Shakez Trace
Shakez Trace
TRACE EVIDENCE
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QUESTION
Discuss the working principles of the following:
1. Comparison Microscope
3. Stereo microscope
4. SEM-EDS
5. FTIR
Comparison Microscope
The comparison microscope combines two compound microscopes connected by an
optical bridge, allowing simultaneous side-by-side viewing of two specimens.
Illumination: A light source illuminates both samples, and a beam splitter directs light to each
optical path.
Optical Bridge: This bridge uses mirrors and prisms to align the images from both microscopes
into a single field of view, separated by a dividing line. The left side shows the image from one
microscope, and the right side shows the other.
Independent Adjustments: Users can independently adjust magnification, focus, and lighting for
each sample, ensuring optimal clarity even if the objects differ in size or shape.
Applications: Widely used in forensic science (e.g., comparing bullet striations), document
examination, and art authentication.
Polarization: A polarizer filters light into a single vibration plane before it passes through the
sample. An analyser above the sample blocks all light except that which has interacted with the
sample’s structure.
Birefringence: Anisotropic materials split light into two rays with different velocities. These
rays interfere, producing colors or intensity variations that reveal structural details.
Applications: Commonly used in mineralogy, crystallography, and forensic fibre analysis to
identify birefringent materials.
Stereo Microscope
The stereo microscope provides a three-dimensional view of specimens using two optical
paths.
Optical Pathways: Two separate objectives and eyepieces create slightly different angles of the
same object, resulting in depth perception.
Magnification and Depth: It offers low magnification (typically 10x–50x) but excellent depth of
field for observing surface features.
Applications: Used in dissection, circuit board inspection, and quality control for larger objects.
SEM Imaging:
A focused electron beam scans the sample surface.
Secondary electrons emitted from the surface are collected to form high-resolution
images of topography.
EDS Analysis:
The electron beam excites atoms in the sample, causing them to emit characteristic X-rays.
An EDS detector identifies these X-rays to determine elemental composition.
: Used in materials science, failure analysis, and nanotechnology for detailed imaging and
composition analysis.
Infrared Radiation: A broad-spectrum IR source passes through the sample. Molecules absorb
specific wavelengths corresponding to their vibrational modes.
Interferometer: A Michelson interferometer modulates IR light into an interference pattern,
which is converted into an absorption spectrum via Fourier Transform.
Spectrum Analysis: Peaks in the spectrum correspond to molecular bonds or functional groups.
Applications: Used in chemistry, polymer analysis, and forensic science for material
identification and purity assessment.
REFERENCES
Doty, K. C., Muro, C. K., Bueno, J., Halámková, L., & Lednev, I. K. (2015). What can
https://doi.org/10.1002/jrs.4826
Microscopy.
Cengiz, S., Karaca, A. C., Çakır, İ., Üner, H. B., & Sevindik, A. (2004). SEM–EDS analysis and