E300 Series Industrial eUSB Module 401-0451-00 Rev.

E300 Series
Industrial eUSB Module

Engineering Specification
Document Number: 401-0451-00

Revision: D

© 2020 | Delkin Devices Inc.

E300 Series Industrial eUSB Module 401-0451-00 Rev. D

Product Overview
⚫ Capacity ⚫ MTBF
￭ 1GB – 32GB ￭ More than 2,000,000 hours at 0°C

⚫ USB Interface ⚫ Features

￭ USB 3.1 Compliant ￭ Static and Dynamic Wear Leveling
￭ Bad Block Management
⚫ Flash Interface ￭ SMART
￭ Flash type: SLC ￭ Firmware Update Capability

⚫ Performance ⚫ Temperature Range

￭ Read: up to 75 MB/s ￭ Operation: -40°C ~ 85°C
￭ Write: up to 29 MB/s ￭ Storage: -50°C ~ +100°C

⚫ Power ConsumptionNote1 ⚫ RoHS compliant

￭ Active mode: < 125mA
￭ Idle mode: < 45mA

Notes:
1. Please see “5.2 Power Consumption” for details.

© 2020 | Delkin Devices Inc.

E300 Series Industrial eUSB Module 401-0451-00 Rev. D

TABLE OF CONTENTS
1. INTRODUCTION....................................................................................................... 6
1.1. General Description ............................................................................................. 6
1.2. Flash Management .............................................................................................. 6
1.2.1. Error Correction Code (ECC) .......................................................................... 6
1.2.2. Wear Leveling ................................................................................................. 6
1.2.3. Bad Block Management.................................................................................. 7
1.2.4. SMART ........................................................................................................... 7
1.2.5. Read Disturb Management ............................................................................. 7
1.2.6. Firmware Redundancy.................................................................................... 7
1.2.7. Dynamic Data Refresh.................................................................................... 8
1.2.8. Power Fail Robustness ................................................................................... 8
1.2.9. Page-based Mapping ..................................................................................... 8
2. PRODUCT SPECIFICATIONS ................................................................................. 9
2.1. Overview ............................................................................................................. 9
2.2. Sequential and Random Performance .............................................................. 10
2.3. Part Numbers .................................................................................................... 10
2.4. Connector & Configuration Options ................................................................... 11
3. ENVIRONMENTAL SPECIFICATIONS .................................................................. 12
3.1. Environmental Conditions.................................................................................. 12
3.1.1. Temperature and Humidity ........................................................................... 12
3.1.2. Shock & Vibration ......................................................................................... 12
3.2. MTBF................................................................................................................. 12
3.3. Certification & Compliance ................................................................................ 12
4. ENDURANCE & DATA RETENTION ..................................................................... 13
5. ELECTRICAL SPECIFICATIONS .......................................................................... 13
5.1. Supply Voltage .................................................................................................. 13
5.2. Power Consumption .......................................................................................... 13
6. INTERFACE ........................................................................................................... 14
6.1. Pin Assignment and Descriptions ...................................................................... 14
7. PHYSICAL ATTRIBUTES ...................................................................................... 15
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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

7.1. Mechanical Form Factor .................................................................................... 15

7.2. Mechanical Dimensions..................................................................................... 15
8. ATA PASS THROUGH, IDENTIFY DEVICE & SMART ......................................... 16
8.1. Supported Commands in ATA Pass Through..................................................... 16
8.2. ATA Identify Device Information ......................................................................... 16
8.3. ATA SMART Functionality .................................................................................. 18
8.3.1. SMART Enable Operations .......................................................................... 18
8.3.2. SMART Disable Operations .......................................................................... 19
8.3.3. SMART Read Data ....................................................................................... 19
8.3.4. SMART Data Structure ................................................................................. 20
8.3.5. Spare Block Count Attribute.......................................................................... 21
8.3.6. Spare Block Count Worst Chip Attribute Threshold ...................................... 21
8.3.7. Erase Count Attribute ................................................................................... 21
8.3.8. Total ECC Errors Attribute ............................................................................ 22
8.3.9. Correctable ECC Errors Attribute.................................................................. 22
8.3.10. Total Number of Reads Attribute ................................................................... 22
8.3.11. Power On Count Attribute ............................................................................. 23
8.3.12. Total LBAs Written Attribute .......................................................................... 23
8.3.13. Total LBAs Read Attribute ............................................................................. 23
8.3.14. Anchor Block Status Attribute ....................................................................... 23
8.3.15. Trim Status Attribute ..................................................................................... 24
8.3.16. SMART Read Attribute Thresholds............................................................... 24
8.3.17. Spare Block Count Attribute Threshold......................................................... 24
8.3.18. Spare Block Count Worst Channel Attribute Threshold ................................ 25
8.3.19. Erase Count Attribute Threshold .................................................................. 25
8.3.20. Total ECC Errors Attribute Threshold............................................................ 25
8.3.21. Correctable ECC Errors Attribute Threshold ................................................. 25
8.3.22. UDMA CRC Errors Attribute Threshold ........................................................ 25
8.3.23. Total Number of Reads Attribute Threshold .................................................. 25
8.3.24. Power On Count Attribute Threshold ............................................................ 25
8.3.25. Total LBAs Written Attribute Threshold ......................................................... 26
8.3.26. Total LBAs Read Attribute Threshold ............................................................ 26
8.3.27. Anchor Block Status Attribute Threshold ...................................................... 26
8.3.28. Trim Status Attribute Threshold .................................................................... 26
8.3.29. SMART Return Status .................................................................................. 26

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

LIST OF TABLES
Table 2-1 Performance by Capacity & Firmware Type ................................................ 10
Table 2-2 Part Numbers by Capacity & Firmware Type .............................................. 10
Table 2-3 Connector & Fixed/Removable Options ...................................................... 11
Table 5-1 Supply Voltage ............................................................................................ 13
Table 5-2 Power Consumption .................................................................................... 13
Table 6-1 Pin Assignment and Description for eUSB .................................................. 14
Table 7-1 eUSB Mechanical Form Factor Attributes ................................................... 15

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

1.Introduction
1.1. General Description
Delkin’s E300 Series Embedded USB (eUSB) is designed as a compact, non-removable

storage module to be used as a boot device or for storage of critical data. The industrial-

grade eUSB is fully compliant with USB 3.1 specifications, and is built with industrial temp

SLC NAND flash.

1.2. Flash Management

1.2.1. Error Correction Code (ECC)

Flash memory cells will deteriorate with use, which might generate random bit errors in the
stored data. Thus, the controller in Delkin’s Industrial eUSB drive applies an advanced BCH
ECC algorithm, which can detect and correct errors occur during read processes, ensuring
data been read correctly, as well as protecting data from corruption. The Delkin Industrial
eUSB also employs “near-miss” ECC, such that all blocks which reach a certain error
threshold are automatically refreshed immediately upon detection. The threshold is
determined by the specific flash and ECC configuration in the card.

1.2.2. Wear Leveling

NAND Flash devices can only undergo a limited number of program/erase cycles, and in
most cases, the flash media are not used evenly. If some blocks are updated more frequently
than others, the lifetime of the device would be reduced significantly. Thus, Wear Leveling
techniques are applied to extend the lifespan of NAND Flash by evenly distributing write and
erase cycles across the media.
The controller in Delkin’s newest Industrial eUSB drive utilizes an advanced Wear Leveling
algorithm, which optimizes life and performance, through a combination of static and global
wear leveling. Static wear leveling is utilized until one flash reaches 90% of the rated P/E
cycles, which is more efficient from a performance standpoint. Once a flash reaches 90%,
wear leveling switches to a global scheme, and all flash blocks participate in wear leveling as
one large pool, which enables the card to maximize lifetime.

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

1.2.3. Bad Block Management

Bad blocks are blocks that include one or more invalid bits and therefore, their reliability is
not guaranteed. Blocks that are identified and marked as bad by the manufacturer are
referred to as “Initial Bad Blocks”. Blocks that develop invalid bits during the lifespan of the
flash are named “Later Bad Blocks”. The controller in Delkin’s Industrial eUSB drive
implements an efficient bad block management algorithm to detect the factory-produced bad
blocks and manage any bad blocks that appear with use. This practice further prevents data
being stored into bad blocks and improves data reliability.

1.2.4. SMART
SMART, an acronym for Self-Monitoring, Analysis and Reporting Technology, is a special
function that allows a memory device to automatically monitor its health. While there is not an
industry standard for USB drive SMART functionality, as there is for SATA & PATA devices,
the Delkin eUSB supports ATA pass through commands to collect data from the card. Refer
to Section 7 for the command details and the information that can be extracted from the card.

1.2.5. Read Disturb Management

Delkin’s Industrial eUSB drives have advanced Read Disturb Management to prevent
uncorrectable errors in heavy read applications. As flash geometries shrink, the likelihood of
disturbances when adjacent pages are frequently read is increased, and typically wear
leveling is triggered by writing and erasing. However, the advanced read disturb
management system actually counts all reads on a block level, and compares them to a
configurable threshold. Once the threshold has been reached, a read wear level is triggered
and the block is refreshed, sending it to the back of the line. This ensures that errors will not
accumulate to the point that they will be uncorrectable.

1.2.6. Firmware Redundancy

Since flash storage is often used in applications with unstable sources of power, protecting
the firmware is critical. Delkin’s Industrial eUSB drives maintain two copies of firmware within
the flash, so that if the primary copy of the firmware is damaged, the back-up copy can be
used, the back-up copy is used, and then the original copy is repaired.

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

1.2.7. Dynamic Data Refresh

Typically, when a drive is new and less than 10% of the program/erase cycles have been
consumed, the data retention time of the flash is 5 or 10 years, depending on the type of
flash. At end of life, however, when 100% of the program/erase cycles have been consumed,
typically, the retention time is 1 year. To extend long term data retention over the life of a
card, Delkin’s Industrial eUSB will automatically refresh data that is not accessed for a long
time, which can be triggered based on a configurable power-on count threshold and operate
in the background.

1.2.8. Power Fail Robustness

With the goal of preventing data corruption and card failure, Delkin’s Industrial eUSB drives
have been developed to survive unscheduled power interruptions with minimal effect. In the
event of a power loss, the controller will reset and flash is immediately write-protected. A log
is kept of recent flash transactions, and if the last data in the log is corrupt, then the controller
will recover the latest valid entry. If a write operation was in process at the time of the power
loss, but not committed to flash, or the tables had not yet been updated, then this data might
be lost. Since the original data is always kept in a “twin” of the active block, we can always
revert back to the last known valid state of the card.

1.2.9. Page-based Mapping

The E300 eUSB utilizes page-based mapping, which has the advantages of improved random
performance, and reduced write amplification, which improves device overall life.

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

2.Product Specifications
2.1. Overview
⚫ Capacity / Flash Type
￭ 1GB to 32GB Industrial Temperature SLC

⚫ Electrical/Physical Interface
￭ Compliant with USB 3.1 Gen 1 Specification, which includes backward compatibility to
USB 2.0 and 1.1

⚫ ECC Scheme
￭ Capable of correcting up to 96 bits per 1K Byte – BCH engine

⚫ Supports SMART commands

⚫ Supports Secure Erase and Sanitize via ATA pass through

commands

⚫ AES encryption engine 128 and 256-bit

⚫ OS Compatibility
￭ All USB 2.0 Compatible Operating Systems supported, including:

- Windows 7 (32 & 64bit), Windows 8, Windows 10, Windows XP

- Linux Kernel 4.2.0-27 (Ubuntu 15.10)

- Mac OS X 10.8.4, 10.11.2

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

2.2. Sequential and Random Performance

Table 2-1 Performance by Capacity & Firmware Type

Sequential Random
Capacity
Read (MB/s) Write (MB/s) Read (MB/s) Write (MB/s)
1GB SLC TBD TBD 5.0 3.5
2GB SLC TBD TBD 5.0 3.5
4GB SLC 35 25 6.0 2.5
8GB SLC 75 35 7.0 3.5
16GB SLC 75 60 7.0 3.8
32GB SLC 75 60 7.0 3.7
Measured with CrystalDiskMark 3.0.3 64 bit in USB 3.0 mode, Random performance for 4K blocks.

2.3. Part Numbers

Industrial SLC eUSB (-40 to 85°C Operating Temperature)

Table 2-2 Part Numbers by Capacity

Capacity Part Number

1GB M40GTQHFL-xx000-D

2GB M402TQHFL-xx000-D

4GB M404TQJGR-xx000-D

8GB M408TQJGR-xx000-D

16GB M416TNKGR-xx000-D

32GB M432TNJGR-xx000-D
NOTES:
1. “xx” in part number is determined by connector selection and fixed vs. removable
configuration. See Section 2.4 for available options.
2. For optional Acrylic conformal coating (contact Delkin for additional cost and MOQ) to
protect the devices from moisture and contaminants, replace the 000 in the part number
with 050.
3. Customized parts will have a special code in place of the 000 to indicate the customer-
specific features or attributes of the part.
4. Contact Delkin for information on a Security version of this product, with zone locking &
encryption capabilities via an API or direct commands. NDA required.

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

2.4. Connector & Configuration Options

Table 2-3 Connector & Fixed/Removable Options

Code Pitch Total Height* Orientation Fixed / Removable Connector Mfr / Part #
RA 0.100” 9.77mm Right Angle Removable Sullins NPPC052KFMS-RC

R1 0.100” 5.93mm Right Angle Removable Samtec HLE-105-02-G-DV

R2 2mm 6.97mm Right Angle Removable Samtec MMS-105-02-L-DV

R3 2mm 4.53mm Right Angle Removable Samtec CLT-105-02-G-D

R4 0.100” 5.93mm Right Angle Fixed Disk Samtec HLE-105-02-G-DV

R5 2mm 6.97mm Right Angle Fixed Disk Samtec MMS-105-02-L-DV

R6 2mm 4.53mm Right Angle Fixed Disk Samtec CLT-105-02-G-D

R7 0.100” 9.77mm Right Angle Fixed Disk Sullins NPPC052KFMS-RC

Removable
R8 0.100” 9.77mm Right Angle Sullins NPPC052KFMS-RC
No keying plug at Pin 9
Removable
RL 0.100” 5.93mm Right Angle External LED Samtec HLE-105-02-G-DV
configuration
ST 2mm 6.46mm Straight Removable Samtec MMS-105-02-L-DH

SF 2mm 6.46mm Straight Fixed Disk Samtec MMS-105-02-L-DH

*Total Height is referenced as Dimension X on the mechanical drawing in Section 7.2

Note: All connectors have keying plug at Pin 9, except R8 as noted.

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

3. Environmental Specifications
3.1. Environmental Conditions

3.1.1. Temperature and Humidity

⚫ Temperature:
▪ Storage: -50°C to +100°C
▪ Operational: -40°C to +85°C

⚫ Humidity:
▪ RH 10 - 95% under 55°C

3.1.2. Shock & Vibration

⚫ Shock Specification
▪ 12G Sawtooth pulse, 11 ms duration, 3 axes

⚫ Vibration Specification
▪ Sine Vibration: 10Hz ~2000Hz, 16.3 G peak to peak, 3 axes
▪ Random Vibration: 10Hz ~2000Hz, 1.49 GRMS, 3 axes

3.2. MTBF
MTBF, an acronym for Mean Time Between Failures, is a measure of a device’s reliability. Its value
represents the average time between a repair and the next failure. The measure is typically in units of

hours. The higher the MTBF value, the higher the reliability of the device. The predicted result of

Delkin’s eUSB SSD is more than 2,000,000 hours for 0°C to 25°C operation.

3.3. Certification & Compliance

⚫ RoHS
⚫ USB 3.1

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

4.Endurance & Data Retention

Attribute Value

Raw Flash Program/Erase Rating 60,000 cycles

Contact Delkin for TBW and life estimate based on

TBW
your specific application / workload
10 years when P/E cycles < 10% of rated cycling
Data Retention
1 year when P/E cycles at 100% of rated cycling

5. Electrical Specifications
5.1. Supply Voltage
Table 5-1 Supply Voltage
Parameter Rating
Operating Voltage 5V ± 10%

5.2. Power Consumption

Table 5-2 Power Consumption
Capacity Read (max) Write (max) Idle (max)
1GB TBD TBD TBD
2GB TBD TBD TBD
4GB 75 75 35
8GB 125 120 45
16GB 130 155 45
32GB 145 175 45
Unit: mA
NOTES:
1. The measured input power voltage is 5V.
2. Power Consumption may vary according to flash configuration, host platform and other factors.

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

6.Interface
6.1. Pin Assignment and Descriptions

Table 6-1 Pin Assignment and Description for eUSB

Pin Number eUSB Pin Description

1 VCC 5.0V USB Bus Power Input
2 SSRX+ Superspeed Receiver
3 DM USB 2.0 data in negative pin terminal
4 SSRX- Superspeed Receiver
5 DP USB 2.0 data in positive pin terminal
6 SSTX+ Superspeed Transmitter
7 GND 0V regulator ground reference input
8 SSTX- Superspeed Transmitter
9 NC Not Connected – Keying Plug (except R8 connector option)
10 Option Optional External LED Connection (contact Delkin)

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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

7. Physical Attributes
7.1. Mechanical Form Factor

Table 7-1 eUSB Mechanical Form Factor Attributes

Dimension Value
Length 36.9mm ± 0.5mm

Width 26.6mm ± 0.5mm

Thickness Varies with Connector

Center of Mounting Hole to
27.5mm ± 0.5mm
Centerline of Connector
Mass 10 g (0.35 oz) maximum

7.2. Mechanical Dimensions

All dimensions in mm. Tolerance on all dimensions ± 0.5mm.

Connector Code Total Height (Dimension X)

RA, R7, R8 9.77mm
R1, R4, RL 5.93mm
R2, R5 6.97mm
R3, R6 4.53mm
ST, SF 6.46mm
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E300 Series Industrial eUSB Module 401-0451-00 Rev. D

8. ATA Pass Through, IDENTIFY DEVICE & SMART

8.1. Supported Commands in ATA Pass Through
The following table lists the ATA commands that are supported by the eUSB firmware in the ATA
Pass-Through(12) and ATA Pass-Through(16) commands.

No. Comand Name Code FR SC SN CY DR HD LBA

1 Identify Device ECh -- -- -- -- Y -- --
2 SMART B0h Y -- -- Y Y -- --

Notes: FR: Feature Register

SC: Sector Count register
SN: Sector Number register
CY: Cylinder Low/High register
DR: Drive bit of Drive/Head Register
HD: Head No. (0 to 15) of Drive/Head Register
Y: Used for the command
-- : Not used for the command

8.2. ATA Identify Device Information

The following table lists the information returned by the Identify Device ATA Passthrough command.

Word Default Total

Data Field Type Information
Address Value Bytes
0 0040h 2 General configuration bit significant information
1-4 0000h 8 Reserved
5 0200h 2 Number of unformatted bytes per sector
6-9 0000h 8 Reserved
10-19 XXXXh 20 Serial number (20 ASCII characters)
20 0002h 2 Buffer type (dual-ported multi-sector)
21 0001h 2 Buffer size in 512 byte increments
22 0004h 2 Number of ECC bytes passed on Read/Write Long Commands
23-26 XXXXh 8 Firmware revision (8 ASCII characters)
27-46 XXXXh 40 Model number (40 ASCII characters)
47 8001h 2 Maximum 1 sector on Read/Write Multiple command
48 0000h 2 Double Word not Supported
49 0F00h 2 Capabilities: DMA, LBA, IORDY supported
50 4001h 2 Capabilities: device specific standby timer minimum
51 0200h 2 PIO data transfer cycle timing mode 2
52 0000h 2 DMA data transfer cycle timing mode not supported
53 0007h 2 Data Fields 64 to 70 and 88 are valid
54 - 58 0000h 10 Reserved
59 0101h 2 Multiple sector setting is valid
60-61 XXXXh 4 Total number of sectors addressable in LBA Mode
62 0000h 2 Single Word DMA transfer not implemented
63 0007h 2 Multiword DMA transfer mode, modes 0 to 2 supported

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Word Default Total

Data Field Type Information
Address Value Bytes
64 0003h 2 Advanced PIO modes: modes 3 and 4 supported
65 0078h 2 Minimum Multiword DMA cycle time.
66 0078h 2 Recommended Multiword DMA cycle time.
67 0078h 2 Minimum PIO transfer cycle time without flow control
68 0078h 2 Minimum PIO transfer cycle time with flow control
69-79 0000h 22 Reserved
80 01E0h 2 Major version number, ATA-5 to ATA-8 support
81 FFFFh 2 Minor version number, not reported
82 0001h 2 Command set: SMART features set
83 4000h 2 Command set: none
84 4000h 2 Command set/feature supported extension: none
85 00Xh 2 Command set enabled: SMART feature set enabled/disabled
86 0000h 2 Command set enabled: none
87 4000h 2 Command set/feature default
UDMA modes 0 to 6 supported
Selected UDMA speed depends on USB speed:
88 043Fh 2 SuperSpeed = UDMA6
HighSpeed = UDMA4
FullSpeed = UDMA1
89 – 118 0000h 60 Reserved
119 4000h 2 Command set/feature set supported extension: none
120 4000h 2 Command set/feature set enabled extension: none
121-129 0000h 18 Reserved
130-133 XXXXh 8 Firmware date string
134-135 0000h 4 Reserved
136-141 XXXXh 12 Firmware file name
142-147 XXXXh 12 Preformat file name
148-153 XXXXh 12 Anchor program file name
154-155 XXXXh 4 Firmware minor revision number
156-221 0000h 132 Reserved
222 1001h 2 Transport major version: Serial transport
223 FFFFh 2 Transport minor version: not reported
224-254 0000h 62 Reserved
255 XXA5h 2 Integrity Word

Words 60, 61, 85, 88 first byte, 130 – 135, 154, 155 and 255 are determined by the running firmware, all other
words are configured in the preformat by the preformat host tool (hsfmt.)

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8.3. ATA SMART Functionality

The ATA Pass Through module of the Delkin eUSB firmware supports the following ATA
SMART commands, determined by the Feature Register value.

Value Command
D0h Read Data
D1h Read Attribute Thresholds
D8h Enable SMART Operations
D9h Disable SMART Operations
DAh Return Status

SMART commands with Feature Register values not mentioned in the above table are not supported and will be aborted.

8.3.1. SMART Enable Operations

COMMAND CODE: B0h with a Feature Register value of D8h

PROTOCOL: Non-data

INPUTS:

Register 7 6 5 4 3 2 1 0
Features D8h
Sector Count
Sector Number
Cylinder Low 4Fh
Cylinder High C2h
Device/Head 1 1 1 0
Command B0h

NORMAL OUTPUTS: None required.

ERROR OUTPUTS: Aborted if the signature in the Cylinder registers is invalid.

DESCRIPTION: This command enables access to the SMART capabilities of the

eUSB controller firmware. The state of SMART (enabled or disabled)
is preserved across power cycles.

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8.3.2. SMART Disable Operations

COMMAND CODE: B0h with a Feature Register value of D9h

PROTOCOL: 5Ah

INPUTS:

Register 7 6 5 4 3 2 1 0
Features D9h
Sector Count
Sector Number
Cylinder Low 4Fh
Cylinder High C2h
Device/Head 1 1 1 0
Command B0h

NORMAL OUTPUTS: None required.

ERROR OUTPUTS: Aborted if either the signature in the Cylinder registers is invalid or if
SMART is not enabled.

DESCRIPTION: This command disables access to the SMART capabilities of the

eUSB controller firmware. The state of SMART (enabled or disabled)
is preserved across power cycles.

8.3.3. SMART Read Data

COMMAND CODE: B0h with a Feature Register value of D0h

PROTOCOL: PIO data in.

INPUTS:

Register 7 6 5 4 3 2 1 0
Features D0h
Sector Count
Sector Number
Cylinder Low 4Fh
Cylinder High C2h
Device/Head 1 1 1 0
Command B0h

NORMAL OUTPUTS: None required.

ERROR OUTPUTS: Aborted if the signature in the Cylinder registers is invalid or if SMART
is not enabled.

DESCRIPTION: This command returns one sector of SMART data. The data structure
returned is shown in Section 3.4.

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8.3.4. SMART Data Structure

The following 512 bytes make up the device SMART data structure. Users can obtain the data
using the “SMART Read Data” command (D0h.)

Byte F/V Description

0–1 0010h SMART structure version
2 – 361 Attribute entries 1 to 30 (12 bytes each)
362 00h Off-line data collection status (no off-line data collection)
363 00h Self-test execution status byte (self-test completed)
364 – 365 0000h Total time in seconds to complete off-line data collection activity
366 00h --
367 00h Off-line data collection capability (no off-line data collection)
368 – 369 0003h SMART capability
370 00h Error logging capability (no error logging)
371 00h --
372 00h Short self-test routine recommended polling time (in minutes)
373 00h Extended self-test routine recommended polling time (in minutes)
374 – 385 00h Reserved
386 – 387 0042h SMART Structure Version
388 – 391 Firmware “Commit” Counter
392 - 395 Firmware Wear Level Threshold
396 01h Global Wear Leveling Active
397 01h Global Bad Block Management active
398 – 401 Average Flash Block Erase Count
402 – 405 Number of Flash Blocks involved in Wear Leveling
406 – 409 Number of total ECC errors during firmware initialization
410 – 413 Number of correctable ECC errors during firmware initialization
414 - 510 00h -
511 Data structure checksum

The attributes that are defined for the eUSB firmware return their data in the attribute section of
the SMART data, using a 12 byte data field.

The field at offset 386 gives a version number for the contents of the SMART data structure.
For the controller in the Delkin eUSB, only version 4 is defined.

The byte at offset 396 is fixed to 1 for page-based firmware. All chips within an interleaved
channel are used for wear leveling.

The byte at offset 397 is fixed to 1 for page-based firmware. Bad block management is always
done within all chips of an interleaved channel.

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8.3.5. Spare Block Count Attribute

This attribute gives information about the amount of available spare blocks.

Offset Value Description

0 196 Attribute ID – Reallocation Count
1–2 0003h Flags – Pre-fail type, attribute value is updated during normal operation
3 Attribute value. The value returned here is the percentage of remaining
spare blocks summed over all flash chips, i.e. (100 x current spare
blocks / initial spare blocks)
4 Attribute value (worst value)
5–7 Sum of the initial number of spare blocks for all flash chips
8 – 10 Sum of the current number of spare blocks for all flash chips
11 00h Reserved

This attribute is used for the SMART Return Status command. If the attribute value field
is less than the spare block threshold (currently fixed at 10), the SMART Return Status
command will indicate a threshold exceeded condition.

8.3.6. Spare Block Count Worst Chip Attribute Threshold

This attribute gives information about the amount of available spare blocks on the
interleave channel that has the lowest current number of spare blocks.

Offset Value Description

0 213 Attribute ID – Spare Block Count Worst Channel (vendor specific)
1–2 0003h Flags – Pre-fail type, attribute value is updated during normal operation
3 Attribute value. The value returned here is from all interleaved channels
the worst percentage of remaining spare blocks i.e. (100 * current spare
blocks / initial spare blocks).
4 Attribute value (worst value)
5–7 Initial number of spare blocks of the interleave channel with the lowest
current number of spare blocks
8 – 10 Current number of spare blocks of the interleave channel with the lowest
current number of spare blocks
11 00h Reserved

8.3.7. Erase Count Attribute

This attribute gives information about the amount of flash block erases that have been
performed.

Offset Value Description

0 229 Attribute ID – Erase Count Usage (vendor specific)
1–2 000Xh Flags – Pre-fail or Advisory type, attribute value is updated during normal
operation
3 Attribute value. The value returned here is an estimation of the
remaining card life, in percent, based on the number of flash block
erases compared to the target number of erase cycles per block.
4 Attribute value (worst value)
5 – 10 Estimated total number of block erases.
11 00h Reserved

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This attribute is used for the SMART Return Status command. If the attribute value field
is less than the erase count threshold (currently fixed at 10), the SMART Return Status
command will indicate a threshold exceeded condition.
The target number of erase cycles per flash block is taken from the
MaxBlockEraseCount column in the Device Description file.

8.3.8. Total ECC Errors Attribute

This attribute gives information about the total number of ECC errors that have occurred
on flash read commands during firmware runtime. This attribute is not used for the
SMART Return Status command.

Offset Value Description

0 203 Attribute ID – Number of ECC Errors
1–2 0002h Flags – Advisory type, attribute value is updated during normal operation
3 64h Attribute value. This value is fixed at 100.
4 64h Attribute value (worst value)
5–8 Total number of ECC errors (correctable and uncorrectable)
9 – 10 ---
11 00h Reserved

8.3.9. Correctable ECC Errors Attribute

This attribute gives information about the total number of correctable ECC errors that
have occurred on flash read commands during firmware runtime. This attribute is not
used for the SMART Return Status command.

Offset Value Description

0 204 Attribute ID – Number of corrected ECC Errors
1–2 0002h Flags – Advisory type, attribute value is updated during normal operation
3 64h Attribute value. This value is fixed at 100.
4 64h Attribute value (worst value)
5–8 Total number of correctable ECC errors
9 – 10 ---
11 00h Reserved

8.3.10. Total Number of Reads Attribute

This attribute gives information about the total number of flash read commands. This can
be useful for interpretation of the number of correctable or total ECC errors. This
attribute is not used for the SMART Return Status command.

Offset Value Description

0 232 Attribute ID – Number of Reads (vendor specific)
1–2 0002h Flags – Advisory type, attribute value is updated during normal operation
3 64h Attribute value. This value is fixed at 100.
4 64h Attribute value (worst value)
5 - 10 Total number of flash read commands
11 00h Reserved

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8.3.11. Power On Count Attribute

Offset Value Description
0 12 Attribute ID – Power On Count (vendor specific)
1–2 0002h Flags – Advisory type, attribute value is updated during normal operation
3 64h Attribute value. This value is fixed at 100.
4 64h Attribute value (worst value)
5-8 Number of Power On cycles
9 – 10 ---
11 00h Reserved

8.3.12. Total LBAs Written Attribute

This attribute gives the total amount of data written to the disk, in units of 32MB (65536
sectors.) This number can be converted to Terabytes Written (TBW) by dividing the raw
attribute value by 215.

Offset Value Description

0 241 Attribute ID – Total LBAs Written (vendor specific)
1–2 0002h Flags – Advisory type, attribute value is updated during normal operation
3 64h Attribute value. This value is fixed at 100.
4 64h Attribute value (worst value)
5 - 10 Total number of LBAs written to the disk, divided by 65536
11 00h Reserved

8.3.13. Total LBAs Read Attribute

This attribute gives the total amount of data read from the disk, in units of 32MB (65536
sectors.) This number can be converted to Terabytes read by dividing the raw attribute
value by 215.

Offset Value Description

0 241 Attribute ID – Total LBAs Read (vendor specific)
1–2 0002h Flags – Advisory type, attribute value is updated during normal operation
3 64h Attribute value. This value is fixed at 100.
4 64h Attribute value (worst value)
5 - 10 Total number of LBAs read from the disk, divided by 65536
11 00h Reserved

8.3.14. Anchor Block Status Attribute

This attribute reports how many times the Anchor block of the card has been re-written,
either by the Anchor block repair routine, or by a firmware update.

Offset Value Description

0 214 Attribute ID – Anchor Block Status (vendor specific)
1–2 0002h Flags – Advisory type, attribute value is updated during normal operation
3 64h Attribute value. This value is fixed at 100.
4 64h Attribute value (worst value)
5–8 Anchor Block Write Count
9 – 10 ---
11 00h Reserved

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8.3.15. Trim Status Attribute

This attribute gives percent ratio for the disk space that is currently in the trimmed state.

Offset Value Description

0 215 Attribute ID – Trim Status (vendor specific)
1–2 0002h Flags – Advisory type, attribute value is updated during normal operation
3 Attribute value.
4 Attribute value (worst value)
5 - 10 ---
11 00h Reserved

8.3.16. SMART Read Attribute Thresholds

COMMAND CODE: B0h with a Feature Register value of D1h

PROTOCOL: PIO data in.

INPUTS:

Register 7 6 5 4 3 2 1 0
Features D1h
Sector Count
Sector Number
Cylinder Low 4Fh
Cylinder High C2h
Device/Head 1 1 1 0
Command B0h

NORMAL OUTPUTS: None required.

ERROR OUTPUTS: Aborted if the signature in the Cylinder registers is invalid or if SMART
is not enabled.

DESCRIPTION: This command returns one sector of SMART attribute thresholds.

The data structure returned is:

Offset Value Description

0-1 001h SMART structure version
2 – 361 Attribute threshold entries 1 to 30 (12 bytes each)
362 – 379 00h Reserved
380 – 510 00h ---
511 Data structure checksum

8.3.17. Spare Block Count Attribute Threshold

Offset Value Description
0 196 Attribute ID – Reallocation Count
1 0Ah Spare Block Count Threshold, fixed at 10
2 - 11 00h Reserved

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8.3.18. Spare Block Count Worst Channel Attribute Threshold

Offset Value Description
0 213 Attribute ID – Spare Block Count Worst Channel (vendor specific)
1 0Ah Spare Block Count Worst Channel Threshold, fixed at 10
2 - 11 00h Reserved

8.3.19. Erase Count Attribute Threshold

Offset Value Description
0 229 Attribute ID – Erase Count Usage (vendor specific)
1 0Ah Erase Count Threshold, fixed at 10
2 - 11 00h Reserved

8.3.20. Total ECC Errors Attribute Threshold

Offset Value Description
0 203 Attribute ID – Number of ECC errors
1 00h No threshold for the Total ECC Errors Attribute
2 - 11 00h Reserved

8.3.21. Correctable ECC Errors Attribute Threshold

Offset Value Description
0 204 Attribute ID – Number of corrected ECC errors
1 00h No threshold for the Correctable ECC Errors Attribute
2 - 11 00h Reserved

8.3.22. UDMA CRC Errors Attribute Threshold

Offset Value Description
0 199 Attribute ID –UDMA CRC error rate
1 00h No threshold for the UDMA CRC Errors Attribute
2 - 11 00h Reserved

8.3.23. Total Number of Reads Attribute Threshold

Offset Value Description
0 232 Attribute ID – Number of Reads (vendor specific)
1 00h No threshold for the Total Number of Reads Attribute
2 - 11 00h Reserved

8.3.24. Power On Count Attribute Threshold

Offset Value Description
0 12 Attribute ID – Power On Count
1 00h No threshold for the Power On Count Attribute
2 - 11 00h Reserved

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8.3.25. Total LBAs Written Attribute Threshold

Offset Value Description
0 241 Attribute ID –Total LBAs Written (vendor specific)
1 00h No threshold for the Total LBAs Written Attribute
2 - 11 00h Reserved

8.3.26. Total LBAs Read Attribute Threshold

Offset Value Description
0 242 Attribute ID – Total LBAs Read (vendor specific)
1 00h No threshold for the Total LBAs Read Attribute
2 - 11 00h Reserved

8.3.27. Anchor Block Status Attribute Threshold

Offset Value Description
0 214 Attribute ID – Anchor Block Status (vendor specific)
1 00h No threshold for the Anchor Block Status Attribute
2 - 11 00h Reserved

8.3.28. Trim Status Attribute Threshold

Offset Value Description
0 215 Attribute ID – Trim Status (vendor specific)
1 00h No threshold for the Trim Status Attribute
2 - 11 00h Reserved

8.3.29. SMART Return Status

COMMAND CODE: B0h with a Feature Register value of DAh

PROTOCOL: Non-data

INPUTS:

Register 7 6 5 4 3 2 1 0
Features DAh
Sector Count
Sector Number
Cylinder Low 4Fh
Cylinder High C2h
Device/Head 1 1 1 0
Command B0h

NORMAL OUTPUTS: Returns a status indication as described below.

ERROR OUTPUTS: Aborted if the signature in the Cylinder registers is invalid or if SMART
is not enabled.

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DESCRIPTION: This command checks the device reliability status. If a threshold

exceeded condition exists for either the Spare Block Count Worst
Channel attribute or the Erase Count attribute, the device will set the
Cylinder Low register to F4h and the Cylinder High register to 2Ch. If
no threshold exceeded condition exists, the device will set the
Cylinder Low register to 4Fh and the Cylinder High register to C2h.

WARNING: This product may contain chemicals known to the State of California to cause cancer, birth
defects, or other reproductive harm. For more information go to www.p65warnings.ca.gov.

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