detectores
detectores
NPérez
SM Olaizola
2004
Outline
Introduction
Photomultipliers
Photodiodes
Parameters
Characteristics: Quantum efficiency, Responsivity, Response speed,
Temperature effects, Noise.
Photodiode structures:
PIN Photodiode
Schottky photodiode
Avalanche photodiode
Applications:
Optical fiber communications systems
Optical disks
Optocouplers
Bar-code readers
CCD devices
CMOS fundamentals
CCD basics and structure
CCD: Charge transfer
Introduction
Photodetectors are used in decoding the information
that a light beam contains
Laser beam from a telecommunications link
Light from a star
…
High performance requirements:
High response or sensitivity in the wavelength range of the
emitter
Fast response speed
Insensitivity to temperature changes
Compatible with different dimensions of optical fibers
Low cost
Long operating life
Introduction
Photomultipliers: photocathode + electron multiplier
High gain and low noise
Big sizes and they need very high voltages to work
Phototransistors
D1
D3 Anode
Light
input e-
D2 D4 I meter
Advantages of photomultipliers:
Very high internal multiplication factors (> 106)
Little additional noise is introduced
Bandwidths of the order of 1 Gigahertz (very good for very
fast measurements)
Main disadvantages:
Low quantum efficiency (< 0.1)
Large size
Limited life
Mechanical fragility
Need for stable high voltage supplies, around 1kV
Photodiodes
Semiconductor is illuminated by light with hν > Eg light is absorbed
in the semiconductor e- - h+ pairs are created
Electric field applied induced carriers take part in electric
conduction photoconduction.
Normal operation: reverse biased intrinsic region fully depleted.
Designed so that most of the e- - h+ pairs are created in the intrinsic region
Electric field in the intrinsic region separates an accelerates carriers
Current flow can be observed in the external circuit.
Photodiodes: Parameters
Diffusion length
1
Ln , p = (Dn , p ⋅ τ n , p ) 2
Ip η
ℜ= = ⋅ λ ( µm )
Po 1.24
Photodiodes: Responsivity
Responsivity
In order to increase ℜ :
A material very absorbing for the incident λ
Depletion region with high, extended electric field
Junction close to the surface
Antireflection layer at the surface
Spectral response ( ℜ vs. λ)
Photodiodes: Response speed
Response speed. Limited by two factors:
Charge collection time or transit time. Two components:
Fast: carriers moving by drift in the depletion region
Slow: Carriers diffusing until they reach the depletion region
RC time constant, coming from:
Capacity of the junction (Cj)
Diode inner resistance (Rd) and load resistance (RL)
Response time.
τ 2 = τ RC
2 2
+ τ trans 2
+ τ diff
Cut-off frequency
1
f 3dB =
2πτ
Photodiodes: Temperature effects
Temperature effects: ↑T ⇒ Two different effects:
Shift in the quantum efficiency
Equivalent
Ip: photocurrent
RL circuit for a
Il: leakage current Rd Vo
Cj photodiode
IN: noise equivalent current Ip Il IN
From the dark current (bulk and surface) I s ,surface = 2qI L B I s ,dark = 2qI D B
Total shot noise
2 2 2
Total noise equivalent current: I N = I S + I T
Reach-through structure
Basic operation
(reverse biased)
Schottky Photodiode
Basic structure
band to band generation (hν > Eg) electron photoemission (hν > qФb)
Heterojunction Photodiode
LEDs and laser diodes emit light modulated with a signal and the
resultant optical signal is received with photodiodes
Analog system
(intensity modulation)
Digital system
REPEATER
Signal electrically
Photodiode reformed Laser
and amplified
Optocouplers
Connection of two circuits without an electric contact.
Formed by a photoemissor and a photodetector
Bar-code readers
Decode the information through the digitalization coming from a light
source reflected on the code
Bar code illuminated ⇒ dark bars absorb light and the spaces reflect
back to the scanner ⇒ transforms the fluctuations of light into electric
pulses
The decoder converts the electric pulses into a binary code and
transmits the decoded information to a terminal
Charge Coupled Devices (CCDs)
MOS Fundamentals
φm: metal work function; φB: potential barrier metal-insulator; χ: semiconductor electron
affinity; χi: insulator electron affinity: ψB: potential difference between EF and Ei
CCDs: MOS Fundamentals
Voltage applied to the metal
(the “gate”): the Fermi level of
the metal and the shape of the
sc energy bands change.
a) accumulation; b) depletion;
c) inversion.
SCCD operation:
confinement and transfer of
charge
Confinement in depth: by
the potential well under
the gate
Lateral confinement:
VG1 > VG2 = VG3
CCDs: Basic and structure
For typical values of xo (oxide thickness) = 0.1 µ and VG 2 − VG1 = 5V, we get
QN, max = -1.7 · 10-7 C/cm2 = 1.06· 1012 electrons/cm2 in the inversion layer.
For gate area of 10 µm x 50 µm, this gives: QN, max = 5.3 · 106 electrons in the
charge packet. (Typical values: in the range of 1 to 5 ·106 electrons)
CCDs: Charge transfer
The charges produced at each
capacitor have to be
transferred to an electronic
storage or memory
Cross section of a three phase
CCD
We only need three gate
voltages (clock voltages) to
supply the device (Fig. c)).
They have equal amplitudes,
but they are shifted in time
with respect to each other
This type of waveform is
called a push clock.
References
[1] Optical Fiber Sensors: Principles and Components. Edited by John Dakin and Brian
Culshaw. Volume one. Artech House
[2] Semiconductor Devices. Physics and Technology. S. M. SZE. Wiley International Edition
[4] Physics of semiconductor devices. S. M. Sze. 2nd edition. Wiley International Edition
[5] Modular series on solid state devices. Advanced MOS devices. D. K. Schroder. Addison-
Wesley Publishing
[7] Optical Fiber Communications. G. Keiser. 3rd Edition. Mc Graw Hill International Editions.
[8] Optical Communication Systems. J. Gowar. 2nd Edition. Prentice Hall International.
[9] www.centrovision.com/tech2.htm