IET Renewable Power Gen - 2023 - Malick - Implementation and Reliability Analysis of a New Non‐Isolated Quadratic Buck
IET Renewable Power Gen - 2023 - Malick - Implementation and Reliability Analysis of a New Non‐Isolated Quadratic Buck
DOI: 10.1049/rpg2.12787
ORIGINAL RESEARCH
1
Department of Electrical Engineering, Aligarh Abstract
Muslim University, Aligarh, India
Here, a new buck–boost converter with reliability analysis is proposed. The converter has
2
Department of Electrical Engineering, National utilized a new voltage multiplier cell at the input side to boost the output voltage. It has
Taiwan University of Science and Technology,
Taipei, Taiwan
a continuous input current with a wide range of duty cycle operations. The converter
3
achieves unity gain at 26.8% duty cycle and can also operate in continuous and discon-
Department of Power Engineering, Faculty of
Electrical Engineering, Sahand University of tinuous conduction modes in buck and boost modes. The detailed reliability analysis of the
Technology, Tabriz, Iran proposed converter using improved Markov modelling is also presented by considering
both open circuit and short circuit faults across the semiconductor devices. The variation
Correspondence of reliability and the mean time to failure (MTTF) with different converter parameters like
Kazem Varesi, Sahand University of Technology,
Tabriz, Iran.
the duty cycle and the input voltage is also discussed here. The hardware results of the
Email: [email protected] developed prototype converter are also presented here at varying duty ratios. The power
loss analysis and comparison of the converter with other newly proposed buck–boost
topologies show the advantages of the proposed converter. For checking the stability of
the converter, the state space model of the converter is also discussed in detail of the
proposed converter.
This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is
properly cited.
© 2023 The Authors. IET Renewable Power Generation published by John Wiley & Sons Ltd on behalf of The Institution of Engineering and Technology.
FIGURE 3 (a) Proposed topology of buck–boost DC–DC converter in ON-state node. (b) Proposed topology of buck–boost DC–DC converter in OFF-state
mode.
capacitor C0 to the load R0 as shown in Figure 3a. The voltage The ideal voltage gain of the proposed topology can be cal-
and current equations of the converter in mode 1 are given as: culated by applying the volt-sec balance principle across the
inductors in CCM operation.
⎧V =V = V
⎪ L1 L2 in
⎛ DT T
⎞
⎪ VL3 = VC 2 1 ⎜
⎨ (1) VL ON dt + VL OFF dt ⎟ = 0 (5)
⎪ VC 1 = Vin T ⎜∫ ∫ ⎟
⎝0 DT ⎠
⎪ VC 0 = V0
⎩
⎧ IC 1 = Iin − 2IL1 ⎧ ( DT T ( ) )
⎪ ⎪1 2Vin − VC 2
∫ Vin dt + ∫ dt = 0
⎨ IC 2 = IL3 (2) ⎪T 2
⎪ ⎨ 0 DT (6)
⎩ IC 0 = I0 ⎪ 2Vin
⎪ VC 2 =
(1 − D )
⎩
2.1.2 Mode 2 (Both switches OFF)
⎧ ( DT T
)
The diodes D0 and D3 conducts when the switches are in the ⎪1
⎪T ∫ VC 2 dt + ∫ (V0 ) dt = 0
OFF state. The VMC charges the capacitor C2 . The inductors
⎨ 0 DT (7)
meanwhile transfer the stored energy to the load R0 as shown in ⎪ − (1 − D ) V0
Figure 3b. The voltage and current equations of the converter ⎪ VC 2 =
⎩ D
in mode 2 are given as:
{ Applying the volt-sec principle across the inductor L1 in (6)
Vin + VC 1 − VC 2 2Vin − VC 2
VL1 = VL2 = = and L3 in (7) we get:
2 2 (3)
VL3 = − VC 0 = −V0 Using Equations (6) and (7) we can obtain the voltage
conversion factor as:
{
IC1 = IC2 = IL1
(4) V0 −2D
MCCM = = (8)
IC 0 = I0 − IL3 Vin ( 1 − D )2
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2736 MALICK ET AL.
as:
⎧ 2Vin (1 − D ) VO
⎪ VS 1 = =
(1 − D ) D
⎪
⎪ 2Vin VO
⎪ VS 2 = =
⎪ ( 1 − D )2 D
⎪ V ( 1 − D ) VO
⎨ VD1 = VD2 = (1 − D ) =
in
2D
(9)
⎪
⎪ 2Vin ( 1 − D VO
)
⎪ VD3 = =
(1 − D ) D
⎪
⎪ 2DVin
⎪ VDO = = VO
⎩ ( 1 − D )2
⎧ 2
⎪ V = V = (1 − D ) VO
FIGURE 5 Switching voltage stress of the proposed converter in CCM. ⎪ C1 in
2D
⎪
⎨V = 2Vin ( 1 − D ) VO (10)
⎪ C2 =
(1 − D ) D
⎪
⎪ VC O = VO
⎩
The average currents through the switches and inductors can
be easily determined by applying the amp-sec balance principle
in the capacitors.
( DT T
)
1
∫ IC ON dt + ∫ IC OFF dt = 0 (11)
T 0 DT
2.3 Design of inductors and capacitors of (1–β) and ends at a time equal to the period (T) as depicted
the proposed converter in Figure 7.
The ripple current and critical values of the inductors can be The maximum current through the inductor in DCM and the
found as: average current through the output diode is given as:
⎧ V ⎧ V0 (𝛽 − D ) T
⎪ Δ iL1 = Δ iL2 = in DT ⎪ IL3 max =
⎪ L1 ⎨ L3 (17)
⎨ (1 − D )2 V0
(13) ⎪ IDO avg = (𝛽 − D ) IL3 max
⎪L =L D Vin ⎩
= =
⎪ 1Cri 2Cri
ΔiL1 fs 2 ΔiL1 fs
⎩
Applying volt-sec balance across the inductors and using the
⎧Δ i = 2DVin above equation we obtain the DCM gain of the converter as,
⎪ L3
( 1 − D ) L3 f s
⎨ (1 − D ) V0
(14) ⎧
⎪ L3 = ⎪ MDCM =
V0
=
2D
⎩ Cri ΔiL3 fs ⎪ Vin 2
⎪ √ 𝛽 − D)
(
⎨ 𝛽 = D + KDCM (18)
The peak-to-peak ripple voltages across the capacitors can be
given as: ⎪
⎪K L3 2
= = (𝛽 − D )
⎪ DCM R0 T
⎧ ⎩
(1 − D )3 V0
⎪Δ VC 1 =
⎪ 2 (1 + D ) R0C1 fs where k is the normalized inductor time constant. Its varia-
⎪ D V0 tion in boundary conduction mode with duty cycle is shown in
⎨ Δ VC 2 = (15)
⎪ ( 1 − D ) R0C2 fs Figure 6
⎪ D V0
⎪ Δ VC 0 =
⎩ R0C0 fs 2.5 Efficiency and power loss distribution
⎧ diL1 diL
( vC2
)
⎪L1 = L2 2 = dvin + (1 − d ) vin −
⎪ dt dt 2
FIGURE 10 Losses in the converter across various elements. ⎪ diL3
⎪ L3 = dvC2 + (1 − d ) (−V0 )
⎪ dt
⎪ dvC
⎨ C1 1 = d (2iL1 − iin ) + (1 − d ) iL1 (20)
currents and capacitor voltages (x = [iL1 iL2 iL3 vC1 vC2 vC0 ]T ) ⎪ dt
and ẋ represents the differentiation of ‘x’ with respect to time. ⎪ dvC
They are represented as a sum of a DC term and a small AC ⎪ C2 2 = diL3 + (1 − d ) iL1
⎪ dt
signal. The output voltage and current across the loads are ⎪ dvC ( )
however assumed constant. The duty ratio and input voltage ⎪ CO O = dIO + (1 − d ) I0 − iL3
⎩ dt
are assumed as input variables ‘u’ whereas the output capacitor
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MALICK ET AL. 2739
FIGURE 11 (a) Bode plot for the uncompensated system. (b) Bode plot for the compensated system.
FIGURE 12 (a) Comparison of the voltage gain of the proposed converter with similar converters. (b) Comparison of the voltage gain for an extended range.
(c) Comparison of normalized switch stress of proposed converter with various similar topologies.
(ND )) utilized in the converter, ideal voltage gain, the normal- switching stress with a larger number of elements. The con-
ized semiconductor switch stress, and the duty cycle for which verters presented in [[16, 17]] do not have continuous input
the converter operates at the boundary of buck and boost mode. current and hence are not suitable for renewable energy appli-
as shown in Table 1. The graph for the comparison of the ideal cations. The converter [18] has a continuous input current,
gain of the topologies is shown in Figure 12a,b, and the compar- produces a high gain but less than the proposed topology
ison of normalized switch stress for the topologies is depicted and the same as in [17], however due to a large number of
in Figure 12c. The main advantage of converter is that quadratic elements it produces a lower gain per element. Most of the
buck operation is possible for lower duty cycles whereas, for converters like the ones proposed in [14–15] and [22] includ-
boost operation a larger duty cycle range is available. The pro- ing the TBBC and SEPIC converter, achieves unity gain at
posed converter operates in buck mode for duty cycles lower 50% duty cycle and operate in buck region for half the time.
than 26.8% and in boost mode for higher duty cycles. Further- This buck mode is also a low output power zone and the pro-
more, due to quadratic gain, the boost converter achieves a high posed converter transitions from the buck mode at 26.8% duty
gain at higher duty ratios. cycle.
The proposed topology produces a high gain during its volt- The converter proposed in [2] produces the same gain as
age boosting stage for the duty cycle greater than 26.8%. The the proposed topology. The converter however produces higher
gain is around 4 times at a duty ratio of 50%. The TBB converter switching stress as compared to the first switch of the proposed
has a discontinuous input current unlike the proposed topology topology at a duty ratio of more than 30%. The converter in
and its high gain is also restricted. The SEPIC converter on the [19] neither has a common ground nor continuous input cur-
other hand has a pulsating output current and generally requires rent while the converter in [20] lacks the latter. The converter in
large series capacitors and high current handling capacities. The [21] on the other hand has both but utilizes a large number of
converter proposed in [13] has a lower voltage gain than the elements. The converter [22] produces a large switching stress
TBBC while the switch withstands half the voltage as in the case at lower duty ratios while the converter [23] produces a lower
of TBBC. gain as compared to the proposed topology. The converter [24]
The converters [14, 15] have continuous input current but has a large number of elements as compared to the proposed
the converter in [14] utilizes a single switch but has high topology.
TABLE 1 Comparative analysis of various similar converters with the proposed converter on basis of various parameters.
MALICK ET AL.
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2742 MALICK ET AL.
∞ 1
MTTF = ∫ P1 (t ) dt = (25)
t =0 𝜆12
For the Markov model having more than two operating states,
the reliability of the converter is defined as the summation of all
the probabilities of failure of the converter including the healthy
state and the derated states. The reliability hence is given as:
∑
s
R (t ) = Pi (t ) (26)
i=1
FIGURE 13 Markov model representation for the proposed converter.
where s represents all the derated state operation of the con-
verter and Pi (t ) is the probability of failure of the ith state
with 𝜆i j representing the failure rate from state i to state j. The
probability function of the system is defined as:
5 RELIABILITY ANALYSIS OF THE
PROPOSED CONVERTER dPi (t )
= Pi (t ) [A] (27)
dt
5.1 Markov model for the proposed
converter The state space matrix [A] is given as:
Here, an improved Markov model is used to carry out the reli- ⎡𝜆11 𝜆12 𝜆13 𝜆14 ⎤
ability analysis of the proposed buck–boost converter. In the ⎢ ⎥
⎢ 0 𝜆22 0 𝜆24 ⎥
Markov model, the reliability of the converter is obtained by A =⎢ ⎥
studying the effect of faults encountered on various elements ⎢ 0 0 𝜆33 𝜆34 ⎥
of the converter. The semiconductor devices like switches and ⎢ ⎥
diodes used in the topology are assumed to be prone to both, ⎣ 0 0 0 0 ⎦
open circuit (OC) and short circuit (SC) faults. In improved
Markov modelling, the fault probability of the short circuit fault Any path provided between the states i and j in the Markov
is considered as αs . Hence the probability of an open circuit model is represented by its suitable failure rate (𝜆i j ) in the state
fault will be (1–αs ) where the probability of a short circuit fault space matrix at the location corresponding to the ith row and jth
is generally higher than that of an open circuit fault. This means column. Upon solving the above equation of probability func-
the value of αs is kept higher than 0.5. The short circuit prob- tion by substituting the value of the state space matrix, we can
ability factor αs aids in a degree of freedom to determine the obtain the generalized values of probabilities of the different
reliability profile of the converter at different values of short cir- states as:
cuit proneness of the semiconductor elements of the converter. ⎧ e𝜆ii t
⎪ i = 1
The consideration of αs makes improved Markov model supe- Pi (t ) = ⎨ 𝜆1i (𝜆 −𝜆 )t (28)
rior than the conventional Markov model. The capacitors and ⎪ 𝜆11 −𝜆ii e 11 ii i ≠ 1
inductors on the other hand being passive devices are assumed ⎩
to be prone to only short circuit faults. The Markov model
represents different states as shown in Figure 13, where state Initially, the converter is assumed to be working in the healthy
1 corresponds to a healthy operation state of the converter. operating state (State 1) and hence all the probabilities of
States 2 and 3 represent derated operation states where par- derated and absorbing states are considered to be 0.
tial power is fed at the load. The converter hence provides a
[P1 (0 ) , P2 (0 ) , P3 (0 ) , P4 (0 )] = [1 0 0 0] (29)
voltage gain lower than the rated output gain. State 4 corre-
sponds to the absorbing or failure state where no output is
The mean time to failure (MTTF) of the converter is the
obtained.
integration of the reliability function and is stated as:
For a two-state Markov model, where state 1 represents
a healthy state and state 2 represents an absorbing state the
⎧ ∞
reliability R(t) is given as: ⎪ MTTF = ∫ R (t ) dt
⎪ t =0
R (t ) = P1 (t ) = e−𝜆12 t (24) ⎨ ( ) (30)
⎪MTTF = −1 + ∑ 𝜆1i
s
1 1
−
where, 𝜆12 is the summation of failure rates of components ⎪ 𝜆11 i=2 𝜆 −𝜆 𝜆 𝜆11
⎩
11 ii ii
TABLE 2 Effect of fault(s) across elements on the output voltage. The failure rates of the components according to the
Derated output voltage improved Markov model as shown in Table 3 and the equation
Type of fault
VODerated for the constant factors as shown in Table 3 is given as:
Element (OC or SC) ( × 100)%
VORated
S1 OC 29.54 ⎧ 𝜆12 = (1 − 𝛼S ) 𝜆S
⎪
S2 OC 70.45 ⎪ 𝜆13 = (1 − 𝛼S ) 𝜆S
⎪
S1 or S2 SC Failure state ⎪
⎨ 𝜆14 = (2 − 𝛼S ) 𝜆D + 2𝛼S 𝜆S + 𝜆CO + 𝜆L (32)
D1 or D2 OC 50.05 ⎪
D3 or D0 OC or SC Failure state ⎪ 𝜆24 = 4 (1 − 𝛼S ) 𝜆D + (1 − 𝛼S ) 𝜆S + 𝜆C + 𝜆C 0 + 𝜆L
⎪
D1 or D2 SC 75.45 ⎪ 𝜆 = (2 − 𝛼 ) 𝜆 + (1 − 𝛼 ) 𝜆 + 𝜆 + 𝜆 + 𝜆
⎩ 34 S D S S C C0 L
C1 SC 50.17
1 − 𝛼S −(0.206𝛼 +0.205 )t
C2 or C0 SC Failure state R (t ) = e−(0.442−0.014𝛼S )t − e S
𝛼S + 0.995
L1 or L2 or L3 SC Failure state
1 − 𝛼S
− e−(0.249𝛼S +0.176 )t (33)
1.208𝛼S + 0.854
1 1 − 𝛼S
5.2 Operation of proposed converter during MTTF = +
0.263𝛼S − 0.265 (0.442 − 0.014𝛼S ) (1.208𝛼S + 0.854 )
faulty conditions
2 1 − 𝛼S
+ +
(0.442 − 0.014𝛼S ) (0.22𝛼S − 0.237 ) (𝛼S + 0.995 )
In this part of the section, an analysis of the converter’s oper-
ation during faulty conditions is presented. The effect of OC years∕failure (34)
and/or SC on various components of the converter as a per-
centage of the derated output voltage as compared to the The reliability and the MTTF of the converter can be easily
voltage at rated operation is discussed. calculated for any failure probability of the switch or diode(s) by
From Table 2, we can easily see the output voltage decreases varying the value of 𝛼S as per the need. For a short circuit prob-
as faults occur across the switch and passive elements of the ability of 75%, the MTTF of the converter is 5.743 years/failure
converter. The proposed converter fails to operate if either whereas for an SC probability of 85% the MTTF is obtained as
switch undergoes an SC fault, whereas it feeds partial power if 5.647 years/failure.
either of them experiences an OC fault. An occurrence of OC
fault in diode, either D1 or D2 still results in producing a gain
of more than 75% as compared to the rated operation and the
occurrence of SC in the diodes results in a partial gain of 50%. 5.4 Variation of reliability and MTTF of the
An OC or SC fault in either diode D3 or D0 results in the failure converter
of operation of the converter. The short circuit fault in passive
components like capacitor C1 results in partial power operation In the current section of the paper, the effect of different con-
of the converter. However, SC faults in capacitor C2 or C0 or verter parameters on the converter’s reliability is discussed. The
any inductor result in total failure. reliability and MTTF of the proposed converter decrease as the
SC probability (αs ) of the semiconductor devices overpower the
5.3 Reliability analysis of the converter OC probability as shown in Figure 14a. The converter is still
using improved Markov modelling 57% reliable after three million hours of operation with the con-
verter for 75% SC probability while it decreases to 50% when
To proceed with the reliability analysis of the converter, the the SC probability increases to 85%. The MTTF on the other
failure rates for various parameters of the converter like hand lies above 5 years if the SC probability is below 94% as
switches(𝜆S ), diodes(𝜆D ) and capacitors(𝜆C )are to be obtained. shown in Figure 14b. The reliability is evaluated and presented
The failure rates of the various elements are obtained and for- in the form of 3D graphs where different parameters are varied
mulated as presented by the authors in [25, 26] and the equations over time.
for the determination of failure rates are given as:
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MALICK ET AL. 2745
FIGURE 14 (a) Variation of reliability of the converter with time as the short circuit (SC) probability is increased. (b) Variation of mean time to failure (MTTF)
of the converter with SC probability.
FIGURE 15 (a) Variation of reliability with time and duty ratio (D). (b) Variation of MTTF with duty ratio (D) as αs is increased.
voltage switching stress across the switch(s). Here, the variation 50% with high reliability while it depicts a high MTTF while
of reliability of the converter is assessed when the duty cycle operating near a 35% duty ratio. With the suggested improved
(D) of the switch is varied keeping the short circuit probabil- Markov model and converter analysis, the 3D plot is illustrated
ity at 75%. The reliability of the converter is slightly lower at in Figure 15b. Consequently, a lower value of input voltage leads
extreme duty ratios as they result in maximum stress across the to lesser voltage stress on the switch which increases the over-
switch. The variation of failure rate of different components as all reliability of the converter and hence a lower probability for
a function of duty cycle [27] is given in (30): a fault to occur across the switch. Furthermore, the reliabil-
ity of the converter decreases with time due to the aging of
⎧ ⎡ ⎛ ⎞⎤ devices and elements, lack of proper maintenance, manhandling
⎪ ( ) ⎢ ⎜ 1 1 ⎟⎥ of equipment etc. The converter’s reliability decreases from 95%
𝜆 = ⎢−1925 ⎜ −
298 ⎟⎟⎥⎥
⎪ s D 0.48 exp
⎪ ⎢ ⎜ 298 + 42.694D + 2.166 to 78% at the duty ratio of 50% when 0.5 million hours of the
⎪ ⎣ ⎝ D2 ⎠⎦
⎪ 0.0038 converter are completed. The converter however achieves an
𝜆D (D ) =
⎪ (6D )2.38 MTTF of around 5.5 years for αs of 75% and an MTTF of 5.32
⎨ [ ( )] (35)
⎪ exp −3091
1
−
1 years for αs of 85% while operating at a 35% duty ratio.
⎪ 355.968+0.736D 298
⎪ −3 ( )
⎪ 𝜆C (D ) = 7.63 × 10 2.37D 3 + 1
⎪ 5.4.2 Effect of input voltage (Vin )
⎪
⎩ 𝜆CO (D ) = 1.154 × 10−2
The reliability of the converter is often affected by a variation
Reliability of 95% and MTTF of 5.25 years is achieved by in input voltage as it affects the voltage and current stresses
the converter at a duty ratio of 0.5 after 0.05 million hours for of the switch and diodes. In various applications like solar PV
75% SC probability as shown in Figure 15a respectively, while it systems, voltage variations due to reasons like partial shading
has a reliability of 50% while operating closer to extreme duty and unequal load sharing are common. With these fluctuations
ratios. The converter performs optimally for duty ratios near at the input, significant ripples in voltage are introduced in the
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2746 MALICK ET AL.
system which degrades the overall performance and reliability TABLE 4 Experimental values of various parameters of elements used in
of the system by imparting severe voltage and current stresses the converter.
across the semiconductor devices. The variation of failure rates Parameter Symbol Value
of elements with variation in input voltage [27] is given in (31).
Input voltage Vin 20 V
[ ( )] Duty cycle D 0.2, 0.4, 0.6
⎧ 1 1
⎪𝜆s (Vin ) = 0.48 exp −1925 −
⎪ 298 + 2.18 × 10−4Vin2 + 4.47 × 10−2Vin 298 Output power PO 10 W, Buck operation
⎪ 120 W, Boost operation
⎪ 𝜆D (Vin ) = 2.052 × 10−4
⎪ Inductors L1 ,L2 650 μH, ESR = 0.12 Ω
⎪ [ ( )]
⎨ 1 1 L3 400 μH ESR = 0.14 Ω
⎪ exp −3091 −
⎪ 298 + 6.75 × 10−6Vin2 + 0.19Vin 298
Capacitors C1 − C3 50 μF, 200 V
⎪ −3 ( −8 3 )
⎪ 𝜆C (Vin ) = 7.63 × 10 1.89 × 10 D + 1 C0 100 μF, 350 V
⎪
⎪ ( ) Diodes D0 to D6 SF8L60USM
⎩ 𝜆C0 (Vin ) = 7.63 × 10−3 2.96 × 10−7 D 3 + 1
(36) Power MOSFETs S1 , S2 SPW52N50C3
The converter achieves a reliability of 95% when the input Driver TLP250H
voltage is around 20 V at 0.3 million hours as shown in Controller STM32 Nucleo
Figure 16a. However, due to lesser voltage, the converter has Switching frequency fs 50 kHz
lower efficiency. As the input voltage is increased to 50 V, the
converter achieves reliability of 87% and 75% after 0.5 and
0.8 million hours of working respectively. The MTTF of the
converter decrease as the input voltage is increased as seen in
Figure 16b. The converter obtains an MTTF of 3.5 and 3 years 6 EXPERIMENTAL RESULTS OF THE
as the SC probability is increased from 75% to 95% for the 20 V PROPOSED CONVERTER
input voltage operation of the converter.
The experimental hardware results of the 200 W prototype of
the proposed buck–boost converter topology are presented in
5.4.3 Effect of output power (PO ) this section. The results verify the theoretical analysis of the
converter and analyze its practical functionality. The results are
A power converter feeds a load at the output designed for a presented while the converter is operated at 20%, 40%, and
specified power and voltage. Hence, variations in this power 60% duty ratios. The experimental bench setup of the proposed
affect the useful life of various elements of the converter and topology is shown in Figure 18. The parameters of all the ele-
cost the converter its reliability over time. The reliability of ments and devices used for taking the results are mentioned in
the converter decreases as the output power is increased and it Table 4.
achieves reliability of 94% while operating at lower powers like Figure 19a depicts, the waveform of the output voltage, input
50 W after 0.2 million hours of operation, but this operation voltage, and voltage across capacitor C1 at a 20% duty ratio. The
results in poor efficiency and high losses. The converter when input voltage is kept at 20 V to take the value of the results and
operated at higher powers is still 85% reliable while operating measurements of the proposed converter. The converter oper-
at 500 W power after 0.4 million hours as shown in Figure 17a. ates in buck mode during this duty cycle operation and produces
The reliability of the converter decreases to 70% after a million an inverted output of 11 V (taken on positive side) at the output
hours of 500 W operation of the converter. The MTTF of 4 with a voltage of 21 V across the VMC capacitor. Figure 19b,
years is obtained by the converter keeping αs as 75% for 100 W on the other hand, depicts an inductor current of through the
output power operation as shown in Figure 17b. L1 at 20 V input. The maximum current of 1.8 A is achieved
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MALICK ET AL. 2747
FIGURE 17 (a) Variation of reliability with time and output power (PO ). (b) Variation of MTTF with output power (PO ) as αs is increased.
FIGURE 19 (a) Top to bottom: Output voltage, capacitor C1 voltage, input voltage and gate pulse at 20% duty cycle. (b) Inductor L1 and L3 current, and gate
pulses at 20% duty cycle.
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2748 MALICK ET AL.
FIGURE 20 (a) Output voltage, capacitor C1 voltage, input voltage and gate pulse at 40% duty cycle. (b) Capacitor C3 and C2 voltage, Switch voltage stress
and gate pulse at 40% duty cycle. (c) Inductor L1 current, Inductor L3 current and gate pulses at 40% duty cycle.
FIGURE 21 (a) Output voltage, capacitor C1 voltage, input voltage and gate pulse at 60% duty cycle. (b) Capacitor C3 and C2 voltage, switch voltage stress and
gate pulse at 60% duty cycle.
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