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SPC_Notes_and_Formulas

Statistical Process Control (SPC) is a statistical method used to monitor and improve process quality by identifying variations. It includes control charts for different types of data, such as X and R charts for small samples, and p-charts for defective proportions. Process capability indices like Cp and Cpk are also calculated to assess process performance against specifications.

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18 views

SPC_Notes_and_Formulas

Statistical Process Control (SPC) is a statistical method used to monitor and improve process quality by identifying variations. It includes control charts for different types of data, such as X and R charts for small samples, and p-charts for defective proportions. Process capability indices like Cp and Cpk are also calculated to assess process performance against specifications.

Uploaded by

psychic_jason0071319
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Statistical Process Control (SPC) Notes & Formulas

1. Definition

Statistical Process Control (SPC) is a method of monitoring, controlling, and improving a process through statistical

analysis. It detects variations to maintain consistent quality.

2. Types of Variation

- Common Cause Variation: Natural, inherent in the process.

- Special Cause Variation: Due to identifiable external factors.

3. Control Charts

Control charts monitor process behavior over time with:

- Center Line (CL): Process average

- UCL: Upper Control Limit

- LCL: Lower Control Limit

4. X and R Chart (for small sample sizes 10)

X Chart:

CL = X (avg. of sample means)

UCL = X + A2 R

LCL = X - A2 R

R Chart:

CL = R (avg. of ranges)

UCL = D4 R

LCL = D3 R

5. X and S Chart (for sample size > 10)

S Chart:

CL = S

UCL = B4 S

LCL = B3 S
Statistical Process Control (SPC) Notes & Formulas

X Chart:

UCL = X + A3 S

LCL = X - A3 S

6. p-Chart (Proportion Defective)

CL = p = (p_i) / k

UCL = p + 3[p(1 - p)/n]

LCL = p - 3[p(1 - p)/n]

7. np-Chart (Number Defective)

CL = np = n p

UCL = np + 3[np(1 - p)]

LCL = np - 3[np(1 - p)]

8. c-Chart (Count of Defects)

CL = c

UCL = c + 3c

LCL = c - 3c

9. u-Chart (Defects per Unit)

CL = u = c_i / n_i

UCL = u + 3(u / n)

LCL = u - 3(u / n)

10. Process Capability Indices

Cp = (USL - LSL) / (6)

Cpk = min[(USL - ) / (3), ( - LSL) / (3)]

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