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Instituto Especializado de Estudios Superiores Loyola: Statistical Process Control"

What is Statistical Process Control? Here you have a short presentation that will increase your knowledge about it and what you can do with it.

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Angel Casilla
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38 views

Instituto Especializado de Estudios Superiores Loyola: Statistical Process Control"

What is Statistical Process Control? Here you have a short presentation that will increase your knowledge about it and what you can do with it.

Uploaded by

Angel Casilla
Copyright
© © All Rights Reserved
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd
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Instituto Especializado de Estudios Superiores Loyola

Statistical Process Control

ngel Casilla 11-03-0069


Henry Garca 11-03-0078
Victor Urbaez
November 17th 2014

Statistical Process Control

Statistical process control is a


collection of tools that when used
together can result in process stability
and variance reduction

Statistical Process Control

The seven major tools are


1) Histogram
2) Pareto Chart
4) Cause and Effect Diagram
5) Defect Concentration Diagram
6) Control Chart
7) Scatter Diagram
8) Check Sheet

Statistical Process Control


The objective of a process
control system is to provide a
statistical signal when
assignable causes of variation
are present

Natural Variations
Also called common causes
Affect virtually all production
processes
Expected amount of variation
Output measures follow a
probability distribution
For any distribution there is a
measure of central tendency and
dispersion
If the distribution of outputs falls
within acceptable limits, the
process is said to be in control

Assignable Variations
Also called special causes of
variation
Generally this is some change in the process

Variations that can be traced to a


specific reason
The objective is to discover when
assignable causes are present
Eliminate the bad causes
Incorporate the good causes

Types of Data
Variables
Characteristics
that can take
any real value
May be in whole
or in fractional
numbers
Continuous
random
variables

Attributes
Defect-related
characteristics
Classify
products as
either good or
bad or count
defects
Categorical or
discrete random
variables

Control Charts
Constructed from historical
data, the purpose of control
charts is to help distinguish
between natural variations and
variations due to assignable
causes

Important uses of the control chart

1. Most processes do not operate in a state of statistical


control
2. Consequently, the routine and attentive use of control
charts will identify assignable causes. If these causes
can be eliminated from the process, variability will be
reduced and the process will be improved
3. The control chart only detects assignable causes.
Management, operator, and engineering action will be
necessary to eliminate the assignable causes.

Statistical Process Control


(SPC)

The process above is in apparent statistical control.


Notice that all points lie within the upper control limits

(UCL) and the lower control limits (LCL). CL-centerline


This process exhibits only common cause variation.

The process above is out of statistical control.


Notice that a single point can be found outside the

control limits (above them).


This means that a source of special cause variation is
present.
Having a point outside the control limits is the most
easily detectable out-of-control condition.

Process Capability
The natural variation of a process
should be small enough to
produce products that meet the
standards required
A process in statistical control
does not necessarily meet the
design specifications
Process capability is a measure of
the relationship between the
natural variation of the process
and the design specifications

Process Capability Ratio


Upper Specification - Lower Specification
Cp =
6
A capable process must have a
Cp of at least 1.0
Does not look at how well the
process is centered in the
specification range
Often a target value of Cp = 1.33
is used to allow for off-center
processes
Six Sigma quality requires a Cp =

Process Capability Index


Cpk = minimum of

Upper
Specification - x
,
Limit

Lower
x - Specification
Limit

A capable process must have a Cpk of


at least 1.0
A capable process is not necessarily
in the center of the specification,
but it falls within the specification
limit at both extremes

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