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MODULE 4 - Introduction To Ebsd

This document provides an introduction to electron backscatter diffraction (EBSD). It discusses the history of EBSD, beginning with the observation of Kikuchi lines in 1928. It describes how EBSD allows for the characterization of crystallographic orientations, misorientations, textures, grain size, and boundary types on a sub-micron scale. The document outlines the basic hardware components used in EBSD, including the sample tilt of 70.5 degrees and forward scattered electron imaging capabilities. It provides examples of EBSD crystal orientation mapping with inverse pole figure color keys.

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Omar Villanueva
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102 views

MODULE 4 - Introduction To Ebsd

This document provides an introduction to electron backscatter diffraction (EBSD). It discusses the history of EBSD, beginning with the observation of Kikuchi lines in 1928. It describes how EBSD allows for the characterization of crystallographic orientations, misorientations, textures, grain size, and boundary types on a sub-micron scale. The document outlines the basic hardware components used in EBSD, including the sample tilt of 70.5 degrees and forward scattered electron imaging capabilities. It provides examples of EBSD crystal orientation mapping with inverse pole figure color keys.

Uploaded by

Omar Villanueva
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPT, PDF, TXT or read online on Scribd
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MODULE 4 - Introduction to

EBSD
EBSD = Electron Backscatter Diffraction
EBSD is a technique that allows:
• Crystallographic Orientations
• Misorientations
• Texture trends
• Grain size and boundary types
• Phases
To be characterised and quantified on a sub-micron scale
Introduction to EBSD - History
• 1928 Kikuchi lines observed in TEM
• 1954 Alam: patterns obtained in TEM
• 1973 Venebles: patterns recorded on film in SEM
• 1980 Patterns imaged with low light TV cameras
• 1990 Automatic pattern solving using Hough transform
• Present day
– Local orientation and misorientation measurements
– Crystal Orientation Mapping (COM)
– Special grain boundaries imaged
– Special textures revealed
– Grain sizing
Introduction to EBSD - Hardware
• Schematic layout o
components
Introduction to EBSD - Collection
Geometry
• 70.5 deg tilt
• Approx. 70
steradian of
pattern
detected
• Distances
shown are
arbitrary
Introduction to EBSD - Forward
Scattered Electron Imaging (FSE)
• FSE greatly
enhances
diffraction
contrast in
imaging
• Grains and
grain
boundaries
are clearly
revealed
Introduction to EBSD - FSE Examples

• Nickel

• Austenitic
Stainless
Steel
Introduction to EBSD - Crystal
Orientation Mapping (COM)
• Crystal uses reference electron image
• Orientation obtained at every pixel
• Color derived from inverse Pole Figure
color key
• Hough transform for every pixel stored for
post acquistion reprocessing
Introduction to EBSD - Color Key for
COMs
• COM with
Inverse Pole
Figure color
key for cubic
material
• Red = 100
• Green = 110
• Blue = 111
planes parallel
to the surface

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