as the NI 9211, if the
sampling rate of a hardware-timed acquisition exceeds the maximum sampling rate of
the module, the most recently acquired sample may be read multiple times and no
warning or error is generated. Exceeding the maximum sampling rate of other devices
in the same task generates warnings or errors. The first sample of a hardware-timed
acquisition with C Series Slow Sample devices is sampled when the task is committed.
Software-timed acquisitions with C Series Slow Sample devices always wait for a new
sample to be acquired.

In a CompactRIO or Single-Board RIO controller with C Series Slow Sample devices,

such as the NI 9211, if the sampling rate of a hardware-timed acquisition exceeds the
maximum sampling rate of the module, DAQmx generates warning or errors. When a
Slow Sample device is in the same task as a non-Slow Sample device, exceeding the
maximum sampling rate of the Slow Sample device results in the most recently
acquired sample being read multiple times. In this scenario, the first sample of a
hardware-timed acquisition with C Series Slow Sample devices is sampled when the
task is committed.

The NI 9213/9214 maximum sample rate of 100 S/s applies to tasks with 13 or less
analog input channels per module. To determine the maximum sample rate for an NI
9213/9214, query the AI.MaxMultiChanRate attribute/property and divide that
returned value by the number of channels. For instance, if your analog input task uses
14 channels and AI.MaxMultiChanRate returns 1360.54, the maximum sample rate
would be 97.18 S/s. You can also query the maximum sample rate used in the task with
the SampClk.MaxRate attribute/property.

The maximum sampling rate of the NI 9215 depends on which channel(s) you are
acquiring from. For instance, a task acquiring from any combination of ai0, ai1, and ai2

460 ni.com
 NI-DAQmx Device Considerations

can sample at faster rates than a task that includes ai3. The maximum sampling rates
are attainable only when sampling from ai0. If you have multiple NI 9215 devices in the
same task, they sample in parallel. For instance, multiple NI 9215 devices acquiring
from ai0 may be able to achieve a faster sampling rate than a single NI 9215 acquiring
from ai3.

The C Series Delta-Sigma devices, such as the NI 9225, NI 9227, NI 9235, and NI 9239,
have both a maximum and a minimum sampling rate. Refer to the specifications for
your device to determine the sampling rate range.

When you set a sampling rate for the NI 9230, NI 9231, NI 9232, or NI 9234, NI-DAQmx
selects the highest possible decimation rate. Refer to the operating instructions for
your device for more information about available sampling rates.

When C Series Delta Sigma devices, such as the NI 9230, NI 9231, NI 9232, NI 9234, NI
9250, or NI 9251 are in a task with a C Series device that has a different sample clock
timebase, NI-DAQmx always chooses the sample clock timebase with the highest
frequency. To override this selection, you can set the sample clock timebase in the
SampClk.Timebase.Src attribute/property.

Hardware and On-Demand Timing for C Series Delta-Sigma Devices

C Series Delta-Sigma devices do not support the on-demand timing type.

All acquisitions and generations for C Series Delta-Sigma devices require hardware
timing from a steady clock. You cannot set the SampClk.Src attribute/property to an
external source when a C Series Delta-Sigma device is in the task. With C Series Delta-
Sigma devices, external clocking from arbitrary external signal sources such as
encoders and tachometers is not supported.

Analog Output Timing Considerations for C Series Devices

Only one hardware-timed analog output task per CompactDAQ chassis at a given time
is supported, but the number of concurrent software-timed analog output tasks is
limited only by the available channels. A single C Series analog output device cannot
be used for hardware-timed and software-timed tasks at the same time.

CompactRIO and Single-Board RIO controllers can support more than one hardware-

© National Instruments 461

 NI-DAQmx Device Considerations

timed AO task per controller. Refer to CompactRIO Timing Engines.

Related concepts:

• CompactRIO Timing Engines

Digital Input/Output Timing Considerations for C Series Devices

Only one hardware-timed digital input task and one hardware-timed digital output
task per CompactDAQ chassis at a given time is supported, but the number of
concurrent software-timed digital I/O tasks is limited only by the available lines.

Refer to Digital I/O Considerations for C Series for more information about
hardware-timed digital input/output.

CompactRIO and Single-Board RIO controllers can support more than one hardware-
timed digital input task and one hardware-timed digital output task per controller.
Refer to CompactRIO Timing Engines.

Related concepts:

• CompactRIO Timing Engines

• Digital I/O Considerations for C Series and TestScale Devices
• Digital I/O Considerations for C Series Devices

Configurable Timing for C Series Devices

On the NI 9207, NI 9208, NI 9209, NI 9212, NI 9213, NI USB-9213, NI 9214, NI 9216, NI

9217, NI 9219, NI 9224, NI 9226, NI 9228, and NI 9775, you can configure high-speed or
high-resolution measurements using the AI.ADCTimingMode attribute/property.

On the NI 9212, NI 9219, and NI USB-9219 you can also configure low-noise
measurements using the AI.ADCTimingMode attribute/property.

Default Settings for the AI.ADCTimingMode Attribute/Property

For all modules in the CompactRIO and Single-Board RIO controllers, the default value
in hardware-timed mode is automatically determined based on Sample Clock Rate.

462 ni.com
 NI-DAQmx Device Considerations

For the NI 9207, NI 9208, NI 9209, NI 9212, NI 9213, NI USB-9213, NI 9214, NI 9216, NI
9217, NI 9219, and NI 9226 in CompactDAQ, the AI.ADCTimingMode attribute/property
is set to High Resolution by default. To increase the conversion rate, set this attribute/
property to High Speed.

For the NI USB-9219, this attribute/property is set to High Resolution by default in on-
demand mode, and the default value in hardware-timed mode is automatically
determined based on Sample Clock Rate. To increase power line noise rejection on the
NI 9212 and NI 9219, set this attribute/property to Best 60 Hz Rejection or Best 50 Hz
Rejection.

For the NI 9224 and NI 9228, this attribute/property is set by default to Automatic,
which causes the module to sample with the highest resolution timing mode that is
faster than the rate you specified.

For the NI 9775, this attribute/property has a default timing mode of Automatic. The
Automatic timing mode automatically configures the module to sample with the
highest resolution timing mode that is compatible with the user-specified rate. If the
AI.Lowpass.Enable attribute/property is set to false, the timing mode will remain in
High Speed regardless of the user-specified sample rate.

Slow sample modules are able to sample just fast enough to avoid returning repeated
data. If the user-specified rate is above the maximum rate, the module will enter
background convert and return repeated data. Slow sample modules on the
cDAQ-9171 and cDAQ-9191 chassis have a default timing mode of Automatic.

The AI.ADCTimingMode attribute/property affects both the maximum and default

values for AIConv.Rate attribute/property in the DAQmx Timing property node. For
instance, if the ADC timing mode corresponds to a conversion time of 200 ms, the
maximum conversion rate is 5 Hz.

Counter Input Timing Considerations for C Series Devices

For the NI 9361, you can use multiple counter input devices in the same task, and NI-
DAQmx automatically synchronizes them. A single NI 9361 cannot be used for
hardware-timed and software-timed tasks at the same time. The CompactDAQ chassis
and CompactRIO controllers support up to four of the onboard chassis counters at a
time.

© National Instruments 463

 NI-DAQmx Device Considerations

Implicit timing is not supported on the NI 9361.

Related concepts:

• CompactRIO Timing Engines

Timing Considerations for DSA Devices

• Supported Sampling Rates

Unlike some other DAQmx devices, DSA devices have both a maximum and a
minimum sampling rate. Refer to the specifications for your device to determine
the sampling rate range.

• Other DSA Timing Considerations

DSA devices do not support the on-demand timing type. All DSA acquisitions and
generations require hardware timing from a steady clock. The NI 4464, 4480, and
4481 are an exception. The NI 4464, 4480, and 4481 support on-demand timing
type.

DSA devices do not support external clocking from arbitrary external signal
sources such as encoders and tachometers. The PFI lines on DSA devices cannot
accept external clocks. You can program a DSA device to use an external clock only
when it is a slave in multi-device synchronized system. Refer to Synchronizing DSA
Devices for more details.

Related concepts:

• Synchronizing DSA Devices

Timing Considerations for E Series Devices

Special timing considerations when using E Series devices:

• ai/ConvertClock

When using the ai/ConvertClock as the source of a route, one extra convert pulse is

464 ni.com
 NI-DAQmx Device Considerations

generated than you might expect. For example, if you perform a finite acquisition
of 100 samples with four channels, you see 401 convert pulses instead of 400. This
extra convert pulse is necessary to set up the configuration memory in hardware
and occurs as the task transitions to the committed state.

• ao/SampleClock

When using an external ao/SampleClock for finite generations, you need to provide
one extra sample clock pulse than the number of samples in the generation for the
Wait Until Done function/VI to indicate the task is complete. For example, if you
want to generate 1000 samples using an external sample clock, you need to
provide 1001 sample clock pulses or the Wait Until Done function/VI never
indicates the task is done. All of the samples are generated, but the analog output
timing engine needs one additional clock pulse to indicate the generation is
complete. If you are trying to synchronize an analog output generation with
another acquisition or generation by sharing a common clock, use the ao/
SampleClock as the master clock or key off of the generation or acquisition
providing the master clock to determine when the generation is complete.

Timing Considerations for FieldDAQ

Sampling Rate Considerations

For the FD-11613 and FD-11614, if the sampling rate of a hardware-timed acquisition
exceeds the maximum sampling rate of the module, the most recently acquired
sample may be read multiple times and no warning or error is generated. Exceeding
the maximum sampling rate of other devices in the same task generates warnings or
errors. The first sample of a hardware-timed acquisition with these devices is sampled
when the task is committed. Software-timed acquisitions with these devices always
wait for a new sample to be acquired.

The FD-11601, FD-11603, FD-11605, FD-11634, and FD-11637 have a user-selectable

sample clock timebase. You can set the sample clock timebase with the
SampClk.Timebase.Src attribute/property. The FD-11601, FD-11603, FD-11605,
FD-11634, and FD-11637 also have both a maximum and a minimum sampling rate.
Refer to your device documentation to determine the sampling rate range and the
user-selectable timebase for your FieldDAQ device.

© National Instruments 465

 NI-DAQmx Device Considerations

If you do not specify a sample clock timebase source or rate, NI-DAQmx auto-selects
the sample clock timebase with the closest sampling rate greater than or equal to your
requested sampling rate. If you do specify the sample clock timebase source or rate,
NI-DAQmx respects the setting and only chooses a sampling rate supported with that
sample clock timebase.

On-Demand Timing

The FD-11601, FD-11603, FD-11605, FD-11634, and FD-11637 do not support the on-
demand timing type.

Configurable Timing for FD-11613 and FD-11614

The FD-11613 and FD-11614 support the following timing modes:

Optimizes accuracy and noise and rejects power

High Resolution
line frequencies.
Best 50 Hz Rejection Optimizes 50 Hz noise rejection.
Best 60 Hz Rejection Optimizes 60 Hz noise rejection.
High Speed Optimizes sample rate and signal bandwidth.
Uses the most appropriate supported timing
Automatic
mode based on the Sample Clock Rate.

Use the AI.ADCTimingMode attribute/property to configure timing on the FD-11613

and FD-11614. This attribute/property is set by default to Automatic, which causes the
module to sample with the highest resolution timing mode that is faster than the rate
you specified.

Hardware-Timed Non-Buffered Sample Mode

In hardware-timed non-buffered sample mode, samples are acquired or generated
continuously using hardware timing and no buffer. You enable this mode by using
sample clock or change detection timing types and specifying a buffer size of 0. This
mode is similar to hardware-timed single point sample mode but with slower
performance and no error checking. Because there is no buffer if you use hardware-
timed non-buffered sample mode, you should ensure that reads or writes execute fast

466 ni.com
 NI-DAQmx Device Considerations

enough to keep up with hardware timing.

Note NI USB devices and NI CompactDAQ systems do not support hardware-

timed non-buffered sample mode when sample clock timing is used.

Related concepts:

• Sample Timing Types

• Hardware-Timed Single Point Sample Mode

Timing Considerations with NI ELVIS II Family and M Series

USB Devices
NI ELVIS II and M Series USB devices do not support hardware-timed single-point
sample mode or Wait for Next Sample Clock. The oscilloscope channels on NI ELVIS II+,
scopeCh0 and scopeCh1, support only finite samples mode, not hardware-timed
single-point mode or continuous samples mode. The NI ELVIS II+ oscilloscope
channels also only support the sample clock sample timing type.

Non-Buffered Change Detection

On X Series, M Series, and C Series devices, you can detect changes on digital lines or
ports without using a buffer by specifying change detection timing with a buffer size of
0. To use change detection timing on port 1 or port 2 for X Series devices, you must use
this non-buffered approach (i.e. specifying a buffer size of 0). On M Series devices, you
can read from port 1 and port 2 using non-buffered change detection timing, but
changes must be detected on port 0.

Timing Considerations for S Series

Analog Input with Pipelined ADCs

Note Not all S Series devices have pipelined ADCs. Refer to the specifications
for your device to determine if your device contains pipelined ADCs.

© National Instruments 467

 NI-DAQmx Device Considerations

Many S Series devices have pipelined ADCs with an intrinsic pipeline depth. This
pipelining allows the device to sample at higher rates, but it also has other
consequences on the timing requirements for the device. S Series devices, except for
the NI 6143, do not support AI hardware-timed single-point sample mode. Since the
data needs to travel through the pipeline before it can be read, the data being read is
always pipeline-depth points old. For instance, if the pipeline depth for a device is
three, the first sample is acquired on clock tick 1, but it is not available for reading until
clock tick 4. Following this logic, you must supply pipeline-depth extra clock pulses for
a finite acquisition to flush the pipeline. Continuing with the previous example, if the
pipeline depth is three and you want to acquire 1000 samples, you need to generate
1003 sample clock pulses. If you are using the onboard sample clock, NI-DAQmx
automatically generates the appropriate number of sample clock pulses. However,
when using an external sample clock or when synchronizing devices, you need to
ensure you supply the appropriate number of sample clock pulses.

There is also a finite amount of time a sample can be held in the pipeline before it
starts to degrade and lose measurement accuracy. This time limit imposes a minimum
sampling rate that must be met to achieve the measurement accuracy specified for the
device. Although you can sample slower than this minimum recommend sampling
rate, the accuracy specifications for the device are not guaranteed. Refer to the
specifications for your device to determine the recommended minimum sampling
rate.

This degradation of samples in the pipeline also affects on-demand single-point

acquisitions and acquisitions that use a Pause Trigger. For on-demand single-point
acquisitions, NI-DAQmx generates multiple sample clocks at the maximum sample rate
of the device for each sample that is read. For S Series devices with a pipelined ADC,
the number of sample clocks generated is equal to the pipeline depth plus one. For S
Series devices that do not have a pipelined ADC, two sample clock pulses are
generated for each point. This means that if you export the sample clock while doing
an on-demand single-point acquisition, you get more sample clock pulses than data
points. NI-DAQmx then throws away all points except the data point that corresponds
to the first sample clock pulse. This ensures the data returned is always valid data. For
acquisitions that use a Pause Trigger, the trigger could invalidate the samples in the
pipeline if the trigger is asserted longer than the pipeline depth divided by the
minimum sampling rate. For instance, if the device has a pipeline depth of three and a
minimum sampling rate of 1000 samples per second, data should not sit in the
pipeline for more than 3 ms. This gives up to a maximum of 3 ms for the Pause Trigger

468 ni.com
 NI-DAQmx Device Considerations

to remain asserted and three sample clocks to be detected before the data in the
pipeline deteriorates past specifications. In the case of a Pause Trigger, NI-DAQmx does
not detect or throw out any invalid samples. You must detect this situation and deal
with any invalid samples as appropriate.

Analog Output

When using an external ao/SampleClock for finite generations, you need to provide
one more sample clock pulse than the number of samples in the generation for the
Wait Until Done function/VI to indicate the task is complete. For example, if you want
to generate 1000 samples using an external sample clock, you need to provide 1001
sample clock pulses, or the Wait Until Done function/VI never indicates the task is
done. All of the samples are generated, but the analog output timing engine needs one
additional clock pulse to indicate the generation is complete. If you are trying to
synchronize an analog output generation with another acquisition or generation by
sharing a common clock, use the ao/SampleClock as the master clock, or key off of the
generation or acquisition providing the master clock to determine when the
generation is complete.

Note For S Series devices that use the STC2 timing chip, such as the NI 6154,
you do not need to apply an extra sample clock pulse to complete the task.

Timing Considerations for SC Express Devices

Related concepts:

• Synchronizing X Series, M Series, and SC Express Devices

Sampling Rate Considerations

NI 433x devices and the NI 4340 have both a maximum and a minimum sampling rate.
Refer to the specifications for your device to determine the sampling rate range.

The NI 4309, NI 4353, and NI 4357 use multiplexed sampling with multiple ADCs. The
maximum sampling rate of a NI 4309, NI 4353, or NI 4357 depends on how many
channels you are acquiring, and which channels you are acquiring from. Setting the
AI.ADCTimingMode and AI.ADCCustomTimingMode properties/attributes for the NI

© National Instruments 469

 NI-DAQmx Device Considerations

4353 or NI 4357 also affects the maximum sampling rate.

Other Timing Considerations

NI 433x devices do not support external clocking from arbitrary external signal sources
such as encoders and tachometers. You can program a NI 433x device to use an
external timebase only when it is a slave in multi-device synchronized system. Refer to
Synchronizing X Series, M Series, and SC Express Devices for more details.

The NI 4340 supports external clocking only in hardware-timed single-point sample

mode.

Timing Considerations with Standalone NI CompactDAQ

Systems
While Standalone NI CompactDAQ systems, such as the NI cDAQ-9132, 9133, 9134,
9135, 9136, and 9137 can be programmed with and run the LabVIEW Real-Time
Module, the hardware and software architecture is optimized for data logging
applications rather than for real-time control applications. This means that Standalone
NI CompactDAQ systems are ideal for streaming many channels to or from disk for
extended periods of time, but should not be used for applications that require hard
determinism. The Standalone NI CompactDAQ hardware and software architectures
are not designed for deterministic operation.

Note

• Standalone NI CompactDAQ systems do not support hardware-timed

single-point sample mode or hardware-timed non-buffered sample
mode.
• Standalone NI CompactDAQ systems do not support DAQ events as
timing sources for time loops.

Sample Rate Considerations

The maximum sample rate depends on several factors, including the settling time for

470 ni.com
 NI-DAQmx Device Considerations

your device, the number of channels in the task, and whether your device uses
simultaneous sampling (one ADC per channel) or multiplexed sampling (one ADC for
all analog input channels). To find the maximum sample rate for your device, use the
Sample Clock:Maximum Sample Rate attribute/property.

Sample Clock-Timed Pulse Train Generation

X Series and 661x devices support buffered, sample clock-timed pulse train generation.
M Series, S Series, TIO, and E Series devices do not. Refer to your device
documentation for additional information on supported counter functionality.

Device-Specific Sampling Methods

S Series and X Series simultaneous sampling devices use simultaneous sampling. M
Series, E Series, all other X Series devices use multiplexed sampling.

C Series devices in CompactDAQ chassis41, TestScale modules in TestScale chassis42,

CompactDAQ controllers43, CompactRIO controllers44 and CompactRIO Single-Board
controllers45 use both simultaneous and multiplexed sampling, where all devices in
the chassis share the same sample clock. Devices, such as the NI 9215, with an ADC for
each analog channel use simultaneous sampling. Devices, such as the NI 9204 and NI
9205, with a single ADC sample in sequence use multiplexed sampling.

Each multiplexed C Series device has a separate convert clock. The convert clock
timing is based on the number of channels for that device in the task, not the total
number of channels in the task. You can set the convert clock rate on a per-device
basis using the Active Devices and AI Convert Rate attributes/properties on the DAQmx
Timing property node. The following figure depicts a ten-channel analog input task on
two simultaneous sampling C Series devices and two multiplexed sampling C Series
devices with different AI convert rates:

41. cDAQ-9171, 9174, 9178, 9179, 9181, 9184, 9185, 9188, 9188XT, 9189, and 9191
42. TS-15000 and TS-15010
43. cDAQ-9132, 9133, 9134, 9135, 9136, and 9137
44. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058
45. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638

© National Instruments 471

 NI-DAQmx Device Considerations

Sample Clock
Mod1/Ch1 Mod1/Ch1
Mod1/Ch2 Mod1/Ch2
Mod2/Ch1 Mod2/Ch1
Mod2/Ch2 Mod2/Ch2

Mod3 Convert Clock

Mod3/Ch1

Mod3/Ch2

Mod3/Ch3

Mod3/Ch1

Mod3/Ch2

Mod3/Ch3
Mod4 Convert Clock
Mod4/Ch1

Mod4/Ch2

Mod4/Ch3

Mod4/Ch1

Mod4/Ch2

Mod4/Ch3
Related concepts:

• Multiplexed Versus Simultaneous Sampling

Timing Considerations for X Series Devices

X Series USB devices do not support hardware-timed single-point sample mode or
Wait for Next Sample Clock.

Timestamps
Network-synchronized devices support four timestamp resources that allow for
timestamping the first sample clock, start trigger, arm start trigger (counters only) or
reference trigger.

The timestamp resources will be used to provide an accurate t0 for waveform reads
with timed acquisitions that will correspond to the first sample clock for Analog Input
and Digital Input tasks. Therefore, the first sample timestamp is enabled by default for
these types of tasks.

The timestamp timescale can be configured using the Timestamp.Timescale attribute/

property. Time triggers and timestamps can be specified in I/O Device Time or Host
Time, depending on the needs of your application.

• I/O Device Time

Shared by all network-synchronized devices on your 802.1AS subnet. I/O Device

Time is most useful for synchronizing events across multiple chassis or correlating
timestamps from multiple chassis, because even though it may be in an obscure

472 ni.com
 NI-DAQmx Device Considerations

time scale (for example, related to a point in the distant past, such as the Linux
1970 epoch), it removes other sources of skew related to Windows system time or
other systems that are not network-synchronized to the same 802.1AS subnet. In
that way, it provides best time trigger and timestamp accuracy but may reduce
usability if it is not correlated to a recognizable global time. I/O Device Time also
has the advantage of being monotonically increasing, so time triggers and
timestamps spread across multiple devices or tasks accurately maintain their
offsets from each other.

• Host Time

The timescale your PC or NI Linux Real-Time controller uses. In cases where the NI
Linux Real-Time controller is the Grand Master of your 802.1AS subnet, Host Time
and I/O Device Time are the same. However, Host Time is typically synchronized to
a local Real Time Clock or a Network Time Protocol server, and it is usually
traceable to global time. Using Host Time is more intuitive because triggers and
timestamps on the chassis are specified in times that are easily correlated to your
local system time. However, this usability comes at the cost of reduced relative
accuracy between time triggers and timestamps that are spread across multiple
devices or tasks, because using the calculated offset between the two timescales is
not as accurate as using I/O Device Time directly. To help account for this loss of
accuracy in a specific and common use-case, NI-DAQmx guarantees that two
events that are scheduled for the same Host Time are guaranteed to start at the
same I/O Device Time, preserving precise synchronization between chassis.

The number of available timestamp resources can be queried using the

NumTimestampEngines attribute/property.

Network-synchronized devices include the following devices:

• cDAQ-9185, and 9189.

• FD-11601, FD-11603, FD-11605, FD-11613, FD-11614, FD-11634, and FD-11637.
• cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056,
9057, and 9058.
• sbRIO-9603, 9608, 9609, 9628, 9629, and 9638.

Related concepts:

© National Instruments 473

 NI-DAQmx Device Considerations

• First Sample Timestamp

• Using Wait for Valid Timestamp VI
• Sync Lock Lost Detection
• Triggering
• Time-Based Features for Network-Synchronized Devices

Using Wait for Valid Timestamp VI

The Wait for Valid Timestamp VI waits until the selected timestamp is available and a
value is returned. Possible timestamps are Start Trigger, Reference Trigger, Arm Start
Trigger and First Sample.

First Sample Timestamp

The first sample timestamp corresponds to the time of the first sample clock pulse in a
task.

The First Sample Timestamp attribute/property can only be enabled for hardware
timed tasks, and is enabled by default for Analog Input and Digital Input tasks. For
Digital Input tasks as well as C Series Slow Sample and Delta-Sigma Devices, the first
sample timestamp will be the t0 for waveform reads. For C Series Scanned Devices, the
t0 for waveform reads will be the first sample timestamp plus an additional delay to
more accurately reflect the time at which the sample was taken.

Related concepts:

• C Series Device Groupings

Configurable ADC Timing

On some devices, you can configure high-speed, high-resolution, or low-noise
measurements using the AI.ADCTimingMode attribute/property. The following devices
support configurable ADC Timing.

• FD-11613 and FD-11614

• NI 9207, NI 9208, NI 9212, NI 9213, NI 9217, and NI 9219
• NI 4353 and NI 4357

474 ni.com
 NI-DAQmx Device Considerations

Related concepts:

• Configurable Timing for SC Express Devices

• Timing Considerations for C Series Devices

Configurable Timing for SC Express Devices

On the NI 4353 and NI 4357, you can configure high-speed or high-resolution
measurements using the AI.ADCTimingMode attribute/property. You can also
configure a custom value. To configure a custom value, do the following:

1. Set the AI.ADCTimingMode attribute/property to Custom.

2. Specify a custom value with the AI.ADCCustomTimingMode attribute/property. A
smaller value is the lowest noise option while a larger value is the highest speed
option. Refer to your device documentation for additional information on custom
values.

Multiple Timing Engines

The following devices have multiple timing engines on some subsystems.

• NI 4302, 4303, 4304, 4305, 4339, 4340, 4463, 4464, 4480, and 4481
• NI 6533 and 6534
• cDAQ-9132, 9133, 9134, 9135, 9136, 9137, 9174, 9178, 9179, 9184, 9185, 9188,
9188XT, and 9189
• TS-15000 and TS-15010
• cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056,
9057, and 9058
• sbRIO-9603, 9608, 9609, 9628, 9629, and 9638

Related concepts:

• Timing Engines
• NI 4302, 4303, 4304, 4305 Timing Engines
• NI 4339, 4463, 4464 Timing Engines
• NI 4340 Timing Engines
• NI 4480, 4481 Timing Engines

© National Instruments 475

 NI-DAQmx Device Considerations

• NI 6533, 6534 Timing Engines

• cDAQ-91xx and TestScale Chassis Timing Engines
• CompactRIO Timing Engines

NI 4302, 4303, 4304, 4305 Timing Engines

The 4302, 4303, 4304, and 4305 have four timing engines. Each of these timing engines
can have its own configuration settings for timing, triggering, and the sample mode
(either buffered or hardware timed single point).

Each timing engine can use any AI channel and can control up to eight channels. Each
channel can only be used once across all timing engines.

By default, NI-DAQmx automatically selects an available timing engine when reserving

the task. Use the DAQmx Timing attribute/property SampTimingEngine to specify the
timing engine to use or to determine which timing engine NI-DAQmx automatically
selected.

Note You must reserve the task before querying the timing engine unless
you explicitly specified the timing engine.

The SampTimingEngine attribute/property is an integer value corresponding to one of

the four analog input timing engines available on the device:

SampTimingEngine Value Timing Engine Used

0 te0
1 te1
2 te2
3 te3

If a task has more than eight channels, NI-DAQmx automatically uses multiple timing
engines, synchronizing and sharing settings across all timing engines. All timing
engines in a single task must share the same settings.

For example, if a task has 10 channels, NI-DAQmx uses two timing engines, which

476 ni.com
 NI-DAQmx Device Considerations

leaves two timing engines for other tasks. If the task has 32 channels, all four timing
engines are used.

Each channel's digital filter settings can be configured independently if the channel is
used in a task in buffered sample mode. For tasks using HWTSP sample mode, all
channels in the task must have the same digital filter configuration.

Related concepts:

• Digital AI Filtering

NI 4339, 4463, 4464 Timing Engines

The NI 4339 and 4464 provide timing engines for analog input. The NI 4463 provides
timing engines for analog output. Multiple timing engines allow those devices to run
up to two tasks simultaneously, each using independent timing and triggering
configurations.

By default, NI-DAQmx automatically selects an available timing engine when reserving

the task. Use the DAQmx Timing attribute/property SampTimingEngine to specify the
timing engine to use or to determine which timing engine NI-DAQmx automatically
selected.

Note You must reserve the task before querying the timing engine unless
you explicitly specified the timing engine.

The SampTimingEngine attribute/property is an integer value corresponding to one of

the two analog input timing or analog output engines available on the device:

SampTimingEngine Value Timing Engine Used

0 te0
1 te1

On the NI 4339, 4463, and 4464, the Sample Clock and Sample Clock Timebase, as well
as the Start and Reference triggers, exist on each timing engine. Therefore, the names

© National Instruments 477

 NI-DAQmx Device Considerations

of the output terminals for those signals include the associated timing engine. If NI-
DAQmx automatically selects the timing engine for a task, the timing engine, thus the
output terminals for those signals, are undefined until you reserve the task. To
reference one of those terminals, such as to share a Start Trigger across multiple tasks,
use the Terminal attribute/property associated with each signal to determine the
terminal name.

Note You must reserve the task before querying the terminal name unless
you explicitly specify the timing engine.

Note The NI 4339 only supports running a single buffered task and a single
hardware-timed single-point task simultaneously.

Related concepts:

• Timing Engines
• Reserved State
• Syntax for Terminal Names
• Terminals

NI 4340 Timing Engines

The 4340 has four timing engines. Each of these timing engines can have its own
configuration settings for timing, triggering, and the sample mode (either buffered or
hardware timed single point).

Each timing engine can use any AI channel and can control up to four channels. Each
channel can only be used once across all timing engines.

By default, NI-DAQmx automatically selects an available timing engine when reserving

the task. Use the DAQmx Timing attribute/property SampTimingEngine to specify the
timing engine to use or to determine which timing engine NI-DAQmx automatically
selected.

Note You must reserve the task before querying the timing engine unless
you explicitly specified the timing engine.

478 ni.com
 NI-DAQmx Device Considerations

The SampTimingEngine attribute/property is an integer value corresponding to one of

the four analog input timing engines available on the device:

SampTimingEngine Value Timing Engine Used

0 te0
1 te1
2 te2
3 te3

NI 4466 and 4467 Timing Engines

The NI 4466 and 4467 provide four timing engines, two for analog input and two for
analog output. Multiple timing engines allow those devices to run up to two analog
input and two analog output tasks simultaneously, each using independent timing
and triggering configurations.

By default, NI-DAQmx automatically selects an available timing engine when reserving

the task. Use the DAQmx Timing attribute/property SampTimingEngine to specify the
timing engine to use or to determine which timing engine NI-DAQmx automatically
selected.

Note You must reserve the task before querying the timing engine unless
you explicitly specified the timing engine.

The SampTimingEngine attribute/property is an integer value corresponding to one of

the four analog input timing or analog output engines available on the device:

SampTimingEngine Value Timing Engine Used

0 te0
1 te1
2 te2
3 te3

© National Instruments 479

 NI-DAQmx Device Considerations

The Sample Clock and Sample Clock Timebase, as well as the Start and Reference
triggers, exist on each timing engine. Therefore, the names of the output terminals for
those signals include the associated timing engine. If NI-DAQmx automatically selects
the timing engine for a task, the timing engine, thus the output terminals for those
signals, are undefined until you reserve the task. To reference one of those terminals,
such as to share a Start Trigger across multiple tasks, use the Terminal attribute/
property associated with each signal to determine the terminal name.

Note You must reserve the task before querying the terminal name unless
you explicitly specify the timing engine.

NI 4480, 4481 Timing Engines

The NI 4480 and 4481 provide timing engines for analog input. Multiple timing engines
allow those devices to run up to three tasks simultaneously, each using independent
timing and triggering configurations.

By default, NI-DAQmx automatically selects an available timing engine when reserving

the task. Use the DAQmx Timing attribute/property SampTimingEngine to specify the
timing engine to use or to determine which timing engine NI-DAQmx automatically
selected.

Note You must reserve the task before querying the timing engine unless
you explicitly specified the timing engine.

The SampTimingEngine attribute/property is an integer value corresponding to one of

the two analog input timing or analog output engines available on the device:

SampTimingEngine Value Timing Engine Used

0 te0
1 te1
2 te2

On the NI 4480 and 4481, the Sample Clock and Sample Clock Timebase, as well as the

480 ni.com
 NI-DAQmx Device Considerations

Start and Reference triggers, exist on each timing engine. Therefore, the names of the
output terminals for those signals include the associated timing engine. If NI-DAQmx
automatically selects the timing engine for a task, the timing engine, thus the output
terminals for those signals, are undefined until you reserve the task. To reference one
of those terminals, such as to share a Start Trigger across multiple tasks, use the
Terminal attribute/property associated with each signal to determine the terminal
name.

Note You must reserve the task before querying the terminal name unless
you explicitly specify the timing engine.

NI 6533, 6534 Timing Engines

NI 6533 and 6534 devices provide two timing engines for digital I/O. Multiple timing
engines allow those devices to run up to two tasks simultaneously, each using
independent timing and triggering configurations. Also, each timing engine uses
different lines for handshaking and burst handshaking.

By default, NI-DAQmx assigns a timing engine based on the ports used in the task.
Refer to device documentation to determine which ports use which timing engine. Use
the DAQmx Timing property/attribute SampTimingEngine to specify the timing engine
to use or to determine which timing engine NI-DAQmx automatically selected.

The SampTimingEngine property/attribute is an integer value corresponding to one of

the two timing engines available on the device:

SampTimingEngine Value Timing Engine Used

0 dig0
1 dig1

On NI 6533 and 6534 devices, the Sample Clock and Sample Clock Timebase, as well as
the Start and Reference triggers, exist on each timing engine. Therefore, the names of
the output terminals for those signals include the associated timing engine.

Related concepts:

© National Instruments 481

 NI-DAQmx Device Considerations

• Timing Engines
• Handshake Timing Defaults
• Burst Handshaking Timing Defaults for NI 653x Devices
• Syntax for Terminal Names
• Terminals

cDAQ-91xx and TestScale Chassis Timing Engines

The cDAQ-91xx46[1] or TestScale47[2] chassis provide three timing engines for analog
input. Multiple timing engines allow those chassis to run up to three analog input
tasks simultaneously, each using independent timing and triggering configurations.

By default, NI-DAQmx automatically selects an available timing engine when reserving

the task. Use the DAQmx Timing attribute/property SampTimingEngine to specify the
timing engine to use or to determine which timing engine NI-DAQmx automatically
selected.

Note You must reserve the task before querying the timing engine unless
you explicitly specified the timing engine.

The SampTimingEngine attribute/property is an integer value corresponding to one of

the three analog input timing engines available on the chassis:

SampTimingEngine Value Timing Engine Used

0 te0
1 te1
2 ai

On cDAQ-91xx[1] or TestScale[2] chassis, the Sample Clock and Sample Clock

Timebase, as well as the Start, Reference, and Pause triggers, exist on each timing
engine. Therefore, the names of the output terminals for those signals include the
associated timing engine. If NI-DAQmx automatically selects the timing engine for a

46. cDAQ-9132, 9133, 9134, 9135, 9136, 9137, 9174, 9178, 9179, 9184, 9185, 9188, 9188XT, and 9189
47. TS-15000 and TS-15010

482 ni.com
 NI-DAQmx Device Considerations

task, the timing engine, thus the output terminals for those signals, are undefined
until you reserve the task. To reference one of those terminals, such as to share a Start
Trigger across multiple tasks, use the Terminal attribute/property associated with each
signal to determine the terminal name.

Note You must reserve the task before querying the terminal name unless
you explicitly specify the timing engine.

Counter Input Modules

The NI 9361 can also use te0 and te1.

Related concepts:

• Timing Engines
• Reserved State
• Syntax for Terminal Names
• Terminals

CompactRIO Timing Engines

CompactRIO48 and CompactRIO Single-Board49 controllers provide eight timing
engines for input and a separate eight timing engines for output. The eight input
timing engines are shared between analog input, digital input, and NI 9361 tasks.
Multiple input timing engines allow those chassis to run up to eight analog input,
digital input, or NI 9361 tasks simultaneously, each using independent timing and
triggering configurations.

The eight output timing engines are shared between analog output and digital output.
Multiple output timing engines allow those chassis to run up to eight analog output or
digital output tasks simultaneously, each using independent timing and triggering
configurations.

By default, NI-DAQmx automatically selects an available timing engine when reserving

the task. Use the DAQmx Timing attribute/property SampTimingEngine to specify the
timing engine to use or to determine which timing engine NI-DAQmx automatically
48. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058.
49. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638.

© National Instruments 483

 NI-DAQmx Device Considerations

selected.

Note You must reserve the task before querying the timing engine unless
you explicitly specified the timing engine.

The SampTimingEngine attribute/property is an integer value corresponding to one of

the eight timing engines available on the chassis:

Analog Input, Digital Input,

Analog Output and Digital
SampTimingEngine Value and NI 9361 Timing Engine
Output Timing Engine Used
Used
0 it0 ot0
1 it1 ot1
2 it2 ot2
3 it3 ot3
4 it4 ot4
5 it5 ot5
6 it6 ot6
7 it7 ot7

On the CompactRIO and CompactRIO Single-Board controllers, the Sample Clock and
Sample Clock Timebase, as well as the Start, Reference (for analog input, digital input,
and NI 9361 tasks only), and Pause triggers, exist on each timing engine. Therefore, the
names of the output terminals for those signals include the associated timing engine.
If NI-DAQmx automatically selects the timing engine for a task, the timing engine, thus
the output terminals for those signals, are undefined until you reserve the task. To
reference one of those terminals, such as to share a Start Trigger across multiple tasks,
use the Terminal attribute/property associated with each signal to determine the
terminal name.

Note You must reserve the task before querying the terminal name unless
you explicitly specify the timing engine.

484 ni.com
 NI-DAQmx Device Considerations

DSA
This section contains information specific to DSA devices.

Alias Rejection (DSA, C Series, and NI 433x)

DSA devices, C Series Delta-Sigma devices, and NI 433x devices employ a class of ADCs
and DACs known as delta-sigma converters. Delta-sigma ADCs include built-in digital
filters to provide alias protection from out-of-band signal components. The digital
filters always impart a delay of several samples between the time when a given analog
voltage level becomes present at the ADC input and when the converter returns the
corresponding digitized value. The length of this delay is always deterministic for a
particular device running at a given sampling rate.

Likewise, interpolators and delta-sigma DACs provide digital filtering on analog output
signals to eliminate out-of-band imaging and quantization noise. As with analog input,
the digital output filtering results in a deterministic delay through the DAC.

You can safely ignore the effects of the digital filter delay for most input-only or output-
only applications. The filter delay can become significant for applications requiring
input and output synchronization such as stimulus-response testing and tight loop
control. For DSA and C Series devices, if your application employs external digital
triggering, the acquisition returns data that occurred in time before the trigger event.
The number of samples preceding the trigger matches the ADC filter delay. Refer to
your device documentation for more details on the ADC and DAC digital filter delays.

Alias Rejection at Low Sample Rates (DSA, C Series, and NI 4330/1)

At very low sample rates, the anti-aliasing filters for AI channels on DSA devices, C
Series Delta-Sigma devices, NI 4330, and NI 4331 devices may not completely reject all
out-of-band signals. This is primarily due to the internal digital filter of the delta-sigma
ADC, which cannot suppress signals with frequencies near the multiples of the
oversample rate (sampling rate multiplied by oversample factor). These devices also
employ fixed cutoff analog lowpass anti-aliasing filters, but at low sample rates, some
multiples of the oversample rate can fall below the cutoff frequency of the analog anti-
aliasing filter.

© National Instruments 485

 NI-DAQmx Device Considerations

For example, for a device using ADCs with an oversample factor of 128X and sampling
at a rate of 1 kS/s, the oversample rate is 128 kHz. Some multiples of that oversample
rate fall below the cutoff of the analog anti-aliasing filter. If the signal to be digitized
contains energy near these frequencies, aliasing can result.

One way to prevent aliasing is to raise the sample rate so that the first 128X multiple of
the sample rate falls above the cutoff of the analog anti-aliasing filter. For example, a
sample rate of 25.6 kS/s is not subject to aliasing because the first 128X multiple (3.2
MHz) is well above the cutoff frequency of the analog anti-aliasing filter. Some DSA
devices support enhanced alias rejection, which automatically handles alias rejection
at low sample rates. Refer to the device documentation for the specifics of your device.

Related concepts:

• C Series Device Groupings

• Enhanced Alias Rejection
• Alias Rejection at Low Sample Rates (DSA, C Series, and NI 4330/1)

Enhanced Alias Rejection

To avoid aliasing at low sample rates, some DSA devices support enhanced alias
rejection. With enhanced alias rejection enabled, the device clocks the ADCs at a
multiple of the user-specified sample rate. This results in an improvement in low-
frequency alias rejection. With enhanced alias rejection enabled, you do not need to
scale the desired sample rate, and you do not need to programmatically decimate data
the device returns.

Enhanced alias rejection is controlled with the AI.EnhancedAliasRejectionEnable

attribute/property. Enhanced alias rejection is enabled by default on NI 4461/4462
devices and disabled by default on NI 447x and NI 449x devices.

Note The original versions of NI 447x devices do not support Enhanced Alias
Rejection. Refer to Dynamic Signal Acquisition Help for more
information.

Related concepts:

486 ni.com
 NI-DAQmx Device Considerations

• Alias Rejection at Low Sample Rates (DSA, C Series, and NI 4330/1)

Synchronization Issues

When synchronizing multiple devices, set the AI.EnhancedAliasRejectionEnable

attribute/property to the same value on all devices. If any of the synchronized devices
do not support enhanced alias rejection, set AI.EnhancedAliasRejectionEnable to
FALSE on all devices. When synchronizing devices from different categories, NI 4461/
4462 with NI 447x for example, set AI.EnhancedAliasRejectionEnable to FALSE on all
devices.

Channel Order
On DSA devices, you must list channels in a task in ascending order. For example, if
your task includes ai0 and ai1, you must arrange the channel list such that ai0
precedes ai1.

This constraint applies to virtual channels as well as physical channels. For example, if
you include a virtual channel for ai0 named vibration and a virtual channel for ai1
named proxProbe, vibration must precede proxProbe in the channel list.

DSA, C Series, and the DAQmx I/O Server

DSA devices and C Series Delta-Sigma devices do not support the DAQmx I/O Server.

Related concepts:

• C Series Delta-Sigma Devices

Filter Delay Removal

NI 4302, 4303, 4304, 4305, 433x, 4340, 4464, 4466, 4467, 4480, 4481, and 449x devices
support filter delay removal, which automatically discards filter delay samples. The
AI.RemoveFilterDelay attribute/property controls the filter delay removal.

On NI 449x devices, the AI.RemoveFilterDelay attribute/property is disabled by default.

© National Instruments 487

 NI-DAQmx Device Considerations

On NI 4302, 4303, 4304, 4305, 433x, 4340, 4464, 4466, 4467, 4480, and 4481 devices, the
AI.RemoveFilterDelay attribute/property is enabled by default. On the NI 4330/4331,
filter delay removal is always enabled.

On NI 4302, 4303, 4304, 4305, 4339, 4340, 4464, 4466, 4467, 4480, and 4481 devices,
you can use the AI.FilterDelayAdjustment attribute/property to further adjust which
samples to discard. This adjustment is relative to the amount of filter delay in the
device, which is indicated by the AI.FilterDelay attribute/property.

If you disable the AI.RemoveFilterDelay attribute/property, you must compensate for

filter delay samples. Refer to your device documentation for information on how many
filter delay samples to compensate for on your device.

Filter Delay (DSA, C Series, and NI 433x)

The delta-sigma ADCs and DACs on DSA devices, C Series Delta-Sigma devices, and NI
433x devices employ digital filtering that imparts a delay of several sample intervals.
The filter delays are equal in a homogeneous system, so these delays cancel out when
performing phase measurements between channels. However, the filter delays differ
in a heterogeneous system. This can introduce errors in phase comparisons between
channels on different devices or between channels on similar devices running at
different rates. Such phase errors are always deterministic, and you can account for
them in software.

Related concepts:

• C Series Device Groupings

Gain for DSA Devices

On DSA devices, each gain setting corresponds to a particular range centered on 0 V.
The gain settings are specified in decibels (dB), where the 0 dB reference is the default
range of ±10 V.

For analog input operations, a negative gain value implies attenuation of the signal
before the ADC, increasing the range beyond ±10 V. Thus, an input gain setting of –10
dB corresponds to an input range of ±31.6 V. On analog output, a negative gain value

488 ni.com
 NI-DAQmx Device Considerations

implies attenuation following the DAC. This decreases the output range. For instance,
an output gain setting of –20 dB corresponds to an output range of ±1 V.

NI-DAQmx has three separate attribute/property sets you can use to control the
hardware gain setting. Each has a different priority. If you write values to two or more
of these attributes/properties that correspond to different hardware gain settings, the
one with the highest priority will determine the hardware behavior.

• Gain Attributes/Properties—The gain attributes/properties AI.Gain and AO.Gain

set the amount of gain to apply to the signal. These properties are set in decibels
referenced to 10 V. These properties have the highest priority in NI-DAQmx.
• Range Attributes/Properties—The range attributes/properties AI.Rng.High,
AI.Rng.Low, AO.DAC.Rng.High, and AO.DAC.Rng.Low define the maximum and
minimum voltages you can acquire or generate. The range attributes/properties
have a lower priority than the gain attributes/properties, but a higher priority than
the maximum and minimum attributes/properties.
• Maximum and Minimum Attributes/Properties—The maximum and minimum
attributes/properties AI.Max, AI.Min, AO.Max, and AO.Min specify values in
engineering units that define the range. These attributes/properties have the
lowest priority in NI-DAQmx. They are also the most commonly used since you can
set them immediately when an NI-DAQmx task is created.

Hardware Data Compression (DSA and NI 433x)

If the raw data compression type is set to lossless packing and all channels in a task
support hardware compression, hardware data compression is enabled by default.
However, if any channels do not support hardware data compression, software data
compression is selected by default.

Integrated Electronic Piezoelectric Excitation (IEPE)

If you attach an IEPE accelerometer or microphone to an AI channel that requires
excitation from a device such as a DSA device, NI 9230, NI 9231, NI 9232, NI 9234 or an
NI 925050, you must enable the IEPE excitation circuitry for that channel to generate
the required current. IEPE signal conditioning can be independently configured on a

50. Devices are listed as examples and are not intended to be a comprehensive list. Refer to the device
documentation for the IEPE specifications of your device.

© National Instruments 489

 NI-DAQmx Device Considerations

per-channel basis.

To enable the IEPE current source on your device, use the Channel attribute/property
AI.Excit.Val to specify a current in amperes. Some devices allow multiple excitation
current values such as 0.004 A and 0.01 A. Other devices allow only a single value such
as 0.004 A. A value of 0 A disables the IEPE excitation. Refer to the device
documentation for details on your device.

Note

• You cannot enable IEPE excitation on DSA devices when the terminal
configuration is differential. The exception is NI 9218 which has
optional IEPE excitation and supports a differential terminal
configuration.
• Changing the IEPE excitation level may cause transient voltages to
appear in the signal. NI-DAQmx does not implement a delay to allow
the signal to settle. Therefore, after changing the IEPE level and
committing this change to the hardware with the Start function/VI or
the Control Task function/VI, you might add a software delay to allow
the signal to settle before proceeding with your application.

A DC offset is generated equal to the product of the excitation current and sensor
impedance when IEPE signal conditioning is enabled. To remove the unwanted offset,
you should enable AC coupling. Using DC coupling with IEPE excitation enabled is
appropriate only if the offset does not exceed the voltage range of the channel.

Input Coupling
You can configure each AI channel of your DSA device to be either AC or DC coupled,
with the exception of the NI 4495, the NI 4496, and the NI 4498 devices, which are AC
coupled only. If you select DC coupling, any DC offset present in the source signal is
passed to the ADC. The DC-coupled configuration is usually best if the signal source
has only small amounts of offset voltage, less than ±100 mV, or if the DC content of the
acquired signal is important.

If the source has a significant amount of unwanted DC offset (bias voltage), you should

490 ni.com
 NI-DAQmx Device Considerations

select AC coupling to take full advantage of the input dynamic range. Selecting AC
coupling enables a single-pole, high-pass resistor-capacitor (RC) filter into the positive
and negative signal path. Refer to your device documentation for additional
information on the filter circuitry.

Use the NI-DAQmx Channel attribute/property AI.Coupling to set the input coupling
mode on your DSA device.

If you create a virtual channel for acceleration or sound pressure measurements with
your DSA device, the input coupling for the channel defaults to AC. For other types of
virtual channels, the input coupling defaults to DC.

Note NI-DAQmx does not compensate for the settling time or delay
introduced by the RC filter.

Using AC coupling results in a drop in the low-frequency response of the AI circuitry.

The AC coupling circuitry is usually characterized by a 3 dB cut-off frequency. However,
the roll off from the high-pass filter can have a measurable effect even at frequencies
several times greater than the 3 dB point.

Overload Detection
DSA devices support overload detection in both the analog domain (pre-digitization)
and digital domain (post-digitization). An analog overrange can occur independently
from a digital overrange, and vice versa. For example, an IEPE accelerometer might
have a resonant frequency that, when stimulated, can produce an overrange in the
analog signal. However, because the delta-sigma technology of the ADC uses very
sharp anti-aliasing filters, the overrange is not passed into the digitized signal.
Conversely, a sharp transient on the analog side might not overrange, but the step
response of the delta-sigma anti-aliasing filters might result in clipping in the digital
data.

Some DSA devices support both analog and digital overload detection, while others
support only digital overload detection. Consult your device documentation for more
information on the overload detection capabilities for your device.

Two NI-DAQmx Read attributes/properties allow you to check for overloaded channels.

© National Instruments 491

 NI-DAQmx Device Considerations

The first is OverloadedChansExist. This attribute/property returns a Boolean true if one

or more channels experience an overload condition. The second is OverloadedChans.
This attribute/property returns an array of strings indicating which channels (if any)
experienced an overload condition. You must query the OverloadedChansExist
attribute/property before querying the OverloadedChans attribute/property.

OverloadedChansExist reads the overload condition from the device and caches it in
the driver. It also resets the overload condition of the device after it is read.
Subsequent reads of OverloadedChans attribute/property will read the overloaded
channel information cached in the driver from the previous OverloadedChansExist
query.

Note NI-DAQmx returns all data whether or not an overload occurs. If your
application requires overload checking, it is recommended that you read the
overload attributes/properties after each call to Read. Your program should
discard questionable data or return a flag when the driver reports an
overload.

Simultaneous Tasks
The following devices can run multiple tasks simultaneously on some subsystems.

• NI 4302, 4303, 4304, 4305, 4339, 4340, 4463, 4464, 4466, and 4467
• NI 6533 and 6534
• cDAQ-9132, 9133, 9134, 9135, 9136, 9137, 9174, 9178, 9179, 9184, 9185, 9188,
9188XT, and 9189
• TS-15000 and TS-15010
• cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056,
9057, and 9058
• sbRIO-9603, 9608, 9609, 9628, 9629, and 9638

Related concepts:

• NI 4302, 4303, 4304, 4305 Simultaneous Tasks

• NI 4339, 4463, and 4464 Simultaneous Tasks
• NI 4480 and 4481 Simultaneous Tasks
• NI 6533/6534 Simultaneous Tasks

492 ni.com
 NI-DAQmx Device Considerations

• CompactDAQ, CompactRIO, and TestScale Simultaneous Tasks

NI 4302, 4303, 4304, 4305 Simultaneous Tasks

The 4302, 4303, 4304, and 4305 can run up to four analog input tasks simultaneously,
each using independent timing and triggering configurations. Each task uses at least
one of the four timing engines on the device.

Each timing engine can control up to eight channels. If a task has more than eight
channels, NI-DAQmx automatically uses multiple timing engines for the task,
synchronizing and sharing settings across all timing engines. For example, if a task has
10 channels, NI-DAQmx uses two timing engines for the task, which leaves two timing
engines for other tasks. If the task has 32 channels, all four timing engines are used for
one task.

Each bank of 8 ADCs (ai0:7, ai8:15, ai16:23, ai23:31) must all be in the same sample
mode (buffered or hardware timed single point). For example, if ai0 is used in a task
configured for hardware timed single point, any task using ai1:7 must also use the
hardware timed single point sample mode.

Each channel's gain can be independently configured regardless of what task it's in or
what sample mode it's used with.

Related concepts:

• NI 4302, 4303, 4304, 4305 Timing Engines

NI 4339, 4463, and 4464 Simultaneous Tasks

NI 4339, 4463, and 4464 devices can run up to two tasks simultaneously, each using
independent timing and triggering configurations. Each task uses one of the two
timing engines on the device.

The NI 4339 only supports running a single buffered task and a single hardware-timed
single-point task simultaneously.

© National Instruments 493

 NI-DAQmx Device Considerations

NI 4340 Simultaneous Tasks

NI 4340 devices can run up to four tasks simultaneously, each using independent
timing and triggering configurations. Each task uses one of the four timing engines on
the device.

NI 4480 and 4481 Simultaneous Tasks

NI 4480 and 4481 devices can run up to three tasks simultaneously, each using
independent timing and triggering configurations. Each task uses one of the three
timing engines on the device.

Each timing engine can be individually configured for frequency-domain mode

(Sample Rate ≤ 1.25 MS/s) or time-domain mode (Sample Rate > 1.25 MS/s). For
information on the differences between frequency-domain and time-domain mode
refer to the PXIe-4480/4481 User Manual.

NI 6533/6534 Simultaneous Tasks

NI 6533 and 6534 devices can run up to two tasks simultaneously, each using
independent timing and triggering configurations. Each task uses one of the two
timing engines on the device.

Related concepts:

• NI 6533, 6534 Timing Engines

CompactDAQ, CompactRIO, and TestScale Simultaneous

Tasks
To achieve maximum performance and synchronization, synchronize all analog input
channels across modules or output channels across modules by combining them into
a single task to create a multidevice task. This is only plausible if all channels in the
task have the same timing needs.

The remainder of this topic provides information regarding how many tasks you can

494 ni.com
 NI-DAQmx Device Considerations

run simultaneously at different rates on the following controllers:

• Gen II CompactDAQ chassis:

◦ cDAQ-9132, 9133, 9134, 9135, 9136, and 9137
◦ cDAQ-9171, 9174, 9178, 9179
◦ cDAQ-9181, 9184, 9185, 9188, 9188XT, and 9189
◦ cDAQ-9191
• cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056,
9057, and 9058
• sbRIO-9603, 9608, 9609, 9628, 9629, and 9638
• TS-15000 and TS-15010

Because hardware timed tasks typically use more onboard resources than software
timed tasks, the total number of possible concurrent tasks typically depends on
whether you are running tasks that use hardware timing or software (on demand)
timing.

Related concepts:

• C Series Multidevice Tasks

• cDAQ-91xx and TestScale Chassis Timing Engines
• CompactRIO Timing Engines

Hardware-Timed Tasks

Hardware-timed tasks require timing information from the System Timing Controller
to use for sample clocks, reference clocks, triggers, and so on.

The System Timing Controller for the Gen II chassis has the following timing engines
built in:

• Three AI timing engines

• One AO timing engine
• One DI timing engine
• One DO timing engine
• Four general purpose counters

The System Timing Controller for the CompactRIO controller has the following timing

© National Instruments 495

 NI-DAQmx Device Considerations

engines built in:

• Eight input timing engines shared between AI and DI

• Eight output timing engines shared between AO and DO
• Four general purpose counters

The following table illustrates the number of hardware timed tasks available to the
user.

CompactDAQ,
CompactDAQ and CompactRIO/Single- CompactRIO, Single-
Hardware-Timed
TestScale: Number of Board RIO: Number of Board RIO, TestScale:
Tasks
Tasks per Chassis Tasks per Controller Number of Tasks per
Module

Analog Input 351 852[2] 1

Analog Output 1 8[2] 1

Counter Input/Output 4, 253[3] 4, 8[2]54[4] 4, 155[5]

Digital Input 1 8[2] 1

Digital Output 1 8[2] 1

51. The number of analog input tasks for Dynamic Signal Analyzer (DSA) devices in Gen II NI
CompactDAQ chassis is limited to two because the chassis support a maximum of two
synchronization pulse signals, which is required when using devices with different oversample clock
timebases, such as DSA.
52. On Single-Board RIO controllers, you can have one task at a time per slot or onboard IO module. The
number of slots and onboard IO modules varies by sbRIO device. See the specifications for your
device.
53. On the Gen II NI CompactDAQ chassis, there is a limit of two NI 9361 tasks per chassis.
54. On CompactRIO controllers, there is a limit of eight NI 9361 tasks per chassis. On Single-Board RIO
Controllers, there is a limit of one NI 9361 task per slot. You can add counter channels from one or
more NI 9361s to a single task. Using the NI 9361s and the 4 general purpose counters, there can be a
total of 12 tasks.
55. One NI 9361 only supports a single task. Therefore, multiple counters from a NI 9361 must be used in
the same task. Other parallel digital modules allow creating separate tasks for each one of the four
onboard counters from the chassis.

496 ni.com
 NI-DAQmx Device Considerations

Streaming Limitations on CompactDAQ Gen II Chassis

On CompactDAQ and TestScale chassis, there is also a streaming buffer for hardware
timed tasks that puts a limit on the total number of hardware timed tasks that can run
simultaneously. The NI cDAQ-9171/9181/9191 support six data streams and the
remaining models support seven data streams. These independent, high-speed data
streams allow for up to six or seven simultaneous hardware-timed tasks, such as
analog input, analog output, buffered counter/timers, hardware-timed digital input/
output, or CAN communication.

Note CAN communication always takes up two data streams, but does not
use any timing engines.

On CompactDAQ and TestScale chassis, the data streams are comprised by an 8 KB

block of memory that is divided up into six or seven First In First Out (FIFO) data
buffers. These data buffers vary in size, and the largest data buffers are assigned to the
first tasks that get reserved. Therefore, to get the best streaming performance, make
sure to reserve your highest bandwidth tasks first. Your first two tasks will reserve 2048
bytes each, the third, fourth and fifth tasks will reserve 1024 bytes each and the sixth
and seventh tasks will reserve 512 bytes each.

Software-Timed Tasks

Most software-timed tasks do not require a signal from the System Timing Controller
to run. Software timed means the host computer is controlling how often a sample is
read from or written to the C Series module.

Analog Input tasks will still use one of the AI timing engines, so the limit for AI tasks is
always the same as hardware times tasks. Each counter input task using an NI 9361
will also use an AI timing engine. This is not the case for AO, DI, or DO. Subsequently,
the software timed task limits for these types of acquisitions depends on the number
of channels you have available to use. See following table for a summary.

© National Instruments 497

 NI-DAQmx Device Considerations

CompactDAQ,
CompactDAQ and CompactRIO, Single- CompactRIO, Single-
Software-Timed (On
TestScale: Number of Board RIO: Number of Board RIO, TestScale:
Demand) Tasks
Tasks per Chassis Tasks per Controller Number of Tasks per
Module

Analog Input 356[6] 8[][6] 1

Number of total AO Number of total AO 1 Task for each channel

Analog Output channels in chassis (up channels in controller (up to 16 tasks per
to 128 total tasks). (up to 128 total tasks). module).

Counter Input/ Output 4, 2[] 4, 8[][] 4, 1[]

Dependent on Dependent on
Digital Input modules. Typically, at modules. Typically, at 1 task per port.57[7]
least 2 static DI per slot. least 2 static DI per slot.
Dependent on Dependent on
modules. Typically, at modules. Typically, at
Digital Output
least 2 static DO per least 2 static DO per 1 task per port.[7]
slot. slot.

The number of counter tasks is always limited by the fact that you have four counters.
Depending on whether you are using a counter task that uses two counters (like
measuring frequency using the two counter methods), you may be restricted to only
two counter tasks. But typically, you can have all fout counters running
simultaneously. To determine if you need one or two counters for your counter task,
see the KnowledgeBase topic KB 4L0A62E9.

Related concepts:

• C Series Device Groupings

• Digital I/O Considerations for C Series and TestScale Devices
• Digital I/O Considerations for C Series Devices

Related information:

• Controller Area Network (CAN) Overview

56. Only Slow-Sampled modules, Multiplexed modules, and Simultaneous SAR modules support
software-timed analog input tasks.
57. The NI 9401 and TS-15050 DIO P0 are 1 task per nibble.

498 ni.com
 NI-DAQmx Device Considerations

• KB 4L0A62E9

Multidevice Tasks
Tasks can contain channels from multiple devices for these devices:

• C Series
• FieldDAQ
• S Series
• DSA, SC Express, and X Series

Related concepts:

• C Series Multidevice Tasks

• C Series Multichassis Device Tasks
• FieldDAQ Multidevice Tasks
• S Series Multidevice Tasks
• DSA, SC Express, and X Series Multidevice Tasks

C Series Multidevice Tasks

When you include channels from multiple C Series modules in a task, NI-DAQmx
automatically synchronizes the modules. A task can include channels from multiple C
Series modules, given the following conditions:

• All channels in the task must be of the same I/O type. Multiple counter I/O
channels are only allowed for Devices That Support Multi-Counter Tasks.
• If the task includes channels from a mixture of C Series Delta-Sigma devices, you
must account for filter delay differences between the devices. This delay is also
known as the input delay. Refer to your device specifications for the value.
• The modules must all be in the same NI CompactDAQ chassis or meet the
conditions for multichassis device tasks.

Note

• AI tasks containing only 16-bit or lower resolution AI modules use half

© National Instruments 499

 NI-DAQmx Device Considerations

the USB bandwidth of tasks with 24-bit AI modules.

• The format of raw data returned by a C Series AI task varies depending
on if any 24-bit AI modules are in the task and might not correspond to
the order of the channels in the task. Scaled or unscaled data is
preferable to raw data with the NI CompactDAQ chassis.
• The acquisition mode of the NI 9775 will vary depending on the other
modules in the task. If the task uses only NI 9775 modules, all the
modules can operate in Record Mode. If the task uses an NI 9775
module and other types of modules, the NI 9775 operates in
Continuous Mode.

Related concepts:

• C Series Device Groupings

• Filter Delay (DSA, C Series, and NI 433x)
• Devices That Support Multi-Counter Tasks

C Series Multichassis Device Tasks

A task can include channels from multiple C Series modules in separate CompactDAQ
chassis58, CompactDAQ controllers59, CompactRIO controllers60 and CompactRIO
Single-Board controllers61, given the following conditions:

• Network-synchronized devices 62 must be part of the same time-synchronized

network. Refer to the device specifications for supported synchronization
protocols and topologies.
• Chassis that are not network-synchronized must be connected through a NI 9469.
• If a task has a network-synchronized chassis and connections through the NI 9469
to chassis that are not synchronized, the first channel in the task must be in the
58. cDAQ-9171, 9174, 9178, 9179, 9181, 9184, 9185, 9188, 9188XT, 9189, and 9191.
59. cDAQ-9132, 9133, 9134, 9135, 9136, and 9137.
60. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058.
61. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638.
62. Network-synchronized devices include the cDAQ-9185, 9189; FD-11601, FD-11603, FD-11605,
FD-11613, FD-11614, FD-11634, FD-11637; cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049,
9053, 9054, 9055, 9056, 9057, 9058; and sbRIO-9603, 9608, 9609, 9628, 9629, and 9638.

500 ni.com
 NI-DAQmx Device Considerations

network-synchronized chassis along with the NI 9469 connection to other chassis

that are not synchronized.
• When using signal-based synchronization using the NI 9469, the first channel in the
channel list must be on a module in the master chassis. The master chassis is
determined by the physical configuration of the chassis connections, and it should
be able to output signals to the slave chassis.
• If an Analog Input task contains Delta-Sigma modules, a channel on a Delta-Sigma
module in the master chassis needs to be first on the channel list.
• If an Analog Input task contains a device with a reference clock, a channel from a
reference-clocked device needs to be first on the channel list.
• No more than one CompactRIO controller may participate in a multichassis device
task.

Exceptions

• The NI 9361 does not support multichassis device tasks.

• The NI 9260 must drive the idle output to zero. If you don't, you will receive an
error.
• The NI 9775 does not support multichassis device tasks.

Related concepts:

• Time-Based Features for Network-Synchronized Devices

DSA, SC Express, and X Series Multidevice Tasks

A task can include channels from multiple DSA, SC Express, and X Series devices, given
the following conditions. When you include channels from multiple devices in a task,
NI-DAQmx automatically synchronizes the devices and enables trigger skew correction
for the devices. All channels in a task must be of the same I/O type, such as analog
input or analog output.

Note For additional device-specific DSA synchronization information, refer

to the NI Dynamic Signal Acquisition User Manual, which you can find
at ni.com/manuals.

Related concepts:

© National Instruments 501

 NI-DAQmx Device Considerations

• Filter Delay (DSA, C Series, and NI 433x)

• Trigger Skew Correction

Analog Input

• USB X Series Devices

You cannot use USB X Series devices in multidevice tasks.

• PCIe X Series Devices

You must use a RTSI cable to connect the devices, and you must identify the cable
in MAX.

• PXI/PXIe Devices
◦ The devices must be in a single chassis, and you must identify the chassis in
MAX.
◦ NI-DAQmx accounts for filter delay differences between devices with some
qualifications:
▪ NI 4461 and 4462 devices lack the ability to compensate for filter delay.
▪ For all other devices, if the task includes channels from different device
families, NI-DAQmx will account for filter delay differences between the
devices.

Use the following table to check the multidevice task compatibility of any one device
to another device. A checkmark in a cell indicates that the devices in the
corresponding row and column can be used together in a multidevice task. For groups
of more than two devices, every device must be compatible with every other device.
An example of a group of devices that can be used in a multidevice task is the NI 4300,
4353, 4357 and PXIe X Series (63xx) as all of these devices are compatible with every
other device listed in the group.

Table 5. PXI/PXIe Multidevice Task Compatibility

4302/
Other
4303/ 4330/ 4461/ 4466/ 4480/ 6386/
4300 4309 4310 4339 4340 4353 4357 4464 449x X Series
4304/ 4331 4462 4467 4481 6396
(63xx)
4305
4300 - - - -
4302/ - - - -

502 ni.com
 NI-DAQmx Device Considerations

4303/
4304/
4305
4309 - - - - - - - - - - - -
4310 - - - - - -
4330/
- - - - - - - -
4331
4339 - - - -
4340 - - - - - -
4353 - - - - - - - - - -
4357 - - - - - - - - - - - -
4461/
- - - - - - - - -
4462
4464 - - - -
4466/
4467
4480/
- - - - -
4481
449x - - - - - - - - - - - - -
6386/
- - - - - -
6396
Other
X Series - - -
(63xx)

Analog Output

• PXIe-4463, 4466, and 4467 devices

The devices must be in a single chassis and the chassis must be identified in MAX.
All devices in the task must be PXIe-4463s.

• PXIe X Series, NI 4322, and NI 6738/6739 Devices

The devices must be in a single chassis and the chassis must be identified in MAX.

• PCIe X Series Devices

You must use a RTSI cable to connect the devices, and you must identify the cable
in MAX.

© National Instruments 503

 NI-DAQmx Device Considerations

• USB X Series Devices

You cannot use USB X Series devices in multidevice tasks.

FieldDAQ Multidevice Tasks

Multiple FieldDAQ devices can be added to the same task, and they will be
automatically synchronized. There are no restrictions on which FieldDAQ devices can
be synchronized together.

S Series Multidevice Tasks

A task can include channels from multiple S Series devices, given the following
conditions. When you include channels from multiple S Series devices in a task, NI-
DAQmx automatically synchronizes the devices.

• All Devices

All channels in the task must be analog input channels.

When you include channels from different S Series devices and use an external
clock setup, you must import the external clock into the device with the longest
pipeline of all the devices in the task. Failing to do so results in an incomplete
acquisition, with the device importing the clock not receiving enough sample clock
pulses.

• PXI Devices

The devices must all be in a single chassis, and you must identify the chassis in
MAX.

• PCI Devices

You must use a RTSI cable to connect the devices, and you must identify the cable
in MAX.

Related concepts:

504 ni.com
 NI-DAQmx Device Considerations

• Timing Considerations for S Series

Bridge Measurement Type Support

The following devices support the force, pressure, torque, and bridge (V/V)
measurement types for taking measurements from bridge-based sensors:

• NI FD-11637
• PXIe-433x
• NI 9218
• NI 9219
• NI 9235
• NI 9236
• NI 9237

C Series Device Groupings

C Series devices can be grouped into scanned devices, slow sample devices, and delta-
sigma devices based on acquisition behavior.

Note This list does not include all C Series devices.

C Series Scanned Devices

• NI 9201
• NI 9203
• NI 9204
• NI 9205
• NI 9206
• NI 9207
• NI 9208
• NI 9209
• NI 9210
• NI 9211
• NI 9213
• NI 9214
• NI 9216

© National Instruments 505

 NI-DAQmx Device Considerations

• NI 9217
• NI 9221
• NI 9226

C Series Slow Sample Devices

• NI 9207
• NI 9208
• NI 9209
• NI 9210
• NI 9211
• NI 9212
• NI 9213
• NI 9214
• NI 9216
• NI 9217
• NI 9219
• NI 9224
• NI 9226
• NI 9228

C Series Delta-Sigma Devices

• NI 9202
• NI 9218
• NI 9225
• NI 9227
• NI 9229
• NI 9230
• NI 9231
• NI 9232
• NI 9234
• NI 9235
• NI 9236
• NI 9237
• NI 9238
• NI 9239

506 ni.com
 NI-DAQmx Device Considerations

• NI 9242
• NI 9244
• NI 9246
• NI 9247
• NI 9250
• NI 9251
• NI 9260

C Series Reference Clocked Devices

• NI 9775

C Series Simultaneous SAR Devices

• NI 9215
• NI 9220
• NI 9222
• NI 9223

Common-Mode Over-Range Detection

All input channels share a common ground, COM, that is isolated from other modules
in the system. The device's common-mode range is the maximum voltage between any
channel and COM. The NI 9213, NI 9214, and PXIe 4353 measures the common-mode
voltage level of each channel, and its over-range status can be monitored in NI-DAQmx.

To determine if a common-mode over-range detection has occurred, use the Common

Mode Range Error Channels Exist and Common Mode Range Error Channels properties
within the DAQmx Read property node. Common Mode Range Error Channels Exist
returns a Boolean of true if one or more channels exceed the common-mode input
range since the last time the property was queried, and Common Mode Range Error
Channels returns the names of the virtual channels that exceed the common-mode
input range.

If a common-mode voltage out of range is detected, the accuracy of the data on any
channel in the task may be impacted. If a thermocouple is connected to the device, but
is not in the task, make sure the channel does not exceed the common-mode voltage

© National Instruments 507

 NI-DAQmx Device Considerations

range. A floating thermocouple, or a channel that is left unconnected, will not exceed
the common-mode voltage range. Refer to the devices Specifications document for
more information about the common-mode voltage range.

Connecting Analog Voltage Input Signals for Isolated

Devices
Signal Source Type
Input Floating Signal Sources (Not Ground-Referenced Signal
Connected to Building Ground) Sources
Examples: Example:

• Ungrounded • Plug-in instruments with non-

thermocouples isolated outputs
• Signal conditioning
with isolated outputs
• Battery devices

Isolation Isolation
Barrier Barrier
AI + AI +

Differential (DIFF) AI – AI –

AI GND AI GND

Isolation Isolation
Barrier Barrier
AI + AI

Referenced Single-Ended AI GND AI GND

(RSE)

Related concepts:

• Terminal Configurations (Analog Input Ground Reference Settings) for Isolated

Devices

508 ni.com
 NI-DAQmx Device Considerations

CompactRIO Considerations
This section contains information on using the following CompactRIO and
CompactRIO single-board controllers with NI-DAQmx:

• cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056,
9057, and 9058 controllers.
• sbRIO-9603, 9608, 9609, 9628, 9629, and 9638 controllers.

Related concepts:

• CompactRIO Timing Engines

• CompactDAQ, CompactRIO, and TestScale Simultaneous Tasks
• Time-Based Features for Network-Synchronized Devices

Slot Program Mode

In MAX, when you add a C Series module to a CompactRIO controller there are three
program modes to choose from.

• Real-Time (NI-DAQmx)
• Real-Time Scan
• LabVIEW FPGA

In order for DAQmx to communicate with the module, the module must be in Real-
Time (NI-DAQmx) mode.

Note Not all modules support Real-Time (NI-DAQmx).

Related information:

• Software Support for CompactRIO and CompactDAQ

Hardware Timed Single Point Sample Mode

The CompactRIO controllers support hardware timed single point (HWTSP) sample
mode with a few caveats.

© National Instruments 509

 NI-DAQmx Device Considerations

• The NI 9260 does not support HWTSP.

• The NI 9361 does not support HWTSP.
• C Series Scanned Devices do not default to the lowest latency mode. They
default to a slower convert rate to allow more time for settling. This behavior limits
the maximum HWTSP acquisition rate of the module to allow more time for
settling. If you prefer, you can configure the module for a faster acquisition rate
with less time for settling. For additional information, see Sampling Rate
Considerations.

Related concepts:

• Sampling Rate Considerations

• C Series Scanned Devices

Model Names
CompactRIO may use slightly different C Series model names and product IDs
compared to CompactDAQ. For CompactRIO, see C Series Module IDs on ni.com.

Related information:

• C Series Module IDs

Timing Considerations
CompactRIO controllers handle sampling rate and the default value for the hardware-
timed mode differently than CompactDAQ chassis.

In a CompactRIO or Single-Board RIO controller with C Series Slow Sample devices,

such as the NI 9211, if the sampling rate of a hardware-timed acquisition exceeds the
maximum sampling rate of the module, DAQmx generates warning or errors. When a
Slow Sample device is in the same task as a non-Slow Sample device, exceeding the
maximum sampling rate of the Slow Sample device results in the most recently
acquired sample being read multiple times. In this scenario, the first sample of a
hardware-timed acquisition with C Series Slow Sample devices is sampled when the
task is committed.

510 ni.com
 NI-DAQmx Device Considerations

Default Settings for the AI.ADCTimingMode Attribute/Property

For all modules in the CompactRIO and Single-Board RIO controllers, the default value
in hardware-timed mode is automatically determined based on Sample Clock Rate.

Related concepts:

• Sampling Rate Considerations

• Configurable Timing for C Series Devices
• CompactRIO Timing Engines
• CompactDAQ, CompactRIO, and TestScale Simultaneous Tasks
• C Series Device Groupings
• CompactDAQ and CompactRIO Simultaneous Tasks

Shared Trigger Bus

On the CompactRIO and CompactRIO Single-Board controllers, NI-DAQmx provides a
simple trigger bus between LabVIEW FPGA and NI-DAQmx with the following
characteristics:

CompactRIO63 CompactRIO Single-Board64

• Four fixed direction LabVIEW FPGA to NI- • Two fixed direction LabVIEW FPGA to NI-
DAQmx Lines: DAQmx Lines:
◦ cRIO_Trig0, cRIO_Trig1, cRIO_Trig2, and ◦ cRIO_Trig0 and cRIO_Trig1 are
cRIO_Trig3 are terminals that are driven terminals that are driven from LabVIEW
from LabVIEW FPGA to NI-DAQmx. FPGA to NI-DAQmx.
◦ LabVIEW FPGA: output boolean chassis ◦ LabVIEW FPGA: output boolean chassis
I/O I/O
◦ NI-DAQmx: common-visibility source ◦ NI-DAQmx: common-visibility source
terminals terminals
▪ Can be used with Immediate ▪ Can be used with Immediate
Routing and Task-Based Routing and Task-Based
Routing Routing
▪ Does not prescribe to Lazy Line ▪ Does not prescribe to Lazy Line
Transitions rules Transitions rules

63. cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056, 9057, and 9058
64. sbRIO-9603, 9608, 9609, 9628, 9629, and 9638

© National Instruments 511

 NI-DAQmx Device Considerations

CompactRIO CompactRIO Single-Board

• Four Fixed Direction NI-DAQmx to LabVIEW • Two Fixed Direction NI-DAQmx to LabVIEW
FPGA Lines: FPGA Lines:
◦ cRIO_Trig4, cRIO_Trig5, cRIO_Trig6, and ◦ cRIO_Trig2 and cRIO_Trig3 are
cRIO_Trig7 are terminals that are driven terminals that are driven from NI-
from NI-DAQmx to LabVIEW FPGA. DAQmx to LabVIEW FPGA.
◦ LabVIEW FPGA: input boolean chassis ◦ LabVIEW FPGA: input boolean chassis
I/O I/O
▪ Minimum pulse width ▪ Minimum pulse width
requirements: requirements:
▪ 12.5 ns for most destination ▪ 12.5 ns for most destination
terminals terminals
▪ 150 ns for SyncPulse terminals ▪ 150 ns for SyncPulse terminals
◦ NI-DAQmx: common-visibility ◦ NI-DAQmx: common-visibility
destination terminals destination terminals
▪ Can be used with Immediate ▪ Can be used with Immediate
Routing and Task-Based Routing and Task-Based
Routing Routing
▪ Does not prescribe to Lazy Line ▪ Does not prescribe to Lazy Line
Transitions rules Transitions rules

Note The signals available for export from DAQmx vary in pulse width. On a
cRIO controller, if you route any of the following signals over the cRIO_Trig
bus to the FPGA Target, the pulse is too short to be seen in the default top
level clock domain of 40 MHz:

• Change detection event exported from a buffered change detection DI

task
• Sample clock exported from a hardware-timed digital input or output
task running faster than 3.5 MHz

• Counter output event exported from a counter task that configures its
output behavior to pulse

To fix this problem, consider routing the signal to a counter to widen the
pulse.

512 ni.com
 NI-DAQmx Device Considerations

Related concepts:

• Immediate Routing
• Task-Based Routing
• Lazy Line Transitions

Devices That Support Multi-Counter Tasks

The following devices have multiple counters and support adding multiple counter
channels to the same task.

• NI 9361

Digital AI Filtering
The NI 4302, 4303, 4304, 4305, 4339, 4480, and 4481 modules have a user-configurable
lowpass filter for their analog input channels. This filtering is implemented with a
digital elliptical filter. It is configured independently of the tracking anti-aliasing filter.
It may be helpful when measuring in an environment with excessive high frequency
noise below the anti-aliasing filter's cutoff.

When sampling in hardware-timed single point mode, the filter is always enabled. You
can set or query its cutoff frequency using the AI.DigFltr.Lowpass.CutoffFreq attribute/
property. If your application does not require this additional filtering, leave this
property set to its default value. This will configure the widest bandwidth filter
possible.

Digital AI filtering for hardware-timed single point mode is supported on the following
modules:

Modules Default Cutoff Frequency Support Cutoff Frequencies

100 Hz, 200 Hz, 500 Hz, 1 kHz,
PXIe-4302, 4303, 4304, 4305 2 kHz
2 kHz, 3 kHz
200 Hz, 500 Hz, 1 kHz, 2 kHz ,
PXIe-4339 2 kHz
3 kHz

© National Instruments 513

 NI-DAQmx Device Considerations

When using other sampling modes, the filter is optional. This filter can be enabled by
using the AI.DigFltr.Enable attribute/property, and you can set or query its cutoff
frequency using the AI.DigFltr.Lowpass.CutoffFreq attribute/property.

The following modules support digital AI filtering in other sampling modes:

Modules Default Cutoff Frequency Support Cutoff Frequencies

2 Hz, 20 Hz, 200 Hz, 1 kHz,
PXIe-4302, 4303, 4304, 4305 None
2 kHz, none
PXIe-4480, 4481 2 MHz 2 MHz, user-defined

Note User-defined cutoff frequencies for the 4480 and 4481 are supported
only for sample rates greater than 1.25 MHz.

Excitation Fault Detection

Two NI-DAQmx Read attributes/properties allow you to check for excitation faults. The
first is ExcitFaultChansExist. This attribute/property returns a Boolean of true if one or
more channels experience an excitation fault condition. The second is ExcitFaultChans.
This attribute/property returns an array of strings indicating which channels (if any)
experienced an excitation fault condition. You must query the ExcitFaultChansExist
attribute/property before querying the ExcitFaultChans attribute/property.

ExcitFaultChansExist reads the excitation fault condition from the device and stores it
in NI-DAQmx. Subsequent reads of ExcitFaultChans will read the excitation fault
channel information stored in NI-DAQmx from the previous ExcitFaultChansExist
query.

NI-DAQmx returns all data regardless of whether an excitation fault happens. If your
application needs excitation fault checking, you should read the excitation fault
attributes/properties after each call to read. Your program should discard questionable
data or return a flag when NI-DAQmx reports an excitation fault.

The NI 9218 can detect if there is an overcurrent fault between EX+ and EX- pins of
either channel for either the strain mode case or the powered sensor measurement

514 ni.com
 NI-DAQmx Device Considerations

case. When the NI 9218 is configured for powered sensor measurement, which requires
a +12 V excitation, it can also detect the absence of the required 9-30 V external power
supply connected to the Vsup terminal. Both of these types of faults are reported as
excitation faults.

The PXIe-4340 can detect if there is an overcurrent fault between the EX+ and EX- pins
of any channel. This fault occurs when a voltage source is connected to the EX+ and EX-
pins of any channel, or the load impedance is too low (excessive current). Ensure that
only the primary winding of an LVDT/RVDT sensor is connected to the EX+ and EX- pins
of any channel on this module.

External Overvoltage Detection

An external overvoltage condition occurs when an analog output channel is connected
to an external voltage source that is high enough to overdrive the analog output
channel. Two NI-DAQmx Write attributes/properties allow you to check for external
overvoltage channels.

The first is ExternalOvervoltageChansExist. This attribute/property returns a Boolean

true if one or more channels experience an external overvoltage condition. The second
is ExternalOvervoltageChans. This attribute/property returns an array of strings
indicating which channels (if any) experienced an external overvoltage condition. You
must query the ExternalOvervoltageChansExist attribute/property before querying the
ExternalOvervoltageChans attribute/property.

ExternalOvervoltageChansExist reads the external overvoltage fault condition from the

device and caches it in the driver. It also resets this condition of the device after it is
read. Subsequent reads of ExternalOvervoltageChans attribute/property will read the
faulted channel information cached in the driver from the previous
ExternalOvervoltageChansExist query.

Note NI-DAQmx generates all data whether or not an external overvoltage

fault occurs. If your application requires external overvoltage checking, it is
recommended that you read the above attributes/properties after each call
to Write. Your program should discard questionable output or return a flag
when the driver reports an external overvoltage.

© National Instruments 515

 NI-DAQmx Device Considerations

Consult your device documentation for more information on fault reporting thresholds
and capabilities specific to your device.

External Reference Sources

For 625x M Series devices, you can use APFI 0 or APFI 1 for analog output external
reference sources. With the NI ELVIS II Family devices, APFI 0 and APFI 1 are not
available as analog output external reference sources. For 628x M Series devices, you
can use ao0 through ao3. On some other STC-based devices, you can use EXTREF as
the analog output external reference source. Using an external voltage reference
enables you to maximize the resolution of your device. If the voltages you want to
generate do not exceed a certain level and you can supply an external reference
voltage at that level, you achieve your device's maximum resolution. You also can use
external reference voltages to apply a gain to a DC voltage or to a time-varying
waveform.

Refer to the specifications for your device for additional information.

FD-11637 Signal Conditioning

Learn about excitation, quarter-bridge completion, and shunt calibration for the
FD-11637.

Excitation

The FD-11637 supports internal excitation at 3 V, 5 V, and 10 V. 10 V excitation is only

supported in Full-Bridge and Half-Bridge modes.

Quarter-Bridge Completion

The FD-11637 supports internal quarter-bridge completion with resistances of 120 Ω

and 350 Ω.

Shunt Calibration

The FD-11637 has a built-in resistor for shunt calibration. Shunt calibration also only
works in Quarter-Bridge mode.

516 ni.com
 NI-DAQmx Device Considerations

Initialized States for Terminals and Output Channels

When you use MAX or the NI-DAQmx API to reset a device, NI-DAQmx sets terminals
and output channels to an initialized state.

• Digital I/O Lines

NI-DAQmx sets all digital I/O lines to the configured power-up state. NI-DAQmx
tristates all digital I/O lines on devices that do not support configurable power-up
states. NI-DAQmx outputs 0 on all digital output-only lines on devices that do not
support configurable power-up states.

• PFI Lines

NI-DAQmx tristates all PFI lines, unless they are also digital I/O lines. In that case,
the digital I/O line behavior applies.

• AO Channels

On E Series, S Series, and AO Series devices, NI-DAQmx does not alter the AO
channels. They continue to generate the DC voltage you last set them to.

With static AO devices, all voltage outputs are at their user-defined values to full
accuracy within 1 s of power-up device reset. Before this time, the voltage outputs
can float to unspecified values.

On DSA devices, NI-DAQmx sets all AO channels to high impedance.

On M Series, C Series, and X Series, the AO channels are set to 0 Volts.

Input Limits Fault Detection

The NI-DAQmx input limits fault properties allow you to check for samples that are
outside the configurable upper and lower limits for each channel in the task.

The fault detection applies to both positive and negative inputs. For instance, if you
specify a lower limit of 2 mA and an upper limit of 12 mA, NI-DAQmx detects a fault at

© National Instruments 517

 NI-DAQmx Device Considerations

15 mA and -15 mA, but not at -6 mA because it is in the range of -2 mA to -12 mA.

AI.InputLimitsFaultDetectEnable—Enables input limits fault detection.

AI.InputLimitsFaultDetect.UpperLimit—Specifies the level of the upper limit for input

limits detection. An input sample outside the upper and lower bounds causes a fault.

AI.InputLimitsFaultDetect.LowerLimit—Specifies the level of the lower limit for input

limits detection. An input sample outside the upper and lower bounds causes a fault.

InputLimitsFaultChansExist—Indicates if the device or devices detected a sample that

was outside the upper or lower limits configured for each channel in the task. Reading
this property clears the input limits fault channel status for all channels in the task.

InputLimitsFaultChans—Lists the virtual channels that have detected samples beyond

the upper or lower limits configured for each channel in the task. You must read
InputLimitsFaultChansExist before you read this property.

Internal PLL Unlock Status

Two NI-DAQmx Read attributes/properties allow you to check if the PLL was unlocked
during data acquisition for a task. The first is PLL.UnlockedChansExist. This attribute/
property returns a Boolean true if one or more channel PLLs became unlocked during
the previous acquisition. The second is PLL.UnlockedChans. This attribute/property
returns an array of strings indicating which channel PLLs (if any) became unlocked.

PLL.UnlockedChansExist can only be used when the task is in a stop state but is still
reserved. You can also explicitly commit, start, and then stop the task without
explicitly uncommitting using the DAQmx Control Task VI.

NI 9775 Considerations
The NI 9775 module operates in two different modes, Continuous Mode and Record
Mode. You can set the NI 9775 operation to be Record Mode by setting the
DataXferReqCond attribute/property to When Acquisition Complete. Any other
supported value of the DataXferReqCond attribute/property will force the NI 9775 into
Continuous Mode. If a value is not set for DataXferReqCond attribute/property, the

518 ni.com
 NI-DAQmx Device Considerations

module will coerce a value based on other task settings.

Continuous Mode
While in Continuous Mode, the NI 9775 returns data as the data is acquired from the
source.

The module does not use the module's onboard buffer when in Continuous Mode. NI-
DAQmx will automatically put the NI 9775 in Continuous Mode if the task is set for
continuous acquisition or if the specified rate is less than or equal to 4 MS/s aggregate
for each module.

Continuous Mode Triggering

In Continuous Mode, the NI 9775 cannot be the source for Analog Edge or Analog Multi
Edge Triggering.

The NI 9775 also does not support Analog Triggering or Retriggering, unless in a task
with the NI 9204, NI 9205, or NI 9206. While in Continuous Mode, Reference and Start
triggers can be configured on the same task.

Record Mode
While in Record Mode, the data is stored on a buffer in the module until the entire
acquisition is complete. The data on the buffer is stored in records based on a trigger
signal sent to the device.

Acquisition is considered complete when any of the following conditions are satisfied:

• The maximum number of triggers are detected and the data for all detected
triggers have been acquired.

By default, the NI 9775 acquires one record. To acquire more than one record, you
can set the Retriggerable attribute/property to true, which will give you as many
records that can fit in the buffer, up to 32 records. Or, you can use the Maximum
Number of Triggers to Detect attribute/property to specify how many records you
want, up to 32 records. Any ignored triggers do not count towards the maximum of
32 records.

© National Instruments 519

 NI-DAQmx Device Considerations

• The Trigger Window has elapsed.

This time setting can be configured through the Trigger Window attribute/
property. The Trigger Window begins when the modules receive a sync pulse,
which synchronizes modules in a task. This sync pulse is sent during the commit
stage of the task which happens in the Start Task function/VI. If the Trigger Window
expires, the module finishes acquiring post-trigger data. If the module is already
finished acquiring post-trigger data, the module returns all of the acquired data.

• The Retrigger Window has elapsed.

This time setting can be configured through the Retrigger Window attribute/
property. The Retrigger Window begins once the module has detected a trigger
and resets every time it detects another trigger. If the Retrigger Window expires,
the module finishes acquiring post-trigger data. If the module is already finished
acquiring post-trigger data, the module returns all of the acquired data.

NI-DAQmx will automatically put the NI 9775 in Record Mode if the channels on the
module are used for trigger sources or if the rate is specified to be greater than 4 MS/s
aggregate for finite acquisitions. When in Record Mode, the NI 9775 may only be in the
same task as other NI 9775 modules in Record Mode.

Record Mode Triggering

In Record Mode, the NI 9775 supports the following triggers and configurations:

• Digital Edge Triggering.

• A single channel configured as the source when using Analog Edge Triggering.
• Up to 4 channels configured as the source, but all of the source channels must be
on the same device when using Analog Multi Edge Triggering.
• Configuration of a single trigger type. You can have Start or Reference triggers
configured, but not both.
• Retriggering on any edge trigger type: Digital Edge, Analog Edge, and Analog Multi
Edge.

Note The module will ignore triggers when acquiring pre-trigger buffer
data or post-trigger data.

520 ni.com
 NI-DAQmx Device Considerations

Onboard Memory Behavior

The retrieval of data from the onboard memory of the module may be faster than the
chassis can transfer it to the host. If this occurs, the chassis FIFO will overflow, erroring
the task and causing a loss of data. To prevent this, set the Data Transfer Maximum
Rate attribute/property to a rate lower than the system's bandwidth.

NI USB-TC01 Considerations
If you are acquiring data from the device in a NI-DAQmx task or using the device's
temperature logger, the NI USB-TC01 launch screen cannot acquire data.

In MAX, the Reset Device option is disabled for the NI USB-TC01. If you attempt to reset
the device with the Reset Device VI/function, it returns an error if any task is using the
device. To reset the NI USB-TC01, disconnect and reconnect the device.

Open Channel Detection

The DAQmx Read OpenChansExist and OpenChans attributes/properties allow you to
check for open channels.

OpenChansExist returns a Boolean of true if one or more channels were disconnected

since the last time the attribute/property was queried, and OpenChans returns the
virtual channel names of the channels that were disconnected. You must query the
OpenChansExist attribute/property before querying the OpenChans attribute/
property.

OpenChansExist reads the open channel condition from the device and caches it in the
driver. Subsequent reads of OpenChans attribute/property will read the channel
information cached in the driver from the previous OpenChansExist query.

NI-DAQmx returns all data whether an open channel is detected. If your application
requires open channel checking, it is recommended that you read the open channel
attributes/properties after each call to Read/Write. Your program should discard
questionable data or return a flag when the driver reports an open channel.

You can also check for shorted channels using the DAQmx Read OvercurrentChansExist

© National Instruments 521

 NI-DAQmx Device Considerations

and OvercurrentChans attributes/properties. Refer to Overcurrent Detection.

Related concepts:

• Overcurrent Detection

Open Current Loop Detection

Two NI-DAQmx Read/Write attributes/properties allow you to check for disconnected
sensors. The first is OpenCurrentLoopChansExist. This attribute/property returns a
Boolean true if one or more channels experience an open current loop condition. The
second is OpenCurrentLoopChans. This attribute/property returns an array of strings
indicating which channels (if any) experienced an open current loop condition. You
must query the OpenCurrentLoopChansExist attribute/property before querying the
OpenCurrentLoopChans attribute/property.

OpenCurrentLoopChansExist reads the open current loop condition from the device
and caches it in the driver. Subsequent reads of OpenCurrentLoopChans attribute/
property will read the open current loop channel information cached in the driver from
the previous OpenCurrentLoopChansExist query.

Note

• NI-DAQmx returns all data whether or not an open current loop occurs.
If your application requires open current loop checking, it is
recommended that you read the open current loop attributes/
properties after each call to Read. Your program should discard
questionable data or return a flag when the driver reports an open
current loop.
• For Analog Input devices with IEPE, the IEPE excitation current source
must be enabled for open current loop detection to work. If IEPE is not
turned on, an error is returned when OpenCurrentLoopChans is read.

522 ni.com
 NI-DAQmx Device Considerations

Open Thermocouple Detection (OTD)

Breaking the hot junction of a thermocouple or disconnecting a thermocouple signal
results in an open thermocouple channel. This causes the channel to return invalid
data. Using open thermocouple detection, you can determine if a thermocouple
channel is disconnected.

Devices have a set of pull-up and bias resistor networks that connect to channels,
forming a voltage divider when a thermocouple is connected and working properly.
When a thermocouple breaks or becomes open, the open thermocouple detection
circuitry uses a small current source to push the input voltage out of range, which is
possible to detect in software using limits or conditions. In normal operation, this
current causes a voltage error on the input, known as a lead offset, when pushing
against a source resistance. In many applications, this error is minimal, but in some
applications where high accuracy is required and there are large source resistances
caused by long, narrow gauge thermocouple wires, the error can be significant.

To determine if a thermocouple is disconnected or becomes open on the FD-11613,

FD-11614, NI 4353, NI 9212, NI 9213, or NI 9214, you can use the
OpenThrmcplChansExist and OpenThrmcplChans attributes/properties.
OpenThrmcplChansExist returns a Boolean of true if one or more channels were
disconnected since the last time the attribute/property was queried, and
OpenThrmcplChans returns the virtual channel names of the channels that were
disconnected.

Lead Offset Nulling

To eliminate lead offset, you can disable open thermocouple detection, which
eliminates the bias current. If you are using an SCXI module, you can disable open
thermocouple detection by removing the bias resistor networks. On the NI 4353 and NI
9214, you can disable OTD current with the OpenThrmcplDetectionEnable attribute/
property.

If an application requires high-accuracy and high-resistance thermocouple wires, but

you do not want to disable the ability to detect open thermocouples, you can perform
lead offset nulling. On the NI 9214, you can calibrate lead offset nulling
programmatically. Lead offset nulling calibration compensates for lead offset error by

© National Instruments 523

 NI-DAQmx Device Considerations

taking the difference between a measurement with the bias current from open
thermocouple detection and one without the bias current. This difference is then
stored in the AI.Thrmcpl.LeadOffsetVoltage attribute/property and is applied to
measurements to compensate for current from open thermocouple detection.

Overcurrent Detection
Two NI-DAQmx Read/Write attributes/properties allow you to check for shorted
channels. The first is OvercurrentChansExist. This attribute/property returns a Boolean
true if one or more channels experience an overcurrent condition. The second is
OvercurrentChans. This attribute/property returns an array of strings indicating which
channels (if any) experienced an overcurrent condition. You must query the
OvercurrentChansExist attribute/property before querying the OvercurrentChans
attribute/property.

OvercurrentChansExist reads the overcurrent condition from the device and caches it
in the driver. Subsequent reads of OvercurrentChans attribute/property will read the
overcurrent channel information cached in the driver from the previous
OvercurrentChansExist query.

Note For the NI 4610, use the AO.PowerAmp.Overcurrent attribute/property

to check for shorted channels. On the NI 4610, AO.PowerAmp.Overcurrent
detects the overcurrent condition for the specified channel and caches that
information in the driver.

NI-DAQmx returns all data whether or not a short occurs. If your application requires
overcurrent checking, it is recommended that you read the overcurrent attributes/
properties after each call to Read/Write. Your program should discard questionable
data or return a flag when the driver reports a short.

IEPE must be turned on for overcurrent detection to work (except for the NI 4322, NI
4610, NI 9219, and NI 9269). If IEPE is not turned on, an error is returned when
OvercurrentChansExist is read.

Shorted current channels are known as short circuits. Overcurrent detection

attributes/properties can be used to detect short circuits.

524 ni.com
 NI-DAQmx Device Considerations

Overtemperature Detection
An overtemperature condition occurs when the ambient temperature of the device
exceeds a safe operating level. The device may disable any overtemperature channels
until the ambient temperature returns to a safe level. Use the
OvertemperatureChansExist attribute/property to determine if the device is
experiencing an overtemperature condition. Devices may have front panel LEDs that
will indicate an overtemperature condition has occurred.

Note Refer to device specific documentation for further information on

meaning of LED status.

Remote and Local Sensing

If you use a cable of significant length, you might experience reduced accuracy in your
measurement due to reduced voltage from wire resistance. You can adjust for this
voltage drop using either remote sense or local sense.

Remote sense uses a separate connection to quantify the voltage drop. This accounts
for the length of the cable in the original connection. To use remote sense, you must
connect the RS+ and RS- terminals on the device to the primary winding terminals on
the sensor.

Local sense measures the voltage drop internally at the excitation terminals. This
method does not require the use of additional wires, but is not as accurate as remote
sense.

On the PXIe-4340, you can set each channel to use either remote sense or local sense
by using the AI.Excit.Source attribute/property.

Power Supply and Power Channel Considerations

Refer to Hardware Input and Output » DAQmx » Power in the LabVIEW Example Finder
for examples that implement many of the following considerations.

© National Instruments 525

 NI-DAQmx Device Considerations

Default Values

The following property values take effect when the task is committed or started.

Property Name Default Value

Pwr.IdleOutputBehavior Maintain Existing Value
Pwr.RemoteSense Local Sense
Pwr.OutputEnable True
Pwr.CurrentSetpoint 0.03A
Pwr.VoltageSetpoint 0V

Configuring Voltage and Current Setpoints

Use the DAQmx Create Channel VI/function to set the current and voltage setpoints.
Two properties reflect the current and voltage setpoints for a power channel, and are
settable at runtime via the DAQmx Channel property node:

• Pwr.Current.Setpoint —The constant output current, in amperes. If the load draws

current greater than this value, output voltage is reduced and the device operates
in constant current mode.
• Pwr.Voltage.Setpoint —The constant output voltage, in volts.

Configuring and Reading Power Output States and Behavior

Use the DAQmx Create Channel VI/function with the Pwr.OutputEnable property to
enable or disable power channel output. At runtime, set this property via the DAQmx
Channel property node.

Use the DAQmx Channel property node with the Pwr.IdleOutputBehavior property to
enable or disable power channel output when the task is uncommitted.

Use the DAQmx Channel property node to read the Pwr.OutputState property and
determine the channel state.

Note Some DAQmx Read instances/functions return power channel samples

526 ni.com
 NI-DAQmx Device Considerations

in I16 format. These instance will always return a value of 0 for current and
voltage while a power channel is disabled. Verify the power output state to
validate a current or voltage sample value of 0.

Detecting Auxiliary Power Errors

Use the DAQmx Read property node to read auxiliary power supply errors. Two
properties reflect the error state for auxiliary power.

Note You must read AuxPowerErrorChansExist before you read

AuxPowerErrorChans. Otherwise you will receive an error message.

• AuxPowerErrorChansExist —Indicates if the device detected something is wrong

with an auxiliary power supply.
• AuxPowerErrorChans —Indicates a list of names of any auxiliary power supply
error virtual channels.

Detecting Remote Sense Errors

Use the DAQmx Read property node to read remote sense errors. Two properties
reflect the error state for Remote Sense.

Note You must read RemoteSenseErrorChansExist before you read

RemoteSenseErrorChans. Otherwise you will receive an error message.

• RemoteSenseErrorChansExist —Indicates if the device detected an error on a

hardware or remote sense connection. You must disable the output and resolve
the hardware connection issue to clear the remote sense error status for all
channels in the task.
• RemoteSenseErrorChans —Indicates a list of names of any remote sense error
virtual channels.

Detecting Over-Temperature Errors

Use the DAQmx Read property node to read over-temperature errors. Two properties
reflect an over-temperature condition.

© National Instruments 527

 NI-DAQmx Device Considerations

Note You must read OvertemperatureChansExist before you read

OvertemperatureChans. Otherwise you will receive an error message.

• OvertemperatureChansExist —Indicates if the device detected an

overtemperature condition in any virtual channel in the task. Reading this property
clears the overtemperature status for all channels in the task.
• OvertemperatureChans —Indicates a list of names of any overtemperature virtual
channels.

Detecting Reverse Voltage Errors

Use the DAQmx Read property node to read reverse voltage errors. Two properties
reflect the reverse voltage error state of channel

Note You must read ReverseVoltageErrorChansExist before you read

ReverseVoltageErrorChans. Otherwise you will receive an error message.

• ReverseVoltageErrorChansExist —Indicates if the device detected a reverse

voltage error in any channel in the task. Reverse voltage error occurs if the local
voltage is equal to the negative saturated voltage.
• ReverseVoltageErrorChans —Indicates a list of names of any reverse voltage error
virtual channels.

Configuring Remote Sense

Use the DAQmx Channel property to set the Pwr.RemoteSense property.

• DAQmx Read will return local voltage if Pwr.RemoteSense is configured to Local.

• DAQmx Read will return remote voltage if Pwr.RemoteSense if configured to
Remote.

Power Supply Fault Detection

The NI 9265 and NI 9266 can detect if there is an insufficient external power or no
external power connected to the Vsup terminal. Two NI-DAQmx Read attributes/
properties allow you to check the external power. The first is
PowerSupplyFaultChansExist. This attribute/property returns a Boolean true if one or

528 ni.com
 NI-DAQmx Device Considerations

more channels lack external power. The second is PowerSupplyFaultChans. This

attribute/property returns an array of strings indicating which channels (if any)
experienced a power supply fault. You must query the PowerSupplyFaultChansExist
attribute/property before querying the PowerSupplyFaultChans attribute/property.

Push-Pull and Open Collector Mode

The NI USB-6000 /6001/6002/6003 are programmable as either push-pull or open-
collector (open-drain) mode. The default configuration is push-pull.

The NI USB-6008 has open-collector (open-drain) mode only, but each channel on the
NI USB-6501, the NI USB-6009, and SensorDAQ are programmable as either push-pull
or open-collector (open-drain) mode. The default configuration of the SensorDAQ, the
NI USB-6008, the NI USB-6009, and the NI USB-6501 DIO ports is open-drain, allowing 5
V operation, with an onboard 4.7 k pull-up resistor. An external, user-provided, pull-up
resistor can be added to increase the source current drive up to a 8.5 mA limit per line.
Refer to the device documentation for more information and instructions on
determining the value of the pull-up resistor.

Querying Device Capabilities with C Series Devices

When querying DAQmx Device and DAQmx Physical Channel attributes/properties with
C Series devices, the supported attributes/properties depend on the slot you plug a
device into. If the device is not in a supported slot, you cannot perform counter I/O, nor
can you query counter-specific device capabilities such as the counter size.

Reading Available Samples on USB or Ethernet DAQ

Reading -1 or querying AvailableSamplesPerChannel sends a request to the device
forcing it to flush any samples that may be sitting in the buffer.

When using USB or Ethernet DAQ devices, these samples may not reach your
computer's buffer in time, resulting in an incorrect number of samples available being
displayed. To ensure all samples get read, either use a second read also querying -1
(which will then contain the desired samples), or specify the number of samples to
read so the device waits until the specified number of samples have entered the

© National Instruments 529

 NI-DAQmx Device Considerations

computer's buffer before returning the data.

RTSI Triggering with M Series USB and NI ELVIS II Family

Devices
M Series USB and NI ELVIS II Family devices do not support RTSI triggering.

SC Express Smart Accessory Connections

The following connections are supported on these SC Express accessories:

Supported
Accessory Description
Connections
Connects all TC channels to the calibration input. This
_tc_calibration
connection is used to verify and adjust TC gain accuracy.
Connects one CJC channel to the calibration input. This
CAL-4353
_cjc_calibration connection is used to verify and adjust CJC gain and offset
accuracy.
_short_tc_terminals Connects all TC channels together.
_remote_sense_floating Disconnects remote sensing for calibration.
RM-4339
_cal_channel Connects all channels to an external calibration source.
RM-4302 _cal_channel Connects all channels to an external calibration source.
RM-4304 _cal_channel Connects all channels to an external calibration source.

SCC Signal Conditioning Device Considerations

The following section applies only to analog input (AI) SCC modules.

In a single stage AI SCC configuration, you connect your external signal to an SCC
module which conditions the signal and passes it to the DAQ device. You can install
single stage AI modules in sockets J1-J8 in the SC-2345 carrier.

Sometimes, you can cascade two AI SCC modules together on a single AI channel to

530 ni.com
 NI-DAQmx Device Considerations

form a dual-stage configuration. In this configuration, you connect the external signal
to the first-stage AI module, which conditions the signal and passes it to the second-
stage AI module. Then, the signal is passed to the DAQ device. First-stage of dual-stage
AI modules can be located in sockets J9-J16. Second-stage of dual-stage AI modules
can be located in sockets J1-J8.

An example of a dual-stage configuration is a voltage attenuator module (SCC-A10) in

the first-stage SCC slot followed by a lowpass filter module (SCC-LP01) in the second-
stage SCC slot to create a combined attenuator and lowpass filter signal conditioning
on the specified AI channel. The following table shows all the SCC devices that support
dual-stage configuration.

SCC Single Stage AI First-Stage of Dual-Stage AI Second-Stage of Dual-Stage AI

Module (J1-J8) (J9-J16) (J1-J8)
SCC-AI
Yes Yes No
Series
SCC-A10 Yes Yes No
SCC-RTD01 Yes Yes No
SCC-CI20 Yes Yes No
SCC-ACC01 Yes Yes No
SCC-TC
Yes Yes No
Series
SCC-FV01 Yes No Yes
SCC-LP
Yes Yes Yes
Series
SCC-FT01 Yes Yes Yes
SCC-SG
Yes Yes No
Series

SCC modules that are not listed in the table above do not support dual-stage
configuration. This includes all analog output, digital input, and digital output SCC
modules.

© National Instruments 531

 NI-DAQmx Device Considerations

Self-Powered Compared to Bus-Powered USB Devices

Bus-powered USB DAQ devices require no external power source. Examples of bus-
powered devices include the following.

• NI mioDAQ devices
◦ USB-6421
◦ USB-6423
◦ USB-6451
◦ USB-6453
• M Series devices
◦ NI 6210
◦ NI 6211
◦ NI 6212
◦ NI 6215
◦ NI 6216
◦ NI 6218

Self-powered USB devices require an external power source such as a wall outlet or a
battery. Self-powered devices can drive higher currents than bus-powered devices.

Setting Power-Up States for M Series, NI 670x, and

Software-Timed Digital I/O Devices
You can set the state of physical channels for some devices when your computer is
powered on or the device is reset in NI-DAQmx. However, for all NI-DAQmx simulated
devices, power-up states are not persisted.

Caution Devices have limited numbers of writes to the EEPROM, so change

power-up states infrequently.

Setting Digital States for M Series, X Series and Software-Timed

Digital I/O Devices
You can set the digital power-up state for M Series, X Series, and software-timed digital
I/O devices to logic low, logic high, or tristate (floating) in MAX. You also can set power-

532 ni.com
 NI-DAQmx Device Considerations

up states with the Set Power Up States (Digital) function/VI, but using MAX is the
recommended method. You can only specify a programmable power-up state of
tristate on devices with configurable direction. Refer to your device documentation to
see if your device supports configurable direction. For NI 6230/36 devices, you can also
specify a power-up state of tristate for digital output. The power-up state can be
specified on a port basis only. The power-up state of all other NI 623x devices can be
specified by line but cannot be set to tristate.

Note I/O direction on software-timed digital I/O devices is port configurable

only*. Therefore, you can set the power-up state to tristate only on a port-by-
port basis. You can, however, set individual digital output lines in a port to
logic low or logic high.

* Except on the PCIe/PXIe-6509 which are also configurable by line.

Setting Analog States for NI 4322 Devices

You can set the analog power-up state for NI 4322 devices in MAX. You also can set
power-up states with the DAQmx Set Power Up States (Analog With Output Type)
function/VI.

Setting Analog States for NI 670x Devices

You can set the analog power-up state for NI 670x devices in MAX. You also can set
power-up states with the DAQmx Set Power Up States (Analog) function/VI, but using
MAX is the recommended method.

Supported Device ID Numbers

Find the ID for your supported device.

For information about which versions of NI-DAQmx support your device, go to

ni.com/info and enter rdsoftwareversion.

© National Instruments 533

 NI-DAQmx Device Considerations

Table 6. Supported device ID numbers

Device ID Device name
0x0160 PCI-DIO-96
0x075C DAQCard-DIO-24
0x075F DAQCard-6715
0x1150 PCI-DIO-32HS
0x1290 PCI-6704
0x12B0 PCI-6534
0x1310 PCI-6602
0x1320 PXI-6533
0x1360 PXI-6602
0x13C0 PXI-6508
0x1490 PXI-6534
0x14E0 PCI-6110
0x14F0 PCI-6111
0x1710 PXI-6509
0x17D0 PCI-6503
0x1870 PCI-6713
0x1880 PCI-6711
0x1920 PXI-6704
0x1AD0 PCI-6133
0x1AE0 PXI-6133
0x1E30 PCI-6624
0x1E40 PXI-6624
0x2410 PCI-6733
0x2420 PXI-6733
0x2430 PCI-6731
0x24F0 PXI-4472

534 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x2510 PCI-4472
0x2520 PCI-4474
0x27A0 PCI-6123
0x27B0 PXI-6123
0x2B10 PXI-6527
0x2B20 PCI-6527
0x2B80 PXI-6713
0x2B90 PXI-6711
0x2C60 PCI-6601
0x2C90 PCI-6703
0x2CC0 PXI-6608
0x2EC0 PXI-6115
0x2ED0 PCI-6115
0x2EE0 PXI-6120
0x2EF0 PCI-6120
0x7023 PXI-2593
0x703F PXI-2566
0x7040 PXI-2567
0x704C PXI-2530
0x7067 PXI-2529
0x7073 PCI-6723
0x707E PXI-4462
0x7085 PCI-6509
0x7086 PXI-6528
0x7087 PCI-6515
0x7088 PCI-6514
0x708C PXI-2568

© National Instruments 535

 NI-DAQmx Device Considerations

Device ID Device name

0x708D PXI-2569
0x709F USB-9421
0x70A1 USB-9472
0x70A2 USB-9481
0x70A4 USB-9201
0x70A5 USB-9221
0x70A7 USB-9263
0x70A8 USB-9233
0x70A9 PCI-6528
0x70AA PCI-6229
0x70AB PCI-6259
0x70AC PCI-6289
0x70AD PXI-6251
0x70AE PXI-6220
0x70AF PCI-6221
0x70B0 PCI-6220
0x70B1 PXI-6229
0x70B2 PXI-6259
0x70B3 PXI-6289
0x70B4 PCI-6250
0x70B5 PXI-6221
0x70B6 PCI-6280
0x70B7 PCI-6254
0x70B8 PCI-6251
0x70B9 PXI-6250
0x70BA PXI-6254
0x70BB PXI-6280

536 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x70BC PCI-6284
0x70BD PCI-6281
0x70BE PXI-6284
0x70BF PXI-6281
0x70C0 PCI-6143
0x70C3 PCI-6511
0x70C8 PCI-6513
0x70C9 PXI-6515
0x70CC PCI-6512
0x70CD PXI-6514
0x70D0 PXI-2570
0x70D1 PXI-6513
0x70D2 PXI-6512
0x70D3 PXI-6511
0x70D4 PCI-6722
0x70E1 PXI-2532
0x70F2 PCI-6224
0x70F3 PXI-6224
0x70FF PXI-6723
0x7100 PXI-6722
0x710D PXI-6143
0x7124 PCI-6510
0x7125 PCI-6516
0x7126 PCI-6517
0x7127 PCI-6518
0x7128 PCI-6519
0x712C USB-9265

© National Instruments 537

 NI-DAQmx Device Considerations

Device ID Device name

0x712E USB-9421 (DSUB)
0x7132 USB-9472 (DSUB)
0x7137 PXI-2575
0x713C PXI-2585
0x713D PXI-2586
0x7146 PCI-6132
0x7147 PXI-6132
0x7148 PCI-6122
0x7149 PXI-6122
0x7150 PXI-2564
0x715F NI 9221
0x7160 NI 9421
0x7161 NI 9421 (DSUB)
0x7162 NI 9472
0x7163 NI 9472 (DSUB)
0x7164 NI 9481
0x7165 NI 9401
0x716B PCI-6230
0x716C PCI-6225
0x716D PXI-6225
0x716F PCI-4461
0x7170 PCI-4462
0x7171 PCI-6010
0x7177 PXI-6230
0x717A USB-6008
0x717B USB-6009
0x717D PCIe-6251

538 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x717F PCIe-6259
0x718A USB-6501
0x718B PCI-6521
0x718C PXI-6521
0x7191 PCI-6154
0x71A1 USB-9201 (DSUB)
0x71A2 USB-9221 (DSUB)
0x71A5 PXI-2594
0x71A7 PXI-2595
0x71A9 PXI-2596
0x71AA PXI-2597
0x71AB PXI-2598
0x71AC PXI-2599
0x71B0 NI 9211
0x71B1 NI 9215
0x71B2 NI 9215 (BNC)
0x71B3 NI 9205 (DSUB)
0x71B4 NI 9263
0x71BB PXI-2584
0x71BC PCI-6221 (37-pin)
0x71C2 USB-9239
0x71C3 USB-9237
0x71C5 PCI-6520
0x71C6 PXI-2576
0x71D9 USB-9211A
0x71DA USB-9215A
0x71DB USB-9215A (BNC)

© National Instruments 539

 NI-DAQmx Device Considerations

Device ID Device name

0x71DF USB-6525
0x71E0 PCI-6255
0x71E1 PXI-6255
0x7209 PCI-6233
0x720A PXI-6233
0x720B PCI-6238
0x720C PXI-6238
0x7252 USB-6251
0x7253 USB-6259
0x7263 NI 9234
0x7264 NI 9206
0x7265 NI 9205
0x726F USB-6210
0x7270 USB-6211
0x7271 USB-6215
0x7272 USB-6218
0x7279 PCI-6232
0x727A PXI-6232
0x727B PCI-6239
0x727C PXI-6239
0x7281 PCI-6236
0x7282 PXI-6236
0x7283 PXI-2554
0x7285 NI 9237
0x72A0 USB-6251 (Mass Termination)
0x72A1 USB-6259 (Mass Termination)
0x72B5 USB-9234

540 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x72B9 NI 9411
0x72BA NI 9422
0x72BB NI 9423
0x72BC NI 9435
0x72BD NI 9474
0x72BE NI 9485
0x72BF NI 9403
0x72C0 NI 9425
0x72C1 NI 9476
0x72C2 NI 9477
0x72C3 NI 9264
0x72C4 NI 9265
0x72C5 NI 9201
0x72C6 NI 9201 (DSUB)
0x72C7 NI 9221 (DSUB)
0x72C8 NI 9203
0x72C9 NI 9217
0x72CA NI 9219
0x72CB NI 9239
0x72CC SensorDAQ
0x72D0 PXI-2545
0x72D1 PXI-2546
0x72D2 PXI-2547
0x72D3 PXI-2548
0x72D4 PXI-2549
0x72D5 PXI-2555
0x72D6 PXI-2556

© National Instruments 541

 NI-DAQmx Device Considerations

Device ID Device name

0x72D7 PXI-2557
0x72D8 PXI-2558
0x72D9 PXI-2559
0x72DC USB-6221
0x72DE USB-6229
0x72E8 PXIe-6251
0x72E9 PXIe-6259
0x72EF PXI-4498
0x72F0 PXI-4496
0x72F3 USB-6005 VSA
0x72F6 USB-9264
0x72FA NI 9229
0x72FD USB-9229
0x72FF USB-6509
0x730C USB-9219
0x731C PXI-2535
0x731D PXI-2536
0x7322 PXIe-6124
0x7326C4C4 PCIe-6509
0x7327 PXI-6529
0x732D USB-6255
0x732E USB-6255 (Mass Termination)
0x732F USB-6225
0x7330 USB-6225 (Mass Termination)
0x7335 PXI-2533
0x7336 PXI-2534
0x7337 NI 9402

542 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x7338 NI 9375
0x7339 USB-6212
0x733B USB-6216
0x733F USB-6281
0x7340 USB-6281 (Mass Termination)
0x7342 PXI-4461
0x7343 USB-6289
0x7344 USB-6289 (Mass Termination)
0x7345 USB-6221 (BNC)
0x7346 USB-6229 (BNC)
0x7347 USB-6251 (BNC)
0x7348 USB-6259 (BNC)
0x7359 PXI-4495
0x7367 USB-9239 (BNC)
0x7368 USB-9229 (BNC)
0x7369 USB-9263 (BNC)
0x737A NI 9229 (BNC)
0x737B NI 9239 (BNC)
0x737C NI 9263 (BNC)
0x7381 NI 9235
0x7382 NI 9236
0x7388 NI 9225
0x7389 USB-6212 (Mass Termination)
0x738A USB-6216 (Mass Termination)
0x73A1 PXIe-4498
0x73A2 PXIe-4496
0x73A6 ELVIS II

© National Instruments 543

 NI-DAQmx Device Considerations

Device ID Device name

0x73C5 PXIe-2527
0x73C6 PXIe-2529
0x73C9 PXIe-2532
0x73CA PXIe-2569
0x73CB PXIe-2575
0x73CC PXIe-2593
0x73D1 USB-4432
0x73E2 NI 9213
0x73E3 NI 9426
0x73E4 NI 9475
0x73E5 NI 9478
0x73E6 NI 9237 (DSUB)
0x73E7 ELVIS II+
0x73F4 PXI-2515
0x73FC USB-6212 (BNC)
0x73FD USB-6216 (BNC)
0x73FE USB-6218 (BNC)
0x7420 NI 9227
0x7425C4C4 PCIe-6320
0x7427C4C4 PCIe-6321
0x7429C4C4 PCIe-6323
0x742AC4C4 PXIe-6341
0x742BC4C4 PCIe-6341
0x742DC4C4 PCIe-6343
0x742FC4C4 PCIe-6351
0x7431C4C4 PCIe-6353
0x7432C4C4 PXIe-6361

544 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x7433C4C4 PCIe-6361
0x7434C4C4 PXIe-6363
0x7435C4C4 PCIe-6363
0x7436C4C4 PXIe-6356
0x7437C4C4 PXIe-6358
0x7438C4C4 PXIe-6366
0x7439C4C4 PXIe-6368
0x7448 PXI-2510
0x7449 USB-9213
0x744F USB-4431
0x7454 PXI-2512
0x7455 PXI-2514
0x7456 PXIe-2512
0x7457 PXIe-2514
0x745C USB-9264 (DSUB)
0x7492C4C4 PXIe-4300
0x7493 cDAQ-9188
0x7494 NI 9264 (DSUB)
0x74A4 cDAQ-9178
0x74A5 cDAQ-9174
0x74A8C4C4 PXIe-4330
0x74A9C4C4 PXIe-4331
0x74AE PXIe-2515
0x74B2C4C4 PXIe-4353
0x74B4 PXI-2531
0x74B5 PXIe-2531
0x74B7 USB-TC01

© National Instruments 545

 NI-DAQmx Device Considerations

Device ID Device name

0x74DF NI 9207 (DSUB)
0x74E0 NI 9208 (DSUB)
0x74E6 NI 9269
0x74F7 USB-6343
0x74F8 USB-6341
0x74FA USB-6351
0x74FB USB-6353
0x74FD USB-6361
0x74FE USB-6363
0x7510 NI 2810
0x7511 NI 2811
0x7512 NI 2815
0x7513 NI 2816
0x7528 PXIe-4497
0x7529 PXIe-4499
0x752A PXIe-4492
0x752B NI 9214
0x7530 NI 9222
0x7531 NI 9223
0x7559 NI 9232
0x755B myDAQ
0x755F cDAQ-9181
0x7560 cDAQ-9191
0x7561 USB-6356 (32 MS)
0x7563 USB-6356 (64 MS)
0x7567 USB-6366 (32 MS)
0x7569 USB-6366 (64 MS)

546 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x7578 NI 9375 (DSUB)
0x757B NI 2812
0x757E NI 2813
0x7581 NI 2814
0x7584 NI 2817
0x7587 NI 2833
0x758A NI 2834
0x7598 PXI-2571
0x759D USB-6361 (Mass Termination)
0x759E USB-6363 (Mass Termination)
0x75A1 USB-6366 (64 MS) (Mass Termination)
0x75BA PXI-2543
0x75BB PXIe-2543
0x75CFC4C4 PXIe-4357
0x75DA USB-6341 (BNC)
0x75DB USB-6343 (BNC)
0x75DC USB-6361 (BNC)
0x75DD USB-6363 (BNC)
0x75DE USB-6356 (32 MS) (BNC)
0x75DF USB-6366 (64 MS) (BNC)
0x75EB NI 9469
0x75F0 cDAQ-9171
0x7606 NI 9220
0x7614 cDAQ-9138
0x7616 NI 9220 (DSUB)
0x7617 cDAQ-9184
0x761F PXI-2540

© National Instruments 547

 NI-DAQmx Device Considerations

Device ID Device name

0x7620 PXIe-2540
0x7621 PXI-2541
0x7622 PXIe-2541
0x7625 USB-6346
0x7628 cDAQ-9139
0x7638 PXI-2720
0x7639 PXI-2722
0x763A PXIe-2725
0x763B PXIe-2727
0x763DC4C4 PXIe-6349
0x764B PXIe-2790
0x764C PXI-2520
0x764D PXI-2521
0x764E PXI-2522
0x764F PXI-2523
0x7654 PXI-2796
0x7655 PXI-2797
0x7656 PXI-2798
0x7657 PXI-2799
0x765D PXI-2542
0x765E PXIe-2542
0x765F PXI-2544
0x7660 PXIe-2544
0x76ABC4C4 PXIe-4322
0x76AF USB-6000
0x76BF USB-6001
0x76C4 USB-6002

548 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x76C6 USB-6003
0x76C8C4C4 PXIe-6614
0x76C9C4C4 PXIe-6612
0x76DCC4C4 PXIe-4610
0x76E3 USB-9482
0x76E7 cDAQ-9188XT
0x76F5 NI 9482
0x770B NI 2865
0x770F NI 9244
0x7711C4C4 PXIe-4464
0x7712C4C4 PXIe-4463
0x7716C4C4 PCIe-6612
0x771EC4C4 PXIe-4339
0x7739 cDAQ-9132
0x773A cDAQ-9134
0x773C NI 9222 (BNC)
0x773D NI 9223 (BNC)
0x7749 NI 9242
0x7751 NI 9238
0x7779 NI 9218 (DSUB)
0x777A NI 9218
0x777F NI 9361
0x778D NI 9437
0x77A5C4C4 PXIe-6345
0x77A6C4C4 PXIe-6355
0x77A7C4C4 PXIe-6365
0x77A8C4C4 PXIe-6375

© National Instruments 549

 NI-DAQmx Device Considerations

Device ID Device name

0x77AB NI 9212
0x77BE cDAQ-9133
0x77BF cDAQ-9135
0x77CAC4C4 PXIe-6738
0x77CBC4C4 PXIe-6739
0x77CE NI 9230
0x77CF NI 9260 (BNC)
0x77D0 NI 9260 (Mini XLR)
0x77D8 NI 9216
0x77D9 NI 9226
0x77E6 NI 9344
0x77E7 NI 9247
0x77EB NI 9251 (Mini XLR)
0x77EC NI 9250 (BNC)
0x77F1 NI 9209 (DSUB)
0x77F4 cDAQ-9179
0x77F6 NI 9246
0x77F9 NI 9216 (DSUB)
0x77FA NI 9226 (DSUB)
0x7802C4C4 PXIe-4302
0x7803C4C4 PXIe-4303
0x7805C4C4 PXIe-4305
0x780F NI 9224
0x7810 NI 9228
0x7829C4C4 PXIe-4340
0x7834 cDAQ-9136
0x7836 cDAQ-9137

550 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x7844C4C4 PXIe-4480
0x7845C4C4 PXIe-4481
0x7868 NI 9232 (BNC)
0x7869 NI 9230 (BNC)
0x786D NI 9436
0x7870 Simulated DAQ Device
0x7882C4C4 PXIe-6376
0x7883C4C4 PXIe-6378
0x788B NI 9202 (DSUB)
0x788D NI 9202
0x788EC4C4 PXIe-4304
0x78A0 NI 9775
0x78ACC4C4 PXIe-4309
0x78B2 NI 9210 (miniTC)
0x78B5 NI 9266
0x78B9 cDAQ-9189
0x78C7 cDAQ-9185
0x78DFC4C4 PXIe-4310
0x7903 cRIO-9040
0x7905 cRIO-9045
0x7907 cRIO-9043
0x7909 cRIO-9048
0x790D cRIO-9048 (TPM)
0x790F cRIO-9042
0x7911 cRIO-9047
0x7913 cRIO-9049
0x7918 NI 9207

© National Instruments 551

 NI-DAQmx Device Considerations

Device ID Device name

0x7919 NI 9208
0x791A NI 9209
0x7923 NI 9425 (Spring)
0x7924 NI 9476 (Spring)
0x7931 NI 9231
0x7941 FD-11613
0x7943 FD-11637
0x7945 FD-11603
0x7988C4C4 PCIe-6738
0x7998 NI 9262
0x7999C4C4 PCIe-6376
0x799AC4C4 PCIe-6374
0x799EC4C4 PXIe-6386
0x799FC4C4 PXIe-6396
0x79A7C4C4 PCIe-6346
0x79C5 NI 9253
0x79C9 NI 9252
0x79CB NI 9252 (DSUB)
0x79CF cRIO-9046
0x79D1 cRIO-9041
0x79E1 cRIO-9053
0x79E2 cRIO-9054
0x79E3 cRIO-9056
0x79E4 cRIO-9057
0x79F7 USB-6349
0x79FD NI 9266 (DSUB)
0x79FF FD-11614

552 ni.com
 NI-DAQmx Device Considerations

Device ID Device name

0x7A07 FD-11601
0x7A08 USB-6346 (BNC)
0x7A1C FD-11634
0x7A27 NI 9210
0x7A29 cRIO-9058
0x7A2C cRIO-9055
0x7A32 FD-11605
0x7A3C sbRIO-9603
0x7A3D sbRIO-9608
0x7A3E sbRIO-9628
0x7A3F sbRIO-9638
0x7A42 sbRIO-9609
0x7A44 sbRIO-9629
0x7A47 NI AI 0-15
0x7A48 NI AO 0-3
0x7A49 NI DIO 0-3
0x7A4A NI DIO 4-11
0x7A50 NI DIO 12-19
0x7A51 NI DIO 20-27
0x7A5F NI 9326
0x7A77C4C4 PXIe-6509
0x7AD5 TS-15100
0x7AD6 TS-15110
0x7AD7 TS-15120
0x7AD8 TS-15130
0x7ADA TS-15010
0x7ADC TS-15000

© National Instruments 553

 NI-DAQmx Device Considerations

Device ID Device name

0x7ADE TS-15050 DIO P0
0x7ADf TS-15200
0x7B39 NI 9204 (DSUB)
0x7B3A NI 9204
0x7B3E USB-6421
0x7B40 USB-6423
0x7B42 USB-6451
0x7B44 USB-6453
0x9020 PXI-2501
0x9030 PXI-2503
0x9040 PXI-2527
0x9050 PXI-2565
0x9060 PXI-2590
0x9070 PXI-2591

Sync Lock Lost Detection

Network-synchronized devices that are part of a time network are synchronized to a
grand master. When the network conditions cause a chassis to lose synchronization,
any task running on that chassis will error.

This can be configured in a task through the DAQmx Channel Property

SyncUnlockBehavior, which defaults to StopTaskAndError, and can be disabled by
setting the value to IgnoreLostSyncLock. If IgnoreLostSyncLock is configured, the task
will keep running regardless of synchronization status. To query the state on a given
task, the DAQmx Read or Write Property Sync.UnlockedChansExist returns whether the
target is currently locked to the grand master. Sync.UnlockedChans returns the
channels from the devices in an unlocked target.

Network-synchronized devices include the following devices:

554 ni.com
 NI-DAQmx Device Considerations

• cDAQ-9185, and 9189.

• FD-11601, FD-11603, FD-11605, FD-11613, FD-11614, FD-11634, and FD-11637.
• cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056,
9057, and 9058.
• sbRIO-9603, 9608, 9609, 9628, 9629, and 9638.

Taking Custom Voltage Measurements with the

PXIe-4339
The PXIe-4339 supports taking regular (non-ratiometric) voltage measurements using
an AI Voltage task. In addition, as of NI-DAQmx 14.5, the PXIe-4339 can perform custom
voltage measurements while providing voltage excitation, for example, when using DC
powered sensors that return a non-ratiometric voltage. To enable this type of
measurement, configure the DAQmx Create Virtual Channel VI to AI Custom Voltage
with Excitation mode.

Setting the use excitation for scaling input to False will prevent the
PXIe-4339's ADCs from scaling the measured voltage ratiometrically to the excitation
voltage.

Setting the use excitation for scaling input to True, will enable the
PXIe-4339 to use the excitation value that the user sets with the DAQmx driver for
scaling the ratiometric input. The device will not use the voltage present on the remote
sense lines for scaling as it does when providing internal excitation. Thus, while the
driver will support using external excitation for ratiometric measurements, this is not a
recommended configuration.

The table below covers each possible combination of AI channel type, voltage
excitation source input value, and use excitation for scaling input
value. The cases highlighted will throw DAQmx errors, and the reasons for the errors
are described in the Use Case and Notes column of the table.

© National Instruments 555

 NI-DAQmx Device Considerations

Voltage Excitation Use Excitation

Channel Type Use Case and Notes
Source for Scaling

Basic bridge
True
measurement
Internal
False Bridge measurements are
always ratiometric
True Bridge measurement with
Bridge / Strain
external excitation
External
Bridge measurements are
False
always ratiometric
True Bridge measurements
None
False require excitation
Basic bridge
True
measurement
Internal
Powered sensor using
False
PXIe-4339 excitation
Bridge measurement using
True
external excitation
Custom Voltage External
Powered sensor using
False
external excitation
Bridge measurements
True
require excitation
None
Basic voltage
False
measurement

Note An RM-4339 is required to select external excitation.

Related reference:

• Using the RM-4339 with the PXIe-4339

Time-Based Features for Network-Synchronized Devices

Network-synchronized devices feature automatic network-based synchronization
when connected together across a compatible network. When these devices are
synchronized across a compatible network all device timebases, time triggers, and
timestamps will automatically be synchronized.

Network-synchronized devices include the following devices:

• cDAQ-9185, and 9189.

• FD-11601, FD-11603, FD-11605, FD-11613, FD-11614, FD-11634, and FD-11637.
• cRIO-9040, 9041, 9042, 9043, 9045, 9046, 9047, 9048, 9049, 9053, 9054, 9055, 9056,
9057, and 9058.
• sbRIO-9603, 9608, 9609, 9628, 9629, and 9638.

The cDAQ-9185/9189 are tethered chassis that can be daisy-chained to each other or
connected to external networks that support 802.1AS synchronization. To learn about

556 ni.com
 NI-DAQmx Device Considerations

this feature, refer to the cDAQ-9185/9189 User Manual and the related concepts in
this help.

The FD-116xx are devices that can be daisy-chained to each other and connected to
external networks that support 802.1AS synchronization. To learn about this feature,
refer to your FieldDAQ User Guide and the related concepts in this help.

Related concepts:

• Time Triggering
• C Series Multichassis Device Tasks
• Sync Lock Lost Detection
• Timestamps

Using Chopping to Remove Offset Voltages

Chopping is a feature that can be used to remove offset voltages and other low
frequency errors. The signal is measured twice, once normally and once with the
inputs inverted. These measurements are then averaged by the device to create each
sample.

The NI 4309 supports chopping but disables it by default. Chopping can be enabled
with the AI.Chop.Enable attribute/property, or when configuring a voltage input
task in the DAQ Assistant by selecting the Enable Chopping option. Refer to the NI
4309 User Manual for wiring instructions.

Using the RM-4339 with the PXIe-4339

This section contains information on using the NI RM-4339 with the PXIe-4339. Refer to
SC Express Smart Accessory Connections for specific terminal connections.

Excitation

The RM-4339 has a connection for an external excitation source. Each channel can also
use it's own channel-specific internal excitation. Use the AI.Excit.Src attribute/property
to set the excitation connection.

© National Instruments 557

 NI-DAQmx Device Considerations

Quarter-Bridge Completion

The RM-4339 includes three internal resistors you can use for quarter-bridge
completion. These resistors are 120 Ω, 350 Ω, and 1 kΩ. Use the
AI.Bridge.NomResistance attribute/property to set quarter-bridge completion.

Shunt Calibration

The RM-4339 includes two independent shunt calibration resistors, named A and B.
You can select which resistor to use using the AI.Bridge.ShuntCal.Select attribute/
property.

You can use an internal or external resistor for shunt resistor A. Use the
AI.Bridge.ShuntCal.ShuntCalASrc attribute/property to set this. Select Built-In to use
the internal 100 kΩ resistor, or User Provided to use an external resistor.

Shunt resistor B is an internal resistor that you can use only with quarter-bridge
completion. You can use a 50 kΩ or 100 kΩ resistor by setting the
AI.Bridge.ShuntCal.ShuntCalBResistance attribute/property.

Note

The DAQmx Perform Shunt Calibration function/VI and the Strain Gage
Calibration Wizard in MAX do not support AI.Bridge.ShuntCal.ShuntCalASrc
or AI.Bridge.ShuntCal.ShuntCalBResistance.

Related concepts:

• SC Express Smart Accessory Connections

X Series Device Groupings

X Series Multiplexed Sampling Devices:

• NI 6320
• NI 6321

558 ni.com
 NI-DAQmx Device Considerations

• NI 6323
• NI 6341
• NI 6343
• NI 6345
• NI 6351
• NI 6353
• NI 6355
• NI 6361
• NI 6363
• NI 6365
• NI 6375

X Series Simultaneous Sampling Devices:

• NI 6346
• NI 6349
• NI 6356
• NI 6358
• NI 6366
• NI 6368
• NI 6374
• NI 6376
• NI 6378
• NI 6386
• NI 6396

© National Instruments 559

 Measurement Fundamentals

Measurement Fundamentals
Measurement Fundamentals covers API-independent information that might help you
as you develop applications. Topics include an explanation of different signal types,
sensors commonly used with measurement devices, signal conditioning, and control
fundamentals.

Measurement System Overview—Hardware and NI-

DAQmx
The following figure depicts the measurement system overview, showing the path of
real-world physical phenomena to your measurement application.

560 ni.com
 Measurement Fundamentals

Physical Phenomena
Light, Pressure, Temperature, and So On

Sensors and Transducers

+ + + +
V HV mV
– – – –

Signal Conditioning

345
SC-2

PXI/SCXI Combination SCXI SCC

Data Acquisition

PCI and PCI PXI, PXI Express

Express and SC Express USB Wireless and WSN cDAQ

Configuration
Measurement & Automation Explorer (MAX), DAQ Assistant, and So On

Driver Engines
NI-DAQmx, NI-488.2

Application Programming Interface (API)

NI-DAQmx, NI-VISA, or Other API

Application Software
LabVIEW, LabWindows/CVI, Measurement Studio, or Other Programming Environments

Your Measurement Application

Sensors and transducers detect physical phenomena. Signal conditioning components

condition physical phenomena so that the measurement device can receive the data.
The computer receives the data through the measurement device. Software controls
the measurement system, telling the measurement device when and from which
channels to acquire or generate data. Software also takes the raw data, analyzes it, and
presents it in a form you can understand, such as a graph, chart, or file for a report.

NI measurement devices and application software are packaged with NI-DAQmx driver
software to program all the features of your NI measurement device such as
configuring, acquiring, and generating data from and sending data to NI measurement
devices. Using NI-DAQmx saves you from having to write these programs yourself.
Application software, such as LabVIEW, LabWindows™/CVI™, and Measurement Studio,
sends the commands to the driver, such as acquire and return a thermocouple
reading, and then displays and analyzes the data acquired.

© National Instruments 561

 Measurement Fundamentals

You can use the NI-DAQmx driver from NI application software or from any
programming environment that supports calling dynamic link libraries (DLLs) through
ANSI C interfaces. Regardless of the programming environment, your DAQ application
uses NI-DAQmx, as shown in the figure.

Signal Types
A signal is classified as analog or digital by the way it conveys information. A digital (or
binary) signal has only two possible discrete levels—high level (on) or low level (off).
An analog signal, on the other hand, contains information in the continuous variation
of the signal with respect to time. A breakdown of the main signal types is shown in the
following figure.
on
On-Off TTL Line off State
t
Digital
1
Pulse Train Counter/ Rate
0 t
Timer
Signals 0.985
DC ADC/DAC Level
(slow) t

Analog Time Domain ADC/DAC Shape

(fast) t

Freq.
Frequency ADC (fast)
Domain Analysis f Content

Analog Connection Considerations

To measure analog signals, you need to know the signal source—grounded or floating.
You also must consider the measurement system—differential, referenced single-
ended, or nonreferenced single-ended.

Related concepts:

• Grounded Signal Sources

• Floating Signal Sources
• Differential Measurement System
• Referenced and Nonreferenced Single-Ended Measurement Systems

Connecting Analog Input Signals

Signal connections vary depending on your device, connector block, and signal
conditioning module. The DAQ Assistant contains connection diagrams that show

562 ni.com
 Measurement Fundamentals

terminal connections for all common analog input measurements, such as measuring
strain, temperature, current, voltage, and so on. Refer to Viewing Connection
Diagrams in the DAQ Assistant Help for additional information.

For terminals specific to your device, refer to your device documentation.

Floating Signal Sources

In a floating source, the voltage signal is not connected to any absolute reference or
any common ground, such as earth or building ground as shown in the following
figure.

+
VS
–

Ground

Floating signal sources are also called nonreferenced signal sources. Some common
examples of floating signal sources are batteries, thermocouples, transformers, and
isolation amplifiers. Notice in the figure that neither terminal of the source is
connected to the electrical outlet ground, so each terminal is independent of the
system ground.

Measuring Floating Signal Sources

You can measure floating signal sources with both differential and single-ended
measurement systems. In the case of the differential measurement system, however,
make sure the common-mode voltage level of the signal with respect to the
measurement system ground remains in the common-mode input range of the
measurement device. A variety of phenomena—for example, the instrumentation
amplifier input bias currents—can move the voltage level of the floating source out of
the valid range of the input stage of a DAQ device.

Related concepts:

© National Instruments 563

 Measurement Fundamentals

• Differential Measurement System

• Referenced and Nonreferenced Single-Ended Measurement Systems

Grounded Signal Sources

A grounded source is one in which the voltage signals are referenced to a system
ground, such as earth or building ground, as shown in the following figure.

+
VS
–

Ground

Because such sources use the system ground, they share a common ground with the
measurement device. The most common examples of grounded sources are devices
that plug into the building ground through wall outlets, such as signal generators and
power supplies.

Note The grounds of two independently grounded signal sources generally

are not at the same potential. The difference in ground potential between
two instruments connected to the same building ground system is typically
10 mV to 200 mV. The difference can be higher if power distribution circuits
are not properly connected.

Measuring Grounded Signal Sources

A grounded signal source is best measured with a differential or an NRSE

measurement system. If you use an RSE measurement system with a grounded source,
the result is typically a noisy measurement system often showing power-line
frequency (60 Hz) components in the readings. Ground-loop introduced noise can
have both AC and DC components, introducing offset errors and noise in the
measurements. The potential difference between the two grounds causes a current to
flow in the interconnection. This current is called ground-loop current.

However, you can still use an RSE measurement system if the signal voltage levels are

564 ni.com
 Measurement Fundamentals

high and the interconnection wiring between the source and the measurement device
has a low impedance. In this case, the signal voltage measurement is degraded by
ground loop, but the degradation may be tolerable. You must observe the polarity of a
grounded signal source before connecting the signal to a ground-referenced
measurement system because the signal source can be short-circuited to ground,
which can damage the signal source.

Related concepts:

• Differential Measurement System

• Referenced and Nonreferenced Single-Ended Measurement Systems

Measurement System Types and Signal Sources

The type of input signal source (grounded or floating) and the configuration of the
measurement system (differential, single-ended, pseudodifferential) determine how
you connect signals to measurement devices.

The following table provides an application-independent summary of analog input

connections.

Signal Source Type

Floating Signal Source (Not Connected
Grounded Signal Source
to Building Ground)
Input
Examples: Ungrounded
Example: Instruments with
thermocouples, signal conditioning
nonisolated outputs
with isolated outputs, battery devices

AI +
AI + +
+ +
+ Vs
Vs AI –
– AI – –
– –
Differential (DIFF)
Rext

AI GND AI GND

© National Instruments 565

 Measurement Fundamentals

Signal Source Type

Floating Signal Source (Not Connected
Grounded Signal Source
to Building Ground)
Input
Examples: Ungrounded
Example: Instruments with
thermocouples, signal conditioning
nonisolated outputs
with isolated outputs, battery devices
Ground Referenced NOT RECOMMENDED

Single-Ended (RSE)
AI AI
+ +
+ +
Vs V1
– AI GND –
– –
Note: AI GND is shared + Vg –

as a reference for all AI GND

RSE channels
Ground-loop losses, Vg, are added to
measured signal.

Nonreferenced Single-
Ended (NRSE)
AI AI
+ + +
+
Vs Vs
– AI SENSE AI SENSE
–
Note: AI SENSE is
Rext
shared as a reference AI GND AI GND
for all NRSE channels
AI GND

AI + AI +
+ +
+ +
Vs Vs
– AI – – AI –
– –
Pseudodifferential Z Z

AI GND AI GND

R ext is the external bias resistor that you add.

Related concepts:

• Grounded Signal Sources

• Floating Signal Sources
• Differential Measurement System
• Referenced and Nonreferenced Single-Ended Measurement Systems
• Pseudodifferential Measurement System

566 ni.com
 Measurement Fundamentals

Differential Measurement System

A differential measurement system has neither of its inputs tied to a fixed reference,
such as earth or building ground. A differential measurement system is similar to a
floating signal source in that the measurement is made with respect to a floating
ground that is different from the measurement system ground. Hand-held, battery-
powered instruments and DAQ devices with instrumentation amplifiers are examples
of differential measurement systems.

The following figure shows an implementation of an 8-channel differential

measurement system used in a typical NI device. Analog multiplexers are used in the
signal path to increase the number of measurement channels when there is only a
single instrumentation amplifier. For this device, the pin labeled AIGND, the analog
input ground, is the measurement system ground.
MUX
CH0+

CH2+

CH1+

Instrumentation
CH7+ + Amplifier

+
MUX
CH0– –
Vm
CH2–

CH1–
–

CH7–

AIGND

Your signal source—floating or grounded—helps determine if you should use a

differential measurement system.

Related concepts:

• Floating Signal Sources

© National Instruments 567

 Measurement Fundamentals

• Grounded Signal Sources

Rejecting Common-Mode Voltages

An ideal differential measurement system responds only to the potential difference
between its two terminals—the positive (+) and negative (–) inputs. Any voltage
measured with respect to the instrumentation amplifier ground that is present at both
amplifier inputs is referred to as a common-mode voltage. Common-mode voltage is
completely rejected (not measured) by an ideal differential measurement system. This
capability is useful in rejection of noise, because unwanted noise is often introduced
as common-mode voltage in the circuit making up the cabling system.

Real-world devices have several factors, described by parameters such as common-

mode voltage range and common-mode rejection ratio (CMRR), that limit the ability to
reject the common-mode voltage.

Common-Mode Voltage

The common-mode voltage range limits the allowable voltage swing on each input
with respect to the measurement system ground. Violating this constraint results not
only in measurement error but also in possible damage to components on the device.
Common-mode voltage (Vcm) is defined using the following formula:

• Vcm = (V+ + V–) / 2

where V+ is the voltage at the noninverting terminal of the measurement system with
respect to the measurement system ground, and V– is the voltage at the inverting
terminal of the measurement system with respect to the measurement system ground.

CMRR

CMRR measures the ability of a differential measurement system to reject the

common-mode voltage signal. For instance, if you are measuring a thermocouple in a
noisy environment, the noise from the environment appears on both input leads.
Therefore, this noise is a common mode voltage signal that is rejected by an amount
equal to the CMRR of the instrument. Most DAQ devices specify the CMRR up to 60 Hz,
the power line frequency. CMRR in decibels (dB) is defined using the following formula:

568 ni.com
 Measurement Fundamentals

• CMRR(dB) = 20 log (Differential Gain/Common-Mode Gain)

A simple circuit is shown in the following figure. In this circuit, CMRR in decibels is
measured as 20 log Vout/Vcm, where Vcm = (V+ + V–)/2.

V+ –
Vout
V–

Referenced and Nonreferenced Single-

Ended Measurement Systems
Referenced and nonreferenced single-ended measurement systems are similar to
grounded sources in that the measurement is made with respect to ground. A
referenced single-ended (RSE) measurement system measures voltage with respect to
the ground, AIGND in the figure, which is directly connected to the measurement
system ground. The following figure shows an 8-channel referenced single-ended
measurement system.
MUX
CH0+

CH2+

CH1+

Instrumentation
CH7+ + Amplifier

–
Vm

AIGND –

DAQ devices often use a variant of the referenced single-ended measurement

technique, known as nonreferenced single-ended (NRSE). The following figure shows
an NRSE system.

© National Instruments 569

 Measurement Fundamentals

MUX
CH0+

CH2+

CH1+

Instrumentation
CH7+ + Amplifier

AISENSE –
Vm

In an NRSE measurement system, all measurements are still made with respect to a
single-node analog input sense (AISENSE), but the potential at this node can vary with
respect to the measurement system ground. The previous figure illustrates that a
single-channel NRSE measurement system is the same as a single-channel differential
measurement system.

Pseudodifferential Measurement System

A pseudodifferential measurement system combines some characteristics of a
differential input channel and a referenced single-ended (RSE) input channel. Like a
differential input channel, a pseudodifferential measurement system exposes both the
positive and negative sides of the channel. You connect the positive and negative
inputs to the respective outputs of the unit under test. The negative input is tied to
system ground through a relatively small impedance (designated as Z1 in the diagram
below). The impedance between the negative input and ground may include both
resistive and capacitive components. The positive and negative sides of the input
channel are separated by a larger impedance (designated by Zin).

Pseudodifferential input configurations are common in simultaneous sampling and

dynamic signal acquisition (DSA) devices that do not employ a multiplexed signal
architecture. A pseudodifferential system is well-suited for measuring the output of
floating or isolated devices under test such as battery-powered instruments or most
accelerometers. The pseudodifferential setup can also be used to measure referenced
signals if the signal reference potential does not differ greatly from the ground
potential of the measurement device. However, ground loops may pose an issue if the
potential of the negative leg of the signal differs significantly from chassis ground. In

570 ni.com
 Measurement Fundamentals

general, a differential input offers a better common-mode rejection ratio (CMRR) than
a pseudodifferential input.
Instrumentation
Amplifier
CH+ +
Z in +
CH– –
Vm
Z1
–

Connecting Analog Output Signals

Signal connections vary depending on your device, connector block, and signal
conditioning module. The following figure shows how to make analog output
connections for a typical NI device.

AO 0
+ Channel 0

Load V OUT 0
–
AO GND

–
Load V OUT 1
+ AO 1
Channel 1

Analog Output Channels

I/O Connector

For terminals specific to your device, refer to your device documentation.

Sampling Considerations

When sampling a signal it is important to consider device range, input limits, sampling
rate, resolution, and code width.

Related concepts:

• Device Range
• Input Limits (Maximum and Minimum Values)
• Sampling Rate

© National Instruments 571

 Measurement Fundamentals

• Resolution
• Calculating the Smallest Detectable Change—Code Width

Device Range

Device range refers to the minimum and maximum analog signal levels that the ADC
can digitize. Many measurement devices can select from several ranges by changing
from unipolar mode to bipolar mode or by selecting from multiple gains, allowing the
ADC to take full advantage of its resolution to digitize the signal.

Related concepts:

• Input Limits (Maximum and Minimum Values)

• Gain for DSA Devices

Unipolar and Bipolar Modes

Unipolar mode means that a device only supports a range of 0 V to +X V. Bipolar mode
means that a device supports a range of -X V to +X V. Some devices support only one
mode or the other, while other devices can change from unipolar mode to bipolar
mode.

Devices that can change from unipolar to bipolar mode are able to select the mode
that best fits the signal to measure. The first chart of the following figure illustrates
unipolar mode for a 3-bit ADC. The ADC has eight digital divisions in the range from 0
to 10 V. In bipolar mode, the range is -10.00 to 10.00 V, as shown in the second chart.
The same ADC now separates a 20 V range into eight divisions. The smallest detectable
difference in voltage increases from 1.25 to 2.50 V, and you now have a much less
accurate representation of the signal. The device selects the best mode available
based on the input limits you specify when you create a virtual channel.

572 ni.com
 Measurement Fundamentals

Range = 0 to 10 V
10.00
111
8.75
Amplitude (volts)

110
7.50
101
6.25
100
5.00
011
3.75
010
2.50
001
1.25
000
0.00
0 50 100 150 200
Time (s)

Range = –10 to 10 V
10.00
111
7.50
Amplitude (volts)

110
5.00
101
2.50
100
0.00
011
–2.50
010
–5.00
001
–7.50
000
–10.00
0 50 100 150 200
Time (s)

Gain Adjustment

If a device has multiple gains, it multiplies an input signal by one of the gains to make
the signal take up more of the full device range. This essentially gives the device
multiple ranges it can select from. For example, a device with an overall range of -10 V
to 10 V and possible gains of 1, 2, and 4 can select between ranges of -10 V to 10 V, -5 V
to 5 V, and -2.5 V to 2.5 V. The device selects the best gain available according to the
input limits you specify when you create a virtual channel.

Note Gain works differently for DSA devices

Input Limits (Maximum and Minimum Values)

Input limits are the maximum and minimum values you expect to measure, after any
scaling, including custom scaling.

Input limits are sometimes confused with device range. Device range refers only to the
input range of a particular device.

If you set your minimum to 0 and your maximum to 7, and your device only has a 0-5
and a 0-10 device range, the device range will be coerced to 0-10 by NI-DAQmx. This
also applies when using a custom scale.

© National Instruments 573

 Measurement Fundamentals

The maximum and minimum input limit values will match the units of measurement of
the task. For instance, the device range for a DAQ device might be 0 to 10 V, but that
device might be used with a temperature sensor that outputs 100 mV for every 1 °C.
The input limits in that case could be 0 to 100, with 10 V corresponding to 100 °C. For
an analog current input task, the units would be amps.

Input limits in a smaller range can improve the precision of your measurement. If your
device has multiple input ranges, you can strategically choose the minimum and
maximum values to detect smaller differences in your signal of interest. Consider a
device that has a 0-10 V and a 0-5 V range. In the previous temperature sensor
example, if you knew that the temperature would never be higher than 50 °C, you
could choose a minimum value of 0 and a maximum value of 50. The device can then
detect smaller differences in temperature because it is digitizing a voltage between 0
and 5 V, rather than 0 and 10 V.

Related concepts:

• Device Range

Sampling Rate

One of the most important parameters of an analog input or output system is the rate
at which the measurement device samples an incoming signal or generates the output
signal. The sampling rate, which is called the scan rate in Traditional NI-DAQ
(Legacy), is the speed at which a device acquires or generates a sample on each
channel. A fast input sampling rate acquires more points in a given time and can form
a better representation of the original signal than a slow sampling rate. Generating a 1
Hz signal using 1000 points per cycle at 1000 S/s produces a much finer representation
than using 10 points per cycle at a sample rate of 10 S/s.

Sampling too slowly results in a poor representation of the analog signal.

Undersampling causes the signal to appear as if it has a different frequency than it
actually does. This misrepresentation of a signal is called aliasing.

Resolution

Resolution is the smallest amount of input signal change that a device or sensor can
detect. The number of bits used to represent an analog signal determines the

574 ni.com
 Measurement Fundamentals

resolution of the ADC. You can compare the resolution on a measurement device to the
marks on a ruler. The more marks you have, the more precise your measurements.
Similarly, the higher the resolution, the higher the number of divisions into which your
system can break down the ADC range, and therefore, the smaller the detectable
change.

A 3-bit ADC divides the range into 23 or 8 divisions. A binary or digital code between
000 and 111 represents each division. The ADC translates each measurement of the
analog signal to one of the digital divisions. The following figure shows a sine wave
digital image as obtained by a 3-bit ADC. Clearly, the digital signal does not represent
the original signal adequately, because the converter has too few digital divisions to
represent the varying voltages of the analog signal. By increasing the resolution to 16
bits, however, the number of divisions of the ADC increases from 8 to 65,536 (216). The
ADC now can obtain an extremely accurate representation of the analog signal.
10.00
111
8.75
110 16-Bit
7.50
Amplitude (volts)

101
6.25
100
5.00
011
3.75
010 3-Bit
2.50
001
1.25
000
0.00
0 50 100 150 200
Time (s)

Calculating the Smallest Detectable Change—Code Width

The resolution and device range of a measurement device determine the smallest
detectable change, called the code width, in the input signal. The smaller your code
width, the more accurate your measurements are.

You can calculate the code width using the following formula:

• code width = device range/ 2resolution

For example, a 12-bit measurement device with a 0 to 10 V range detects a 2.4 mV

change, while the same device with a -10 to 10 V input range detects only a change of
4.8 mV:

• device range/ 2resolution = 10/212 = 2.4 mV

© National Instruments 575

 Measurement Fundamentals

• device range/ 2resolution = 20/212 = 4.8 mV

A high-resolution A/D converter (ADC) provides a smaller code width given the
preceding device voltage ranges.

• device range/ 2resolution = 10/216 = 0.15 mV

• device range/ 2resolution = 20/216 = 0.3 mV

The following table shows how the code width of a 12-bit measurement device varies
by device range. The device selects the best possible range based on the input limits
you specify when you create a virtual channel. Select input limits that accurately
reflect the signal you want to measure in order to achieve the smallest possible code
width. NI-DAQmx coerces those input limits to fit the selected device range.

Overall Device Range Possible Device Ranges with Gain Adjustment Precision65

• 0 to 10 V • 2.44 mV
• 0 to 5 V • 1.22 mV
• 0 to 2.5 V • 610 µV
0 to 10 V • 0 to 1.25 V • 305 µV
• 0 to 1 V • 244 µV
• 0 to 0.1 V • 24.4 µV
• 0 to 20 mV • 4.88 µV

• -5 to 5 V • 2.44 mV
• -2.5 to 2.5 V • 1.22 mV
• -1.25 to 1.25 V • 610 µV
–5 to 5 V • -0.625 to 0.625 V • 305 µV
• -0.5 to 0.5 V • 244 µV
• -50 to 50 mV • 24.4 µV
• -10 to 10 mV • 4.88 µV

• -10 to 10 V • 4.88 mV
-10 to 10 V
• -5 to 5 V • 2.44 mV

65. The value of 1 Least Significant Bit (LSB) of the 12-bit ADC. In other words, the voltage increment
corresponding to a change of 1 count in the ADC 12-bit count.

576 ni.com
 Measurement Fundamentals

Overall Device Range Possible Device Ranges with Gain Adjustment Precision

• -2.5 to 2.5 V • 1.22 mV

• -1.25 to 1.25 V • 610 µV
• -1 to 1 V • 488 µV
• -0.1 to 0.1 V • 48.8 µV
• -20 to 20 mV • 9.76 µV

Note The NI 4472 is a 24-bit device with a range of -10 V to 10 V. However,

one bit is reserved, leaving an effective resolution of 23 bits. Thus, the code
width is 20/223 = 2.38 µV.

Related concepts:

• Resolution
• Device Range
• Input Limits (Maximum and Minimum Values)
• Input Limit Coercion

Digital Signals
A digital signal has two discrete levels—a high and a low level. One example of a digital
signal is a transistor-transistor logic (TTL) compatible signal. A TTL-compatible signal
has the following characteristics:

• 0 V to 0.8 V = logic low

• 2 V to 5 V = logic high
• Maximum rise/fall time = 50 ns

Maximum Rise/Fall Time = 50 ns

+5.0 V

High

+2.0 V
Indeterminate
+0.8 V
Low
0V

Digital devices can monitor the state of the pulse and can transition the pulse from one

© National Instruments 577

 Measurement Fundamentals

state to another. A counter can also monitor the state as well as detect rising edges, a
transition from logic low to logic high, and falling edges, a transition from logic high to
logic low. Counters are used commonly to count edges and for time measurements,
such as measuring digital frequency or the period of a signal.

Connecting Digital I/O Signals

The number of digital lines varies from device to device. The following figure shows
signal connections for three typical DIO applications.

+5 V

LED

P0.<4..7>

TTL Signal
P0.<0..3>

+5 V

Switch

D GND

I/O Connector

The figure shows PO <0..3> configured for digital input and PO <4..7> configured for
digital output. Digital input applications include receiving TTL signals and sensing
external device states such as the state of a switch. Digital output applications include
sending TTL signals and driving external devices such as the LED shown in the figure.

Counters

Counters measure and generate digital signals. Counters are used commonly to count
edges and for time measurements, such as measuring digital frequency or the period
of a signal. The signal connections required for counters vary depending on the device
and your application.

Related concepts:

578 ni.com
 Measurement Fundamentals

• Connecting Counter Signals

Digital Logic States

Test engineers can choose from a number of different digital I/O instruments with a
range of features for communication and test applications. Beyond the basic
capabilities of driving a digital pattern of 1s and 0s, digital instruments often support
waveforms that can include some or all of the logic states shown in the following table.

Logic State Drive Data Expected Response

0 Logic Low Don't Care
Drive States 1 Logic High Don't Care
Z Disable Don't Care
L Disable Logic Low
Compare States H Disable Logic High
X Disable Don't Care

The six logic states control the voltage driver and, if supported, the compare engine of
the digital tester (such as a DAQ device) on a per clock cycle basis. Drive states specify
what stimulus data the digital tester drives on a particular channel or when to disable
the voltage driver (referred to as the tristate or high-impedence state). Compare states
indicate the expected response from the device under test. These six logic states make
it possible to perform bidirectional communication and real-time hardware
comparison of acquired response data.

Duty Cycle

The duty cycle is a characteristic of a pulse. Use the following equation to calculate the
duty cycle of a pulse whose high time and low time are unequal:

• Duty Cycle = High Time/Pulse Period

where Pulse Period is high time plus low time.

The duty cycle of a pulse is between 0 and 1 and is often expressed as a percentage.

© National Instruments 579

 Measurement Fundamentals

Refer to the following figure for examples of duty cycles. A pulse with a high time equal
to the low time has a duty cycle of 0.5, or 50%. A duty cycle less than 50% indicates
that the low time is greater than the high time, and a duty cycle greater than 50%
indicates that the high time is greater than the low time.
Counter
Starts

Duty Cycle = 0.5

Duty Cycle = 0.1

Duty Cycle = 0.9

Initial
Delay

Signal Analysis
Signal analysis is the process of transforming an acquired signal to extract information
about the signal, filter noise from the signal, and present the signal in a more
understandable form than the raw signal.

Filtering and windowing are two signal analysis techniques.

Related concepts:

• Filtering
• Windowing

Filtering

Filtering is one of the most commonly used signal processing techniques. Signal
conditioning systems can filter unwanted signals or noise from the signal you are
measuring. Use a noise filter on low-rate, or slowly changing, signals, such as
temperature, to eliminate higher frequency signals that can reduce signal accuracy. A
common use of a filter is to eliminate the noise from a 50 or 60 Hz AC power line. A
lowpass filter of 4 Hz removes the 50 or 60 Hz AC noise from signals sampled at low
rates. A lowpass filter eliminates all signal frequency components above the cutoff

580 ni.com
 Measurement Fundamentals

frequency. Many signal conditioning modules have lowpass filters that have software-
selectable cutoff frequencies from 10 Hz to 25 kHz.

Windowing

Use windowing, or smoothing windows, to minimize spectral leakage associated with

truncated waveforms.

Spectral Leakage

Spectral leakage is a phenomenon whereby the measured spectral energy appears to

leak from one frequency into other frequencies. It occurs when a sampled waveform
does not contain an integral number of cycles over the time period during which it was
sampled. The technique used to reduce spectral leakage is to multiply the time-
domain waveform by a window function.

Discrete Fourier Transform (DFT) and Fast Fourier Transform (FFT) are mathematical
techniques that resolve a given signal into the sum of sines and cosines. It is the basis
for spectrum analysis. Using the DFT/FFT when you sample a noninteger number of
cycles, such as 7.5 cycles, returns a spectrum in which it appears as if the energy at one
frequency leaks into all the other frequencies because the FFT assumes that the data is
a single period of a periodically repeating waveform. The artificial discontinuities
appear as very high frequencies that were not present in the original signal. Because
these frequencies are higher than the Nyquist frequency, they appear aliased between
0 and fs/2.

The type of window to use depends on the type of signal you acquire and on the
application. Choosing the correct window requires some knowledge of the signal that
you are analyzing. The following table lists common types of windows, the appropriate
signal types, and example applications.

Window Signal Type and Description Applications

Order tracking, system analysis (frequency
Transient signals that are shorter
Rectangular response measurements) with pseudorandom
than the length of the window;
(no excitation, separation of two tones with
truncates a window to within a
window) frequencies very close to each other but with
finite time interval
almost equal amplitudes

© National Instruments 581

 Measurement Fundamentals

Window Signal Type and Description Applications

Window that is the shape of a
Triangle General-purpose applications
triangle
Transient signals that are longer
Hanning Often used in speech signal processing
than the length of the window
Transient signals that are longer
than the length of the window; a
Hamming modified version of the Hanning Often used in speech signal processing
window that is discontinuous at
the edges
Transient signals; similar to
Hanning and Hamming windows
Blackman General-purpose applications
but adds one additional cosine
term to reduce ripple
Has the best amplitude accuracy
Accurate, single-tone amplitude measurements
Flat Top of all the windows but limits
with no nearby frequency components
frequency selectivity

Note In many cases, you might not have sufficient knowledge of the signal,
so you need to experiment with different windows to find the best one.

Signal Conditioning
Sensors can generate electrical signals to measure physical phenomena, such as
temperature, force, sound, or light. To measure signals from transducers, you must
convert them into a form that a DAQ device can accept. For example, the output
voltage of most thermocouples is very small and susceptible to noise. Therefore, you
may need to amplify or filter the thermocouple output before digitizing it.

The manipulation of signals to prepare them for digitizing is called signal

conditioning. Common types of signal conditioning include the following.

Amplification
Amplification is a type of signal conditioning that improves accuracy in the resulting

582 ni.com
 Measurement Fundamentals

digitized signal by increasing signal amplitude relative to noise.

For the highest possible accuracy, amplify the signal so the maximum voltage swing
equals the maximum input range of the ADC, or digitizer. Your system should amplify
low-level signals at the measurement device located nearest the signal source, as
shown in the following figure.

Noise

Instrumentation
Amplifier
+
– Lead MUX ADC
Low-Level Wires
Signals External
Amplifier Measurement
Device

Tip Use shielded cables or a twisted pair of cables. By minimizing wire

length, you can minimize noise that the lead wires pick up. Keep signal wires
away from AC power cables and monitors to reduce 50 or 60 Hz noise.

If you amplify the signal at the measurement device, the signal is measured and
digitized with noise that may have entered the lead wires. However, if you amplify the
signal close to the signal source with an SCXI module, noise has less impact on the
measured signal.

Linearization
Linearization is a type of signal conditioning in which software linearizes the voltage
levels from transducers, so the voltages can be scaled to measure physical
phenomena. For example, a change in voltage of 10 mV for a thermocouple usually
does not reflect a change of 10 degrees. However, with linearization in software or
hardware, the thermocouple can be scaled to the appropriate temperature in your
application. Most transducers have linearization tables that describe scaling the
transducer.

Transducer Excitation
Signal conditioning systems can generate excitation for some transducers. Strain gages
and RTDs require external voltage and current, respectively, to excite their circuitry

© National Instruments 583

 Measurement Fundamentals

into measuring physical phenomena. This type of excitation is similar to the power a
radio needs to receive and decode audio signals. Several measurement devices
provide the necessary excitation for transducers. Consult your device documentation
to see if your device can generate excitation.

Isolation
Signals often can exceed the limits that a measurement device can handle. Trying to
measure a signal that is too large for the measurement device can damage the device
or you. To keep you and your device safe from large voltages, you can apply a signal
conditioning technique called isolation. The signal conditioning hardware attenuates
high common mode voltages and extracts a signal that measurement devices can
handle. Isolation also ensures that differences in ground potentials do not affect your
device.

Common Sensors
Depending on your application, you may use several different kinds of sensors. Some
commonly used ones are strain gages, thermocouples, thermistors, angular encoders,
linear encoders, bridge-based sensors, and resistance temperature detectors (RTDs).

Related concepts:

• Strain Gages
• Thermocouples
• Thermistors
• Quadrature Encoders
• Two-Pulse Encoders
• Bridge-Based Sensors
• Resistance Temperature Detectors (RTDs)

2-Wire Resistance
Resistance measurements in the range above 100 Ω are generally made using the
2-wire method shown in the following figure. The excitation current flows through the
leads and the unknown resistance, Rmeas. Your device measures the voltage across the

584 ni.com
 Measurement Fundamentals

resistance through the same set of leads and computes the resistance accordingly.

Errors in the 2-wire measurements are introduced by the lead resistance, RLead, when
measuring lower resistances. Because there is a voltage drop across the lead
resistance equal to I × RLead, the voltage measured by your device is not exactly the
same as the voltage across the resistance, Rmeas. Because typical lead resistances lie in
the range of 0.01–1 Ω, accurate 2-wire resistance measurements are very difficult to
obtain if Rmeas is below 100 Ω.

Test
Current
DAQ Device EX+ RLead

+
IEX ADC Σ Rmeas
–

EX– RLead

3-Wire Resistance
Use the 3-wire resistance method, as shown in the following figure, to measure
resistance on resistors that have three lead wires.

Test
RLead Current
DAQ Device EX+

+ +
IEX ADC Σ Σ Rmeas
– –
RLead
+ Sense–
×2 Σ
–

RLead
EX–

The 3-wire method uses three test leads, one pair for the excitation current (EX+, EX-),
and a third wire (Sense-) to compensate for the lead wire resistances. The third wire

© National Instruments 585

 Measurement Fundamentals

measures the voltage developed over the lead resistance in the EX- leg of the excitation
current path. By subtracting its value from the overall differential signal, the device can
compensate for parasitic lead resistances in the EX+ leg. However, this would only
compensate for lead resistance in the EX+ leg and not in the EX- leg. To compensate for
lead resistance both in the EX- leg and in the EX+ leg, the device approximates the EX+
leg by assuming the voltage is the same as in the EX- leg. Thus the voltage between
Sense- and EX- is multiplied by two before being subtracted from the overall
differential signal. This method works well when lead resistances in the EX+ leg match
resistances in the EX- leg.

Some legacy devices do not provide compensation. In that case, you need to specify
the lead-wire resistance so that it can be subtracted in software.

4-Wire Resistance
Use the 4-wire resistance method, as shown in the following figure, to measure
resistances of less than 100 Ω. The 4-wire method is more accurate than the 2-wire
method.

Test
DAQ Device RLead Current
EX+

RLead
Sense–

+
IEX ADC Σ Rmeas
–
RLead
Sense–

RLead
EX–

The 4-wire method uses four test leads, one pair for the injected current (the test lead)
and the other pair for sensing the voltage across the resistor Rmeas (the sense lead).
Because no current flows in the sense lead, the device measures only the voltage
developed across the resistance. Thus, a 4-wire resistance eliminates errors that test
lead and contact resistance cause.

586 ni.com
 Measurement Fundamentals

Bridge-Based Sensors
Bridge-based sensors operate by correlating a physical phenomena, such as strain,
temperature, or force, to a change in resistance in one or more legs of a Wheatstone
bridge. The general Wheatstone bridge, shown in the following figure, is a network of
four resistive legs with an excitation voltage, VEX, that is applied across the bridge. One
or more of these legs can be active sensing elements.

R1 R4

+ – +
VEX VCH
–

R2 R3

The Wheatstone bridge is the electrical equivalent of two parallel voltage divider
circuits. R1 and R2 compose one voltage divider circuit, and R4 and R3 compose the
second voltage divider circuit. You measure the output of a Wheatstone bridge
between the middle nodes of the two voltage dividers.

A physical phenomena, such as a temperature shift or a change in strain applied to a

specimen, changes the resistance of the sensing elements in the Wheatstone bridge.
You can use the Wheatstone bridge configuration to help measure the small variations
in resistance that the sensing elements produce corresponding to a physical change in
the specimen.

Bridge Measurement Types

NI-DAQmx provides several measurement types for taking measurements from a

bridge-based sensor.

• Strain gage—Use the strain gage measurement type for performing strain
measurements.
• Force, pressure, and torque—Use these measurement types for performing
bridge-based force, pressure, or torque measurements on supported devices.

NI-DAQmx provides additional measurement types from which you read data in
electrical units. Use a custom scale or write scaling code to convert the electrical units
to physical units.

© National Instruments 587

 Measurement Fundamentals

• Bridge (V/V)—Channels using the bridge V/V measurement type return a voltage
ratio instead of physical units. Use this measurement type on supported devices
for other bridge-based sensors, for sensors that scale data to physical units NI-
DAQmx does not support, or to measure torsional strain.
• Custom voltage with excitation—Use this measurement type for bridge-based
measurements on devices that do not support the strain gage, force, pressure,
torque, or bridge (V/V) measurement types. Specify to use excitation for scaling to
acquire a voltage ratio instead of a voltage. On ratiometric devices, you must
specify to use excitation for scaling because those devices can only acquire a
voltage ratio.
• Voltage—Use this measurement type with bridge-based sensors that include an
internal amplifier and output voltage.
• Current—Use this measurement type with bridge-based sensors that include an
internal amplifier and output current.
Related concepts:

• Bridge Measurement Type Support

Bridge Sensor Scaling

Measurements from a bridge-based sensor are based on a ratio of measured voltage to

excitation voltage. NI-DAQmx uses the following equation to calculate that ratio:

(V – VIB) × G
VR =
(VEX)

where VR is the voltage ratio; V is the voltage output from the bridge; VIB is the initial
bridge voltage, as determined by offset nulling; VEX is the excitation voltage supplied
to the bridge; and G is the gain adjustment from shunt calibration.

Ratiometric devices divide the voltage output from the bridge by the excitation voltage
in hardware. Therefore, V/VEX must be within the device range of the device. On
voltage devices, the voltage output from the bridge must be within the device range.
The initial bridge voltage and gain adjustment affect the association between device
range and input limits. For example, on a device that can measure ±5 V, an initial
bridge voltage of 1 V means that the minimum and maximum input limits must
correspond to -6 V to 4 V.

588 ni.com
 Measurement Fundamentals

NI-DAQmx uses various methods to scale that voltage ratio to physical units,
depending on the bridge configuration for strain measurements or on the scaling type
that best matches the specifications provided by the sensor manufacturer for other
bridge-based sensors NI-DAQmx supports.

Related concepts:

• Offset Nulling (Bridge Balancing)

• Shunt Calibration (Gain Adjustment)
• Device Range
• Input Limits (Maximum and Minimum Values)
• Strain Gage Bridge Configurations
• Bridge Scaling Types

Bridge Configurations

There are three types of bridge configurations: quarter-bridge, half-bridge, and full-
bridge. The number of active element legs in the Wheatstone bridge determines the
kind of bridge configuration.

Configuration Number of Active Elements

Quarter-bridge 1
Half-bridge 2
Full-bridge 4

Strain gages use variations of these bridge configurations.

Related concepts:

• Strain Gage Bridge Configurations

Signal Conditioning Requirements for Bridge-Based Sensors

Common signal conditioning requirements for bridge-based sensors include:

• Bridge completion

© National Instruments 589

 Measurement Fundamentals

• Bridge excitation and remote sensing

• Signal amplification

In addition, you should calibrate your sensor periodically to account for changes in the
physical characteristics of the sensor and in the material the sensor is measuring, to
account for variations in the lead wire resistance, and to compensate for imperfections
in the measurement system. Calibrating bridge-based sensors usually involves two
steps: offset nulling, or bridge balancing, and shunt calibration, or gain adjustment.

Related concepts:

• Bridge Completion
• Bridge Excitation
• Signal Amplification
• Offset Nulling (Bridge Balancing)
• Shunt Calibration (Gain Adjustment)

Bridge Completion

Unless you are using a full-bridge sensor, you must complete the bridge with reference
resistors. Therefore, signal conditioners for bridge-based sensors typically provide
half-bridge completion networks consisting of two high-precision reference resistors.
The nominal resistance of the completion resistors is less important than how well the
two resistors match. Ideally, the resistors match well and provide a stable reference
voltage of VEX/2 to the negative input lead of the measurement channel. The high
resistance of the completion resistors helps minimize the current draw from the
excitation voltage. However, using completion resistors that are too large can result in
increased noise and errors due to bias currents.

Signal Amplification

The output of bridge-based sensors is relatively small. For example, most strain gage
bridges and strain-based transducers output less than 10 mV/V, or 10 millivolts of
output per volt of excitation voltage. Therefore, signal conditioners for bridge-based
sensors usually include amplifiers to boost the signal level, to increase measurement
resolution, and to improve signal-to-noise ratios. For example, SCXI signal
conditioning modules include configurable gain amplifiers with gains up to 2,000.
Other devices support multiple device ranges.

590 ni.com
 Measurement Fundamentals

Related concepts:

• Device Range

Bridge Excitation

Bridge-based sensors require a constant voltage to power the bridge. Bridge signal
conditioners typically include a voltage source. While there is no standard voltage level
that is recognized industry wide, excitation voltage levels of around 3 V and 10 V are
common.

Excitation sources can suffer from stability and accuracy issues. To compensate,
ratiometric devices constantly measure the actual excitation voltage and use it, rather
than an intended excitation value, when scaling data.

Related concepts:

• Bridge Sensor Scaling

Remote Sensing

If the bridge circuit is located away from the signal conditioner and excitation source, a
possible source of error is voltage drops caused by resistance in the wires that connect
the excitation voltage to the bridge. Therefore, some signal conditioners include a
feature called remote sensing to compensate for this error. There are two common
methods of remote sensing.

With feedback remote sensing, you connect extra sense wires to the point where the
excitation voltage wires connect to the bridge circuit. The extra sense wires serve to
regulate the excitation supply, to compensate for lead losses, and to deliver the
needed voltage at the bridge.

An alternative remote sensing scheme uses a separate measurement channel to

measure directly the excitation voltage delivered across the bridge. Because the
measurement channel leads carry very little current, the lead resistance has negligible
effect on the measurement. You then can use the measured excitation voltage in the
voltage-to-strain conversion to compensate for lead losses.

© National Instruments 591

 Measurement Fundamentals

Bridge-Based Sensor Calibration

Calibrate bridge-based sensors periodically to account for changes in the physical

characteristics of the sensor and in the material the sensor is measuring, to account for
variations in the lead wire resistance, and to compensate for imperfections in the
measurement system. Calibrating bridge-based sensors usually involves two steps:
offset nulling, or bridge balancing, and shunt calibration, or gain adjustment.

Related concepts:

• Offset Nulling (Bridge Balancing)

• Shunt Calibration (Gain Adjustment)

Offset Nulling (Bridge Balancing)

When you install a bridge-based sensor, the bridge probably will not output exactly 0 V
when not under load. Slight variations in resistance among the bridge legs generate
some nonzero initial offset voltage. Use the DAQmx Perform Bridge Offset Nulling
Calibration VI/function or the DAQ Assistant to perform an offset nulling calibration,
which performs bridge balancing in a few different ways. Refer to the device
documentation to determine the offset nulling methods your device provides.

Related concepts:

• Bridge Sensor Scaling

Software Compensation (Initial Bridge Voltage)

This method of bridge balancing compensates for the initial voltage in software. With
this method, NI-DAQmx measures the bridge while not under load. NI-DAQmx then
uses this measurement as the initial bridge voltage when scaling readings from the
bridge. This method is simple, fast, and requires no manual adjustments. The
disadvantage of the software compensation method is that the method does not
remove the offset of the bridge. If the offset is large enough, it limits the amplifier gain
you can apply to the output voltage, thus limiting the dynamic range of the
measurement.

592 ni.com
 Measurement Fundamentals

Offset Nulling Circuit

The second bridge balancing method uses an adjustable resistor, or potentiometer, to

electrically adjust the output of the bridge to 0 V.

Hardware Nulling Compensation

The third method, like the software compensation method, does not affect the bridge
directly. A nulling circuit adds an adjustable DC voltage, positive or negative, to the
output of the instrumentation amplifier to compensate for initial bridge offset.

Shunt Calibration (Gain Adjustment)

You can verify the output of a bridge-based measurement system by comparing the
measured bridge output with a calculated value if the physical load on the sensor is
known. NI-DAQmx can then use the difference (if any) between the calculated and the
measured values as a gain adjustment factor for each measurement. You can simulate
applying a load to the bridge by connecting a large known resistor in parallel with the
bridge. This resistor, called a shunt resistor, offsets the zero voltage of the bridge.
Because the value of the shunt resistor is known, you can calculate the physical load
corresponding to the voltage drop of the resistor.

Use the DAQmx Perform Shunt Calibration VI/function or the DAQ Assistant to perform
a shunt calibration, which sets the gain adjustment for a virtual channel. NI-DAQmx
then uses this gain adjustment when scaling readings from the bridge. Some NI
products include internal shunt resistors.

Related concepts:

• Bridge Sensor Scaling

Bridge-Based Force, Pressure, and Torque Sensors

Sensors for measuring force, pressure, and torque, such as a load cell, are often based
on a Wheatstone bridge. These sensors typically use a full-bridge configuration with a
350 Ω nominal bridge resistance.

Sensor manufacturers often provide a table or polynomial equation to describe how

© National Instruments 593

 Measurement Fundamentals

electrical values scale to the physical phenomena the sensor measures. NI-DAQmx
provides several scaling types for scaling data according to the specifications provided
by the sensor manufacturer.

Related concepts:

• Bridge-Based Sensors
• Bridge Configurations
• Bridge Scaling Types

Bridge Scaling Types

NI-DAQmx provides three methods to scale electrical values (voltage ratios) from a
bridge-based sensor to physical units:

• Two-Point Linear—You provide two pairs of electrical values and their

corresponding physical values. NI-DAQmx uses those values to calculate the slope
and y-intercept of a linear equation and uses that equation to scale electrical
values to physical values. Measured electrical and physical values can fall outside
the range of the values specified for calculating the slope and y-intercept.
• Table—You provide a set of electrical values and the corresponding physical
values. NI-DAQmx performs linear scaling between each pair of electrical and
physical values. The input limits must fall within the smallest and largest physical
values.
• Polynomial—You provide the forward and reverse coefficients of a polynomial
equation. NI-DAQmx uses that equation to scale electrical values to physical
values. Use the DAQmx Compute Reverse Polynomial Coefficients VI/function to
determine one set of coefficients if you know only the other set.

Datasheets or calibration certificates from sensor manufacturers often include a table

of electrical and physical values or a polynomial equation for scaling. If you do not
have a table or polynomial equation for your sensor, use two-point linear scaling. Use
the rated output of the sensor and the sensor capacity as one pair of electrical and
physical values. Use zero for the other pair of electrical and physical values.

Note Strain gages use specific equations for scaling, depending on the
bridge configuration.

594 ni.com
 Measurement Fundamentals

Related concepts:

• Bridge Sensor Scaling

• Input Limits (Maximum and Minimum Values)
• Strain Gage Bridge Configurations

Strain Gages

You can measure strain with a strain gage, which is a device with electrical resistance
that varies in proportion to the amount of strain in the device, and with signal
conditioning. When using a strain gage, you bond the strain gage to the device under
test, apply force, and measure the strain by detecting changes in resistance (Ω). Strain
gages return varying voltages in response to stress or vibrations in materials.
Resistance changes in parts of the strain gage to indicate deformation of the material.
Strain gages require excitation, generally voltage excitation, and linearization of the
voltage measurements.

Strain measurements rarely involve quantities larger than a few microstrain (µε).
Therefore, measuring strain requires accurate measurements of very small changes in
resistance. For example, if a test specimen undergoes a substantial strain of 500 µε, a
strain gage with a gage factor of 2 exhibits a change in electrical resistance of only 2 ×
(500 × 10 -6 ) = 0.1%. For 120 Ω, this is a change of only 0.12 Ω.

To measure such small changes in resistance and to compensate for temperature

sensitivity, strain gages often use a Wheatstone bridge with a voltage or current
excitation source, arranged in one of several bridge configurations. The gage is the
collection of all of the active elements of the Wheatstone bridge.

NI-DAQmx supports measuring axial strain, bending strain, or both. While you can use
some similar configuration types to measure torsional strain, NI software scaling does
not support these configuration types. It is possible to use NI products to measure
torsional strain, but to properly scale these configuration types you must use a custom
scale with a bridge (V/V) or a custom voltage with excitation channel.

Gage Factor

A fundamental parameter of the strain gage is its sensitivity to strain, expressed

© National Instruments 595

 Measurement Fundamentals

quantitatively as the gage factor (GF). Gage factor is the ratio of the fractional change
in electrical resistance to the fractional change in length, or strain. The gage factor
must be the same for each gage in the bridge.

The gage factor for metallic strain gages is usually around 2. You can obtain the actual
gage factor of a particular strain gage from the sensor vendor or sensor
documentation.

Nominal Gage Resistance

Nominal gage resistance is the resistance of a strain gage in an unstrained position.

You can obtain the nominal gage resistance of a particular gage from the sensor
vendor or sensor documentation.

Related concepts:

• Strain Rosette
• Signal Conditioning Requirements for Bridge-Based Sensors
• Bridge-Based Sensors
• Strain Gage Bridge Configurations
• Custom Scales

Strain Gage Bridge Configurations

Connect strain gages in a variation on a generic Wheatstone bridge configuration.

These configurations vary based on the placement of strain gages within the bridge;
their location and orientation on the material you want to measure; and whether the
gages are active sensing gages or dummy gages, used for temperature compensation.

Related concepts:

• Bridge Configurations
• Quarter-Bridge Type I
• Quarter-Bridge Type II
• Half-Bridge Type I
• Half-Bridge Type II
• Full-Bridge Type I
• Full-Bridge Type II

596 ni.com
 Measurement Fundamentals

• Full-Bridge Type III

Quarter-Bridge Type I
The following figure shows how to position a strain gage resistor in an axial
configuration for the quarter-bridge type I.

R4 (+ )

The following figure shows how to position a strain gage resistor in a bending
configuration for the quarter-bridge type I.

R4 (+ )

Quarter-bridge type I strain gage configurations have the following characteristics:

• A single active strain gage element mounted in the principle direction of axial or
bending strain.
• A passive quarter-bridge completion resistor, known as a dummy resistor, in
addition to half-bridge completion.
• Temperature variation decreasing the accuracy of the measurements.
• Sensitivity at 1000 µε is ~ 0.5 mVout / VEX input.

Related concepts:

• Bridge Sensor Scaling

© National Instruments 597

 Measurement Fundamentals

Quarter-Bridge Type I Circuit Diagram

RL

R1
R4 (+ )
+ RL
– +
VEX VCH
–
RL
R2 R3

The following symbols apply to the circuit diagram:

• R1 is the half-bridge completion resistor.

• R2 is the half-bridge completion resistor.
• R3 is the quarter-bridge completion resistor, known as a dummy resistor.
• R4 is the active strain gage element measuring tensile strain (+ε).
• VEX is the excitation voltage.
• RL is the lead resistance.
• VCH is the measured voltage.

The following equation converts voltage ratios to strain units for quarter-bridge
configurations.

–4Vr RL
strain( ) = 1+
GF(1+2Vr) Rg

where Vr is the voltage ratio that virtual channels use in the voltage-to-strain
conversion equation, GF is the gage factor, RL is the lead resistance, and Rg is the
nominal gage resistance.

Quarter-Bridge Type II
The following figure shows how to position a strain gage resistor in an axial
configuration for the quarter-bridge type II.

598 ni.com
 Measurement Fundamentals

R 4 (+ )

R3

The following figure shows how to position a strain gage resistor in a bending
configuration for the quarter-bridge type II.

R 4 (+ )

R3

Quarter-bridge type II strain gage configurations have the following characteristics:

• One active strain gage element and one passive, temperature-sensing quarter-
bridge element, known as a dummy resistor. The active element is mounted in the
direction of axial or bending strain. The dummy gage is mounted in close thermal
contact with the strain specimen but is not bonded to the specimen, and is usually
mounted transverse, or perpendicular, to the principle axis of strain. This
configuration is often confused with the half-bridge type I configuration, but in the
half-bridge type I configuration, the R3 element is active and bonded to the strain
specimen to measure the effect of Poisson's ratio.
• Completion resistors which provide half-bridge completion.
• Compensation for temperature.
• Sensitivity at 1000 µε is ~ 0.5 mVout/ VEX input.

Related concepts:

• Bridge Sensor Scaling

Quarter-Bridge Type II Circuit Diagram

© National Instruments 599

 Measurement Fundamentals

RL

R2
R4 (+ )
+ RL
– +
VEX VCH
–
R2 R3
RL

The following symbols apply to the circuit diagram:

• R1 is the half-bridge completion resistor.

• R2 is the half-bridge completion resistor.
• R3 is the quarter-bridge temperature sensing element, known as a dummy resistor.
• R4 is the active strain gage element measuring tensile strain (+ε).
• VEX is the excitation voltage.
• RL is the lead resistance.
• VCH is the measured voltage.

The following equation converts voltage ratios to strain units for quarter-bridge
configurations.

–4Vr RL
strain( ) = 1+
GF(1+2Vr) Rg

where Vr is the voltage ratio that virtual channels use in the voltage-to-strain
conversion equation, GF is the gage factor, RL is the lead resistance, and Rg is the
nominal gage resistance.

Half-Bridge Type I
The following figure shows how to position strain gage resistors in an axial
configuration for the half-bridge type I.

R4 (+ )

R3 ( )

600 ni.com
 Measurement Fundamentals

The following figure shows how to position strain gage resistors in a bending
configuration for the half-bridge type I.

R4 (+ )

R3 ( )

Half-bridge type I strain gage configurations have the following characteristics:

• Two active strain gage elements, one mounted in the direction of axial strain and
the other acting as a Poisson gage and mounted transverse, or perpendicular, to
the principal axis of strain.
• Completion resistors which provide half-bridge completion.
• Sensitivity to both axial and bending strain.
• Compensation for temperature.
• Compensation for the aggregate effect on the principle strain measurement due to
the Poisson's ratio of the material.
• Sensitivity at 1000 µε is ~ 0.65 mVout/ VEX input

Related concepts:

• Bridge Sensor Scaling

Half-Bridge Type I Circuit Diagram

RL

R1
R 4 (+ )
+ RL
– +
VEX VCH
–
R2 R 3 (– )
RL

The following symbols apply to the circuit diagram:

• R1 is the half-bridge completion resistor.

• R2 is the half-bridge completion resistor.
• R3 is the active strain gage element measuring compression due to the Poisson

© National Instruments 601

 Measurement Fundamentals

effect (–ε).
• R4 is the active strain gage element measuring tensile strain (+ε).
• VEX is the excitation voltage.
• RL is the lead resistance.
• VCH is the measured voltage.

The following equation converts voltage ratios to strain units for half-bridge type I
configurations.

–4Vr RL
strain( ) = 1+
GF[(1+ )–2Vr( –1)] Rg

where Vr is the voltage ratio that virtual channels use in the voltage-to-strain
conversion equation, GF is the gage factor, v is the Poisson's ratio, RL is the lead
resistance, and Rg is the nominal gage resistance.

Half-Bridge Type II
The half-bridge type II configuration only measures bending strain.

R 4 (+ )

R 3 (– )

The following figure shows how to position strain gage resistors in a bending
configuration for the half-bridge type II.

602 ni.com
 Measurement Fundamentals

R4 (+ )

R3 ( )

Half-bridge type II strain gage configurations have the following characteristics:

• Two active strain gage elements, one mounted in the direction of axial strain on
the top side of the strain specimen and the other mounted in the direction of axial
strain on the bottom side.
• Completion resistors which provide half-bridge completion.
• Sensitivity to bending strain.
• Rejection of axial strain.
• Compensation for temperature.
• Sensitivity at 1000 µε is ~ 1 mVout / VEX input.

Related concepts:

• Bridge Sensor Scaling

Half-Bridge Type II Circuit Diagram

RL

R1 R4 (+ )
+ RL
– +
VEX VCH
–
R2 R3 (– )
RL

The following symbols apply to the circuit diagram:

• R1 is the half-bridge completion resistor.

• R2 is the half-bridge completion resistor.
• R3 is the active strain gage element measuring compressive strain (–ε).
• R4 is the active strain gage resistor measuring tensile strain (+ε).
• VEX is the excitation voltage.
• RL is the lead resistance.
• VCH is the measured voltage.

© National Instruments 603

 Measurement Fundamentals

The following equation converts voltage ratios to strain units for half-bridge type II
configurations.

–2V r RL
Strain( ) =
GF
(1+ Rg
)

where Vr is the voltage ratio that virtual channels use in the voltage-to-strain
conversion equation, GF is the gage factor, RL is the lead resistance, and Rg is the
nominal gage resistance.

Full-Bridge Type I
The full-bridge type I configuration only measures the bending strain.

R2

R1

R4

R3

The following figure shows how to position strain gage resistors in a bending
configuration for the full-bridge type I.

R2 (+ )

R1 (– )

R4 (+ )

R3 (– )

Full-bridge type I strain gage configurations have the following characteristics:

• Four active strain gage elements, two mounted in the direction of bending strain
on the top side of the strain specimen and the other two mounted in the direction

604 ni.com
 Measurement Fundamentals

of bending strain on the bottom side.

• High sensitivity to bending strain.
• Rejection of axial strain.
• Compensation for temperature.
• Compensation for lead resistance.
• Sensitivity at 1000 µε is ~ 2.0 mVout / VEX input.

Related concepts:

• Bridge Sensor Scaling

Full-Bridge Type I Circuit Diagram

R1 (– ) R4 (+ )

+ – +
VEX VCH
–

R2 (+ ) R3 (– )

The following symbols apply to the circuit diagram:

• R1 is the active strain gage element measuring compressive strain (–ε).

• R2 is the active strain gage element measuring tensile strain (+ε).
• R3 is the active strain gage element measuring compressive strain (–ε).
• R4 is the active strain gage element measuring tensile strain (+ε).
• VEX is the excitation voltage.
• RL is the lead resistance.
• VCH is the measured voltage.

The following equation converts voltage ratios to strain units for full-bridge type I
configurations.
–V r
Strain( ) =
GF

where Vr is the voltage ratio that virtual channels use in the voltage-to-strain
conversion equation, and GF is the gage factor.

© National Instruments 605

 Measurement Fundamentals

Full-Bridge Type II
The full-bridge type II configuration only measures bending strain.

R4

R1

R3

R2

The following figure shows how to position strain gage elements in a bending
configuration for the full-bridge type II.

R4 (+ )

R1 ( )

R3 ( )

R2 (+ )

Full-bridge type II strain gage configurations have the following characteristics:

• Four active strain gage elements. Two are mounted in the direction of bending
strain with one on the top side of the strain specimen and the other on the bottom
side. The other two act together as a Poisson gage and are mounted transverse, or
perpendicular, to the principal axis of strain with one on the top side of the strain
specimen and the other on the bottom side.
• Rejection of axial strain.
• Compensation for temperature.
• Compensation for the aggregate effect on the principle strain measurement due to
the Poisson's ratio of the material.
• Compensation for lead resistance.

606 ni.com
 Measurement Fundamentals

• Sensitivity at 1000 µε is ~ 1.3 mVout / VEX input.

Related concepts:

• Bridge Sensor Scaling

Full-Bridge Type II Circuit Diagram

R1 (– ) R4 (+ )

+ – +
VEX VCH
–

R2 (+ ) R3 (– )

The following symbols apply to the circuit diagram:

• R1 is the active strain gage element measuring compressive Poisson effect (–ε).
• R2 is the active strain gage element measuring tensile Poisson effect (+ε).
• R3 is the active strain gage element measuring compressive strain (–ε).
• R4 is the active strain gage element measuring tensile strain (+ε).
• VEX is the excitation voltage.
• RL is the lead resistance.
• VCH is the measured voltage.

The following equation converts voltage ratios to strain units for full-bridge type II
configurations.

–2V r
Strain( )=
GF( +1)

where Vr is the voltage ratio that virtual channels use in the voltage-to-strain
conversion equation, GF is the gage factor, and v is the Poisson's ratio.

Full-Bridge Type III

The following figure shows how to position strain gage resistors in an axial
configuration for the full-bridge type III.

© National Instruments 607

 Measurement Fundamentals

R2 (+ )

R1 ( )

R4 (+ )

R3 ( )

The full-bridge type III configuration only measures the axial configuration.

R2

R1

R4

R3

Full-bridge type III strain gage configurations have the following characteristics:

• Four active strain gage elements. Two are mounted in the direction of axial strain
with one on the top side of the strain specimen and the other on the bottom side.
The other two act together as a Poisson gage and are mounted transverse, or
perpendicular, to the principal axis of strain with one on the top side of the strain
specimen and the other on the bottom side.
• Compensation for temperature.
• Rejection of bending strain.
• Compensation for the aggregate effect on the principle strain measurement due to
the Poisson's ratio of the material.
• Compensation for lead resistance.
• Sensitivity at 1000 µε is ~ 1.3 mVout / VEX input.

Related concepts:

• Bridge Sensor Scaling

608 ni.com
 Measurement Fundamentals

Full-Bridge Type III Circuit Diagram

R 1 (– ) R 4 (+ )

+ – +
VEX VCH
–

R 2 (+ ) R 3 (– )

The following symbols apply to the circuit diagram:

• R1 is the active strain gage element measuring compressive Poisson effect (–ε).
• R2 is the active strain gage element measuring tensile strain (+ε).
• R3 is the active strain gage element measuring compressive Poisson effect (–ε).
• R4 is the active strain gage element measuring the tensile strain (+ε).
• VEX is the excitation voltage.
• RL is the lead resistance.
• VCH is the measured voltage.

The following equation converts voltage ratios to strain units for full-bridge type III
configurations.

–2V r
Strain( )=
GF[( +1)–V r ( –1)]

where Vr is the voltage ratio that virtual channels use in the voltage-to-strain
conversion equation, GF is the gage factor, and v is the Poisson's ratio.

Strain Rosette

A strain gage can measure strain in only one direction—the axis along which the strain
gage is mounted. To effectively measure the three independent components of plane
strain (extensional strain along X and Y axis, as well as shear strain), three independent
strain measurements are needed. Strain gage rosettes are used to perform such
measurements.

A strain gage rosette is an arrangement of two or three closely positioned strain gages,
separately oriented to measure the strains along different directions of the underlying

© National Instruments 609

 Measurement Fundamentals

surface of the object being measured.

Strain-gage manufacturers offer three basic types of strain gage rosettes.

• Tee Rosette—A tee rosette consists of two gages oriented at 90 degrees with
respect to each other.
• Rectangular Rosette—A rectangular rosette consists of three strain gages, each
separated by a 45 degree angle.
• Delta Rosette—A delta rosette consists of three strain gages, each separated by a
60 degree angle.
Related concepts:

• Strain Gages

Eddy Current Proximity Probes

Proximity probes are sensors that measure relative proximity. They use changes in
voltage to measure shaft surfaces that rotate or reciprocate. Because they are non-
contacting transducers, proximity probes are mounted on a reasonably stationary
mechanical structure, such as a bearing housing. From the mounting point, they
measure the static and dynamic displacement behavior of the moving machinery. Use
the proximity probe measurement type when you want to measure a dynamic
position, such as an air gap between parts of moving machinery.

Eddy current proximity probes contain a driver and a monitor or regulated DC supply.
The monitor or DC supply applies a power input of -24 VDC to the driver. The driver's
internal oscillator converts some of the energy into a high-frequency radio signal. The
signal is directed to the probe coil through a coaxial cable. The coil at the tip of the
probe broadcasts the signal as a magnetic field into the surrounding area. If a
conductive material intercepts the magnetic field, eddy currents are generated and the
high-frequency radio signal loses power. The closer the conductive material is to the
probe tip, the more power the signal loses. This power loss triggers a change in the
voltage of the driver.

Proximity probe sensitivity is usually defined as the slope of a calibration curve as

follows:

610 ni.com
 Measurement Fundamentals

Differential Voltage
Sensitivity =
Differential Gap

You can calculate the sensitivity by measuring two points in the sensor's dynamic
range, using the following formula:

Point1 Voltage – Point2 Voltage

Sensitivity =
Point1 Gap – Point2 Gap

Note Proximity probes can differ in sensitivity. Refer to the documentation

provided by the proximity probe manufacturer for information specific to
your probe.

Offset voltage can occur when the tip of the probe touches the conductive material.
Use the following formula to determine the offset voltage where offset is the output
voltage of the sensor when the tip contacts the conductive material. In most cases,
offset should be 0 V.

Voltage = Sensitivity* Gap + Offset

After you calibrate your proximity probe, you need to update the sensitivity and offset
attributes. You can determine the physical distance between the sensor's tip and the
target material by using the following formula:

Distance = (Voltage – Offset) / Sensitivity

Encoders
There are two common types of encoders used for measuring position: two-pulse
encoders and quadrature encoders.

Related concepts:

• Two-Pulse Encoders

© National Instruments 611

 Measurement Fundamentals

• Quadrature Encoders

Quadrature Encoders

Quadrature encoders measure position by causing two signals to pulse while the
encoder moves. These signals are signal A (also called channel A) and signal B (also
called channel B). Signal A and B are offset by 90°, which determines the direction the
encoder moves. For instance, in an angular quadrature encoder, if signal A leads, the
encoder rotates clockwise. If signal B leads, the encoder rotates counter clockwise.

Counters on M Series, C Series, NI-TIO devices support three types of decoding for
quadrature encoders: X1, X2, and X4. With X1 decoding, when signal A leads signal B,
the counter increments on the rising edge of signal A. When signal B leads signal A, the
counter decrements on the falling edge of signal A.
Signal A
Signal B
Counter
Value 5 6 7 7 6 5

With X2 decoding, the same behavior holds as with X1, except the counter increments
and decrements on both rising and falling edges of signal A.
Signal A
Signal B
Counter
Value 5 6 7 8 9 9 8 7 6 5

Similarly, with X4 decoding, the counter increments and decrements on both rising
and falling edges of both signal A and signal B. X4 decoding is more sensitive to
position, but is also more likely to provide an incorrect measurement if there is
vibration in the encoder.
Signal A
Signal B
Counter
5 6 7 8 9 10 11 12 13 13 12 11 10 9 8 7 6 5
Value

Many encoders also use z indexing for precise determination of a reference position.

Related concepts:

• Z Indexing

612 ni.com
 Measurement Fundamentals

Two-Pulse Encoders

A two pulse encoder is a position measurement sensor that has two channels, A and B.
When the encoder is moved, either signal A or signal B on the encoder pulses. A pulse
on signal A represents a movement in one direction, and a pulse on signal B represents
movement in the opposite direction. When signal A pulses, the counter increments.
When signal B pulses, the counter decrements.
Signal A

Signal B

Count 1 2 3 2 1 0

Many encoders also use z indexing for precise determination of a reference position.

Related concepts:

• Z Indexing

Z Indexing

Encoders typically use a third signal for Z indexing, which produces a pulse at fixed
positions that you can use for precise determination of a reference position. For
instance, if the Z index is 45° for an angular encoder, the encoder sends a pulse on the
Z input terminal every time the encoder is turned to the 45° mark.

The behavior of signal Z differs with designs. You must refer to the documentation for
an encoder to obtain the timing of signal Z in relation to the A and B signals. In NI-
DAQmx, you can configure Z indexing with the Z Index Phase attribute/property.

Integrated Electronics Piezoelectric (IEPE) and Charge

Integrated Electronics Piezoelectric (IEPE) is a type of transducer that is packaged with
a built-in amplifier. Because the charge produced by some sensors is very small, the
electrical signal produced by the transducer is susceptible to noise, and sensitive
electronics must be used to amplify and condition the signal. An IEPE sensor integrates
the sensitive electronics as close as possible to the transducer to ensure better noise
immunity and convenient packaging. These sensors require a 4-20 mA current
excitation to operate.

© National Instruments 613

 Measurement Fundamentals

Charge Mode Operation

A charge mode sensor is a piezoelectric transducer which requires an amplifier, but

unlike IEPE transducers, this amplifier is not built in. This separation of transducer and
amplifier allows for the implementation of more complex amplifiers and filters
because there is less constraints on physical space and power. The separation of
piezoelectric element and signal conditioning also allows the transducer to operate
over a higher temperature range. These sensors require no external excitation, but do
require a device which has charge mode amplification.

Accelerometers

An accelerometer, a sensor that represents acceleration as a voltage, comes in two

axial types. The most common accelerometer measures acceleration along only a
single axis. This type is often used to measure mechanical vibration levels. The second
type is a tri-axial accelerometer. This accelerometer can create a 3D vector of
acceleration in the form of orthogonal components. Use this type when you need to
determine the type of vibration—lateral, transverse, rotational, and so on—that a
component is undergoing or the direction of acceleration of the component.

Both types of accelerometers come with either both leads insulated, or isolated, from
the case or with one lead grounded to the case. Some accelerometers rely on the
piezoelectric effect to generate voltage. To measure acceleration with this type of
sensor, the sensor must be connected to a charge-sensitive amplifier.

Other accelerometers have a charge-sensitive amplifier built inside them. This

amplifier accepts a constant current source and varies its impedance with respect to a
varying charge on the piezoelectric crystal. You can see this change in impedance as a
change in voltage across the inputs of the accelerometer. Thus, the accelerometer uses
only two wires per axis for both sensor excitation, or current, and signal output, or
voltage. The instrumentation for this type of accelerometer consists of a constant
current source and an instrumentation, or differential, amplifier. The current source
provides the excitation for the built-in amplifier of the sensor, while the
instrumentation amplifier measures the voltage potential across the leads of the
sensor.

When choosing an accelerometer, pay attention to the most critical parameters. If the
sensor must operate in extreme temperatures, you are limited to a sensor that relies

614 ni.com
 Measurement Fundamentals

on the piezoelectric effect to generate voltage. If the environment is very noisy, a

sensor with a charge-sensitive amplifier built in might be the only usable choice.

To reduce errors when using an accelerometer, consider these factors:

• If the sensor is DC coupled, the DC offset of the accelerometer can drift with both
temperature and age. This applies to both types of sensors because charge-
sensitive amplifiers are prone to drift. AC coupling the output of the amplifier can
minimize the drift in the system.
• Motors, transformers, and other industrial equipment can induce noise currents in
the sensor cables. These currents can be an especially large source of noise with
sensor systems that rely on the piezoelectric effect to generate voltage. Carefully
routing sensor cables can minimize the noise in the cables.
• Accelerometers might have ground loops. Some accelerometers have their cases
tied to a sense wire, while others are completely isolated from their cases. If you
use a case-grounded sensor in a system with a grounded input amplifier, you set
up a large ground loop, creating a source of noise.

Related concepts:

• Velocity Transducers

Force Sensors (Piezoelectric)

Piezoelectric force sensors are typically used to measure dynamic force events. Such
sensors are divided into two main categories: load cells and impact hammers.

Piezoelectric load cells measure the amount of force transmitted through the sensor in
response to an external stimulus, such as shaking or an impact.

Impact hammers allow you to apply an impact to a material and measure the actual
amount of force applied. You can then correlate that force to the force measured by a
load cell or to readings from accelerometers. Impact hammers can use tips of different
size, shape, or material for measuring different frequencies.

Note NI-DAQmx supports only bridge-based and IEPE force sensors.

© National Instruments 615

 Measurement Fundamentals

Sensor manufacturers make load cells and impact hammers with varying sensitivity
and other characteristics. Refer to the documentation from your sensor manufacturer
for specifications and theory of operation for your load cell or impact hammer.

Sensor Calibration

Force sensors can drift from their documented sensitivity over time. Calibrating a force
sensor involves determining its actual sensitivity. Use ratio calibration with a
calibrated accelerometer to determine the actual sensitivity of a force sensor.

Related concepts:

• Accelerometers
• Velocity Transducers

Microphones

A microphone is a transducer that converts acoustical waves into electrical signals.

The most common instrumentation microphone, a condenser microphone, uses a
capacitive sensing element.

A condenser microphone incorporates a stretched metal diaphragm that forms one

plate of a capacitor. A metal disk placed close to the diaphragm acts as a backplate.
When a sound field excites the diaphragm, the capacitance between the two plates
varies according to the variation in the sound pressure. A stable DC voltage is applied
to the plates through a high resistance to keep electrical charges on the plate. The
change in the capacitance generates an AC output proportional to the sound pressure.
The following figure shows a condenser microphone.
4

AP

AP = acoustic pressure, 1 = metal diaphragm, 2 = metal disk, 3 = insulator, 4 = case.

616 ni.com
 Measurement Fundamentals

An instrumentation microphone usually consists of a microphone cartridge and a pre-

amplifier. Sometimes these two components are independent; sometimes the
components are combined and cannot be separated.

The major characteristics of a microphone are its sensitivity, usually expressed in mV/
Pa, and its frequency response. Microphones are available in different diameters.
Common diameters include: 1/8 in., 1/4 in., 1/2 in., and 1 in. Each diameter offers a
specific compromise in terms of sensitivity and frequency response.

To reduce errors when using a microphone, keep several factors in mind:

• For measurements in a free field (a sound field with no major nearby reflections),
use a free-field microphone pointed at the source of sound.
• For measurements in a diffuse field, such as inside in a highly reverberant room,
where sound is coming from all directions, use a random incidence microphone.
• For measurements when the microphone is part of the surface of a room or of the
object being measured, use a pressure microphone.
• For outdoor measurements, fit the microphone with suitable protection against
the environment. This may include windscreens, rain caps, and built-in heaters to
prevent condensation.
• To prevent vibrations from influencing the measurement, you might need to shock
mount the microphone. Check the microphone specifications for vibration
sensitivity.
• For reproducible measurements, make sure the microphone is mounted firmly and
at a precisely reproducible location, both compared to the unit being tested and to
the environment.
• Always calibrate the entire measurement chain, including the microphone, before
starting the measurement. For highly critical measurements, as an extra
precaution, you may want to perform a new calibration immediately after the
measurements are completed to make sure the system is still within tolerances.

Velocity Transducers

Velocity transducers are used to measure dynamic velocity such as that produced by a
running machine or a vibrating structure.

Older velocity probes use a moving coil in a permanent magnetic field to generate a
signal that is proportional to the velocity of the vibration.

© National Instruments 617

 Measurement Fundamentals

More modern implementations operate using the same principles as IEPE

accelerometers. Additionally, an integrating circuit is used to convert acceleration to
velocity. Use the same best practices for storage and handling, calibration, mounting,
and signal conditioning of IEPE velocity sensors as you would for IEPE accelerometers.

Note NI-DAQmx supports only IEPE velocity sensors.

Sensor manufacturers make IEPE velocity transducers with varying sensitivity and
other characteristics. Use a sensor appropriate for your application.

Overview of Temperature Sensor Types

The three most commonly used transducers for temperature are thermocouples,
resistance temperature detectors (RTDs), and thermistors. The following table
illustrates some of the capabilities and limitations of these sensors. Use this table as a
reference for choosing the right sensor for your temperature measurement
application.

Sensor Advantages Disadvantages

wide range, fast response,
Thermocouples require CJC, nonlinear
inexpensive
slow response, require excitation, lead
RTDs rugged, accurate
resistance, nonlinear
repeatable, fine resolution, low require excitation, narrow range,
Thermistors
current, fast response nonlinear

Related concepts:

• Thermocouples
• Resistance Temperature Detectors (RTDs)
• Thermistors

Resistance Temperature Detectors (RTDs)

618 ni.com
 Measurement Fundamentals

An RTD is a temperature sensing device with resistance that increases with

temperature. An RTD is usually constructed with wire coil or deposited film of pure
metal. RTDs can be made of different metals and have different nominal resistances,
but the most popular RTD is platinum and has a nominal resistance of 100 Ω at 0 °C.

Signal conditioning is generally required to measure temperature using an RTD.

Because an RTD is a resistive device, you must pass a current through the device to
produce a measurable voltage. Providing current to take a resistive measurement is a
form of signal conditioning called current excitation. In addition to producing current
excitation for the RTD, signal conditioning amplifies the output voltage signal, and
filters the signal to remove unwanted noise. You also can use signal conditioning to
electrically isolate the RTD and the monitored system from the DAQ system and the
host computer. Refer to Signal Conditioning Requirements for Thermistors
and RTDs for more information.

Numerous types of RTDs exist, and they are typically defined by their material, their
nominal resistance, and their temperature coefficient of resistance (TCR). The TCR of
an RTD is the average temperature coefficient of resistance of the RTD from 0 to 100 °C
and is the most common method of specifying the behavior of an RTD. The TCR for
platinum RTDs is determined by the Callendar-Van Dusen equation.

Related concepts:

• Signal Conditioning Requirements for Thermistors and RTDs

• Callendar-Van Dusen Equation
• Platinum RTD Types
• 2-Wire Resistance
• 3-Wire Resistance
• 4-Wire Resistance

Platinum RTD Types

The following table lists common platinum RTD types and standards. All of these RTD
types are supported in NI-DAQmx. Notice that there are some shared standards. The
TCR and the Callendar-Van Dusen coefficients are more important than the standards.

© National Instruments 619

 Measurement Fundamentals

Typical Callendar-Van Dusen

Standards Material TCR Notes
R0 (Ω) Coefficient

• IEC-751
• DIN 43760 • 100 • A = 3.9083 × 10-3
• BS 1904 Ω Most common
• ASTM-E1137
Platinum 3851
• 1000 • B = -5.775 × 10-7 RTDs
• EN-60751 Ω • C = -4.183 × 10-12
• IEC-60751

• A = 3.81 × 10-3
Low-cost vendor
compliant RTD66
Platinum 3750 1000 Ω • B = -6.02 × 10-7 Low-cost RTD
• C = -6.0 × 10-12

• A = 3.9739 × 10-3
Used primarily in
JISC 1604 1997 Platinum 3916 100 Ω • B = -5.870 × 10-7 Japan
• C = -4.4 × 10-12

• A = 3.9787 × 10-3
US Industrial Standard
D-100 American
Platinum 3920 100 Ω • B = -5.8686 × 10-7 Low-cost RTD
• C = -4.167 × 10-12

• A = 3.9692 × 10-3
US Industrial Standard
American
Platinum 3911 100 Ω • B = -5.8495 × 10-7 Low-cost RTD
• C = -4.233 × 10-12

• A = 3.9888 × 10-3
The definition of
ITS-90 Platinum 3928 100 Ω • B = -5.915 × 10-7 temperature
• C = -3.85 × 10-12

66. No standard. Check the TCR.

620 ni.com
 Measurement Fundamentals

Related concepts:

• Callendar-Van Dusen Equation

Callendar-Van Dusen Equation

Platinum RTDs use a linearization curve known as the Callendar-Van Dusen equation
to measure the temperature of RTDs. The equation is as follows:

Temperatures below 0 °C:

R T = R0[1 + A × T + B × T2 + C × T3 × (T - 100 °C)]

Temperatures above 0 °C:

R T = R0[1 + A × T + B × T2]

Where:

T = temperature in degrees Celsius

RT = RTD resistance at temperature T

R0 = RTD nominal resistance at 0 °C

A, B, and C = coefficients given in the table in Platinum RTD Types.

Related concepts:

• Platinum RTD Types

Thermistors

A thermistor is a piece of semiconductor made from metal oxides, pressed into a small
bead, disk, wafer, or other shape, heated at high temperatures, and coated with epoxy
or glass.

© National Instruments 621

 Measurement Fundamentals

Like RTDs, by passing a current through a thermistor, you can read the voltage across
the thermistor and thus determine its temperature. Unlike RTDs, thermistors have a
higher resistance (anywhere from 2,000 to 10,000 Ω) and a much higher sensitivity
(~200 Ω/°C). However, thermistors are generally used only up to the 300 °C
temperature range.

NI-DAQmx scales the resistance of a thermistor to a temperature using the Steinhart-

Hart thermistor equation:
1
= A + B(In(R)) + C(In(R))3
T

where T is the temperature in Kelvins, R is the measured resistance, and A, B, and C are
constants provided by the thermistor manufacturer.

Because thermistors have high resistance, lead-wire resistance does not affect the
accuracy of the measurements. Unlike RTDs, 2-wire measurements are adequate.

For more information about the signal conditioning requirements of a thermistor, refer
to Signal Conditioning Requirements for Thermistors and RTDs.

Related concepts:

• Signal Conditioning Requirements for Thermistors and RTDs

Signal Conditioning Requirements for Thermistors and RTDs

Thermistors and RTDs require the following signal conditioning:

• Current Excitation—Because RTDs and thermistors are resistive devices, your DAQ
system must provide a current excitation source to measure a voltage across the
device. This current source must be constant and precise.
• 2-, 3-, and 4-Wire Configurations (RTDs only)—RTDs come in 2-, 3-, and 4-wire
configurations. Therefore, your system must support the type of RTD you choose.
Thermistors are typically 2-wire devices because they have higher resistance
characteristics, thus eliminating lead resistance considerations.
• Linearization —Neither RTD nor thermistor output voltage is linear with
temperature. Therefore, your system must perform linearization either in hardware
or software.

622 ni.com
 Measurement Fundamentals

Related concepts:

• 2-Wire Resistance
• 3-Wire Resistance
• 4-Wire Resistance

Thermocouples

Thermocouples are the most commonly used temperature sensors.

A thermocouple is created when two dissimilar metals touch and the contact point
produces a small open-circuit voltage that corresponds to temperature. This
thermoelectric voltage is known as Seebeck voltage and is nonlinear with respect to
temperature. Thermocouples require signal conditioning.

Thermocouple types differ in composition and accurate range:

Temperature Range
Temperature Range (°C) for
Thermocouple Positive Negative (°C) for Inverse
Polynomial Coefficients or
Type Conductor Conductor Polynomial
for Table Conversion
Coefficients
J Iron Constantan -210 to 1200 -210 to 1200
K Chromel Alumel -270 to 1372 -200 to 1372
N Nicrosil Nisil -270 to 1300 -200 to 1300
Platinum-13%
R Platinum -50 to 1768 -50 to 1768
Rhodium
Platinum-10%
S Platinum -50 to 1768 -50 to 1768
Rhodium
T Copper Constantan -270 to 400 -200 to 400
B Platinum Rhodium 0 to 1820 250 to 1820
E Chromel Constantan -270 to 1000 -200 to 1000

© National Instruments 623

 Measurement Fundamentals

Use the temperature ranges for polynomial coefficients when converting temperature
to voltage. For most thermocouples, the equation used for converting temperature to
voltage is the following:
n
i
VR = ci t 90
i=0

where E is the voltage in millivolts, t90 is the temperature in degrees Celsius, and ci is
the coefficient.

Use the temperature ranges for inverse polynomial coefficients when converting
voltage to temperature. For most thermocouples, the equation for converting voltage
to temperature is the following:
n
i
t 90 = Di E
i=0

where t90 is the temperature in degrees Celsius, E is the voltage in millivolts, and Di is
the coefficient.

Note For coefficients to use with each thermocouple type, visit the NIST
ITS-90 thermocouple database available at nist.gov.

Related concepts:

• Signal Conditioning Requirements for Thermocouples

Related information:

• nist.gov

Signal Conditioning Requirements for Thermocouples

Thermocouples require the following signal conditioning:

• Amplification for High-Resolution ADC—Thermocouples generate very low-

voltage signals, usually measured in microvolts. To acquire these signals with a
measurement device, you must amplify the thermocouple signal to measure it

624 ni.com
 Measurement Fundamentals

accurately with a standard 12-bit measurement device. Alternatively, you can use a
measurement device with a high-resolution ADC. NI recommends a device with 16
bits of resolution and amplification capabilities or a device with 24 bits of
resolution.
• Cold-Junction Compensation—Thermocouples require some form of temperature
reference to compensate for unwanted parasitic thermocouples. A parasitic
thermocouple is created when you connect a thermocouple to an instrument.
Because the terminals on the instrument are made of a different material than the
thermocouple wire, voltage is created at the junctions, called cold junctions, which
changes the voltage output by the actual thermocouple.

Traditionally, the temperature reference was 0 °C. The National Institute of

Standards and Technology (NIST) thermocouple reference tables are created using
this setup. Although an ice bath reference is quite accurate, it is not always
practical. A more practical approach is to measure the temperature of the
reference junction with a direct-reading temperature sensor, such as a thermistor
or an IC sensor, and then subtract the parasitic thermocouple thermoelectric
contributions. This process is called cold-junction compensation.

T1

Isothermal
Region Ice Bath
Temp = 0° C

Copper
Metal 1
Metal 2

• Filtering—A thermocouple can act much like an antenna, making it very

susceptible to noise from nearby 50/60 Hz power sources. Therefore, apply a 2 Hz
or 4 Hz lowpass filter to your thermocouple signal to remove power line noise.
• Linearization—The output voltage of a thermocouple is not linear with
temperature. Therefore, your system must perform linearization either through
hardware or software.

LVDTs
LVDTs operate on the principle of a transformer and consist of a stationary coil

© National Instruments 625

 Measurement Fundamentals

assembly and a moveable core. An LVDT measures displacement by associating a

specific signal value for any given position of the core. LVDT signal conditioners
generate a sine wave for the primary output signal and synchronously demodulate the
secondary output signal. The demodulated output is passed through a lowpass filter
to remove high-frequency ripple. The resulting output is a DC voltage proportional to
core displacement. The sign of the DC voltage indicates whether the displacement is to
the left or right.

LVDTs require special electronics designed for the sensor. LVDTs typically have a delay
of approximately 10 ms caused by filtering in the signal conditioner.

LVDTs typically come in 4-wire, or open wire, and 5-wire, or ratiometric wire,
configurations. Wires from the sensor connect to a signal conditioning circuit that
translates the output of the LVDT to a measurable voltage. The method of signal
conditioning used on the signals from the first and second secondaries differentiate
the 4-wire and 5-wire configurations. In the 4-wire configuration, the sensor only
measures the voltage difference between the two secondaries.

The benefit of using a 4-wire configuration is that you require a simpler signal
conditioning system. However, temperature changes can alter the efficiency of the
magnetic induction of the LVDT. Because the 4-wire scheme is also sensitive to phase
changes between the primary and the resulting secondary voltage, long wires or a
poor excitation source also can cause problems.

The 5-wire configuration is less sensitive to both temperature changes and phase
differences between the primary and the secondaries. The device determines phase
information at the signal conditioning circuitry without needing to reference the phase
of the primary excitation source. Therefore, you can use longer wires between the
LVDT and the signal conditioning circuitry.

LVDTs are extremely rugged, operate over wide temperature ranges, and are
insensitive to moisture and dirt. LVDTs are a preferred sensor in harsh environments,
where very long life is needed because there are no moving parts in contact or where
very low friction is required. Also, LVDT technology lends itself well to applications
requiring accurate measurements less than 0.1 in., such as measuring the thickness of
sheet material. The main advantage of the LVDT transducer over other types of
displacement transducer is the high degree of robustness. Because there is no physical
contact across the sensing element, there is no wear in the sensing element.

626 ni.com
 Measurement Fundamentals

Because the device relies on the coupling of magnetic flux, an LVDT can have infinite
resolution. Therefore, suitable signal conditioning hardware can detect the smallest
fraction of movement, and only the resolution of the data acquisition system
determines the resolution of the transducer.

RVDTs
RVDTs are the rotational version of LVDTs and generally operate over an angular range
of ±30°–70°. They are available in servo-mount and can rotate through 360° without
stopping.

RVDTs require special electronics designed for the sensor. RVDTs typically have a delay
of 10 ms caused by required filtering in the signal conditioner. They are extremely
rugged and operate over wide temperature ranges. In environments characterized by
extremes in temperature and shock, an RVDT is the clear choice for rotational
applications when you need more than 70° of measurement range.

Related concepts:

• LVDTs

Transducer Electronic Data Sheets (TEDS)

IEEE P1451.4 is an emerging standard for adding plug and play capabilities to analog
transducers. The underlying mechanism for plug and play identification is the
standardization of a Transducer Electronic Data Sheet (TEDS). A TEDS contains the
critical information needed by a device or measurement system to identify,
characterize, interface, and properly use signals from an analog sensor. That
information includes the sensor's model number, model ID, calibration constants,
scaling constants, and more.

A TEDS is deployed for a sensor in one of two ways:

• A TEDS can reside in embedded memory, typically an EEPROM, within the sensor.
To download a TEDS from the sensor, you need TEDS-supported hardware such as
the BNC-2096 or the SCXI-1314T. You can then download the TEDS in MAX to use in
your application. Refer to the Measurement & Automation Explorer Help

© National Instruments 627

 Measurement Fundamentals

for NI-DAQmx for additional information on downloading and using TEDS.

• A Virtual TEDS can exist as a separate file, downloadable from the internet. A
Virtual TEDS extends the benefits of the standardized TEDS to legacy sensors and
applications in which the embedded memory or EEPROM is not available. You can
download Virtual TEDS from ni.com by typing in the sensor serial number. A Virtual
TEDS does not require TEDS-supported hardware.

Writing Data to TEDS Sensors

Use the Write TEDS Data function/VI to write data to a TEDS sensor. The TEDS data
must be in a virtual TEDS file or in a bitstream constructed according to the IEEE 1451.4
specification.

National Instruments provides a LabVIEW library for viewing and editing TEDS
bitstreams and virtual TEDS files. You can download the TEDS Library for LabVIEW at
How Do I Install the TEDS Library into LabVIEW?.

Related concepts:

• Transducer Electronic Data Sheets (TEDS)

Basic TEDS Data

Some TEDS sensors include a PROM, to which you can write data one time. When you
write TEDS data, you can choose to write basic TEDS data to the PROM or to the
EEPROM. Basic TEDS data includes the manufacturer ID, model number, serial
number, version number, and version letter. If you write basic TEDS data to the PROM,
the Write TEDS Data function/VI returns an error if you later attempt to write basic
TEDS data to the EEPROM.

Control Overview
In a typical control application, there are one or more process variables that you want
to control, such as temperature. Sensors measure the process variable in the dynamic
system and provide the data to the control application. The set point is the value you
want for the process variable. A comparator determines if a difference exists between
the process variable and the set point. If a difference exists and if the control system

628 ni.com
 Measurement Fundamentals

deems the difference large enough, the compensator processes the data and
determines the desired actuator output to drive the system closer to the set point.

Comparator

Actuator System
Set Point + – Compensator
Output (Plant)

Process
Variable
Measurement

For example, in a temperature measurement system, if the actual temperature is 100

°C and the temperature set point is 120 °C, the compensator needs to take some action
to raise the temperature. One actuator output might be to drive a heater at 62 percent
of its maximum output capacity. The increased heater actuator output causes the
system to become warmer, which results in an increased temperature. This kind of
system is called a closed-loop control system because the process of reading sensors
and calculating the actuator output you want repeats continuously at a fixed loop rate.

Related concepts:

• Proportional-Integral-Derivative (PID)
• Real Time
• Loop Cycle Time
• Jitter Overview for Control Applications
• Event Response

Proportional-Integral-Derivative (PID)
The Proportional-Integral-Derivative (PID) algorithm is the most common control
algorithm used in industry. Often, people use PID to control processes that include
heating and cooling systems, fluid level monitoring, flow control, and pressure control.
In PID control, you must specify a process variable and a setpoint. The process variable
is the system parameter you want to control, such as temperature, pressure, or flow
rate, and the setpoint is the desired value for the parameter you are controlling. A PID
controller determines a controller output value, such as the heater power or valve
position. The controller applies the controller output value to the system, which in
turn drives the process variable toward the setpoint value.

© National Instruments 629

 Measurement Fundamentals

Real Time
Real time means that responses occur in time, or on time. With non-real-time systems,
there is no way to ensure that a response occurs within any time period, and
operations may finish much later or earlier than expected. In other words, real-time
systems are deterministic, which guarantees that operations occur within a given time.
Real-time systems are predictable.

For a system to be a real-time system, all parts of it need to be real time. For instance,
even though a program runs in a real-time operating system, it does not mean that the
program behaves with real-time characteristics. The program may rely on something
that does not behave in real-time such as file I/O, which then causes the program to
not behave in real-time.

Loop Cycle Time

Many applications that require a real-time operating system are cyclic, such as a
control application. The time between the start and finish of each cycle, T, is called the
loop cycle time (or sample period). 1/T is the loop rate or sample rate. Even with
real-time operating systems, the loop cycle time can vary between cycles, but will not
be greater than the maximum jitter.

Related concepts:

• Jitter Overview for Control Applications

Jitter Overview for Control Applications

For control applications, the amount of time that the loop cycle time varies from the
desired time is called jitter. The maximum amount that a loop cycle time varies from
the desired loop cycle time is called maximum jitter.

630 ni.com
 Measurement Fundamentals

Jitter

Desired Loop Period

5
Loop Iteration

Time
Loop Period

In real-time systems, jitter is bounded. For instance, air bags must deploy within
fractions of a second after a critical impact and are thus bound to a maximum jitter. In
non-real-time systems, jitter is unbounded—or very large. Waiting for a bus is an
example. Suppose that according to the schedule, the bus is supposed to arrive at
11:00 a.m. but actually arrives at 11:05 a.m. one day, 11:30 a.m. the next day, and has a
flat tire the day after that. There is no bound on how late the bus could arrive.

Related concepts:

• Loop Cycle Time

Event Response
Event response applications require a response to a stimulus in a determined amount
of time. An example is monitoring the temperature of an engine. When the
temperature rises too high, the engine is slowed down. The event, in this case, is the
temperature rising above a predetermined level, and the response is the engine
slowing down. Another example comes from manufacturing. In a manufacturing line, a
system senses when a part is in front of a station (the event) and takes a reading or
manipulates the part (the response). If the system does not sense and respond to the
presence of that part in a set amount of time, the manufacturing line creates defective
parts.

© 2025 National Instruments Corporation. © National Instruments 631