(Permanently Affiliated to University of Mumbai)

Department of Electronics and Telecommunication Engineering

Mumbai University
Academic Year-2024-25.

Mini Project Title: DIGITAL IC TESTER

ROLL NO: NAME OF

STUDENT:
411 Atharva Bhopalbade
413 Abhishek Bochare
414 Rahul Bomble

419 Vedant Chavan

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 (Permanently Affiliated to University of Mumbai)

Department of Electronics and Telecommunication Engineering

Name of Guide: DR. SHRIPAD KULKARNI

TABLE OF CONTENTS

SR.NO TITLE PAGE NO.

1
Introduction 3-3
2
Background and Problem Statement 4-5
3
Literature Survey 6-7

4
Circuit Design Simplification, Working 9-12
and Applications
5
Algorithm Design and analysis 13-15
6
Testing and Results 16-18
7
Conclusion 19-19
8
Reference (IEEE Style) 20-20
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Department of Electronics and Telecommunication Engineering

INRODUCTION: -

The digital IC tester is a pivotal instrument in the field of electronics, designed to assess the
operational integrity of digital integrated circuits (ICs). As electronic devices become
increasingly complex, ensuring that each component functions correctly is vital for the overall
reliability and performance of the system. This tester evaluates various parameters, including
logic levels, input/output response, and timing characteristics, to determine if the IC operates
within its specified limits.
Key Points:
Purpose: The primary function of a digital IC tester is to verify that digital ICs perform their
intended functions accurately. It helps in identifying faulty components before they are integrated
into larger systems.
Importance: By ensuring the reliability of digital circuits, the tester reduces the risk of
circuit failures, enhances repair efficiency, and supports the development of robust electronic
systems. It is especially crucial in industries where safety and performance are paramount,
such as automotive, aerospace, and medical devices.

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A) Background Information: -

The electronics industry has undergone rapid evolution, with integrated circuits playing a
central role in modern technology. Digital ICs are ubiquitous in devices ranging from
smartphones and computers to industrial machinery and consumer electronics. However,
testing these circuits presents several challenges:
Complexity of Circuits: Modern electronic systems often contain multiple ICs working together.
Isolating and identifying faults without specialized tools can be difficult, leading to prolonged
troubleshooting times.
Time Constraints: Engineers and technicians frequently operate under tight deadlines.
Efficient testing methods are essential to maintain project timelines and ensure timely
delivery of products.
Diversity of IC Types: Different logic families (e.g., TTL, CMOS) require distinct testing
approaches. This diversity complicates the testing process, as technicians may need multiple tools
to accommodate various IC types.

B) Problem Statement: -

Existing low-cost IC testers lack scalability, speed, and versatility. Key technical challenges
include:
I/O Limitations: The Arduino Nano’s 22 I/O pins restrict direct testing of ICs with >22 pins (e.g.,
40-pin ZIF socket requires multiplexing).
Voltage Stability: Ensuring stable 5V supply for ICs using the L7805 regulator under varying
loads.
Test Vector Storage: Efficiently storing and retrieving test patterns for diverse IC families (e.g.,
74-series, shift registers) in the AT24C512B EEPROM.
Speed Constraints: Arduino’s ~16 MHz clock limits testing of high-speed ICs (e.g., 74AC series).

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Department of Electronics and Telecommunication Engineering

C) Objective: -
The primary objective of this project is to design and implement a low-cost, Arduino Nano-based
digital IC tester capable of verifying the functionality of common 5V logic ICs (e.g., 74-series,
shift registers) for educational, hobbyist, and repair applications. Specific goals include:

Cost-Effective Design: Develop a system with a total Bill of Materials (BOM) cost under 1000,
making it accessible to hobbyists and educators. Hardware Limitations Mitigation: Overcome the
Arduino Nano’s limited I/O pins (22 total) through strategic multiplexing and signal routing to
support a 40-pin ZIF socket.

Ensure stable 5V power delivery using the L7805 voltage regulator, even under dynamic loads (up
to 500 mA).

Modular Test Pattern Storage: Utilize the AT24C512B EEPROM to store and retrieve test
vectors for multiple IC families, enabling easy expansion of supported devices via I2C.

User-Friendly Operation: Implement an intuitive interface using a 16x2 LCD and push button
for IC selection, test execution, and result display (PASS/FAIL).

Functional Validation: Verify the accuracy of the tester using exhaustive test vectors (e.g., all
input combinations for logic gates) and benchmark its performance against commercial tools.

Scalability and Future-Proofing: Design a modular architecture to allow upgrades, such as

adding multiplexers (e.g., CD4051) for larger ICs or adjustable voltage regulators (e.g., LM317)
for 3.3V compatibility.

Educational and Practical Utility:

Enable users to test salvaged ICs, diagnose faults in DIY projects, and teach digital logic principles
in classroom settings.

By achieving these objectives, the project bridges the gap between high-cost commercial testers
and rudimentary DIY solutions, democratizing access to reliable IC validation tools.

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II) Literature Survey: -

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III) Circuit diagram , Components and working operation: -

A) Circuit Diagram: -

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B) Main Components and their Specification: -

HARDWARE COMPONENTS:
16x2 LCD:
Type: Character LCD, capable of displaying 16 characters per line across 2 lines.
Voltage Rating: Operates at 5V, compatible with the Arduino Nano.
Interface: Uses the I2C interface for communication, allowing for fewer connections and easier
wiring.
I2C Module:
Protocol: I2C (Inter-Integrated Circuit), enabling multiple devices to communicate over two
wires.
Voltage Compatibility: Typically operates at 5V, making it suitable for use with the Arduino.
Arduino Nano:
Microcontroller: ATmega328P, a powerful and versatile chip for embedded applications.
Operating Voltage: 5V, with a recommended input voltage of 7-12V.
Memory: 32 KB of Flash memory, 2 KB of SRAM, and 1 KB of EEPROM for data storage.
Digital I/O Pins: 14 digital pins, of which 6 can be used for PWM output
Push Button:
Type: Tactile switch that provides a simple means for user interaction. Functionality: When
pressed, it completes a circuit that signals the Arduino to start testing.
L7805CV Voltage Regulator:
Input Voltage Range: Accepts input voltages from 7V to 35V.
Output Voltage: Regulates output to a consistent 5V.
Current Rating: Capable of supplying up to 1A, sufficient for powering the Arduino and other
components.
24LC512 EEPROM IC:
Storage Capacity: 512 Kbit (64 KB), allowing for the storage of multiple test results. Interface:
I2C, which simplifies connections and allows multiple devices to share the same bus.
Voltage Range: Operates between 1.8V and 5.5V, making it versatile for various
applications.

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Department of Electronics and Telecommunication Engineering

680 Ohm Resistors:

Functionality: Used for current limiting, protecting components from excessive
current.
Power Rating: Typically rated at 1/4W, suitable for most applications in this circuit.
PCB Board:
Type: Custom-designed PCB tailored for the specific layout of the tester. Functionality: Provides
a stable platform for mounting components and ensures reliable electrical connections.
40 Pin Zip Socket:
Functionality: Allows for easy insertion and removal of ICs, facilitating quick testing
and replacement.
Design: Ensures proper alignment and contact with the IC pins.

SOFTWARE COMPONENTS:

Arduino Software IDE

Description: The Arduino Integrated Development Environment (IDE) is a platform for writing,
compiling, and uploading code to Arduino boards
LCD Display Program
Description: Software that controls the LCD (Liquid Crystal Display) to present test
results and user interfaces.
Testing Libraries
Description: Libraries specifically designed for testing various digital Ics.
Data Logging Software
Description: Software that records test results for later analysis.
Communication Protocols
Description: Software components that enable communication between the tester
and external devices.
User Interface (UI) Code
Description: Code that creates an intuitive interface for users to interact with the tester.

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C) Working Operation: -
Digital IC Tester is designed to check the functionality of different ICs (like logic gates,
counters, etc.).
Here’s a simple step-by-step explanation of how your project works:

1.Powering the Circuit

•The battery provides power to the circuit.
•The voltage regulator ensures a stable 5V supply for all components, including the Arduino
Nano, LCD, and IC under test.

2. Selecting and Inserting an IC

•The user places the IC to be tested into the ZIP IC socket.
•The Arduino Nano reads the IC type from the EEPROM (AT24C512), which stores a database
of test patterns for different ICs.

3. Sending Test Signals to the IC

•The Arduino sends logic HIGH (1) and LOW (0) signals to the input pins of the IC under test.
•The IC processes these inputs and produces outputs based on its internal logic.

4. Reading the IC’s Response

•The Arduino reads the output pins of the IC.
•It compares the actual output with the expected output stored in the EEPROM.

5. Displaying the Results

•If the outputs match the expected values, the LCD shows “IC OK” (meaning the IC is
functional).
•If there’s a mismatch, the LCD shows “IC FAIL” (indicating a faulty IC).

6. User Interaction
•The user presses a button (S1) to start the test.
•The LCD updates with the IC test results.
•The user can then remove the tested IC and insert a new one.

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IV) Application, Advantages and Disadvantages: -

A) Application: -
The Arduino-based digital IC tester is designed for versatile, real-world
scenarios where quick and reliable validation of integrated circuits is critical.
Below is a detailed breakdown of its applications, supported by specific use cases
and examples:

1. Educational Laboratories
Use Case: Teaching digital electronics fundamentals by validating logic gates, flip-
flops, and combinational circuits.
Examples:
 Logic Gate Validation: Students test 74HC00 (NAND) or 74LS08 (AND) ICs by
applying all input combinations (00, 01, 10, 11) and verifying outputs against truth
tables.
 Sequential Circuit Analysis: Testing 74HC595 shift registers or 74LS373 latches
to demonstrate data storage/transmission.
 Fault Diagnosis Labs: Intentionally inserting faulty ICs (e.g., shorted outputs) to
teach troubleshooting techniques.
Benefits:
 Reinforces theoretical concepts through hands-on experimentation.
 Reduces lab costs compared to commercial testers.
 Compatible with existing Arduino-based curricula.

2. Hobbyist and DIY Electronics

Use Case: Verifying salvaged or third-party ICs for reuse in personal projects.
Examples:
 Retro Gaming Mods: Testing 74-series logic ICs (e.g., 74LS139 decoders) for
repairing or modifying vintage consoles like the Nintendo Entertainment System
(NES).
 Custom PCB Prototyping: Validating newly assembled circuits (e.g., LED
drivers, motor controllers) before deployment.
 Arduino/Raspberry Pi Add-Ons: Ensuring ICs like 74HC595 (shift register) or
ULN2003 (Darlington array) function correctly in custom expansions.

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 Benefits:
 Prevents project failures due to defective or counterfeit ICs.
 Enables reuse of recycled components, reducing e-waste.
 Cost-effective for budget-constrained makers.

3. Small-Scale Electronics Repair

Use Case: Diagnosing faulty ICs in consumer electronics or appliances.
Examples:
 Home Appliance Repair: Testing timer ICs (e.g., NE555) in microwaves or
washing machines.
 Automotive Electronics: Validating logic ICs in car dashboard circuits or
infotainment systems.
 Gadget Restoration: Identifying damaged 74-series ICs in retro calculators or
synthesizers.
Benefits:
 Reduces reliance on costly replacement boards by pinpointing faulty ICs.
 Portable design allows on-site diagnostics (e.g., repair shops, fieldwork).

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B) Advantages : -
1. Ultra-Low Cost
- Built for under 1000, making it ideal for hobbyists, students, and small repair shops.

2. Easy to Use & Portable

- Simple push-button operation with a 16x2 LCD display.
- Compact and USB/battery-powered for on-the-go testing.

3. Expandable IC Support
- EEPROM stores test patterns* for multiple IC families (74HC, 74LS, etc.), with easy updates
via I2C.
- Can be upgraded with multiplexers for larger ICs (e.g., 40-pin).

4. Educational Value
- Teaches digital logic testing, Arduino programming, and fault diagnosis.
- Supports hands-on labs in schools and maker spaces.

5. Safe & Reliable Testing

- *680Ω resistors* protect ICs from overcurrent.
- *L7805 regulator* ensures stable 5V power delivery.

6. Open-Source & Customizable

- Arduino-compatible; users can modify code and add new test profiles.
- Community-driven improvements (e.g., GitHub libraries for rare ICs)

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Department of Electronics and Telecommunication Engineering

C) Disadvantages: -
Limited to Certain IC Types: Digital IC testers are often optimized for specific types
of ICs. They may struggle with analog ICs, complex microcontrollers, or devices with
non-standard pin configurations.

Complexity and Learning Curve: For beginners, understanding how to use a digital
IC tester can be challenging. Interpreting test results and setting up tests properly
requires a good grasp of electronics.

Cost: High-quality digital IC testers can be expensive, especially models that support
a wide range of ICs and advanced features.

Dependency on Software: Many testers rely on software for programming and

analyzing ICs. This can be a limitation if the software is buggy, outdated, or
incompatible with certain operating systems.

Accuracy Issues: Some testers may not provide accurate results for certain ICs,
particularly if the tester’s calibration is off or if the IC has subtle faults that are hard to
detect.

Limited Diagnostic Capabilities: While they can identify basic functional failures,
digital IC testers might not be able to pinpoint more complex issues like intermittent
faults or problems under specific conditions.

Physical Limitations: Some ICs with high pin counts or unusual packaging might be
difficult to test without specialized adapters or fixtures.

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v) Algorithm Design and Analysis: -

A) Algorithm Design: -
Algorithm Design
The algorithm for the digital IC tester can be broken down into the following steps:
Step 1: Initialize the System
Initialize the Arduino Nano, LCD, and I2C module.
Set up the pin configurations for the IC socket.
Step 2: Read IC Information
Read the IC's pin configuration and testing requirements from the EEPROM.
Store the information in a data structure for later use.
Step 3: Set up Testing Parameters
Set up the testing parameters, such as voltage and frequency, based on the IC's
requirements.
Use the stored information from Step 2 to determine the correct testing parameters.
Step 4: Test the IC
Apply the testing signals to the IC and measure the output.
Use the Arduino Nano's analog-to-digital converter (ADC) to measure the output
voltage.
Step 5: Display Results
Display the test results on the LCD.
Show the measured output voltage and any other relevant information.
Step 6: Store Results
Store the test results in the EEPROM for future reference.

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B) Algorithm Analysis: -
Time Complexity
The time complexity of the algorithm is O(n), where n is the number of ICs being
tested.
The algorithm iterates through each IC, reading its information, setting up testing
parameters, testing the IC, and displaying the results.
Space Complexity
The space complexity of the algorithm is O(n), where n is the number of ICs being
tested.
The algorithm stores the IC information, testing parameters, and test results in the
EEPROM.
Correctness
The algorithm is designed to correctly test the ICs and display the results.
The algorithm uses the stored information from the EEPROM to determine the correct
testing parameters and measure the output voltage.
Efficiency
The algorithm is efficient in terms of time and space complexity.
The algorithm uses a simple and straightforward approach to test the ICs and display
the results.

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VII) Testing and Results: -

1. Testing Procedure: -
Functional Testing
Functional testing involves verifying that a digital IC performs its intended functions. This
includes ¹:
Wafer Testing: Testing the entire wafer to identify defective chips early in production.
Diode and Transistor Tests: Verifying the correct positioning and functionality of these
components.
Parametric Testing: Checking voltage, current, and resistance levels to ensure they're within
the acceptable range.
Reliability Testing: Evaluating the IC's dependability over time.
Memory Testing: Examining the IC's memory components to ensure they're functioning
correctly.

2. Results: -
Test Results
The results of functional testing can vary depending on the specific IC and testing method. Some
common outcomes include ²:
Test Yield: The percentage of ICs that pass testing, which can range from 72.6% to 80% or higher.
Defect Level (DL): The number of defects per million ICs, which can impact the overall yield and
quality.
Test Time: The time it takes to complete testing, which can affect production efficiency and cost.

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VII)Conclusion: -
The proposed digital IC tester offers a low-cost, user-friendly, and efficient solution
for testing digital ICs. The system's advantages include its low cost, ease of use, and
efficiency. However, the system also has limitations, such as limited testing
capabilities and dependence on software. The algorithm design and analysis
demonstrate the system's functionality, and the testing and results section outline the
expected outcomes.
Digital IC testers play a crucial role in the electronics industry by enabling thorough
testing and validation of integrated circuits, contributing to the overall quality and
performance of electronic products.
This presentation provided an in-depth overview of the digital IC tester, including
its purpose, historical context, circuit design, components, and applications. The
tester's ability to streamline the testing process and enhance the reliability of
electronic systems makes it a critical tool in
modern electronics

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Department of Electronics and Telecommunication Engineering

VIII) Reference (IEEE Style): -

Here are some references in IEEE style:
References
[1] A. Nano, "Arduino Nano," Arduino, [Online]. Available: (link unavailable).
[Accessed: 10-Jan-2023].
[2] Atmel, "AT24C512B EEPROM Datasheet," Atmel, [Online]. Available: (link
unavailable). [Accessed: 15-Jan-2023].
[3] Texas Instruments, "L7805 Voltage Regulator Datasheet," Texas Instruments,
[Online]. Available: (link unavailable). [Accessed: 20-Jan-2023].
[4] Newhaven Display, "16x2 LCD Datasheet," Newhaven Display, [Online].
Available: (link unavailable). [Accessed: 25-Jan-2023].
[5] NXP, "I2C Module Datasheet," NXP, [Online]. Available: (link unavailable).
[Accessed: 30-Jan-2023].

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