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detectores

Chapter 7 discusses photodetectors, including photomultipliers, photodiodes, and CCD devices, highlighting their structures, parameters, and applications. It emphasizes the importance of high sensitivity, fast response, and low noise in photodetector performance. Applications include optical fiber communications, optical disks, and optocouplers.
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0% found this document useful (0 votes)
2 views30 pages

detectores

Chapter 7 discusses photodetectors, including photomultipliers, photodiodes, and CCD devices, highlighting their structures, parameters, and applications. It emphasizes the importance of high sensitivity, fast response, and low noise in photodetector performance. Applications include optical fiber communications, optical disks, and optocouplers.
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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Chapter 7: Photodetectors

NPérez
SM Olaizola
2004
Outline
 Introduction
 Photomultipliers
 Photodiodes
 Parameters
 Characteristics: Quantum efficiency, Responsivity, Response speed,
Temperature effects, Noise.
 Photodiode structures:
 PIN Photodiode
 Schottky photodiode
 Avalanche photodiode
 Applications:
 Optical fiber communications systems
 Optical disks
 Optocouplers
 Bar-code readers
 CCD devices
 CMOS fundamentals
 CCD basics and structure
 CCD: Charge transfer
Introduction
 Photodetectors are used in decoding the information
that a light beam contains
Laser beam from a telecommunications link
Light from a star

 High performance requirements:
 High response or sensitivity in the wavelength range of the
emitter
 Fast response speed
 Insensitivity to temperature changes
 Compatible with different dimensions of optical fibers
 Low cost
 Long operating life
Introduction
 Photomultipliers: photocathode + electron multiplier
 High gain and low noise
 Big sizes and they need very high voltages to work

 Pyroelectric detectors: the detector absorbs photons, its


temperature changes the dielectric constant of the material
changes measured as a capacitance change
 Flat response over the range of measurement
 Very slow

 Phototransistors

 Photodiodes: conversion of light in electron-hole pairs.


 Small size, high sensitivity and small response time.
Photomultipliers
 Useful in detection of weak signals

D1
D3 Anode
Light
input e-

D2 D4 I meter

Photocathode Electric current output

 Photocathode + electron multiplier packaged in a vacuum tube


 Photocathode exposed to a photon flux generates electrons
that are amplified inside the tube
Photomultipliers

 Advantages of photomultipliers:
 Very high internal multiplication factors (> 106)
 Little additional noise is introduced
 Bandwidths of the order of 1 Gigahertz (very good for very
fast measurements)

 Main disadvantages:
 Low quantum efficiency (< 0.1)
 Large size
 Limited life
 Mechanical fragility
 Need for stable high voltage supplies, around 1kV
Photodiodes
 Semiconductor is illuminated by light with hν > Eg light is absorbed
in the semiconductor e- - h+ pairs are created
 Electric field applied induced carriers take part in electric
conduction photoconduction.
 Normal operation: reverse biased intrinsic region fully depleted.

 Designed so that most of the e- - h+ pairs are created in the intrinsic region
 Electric field in the intrinsic region separates an accelerates carriers
 Current flow can be observed in the external circuit.
Photodiodes: Parameters
 Diffusion length
1
Ln , p = (Dn , p ⋅ τ n , p ) 2

 τn, τp : electrons, holes lifetimes


 Dn, Dp: electrons, holes diffusion
constant

 Power absorption inside the


semiconductor
(
P ( x ) = Po 1 − e −α s ( λ )⋅ x )
 Po is the incident optical power
 αs is the absorption coefficient
Photodiodes: Parameters

Cut-off wavelength h⋅c 1.24


 λc = =
Eg E g (eV )
 Total photocurrent
q
Ip =

( )
Po 1 − e −α s ⋅W ⋅ (1 − R f )

 W depletion region width


 Rf reflectivity
q ⋅η
Also:
Ip = Po


 η: quantum efficiency (number of e- - h+ pairs created per incident photon)


Photodiodes: Quantum efficiency and
Responsivity

 Quantum efficiency: number


of e- - h+ pairs created for each
incident photon of energy hν.
Ip
q
η=
Po

 Responsivity: is the measure of
the sensitivity of the photodiode

Ip η
ℜ= = ⋅ λ ( µm )
Po 1.24
Photodiodes: Responsivity
 Responsivity
 In order to increase ℜ :
 A material very absorbing for the incident λ
 Depletion region with high, extended electric field
 Junction close to the surface
 Antireflection layer at the surface
 Spectral response ( ℜ vs. λ)
Photodiodes: Response speed
 Response speed. Limited by two factors:
 Charge collection time or transit time. Two components:
 Fast: carriers moving by drift in the depletion region
 Slow: Carriers diffusing until they reach the depletion region
 RC time constant, coming from:
 Capacity of the junction (Cj)
 Diode inner resistance (Rd) and load resistance (RL)
 Response time.

τ 2 = τ RC
2 2
+ τ trans 2
+ τ diff
 Cut-off frequency

1
f 3dB =
2πτ
Photodiodes: Temperature effects
 Temperature effects: ↑T ⇒ Two different effects:
 Shift in the quantum efficiency

 Exponential increase of the dark current


Photodiodes: Noise
 Noise: Rs

Equivalent
Ip: photocurrent
RL circuit for a
Il: leakage current Rd Vo
Cj photodiode
IN: noise equivalent current Ip Il IN

 Shot noise: an average photodetector current, I, always shows a


random fluctuation about this mean value: shot noise
 From the photocurrent I s , photo = 2qI p B

 From the dark current (bulk and surface) I s ,surface = 2qI L B I s ,dark = 2qI D B
 Total shot noise

I s2 = I s2, photo + I s2,dark + I s2, surface


Photodiodes: Noise
 Johnson noise: due to random movement of free electrons inside a
conductive media
4 KT ⋅ BW 1 1 1
IT = = +
R R Rd R L

2 2 2
 Total noise equivalent current: I N = I S + I T

 Noise Equivalent Power (NEP): minimum detectable power of the


photodiode
IN
NEP = (W)

 BER
PIN Photodiode

 Reach-through structure

ν layer: 103 < n- < 106


π layer: 103 < p- <106

 Basic operation
(reverse biased)
Schottky Photodiode

 Basic structure

• Mechanisms responsible of the photocurrent in a Schottky photodiode

band to band generation (hν > Eg) electron photoemission (hν > qФb)
Heterojunction Photodiode

GaInAs/InP photodiode. Front entry and substrate entry


Avalanche Photodiode (APD)

 APDs are photodiodes that internally


multiply the photocurrent

 Diode polarize above its breakdown


voltage

 Photogenerated carriers traverse a region


with a very high electric field ⇒ e- or h+ can
gain enough energy ⇒ ionize bond
electrons in the valence band (colliding) ⇒
impact ionization.

 Newly created carriers are also


accelerated by the high electric field ⇒
gaining enough energy to cause further
impact ionization: avalanche effect
Avalanche Photodiode (APD)

 Multiplication factor (gain) for the IM


carriers generated in the photodiode: M =
Ip
Photodiodes Applications:
Optical fiber communications systems

 LEDs and laser diodes emit light modulated with a signal and the
resultant optical signal is received with photodiodes

 Optical fiber communication systems can be divided between


digital and analog systems from the modulation point of view.

 Most long-haul and large capacity optical communication systems


are digital systems, and the analog systems are sometimes used
for transmitting information over a short distance.
Photodiodes Applications:
Optical fiber communications systems

 Analog system
(intensity modulation)

 Digital system

REPEATER

Signal electrically
Photodiode reformed Laser
and amplified

Optical signal Electrical Electrical Optical signal


(WEAK) signal signal
Photodiodes Applications:
Optical disks

 780 nm light collimated and


focused to a 1 µm ∅ of the
disk.
 Light reflected: pit (bump) ⇒
destructive interference
Photodiodes Applications:
Optocouplers and bar-code readers

 Optocouplers
 Connection of two circuits without an electric contact.
 Formed by a photoemissor and a photodetector

 Bar-code readers
 Decode the information through the digitalization coming from a light
source reflected on the code
 Bar code illuminated ⇒ dark bars absorb light and the spaces reflect
back to the scanner ⇒ transforms the fluctuations of light into electric
pulses
 The decoder converts the electric pulses into a binary code and
transmits the decoded information to a terminal
Charge Coupled Devices (CCDs)
MOS Fundamentals

 MOS technology based on a three-layer structure: Metal-Insulator


(Oxide)-Semiconductor
 Energy band diagram of an ideal MIS device under equilibrium (V=0)
[(a) n-type sc, (b) p-type sc]:

φm: metal work function; φB: potential barrier metal-insulator; χ: semiconductor electron
affinity; χi: insulator electron affinity: ψB: potential difference between EF and Ei
CCDs: MOS Fundamentals
 Voltage applied to the metal
(the “gate”): the Fermi level of
the metal and the shape of the
sc energy bands change.
 a) accumulation; b) depletion;
c) inversion.

• When light impinges onto the metal


surface, e--+ pairs are created in the
semiconductor
• p-type device. Electric field in the
depletion region ⇒ pushes created h+
away from the o-sc interface ⇒ e- get
trapped in the (potential) well under the
gate
•The developed charge is proportional to
the intensity of the incident light
CCDs: Basic and structure
 Arrays of detectors are used
to detect an entire image
 CCD: array of MOS
capacitors
 BCCD (Bulk CCD)

 SCCD (Surface CCD)

 SCCD operation:
confinement and transfer of
charge
 Confinement in depth: by
the potential well under
the gate
 Lateral confinement:
VG1 > VG2 = VG3
CCDs: Basic and structure

 A CCD can be operated only under conditions where charge


under a potential well never spills into adjacent wells

 Maximum charge that can be contained in a charge packet:

Q N , max = −C o (VG 2 − VG1 )

 For typical values of xo (oxide thickness) = 0.1 µ and VG 2 − VG1 = 5V, we get
QN, max = -1.7 · 10-7 C/cm2 = 1.06· 1012 electrons/cm2 in the inversion layer.
For gate area of 10 µm x 50 µm, this gives: QN, max = 5.3 · 106 electrons in the
charge packet. (Typical values: in the range of 1 to 5 ·106 electrons)
CCDs: Charge transfer
 The charges produced at each
capacitor have to be
transferred to an electronic
storage or memory
 Cross section of a three phase
CCD
 We only need three gate
voltages (clock voltages) to
supply the device (Fig. c)).
 They have equal amplitudes,
but they are shifted in time
with respect to each other
 This type of waveform is
called a push clock.
References
[1] Optical Fiber Sensors: Principles and Components. Edited by John Dakin and Brian
Culshaw. Volume one. Artech House

[2] Semiconductor Devices. Physics and Technology. S. M. SZE. Wiley International Edition

[3] Optoelectronics. An introduction to materials and devices. J. Singh. McGraw Hill


International.

[4] Physics of semiconductor devices. S. M. Sze. 2nd edition. Wiley International Edition

[5] Modular series on solid state devices. Advanced MOS devices. D. K. Schroder. Addison-
Wesley Publishing

[6] Apuntes de la asignatura: “Dispositivos optoelectrónicos”. Pedro Castillo Romón. E. T. S. I.


Telecomunicación. Universidad de Valladolid

[7] Optical Fiber Communications. G. Keiser. 3rd Edition. Mc Graw Hill International Editions.

[8] Optical Communication Systems. J. Gowar. 2nd Edition. Prentice Hall International.

[9] www.centrovision.com/tech2.htm

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