Statistical Process Control: Samir Mistry
Statistical Process Control: Samir Mistry
Control
By
Samir Mistry
© 2005 Wiley
Learning Objectives
Using statistical tools in measuring quality
characteristics
Identify and describe causes of variation
Describe the use of control charts
Identify the differences between x-bar, R-,
p-, and
c-charts
Explain process capability and process
capability index
Three SQC Categories
Traditional descriptive statistics
e.g. the mean, standard deviation, and range
Acceptance sampling used to randomly inspect a batch
of goods to determine acceptance/rejection
Does not help to catch in-process problems
Statistical process control (SPC)
Involves inspecting the output from a process
Quality characteristics are measured and charted
Helpful in identifying in-process variations
Sources of Variation
Common causes of variation
Random causes that we cannot identify
Unavoidable
e.g. slight differences in process variables like diameter, weight,
service time, temperature
(n)
A2 D3 D4
2 1.88 0.00 3.27
0.2 0.3 0.2
R .233 3 1.02 0.00 2.57
3 4 0.73 0.00 2.28
5 0.58 0.00 2.11
6 0.48 0.00 2.00
UCL R D4 R 2.28(.233) .53 7 0.42 0.08 1.92
LCL R D3 R 0.0(.233) 0.0 8 0.37 0.14 1.86
9 0.34 0.18 1.82
10 0.31 0.22 1.78
11 0.29 0.26 1.74
12 0.27 0.28 1.72
13 0.25 0.31 1.69
14 0.24 0.33 1.67
15 0.22 0.35 1.65
R Control Chart
Second Method for the X-bar Chart Using
R-bar and the A2 Factor (table 6-1)
Use this method when sigma for the process
distribution is not know
Control limits solution:
Cp=
Computing the Cpk Value at Cocoa Fizz
Design specifications call for a
target value of 16.0 ±0.2 OZ.
(USL = 16.2 & LSL = 15.8)
Observed process output has now
shifted and has a µ of 15.9 and a
σ of 0.1 oz.
16.2 15.9 15.9 15.8
Cpk min ,
3(.1) 3(.1)
.1
Cpk .33
.3
Cpk is less than 1, revealing that
the process is not capable
±6 Sigma versus ± 3 Sigma
Motorola coined “six-sigma” to PPM Defective for ±3σ
describe their higher quality versus ±6σ quality
efforts back in 1980’s