1022-01
1022-01
CALIBRATION
In recognition of the successful completion of the A2LA evaluation process (including an assessment of
the organization’s compliance with A2LA’s Calibration Program Requirements), accreditation is granted
to this laboratory to perform the following calibrations1, 8:
I. Acoustics
Acoustics – Measure
Acoustics – Measuring
Equipment3
Acoustics – Measuring
Equipment3 (cont)
II. Chemical
III. Dimensional
Precision Levels
High Accuracy Up to ± 1000 arc-sec 0.97 arc-sec Gage blocks, sine plate
Inclinometers, Digital
Protractors
Length Standards, Foils, Up to 12 in 5.8 µin + 1.5 µin/in Master gage blocks &
Shims & Feeler/Thickness laser interferometer
Gauges
(12 to 48) in 14 µin + 0.8 µin/in Master gage blocks, gage
amplifier
Hand Tools3 –
Calipers:
Outside Up to 72 in 31 µin + 4.9 µin/in Gage blocks
Step, Depth Up to 72 in 33 µin + 4.9 µin/in
Inside 1.4 in 51 µin Master ring
Digital & Dial Up to 6 in 32 µin + 3 µin/in Gage blocks
Indicators
Dial Indicator Up to 2 in 13 µin Amplifier, gage head
Calibrator
Micrometers:
Spindle Linearity Up to 72 in 7.1 µin + 5.3 µin/in Gage blocks
Anvil Flatness 50 µin 3.2 µin Optical flat
Parallelism 50 µin 5.6 µin
Height Gages Up to 72 in 290 µin + 2.6 µin/in Gage blocks
Chamfer Gage – Inside Up to 2 in 380 µin Master rings & plug
& Outside Diameter gages
Resolution:
Comparator Gages 100 µin 73 µin Gage blocks
(Mikrokator, Blanchett 50 µin 33 µin
Sheffield, Differential 20 µin 13 µin
Probes) 10 µin 8.2 µin
5 µin 5.1 µin
2 µin 3.4 µin
Height Masters
Column Up to 24 in 10 µin + 1.9 µin/in Gage blocks
Block Parallelism Block surface area 30 µin Lever probe
Micrometer Head Up to 1 in 19 µin Axial probe
Coating Thickness – (0.5 to 150) mils 0.061 mils + Thickness foil sets
Measuring Equipment 0.012 mils/mils
(0.01 to 5.7) mm 0.74 µm + 6.9 µm/mm
Optical Comparators3 –
Par Centricity Field of View 110 µin + 0.6 µin/in Glass rule
Plain Diameter – Internal Up to 12 in 5.8 µin + 1.5 µin/in Master gage blocks
(Plain Rings) & laser
interferometer
Plain Diameter – External Up to 12 in 5.7 µin + 1.5 µin/in Master gage blocks
(Plug Gages, Pin Gages) & laser
interferometer
Surface Plate 3 –
Flatness Up to 16 ft √D x 9.2 µin Electronic leveling
diagonal system
Local Area Flatness Up to 0.001 in 31 µin Repeat-o-meter
Length 1D – Measure
Length Up to 10 in 160 µin + 46 µin/in Optical comparator
V-Blocks
Parallelism Up to 10 in 36 µin Surface plate,
master square, pin
Squareness 110 µin + 5.8 µin/in gage, electronic
probe
Roundness Measuring
Machine
Radial Departure (0 to 360) ° 7.4 µin Precision square
Gage Head Calibration 200 µin 5.1 µin Gage blocks
Coning 100 µin 6.8 µin Precision sphere
Axial Error 100 µin 6.8 µin Precision sphere
DC High Voltage3 –
(0 to 12) Ω 1 mΩ + 19 µΩ/Ω
(12 to 120) Ω 1.2 mΩ + 19 µΩ/Ω
120 Ω to 1.2 kΩ 4.4 mΩ + 19 µΩ/Ω
(1.2 to 12) kΩ 44 mΩ + 19 µΩ/Ω
(12 to 120) kΩ 0.44 Ω + 19 µΩ/Ω
120 kΩ to 1.2 MΩ 4.4 Ω + 19 µΩ/Ω
(1.2 to 12) MΩ 63 Ω + 27 µΩ/Ω
(12 to 120) MΩ 6.5 kΩ + 0.33 mΩ/Ω
(120 to 1200) MΩ 0.47 MΩ + 3.1 mΩ/Ω
Resistance3 – Generate
(cont)
Resistance – Measure
Resistance – Measure
AC Voltage – Generate3
AC Voltage – Generate3
(cont)
AC Voltage – Generate3
Up to 2.2 mV (10 to 20) Hz 4 µV + 0.24 mV/V Fluke 5730A
(20 to 40) Hz 4 µV + 90 µV/V
40 Hz to 20 kHz 4 µV + 80 µV/V
(20 to 50) kHz 4 µV + 0.2 mV/V
(50 to 100) kHz 5 µV + 0.5 mV/V
(100 to 300) kHz 10 µV + 1.1 mV/V
(300 to 500) kHz 20 µV + 1.4 mV/V
500 kHz to 1 MHz 20 µV + 2.7 mV/V
(2.2 to 22) mV (10 to 20) Hz 4.6 µV + 0.24 mV/V
(20 to 40) Hz 4.2 µV + 90 µV/V
40 Hz to 20 kHz 4.2 µV + 80 µV/V
(20 to 50) kHz 4.5 µV + 0.2 mV/V
(50 to 100) kHz 6.2 µV + 0.5 mV/V
(100 to 300) kHz 12 µV + 1.1 mV/V
(300 to 500) kHz 23 µV + 1.4 mV/V
500 kHz to 1 MHz 26 µV + 2.7 mV/V
(22 to 220) mV (10 to 20) Hz 18 µV + 0.24 mV/V
(20 to 40) Hz 9.2 µV + 90 µV/V
40 Hz to 20 kHz 8.4 µV + 57 µV/V
(20 to 50) kHz 10 µV + 0.12 mV/V
(50 to 100) kHz 24 µV + 0.31 mV/V
(100 to 300) kHz 36 µV + 0.66 mV/V
(300 to 500) kHz 58 µV + 1.4 mV/V
500 kHz to 1 MHz 0.11 mV + 2.7 mV/V
220 mV to 2.2 V (10 to 20) Hz 96 µV + 0.25 mV/V
(20 to 40) Hz 37 µV + 91 µV/V
40 Hz to 20 kHz 18 µV + 42 µV/V
(20 to 50) kHz 26 µV + 68 µV/V
(50 to 100) kHz 50 µV + 85 µV/V
(100 to 300) kHz 0.16 mV + 0.35 mV/V
(300 to 500) kHz 0.43 mV + 1 mV/V
500 kHz to 1 MHz 0.69 mV + 1.7 mV/V
(2.2 to 22) V (10 to 20) Hz 0.97 mV + 0.25 mV/V
(20 to 40) Hz 0.36 mV + 92 µV/V
40 Hz to 20 kHz 0.16 mV + 42 µV/V
(20 to 50) kHz 0.26 mV + 68 µV/V
(50 to 100) kHz 0.4 mV + 84 µV/V
(100 to 300) kHz 1.2 mV + 0.27 mV/V
(300 to 500) kHz 4.3 mV + 1 mV/V
500 kHz to 1 MHz 6.6 mV + 1.5 mV/V
(22 to 220) V* (10 to 20) Hz 9.6 mV + 0.25 mV/V * 220 V range
(20 to 40) Hz 3.6 mV + 92 µV/V subject to 2.2E7
40 Hz to 20 kHz 1.8 mV + 52 µV/V V-Hz limitation
(20 to 50) kHz 2.9 mV + 81 µV/V
(50 to 100) kHz 5.9 mV + 0.15 mV/V
AC Voltage – Generate,
High Frequency Flatness
AC Voltage – Generate,
High Frequency Flatness
(cont)
AC Voltage – Measure
AC Voltage – Measure
(cont)
AC Voltage – Measure
(cont)
AC Voltage3 – Measure
(cont)
(1 to 10) V (1 to 40) Hz 0.47 mV + 70 µV/V Agilent 3458A
40 Hz to 1 kHz 0.27 mV + 70 µV/V
(1 to 20) kHz 0.34 mV + 0.14 mV/V CMC’s apply to
(20 to 50) kHz 0.5 mV + 0.3 mV/V
(50 to 100) kHz 1 mV + 0.8 mV/V 120% of range,
(100 to 300) kHz 4 mV + 3 mV/V except 1000 V
(0.3 to 1) MHz 11 mV + 10 mV/V range maximum is
(1 to 2) MHz 16 mV + 15 mV/V 700 V
(10 to 100) V (1 to 40) Hz 6 mV + 0.2 mV/V
40 Hz to 1 kHz 4 mV + 0.2 mV/V
(1 to 20) kHz 4 mV + 0.2 mV/V
(20 to 50) kHz 5.5 mV + 0.35 mV/V
(50 to 100) kHz 14 mV + 1.2 mV/V
(100 to 300) kHz 50 mV + 4 mV/V
(0.3 to 1) MHz 0.16 V + 15 mV/V
(100 to 750) V (1 to 40) Hz 56 mV + 0.4 mV/V
40 Hz to 1 kHz 42 mV + 0.4 mV/V
(1 to 20) kHz 56 mV + 0.6 mV/V
(20 to 50) kHz 98 mV + 1.2 mV/V
(50 to 100) kHz 0.22 V + 3 mV/V
AC High Voltage3
Generate:
(1 to 10) kV 60 Hz 0.16 % HV AC power
(10 to 20) kV 60 Hz 0.12 % Supply with Vitrek
4700 w/ HVP-35
Measure:
(1 to 10) kV 50/60 Hz 0.16 % Vitrek 4700 w/
(10 to 35) kV 50/60 Hz 0.12 % HVL-100 & HVP-
(35 to 70) kV 50/60 Hz 0.12 % 35
Hz kHz MHz
Frequency
10 20 40 0.1 1 10 20 50 0.1 0.3 0.5 0.8 1
All CMC values below are presented in µV/V
2 mV 480 490 460 470 450 480 490 450 530 610 750 900 910
6 mV 290 300 250 250 220 220 230 290 330 500 530 670 740
10 mV 110 110 100 92 110 92 110 120 200 270 330 400 440
20 mV 230 87 85 78 110 78 95 130 210 330 530 660 520
60 mV 90 56 55 53 42 57 56 61 120 170 270 380 390
100 mV 70 46 33 29 22 27 30 35 63 93 140 230 260
200 mV 50 29 23 27 17 24 26 42 65 99 140 210 240
600 mV 38 24 13 16 16 17 15 15 21 32 46 81 100
1V 29 20 10 9 10 11 10 12 16 25 31 40 52
2V 37 20 14 11 17 12 9 8 35 26 32 42 56
6V 31 18 10 9 14 23 9 9 10 28 31 34 46
10 V 40 18 9 10 9 9 11 12 12 26 29 35 45
20 V 38 20 10 8 9 8 10 9 12 26 30 49 71
60 V 31 18 9 9 10 10 10 12 14 15
100 V 34 19 9 9 9 10 10 12 19
200 V 45 18 11 11 11 12 11 15 21
600 V 18 16 16 18 20 17 40
1000 V 16 14 14 16 18 32 *
* 30 kHz
AC Current3 – Generate
AC Current3 – Generate
(cont)
Clamp Meters3:
Toroidal:
Non-Toroidal:
All Types:
Fluke 5120A w/:
(100 to 2500) A (10 to 300) Hz 0.68 % Coil 3KA
(100 to 1000) A 300 Hz to 1 kHz 0.55 %
AC Current – Generate3
AC Current3 – Measure
AC Current3 – Measure
(cont)
(0.1 to 1) mA (10 to 20) Hz 0.0076 % Fluke 5790B with
(20 to 40) Hz 0.0032 % A40B current shunts
(40 to 400) Hz 0.0024 %
400 Hz to 3 kHz 0.0028 %
(3 to 20) kHz 0.003 %
(20 to 50) kHz 0.0038 %
(50 to 100) kHz 0.0055 %
AC Current3 – Measure
(cont)
(1 to 2) A (10 to 20) Hz 0.0076 % Fluke 5790B with
(20 to 40) Hz 0.0031 % A40B current
40 Hz to 20 kHz 0.0022 % shunts
(20 to 50) kHz 0.0034 %
(50 to 100) kHz 0.006 %
(2 to 5) A (10 to 20) Hz 0.0078 %
(20 to 40) Hz 0.0036 %
40 Hz to 20 kHz 0.0029 %
(20 to 50) kHz 0.0045 %
(50 to 100) kHz 0.0076 %
(5 to 10) A (10 to 20) Hz 0.008 %
(20 to 40) Hz 0.004 %
40 Hz to 20 kHz 0.0038 %
(20 to 50) kHz 0.0068 %
(50 to 100) kHz 0.011 %
(10 to 20) A (10 to 20) Hz 0.0085 %
(20 to 40) Hz 0.0048 %
40 Hz to 5 kHz 0.0041 %
(5 to 20) kHz 0.0059 %
(20 to 50) kHz 0.0089 %
(50 to 100) kHz 0.017 %
(20 to 50) A (10 to 20) Hz 0.0085 %
(20 to 40) Hz 0.0056 %
40 Hz to 5 kHz 0.0055 %
(5 to 20) kHz 0.0077 %
(20 to 33) kHz 0.0096 %
(33 to 50) kHz 0.011 %
(50 to 70) kHz 0.013 %
(70 to 100) kHz 0.019 %
(50 to 100) A (10 to 20) Hz 0.0085 %
(20 to 40) Hz 0.0066 %
(40 to 500) Hz 0.006 %
500 Hz to 5 kHz 0.0073 %
(5 to 20) kHz 0.011 %
(20 to 33) kHz 0.013 %
(33 to 50) kHz 0.016 %
(50 to 70) kHz 0.02 %
(70 to 100) kHz 0.025 %
AC Impedance3 – Generate,
Fixed Points
Capacitance3 – Generate
Capacitance3 – Generate
(cont)
AC Power3 –
See Table Below See Table Below Fluke 5520A
Generate
AC Power3 – Generate
See Table Below See Table Below Fluke 5520A
(cont)
AC Power – Generate3 See Table Below See Table Below Fluke 5560A
(cont)
AC Power – Generate3 See Table Below See Table Below Fluke 5560A
(cont)
Ø 20 °
2.7 %
PF=0.940
Ø 30 °
4.2 %
PF=0.866
Ø0°
1.1 %
PF=1.000
Ø 10 °
3.4 %
PF=0.985
Ø 20 °
5.9%
PF=0.940
Capacitance3 – Generate,
Fixed Points
1000 pF 1 kHz 43 fF
1 MHz 65 fF
2 MHz 0.15 pF
3 MHz 0.28 pF
4 MHz 0.44 pF
5 MHz 0.62 pF
10 MHz 1.9 pF
13 MHz 2.8 pF
Capacitance3 – Measure
(0.1 to 1) pF 50 Hz 0.99 fF
400 Hz 92 fF
1 kHz 74 fF
2 kHz 87 fF
3 kHz 0.11 fF
5 kHz 0.18 fF
10 kHz 0.51 fF
Capacitance3 – Measure
(cont)
(1 to 10) pF 50 Hz 2.4 fF Andeen-Hagerling
200 Hz 0.87 fF AH2700A
400 Hz 0.7 fF
1 kHz 0.64 fF
2 kHz 0.7 fF
3 kHz 0.79 fF
5 kHz 1.1 fF
10 kHz 2.1 fF
(10 to 100) pF 50 Hz 17 fF
200 Hz 8.2 fF
400 Hz 6.8 fF
1 kHz 6.3 fF
2 kHz 6.7 fF
3 kHz 7.2 fF
5 kHz 8.7 fF
10 kHz 14 fF
(0.1 to 1) nF 50 Hz 0.17 pF
200 Hz 82 fF
400 Hz 68 fF
1 kHz 63 fF
2 kHz 67 fF
3 kHz 72 fF
5 kHz 88 fF
10 kHz 0.14 pF
(1 to 10) nF 50 Hz 13 pF
200 Hz 3.8 pF
400 Hz 2.3 pF
1 kHz 1.8 pF
2 kHz 2.1 pF
3 kHz 2.7 pF
5 kHz 4.1 pF
10 kHz 8.3 pF
(10 to 100) nF 50 Hz 0.37 nF
200 Hz 98 pF
400 Hz 57 pF
1 kHz 41 pF
2 kHz 52 pF
3 kHz 70 pF
5 kHz 0.12 nF
10 kHz 0.31 nF
(0.1 to 1.5) µF 50 Hz 11 nF
200 Hz 2.9 nF
400 Hz 2 nF
1 kHz 1.2 nF
2 kHz 1.9 nF
3 kHz 3 nF
5 kHz 7.7 nF
Capacitance – Measure3 See Table Below See Table Below Keysight E4980A
AC Impedance – Measure3 See Table Below See Table Below Keysight E4980A
Inductance – Measure3 See Table Below See Table Below Keysight E4980A
Inductance – Generate3
Inductance – Generate3
(cont)
Inductance3 – Generate
100 µH 100 Hz 0.018 µH General Radio 1482
200 Hz 0.018 µH series
400 Hz 0.018 µH
1 kHz 0.012 µH
10 kHz 0.018 µH
200 µH 100 Hz 1 µH
200 Hz 0.98 µH
400 Hz 0.72 µH
1 kHz 0.46 µH
10 kHz 0.64 µH
Inductance3 – Generate
(cont)
1 mH 100 Hz 0.14 µH
200 Hz 0.14 µH
400 Hz 0.14 µH
1 kHz 0.13 µH
10 kHz 0.18 µH
5 mH 100 Hz 12 µH
200 Hz 3.7 µH
400 Hz 7 µH
1 kHz 6 µH
10 kHz 2.4 µH
10 mH 100 Hz 1.4 µH
200 Hz 1.4 µH
400 Hz 1.4 µH
1 kHz 1.1 µH
10 kHz 1.6 µH
100 mH 100 Hz 13 µH
200 Hz 13 µH
400 Hz 13 µH
1 kHz 11 µH
10 kHz 21 µH
500 mH 100 Hz 0.36 mH
200 Hz 0.36 mH
400 Hz 2.8 mH
1 kHz 0.27 mH
1H 100 Hz 0.12 mH
200 Hz 0.12 mH
400 Hz 0.12 mH
1 kHz 0.12 mH
5H 100 Hz 1.6 mH
200 Hz 3.6 mH
400 Hz 1.3 mH
1 kHz 1.5 mH
10 H 100 Hz 1.3 mH
200 Hz 1.3 mH
400 Hz 1.3 mH
1 kHz 1.2 mH
Inductance – Measure
200 µH 100 Hz 1 µH
200 Hz 0.98 µH
400 Hz 0.72 µH
1 kHz 0.46 µH
10 kHz 0.64 µH
1 mH 100 Hz 0.6 µH
200 Hz 0.6 µH
400 Hz 0.6 µH
1 kHz 0.6 µH
10 kHz 0.62 µH
5 mH 100 Hz 12 µH
200 Hz 3.8 µH
400 Hz 7.1 µH
1 kHz 6.1 µH
10 kHz 2.5 µH
10 mH 100 Hz 1.8 µH
200 Hz 1.8 µH
400 Hz 1.8 µH
1 kHz 1.6 µH
10 kHz 2 µH
100 mH 100 Hz 17 µH
200 Hz 17 µH
400 Hz 17 µH
1 kHz 16 µH
10 kHz 24 µH
500 mH
100 Hz 0.37 mH
200 Hz 0.37 mH
400 Hz 2.8 mH
1 kHz 0.28 mH
Inductance – Measure
(cont)
5H 100 Hz 1.7 mH
200 Hz 3.6 mH
400 Hz 1.4 mH
1 kHz 1.6 mH
10 H 100 Hz 1.7 mH
200 Hz 1.7 mH
400 Hz 1.7 mH
1 kHz 1.7 mH
(0 to 360)°:
(0 to 360)°
Distortion3
Oscilloscopes3 –
Volt:
Oscilloscopes3 – (cont)
Volt
4 mV to 3.5 V
(600 to 1100) MHz 0.58 mV + 67 mV/V
Oscilloscopes3 –
Voltage:
70 ps 17 ps w/9560 active
10 Hz to 1 MHz head
Oscilloscopes3 – (cont)
Level Sine Wave 50 kHz to 300 MHz 3.3 % Fluke 9500B w/ active
(300 to 550) MHz 3.4 % heads
(0.55 to 1.1) GHz 4%
(1.1 to 3.2) GHz 4.4 %
(3.2 to 6) GHz 5.8 %
Electrical Calibration of
RTDs3 – Measure
Electrical Calibration of
RTDs3 – Measure (cont)
Electrical Calibration of
RTDs3 – Generate
Thermocouple3 – Indicating
Systems & Measure
Type B (600 to 800) °C 0.35 °C Fluke 7526A
(800 to 1550) °C 0.28 °C
(1550 to 1820) °C 0.23 °C
Thermocouple3 – Indicating
Systems & Measure (cont)
Power Meter3 –
Amplitude Modulation3 –
Measure
Frequency Modulation3 –
Measure
Phase Modulation3 –
Measure
Attenuation – Measure3
Attenuation – Generate3
LISN
Insertion Loss, (-5 to 0) dB (10 to 300) kHz 0.035 dB Agilent E5071C, cal/ver
300 kHz to 10 MHz 0.024 dB kit
(10 to 1000) MHz 0.027 dB
Phase Angle, (-10 to 90)° 10 to 10 MHz 1.4° CISPR 16, CISPR 25,
(10 to 1000) MHz 1.7° IEC61000-4, MIL-
STD-461F, ISO 7637,
Impedance, (0.5 to 100) Ω 10 kHz to 10 MHz 0.54 Ω ANSI C63.4
(10 to 1000) MHz 0.75 Ω
Lowest measurement range is determined by the E4440A local oscillator’s interaction with the unit
under test. Values stated below are informational only and serve as a guide for typical system
sensitivity performance. Actual sensitivity performance may be better than what is stated.
S-Parameters (Reflection & 9 kHz to 50 See tables below Network analyzers with
Transmission) GHz (Interpolate CMC’s between calibration/
cardinal points listed) verification kits
Type N: Transmission S12/S21 Linear Magnitude (dB) (cont) E5071C with 85032F
dB (9 to 300) kHz 300 kHz to 10 MHz 10 MHz to 3 GHz (3 to 4.5) GHz
0 0.039 0.032 0.034 0.063
10 0.052 0.047 0.048 0.071
Type N: Transmission S12/S21 Phase (°) E5071C with 85032F
dB (9 to 300) kHz 300 kHz to 10 MHz 10 MHz to 3 GHz (3 to 4.5) GHz
-90 --- --- 20 21
-80 --- 29 6.9 6.9
-70 28 8.9 2.7 2.7
-60 8.7 3 1.3 1.4
-50 2.8 1.2 0.86 0.93
-40 1.1 0.68 0.63 0.72
-30 0.56 0.48 0.47 0.59
-20 0.38 0.34 0.34 0.49
-10 0.32 0.28 0.29 0.45
0 0.27 0.23 0.24 0.42
10 0.37 0.34 0.35 0.49
Type N: Reflection S11/S22 Linear Magnitude (ρ) E8364A with 85054B
rho 45 MHz to 2 GHz (2 to 18) GHz
0 0.0042 0.0081
0.1 0.0043 0.0081
0.2 0.0043 0.0083
0.3 0.0044 0.0086
0.4 0.0046 0.0092
0.5 0.0048 0.01
0.6 0.0051 0.012
0.7 0.0056 0.015
0.8 0.0061 0.018
0.9 0.0069 0.021
1.0 0.0077 0.025
Type N: Reflection S11/S22 Phase (°) E8364A with 85054B
rho 45 MHz to 2 GHz (2 to 18) GHz
0 --- ---
0.1 2.3 4.6
0.2 1.2 2.3
0.3 0.82 1.6
0.4 0.64 1.3
3.5 mm: Reflection S11/S22 Linear Magnitude (ρ) (cont) E8364A with 85052C
rho 45 MHz to 2 GHz (2 to 20) GHz (20 to 26.5) GHz
0.1 0.0042 0.0035 0.0037
0.2 0.0043 0.0037 0.0039
0.3 0.0044 0.0038 0.0043
0.4 0.0047 0.004 0.0046
0.5 0.0052 0.0042 0.0049
0.6 0.0058 0.0044 0.0051
0.7 0.0068 0.0046 0.0053
0.8 0.008 0.0049 0.0055
0.9 0.0094 0.0052 0.0057
1.0 0.011 0.0055 0.0058
3.5 mm: Reflection S11/S22 Phase (°) E8364A with 85052C
rho 45 MHz to 2 GHz (2 to 18) GHz (20 to 26.5) GHz
0 --- --- ---
0.1 2.3 1.9 2
0.2 1.2 0.98 1.1
0.3 0.82 0.69 0.78
0.4 0.66 0.55 0.64
0.5 0.58 0.47 0.55
0.6 0.56 0.42 0.49
0.7 0.56 0.38 0.44
0.8 0.58 0.35 0.4
0.9 0.61 0.34 0.37
1.0 0.65 0.33 0.35
3.5 mm: Transmission S12/S21 Linear Magnitude (dB) E8364A with 85052C
dB 45 MHz to 2 GHz (2 to 18) GHz (20 to 26.5) GHz
-90 17 1.4 2.4
-80 9.5 0.5 0.88
-70 4.2 0.23 0.34
-60 1.6 0.14 0.18
-50 0.55 0.11 0.13
-40 0.2 0.083 0.11
-30 0.098 0.071 0.094
-20 0.059 0.06 0.082
-10 0.039 0.048 0.068
0 0.029 0.029 0.034
10 0.038 0.12 0.26
2.4 mm: Reflection S11/S22 Phase (°) (cont) E8364A with 85056A
rho 45 MHz to 2 GHz (2 to 18) GHz (20 to 40) GHz (40 to 50) GHz
0.9 0.7 0.86 1.4 1.8
1.0 0.7 0.9 1.5 1.9
2.4 mm: Transmission S12/S21 Linear Magnitude (dB) E8364A with 85056A
dB 45 MHz to 2 GHz (2 to 18) GHz (20 to 40) GHz (40 to 50) GHz
-90 17 1.4 2.5 2.5
-80 9.5 0.5 0.9 0.91
-70 4.2 0.23 0.37 0.4
-60 1.6 0.15 0.23 0.29
-50 0.55 0.12 0.19 0.26
-40 0.2 0.091 0.17 0.24
-30 0.098 0.079 0.16 0.23
-20 0.059 0.07 0.15 0.23
-10 0.039 0.06 0.14 0.22
0 0.029 0.046 0.11 0.2
10 0.039 0.12 0.46 0.49
2.4 mm: Transmission S12/S21 Phase (°) E8364A with 85056A
dB 45 MHz to 2 GHz (2 to 18) GHz (20 to 40) GHz (40 to 50) GHz
-90 --- 9.9 19 19
-80 --- 3.4 6.2 6.3
-70 39 1.5 2.5 2.7
-60 12 0.97 1.5 1.9
-50 3.8 0.75 1.3 1.7
-40 1.4 0.59 1.1 1.6
-30 0.66 0.52 1.1 1.6
-20 0.4 0.46 1 1.5
-10 0.27 0.4 0.92 1.5
0 0.21 0.32 0.72 1.4
10 0.27 0.83 3.9 4
Viscosity – Ford, Dip & Cup Nos. 1 through 5 0.5 % Viscosity cups,
Other Viscosity Cups stopwatch,
thermometer using
ASTM D1200,
D4212, ISO-2431
VII. Mechanical
Force – Compression & (50 to 2000) lbf 0.016 % Standard load cells
Tension3 – Measuring (100 to 5000) lbf 0.012 %
Equipment (Incl. Wheel (200 to 10 000) lbf 0.015 %
Load Scales & (500 to 25 000) lbf 0.015 %
Dynamometers) (1000 to 50 000) lbf 0.026 %
Accelerometers –
Voltage Sensitivity
100 Hz (ref) (98 to 102) mV/g 1.2 % Vibration transducer
159 Hz (ref) 1.2 % calibration system
HRC
Low 0.45 HRC
Middle 0.48 HRC
High 0.37 HRC
HRB
Low 1.1 HRB
Middle 1.1 HRB
High 0.84 HRB
HR 15N
Low 1.1 HR15N
Middle 1.1 HR15N
High 0.87 HR15N
HR 30N
Low 1.1 HR30N
Middle 0.73 HR30N
High 0.68 HR30N
HR 45N
Low 0.86 HR45N
Middle 0.86 HR45N
High 0.69 HR45N
HR 15T
Low 0.96 HR15T
Middle 0.85 HR15T
High 0.93 HR15T
HR 30T
Low 1.1 HR 30T
Middle 0.91 HR 30T
High 0.91 HR 30T
HR45T
Low 1.3 HR45T
Middle 1.3 HR45T
High 0.96 HR45T
Vibration Generators3
Vibration Generators
IX. Thermodynamics
Frequency3 – Measuring 1 µHz to 80 MHz 5.8 µHz + 0.6 pHz/Hz GPS w/33250A
Equipment
80 MHz to 26.5 GHz 0.58 mHz + 0.66 pHz/Hz GPS w/E8257D
Tachometers – Optical3 (1 to 100 000) rpm 0.000 54 rpm + Function generator &
0.000 038 rpm/rpm LED
_______________________________________________
1
This laboratory offers commercial calibration service and field calibration service.
2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs
represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually
using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration
performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device
and to influences from the circumstances of the specific calibration.
3
Field calibration service is available for this calibration. Please note the actual measurement
uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found
on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of
calibration and for other possible adverse effects such as those caused by transportation of the
calibration equipment. The usual allowance for the actual uncertainty introduced by the item being
calibrated, (e.g., resolution) must also be considered and this, on its own, could result in the actual
measurement uncertainty achievable on a customer’s site being larger than the CMC.
4
In the statement of CMC, L is the numerical value of the nominal length of the device measured in
inches; D is the numerical value of the nominal diameter of the device measured in inches; Di is the
numerical value of the nominal diagonal of the plate measured in feet; R is the numerical value of the
resolution of the device in its respective units; F is the applied frequency in kHz; and percentages are
percentage of reading unless otherwise indicated.
5
The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges
indicated for the listed measurement parameter.
6
CMC components that can be reasonably attributed to the Unit Under Test have not been utilized in the
calculation of the CMC value for this measurement parameter.
7
The stated measured values are determined using the indicated instrument (see Comments). This
capability is suitable for the calibration of the devices intended to measure or generate the measured
value in the ranges indicated. CMCs are expressed as either a specific value that covers the full range
or as a percent or fraction of the reading plus a fixed floor specification.
TRESCAL, INC.
Howell, MI
for technical competence in the field of
Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General
requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of ANSI/NCSL
Z540-1-1994, ANSI/NCSL Z540.3-2006, and R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This
accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management
system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
_______________________
Mr. Trace McInturff, Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1022.01
Valid to May 31, 2026
Revised November 22, 2024
For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.