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Flip Flops

The document discusses various types of digital logic components including flip-flops, registers, and memory devices. It provides details on basic RS and clocked D flip-flops, master-slave flip-flops, and parallel registers. It also discusses metastability issues that can occur in flip-flops. Additional sections cover synchronous and asynchronous memory technologies like magnetic core memory, semiconductor memory, radiation-hardened PROM architecture, and EEPROM devices.

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Nagul Meera
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202 views

Flip Flops

The document discusses various types of digital logic components including flip-flops, registers, and memory devices. It provides details on basic RS and clocked D flip-flops, master-slave flip-flops, and parallel registers. It also discusses metastability issues that can occur in flip-flops. Additional sections cover synchronous and asynchronous memory technologies like magnetic core memory, semiconductor memory, radiation-hardened PROM architecture, and EEPROM devices.

Uploaded by

Nagul Meera
Copyright
© Attribution Non-Commercial (BY-NC)
Available Formats
Download as PPT, PDF, TXT or read online on Scribd
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Flip-Flops

Basic RS Flip-Flop (NAND)


1 0 S (set) 1 S R Q Q Q 1 0 0 1 1 1 0 1 (after S = 1, R = 0) 0 1 1 0 1 1 1 0 (after S = 0, R = 1) Q 0 0 1 1 (b) Truth table

1 0 R (reset) 2 (a) Logic diagram

A flip-flop holds 1 "bit". "Bit" ::= "binary digit."

Clocked D Flip-Flop
D 3

CP 4 2 Q

The present state is held when CP is low.

Clock Pulse Definition


Positive Pulse Negative Pulse

Positive Negative Edge Edge

Negative Positive Edge Edge

Edges can also be referred to as leading and trailing.

Master-Slave Flip-Flop
Y Master R R

S Slave

CP MASTER-SLAVE FLIP-FLOP

Flip-Flop on RT54SX-A (Not hardened)

Master

Slave

RT54SX-A SEU Performance


10-6

UMC A54SX32A 0.22 m Heavy Ion Test Device/Date Code = D7766.12 WFR #15 NASA/Goddard Space Flight Center Brookhaven National Lab October, 2000

Flip-Flop String Flip-Flop String w/ Buffers

Cross-section (cm /flip-flop)

10-7

Notes:

10-8

1. S/N LAN4001 2. Ions = 210 MeV Cl-35, 284 MeV Br-81, 345 MeV I-127 3. Fluence ~ 107 ions/cm2 4. Bias = 4.5, 2.25 VDC 5. Checkerboard pattern 6. Frequency = 1 MHz 7. 200 flip-flops / string 8. Regular CLK Buffer

10-9 0 10 20 30 40
2

50

60

LET (MeV-cm /mg)

RT54SX-S Latch (SEU Hardened)


AFB

B
A
S

ANQ
Y

Y A

A B C Y

B
C

BFB B
Y

BNQ
S

Y B

A B C

A B C Y
A Y

CFB B A CNQ
Y S A Y C A Y

A B C

A B Y

Flip-Flop Timing: RT54SX-S

Worst-case Military Conditions, VCCA=2.3, VCCI=3.0V, TJ=125C -1 Speed Grade Min Max Units tRCO Sequential Clock-to-Q 1.0 ns tCLR Asynchronous Clear-to-Q 0.9 ns tPRESET Asynchronous Preset-to-Q 1.0 ns tSUD Flip-Flop Data Input Set-Up 0.6 ns tHD Flip-Flop Data Input Hold 0.0 ns tWASYN Asynchronous Pulse Width 1.8 ns

Metastability - Introduction
Can occur if the setup, hold time, or clock pulse width of a flip-flop is not met. A problem for asynchronous systems or events. Can be a problem in synchronous systems. Three possible symptoms: Increased CLK -> Q delay. Output a non-logic level Output switching and then returning to its original state. Theoretically, the amount of time a device stays in the metastable state may be infinite. Many designers are not aware of metastability.

Metastability
In practical circuits, there is sufficient noise to move the device output of the metastable state and into one of the two legal ones. This time can not be bound. It is statistical. Factors that affect a flip-flop's metastable "performance" include the circuit design and the process the device is fabricated on. The resolution time is not linear with increased circuit time and the MTBF is an exponential function of the available slack time.

Metastability - Calculation
MTBF = eK2*t / ( K1 x FCLK x FDATA)
t is the slack time available for settling K1 and K2 are constants that are characteristic of the flip-flop Fclock and Fdata are the frequency of the synchronizing clock and asynchronous data.

Software is available to automate the calculations with built-in tables of parameters. Not all manufacturers provide data.

Metastability - Sample Data


Sample Metastable Time Data CX2001 Technology 50 MHz clock, 10 MHz data rate
25 20 15

log10 (MTBF (years))

10 5 0 -5 -10 -15 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

Note: Each flip-flop has its own K1, K2 parameters.

Slack Time (ns)

Synchronizer (Bad Circuit)


VCC Y D Q D DF1 CLK Q

DFC1B

EVENT

CLK CLR

SYSRESET

B AND 2A Y A

SYSCLK

Metastable State: Possible Output from a Flip-flop


CLK

D Metastable Q

Metastable State: Possible Outputs from a Flip-flop


CLK

Correct Output

Parallel Registers

DATA [ 3 : 0 ]
DF1 CLK

Q[3:0]

4-Bit Parallel Register

CLOCK

DF1 CLK

D DF1 CLK

D
DF1 CLK

4-Bit Register With Enable

DATA [ 3 : 0 ]
DF1 CLK

Q[3:0]

CLOCK

DF1 CLK

D DF1 CLK

D
DF1 CLK

Register Files (Simplified)


Register 2

Q D CLK
Register 1

Address - log2(num registers)


D and Q are both sets of lines, with the number of lines equal to the width of each register. There are often multiple address ports, as well as additional data ports.

Memory Devices

Magnetic Core Memory


Register

Decoder (AND plane) Sense wires serve as OR plane.

Semiconductor Memory
Address inputs

Data inputs D0 Word 0 BC Word 1 BC BC BC BC BC

D1

Decoder (AND plane)

D2

Word 2 BC Word3 BC BC BC BC BC

D3 Memory enable Read/write

OR plane
Data outputs

Rad-Hard PROM Architecture


A5 - A11
Row Decoders Memory Array

A0 - A4
A12 - A14 CE OE VPP*

Column Decoders Section Select

Column Muxing and Sense Amps

Control Logic

I/O Buffers

No latches in this architecture

DQ0 - 7

W28C64 EEPROM
Simplified Block Diagram
Row Address Latches Column Address Latches Row Address Decoder Column Address Decoder 64 Byte Page Buffer E2 Memory Array A6-12

A0-5

CE* WE*

Edge Detect & Latches Latch Enable

Timer

I/O Buffer/ Data Polling Control Logic

OE*

Control Latch

PE

RSTB

CLK

VW

I/O0-7

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