A 4-Terminal Wide-band Monolithic Amplifier
A 4-Terminal Wide-band Monolithic Amplifier
RO = 500
Abstract-A bipolar monolithic amplifier is described which achieves
+
18 dB gain, 725 MHz-3 dB bandwidth and 4.4 dB noise figure. The
circuit is housed in a 4-lead TO-46 package, consumes 180 mW of dc -F-l
power and requires no external components. Input and output imped-
ances are matched to 50 Q with VSWR less than 1.5 across the band.
A high-power vemion of the circuit consumes 1 W of dc power and gives
152 mW of output power at 200 MHz.
Ri = 500
—
1
J
‘LI
5orr
& RL V.
l--
=
v I 2rl ‘E2
I. INTRODUCTION ‘FI
>
w
=
IDE-BAND amplifiers are used in a variety of modern 140a
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MEYER AND BLAUSCHILDI:4-TERMINAL AMPLIFIER 635
Vcc = +6V
T~
r
RO L2
‘JO
i 10 3nH
Q2
33
40
L Q4
p._3
d
RE2
hFl
12
140
REI Q5
+ 12
~
capacitance.
matches at input and
output by partially resonating with 0.5 pF of pad and package L
=
L(3nH)
(a)
T 1
HI. LAYOUT AND PACKAGING
The low-power circuit active die size is 18 X 17 roils and a
die photograph is shown in Fig. 3. The input and output pads
on the left are minimum size at 2.5 milsz in order to reduce
-+1 Q2
=
RL
F
e RF1
parasitic capacitance. The upper pad is the input lead con-
E
nected to device Q1, which is the largest of the active devices.
REI RE2
The lower pad is the output connection with the 10$2 resistor
in series with the Darlingtom common collector. The compen- L(lnH)
sation capacitor is also lc)cated in the Darlington isolation
region. The supply voltage pad is shown at the bottom of the
die.
!i
n
L(l nH)
RF2 I
n
24
22
20
g
-.
gN 18
g
~
16
14
12
10 20 50 00 200 E@o
FREQI !NCYMHz
Fig. 6. Low-power amplifier frequency response.
TABLE I
LOW-POWER
CIRCUITPERFORMANCE
OVERTEMPERATURE
stages and bonding each pad to the TO-46 header with triple TABLE 11
bond wires. The :resulting inductors of about 1 nH in each lead MEASURED S PARAMETERS FORTHELOW-POWER
CIRCUIT
have a negligible. effect on the circuit performance. This imple-
F(MHz) Sll (dB) S 12(dB) S21 (dB) SZ (dB)
mentation is further illustrated in Fig. 5, which is a photograph
of the low-power chip bonded in the TO-46 header. The ad- 50 -27.8 79° -27.4 0 18.0 5° -16.4 33°
vantages of the T() -46 package for this application are apparent 300 -21.3 159° -28.9 6;0 18.5 23° -13.1 106°
in the close proximity of input and output posts to the die, and 550 -15.0 176° -33,8 130° 17.8 38° -12.6 155°
700 -1S.2 178° -37.2 -153° 15.6 48° -15.0 160°
the use of the TO-46 header itself as a low-inductance ground
plane. The fourth (ground) lead is not visible in this top view.
most of the bias currents and voltages vary by only 10 percent
IV. MONOLITHIC PROCESS or less as temperature varies from - 55°C to 125”C. The ex-
The performance of the circuit is directly dependent on the ception is the Darlington driver Q6, whose current varies by a
characteristics of the IC process used for fabrication. This factor of two due to VBE variation in Qz. However, Qb is
circuit is fabricated using an ion-implanted high-frequency biased with a sufficiently high collector current to ensure that
junction-isolated monolithic process with peak ~T = 5 GHz. this variation has a negligible effect on circuit performance.
Collector and base resistance are minimized using deep n+ and Also shown in Table I is the power gain Szl, which varies only
p+ contacts and minimum feature size is 2 pm. 0.2 dB at 100 MHz due to the stabilizing effect of the feedback
loop gain. At the top of the band (700 MHz) the gain variation
V. MEASUREMENTS is 2.4 dB over temperature due to the much reduced feedback
A number of samples of the low-power amplifier have been loop gain at this frequency. The high-frequency S parameters
extensively chamcterized and performance has been found to of the circuit as a function of frequency are listed in detail in
agree well with computer simulations based on comprehensive Table II. The overall circuit specifications are summarized in
device models. As shown in Fig. 6, the measured gain versus Table HI where the large-signal characteristics at 100 MHz are
frequency response is essentially flat and equal to 18 dB up to specified via the 1 dB gain compression point, saturated output
200 MHz. A gain peak of 0.7 dB occurs at 400 MHz with a power and lkfa intercept. These specifications are largely
-3 dB frequency of 725 MHz. The circuit still has 10 dB of determined by bias current in the output stage. At higher fre-
gain at 1 GHz. quencies the saturated output power decreases due to limita-
The circuit performance over temperature is summarized in tions on the drive available to the output stage. This behavior
Table I. Here the influence of the dc feedback is evident as is summarized in Fig. 7.
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MEYER AND BLAUSCHILD :4-TERMINAL AMPLIFIER 637
TABLE III
LOW-POWER
AMPLIFIER
SPECIFICATIONS
J’& 6V
‘dc 180 mW
N_oisefigure 4.4 dB
RI 50 Q (VSWR < 1.5)
R. 50 ~ (VSWR < 1.5)
Gain 18 dB
-3 dB bandwidth 725 MHz
1 dB gain compression point +3 dB_m
Saturated output power +12 dBm
Z&f3intereept +17 dBm
Active die size 18 X 17mils
Process n-p-n .fT 5 GHz
TEMPERATURE TA = 27°C
;[. ~
Fig. 9. High-power amplifier die photograph,
TABLE IV
MEASURED S PARAMETERS FORTHBHIGH-POWER
AMPLIFIER
0, 1 II I 1 [Ill
70
I 1 I I I 1111
100
I 1 I I II
1000
100 -25.6 -14° -30.5 12° 23.0 -39° -11.8 -115°
FREQUENCY (MHz)
200 -24.5 -60° -30.1 8° 23.1 -48: -12.7 -127°
Fig. 7. Saturated output power versus supply voltage and frequency
450 -23.0 -11° -30.1 47° 21.9 -125 -6.9 -155°
650 -17.1 -20° -29.5 65° 19.3 169° -8.0 -155°
for the low-power amplifier.
Vcc = 9V
, The high-power circuit is housed in a 4-lead TO-39 can, and
Q3 RFC
in order to improve the circuit efficiency two external com-
RI 3s00
ponents are added. These are shown in Fig. 8 where the bias
<) resistor RB = 45 Q is external to the chip and connected to
RB 45rl
t Vcc via an RF choke, To further improve the output power
capability, the series matching resistor is omitted at the output
Q4 4
vi RFI
*
and the circuit is designed for an input resistance of 50 ~ and
Zzorl
R3 1Sa
output resistance of 25 fl.
‘El
The die photograph of the high-power amplifier is shown in
v
RFZ Fig. 9. Transistors Qz and Q5 carry the largest currents and
w +
130Q thus have the largest emitter areas. The current and power levels
4.5n RE2 used in the circuit require use of emitter ballasting to prevent
t
second breakdown in the active devices. This is achieved using
5$1 resistors in each emitter finger. These are fabricated using
the low sheet resistance of the deep collector n+ contact and
an effective total resistance of 0.4 fl in the emitter lead of the
Fig. 8. High-power amplWler schematic.
output transistor.
The measured 5’ parameters of the high-power amplifier are
VI. HIGH-POWER AMPLIFIER summarized in Table IV. A low-frequency gain of 23 dB has
The amplifier described above was designed for relatively been achieved with good input match to 50 S2, an output re-
low-power operation with good noise performance. However, sistance close to 25 Cl, and a -3 dB bandwidth of 625 MHz.
there are a number of applications which call for larger amounts The measured output power capability is shown in Fig. 10 and
of saturated output power than is available from this circuit. indicates that 152 mW is available at 200 MHz and 42 mW at
To meet this need, a high-power version of the circuit was 550 MHz.
designed with schematic as shown in Fig. 8. In this case, the
collector of Qb is connected to Vcc to allow miximum output VII. CONCLUSIONS
voltage swing. The supply voltage is raised to 9 V and the bias A wide-band monolithic amplifier has been described which
current in Q2 is raised to 70 mA. Total power dissipation is is housed in a 4-terminal package and needs no external com-
1 W. As explained in the Appendix, this requires RE2 to be ponents in its low-power version. A gain of 18 dB, bandwidth
reduced to 4.5 Cl. of 725 MHz, and noise figure of 4.4 dB are achieved by careful
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638 IEEE JOURNAL OF SOLID-STATE CIRCUITS,VOL. SC-16, NO. 6, DECEMBER 1981
(6)
RF1 + RE1
= 10 Robert A. Blauschild (S’70-M’74), for a photograph and biography,
R*, see this issue, p. 633.
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