0% found this document useful (0 votes)
14 views

Bin Editor Rev3

The document outlines the functionality of the Bin Editor, which includes auto binning and manual reclassification of defects identified by Falcon machines. It details the processes involved in defect classification, including the use of bin codes, classification editor tables, and verification methods. Additionally, it describes how to filter bin codes and utilize a colored wafer map for visual representation during verification.

Uploaded by

xjtushuyuan
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
0% found this document useful (0 votes)
14 views

Bin Editor Rev3

The document outlines the functionality of the Bin Editor, which includes auto binning and manual reclassification of defects identified by Falcon machines. It details the processes involved in defect classification, including the use of bin codes, classification editor tables, and verification methods. Additionally, it describes how to filter bin codes and utilize a colored wafer map for visual representation during verification.

Uploaded by

xjtushuyuan
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 18

Bin Editor

Internal property
2007.10.01 11:24:09
+02'00'

Training Document
AT2200911
Concept
Bin Editor Auto Bin
Manual Reclassifying

Terms:
Bin Codes are used to identify Falcon found defects by Customer known QA
codes.

AT2200911

AT2101711
Auto Binning & Reclassifying
• Auto binning - By Falcon machine
Performed automatically during Inspection scan
on all defected “defects”.

• Manual Reclassification – By Operator


Performed during verification, either on Falcon or on an Offline Verification
Station, per each specific defect found.
“Translating” Camtek/Falcon’s ID’s to customer known Q.A. codes.

AT2200911

AT2101711
Auto Bin & Reclassifying process

Machine setup stage Inspection after scanning

Verification
Bin Editor –
Classification Editor
Setting ….
Simple Advanced
Auto Binning classification classification
Setting ….
Defect naming by Reclassifying –
Algorithm OR Type Defect Coding by
customers BINs

AT2200911

AT2101711
BIN Editor GUI – How to get there

AT2200911

AT2101711
Classification Editor table

¾ Code – Identifier used internally by Camtek application


¾ Desc – Description of the Defect according to Camtek’s algorithms/types, for
advanced classification & ADC
¾ Status – Determines if the item found is a defect or not, ONLY a 'Defect'
assigned items will be included in the output format
¾ Priority – Determines the priority of each defect found, ONLY the highest priority
will be registered as defects type of each Die/Frame (Highest = 1)
¾ Color – Color to be displayed for each defect type
¾ Key – Displays the Hot Key combination to assign a defect type.
AT2200911

AT2101711
Classification Editor table

¾ Display – When selected, these defects will be displayed in the Reclassify


list during verification.
¾ Grab Image – When selected, these defects will be saved for offline
classification. Bin types with unchecked boxes, will not have their images
saved.
¾ Verify – Bin type that are not selected, will not be verified during online and
offline verification. You can still grab the image, but during verification, the
defect will not be displayed.
¾ Extended - When activated in the verification mode the codes entered here,
are the codes you can key-in to find a defect. If a defect has no code, it will
disappear from the list as soon as you enter a letter. Each option is
activated by selecting a check box under the heading, and in the same row
as the bin code. AT2200911

¾ Cust 1, 2 … - Defect bin number per customer.


AT2101711
Classification toolbar

¾ Add line – Used to add a new classification defect type


¾ Cust1 (combo box) – An existing name for the customer BIN Code, these names
are editable using the edit box next
¾ Good \ Bad (combo box) – Determines the classification of each type for the
simple classification.
¾ Auto Bin – Select to open the Auto Binning dialog box
¾ Mark Die BIN – The code for Dice that where not inspected
¾ Edge BIN – The code for Dice included in the EBR
¾ Null BIN – The code for areas without Dice or without production Dice (such as
AT2200911
Test dice who are not inspected)

AT2101711
Auto Binning Table

Falcon Types Customer Lookup Table


Types

A B C

A+B=>C
AT2200911

AT2101711
Auto Binning Operation

1. Select a type or a combination of types (the left side column)


2. Select the Defect classification type related to it (the middle column)
3. Select “Add”, the connection is added to the lookup table (the right side
column)
4. Click "Save" AT2200911

AT2101711
Auto Binning Example

1. Solder Bump, X and Y Miss location are classified as Solder in the


Customer Defect types (blue category in the lookup table)
2. In case of
i. Miss location only in one direction
ii. Miss location in X and Y and other as well
iii. Other solder problems AT2200911

The defect will be classified into the default category as Solder Defect
AT2101711
Reclassification Methods (Bin Codes)
1. Simple classification – Good or Bad
2. Advanced classification – Various categories customer dependant.
3. Extended – Future option

Advanced :
ADV + ReClassify
are marked
Simple:
Only ReClassify
is marked

AT2200911

AT2101711
Verify Screen

AT2200911

AT2101711
Defects Classification By Zone

Change bin code for a


specific zone through Die
Editor
One bin code can be
assigned to each zone
All defects found in that zone
will be classified accordingly.

AT2200911

AT2101711
Filtered Bin Codes
Bin Codes can be filtered by performing the following steps:
1. Open the Reclassify window
2. Select the Extended radio button
3. Start typing the name of the bin code, as each letter is typed the list is
filtered to match the typed-in letters

AT2200911

AT2101711
Colored Wafer Map
• When setting up Falcon's Bin codes in the Classification Editor, a
color is applied for each defect type (Bin code).
• During verification a colored defects map can be displayed.

AT2200911

AT2101711
Colored Wafer Map
To activate this option mark, Show Die Color (In verify), checkbox at
System Setup screen.

AT2200911

AT2101711
AT2200911

AT2101711

You might also like