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K0024021000377-E0 英文报告 (CE) - 250219 - 104631

The EMC test report for the Beacon Tester (Model VRI8A) indicates compliance with the EMC Directive 2014/30/EU and relevant standards, confirming that the equipment's emission levels and immunity endurance meet required limits. The testing was conducted by Zhejiang Kezheng Electronic Information Product Testing Co., Ltd. on February 28, 2024, with results showing that the equipment operates within acceptable parameters for electromagnetic compatibility. The report is prepared for China E-Tech(Ningbo) Maritime Electronics Research Institute Co., Ltd.

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0% found this document useful (0 votes)
24 views40 pages

K0024021000377-E0 英文报告 (CE) - 250219 - 104631

The EMC test report for the Beacon Tester (Model VRI8A) indicates compliance with the EMC Directive 2014/30/EU and relevant standards, confirming that the equipment's emission levels and immunity endurance meet required limits. The testing was conducted by Zhejiang Kezheng Electronic Information Product Testing Co., Ltd. on February 28, 2024, with results showing that the equipment operates within acceptable parameters for electromagnetic compatibility. The report is prepared for China E-Tech(Ningbo) Maritime Electronics Research Institute Co., Ltd.

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electronics
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© © All Rights Reserved
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K0024021000377-E0 Page 1 / 39

中国认可
国际互认
检测
TESTING
CNAS L0461

EMC TEST REPORT


of
Beacon Tester
Brand Name: /
Model No.: VRI8A
Serial No.: /
Report No.: K0024021000377-E0

Issue Date: 2024-02-29

Prepared for

China E-Tech(Ningbo)Maritime Electronics Research


Institute Co., Ltd.
No. 587 Zhongdian Industrial Park, Taoyuan Road, Xiuzhou District, Jiaxing City

Prepared by

Zhejiang Kezheng Electronic Information Product


Testing Co., Ltd.
Number 316, Jianghong South Road, Hangzhou, Zhejiang, China
310052, P. R. China Tel: 86 571 88366800 Fax:86 571 88366821
K0024021000377-E0 Page 2 / 39

VERIFICATION OF COMPLIANCE
Product Name: Beacon Tester

Brand Name: /

Certified Models: Please refer to remark

Test Sample Models: VRI8A

Power Supply: 100-240VAC

I/O Ports: /

Technical Data: /

Receipt Date: 2024-02-27

Test Date: 2024-02-28

Type of Test: EMC Directive 2014/30/EU for CE Marking


EN 55032:2015+A11:2020+A1:2020
EN 55035:2017+A11:2020
Test Standards: EN IEC 61000-3-2:2019+A1:2021
EN 61000-3-3:2013+A1:2019+A2:2021
Applicant: China E-Tech(Ningbo)Maritime Electronics Research Institute Co., Ltd.

No. 587 Zhongdian Industrial Park, Taoyuan Road,Xiuzhou District, Jiaxing


Applicant Address: City

Manufacturer: China E-Tech(Ningbo)Maritime Electronics Research Institute Co., Ltd.

No. 587 Zhongdian Industrial Park, Taoyuan Road,Xiuzhou District, Jiaxing


Manufacturer Address: City

Remark:

The above equipment was tested by KZTC for compliance with the requirements set forth in EMC
Directive 2014/30/EU and the Technical Standards mentioned above. This said equipment in the
configuration described in this report shows the maximum emission levels emanating from equipment
and the level of the immunity endurance of the equipment are within the compliance requirements.

Approved by: Checked by: Chief tester:


K0024021000377-E0 Page 3 / 39

Summary of Test Results


The equipment complies with the requirements according to the following standards:
EN 55032:2015+A11:2020+A1:2020 Electromagnetic compatibility of multimedia equipment –
Emission requirements
EN 55035:2017+A11:2020 Information technology equipment - Immunity characteristics - Limits and
methods of measurement
EN IEC 61000-3-2:2019+A1:2021 Limits for harmonic current emissions (equipment input current≤
16 A per phase)
EN 61000-3-3:2013+A1:2019+A2:2021 Limitation of voltage changes, voltage fluctuations and flicker
in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase

Test Equipment List


For Radiated Emission test:
Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
R&S/EMI Test Receiver ESR7 DC0131 2023/09/09 2024/09/09
SCHWARZBECK
/Bilog Antenna VULB9163 DC0271 2024/11/30 2025/11/30
EMCO/Horn Antenna EMCO3115 DC0013 2023/03/05 2024/03/05
TDK 966 Chamber 966 DC0199 2021/05/18 2025/05/18

For Conducted Emission test:


Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
R&S/EMI Test Receiver ESR3 DC0170 2023/03/05 2024/03/05
R&S/LISN ENV216 DC0123-2 2023/09/09 2024/09/09
Shielding Room 10*10*4(M) SB131 2023/09/09 2024/09/09
TESEQ /ISN T8-CAT6 DC0079-4 2023/03/05 2024/03/05

For ESD test:


Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
TESEQ /ESD Generator NSG438 DC0074 2023/03/05 2024/03/05

For Radiated Electromagnetic Field immunity test:


Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
Keysight /Generator N5181A DC0106-3 2023/03/05 2024/03/05
Keysight /Power Meter E4419B DC0106-4 2023/03/05 2024/03/05
Milmega/Power Amplifier CBA1G DC0106-6 2023/03/05 2024/03/05
Milmega/ Power Amplifier AS0102 / / /
Milmega/ Power Amplifier AS0206 / / /
ETS/Probe HI-6105 DC0106-9 2023/03/05 2024/03/05
SCHWARZBECK/
VULP9118E DC0106-2 2023/03/05 2024/03/05
EMS Antenna

For Fast Transients/Burst test:


Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
Everfine /
Fast Transients /Burst EMS61000-4N DC0259 2023/03/05 2024/03/05
Generator
K0024021000377-E0 Page 4 / 39
For Surge Immunity test:
Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
Teseq /
Surge /Dips/Interruption and NSG3060 DC0135 2024/09/09 2024/09/09
Variations Simulator

For immunity to Conducted Disturbance /Induced by Radio-Frequency Field :


Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
SCHAFFNER/RF Generator NSG2070 DC0070 2024/09/09 2024/09/09

For Power Frequency Magnetic Field Immunity Test:


Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
EVERFINE/Power
Frequency Magnetic Field EMS61000-8K DC0107 2024/09/09 2024/09/09
Generator

For Voltage Dips/ Short Interruption and Voltage Variation Immunity test:
Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
Teseq /
Surge /Dips/Interruption and NSG2050 DC0011 2023/03/05 2024/03/05
Variations Simulator

For Harmonic Currents and Flicker Test:


Manufacturer/Type Model No. Serial No. Last Cal. Cal. Due
Harmonic & Flicker
ECTS2-3150F DC0270 2023/03/05 2024/03/05
Test System

Accessory Equipment List


Equipment Information

Name Model S/N Manufacturer Used


Note book computer XPSL502X 7K-V447Q-Y6BV2 DELL /
Personal computer A4800 NA06425384 Lenovo /

Monitor E1912Hc 64180-275-48RL DELL /


Keyboard 600 0065802248457 Microsoft /
Mouse M-UAG96B LZ74638 Logitech /

HDMI Cable DH800-2M 24618792 Qiuyeyuan /


IPC321SR3-V A0210235T4LUF1750
IP Camera Uniview /
SPF28 01958
K0024021000377-E0 Page 5 / 39
SECTION 1 EN 55032 (LINE CONDUCTED & RADIATED EMISSION)

MEASUREMENT PROCEDURE
(LINE CONDUCTED EMISSION TEST)

1) The equipment was set up as per the test configuration to simulate typical actual usage per the
user’s manual. When the EUT is a tabletop system, a wooden table with a height of 0.8 meters is
used and is placed on the ground plane as per EN 55032 (see Test Facility for the dimensions of the
ground pland used). When the EUT is a floor-standing equipment, it is placed on the ground plane
which has a 10 mm non-conductive covering to insulate the EUT from the ground plane.
2) Support equipment, if needed, was placed as per EN 55032.
3) All I/O cables were positioned to simulate typical actual usage as per EN 55032.
4) The EUT received AC power through a Line Impedance Stabilization Network (LISN) which supplied
power source of 230VAC/50Hz and was grounded to the ground plane.
5) The EUT test program was started. Emissions were measured on both power lines, Line 1 and Line
2, recording at least the six highest emissions.
Emission frequency and amplitude were recorded into a computer in which correction factors were
used to calculate the emission level and compare reading to the applicable limit.

Mains Ports Conducted Disturbance Limit( CLASS A)


Frequency Maximum RF Line Voltage
range dB(µV)
MHz Q.P. Average
0.15 ~ 0.50 79 66
0.50 ~ 30.00 73 60

Note: The lower limit shall apply at the transition frequency.


K0024021000377-E0 Page 6 / 39
Test Site: KZTC EMC lab

Operator: Xiang lei Ni xiaocao

Test date: 2024-02-28

Temperature: 17°C Relative Humidity: 35%

Comment: EUT operated continuously

Start Stop Step Detector Meas. IF Transducer

Frequency Frequency Width Time Bandw.

150.0 kHz 30.0 MHz 4.0 kHz QuasiPeak 1.0 s 9 kHz ENV216
Level in dBuV

Frequency in Hz

Final_Result
Frequency QuasiPeak Average Limit Margin Meas. Time Bandwidth Line Filter
(MHz) (dBuV) (dBuV) (dBuV) (dB) (ms) (kHz)
0.559000 --- 36.39 60.00 23.61 1000.0 9.000 L1 ON
1.187000 --- 32.95 60.00 27.05 1000.0 9.000 L1 ON
1.259000 --- 30.38 60.00 29.62 1000.0 9.000 L1 ON
1.819000 --- 32.43 60.00 27.57 1000.0 9.000 L1 ON
1.887000 --- 32.31 60.00 27.69 1000.0 9.000 L1 ON
16.459000 42.09 --- 73.00 30.91 1000.0 9.000 L1 ON
16.591000 43.48 --- 73.00 29.52 1000.0 9.000 L1 ON
16.663000 43.71 --- 73.00 29.29 1000.0 9.000 L1 ON
16.731000 43.51 --- 73.00 29.49 1000.0 9.000 L1 ON
16.867000 42.42 --- 73.00 30.58 1000.0 9.000 L1 ON
17.095000 42.88 --- 73.00 30.12 1000.0 9.000 L1 ON
17.155000 --- 29.61 60.00 30.39 1000.0 9.000 L1 ON
K0024021000377-E0 Page 7 / 39
Test Site: KZTC EMC lab
Operator: Xiang lei Ni xiaocao

Test date: 2024-02-28

Temperature: 17°C Relative Humidity: 35%

Comment: EUT operated continuously

Start Stop Step Detector Meas. IF Transducer

Frequency Frequency Width Time Bandw.

150.0 kHz 30.0 MHz 4.0 kHz QuasiPeak 1.0 s 9 kHz ENV216
Level in dBuV

Frequency in Hz

Final_Result
Frequency QuasiPeak Average Limit Margin Meas. Time Bandwidth Line Filter
(MHz) (dBuV) (dBuV) (dBuV) (dB) (ms) (kHz)
0.562000 --- 37.58 60.00 22.42 1000.0 9.000 N ON
0.562000 42.66 --- 73.00 30.34 1000.0 9.000 N ON
0.626000 --- 32.49 60.00 27.51 1000.0 9.000 N ON
1.118000 --- 29.89 60.00 30.11 1000.0 9.000 N ON
1.186000 --- 32.57 60.00 27.43 1000.0 9.000 N ON
1.254000 --- 32.09 60.00 27.91 1000.0 9.000 N ON
1.814000 --- 30.95 60.00 29.05 1000.0 9.000 N ON
13.666000 36.65 --- 73.00 36.35 1000.0 9.000 N ON
14.406000 39.22 --- 73.00 33.78 1000.0 9.000 N ON
15.222000 40.39 --- 73.00 32.61 1000.0 9.000 N ON
15.286000 40.80 --- 73.00 32.20 1000.0 9.000 N ON
15.970000 40.31 --- 73.00 32.69 1000.0 9.000 N ON
K0024021000377-E0 Page 8 / 39

MEASUREMENT PROCEDURE
( RADIATED EMISSION TEST)

1) The equipment was set up as per the test configuration to simulate typical actual usage per the
user’s manual. When the EUT is a tabletop system , a wooden turntable with a height of 0.8 meters
is used which is placed on the ground plane as per EN 55032 ( see Test Facility for the dimensions
of the ground plane used). When the EUT is a floor-standing equipment, it is placed on the ground
plane which has a 10mm non-conductive covering to insulate the EUT from the ground plane.
2) Support equipment, if needed, was placed as per EN55032.
3) All I/O cables were positioned to simulate typical actual usage as per EN 55032.
4) The antenna was placed at 3 meter away from the EUT and connected to the receiver via a cable
and at times a pre-amplifier would be used.
5) The Receiver scanned from 30MHz to 6000MHz. The EUT test program was started. Emissions
were scanned and measured rotating the EUT to 360 degrees and positioning the antenna 1 to 4
meters above the ground plane, in both the vertical and the horizontal polarization, to maximize the
emission reading level.
Record at least the six highest emissions. Emission frequency, amplitude, antenna position,
polarization and turntable position were recorded into a computer in which correction factors were used
to calculate the emission level and compare reading to the applicable limit and only Q.P. reading is
presented.

RADIATED EMISSION LIMIT ( 30MHz~1000MHz CLASS A )

Maximum Field Strength Limit Maximum Field Strength Limit


Frequency dBµV/m, Q.P. dBµV/m, Q.P.
( MHz ) (Distance: 10 m) (Distance: 3 m)

30 ~ 230 40 50

230 ~ 1000 47 57

Note: The lower limit shall apply at the transition frequency.


K0024021000377-E0 Page 9 / 39
Test Site: KZTC EMC lab

Operator: Xiang lei Ni xiaocao

Test date: 2024-02-28

Temperature: 16°C Relative Humidity: 36%

Comment: EUT operated continuously

Start Stop Step Detector Meas. IF Transducer

Frequency Frequency Width Time Bandw.

30.0 MHz 1.0 GHz 60.0 kHz QuasiPeak 1.0 s 120 kHz VULB9163
Level in dBuV/m

Frequency in Hz

Final_Result
Frequency QuasiPeak Limit Margin Meas. Bandwidth Height Pol Azimuth Corr.
(MHz) (dBuV/m) (dBuV/m) (dB) Time (kHz) (cm) (deg) (dB)
(ms)
382.498000 38.69 57.00 18.31 1000.0 120.000 100.0 H 245.0 23.1
400.006500 47.43 57.00 9.57 1000.0 120.000 102.0 H 262.0 23.6
685.623000 31.11 57.00 25.89 1000.0 120.000 221.0 H 342.0 28.1
765.017500 41.57 57.00 15.43 1000.0 120.000 100.0 H 151.0 29.6
800.034500 41.08 57.00 15.92 1000.0 120.000 100.0 H 144.0 29.5
892.524000 34.21 57.00 22.79 1000.0 120.000 125.0 H 330.0 30.8
K0024021000377-E0 Page 10 / 39
Test Site: KZTC EMC lab

Operator: Xiang lei Ni xiaocao

Test date: 2024-02-28

Temperature: 16°C Relative Humidity: 36%

Comment: EUT operated continuously

Start Stop Step Detector Meas. IF Transducer

Frequency Frequency Width Time Bandw.

30.0 MHz 1.0 GHz 60.0 kHz QuasiPeak 1.0 s 120 kHz VULB9163
Level in dBuV/m

Frequency in Hz

Final_Result
Frequency QuasiPeak Limit Margin Meas. Bandwidth Height Pol Azimuth Corr.
(MHz) (dBuV/m) (dBuV/m) (dB) Time (kHz) (cm) (deg) (dB)
(ms)
45.762500 28.09 50.00 21.91 1000.0 120.000 122.0 V 83.0 20.7
382.498000 40.67 57.00 16.33 1000.0 120.000 123.0 V 163.0 23.1
400.006500 50.61 57.00 6.39 1000.0 120.000 118.0 V 191.0 23.6
765.017500 40.94 57.00 16.06 1000.0 120.000 220.0 V 307.0 29.6
800.034500 37.54 57.00 19.46 1000.0 120.000 215.0 V 1.0 29.5
892.524000 43.53 57.00 13.47 1000.0 120.000 100.0 V 343.0 30.8
K0024021000377-E0 Page 11 / 39

RADIATED EMISSION LIMIT ( 1000MHz ~6000MHz CLASS A )

Maximum Field Strength Limit


Frequency
( MHz )
dBµV/m,P.K dBµV/m ,Average

1000 ~ 3000 76 56

3000 ~ 6000 80 60

remarks 2.4GHz is the operating frequency point of the equipment

Note: The lower limit shall apply at the transition frequency.


K0024021000377-E0 Page 12 / 39
Test Site: KZTC EMC lab
Operator: Ni xiaocao Xiang lei

Test date: 2024-02-28

Temperature: 16°C Relative Humidity: 35%

Comment: EUT operated continuously

Start Stop Step Detector Meas. IF Transducer

Frequency Frequency Width Time Bandw.

1.0 GHz 6.0 GHz 500.0 kHz MaxPeak 1.0 s 1 MHz EMCO 3115-3m
Level in dBuV/m

Frequency in Hz

Final_Result
Frequency MaxPeak CAverage Limit Margin Meas. Bandwidth Height Pol Azimuth
(MHz) (dBuV/m) (dBuV/m) (dBuV/m) (dB) Time (kHz) (cm) (deg)
(ms)
2000.000000 --- 39.32 56.00 16.68 1000.0 1000.000 125.0 H 357.0
2677.500000 50.60 --- 76.00 25.40 1000.0 1000.000 100.0 H 310.0
2677.500000 --- 42.67 56.00 13.33 1000.0 1000.000 215.0 H 310.0
2800.000000 --- 39.21 56.00 16.79 1000.0 1000.000 211.0 H 341.0
3877.812500 --- 45.78 60.00 14.22 1000.0 1000.000 125.0 H 310.0
4027.500000 54.78 --- 80.00 25.22 1000.0 1000.000 100.0 H 84.0
4276.875000 53.53 --- 80.00 26.47 1000.0 1000.000 214.0 H 280.0
4999.375000 55.14 --- 80.00 24.86 1000.0 1000.000 125.0 H 106.0
5330.625000 --- 42.76 60.00 17.24 1000.0 1000.000 100.0 H 106.0
5334.062500 55.46 --- 80.00 24.54 1000.0 1000.000 216.0 H 33.0
5597.187500 --- 42.43 60.00 17.57 1000.0 1000.000 100.0 H 120.0
5933.437500 55.79 --- 80.00 24.21 1000.0 1000.000 125.0 H 228.0
K0024021000377-E0 Page 13 / 39
Test Site: KZTC EMC lab
Operator: Ni xiaocao Xiang lei

Test date: 2024-02-28

Temperature: 16°C Relative Humidity: 35%

Comment: EUT operated continuously

Start Stop Step Detector Meas. IF Transducer

Frequency Frequency Width Time Bandw.

1.0 GHz 6.0 GHz 500.0 kHz MaxPeak 1.0 s 1 MHz EMCO 3115-3m
Level in dBuV/m

Frequency in Hz

Final_Result
Frequency MaxPeak CAverage Limit Margin Meas. Bandwidth Height Pol Azimuth
(MHz) (dBuV/m) (dBuV/m) (dBuV/m) (dB) Time (kHz) (cm) (deg)
(ms)
1200.000000 --- 37.12 56.00 18.88 1000.0 1000.000 125.0 V 113.0
2295.000000 --- 40.34 56.00 15.66 1000.0 1000.000 100.0 V 17.0
2400.000000 --- 39.13 56.00 16.87 1000.0 1000.000 261.0 V 39.0
2400.000000 49.96 --- 76.00 26.04 1000.0 1000.000 115.0 V 39.0
4001.562500 55.45 --- 80.00 24.55 1000.0 1000.000 100.0 V 171.0
4005.000000 --- 42.06 60.00 17.94 1000.0 1000.000 135.0 V 134.0
4241.250000 53.27 --- 80.00 26.73 1000.0 1000.000 206.0 V 17.0
5000.000000 53.67 --- 80.00 26.33 1000.0 1000.000 125.0 V 179.0
5314.687500 --- 42.62 60.00 17.38 1000.0 1000.000 100.0 V 61.0
5328.437500 55.34 --- 80.00 24.66 1000.0 1000.000 128.0 V 179.0
5661.250000 55.40 --- 80.00 24.60 1000.0 1000.000 225.0 V 257.0
5983.437500 --- 42.96 60.00 17.04 1000.0 1000.000 220.0 V 83.0
K0024021000377-E0 Page 14 / 39
SECTION 2 EN 61000-3-2 & EN 61000-3-3 ( POWER HARMONICS &
VOLTAGE FLUCTUATION / FLICKER )
POWER HARMONICS MEASUREMENT

Port : AC mains

Basic Standard : EN 61000-3-2:2019+A1:2021

Limits : CLASS A

Tester : Xiang lei, Ni xiaocao

Temperature : 17℃

Humidity : 34%

VOLTAGE FLUCTUATION / FLICER MEASUREMENT

Port : AC mains

Basic Standard : EN 61000-3-3:2013+A1:2019+A2:2021

Limits : § 5 of IEC 61000-3-3

Tester : Xiang lei, Ni xiaocao

Temperature : 16℃

Humidity : 35%

EUT exercise:

The EUT was set to operate with normal load and exercised all support units intended to maximum
harmonic current emission during the test.
K0024021000377-E0 Page 15 / 39
Block Diagram of Test Setup:

Harmonics & Flicker


Analyzer
+ Power cord
EUT Support Units
Power Source

0.8m

Result:

PASS (Please see the attached test data).


K0024021000377-E0 Page 16 / 39

EN 61000-3-2 TEST REPORT

TEST SETUP

Test Freq.: 50.00Hz Test Voltage: 230.0vac


Waveform: SINE Test time: 2.5min
Classification: CLASS A

Prog. Zo Enabled: YES Prog. Zo: 0.000

Motor Driven with Phase Angle Control: NO


Impedance selected: DIRECT
Synthetic R + L Enabled: NO
Resistance: 0,380 Ohms Inductance: 460.000 uH

Test Data:

Vrms (Volts)/V-pk/V-CF: 231.10 / 324.9 / 1.406 Frequency (Hz): 50.0001


I_rms (Amps): 0.077 Power (VA)/VAR: 17.7 / 16.6
I_fund (Amps): 0.028 Power (W): 6.4
I_peak (Amps)/I-CF: 0.431 / 5.274 Power Factor: 0.358
V-THD (%): 0.34 I-THD (%): 252.43
POHC (A): 0.020 (method C.3) POHC Limit (A): 0.250
I-THC (A): 0.070 Meas. Pwr (Min / Max) 3.4W/6.4W

Harm No. Harm. Ave. Harm. % Of Result Result (Max.) Harm. Harm. Win. % Of Max
Limit Limits (Ave.) Win. (150%)
(100%)
2 0.0003 1.0800 0.0 PASS PASS 0.0005 1.6200 0.0
3 0.0295 2.3000 1.3 PASS PASS 0.0299 3.4500 0.9
4 0.0006 0.4300 0.1 PASS PASS 0.0008 0.6450 0.1
5 0.0279 1.1400 2.4 PASS PASS 0.0283 1.7100 1.7
6 0.0003 0.3000 0.1 PASS PASS 0.0005 0.4500 0.1
7 0.0262 0.7700 3.4 PASS PASS 0.0265 1.1550 2.3
8 0.0011 0.2300 0.5 PASS PASS 0.0013 0.3450 0.4
9 0.0246 0.4000 6.1 PASS PASS 0.0249 0.6000 4.1
10 0.0003 0.1840 0.1 PASS PASS 0.0005 0.2760 0.2
11 0.0217 0.3300 6.6 PASS PASS 0.0220 0.4950 4.4
12 0.0012 0.1530 0.8 PASS PASS 0.0013 0.2295 0.6
13 0.0197 0.2100 9.4 PASS PASS 0.0199 0.3150 6.3
14 0.0003 0.1310 0.2 PASS PASS 0.0005 0.1965 0.2
15 0.0167 0.1500 11.2 PASS PASS 0.0170 0.2250 7.5
16 0.0012 0.1150 1.1 PASS PASS 0.0013 0.1725 0.8
17 0.0143 0.1320 10.8 PASS PASS 0.0145 0.1980 7.3
18 0.0003 0.1020 0.3 PASS PASS 0.0005 0.1530 0.3
19 0.0119 0.1180 10.1 PASS PASS 0.0121 0.1770 6.8
20 0.0008 0.0920 0.9 PASS PASS 0.0009 0.1380 0.7
21 0.0096 0.1070 9.0 PASS PASS 0.0098 0.1605 6.1
22 0.0004 0.0830 0.5 PASS PASS 0.0005 0.1245 0.4
K0024021000377-E0 Page 17 / 39
23 0.0081 0.0970 8.3 PASS PASS 0.0082 0.1455 5.7
24 0.0006 0.0760 0.8 PASS PASS 0.0007 0.1140 0.6
25 0.0066 0.0900 7.4 PASS PASS 0.0068 0.1350 5.0
26 0.0004 0.0700 0.6 PASS PASS 0.0005 0.1050 0.5
27 0.0059 0.0830 7.1 PASS PASS 0.0061 0.1245 4.9
28 0.0005 0.0650 0.7 PASS PASS 0.0006 0.0975 0.6
29 0.0055 0.0770 7.2 PASS PASS 0.0057 0.1155 4.9
30 0.0004 0.0610 0.6 PASS PASS 0.0005 0.0915 0.6
31 0.0053 0.0720 7.3 PASS PASS 0.0054 0.1080 5.0
32 0.0005 0.0570 0.9 PASS PASS 0.0006 0.0855 0.7
33 0.0051 0.0680 7.6 PASS PASS 0.0053 0.1020 5.2
34 0.0004 0.0540 0.7 PASS PASS 0.0005 0.0810 0.6
35 0.0050 0.0640 7.8 PASS PASS 0.0051 0.0960 5.3
36 0.0004 0.0510 0.8 PASS PASS 0.0005 0.0765 0.7
37 0.0046 0.0600 7.7 PASS PASS 0.0048 0.0900 5.3
38 0.0004 0.0480 0.7 PASS PASS 0.0005 0.0720 0.6
39 0.0043 0.0570 7.5 PASS PASS 0.0044 0.0855 5.2
40 0.0003 0.0460 0.7 PASS PASS 0.0004 0.0690 0.6

EN 61000-3-3 TEST REPORT

TEST SETUP

Test Freq.: 50.00 Hz Test Voltage: 230.12 vac

Waveform: SINE

Test Time: 120.0 min Tshort: 10.0 min

Prog. Zo Enabled: YES Prog. Zo: 0.000

Impedance selected: IEC 725 REF IMPEDANCE

Resistance: 0.380 Ohms Inductance: 460.000uH

TEST DATA
Result: PASS

EUT Data Limit Result

dc % 0.000 3.30 PASS

dmax % 0.000 4.00 PASS

d (t) sec. 0.000 0.50 PASS

Pst 0.156 1.0 PASS


K0024021000377-E0 Page 18 / 39

SECTION 3 EN 61000-4-2 ( ELECTROSTATIC DISCHARGE )


ELECTROSTATIC DISCHARGE IMMUNITY TEST

Port : Enclosure

Basic Standard : EN55035:2017+A11:2020

Test Level : ±8kV ( Air Discharge )

±4kV ( Contact Discharge)

±4kV ( Indirect Discharge )

Performance Criteria : B ( Standard require )

Tester : Xiang lei, Ni xiaocao

Temperature / Humidity : 17℃/36%

Block Diagram of Test Setup:


( The 470 k ohm resistors are installed per standard requirement )

VCP

EUT
Support units & HCP
>1m Support Units

0.8m
Wooden Table

Ground Reference Plane


K0024021000377-E0 Page 19 / 39

Test Procedure:

1. The EUT was located in 0.1 m minimum away from all sides of the HCP.
2. The support units were located 1 m minimum away from the EUT.
3. The EUT operated continuously.
4. Selecting appropriate points of EUT for contact discharge and put a mark on EUT to show tested
point(s).
5. The air discharge was scanned and put a mark on EUT to show tested point(s).
6. The following test condition was followed during the tests.

The electrostatic discharges were applied as follows:

Amount of Discharges Voltage Coupling Result ( Pass/Fail )


Mini 25 / Point +/- 4kV Contact Discharge Pass
Mini 10 / Point +/- 8kV Air Discharge Pass
Mini 25 / Point +/- 4kV Indirect Discharge HCP( Front ) Pass
Mini 25 / Point +/- 4kV Indirect Discharge VCP( Left ) Pass
Mini 25 / Point +/- 4kV Indirect Discharge VCP( Right ) Pass

Performance & Result:

□Criteria A: The apparatus continues to operate as intended. No degradation of performance or


loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may
be replaced by a permissible loss of performance.
■Criteria B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the
performance degradation of performance is however allowed.
□Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can
be restored by the operation of controls.

■PASS □FAILED

Observation: No any function degraded during the tests.


K0024021000377-E0 Page 20 / 39

SECTION 4 EN 61000-4-3 (RADIATED ELECTROMAGNETIC FIELD)


RADIATED ELECTROMAGNETIC FIELD IMMUNITY TEST

Port : Enclosure

Basic Standard : EN55035:2017+A11:2020

Requirements : 3V/m/with 80% AM.1kHz Modulation.


80~1000MHz, 1800 MHz, 2600 MHz,
3500 MHz, 5000 MHz
Performance Criteria : A ( Standard require )

Tester : Xiang lei, Ni xiaocao

Temperature : 17℃

Humidity : 32%RH

Block Diagram of Test Setup:


K0024021000377-E0 Page 21 / 39
Test Procedure:
1. The EUT was located at the calibrated square area of field uniformity. The support units were located
outside of the uniformity area, but the cable(s) connected with EUT were exposed to the calibrated
field as per EN 61000-4-3.
2. The EUT was set to operate normally.
3. Adjusting the monitoring camera to monitor the EUT status as clear as possible.
4. Performing the test at each side of EUT with specified level at 1% of fundamental.
5. Recording the test result.

Test conditions:

Test level : 3V/m


Steps : 1% of fundamental
Dwell Time : 3 sec
Range ( MHz ) Field Modulation Polarity Position ( °) Result ( Pass/Fail )
80~1000,1800,
3V Yes H&V Front Pass
2600,3500,5000
80~1000,1800,
3V Yes H&V Right Pass
2600,3500,5000
80~1000,1800,
3V Yes H&V Back Pass
2600,3500,5000
80~1000,1800,
3V Yes H&V Left Pass
2600,3500,5000

Performance & Result:

■Criteria A: The apparatus continues to operate as intended. No degradation of performance or loss


of function is allowed below a performance level specified by the manufacturer, when the apparatus is
used as intended. In some cases the performance level may be replaced by a permissible loss of
performance.
□Criteria B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may be replaced by
a permissible loss of performance. During the test, degradation of performance is however
allowed.
□Criteria C: Temporary loss of function is allowed, provided the functions self-recoverable or can be
restored by the operation of controls.

■PASS □FAILED

Observation: No any function degraded during the tests.


K0024021000377-E0 Page 22 / 39
SECTION 5 EN 61000-4-4 ( FAST TRANSIENTS/BURST )
FAST TRANSIENTS/BURST IMMUNITY TEST

Port : AC Mains

Basic Standard : EN55035:2017+A11:2020

Requirements : +/- 1.0kV (AC Power Line)

Performance Criteria :B

Tester : Xiang lei, Ni xiaocao

Temperature : 19℃

Humidity : 35%RH

Block Diagram of Test Setup:

EUT
Support Units

AC 80cm Non-Conductive Table


EFT/Burst
Line
Generator

Controller Computer printer


K0024021000377-E0 Page 23 / 39

Test Procedure:

1. The EUT was located on a wooden table, 0.5m away from ground panel.
2. The EUT operated continuously.
3. The following test condition was followed during the tests.

Test conditions:
Impulse Frequency: 5kHz
Tr / Th: 5/50ns
Burst Duration: 15ms
Burst Period: 300ms
Performance
Inject Line Voltage KV Inject Method Result ( Pass/Fail )
Criteria
AC Power Line +1.0 Direct Pass B
AC Power Line -1.0 Direct Pass B

Performance & Result:

□Criteria A: The apparatus continues to operate as intended. No degradation of performance or


loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may
be replaced by a permissible loss of performance.

■Criteria B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the
performance degradation of performance is however allowed.

□Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can
be restored by the operation of controls.

■PASS

Observation: No any function degraded during the tests.


K0024021000377-E0 Page 24 / 39
SECTION 6 EN 61000-4-5 ( SURGE IMMUNITY )
SURGE IMMUNITY TEST

Port : AC Mains

Basic Standard : EN55035:2017+A11:2020

Requirements : +/- 1.0kV ( Line to Line )

Performance Criteria :B

Tester : Xiang lei, Ni xiaocao

Temperature : 18℃

Humidity : 34%RH

Block Diagram of Test Setup:

To AC
Surge EUT
Source
Immunity &
Test Support Units

80 cm

Controller Computer Printer


K0024021000377-E0 Page 25 / 39

Test Procedure:
1. The EUT was located on a 0.8m wooden table.
2. The EUT operated continuously.
3. The following test condition was followed during the tests.
Test conditions:

Voltage Waveform : AC Mains:1.2/50 us & Signal port :10/700 us


Current Waveform : AC Mains: 8/20 us & Signal port : 5/320us
Polarity : Positive / Negative
Phase angle : AC Mains : 0°, 90°,180°, 270° Signal port : Asynch
Number of Test :5

Voltage Performance
Coupling Line Polarity Result ( Pass/Fail )
kV Criteria
L-N 1.0 Negative & Positive Pass B

Performance & Result:

□Criteria A: The apparatus continues to operate as intended. No degradation of performance or


loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may
be replaced by a permissible loss of performance.

■Criteria B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the
performance degradation of performance is however allowed.

□Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can
be restored by the operation of controls.

■PASS

Observation: No any function degraded during the tests.


K0024021000377-E0 Page 26 / 39

SECTION 7 EN 61000-4-6 ( CONDUCTED DISTURBANCE /INDUCED BY RADIO-


FREQUENCY FIELD )
CONDUCTED DISTURBANCE IMMUNITY TEST

Port :AC Mains

Basic Standard : EN55035:2017+A11:2020

Requirements : 3V to 1V with 80% AM.1kHz Modulation

Injection Network : CDN-M3(AC Mains)


Clamp(Signal port)
Performance Criteria : A ( Standard require )

Tester : Xiang lei, Ni xiaocao

Temperature : 17℃

Humidity : 35%RH

Block Diagram of Test Setup:

10cm isolation 0.1m < L < 0.3m


supporter

EUT and
Support
RF PC
units
CDN Generator Controller

Ground Reference Plane


K0024021000377-E0 Page 27 / 39

Test Procedure:

1. The EUT and support units were located at a ground reference plane with the interposition of a
0.1m thickness insulating support and the CDN was located on GRP directly.
2. The EUT operated continuously.
3. Setting the testing parameters of CS test software per IEC 61000-4-6 and performing the
immunity test.
4. Recording the test result in following table.

Test conditions:

Frequency Range : 0.15MHz ~ 80MHz


Frequency Step : 1% of fundamental
Dwell Time : 3 sec

Result
Coupling Line Range ( MHz ) Voltage Modulation Performance
( Pass/ Fail )
Criteria
AC port 0.15 ~ 10 3V Yes Pass A
AC port 10 ~ 30 3V to 1V Yes Pass A
AC port 30 ~ 80 1V Yes Pass A

Performance & Result:

■Criteria A: The apparatus continues to operate as intended. No degradation of performance or


loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may
be replaced by a permissible loss of performance.

□Criteria B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the
performance degradation of performance is however allowed.

□Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can
be restored by the operation of controls.

■PASS

Observation: No any function degraded during the tests.


K0024021000377-E0 Page 28 / 39
SECTION 8 EN 61000-4-8 (POWER FREQUENCY MAGNETIC FIELD IMMUNITY
TEST )
POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST

Port : Enclosure

Basic Standard : EN55035:2017+A11:2020

Requirements : 1A/m

Performance Criteria : A ( Standard require )

Tester : Xiang lei, Ni xiaocao

Temperature : 17℃

Humidity : 36%RH

Block Diagram of Test Setup:

1/2 Dimension
Induction
of EUT
Coil

EUT
10cm thick
Insulation
Support

Signal
Generator

To To
Earth Ground Earth Ground
K0024021000377-E0 Page 29 / 39
Test Procedure:
1. The EUT and support units were located on Ground Reference Plane with the interposition of a
0.1m thickness insulation support.
2. Putting the induction coil on horizontal direction. ( X direction )
3. The test program exercised related support units sequentially.
4. Recording the test result as shown in following table.
5. Rotating the induction coil by 90°( Y direction ) then repeat step 3 to 6.
6. Rotating the induction coil by 90°again ( Z direction ) then repeat step 3 to 6.

Test conditions:
Field Strength : 1 A/m
Power Freq : 50Hz,60Hz
Orientation : X, Y, Z

Result ( Pass/
Orientation Field Remark
Fail )
X 1A/m Pass N/A

Y 1A/m Pass N/A

Z 1A/m Pass N/A

Performance & Result:

■Criteria A: The apparatus continues to operate as intended. No degradation of performance or


loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may
be replaced by a permissible loss of performance.

□Criteria B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the
performance degradation of performance is however allowed.

□Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can
be restored by the operation of controls.

■PASS □FAILED

Observation: No any function degraded during the tests.


K0024021000377-E0 Page 30 / 39
SECTION 9 EN 61000-4-11 ( VOLTAGE DIPS, SHORT INTERRUPTIONS AND
VOLTAGE VARIATIONS )
VOLTAGE DIPS / SHORT INTERRUPTIONS

Port : AC mains

Basic Standard : EN55035:2017+A11:2020

Requirements : Phase Angle : 0 degree

Test level Reduction Duration Performance


Voltage %UT (%) ( periods ) Criteria
Dips <5 >95 0.5 B
70 30 25 C

Test level Reduction Duration Performance


Voltage
%UT (%) ( periods ) Criteria
Interruptions
<5 >95 250 C

Test Interval : Min. 10 sec

Tester : Xiang lei, Ni xiaocao

Temperature : 18℃

Humidity : 34%RH

Block Diagram of Test Setup:

To AC Dips/Interruption
EUT
Source and Variations
&
Simulator
Support Units

80 cm

Controller Computer Printer


K0024021000377-E0 Page 31 / 39

Test Procedure:
1. The EUT and support units were located on a wooden table, 0.8m away from ground floor.
2. A test program was loaded and executed in Windows mode.
3. The EUT operated continuously.
4. Recording the test result in test record form.

Test conditions:
The duration with a sequence of three dips/interruptions with interval of 10s minimum
( Between each test event )

Voltage Dips:
Meet
Test Level Reduction Duration
Observation performance
% UT (%) ( periods )
Criteria
<5 >95 0.5 Normal B
70 30 25 Normal C

Voltage Interruptions:
Meet
Test Level Reduction Duration
Observation performance
% UT (%) ( periods )
Criteria
0 100 250 / C
Normal: No any functions degrade during and after the test.

Performance & Result:

□Criteria A: The apparatus continues to operate as intended. No degradation of performance or


loss of function is allowed below a performance level specified by the manufacturer,
when the apparatus is used as intended. In some cases the performance level may
be replaced by a permissible loss of performance.

■Criteria B: The apparatus continues to operate as intended after the test. No degradation of
performance or loss of function is allowed below a performance level specified by the
manufacturer, when the apparatus is used as intended. In some cases the
performance degradation of performance is however allowed.

■Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can
be restored by the operation of controls.

■PASS

Observation: No any function degraded during the tests.


K0024021000377-E0 Page 32 / 39

Photographs of the EUT


K0024021000377-E0 Page 33 / 39

Photographs of the Test Configuration

Photograph 1: Set up of Radiated Electromagnetic Disturbances ( 30MHz~1000MHz )

Photograph 2: Set up of Radiated Electromagnetic Disturbances ( 1000MHz~6000MHz )


K0024021000377-E0 Page 34 / 39
Photograph 3: Set-up of Mains Ports Conducted Emission Test

Photograph4: Set-up of Radio-frequency Electromagnetic Field Immunity Test


K0024021000377-E0 Page 35 / 39

Photograph 5: Set-up for Electrostatic Discharge Immunity Test

Photograph 6: Set-up for Electrical Fast Transient/Burst Immunity Test


K0024021000377-E0 Page 36 / 39
Photograph 7: Set-up of Conducted Disturbance Immunity Test

Photograph 8: Set-up of Surge Immunity Test


K0024021000377-E0 Page 37 / 39

Photograph 9: Set-up of Power Frequency Magnetic Field Immunity Test

Photograph 10: Set-up for Voltage Dips and Interruptions Test


K0024021000377-E0 Page 38 / 39

Photograph 11: Set-up of Power Harmonics & Voltage Fluctuation/Flicker Test


K0024021000377-E0 Page 39 / 39

NOTES

1. Reports with no signet of “test report” or that of the inspect institute are
all invalid.

2. Partial copy of this report is forbidden. Entire copy of the report without signet
is invalid.

3. Report with no approval are invalid.

4. Altered report is invalid.

5. If any disagreement on this report, a written claim is requested to be submit


to the institute within 15days on receipt of the report.

6. The customer shall provide the information about the sample and the customer in
the report for sample inspection. The authenticity of the report shall be the
responsibility of the customer. The test result shall only be the responsibility
of the sample under test.

7. The agency shall not be liable for any test data provided by the customer in the
report.

8. The data and results of the report without CMA mark are only for the client to
know the quality of the sample.

9. The electronic report is signed with the electronic certificateissued by Zhejiang


Digital Certification Center. When double-clicking the electronic signature, the
signature verification status pops up as the signature is valid, the document
has not been modified, etc., the electronic report is valid; the pop-up signature
verification status is the signature invalid or When the document has been changed
and other information, the electronic report is invalid.

Address: 316#, Jiang Hong South Road, Hangzhou, China


Tel: +86 571 88366861
Fax: +86 571 88366821
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