Mlx 90393
Mlx 90393
Datasheet
push-pull functionality
RAM EEPROM SCL/ SCLK
VX
Tria xis® VY
MISO
MUX
VZ Control
G ADC SPI/ I2C
Contents
1. Features and Benefits ............................................................................................................................... 1
2. Application Examples................................................................................................................................ 1
3. Description ............................................................................................................................................... 1
4. Ordering Information ............................................................................................................................... 5
5. Functional Diagram .................................................................................................................................. 6
5.1. QFN-16 Block Diagram ..................................................................................................................... 6
5.2. UTDFN-8 Block Diagram................................................................................................................... 6
6. Glossary of Terms ..................................................................................................................................... 7
7. QFN-16 Pinout .......................................................................................................................................... 8
8. UTDFN-8 Pinout ........................................................................................................................................ 9
9. Absolute Maximum Ratings .................................................................................................................... 10
10. General Electrical Specifications........................................................................................................... 11
11. Thermal Specification ........................................................................................................................... 12
12. Timing Specification ............................................................................................................................. 13
13. Magnetic Specification ......................................................................................................................... 14
13.1. Noise vs Conversion Time ............................................................................................................ 16
14. Mode Selection..................................................................................................................................... 17
14.1. Burst mode ................................................................................................................................... 18
14.2. Single Measurement mode ......................................................................................................... 18
14.3. Wake-Up on Change mode.......................................................................................................... 19
15. Digital Specification .............................................................................................................................. 19
15.1. Command List .............................................................................................................................. 20
15.2. Status Byte ................................................................................................................................... 21
15.3. SPI Communication ...................................................................................................................... 22
15.3.1. Command implementation.................................................................................................... 22
15.3.2. SPI Timing Specification ......................................................................................................... 24
15.4. I2C Communication ...................................................................................................................... 24
15.4.1. Command Implementation.................................................................................................... 25
15.4.2. I2C Timing Specification ......................................................................................................... 27
16. Memory Map ........................................................................................................................................ 28
16.1. General Description ..................................................................................................................... 28
4. Ordering Information
Product Temperature Package Option Code Packing Form Definition
Legend:
Temperature Code:
S: from -20°C to 85°C
E: from -40°C to 85°C
Package Code: “LW” for QFN-16 3x3x1mm package with wettable flanks
“LQ” for UTDFN-8 2.5x2mm package
5. Functional Diagram
5.1. QFN-16 Block Diagram
6. Glossary of Terms
Term Definition
Gauss (G), Tesla (T) Units for the magnetic flux density − 1 mT = 10 G
NC Not Connected
%DC Duty Cycle of the output signal i.e. TON /(TON + TOFF)
7. QFN-16 Pinout
Pin Name Type Supply Wiring Recommendation
# System
4 N/C -- -- -- -- -- --
9 N/C -- -- -- -- -- --
10 N/C -- -- -- -- -- --
14 N/C -- -- -- -- -- --
16 N/C -- -- -- -- -- --
8. UTDFN-8 Pinout
Pin Name Type Supply Wiring Recommendation
# System
Exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolute maximum-rated
conditions for extended periods may affect device reliability.
1
Standby current corresponds to the current consumed in the digital where only the low power oscillator is running.
This standby current is present in burst mode, or whenever the IC is counting down to start a new conversion.
2
Idle current corresponds to the current drawn by the IC in idle mode where all operating functions are disabled except
communications.
3
The linearity is defined as the best fit curve through the digital temperature outputs over the entire temperature
range. It includes ADC non-linearity effects
4
This conversion time is defined as the time to acquire a single axis of the magnetic flux density. When measuring
multiple axes they are obtained through time multiplexing. The conversion time is programmable through parameters
OSR and DIG_FILT for magnetic values and OSR2 for the temperature value. The conversion sequence is TXYZ, opposite
of the ZYXT argument of the command set.
5
The time TINTERVAL is defined as the time between the end of one set of measurements (any combination of TXYZ) and
the start of the following same set of measurements in BURST and WOC mode. As a result of this, the maximum output
data rate is not only a function of TINTERVAL but equals 1/(TCONV_BURSTWOC + TINTERVAL).
Startup
TPOR Power-on-reset completion time 0.6 1.5 ms
External Trigger
TTRIG Trigger pulse width (active high) 0.01 250 us
Table 8: Timing Specifications
OFFSTHD Offset thermal drift, Delta from 25°C (6) < ±1000 LSB
6
The offset thermal drift is defined as the deviation at 0Gauss from the output with respect to the output at 25°C when
sweeping the temperature. The highest gradient (µT/°C) typically occurs at 85°C. The spec value is based on
characterization on limited sample size at GAIN_SEL=0x7 and RES_XYZ=0x00.
7
The total axis sensitivity is programmable to support different applications, but has no Automatic Gain control on-chip
as do the other angular position sensors from Melexis. The highest gain corresponds to at least the minimum +/-4.8mT
magnetic measurement range and the magnetic resolution defined by SENSii.
8
The sensitivity thermal drift is expressed as a band around the sensitivity at 25°C. It is applicable on wafer level
trimming, but can be influenced by packaging (overmolding).
50
40
Noise Stdev [mGauss]
OSR = 0
30
OSR = 1
OSR = 2
20 OSR = 3
10
0
1 10 100
Figure 2: XY axis RMS noise versus conversion time, expressed in mGauss for GAIN_SEL = 0x7
80
70
60
Noise Stdev [mGauss]
50
OSR = 0
40 OSR = 1
OSR = 2
30 OSR = 3
20
10
0
1 10 100
Figure 3: Z axis RMS noise versus conversion time, expressed in mGauss for GAIN_SEL = 0x7
Burst mode
The ASIC will have a programmable data rate at which it will operate. This data rate implies auto-
wakeup and sequencing of the ASIC, flagging that data is ready on a dedicated pin (INT/DRDY). The
maximum data rate corresponds to continuous burst mode, and is a function of the chosen
measurement axes. For non-continuous burst modes, the time during which the ASIC has a counter
running but is not doing an actual conversion is called the Standby mode (STBY).
Single Measure mode
The master will ask for data via the corresponding protocol (I2C or SPI), waking up the ASIC to make a
single conversion, immediately followed by an automatic return to sleep mode (IDLE) until the next
polling of the master. This polling can also be done by strobing the TRG pin instead, which has the
same effect as sending a protocol command for a single measurement.
Wake-Up on Change
This mode is similar to the burst mode in the sense that the device will be auto-sequencing, with the
difference that the measured component(s) is/are compared with a reference and in case the
difference is bigger than a user-defined threshold, the DRDY signal is set on the designated pin. The
user can select which axes and/or temperature fall under this cyclic check, and which thresholds are
allowed.
The user can change the operating mode at all time through a specific command on the bus. The device
waits in IDLE mode after power-up, but with a proper user command any mode can be set after power-up.
Changing to Burst or WOC mode, coming from Single Measure mode, is always accompanied by a
measurement first. The top-level state diagram indicating the different modes and some relevant timing is
shown below in Figure 4. In the Measure state, the MDATA flag will define which components will be
measured (ZYXT). The order of conversion is defined as TXYZ and cannot be modified by the user, only the
combination of axes is a degree of freedom.
Arrows indicated in grey are the direct result of an Exit command. The main difference between STANDBY
and WOC_IDLE is that in STANDBY mode, all analog circuitry is ready to make a conversion, but this is
accompanied by a larger current consumption than IDLE mode. For burst mode this extra current
consumption is justified because the emphasis is more on accurate timing intervals, avoiding the delay of
TSTBY before conversion and supporting an efficient continuous burst mode without standby overhead.
It is the user’s responsibility to read back the measured data as the MLX90393 is a slave device on the bus.
Even in burst mode and WOC mode when the MLX90393 is auto-sequencing, the master will be responsible
for collecting the acquired sensor data.
Startup
Startup
Idle
Command received
to start
measurement
Enable analog
Idle
typ.220µs
NVRAM copy
typ.360µs
Active
Measuring
BM/WOC,
Ending active mode BM, BDR>0
BDR=0
typ.100µs SM, or EX received
WOC, BDR>0
Whenever the MLX90393 has made the selected conversions (based on MDATA), the DRDY signal will be set
(active H) on the INT and/or INT/TRG pin to indicate that the data is ready for readback. It will remain high
until the master has sent the command to read out at least one of the converted quantities (ZYXT). Should
the master have failed to read out any of them by the time the sensor has made a new conversion, the
INT/DRDY pin will be strobed low for 10us, and the next rising edge will indicate a new set of data is ready.
the concatenation of the TSTBY, TACTIVE, m*TCONVM (with m # of axes) and TCONVT. The conversion time will
effectively be programmable by the user (see burst mode), but is equally a function of the required
axes/temperature to be measured.
Upon reception of such a polling command from the master, the sensor will make the necessary
acquisitions, and set the DRDY signal high to flag that the measurement has been performed and the master
can read out the data on the bus at his convenience. The INT/DRDY will be cleared either when:
The master has issued a command to read out at least one of the measured components
The master issues an Exit (EX) command to cancel the measurement
The chip is reset, after POR (Power-on reset) or Reset command (RT)
The first measurement of WOC mode is stored as reference value once. This measurement at “t=0” is
then the basis for comparison or,
The reference for acquisition(t) is always acquisition(t-1), in such a way that the INT signal will only
be set if the derivative of any component exceeds a threshold.
The in-application programmability is the same as for burst mode, but now the thresholds for setting the
interrupt are also programmable by the user, as well as the reference, if the latter is data(t=0) or data(t-1).
/CS = 0 for SPI, addressing the MLX90393 slave in SPI mode (3- and 4-wire), but releasing this line in
between commands (no permanent addressing allowed)
/CS = 1 for I2C, addressing the MLX90393 slave when the correct address is transmitted over the bus
(permanently kept high)
To ensure the activity on the SPI bus cannot be accidentally interpreted as I2C protocol, programming bits
are available in the memory of the MLX90393 to force the communication mode. It concerns the
COMM_MODE[1:0] bits with the following effect:
Command Set
Command Name Symbol # CMD1 byte CMD2 byte CMD3 byte CMD4 byte
The argument for the volatile memory access commands (RR/WR) «abc» should be set to 0x0, in order to get
normal read-out and write of the memory.
The argument in all mode-starting commands (SB/SW/SM) is a nibble specifying the conversions to be
performed by the sensor in the following order «zyxt». For example, if only Y axis and temperature are to be
measured in Single Measurement mode the correct command to be transmitted is 0x35. The sequence of
measurement execution on-chip is inverted to «TXYZ», so T will be measured before X, followed by Y and
finally Z. By issuing an all-zero «zyxt» nibble, the BURST_SEL value from RAM will be used instead of the
empty argument of the command.
The communication is also bundled in bytes, equally MSB first and MSByte first. A command can of course
consist of more than 1 byte (refer to Table 10: Communication mode definition) as can the response be from
the MLX90393 in the form of multiple bytes after the status byte (not shown in Figure 5: SPI communication
example)
/CS
SCL 1 2 3 4 5 6 7 8 1 2 3 4 5 6 7 8
ADD NADD
All the commands follow the structure below. The reply from the MLX90393 is only the status byte. The
example below is for a start of a burst mode with X and Y being measured.
0x16 0x00
xx Status
Figure 7: SB command, XY
After the HS command, wait at least 15ms before sending the next command to allow the IC to update the
NVRAM correctly.
15.3.1.2. RT
This command will (warm-)reset the IC. The status byte of the command following will indicate the reset
event. It is recommended to perform an ‘EX’ command before issuing a ‘RT’ command.
0xF0
xx
Figure 8: RT command
15.3.1.3. RM
This command differs depending on the value for zyxt. The data is returned in the order Status-TXYZ, where
the components which are set to zero are skipped.
15.3.1.4. RR
Important in this command is that the register address to be read needs to be shifter left by two bits. To
read register 0x12 for example, the MOSI byte becomes 0x48.
15.3.1.5. WR
Important in this command is that the register address to be read needs to be shifter left by two bits. To
read register 0x12 for example, the MOSI byte becomes 0x48.
CS
SPC
The 7-bit I2C-address is determined by the connection to the A0 and A1 pins. The 5 MSBs are programmed
by Melexis in the MLX90393. Please contact Melexis in case other addressing is required.
S I2C Start
SR I2C Repeated Start
P I2C Stop
A Acknowledge from IC (1 bit)
A NACK (Not) Acknowledge from Master (1 bit)
xxx I2C Addressing (1 byte)
xxx Data from Master to IC (1 byte)
xxx Data from IC to Master (1 byte)
All the commands follow the structure below. The reply from the MLX90393 is only the status byte. The
example below is for a start of a burst mode with X and Y being measured.
After the HS command, wait at least 15ms before sending the next command to allow the IC to update the
NVRAM correctly.
15.4.1.2. RT
This command will (warm-)reset the IC. The status byte of the command following will indicate the reset
event. It is recommended to perform an ‘EX’ command before issuing a ‘RT’ command.
15.4.1.3. RM
This command differs depending on the value for zyxt. The data is returned in the order Status-TXYZ, where
the components which are set to zero are skipped.
S I2C addr [W] A 0x4F A SR I2C addr [R] A Status A T [15:8] A T [7:0] A
X [15:8] A X [7:0] A Y [15:8] A Y [7:0] A Z [15:8] A Z [7:0] NACK P
S I2C addr [W] A 0x45 A SR I2C addr [R] A Status A T [15:8] A T [7:0] A
Y [15:8] A Y [7:0] NACK P
15.4.1.4. RR
Important in this command is that the register address to be read needs to be shifted left by two bits. To
read register 0x12 for example, the SDA byte becomes 0x48.
S I2C addr [W] A 0x50 A Register << 2 A SR I2C addr [R] A Status A Data [15:8] A Data [7:0] NACK P
15.4.1.5. WR
Important in this command is that the register address to be read needs to be shifted left by two bits. To
read register 0x12 for example, the SDA byte becomes 0x48.
S I2C addr [W] A 0x60 A Data [15:8] A Data [7:0] A Register << 2 A SR I2C addr [R] A Status NACK P
REPEATED
tf (SDA) tr (SDA) START
START
tsu (SR)
SDA
STOP START
SCL
9
Where Cb is the total bus capacitance (in pF)
The RR and WR commands impact the volatile memory only, there no direct access possible to the non-
volatile memory. The customer area of the volatile memory is bidirectionally accessible to the customer; the
Melexis area is write-protected. Only modifications in the blue area are allowed with the WR command. The
adjustments in the customer area can be stored in the permanent non-volatile memory with the STORE
command HS, which copies the entire volatile memory including the Melexis area to the non-volatile one.
With the HR command the non-volatile memory content can be recalled to the volatile memory, which can
restore any modifications due to prior WR commands. The HR step is performed automatically at start-up of
the ASIC, either through cold reset or warm reset with the RT command.
VOLATILE NON-VOLATILE
MEMORY MEMORY
STORE (HS)
RECALL (HR)
MELEXIS AREA MELEXIS AREA
RR WR
Figure 22: The memories of the MLX90393, their areas and the impacting commands.
The latter can be filled with customer content freely, and covers the address span from (and including) 0x0A
to 0x1F, a total of 352 bits. The memory mapping of volatile and non-volatile memory on address level is
identical. The volatile memory map is given in Figure 23.
The table below gives an overview of the customer area in the MLX90393’s NVRAM.
In the register map, the 16-bit words are split into 2 bytes for the sake of readability. The general format is
shown below in the yellow table.
The non-volatile memory can only be written (HS store command) if pin VDD is supplied with 3.3V minimum,
otherwise the write sequence cannot be performed in a reliable way. Additionally, this HS command was
designed to be used as one-time calibration, but not as multi write-cycle memory within the application. In
case memory is written within the application, the number of write cycles should be kept to a minimum.
There is no limit to the write cycles in the volatile memory (WR write command).
Parameter Description
BIST Enabled the on-chip coil, applying a Z-field [Built-In Self Test]
GAIN_SEL[2:0] Analog chain gain setting, factor 5 between min and max code
TRIG_INT_SEL Puts TRIG_INT pin in TRIG mode when cleared, INT mode otherwise
COMM_MODE[1:0] Allow only SPI [10b], only I2C [11b] or both [0Xb] according to CS pin
RES_XYZ[5:0] Selects the desired 16-bit output value from the 19-bit ADC
Parameter Description
16.2.1. ANA_RESERVED_LOW
Reserved bits for analog trimming at Melexis factory. Do not modify.
16.2.2. BIST
Enables (1) or disables (0) the built in self-test coil. In normal operation set to 0. A measurement with this
coil enabled shows a change in magnetic field sensed on the Z-axis.
16.2.3. Z_Series
Enables series connection of hall plates for Z axis measurement. In normal operation set to 0.
16.2.4. GAIN_SEL[2:0]
Sets the analog gain to the desired value. The sensitivity is dependent on the axis (the X- and Y-axis have
higher sensitivity, compared with the Z-axis, expressed in LSB/µT) as well as the setting of the RES_XYZ[5:0]
parameter. The relationship is given in the below table.
10
For HALLCONF = 0x0, the sensitivity scales with a factor 98/75. For example (0.150µT/LSB with HALLCONF 0xC
becomes 0.196µT/LSB with HALLCONF 0x0)
16.2.5. HALLCONF[3:0]
Modifies the hall plate spinning (2-phase vs 4-phase) which has an effect on the minimum sampling rate
achievable. Some configurations of OSR and DIG_FILT are not permitted. The cells shown in red are not
permitted with HALL_CONF=0xC (default) but are allowed when HALL_CONF=0x0.
16.2.6. TRIG_INT_SEL
When set to 0 the TRIG_INT pin is in trigger mode. When set to 1 the TRIG_INT pin acts as an interrupt pin.
16.2.7. COMM_MODE[1:0]
When set to 0x2 only SPI communication is allowed. When set to 0x3 only I2C communication is allowed.
When set to 0x0 or 0x1 both communication modes can be used but the selection is made by the CS pin.
16.2.8. WOC_DIFF
When wake-on-change mode is enabled this parameter defines the mode to use. When enabled, a
comparison on the current measurement is made with the previous measurement. When disabled, the first
initial measurement is used as a reference.
16.2.9. EXT_TRIG
Allows for external trigger events when set to 1 and TRIG_INT_SEL = 0. When enabled an acquisition will
start with the external trigger pin detects a high value. Acquisitions will continue to be triggered until the
EXT_TRIG pin is brought low.
16.2.10. TCMP_EN
Enables (1) or disables (0) the on-chip sensitivity drift compensation. Enabling the temperature
compensation will influence the way the magnetic values are encoded and transmitted to the system
microcontroller as shown in the table below.
unsigned
2 ±22000
0µT = 215LSB
N/A
unsigned
3 ±11000
0µT = 214LSB
Table 21: Output Range and Type as a function of TCMP_EN and RES_XYZ={RESX,RESY,RESZ}
16.2.11. BURST_SEL[3:0]
Defines the axes that will be converted in burst mode if the SB command argument is 0.
16.2.12. OSR2[1:0]
Selects the temperature sensor ADC oversampling ratio
16.2.13. RES_XYZ[5:0]
See 16.2.4 for the relationship between the gain and resolution. Additionally, section 16.2.10 for the
relationship between RES_XYZ and the output data format.
16.2.14. DIG_FILT[1:0]
See 16.2.5 for the selection of DIG_FILT and the impact on conversion time.
16.2.15. OSR[1:0]
Oversampling ratio for the magnetic measurements. See 16.2.5 for the selection of OSR
16.2.16. SENS_TC_HT[7:0]
Sensitivity drift compensation factor for T > TREF
16.2.17. SENS_TC_LT[7:0]
Sensitivity drift compensation factor for T < TREF
16.2.18. OFFSET_i[15:0]
Constant offset correction, independent of temperature, and programmable for each individual axis where
i=X, Y, or Z.
16.2.19. WOi_THRESHOLD[15:0]
Wake-on-change threshold. Independently programmable for each magnetic axis (i=X, Y, Z) and temperature
(i=T)
A1 A0 I2C Address
-------------------------------------
Vss Vss 0001100R/W
Vss Vdd 0001101R/W
Vdd Vss 0001110R/W
A0
A1
MLX90393 SENB/CS
VDD MCU
(2.2V - 3.6V)
VDD
C1
VSS
INT/TRG Trigger
INT Interrupt/DRDY
1.2 SPI
Short on PCB
for 3-wire SPI
A0
A1
VDDIO C1=C2=0.1uF
(1.71V - VDD)
VDDIO
C2
MISO
SDA/MOSI
SPI
SCL/SCLK
SENB/CS
VSS
INT/TRG Trigger
INT Interrupt/DRDY
0.42 ± 0.10
1.50±0.20
1 2 3
1.50
±0.20 16
2.90 1.55
3.10 1.80
Y Z 0.20
0.30-0.50
1.55
2.90 1.80
3.10
The sensing elements – Hall plates with the patented IMC technology – are located in the center of the die, which on its turn
is located in the center of the package.
Marking :
A0
A1
12 11 Part Number MLX90393 (3 digits)
Die Version (1 digit)
VSS 13 VDD_IO 393 A
1 2 3
INT
MS/CS
SCL/SCLK
Y Z
MS/CS
Marking :
VDD
VSS
INT
8 7
Part Number MLX90393 (2 digits)
Last two digits of lot number (2 digits)
93XX 93 A
YWW YWW
Assembly Year (Y) and week (WW)
1 4
SDA/MOSI
SCL/SCLK
VDD_IO
MISO
For further details about test method references and for compliance verification of selected soldering method for
product integration, Melexis recommends reviewing on our web site the General Guidelines soldering
recommendation. For all soldering technologies deviating from the one mentioned in above document (regarding peak
temperature, temperature gradient, temperature profile, etc.), additional classification and qualification tests have to
be agreed upon with Melexis.
For package technology embedding trim and form post-delivery capability, Melexis recommends to consult the
dedicated trim & form recommendation application note: lead trimming and forming recommendations
Melexis is contributing to global environmental conservation by promoting lead free solutions. For more information
on qualifications of RoHS compliant products (RoHS = European directive on the Restriction Of the use of certain
Hazardous Substances) please visit the quality page on our website: http://www.melexis.com/en/quality-environment
13-Jul-2017 003 Added additional ordering codes for up to 16 sensors on the same
bus and their description in Table 2
Added E temperature code for -40°C capable products and the
associated update of the operating range in chapter 3
Updated template to new Melexis format
22. Contact
For the latest version of this document, go to our website at www.melexis.com.
For additional information, please contact our Direct Sales team and get help for your specific needs:
Email : [email protected]
Email : [email protected]
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