8.semicondutor Devices
8.semicondutor Devices
Formation of pn-junction:
Potential barrier
V
P-region N-region
+
+
+
Depletion Layer
Depletion region:
N P
Cathode Anode
_
+
Energy band structure of PN-junction
P - type N - type
E E
Ec Ec EC
EC
EFP
EFP
Ev Ev
Conduction band
E
Ec Ec
EFn
EFP
Valence band
Depletion region
E
PN - junction
EFp EFn
Fermi level
Valence band
eVB
P N
V - I characteristics of PN junction:
1. zero bias
ECP
eVB
EFP ECP
EVP EFn
eVB
EVn
2. Forward bias
Potential barrier
V
P-region N-region
+
+
+
+
Depletion Layer
ECP
e( VB- VF)
ECP
EFn
EFP
EVP
e (VB – VF)
EVn
3. Reverse bias
Potential barrier
V
P-region N-region
+
+
+
+
Depletion Layer
ECP
e( VB-+Vr)
ECP
EFP
EFn
EVP
e (VB + Vr)
EVn
I
current
Reverse bias
V
Forward bias
Zener voltage
Leakage current
Diffusion of majority carriers:
transformaer
B
Full wave rectifier
Center tapped
transformer
A
A.C input
B
D .C output
Efficiency of a rectifier :
op (d .c) power
efficieny
ip (a.c) power
Light emitting diodes:
Principle:
Cathode
Current
I(MA)
V
Photo diode
+
P-diffusion
Depletion region
N-type
N+ contact region
P Depletion region N N+
Anode Cathode
+
_