CIE S 025: Test Method for LED Lamps,

LED Luminaires and LED Modules

Tony Bergen
Secretary, Division 2, International Commission on Illumination (CIE)
Technical Director, Photometric Solutions International Pty Ltd
 Acknowledgement
2

 The contents of many of the slides in this presentation were

provided by Dr Yoshi Ohno, National Institute of Standards
and Technology (NIST), the US Department of Commerce

UNEP-lites.asia MVE webinar, 7 May 2015

 Outline
3

 Background and purpose of CIE S 025

 What measurements it covers
 Standard test conditions and tolerance interval
 Operating conditions for device under test
 Requirements for test equipment
 Reporting uncertainties of measurement

UNEP-lites.asia MVE webinar, 7 May 2015

 Outline
4

 Background and purpose of CIE S 025

 What measurements it covers
 Standard test conditions and tolerance interval
 Operating conditions for device under test
 Requirements for test equipment
 Reporting uncertainties of measurement

UNEP-lites.asia MVE webinar, 7 May 2015

 Importance of Quality Assurance of SSL
Products
5

Various Solid State Lighting (SSL) products are

introduced in many countries
Problems
• Some very low quality products in the market
(dim, short life, bad colour)
• Inaccurate performance claims
• Insufficient product information (label)

• Consumers’ disappointment
• Delay of adoption of SSL
Needs for good standards and regulations
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 Need for International Harmonisation in
SSL Testing and Accreditation: Historical
6

DOE new Energy

lighting Label Eco-
products design
regulations Chinese
regulations
JAPAN
Eco mark
Top Runner
EN Test Chinese CQC JIS Test
Method and GB stds Methods
LM-79
Manufacturers Manufacturers Manufacturers
Manufacturers & Testing labs & Testing labs & Testing labs
Test
& Testing labs
reports CNAS SSL IA-JAPAN SSL
Acc. Prog. for testing acc. testing acc.
NVLAP and other
SSL testing
SSL testing acc.
PT for PT for
PT by NIST PT for
Chinese T.M. JIS T.M.
for LM-79 EN T.M.

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 Needs for International Harmonisation in
SSL Testing and Accreditation: Now
7

DOE new Energy

lighting Label Eco-
products design
regulations Chinese
regulations
Eco
CIE S 025 mark

International International International

Test Method Test Method Test Method
International
Test Method

Manufacturers & Manufacturers & Manufacturers &

Manufacturers & Testing labs Testing labs Testing labs
Testing labs Mutual
recognition CNAS SSL IA-JAPAN SSL
Accreditation testing acc. testing acc.
NVLAP and other
SSL testing acc.
for SSL testing
PT for PT for
PT for Shared PT for
CIE S 025 CIE S 025
CIE S 025 CIE S 025

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8

CIE standard S 025 provides a unified

global test method for harmonisation of
testing of LEDs and SSL products

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 Who is the CIE??
9

 CIE is the International Commission on Illumination

(Commission Internationale de l'Eclairage)
 An independent, non-profit organisation recognised by the
ISO as an international standardisation body in the field of
light and lighting
 The CIE is about...
 LIGHT & VISION & COLOUR
 SCIENCE & STANDARDS
 KNOWLEDGE TRANSFER & QUALITY ASSURANCE
 The CIE has been working for over 100 years

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 CIE Technical Committee TC2-71
10

 CIE Division 2 deals with physical measurement of light and

radiation
 CIE TC2-71 CIE Standard on Test Methods for LED Lamps,
Luminaires and Modules
 Established in 2011
 Chair: Dr. Yoshi Ohno (NIST, USA)
 The TC has 37 members from 16 countries in 5 continents:
globally representative
 Standard was published in March 2015:
CIE S 025/E:2015 Test Method for LED Lamps, LED
Luminaires and LED Modules

UNEP-lites.asia MVE webinar, 7 May 2015

 CIE TC2-71 and CEN TC169 WG7
11

CIE TC2-71 CIE Standard on test methods for LED Lamps,

luminaires and modules
Chair, Yoshi Ohno (US)

Joint work with

CEN TC169 WG7 Photometry, Chair, Guy Vandermeersch (BE)

CIE S 025/E:2015 Test Method for LED Lamps, LED

Luminaires and LED Modules Published 2015.3.20

EN 13032 Lighting Applications — Measurement and Presentation of

Photometric Data of Lamps and Luminaires — Part 4: LED Lamps, Modules
and Luminaires In final approval process

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 CIE S 025 and LM-79
12

 IESNA LM-79-08 was one of the first test methods for SSL devices
 It became a default global test standard for SSL measurement
 However, LM-79 was developed by a regional organisation: many
national standards could not adopt this
 CIE S 025 draws on the experience of LM-79:
 it is more comprehensive; covers more measurement instruments; and
has greater depth
 S 025 development was globally representative
 S 025 was developed by CIE, a recognised international standards
organisation
 National and regional standardising bodies and regulators should
now move to adopting S 025 for LED measurement

UNEP-lites.asia MVE webinar, 7 May 2015

 Outline
13

 Background and purpose of CIE S 025

 What measurements it covers
 Standard test conditions and tolerance interval
 Operating conditions for device under test
 Requirements for test equipment
 Reporting uncertainties of measurement

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 What it Covers
14

 Products covered:
 LED lamps
 LED luminaires
 LED modules

 Products not covered:

 LED packages
 OLED products

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 Measurements it Covers
15

 Total luminous flux

 Partial luminous flux (useful lumens)
 Centre beam and beam angles
 Electrical measurements
 Luminous efficacy (efficiency)
 Luminous intensity distribution
 Chromaticity coordinates
 Correlated colour temperature
 Distance from Planckian locus
 Colour rendering indices
 Angular colour uniformity

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 What it Doesn’t Cover
16

 The Standard does not cover or only partially covers:

 Dimmable, internal feedback, adjustable colour, adjustable white, multicolour
 Maintained luminous flux
 Omni-directional assessment
 Maintained colour measurements
 Harmonics & EMC
 Start time / activation time
 Switch withstand
 Lamp Life
 Temperature cycling shock
 Endurance
 Photobiological hazards
 Flicker
 Dimmer compatibility
 Note: Many of these are already covered satisfactorily in other Standards

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 Outline
17

 Background and purpose of CIE S 025

 What measurements it covers
 Standard test conditions and tolerance interval
 Operating conditions for device under test
 Requirements for test equipment
 Reporting uncertainties of measurement

UNEP-lites.asia MVE webinar, 7 May 2015

 Standard test conditions and tolerance interval
18

4.1 General
4.1.1 Standard Test Conditions
Tolerance
interval
Measurements of the photometric, colorimetric
and electrical characteristics of a LED device
Set
shall be performed by means of appropriate
value
equipment and procedures under defined
standard test conditions for operation of the DUT
(Device Under Test). A standard test condition
includes a set value and a tolerance interval.
Measurement results are expressed for the set
value of the standard test conditions.

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 Standard Test Conditions
19

(For operation of DUT)

 Ambient temperature (LED lamps, luminaires)
25 °C ±1.2 °C
 Surface temperature (LED module) ±2.5 °C from
specified tp
 Air movement 0 to 0.25 m/s
 Test voltage ± 0.4 % from rated supply voltage

Set value ± tolerance interval

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 Need to Consider
20

 What is the uncertainty of your instrument (eg: thermometer,

anemometer)?
 How does the uncertainty affect the tolerance interval?

4.1.2 Tolerance Interval

The measurement uncertainty of the related parameter shall be taken
into account to ensure that the parameter is within the tolerance
interval. For this purpose, an acceptance interval is defined as the
tolerance interval reduced by the expanded uncertainty (95%
confidence) of the measurement of the parameter on both limits of the
tolerance.

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 Tolerance Interval and Acceptance Interval
21

Annex A
Tolerance Interval
“tolerance interval” defined in ISO/IEC Guide 98-4 Role of measurement
uncertainty in conformity assessment.
Tolerance interval is an acceptable range of the true value of the parameter (not
the range of readings of instrument). Therefore, to ensure this requirement is
fulfilled, measurement uncertainty of the parameter needs to be taken into
account.

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 Tolerance Interval and Acceptance Interval
22

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 Examples of Acceptance Intervals
23

(example values only)

Tolerance Instrument Acceptance
Interval uncertainty interval
(k=2)
Ambient temperature ± 1.2 oC 0.2 oC ± 1.0 oC
0.5 oC ± 0.7 oC
Surface temperature ± 2.5 oC 0.5 oC ± 2.0 oC
(LED module)
Air movement speed ± 0.25 m/s 0.05 m/s ± 0.20 m/s
Supply voltage (AC) ± 0.4 % 0.2 % ± 0.2 %
(DC) ± 0.2 % 0.1 % ± 0.1 %

• There are no requirements for the instrument uncertainties

• The larger the uncertainty, the smaller the acceptance interval

UNEP-lites.asia MVE webinar, 7 May 2015

 Tolerance Interval and Acceptance Interval
24

3.38
tolerance interval
interval of permissible values of a property
Note 1 to entry: Unless otherwise stated in a specification, the tolerance limits belong to the
tolerance interval.
Note 2 to entry: The term “tolerance interval“ as used in conformity assessment has a
different meaning from the same term as it is used in statistics.
[SOURCE: ISO/IEC Guide 98-4, 3.3.5]

3.39
acceptance interval
interval of permissible measured quantity values
Note 1 to entry: Unless otherwise stated in the specification, the acceptance limits belong to
the acceptance interval.
[SOURCE: ISO/IEC Guide 98-4, 3.3.9]

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 Outside the Tolerance Interval
25

4.1 General Measured

parameter
4.1.1 Standard Test Conditions
value

In case where some of the standard test conditions

Tolerance
or requirements cannot be fulfilled, deviations interval
outside the tolerance intervals or requirements are
permitted if the related measurements are Set
corrected to the standard test conditions. In such value
cases, the specific uncertainty component for the
corrected parameter shall be evaluated and
incorporated into the final uncertainty budget. The
actual measurement condition and the fact that
correction is made to the standard test condition for
the parameter shall be reported in the test report.

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 Correction to the Standard Condition
26

4.1 General Measured

parameter
4.1.1 Standard Test Conditions value

(Even if the tolerance is met) To further reduce Tolerance

the uncertainty of measurements, the results interval
may be corrected for the deviation within the
tolerance interval, to conditions at the set value Set
value
of the standard test condition. The set value is
normally the centre value of the tolerance
interval, though not always so.

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 Direct Correction of the Measurement Result
27

o
Example: In a goniophotometric measurement, room temperature = 27.3 C

Use a temperature controlled chamber and a luminance meter to make a

o
correction factor to correct the measured result to what it would be at 25.0 C

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 Correction Using Sensitivity Coefficient
28
1.05
Relative luminous flux

1.04
1.03
1.02 Sensitivity coefficient
1.01 = -0.5% / oC
1.00
0.99
0.98
0.97
0.96
15 20 25 30 35
Ambient temperature (oC)
o o
Set value = 25 C Measured value = 27.3 C
Measured luminous flux: F = 1243 lm
Corrected luminous flux: F (25 C) = 1257 lm
o

UNEP-lites.asia MVE webinar, 7 May 2015

 Outline
29

 Background and purpose of CIE S 025

 What measurements it covers
 Standard test conditions and tolerance interval
 Operating conditions for device under test
 Requirements for test equipment
 Reporting uncertainties of measurement

UNEP-lites.asia MVE webinar, 7 May 2015

 Temperature Conditions for Operation of DUT
30

LED Lamps
LED lamps are measured in standard test conditions and data shall be reported
o
for tamb = 25 C. If other operating temperatures are declared by the manufacturer,
the measured results at the given temperature shall be reported or a service
conversion factor shall be provided.

LED Modules
LED modules are measured in standard test conditions at the rated performance
temperature tp. The temperature at the tp-point shall be set at this value for the
measurements. …… a suitable temperature controlled heat sink may be used.
Interpolation techniques may also be applied (see Annex C).

LED Luminaires
o
LED luminaires are measured in standard test conditions at tamb = 25 C.

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 Air Movement
31

Air Movement
Measurements shall be made in still air. (Set value: air velocity is zero).
Tolerance interval: 0 m/s to 0.25 m/s
Tolerance
interval

This is an example of a tolerance Set

interval where the set point is not value
in the centre!

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 Operating Position of Device Under Test (DUT)
32

Operating Position
Specific requirement: The DUT shall remain in its designed
operating condition (with respect to gravity direction) throughout the
stabilization and testing period.

If this requirement is not met, the measurements shall be

corrected to the performance in the designed operating position.

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 Stabilization of Device Under Test (DUT)
33

LED Lamps and LED Luminaires

The DUT shall be operated (at ambient temperature 25 °C) for at least 30
min and it is considered as stable if the relative difference of maximum
and minimum readings of light output and electrical power observed over
the last 15 minutes is less than 0,5 % of the minimum reading.

F < 0.5 %
P

15 min
0 30 min
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 Stabilization of Device Under Test (DUT)
34

LED Modules

When the temperature reaches and maintains the specified performance

temperature tp within ±1 C for 15 min, the LED module is considered to be
o

stabilized in temperature.

tp ≤ ±1 oC
tp
15 min
0
The temperature of LED modules is commonly adjusted using a temperature-
controlled heat sink.

UNEP-lites.asia MVE webinar, 7 May 2015

 Outline
35

 Background and purpose of CIE S 025

 What measurements it covers
 Standard test conditions and tolerance interval
 Operating conditions for device under test
 Requirements for test equipment
 Reporting uncertainties of measurement

UNEP-lites.asia MVE webinar, 7 May 2015

 Laboratory Requirements for Tests
36

All measurements shall be traceable to the SI* when

instruments are used to measure absolute values of a
quantity relevant to the measurement.

3.37
traceability
property of a measurement result whereby the result can be
related to a reference (usually NMI’s calibration) through a documented
unbroken chain of calibrations, each contributing to the
measurement uncertainty.
* Note: SI is an abbreviation for Système International d’Unités (International System
of Units) is defined by the CGPM (General Conference of Weights and Measure) and
includes the units used internationally today.

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 Electrical Test Conditions and Electrical
Equipment
37

Specific requirements (summary)

 Calibration uncertainty of AC Voltmeters and ammeters ≤ 0.2 % for

AC, ≤ 0.1 % for DC
 Calibration uncertainty of AC power meter ≤ 0.5 %
 Bandwidth of AC power meter ≥ 100 kHz.
 Internal impedance of the voltage measurement: ≥ 1 MW
 AC power supply THD ≤ 1.5% (≤ 3 % for PF > 0.9) at DUT terminal
 AC power supply frequency uncertainty ≤ 0.2 %
 DC power supply voltage AC ripple ≤ 0.5 %

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 Electrical Test Conditions and Electrical
Equipment
38

The voltage of the AC power supply shall be regulated (tested) at the

supply terminals of the DUT. (not at the output terminal of power
supply. Cables included).

Specific requirement: Any drift or fluctuation of the supply voltage during

measurement of a DUT shall be within the acceptance interval of the
test voltage (4.3.1).

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 Photometric and Colorimetric Measurement
Instruments
39

Integrating sphere systems:

• Sphere-photometer (photometer head as detector)
• Sphere-spectroradiometer (spectroradiometer as detector)

Goniophotometer systems:
• Goniophotometer (photometer head as detector)
• Gonio-spectroradiometer (spectroradiometer as detector)
• Gonio-colorimeter (tristimulus colorimeter as detector)

Other types of measurement instruments including integrating hemisphere,

near-field goniophotometer and ILMD, are acceptable if they are
demonstrated to produce equivalent results as a conventional integrating
sphere system or conventional goniophotometer system.

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 Photometric and Colorimetric Measurement
Instruments
40

Specific requirements (summary)

 f1’ of the photometer system (gonio, sphere) ≤ 3 %

 f2 of the detector head of sphere system ≤ 15%
 Repeatability of sphere (open/close) ≤ 0.5 %
 Stability of the sphere between recalibrations ≤ 0.5 %
 Spectroradiometer bandwidth and interval ≤ 5 nm
 Spectroradiometer wavelength uncertainty ≤ 0.5 nm
 Angle uncertainty of goniophotometers ≤ 0.5 °

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 Integrating Sphere Measurements
41

 Covers both 4 and 2 integrating sphere systems

<４  geometry> <2  geometry>

From IES LM-79

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 Integrating Sphere Measurements
42

 Gives guidance for:

 Self-absorption measurements
 Size of DUT with respect to size of sphere
 Orientation of DUT in sphere
 Sphere reflectance uniformity
 Cosine response
 Repeatability of closure
 Calibration interval
 Spectral responsivity (including coating reflectance)

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 Goniophotometer Measurements
43

 Gives guidance for:

 Angular scan range and dead angle
 Angular aiming and accuracy
 Stray light
 Spectral responsivity (including mirror reflectance)
 Test distance for far-field measurements (see next slide)

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 Distance requirements for goniophotometers
44

Luminous intensity measurements according to the inverse square law require a sufficient photometric
distance.

Specific requirements for test distance in far-field photometry:

− For DUT having near cosine (Lambertian) distribution (beam angle ≥ 90°) in all C-planes: ≥ 5 × D
− For DUT having a broad angular distribution different from a cosine distribution (beam angle ≥ 60°)
in some of the C-planes: ≥ 10 × D
− For DUT with narrower angular distributions , steep gradients in the luminous intensity distribution or
critical glare control: ≥ 15 × D
− For DUT where there are large non-luminous spaces between the luminous areas: ≥ 15 × (D+S)

where D is the maximal luminous dimension of the DUT and S is the largest distance between two
adjacent luminous areas.

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 Outline
45

 Background and purpose of CIE S 025

 What measurements it covers
 Standard test conditions and tolerance interval
 Operating conditions for device under test
 Requirements for test equipment
 Reporting uncertainties of measurement

UNEP-lites.asia MVE webinar, 7 May 2015

 Reporting of Measurement Uncertainties
46

 It is a simple fact of life that no measurement is ever perfect

 For each measurement there is an uncertainty of
measurement, which is like an estimate of the possible error
that could be associated with the measurement result
 CIE S 025 requires that all measurement reports shall
include a statement of uncertainties of measurement

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 Reporting of Measurement Uncertainties
47

 A statement of uncertainties consists of a magnitude and an

associated probability

Magnitude Probability

May be relative (eg: 5%) May be a coverage probability, eg: 95%

May be absolute (eg: 14 lm) May be a coverage factor, eg: k = 2

 “The measured luminous flux is 783 lm ± 4.2% with a

coverage factor k = 2”
 “The correlated colour temperature is 3012 K ± 55 K with a
confidence interval of 95%”

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 Reporting of Measurement Uncertainties
48

 Ideally, for best practice, measurement uncertainties would

be evaluated for each test
 However for practical purposes, it is permitted to use
uncertainty values for a typical product of the similar type,
with a statement that indicates so in the test report
 If a lab does this, they must keep a detailed uncertainty
budget and evidence of how they evaluated this “typical”
product

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 Reporting of Measurement Uncertainties
49

 The measurement uncertainties shall be evaluated according

to ISO/IEC Guide 98-3 and its supplements
 Guidance for evaluating measurement uncertainties for LED
lighting devices is given in Chapter 8 and Annex D of
CIE S 025
 Guidance is also available in CIE 198:2011 “Determination of
Measurement Uncertainties in Photometry” and its
supplements

UNEP-lites.asia MVE webinar, 7 May 2015

 Summary
50

 CIE has recently published the Standard CIE S 025/E:2015,

which is a standard test method for photometric testing of
LED lamps, luminaires and modules
 CIE S 025 can be used for worldwide harmonised testing of
LED lighting products
 It contains test conditions and requirements for equipment
used to perform the tests
 It requires mandatory reporting of measurement uncertainties
 Standardising bodies and regulators are encouraged to move
to adopting CIE S 025 for LED measurement
 http://div2.cie.co.at/?i_ca_id=563&pubid=491

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 Upcoming CIE Conferences
51

 CIE’s 28th Quadrennial Session, Manchester/UK, June 28 -

July 4, 2015

 CIE Lighting Quality and Energy Efficiency Conference,

Melbourne/Australia, March 3-5, 2016

 More information: http://www.cie.co.at/

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52

Thank you for your kind attention.

Any questions?

Tony Bergen
[email protected]

UNEP-lites.asia MVE webinar, 7 May 2015