UNIT I MAND I_2024
UNIT I MAND I_2024
CONTENTS
UNIT I CONCEPTS OF MEASUREMENTS
ELECTRICAL SYSTEMS
Data storage
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Measuring Element
Quantity
Reproducibility: The degree of closeness with which a given value may be repeatedly
measured. It may be specified in turns of units for a given period of time.
Drift : Means that with given input the measured value do not vary with time. It can
classified into Zero, Span or Sensitive and Zonal Drift.
Zero drift:
If entire calibration shifts due to
slippage permanent or due to
Undue warming up of electronic
tube circuits zero drift occurs
as shown in fig .
Span (or) Sensitivity drift: If Zonal drift: If the drift occurs
there is proportional change only over a portion of span over
in the indication all along the a portion of instrument, it is
upward scale, the drift is called as zonal drift as shown in
called span on sensitivity fig
drift as shown in fig
As the input varies from instant to instant , output also varies from
instant to instant. The behavior of the system under such conditions is
called dynamic response.
DYNAMIC BEHAVIOR
Dynamic behavior of an instrument is determined by applying some form of known and
predetermined input to its primary element and study the output – The behavior is judged
for three types of input as shown in figure
Speed of response
It is defined as the rapidity with which a measurement system responds to
changes in the measured quantity.
Measuring lag
It refers to retardation or delay in the response of an instrument to change in
the input signal. The measurement lags are of two types
Fidelity: It is defined as the degree to which a measurement system
indicates changes in the measured quantity without any dynamic
error.
Dynamic error: Is difference between the true value of the quantity
changing with the time and the value indicated by the instrument if
no static error is assumed.
ERRORS IN MEASUREMENT
There is always some difference between the actual value and
1. Gross errors
2. Systematic errors
3. Random errors
ERRORS
number of observers.
ERRORS CONTD
2. Systematic errors:
They are classified as
a. Instrumental errors
b. Environmental errors
c. Observational errors
Instrumental errors: Errors due following reasons:
a. Due to inherent short comings in instrument
b. Due to misuse of the instruments
c. Due to loading effects
ERRORS- INSTRUMENT - INHERENT
SHORT COMINGS
These errors are inherent in instruments because of their
Instrument Mechanical Structure causes inherent short comings and
are follows:
• Construction
• Calibration / Operation of instrument / measuring
devices
Example:
The spring used for producing controlling torque of permanent
magnet instrument become weak, the instrument will read high.
Others Errors: Misuse of instruments, Due to loading effects.
Elimination process: Careful planning and recalibration.
ENVIRONMENTAL ERRORS
Environmental errors emerge due to usage of an instrument in different
conditions other than for which it is assembled and calibrated.
1. Temperature
2. Pressure
3. Humidity
4. Dust
5. Vibration
Elimination of Environmental Errors:
a. Usage of instrument under temperature / pressure
controlled conditions
b. Deviation in local environmental errors be determined and
suitable correction to instrumental readings applied.
c. Automatic compensation employing devices
d. New calibration made in the changed conditions.
OBSERVATIONAL ERRORS
Observational errors: Occur due to improper observation made by the
observer.
Example:
The pointer of a voltmeter rests slightly above the surface of scale.
An error on account of parallax will be incurred unless the line vision of
the observer is exactly above the pointer.
Elimination of Observational Error
To minimize parallax errors , highly accurate meters are provided with
mirrored scales.
RANDOM AND LIMITING
ERRORS
1.Multisample test
2.Single sample test
Multisample test
In this test , repeated measurement of a given quantity are done
using different test conditions such as employing different ways
of measurement and by employing different observation.
Simply making measurements with the same equipment ,
procedure and technique and same observer does not provide
multisample test.
Single sample test
A single measurement done under specific condition is known
as single sample test.
STATISTICAL EVALUATION OF DATA
MEASUREMENT
To obtain the probable true value of the measured quantity.
X = X1+X2+X3+…….+Xn = ЄX
n n
Parallel connection :
R = R1R2 / (R1 + R2) = 78.75 x 37.8 / (78.75 + 37.8)
= 25.54Ω
Rated value of parallel resistors = 75x36 /(75+36)
= 24.32Ω
Limiting error = 25.54 -24.32 = 1.22Ω
Problems - contd
1. Primary calibration
2. Secondary calibration
3. Direct calibration
4. Indirect calibration
5. Routine Calibration
Calibration Procedure
1. Primary Standards
2. Secondary standards
3. Teritiary standards
4. Working standards
SECONDARY STANDARDS
These are close copies of primary standards w.r.t design,
material & length. Any error existing in these standards is
recorded by comparison with primary standards after long
intervals. They are kept at a number of places under great
supervision and serve as reference for tertiary standards.
This also acts as safeguard against the loss or destruction of
primary standards.
TERITIARY STANDARDS:
The primary or secondary standards exist as the ultimate controls
for reference at rare intervals.
Tertiary standards are the reference standards employed by
National Physical laboratory (N.P.L) and are the first standards to
be used for reference in laboratories & workshops.
They are made as close copies of secondary standards & are kept
as reference for comparison with working standards.
Working standards:
These standards are similar in design to primary, secondary &
tertiary standards.
But being less in cost and are made of low grade materials, they
are used for general
applications in metrology laboratories.