DFT Shift and Capture Concept

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DFT Shift and Capture Concept

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rishavrk692

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DFT: Shift and Capture Concepts

• Essential operations in Design for Testability

(DFT).
Shift Operation

• Loading test patterns into scan chains.

• Sequentially shifts test patterns through flip-
flops.
• Verifies scan chain connectivity and
functionality.
Capture Operation

• Captures the response to the applied test

patterns.
• Stimulates the circuit with a test clock pulse.
• Observes circuit functionality under test
conditions.
Combined Operation

• Cycle: Shift → Capture → Shift Out.

• Purpose: Enables fault detection by comparing
expected vs actual responses.

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DFT Shift and Capture Concept

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DFT Shift and Capture Concept

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DFT: Shift and Capture Concepts

• Essential operations in Design for Testability

• Loading test patterns into scan chains.

• Captures the response to the applied test

• Cycle: Shift → Capture → Shift Out.

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