Class 2
Class 2
presentation
BITS Pilani Prof. Kranthi Kumar Palavalasa
Electrical and Electronics Engineering
Pilani Campus
BITS Pilani
Pilani Campus
Chap
BITS Pilani, Pilani 2-3
Campus
Solid-State Electronic
Materials
Electronic materials fall into three categories (WRT resistivity):
– Insulators > 105 -cm (diamond = 1016 )
– Semiconductors 10-3 < < 105 -cm
– Conductors < 10-3 -cm (copper = 10-6 )
Elemental semiconductors are formed from a single type of atom of column IV,
typically Silicon.
Silicon quickly replaced germanium due to its higher bandgap energy, lower cost, and
ability to be easily oxidized to form silicon-dioxide insulating layers.
Chap
BITS Pilani, Pilani 2-4
Campus
Semiconductor Materials
Bandgap is an energy range in a solid where no electron states can exist. It
refers to the energy difference between the top of the valence band and
the bottom of the conduction band in insulators and semiconductors
Chap
BITS Pilani, Pilani 2-5
Campus
Semiconductor Materials
(cont.)
Bandgap
Semiconductor Energy EG (eV)
Carbon (diamond) 5.47
Silicon 1.12
Germanium 0.66
Tin 0.082
Gallium arsenide 1.42
Gallium nitride 3.49
Indium phosphide 1.35
Boron nitride 7.50
Silicon carbide 3.26
Cadmium selenide 1.70
Chap
BITS Pilani, Pilani 2-6
Campus
Covalent Bond Model
• Silicon has four electrons in the outer shell.
• Single crystal material is formed by the covalent bonding of each
silicon atom with its four nearest neighbors.
Chap
BITS Pilani, Pilani 2-7
Campus
Silicon Covalent Bond Model
(cont.)
Silicon atom
Chap
BITS Pilani, Pilani 2-8
Campus
Silicon Covalent Bond Model
(cont.)
Covalent bond
Chap
BITS Pilani, Pilani 2-9
Campus
Silicon Covalent Bond Model
(cont.)
Chap
BITS Pilani, Pilani 2 - 10
Campus
Silicon Covalent Bond Model
(cont.)
Chap
BITS Pilani, Pilani 2 - 11
Campus
Silicon Covalent Bond Model
(cont.)
• Near absolute zero, all bonds are complete • Increasing temperature adds energy to the
system and breaks bonds in the lattice,
• Each Si atom contributes one electron to generating electron-hole pairs.
each of the four bond pairs • The pairs move within the matter forming
• The outer shell is full, no free electrons, semiconductor
silicon crystal is an insulator • Some of the electrons can fall into the
holes – recombination.
Chap
BITS Pilani, Pilani 2 - 12
Campus
Intrinsic Carrier Concentration
Chap
BITS Pilani, Pilani 2 - 13
Campus
Intrinsic Carrier Concentration
(cont.)
Electron density is n (electrons/cm3)
and for intrinsic material n = ni.
Intrinsic refers to properties of pure
materials.
ni ≈ 1010 cm-3 for Si
The density of silicon atoms is na ≈
5x1022 cm-3
Thus at a room temperature one
bond per about 1013 is broken
Chap
BITS Pilani, Pilani 2 - 14
Campus
Electron-hole concentrations
Chap
BITS Pilani, Pilani 2 - 15
Campus
Drift Current
Charged particles move or drift under the influence of the applied field.
The resulting current is called drift current.
Electrical resistivity and its reciprocal, conductivity , characterize current flow in a
material when an electric field is applied.
Drift current density is
j = Qv [(C/cm3)(cm/s) = A/cm2]
j = current density, (Coulomb charge moving through a unit area)
Q = charge density, (Charge in a unit volume)
v = velocity of charge in an electric field.
Note that “density” may mean area or volumetric density, depending on the context.
Chap
BITS Pilani, Pilani 2 - 16
Campus
Mobility
Chap
BITS Pilani, Pilani 2 - 17
Campus
Velocity Saturation
At high fields, carrier velocity saturates and places upper limits on the speed
of solid-state devices.
Chap
BITS Pilani, Pilani 2 - 18
Campus
Intrinsic Silicon Resistivity
Analysis: Charge density of electrons is Qn = -qni and for holes is Qp = +qni. Thus:
Recalling the classification in the beginning, intrinsic silicon is near the low end of
the insulator resistivity range
Conclusions: Resistivity has been found, and intrinsic silicon is a poor insulator.
Chap
BITS Pilani, Pilani 2 - 20
Campus
Semiconductor Doping
Chap
BITS Pilani, Pilani 2 - 21
Campus
Donor Impurities in Silicon
Chap
BITS Pilani, Pilani 2 - 22
Campus
Acceptor Impurities in Silicon
q
e
Vacancy
q
Chap
BITS Pilani, Pilani 2 - 23
Campus
Acceptor Impurities – Hole
propagation
Chap
BITS Pilani, Pilani 2 - 24
Campus
Acceptor Impurities – Hole
propagation
Hole
Chap
BITS Pilani, Pilani 2 - 25
Campus
Acceptor Impurities – Hole
propagation
Hole
Chap
BITS Pilani, Pilani 2 - 26
Campus
Acceptor Impurities – Hole
propagation
Chap
BITS Pilani, Pilani 2 - 27
Campus
Doped Silicon Carrier Concentrations
(how to calculate)
In doped material, the electron and hole concentrations are no longer equal.
If n > p, the material is n-type.
If p > n, the material is p-type.
The carrier with the largest concentration is the majority carrier, the smaller
is the minority carrier.
ND = donor impurity concentration
NA = acceptor impurity concentration atoms/cm3
Charge neutrality requires q(ND + p - NA - n) = 0:
positive charge: p (holes) + ND (ionized donors)
negative charge: n (electrons) + ND (ionized acceptors)
It can also be shown that pn = ni2, even for doped semiconductors in thermal
equilibrium.
Chap
BITS Pilani, Pilani 2 - 28
Campus
n-type Material
Solving for n
(N D N A ) (N D N A ) 2 4n i2 n i2
n and p
2 n
For (ND - NA) >> 2ni, n (ND - NA) .
Chap
BITS Pilani, Pilani 2 - 29
Campus
p-type Material
Similar to the approach used with n-type material we find the following
equations:
(N A N D ) (N A N D ) 2 4n i2 n i2
p and n
2 p
We find the majority carrier concentration from charge neutrality and find the
minority carrier concentration from the thermal equilibrium relationship.
Chap
BITS Pilani, Pilani 2 - 30
Campus
Practical Doping Levels
For practical doping levels (dopant concentration usually is quite larger then
ni):
n (ND - NA) for n-type material
p (NA - ND) for p-type material.
Typical doping ranges are 1014/cm3 to 1021/cm3.
Chap
BITS Pilani, Pilani 2 - 31
Campus
Mobility and Resistivity in
Doped Semiconductors
Chap
BITS Pilani, Pilani 2 - 32
Campus
Diffusion Current
This gives rise to a diffusion current resulting from the natural tendency of
carriers to move from high concentration regions to low concentration
regions.
Chap
BITS Pilani, Pilani 2 - 33
Campus
Diffusion Current (cont.)
A bar of silicon (a) into which holes are injected, thus If the electrons are injected and the electron-
creating the hole concentration profile along the x concentration profile shown is established in
axis, shown in (b). The holes diffuse in the positive a bar of silicon, electrons diffuse in the x
direction of x and give rise to a hole-diffusion current direction, giving rise to an electron-diffusion
in the same direction. current in the negative -x direction.
Chap
BITS Pilani, Pilani 2 - 34
Campus
Diffusion Current (cont.)
p p
j pdiff ( q) D p qD p A/cm 2
x x
diff n n
jn (q) Dn qDn A/cm 2
x x
Chap
BITS Pilani, Pilani 2 - 35
Campus
Diffusion Current (cont.)
Dp and Dn are the hole and electron diffusivities with units cm2/s. Diffusivity
and mobility are related by Einsteins’s relationship:
Dn kT D p
VT Thermal voltage
n q p
Dn n VT , D p p VT
Chap
BITS Pilani, Pilani 2 - 36
Campus
Total Current in a Semiconductor
Total current is the sum of drift and diffusion current:
T n
j q n nE qDn
n
x
T p
j p q p pE qD p
x
Rewriting using Einstein’s relationship (Dp = nVT),
T 1 n
j q n n E VT
n In the following sections, we will use
n x these equations, combined with
Gauss’ law, (E)=Q, to calculate
T 1 p currents in a variety of
j q p p E VT
p semiconductor devices.
p x
Example here
Chap
BITS Pilani, Pilani 2 - 37
Campus
Semiconductor Energy Band
Model
What happens as
temperature increases?
Chap
BITS Pilani, Pilani 2 - 38
Campus
Semiconductor Energy Band
Model
Chap
BITS Pilani, Pilani 2 - 39
Campus
Energy Band Model for a
Doped Semiconductor
Chap
BITS Pilani, Pilani 2 - 40
Campus
Energy Band Model for a
Doped Semiconductor