IRJET- Design and Implementation of High Speed, Low Power Charge Shared Reset Method based Dynamic Latch Comparator using 45nm CMOS Technology
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This document presents the design and implementation of a high-speed, low-power charge shared reset method based dynamic latch comparator using 45nm CMOS technology. The proposed comparator architecture uses a charge shared reset technique where the output voltage levels are held at a constant value during the reset phase, allowing for faster comparison during the evaluation phase. This reduces power consumption and delay. The comparator was designed and tested using Cadence Virtuoso 45nm tools. Simulation results show the proposed comparator has a power consumption of 128nW, delay of 22.8ps, and area of 21.56μm2, demonstrating improved performance over existing comparator designs.
![International Research Journal of Engineering and Technology (IRJET) e-ISSN: 2395-0056
Volume: 06 Issue: 07 | July 2019 www.irjet.net p-ISSN: 2395-0072
© 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 2172
DESIGN AND IMPLEMENTATION OF HIGH SPEED, LOW POWER CHARGE
SHARED RESET METHOD BASED DYNAMIC LATCH COMPARATOR
USING 45nm CMOS TECHNOLOGY
SHUBHASHREE P R1, SAVIDHAN SHETTY C S2
1Student, Dept. of ECE, Sahyadri College of Engineering & Management, Karnataka, India
2Assistant Professor, Dept. of ECE, Sahyadri College of Engineering & Management, Karnataka, India
---------------------------------------------------------------------***----------------------------------------------------------------------
Abstract - An analog to digital converter (ADC) is an
essential building block to run the semiconductor industry.
Comparator is an important component of ADCs. The high
speed, low voltage, area efficient, and low power optimized
comparators are very important to enhance the performance
of the ADCs. This paper presents Charge shared reset method
based dynamic comparator design using Cadence virtuoso
45nm technology. The main aim of the project is to design low
power, high speed, optimized Dynamic latch comparator
which is very useful for the electronic industries where low
power and optimized performance are the prime concerns. In
the proposed comparator architecture, outputs of the
comparator will not go below the thresholdvoltageduringthe
reset phase of the clock which will be held at a constant
voltage level. Hence quicker comparison of the signals can be
achieved at the start of the evaluation phase. This will
significantly reduce power and delay in the design.
Key Words: ADC, Dynamic Comparator, Low power
design, Delay, minimum area, Cadence virtuoso 45nm
technology.
1. INTRODUCTION
The continuous improvementinCMOStechnologyallowsthe
researchers to manufacture completely on-chip devices
without trading off the performance parameters. The
comparator is the fundamental component of the ADCs. The
function of the comparator circuit is tocomparetwosame or
dissimilar electrical signals. Comparators are used in wide
variety of the applicationssuchasRF communications,ADCs,
memory detecting circuits, testing oscilloscope,inswitching
power regulators, and signal recognition systems etc. These
days, where interest for portable battery operateddevicesis
expanding, a noteworthy significance is given towards low
power designs forhighspeedapplications.Comparatoristhe
decision making circuits which has crucial influence on the
performance of high speed applications. The proposed
comparator architecture is based on shared charge reset
technique. The proposed architecture is a dynamic latch
comparator, where output voltage level will not go less than
the threshold voltage during reset phase of clock. This is a
low voltage, high speed optimized comparator through
which we can achieve quicker comparison between two
signals. The circuit area is also optimized by using Cadence
virtuoso 45nm technology. The symbol of a comparator is
shown in Fig -1. The cmos comparator is well known as a
decision making circuit.
Fig -1: Comparator symbol
If Vp>Vn then the output, Vout = Vdd =logic1. If Vp<Vn then
the output, Vout = ground= logic0. Thecomparatorconverts
analog input signal into digital output signal hence,
comparator has vital effect ontheperformanceofhighspeed
applications. The low power, high speed comparators will
improve the performance of ADCs. An optimized design for
dynamic comparator is proposed in this project focusing on
main performance parameters such as silicon area, delay,
PDP, and power consumption management.
2. LITERATURE SURVEY
The variety of comparator circuits were focused from
various leading technical papersarestudiedanddiscussedin
this section. Sagar Kumar Vinodiya and R S Gamad [1]
proposed a high speed comparator which has a differential
input stage along with a latch stage. Herecomparatordesign
is optimized to get minimum power and delay. The dynamic
latch comparator has delay of 0.56ns and power
consumption of 96.5pw. But this comparator requires more
area as it has many transistors in the circuit. The circuit was
designed and tested using SCL 180nm technology by using
ADE tool of Cadence. Shabi Tabassum and Anush Bekal [2]
proposed a comparator, which consists of preamplifier and
latch stage. This comparator architecture which helps to
remove the kickback noise anddcoffsetvoltage.Theaverage
power consumed in the design was 70µW. This design was](https://image.slidesharecdn.com/irjet-v6i7308-191112065045/85/IRJET-Design-and-Implementation-of-High-Speed-Low-Power-Charge-Shared-Reset-Method-based-Dynamic-Latch-Comparator-using-45nm-CMOS-Technology-1-320.jpg)
![International Research Journal of Engineering and Technology (IRJET) e-ISSN: 2395-0056
Volume: 06 Issue: 07 | July 2019 www.irjet.net p-ISSN: 2395-0072
© 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 2173
made in 180nm CMOStechnology with thelowvoltageof 1V.
The proposed architecture is used in Successive
Approximation ADCs. VijaySavaniandN.M.Devashrayee [3]
analyzed different types of dynamic latch comparators and
listed various types of performance parameters. The Single
tail dynamic latch comparator has high impedance at input
stage and minimum static power dissipation. But this has
high power dissipation and low speed of operation. The
double tail current dynamic latchedcomparatorarchitecture
provides low offset and minimum delay. The layout of this
comparator occupies more silicon area. The shared charge
reset technique comparator has minimum delay and power
consumption in the circuit. This comparator architecture is
implemented in 90nm technology using gpdk90 technology
in cadence tool which has delay of 50.9ps and power
consumption of 31.80 μW. Anil Khatak, Manoj Kumar, and
Sanjeev Dhull [4] introduced a Comparator with two cross-
coupled Inverters for ADCs using 90nm technology. This
comparator was designed using SPICE in 90 nm technology
with minimum delay and power consumption. The two
Cross-Coupled Inverters implemented in this comparator
architecture has zero static power dissipation. This
Comparator is utilized in successive approximation ADCs.
Ms. Aayisa Banu S and Mr. Ramesh K [5] designed a
comparator which acts as the quantizer in the ADCs
applications. The proposed architecture uses CMOS
Operational Amplifier design technique. Theparasitic effects
limits the performance the comparators, hence the parasitic
effects are greatly minimized in this design.Thiscomparator
is designed by using gpdk180 technology library in Cadence
tool. B.B.A. Fouzy and Bhuiyan [6] proposed pre-amplifier-
latch based comparator using 0.13µm CMOS process in
Design IC of Mentor Graphics environment. In order to get
high speed comparator thecombinationofanamplifierstage
and latch circuit is implemented in this comparator. The
proposed comparator architecture has 0.65ns of delay,
1.5nW of power and occupies 256µm2 of silicon space. This
comparator is mainly used in area efficient, very low-power,
and rapid ADCs.
2. SCHEMATIC DIAGRAM AND OPEARTION OF
PROPOSED COMPARATOR
The proposed project is implemented using Cadence
virtuoso 45nm tool. In all other dynamic latch comparator,
during reset phase the outputterminal eitherchargedto Vdd
or discharged to ground GND. In this proposed comparator
uses new reset technique, in which charge isretainedduring
reset phase. The circuit diagram of Charge shared dynamic
comparator is shown in Fig -2.
Fig -2: Circuit diagram of proposed comparator
The proposed comparator operates during reset phase
(CLK=0) and evaluation phase (CLK=1) of the clock signal.
When CLK = 0, the transistors MT1 and MT2 are turned OFF
and both Fn and Fp terminals will bechargedtoVddthrough
M3 and M4. Then the transistors MI1 and MI2 are turned
ON. The pass transistor SC shorts the output terminals Outp
and Outn during the reset phase. The pass transistor SC
shares the charge between two output terminals Outp and
Outn, as one of the output terminal will be at Vdd and other
at Gnd after the previous evaluation phase. Hence output
terminals will be held at constant voltage level. When CLK =
1, the transistors MT2 and MT1 are ON and transistors M3
and M4 are OFF. Both Fn and Fp terminals will discharge at
different speed which depends on the inputs applied to the
circuit. If Vinp > Vinn, the terminal Fn discharges fasterthan
Fp and vice versa. If the potential at terminals Fp or Fn,
becomes less than the threshold voltage of transistor (MI2
or MI1), the transistor MI2 or MI1 turns OFF. Thelatchstage
of the comparator drives, one output to Vdd and other
output to ground. Thus input signals can be compared at
quickly during evaluation phase. This greatly reduces the
delay and power consumption in the circuit.
3. IMPLEMENTATION
The comparator circuit schematic is designed and tested
using Cadence Virtuoso 45nm tool is shown in Fig -3. The
circuit has two input terminals (Vinp, Vinn), two output
terminals (Outp, Outn), high frequency clock signal, and
supply voltage of 1V. The proposed comparator is tested
with different input parameters and verified for correct
output. The transient response of the comparator
architecture is observed by using ADE (Analog Design
Environment) tool is shown in Fig -4.](https://image.slidesharecdn.com/irjet-v6i7308-191112065045/85/IRJET-Design-and-Implementation-of-High-Speed-Low-Power-Charge-Shared-Reset-Method-based-Dynamic-Latch-Comparator-using-45nm-CMOS-Technology-2-320.jpg)
![International Research Journal of Engineering and Technology (IRJET) e-ISSN: 2395-0056
Volume: 06 Issue: 07 | July 2019 www.irjet.net p-ISSN: 2395-0072
© 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 2174
Fig -3: Circuit schematic in 45nm Cadence Virtuoso tool
Fig -4: Transient Response of the proposed comparator
Layout of the comparatorisdesignedusingCadencevirtuoso
Layout XL tool. All the layouts components need to be
arranged and connected properly in order to manage the
area. The layout is checked for Design Rule Check errors,
made error free and Layout Versus Schematic is matched.
The silicon area of this layout design is 21.56µm2 isshownin
Fig -5. Thus proposed comparator occupies minimum area
when compared to other conventional comparators.
Fig -5: Layout design of the proposed comparator circuit
schematic using cadence virtuoso 45nm tool
4. OUTCOME
The proposed optimized comparator has an efficient layout
area, minimum delay, and power consumption when
compared to other existing comparator architecture. The
proposedcomparatorhaspowerconsumptionof128nW and
delay of 22.8 ps. It operates with the low supply voltage of
1V. The comparison between the existing approaches and
the proposed design is listed in Table -1
Table -1: Comparisons between existing approaches and
proposed design.
Paramete
rs
[6] [1] [3] [2] [4] [5] Propo
sed
work
Technolo
gy (nm)
130 180 90 180 90 180 45
Supply
voltage
(V)
1.2 1.2 1 1 700
m
1 1
Average
Power
(W)
1.5n 96.5
p
31.8
μ
70μ 13.8
μ
0.95
μ
128.6
n
Delay (s) 0.62
n
0.56
n
50.9
p
- 1.12
μ
1.56
n
22.8p
Clock
Frequenc
y (Hz)
100
M
250
M
1G - - - 10G
PDP (fJ) 0.00
093
0.00
05
1.62 - - 1.48 0.002
9
Area
(µm2)
256 - 58.3
2
- - - 21.56](https://image.slidesharecdn.com/irjet-v6i7308-191112065045/85/IRJET-Design-and-Implementation-of-High-Speed-Low-Power-Charge-Shared-Reset-Method-based-Dynamic-Latch-Comparator-using-45nm-CMOS-Technology-3-320.jpg)
![International Research Journal of Engineering and Technology (IRJET) e-ISSN: 2395-0056
Volume: 06 Issue: 07 | July 2019 www.irjet.net p-ISSN: 2395-0072
© 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 2175
5. CONCLUSION
The proposed comparator enhancestheperformanceofADC
and it is highly improved for high speed applications. The
proposed comparator circuit is designed and tested using
Cadence virtuoso 45nm technology, which has efficient
layout area of 21.56 µm2. This comparator has low power
consumption of 128.6nW.Thusperformanceparameters are
improved in the proposed design.
REFERENCES
[1] Sagar Kumar Vinodiya and R. S. Gamad, “Analysis and
Design of Low Power, High speed Comparators in
180nm Technology with LowSupplyVoltagesforADCs,”
2017 8th International Conference on Computing,
Communication and Networking Technologies
(ICCCNT). IEEE, 2017.
[2] Shabi Tabassum, Anush Bekal, and Manish Goswami, “A
Low Power Preamplifier Latch based ComparatorUsing
180nm CMOS Technology,” 2013 IEEE Asia Pacific
Conference on Postgraduate Research in
Microelectronics and Electronics (PrimeAsia). IEEE,
2013.
[3] Savani, Vijay, and N. M. Devashrayee, “Design and
analysis of low-power shared charge reset technique
based dynamic latch comparator,” Microelectronics
journal 74 (2018): 116-126.
[4] Anil Khatak,Manoj Kumar, and Sanjeev Dhull,
“Comparative analysis of comparators in 90nm CMOS
Technology,” 2018 International Conference on Power
Energy, Environment and Intelligent Control (PEEIC).
IEEE, 2018.
[5] Ms. Aayisa Banu S, Ms. Divya R, and Mr. Ramesh K,
“Design and Simulation of Low Power and High Speed
Comparator using VLSI Technique,” International
Journal of Advanced Research in Computer and
Communication Engineering (IJARCCE).Vol. 6, Issue 1,
January 2017.
[6] B.B.A. Fouzy, M.B.I. Reaz, M.A.S. Bhuiyan, M.T.I. Badal,
and F.H. Hashim, “Design of a Low-power High-speed
Comparator in 0.13µm CMOS,” 2016 International
Conference on Advances in Electrical, Electronic and
System Engineering, 14-16 Nov 2016, Malaysia IEEE,
2016.](https://image.slidesharecdn.com/irjet-v6i7308-191112065045/85/IRJET-Design-and-Implementation-of-High-Speed-Low-Power-Charge-Shared-Reset-Method-based-Dynamic-Latch-Comparator-using-45nm-CMOS-Technology-4-320.jpg)
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IRJET- Design and Implementation of High Speed, Low Power Charge Shared Reset Method based Dynamic Latch Comparator using 45nm CMOS Technology
- 1. International Research Journal of Engineering and Technology (IRJET) e-ISSN: 2395-0056 Volume: 06 Issue: 07 | July 2019 www.irjet.net p-ISSN: 2395-0072 © 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 2172 DESIGN AND IMPLEMENTATION OF HIGH SPEED, LOW POWER CHARGE SHARED RESET METHOD BASED DYNAMIC LATCH COMPARATOR USING 45nm CMOS TECHNOLOGY SHUBHASHREE P R1, SAVIDHAN SHETTY C S2 1Student, Dept. of ECE, Sahyadri College of Engineering & Management, Karnataka, India 2Assistant Professor, Dept. of ECE, Sahyadri College of Engineering & Management, Karnataka, India ---------------------------------------------------------------------***---------------------------------------------------------------------- Abstract - An analog to digital converter (ADC) is an essential building block to run the semiconductor industry. Comparator is an important component of ADCs. The high speed, low voltage, area efficient, and low power optimized comparators are very important to enhance the performance of the ADCs. This paper presents Charge shared reset method based dynamic comparator design using Cadence virtuoso 45nm technology. The main aim of the project is to design low power, high speed, optimized Dynamic latch comparator which is very useful for the electronic industries where low power and optimized performance are the prime concerns. In the proposed comparator architecture, outputs of the comparator will not go below the thresholdvoltageduringthe reset phase of the clock which will be held at a constant voltage level. Hence quicker comparison of the signals can be achieved at the start of the evaluation phase. This will significantly reduce power and delay in the design. Key Words: ADC, Dynamic Comparator, Low power design, Delay, minimum area, Cadence virtuoso 45nm technology. 1. INTRODUCTION The continuous improvementinCMOStechnologyallowsthe researchers to manufacture completely on-chip devices without trading off the performance parameters. The comparator is the fundamental component of the ADCs. The function of the comparator circuit is tocomparetwosame or dissimilar electrical signals. Comparators are used in wide variety of the applicationssuchasRF communications,ADCs, memory detecting circuits, testing oscilloscope,inswitching power regulators, and signal recognition systems etc. These days, where interest for portable battery operateddevicesis expanding, a noteworthy significance is given towards low power designs forhighspeedapplications.Comparatoristhe decision making circuits which has crucial influence on the performance of high speed applications. The proposed comparator architecture is based on shared charge reset technique. The proposed architecture is a dynamic latch comparator, where output voltage level will not go less than the threshold voltage during reset phase of clock. This is a low voltage, high speed optimized comparator through which we can achieve quicker comparison between two signals. The circuit area is also optimized by using Cadence virtuoso 45nm technology. The symbol of a comparator is shown in Fig -1. The cmos comparator is well known as a decision making circuit. Fig -1: Comparator symbol If Vp>Vn then the output, Vout = Vdd =logic1. If Vp<Vn then the output, Vout = ground= logic0. Thecomparatorconverts analog input signal into digital output signal hence, comparator has vital effect ontheperformanceofhighspeed applications. The low power, high speed comparators will improve the performance of ADCs. An optimized design for dynamic comparator is proposed in this project focusing on main performance parameters such as silicon area, delay, PDP, and power consumption management. 2. LITERATURE SURVEY The variety of comparator circuits were focused from various leading technical papersarestudiedanddiscussedin this section. Sagar Kumar Vinodiya and R S Gamad [1] proposed a high speed comparator which has a differential input stage along with a latch stage. Herecomparatordesign is optimized to get minimum power and delay. The dynamic latch comparator has delay of 0.56ns and power consumption of 96.5pw. But this comparator requires more area as it has many transistors in the circuit. The circuit was designed and tested using SCL 180nm technology by using ADE tool of Cadence. Shabi Tabassum and Anush Bekal [2] proposed a comparator, which consists of preamplifier and latch stage. This comparator architecture which helps to remove the kickback noise anddcoffsetvoltage.Theaverage power consumed in the design was 70µW. This design was
- 2. International Research Journal of Engineering and Technology (IRJET) e-ISSN: 2395-0056 Volume: 06 Issue: 07 | July 2019 www.irjet.net p-ISSN: 2395-0072 © 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 2173 made in 180nm CMOStechnology with thelowvoltageof 1V. The proposed architecture is used in Successive Approximation ADCs. VijaySavaniandN.M.Devashrayee [3] analyzed different types of dynamic latch comparators and listed various types of performance parameters. The Single tail dynamic latch comparator has high impedance at input stage and minimum static power dissipation. But this has high power dissipation and low speed of operation. The double tail current dynamic latchedcomparatorarchitecture provides low offset and minimum delay. The layout of this comparator occupies more silicon area. The shared charge reset technique comparator has minimum delay and power consumption in the circuit. This comparator architecture is implemented in 90nm technology using gpdk90 technology in cadence tool which has delay of 50.9ps and power consumption of 31.80 μW. Anil Khatak, Manoj Kumar, and Sanjeev Dhull [4] introduced a Comparator with two cross- coupled Inverters for ADCs using 90nm technology. This comparator was designed using SPICE in 90 nm technology with minimum delay and power consumption. The two Cross-Coupled Inverters implemented in this comparator architecture has zero static power dissipation. This Comparator is utilized in successive approximation ADCs. Ms. Aayisa Banu S and Mr. Ramesh K [5] designed a comparator which acts as the quantizer in the ADCs applications. The proposed architecture uses CMOS Operational Amplifier design technique. Theparasitic effects limits the performance the comparators, hence the parasitic effects are greatly minimized in this design.Thiscomparator is designed by using gpdk180 technology library in Cadence tool. B.B.A. Fouzy and Bhuiyan [6] proposed pre-amplifier- latch based comparator using 0.13µm CMOS process in Design IC of Mentor Graphics environment. In order to get high speed comparator thecombinationofanamplifierstage and latch circuit is implemented in this comparator. The proposed comparator architecture has 0.65ns of delay, 1.5nW of power and occupies 256µm2 of silicon space. This comparator is mainly used in area efficient, very low-power, and rapid ADCs. 2. SCHEMATIC DIAGRAM AND OPEARTION OF PROPOSED COMPARATOR The proposed project is implemented using Cadence virtuoso 45nm tool. In all other dynamic latch comparator, during reset phase the outputterminal eitherchargedto Vdd or discharged to ground GND. In this proposed comparator uses new reset technique, in which charge isretainedduring reset phase. The circuit diagram of Charge shared dynamic comparator is shown in Fig -2. Fig -2: Circuit diagram of proposed comparator The proposed comparator operates during reset phase (CLK=0) and evaluation phase (CLK=1) of the clock signal. When CLK = 0, the transistors MT1 and MT2 are turned OFF and both Fn and Fp terminals will bechargedtoVddthrough M3 and M4. Then the transistors MI1 and MI2 are turned ON. The pass transistor SC shorts the output terminals Outp and Outn during the reset phase. The pass transistor SC shares the charge between two output terminals Outp and Outn, as one of the output terminal will be at Vdd and other at Gnd after the previous evaluation phase. Hence output terminals will be held at constant voltage level. When CLK = 1, the transistors MT2 and MT1 are ON and transistors M3 and M4 are OFF. Both Fn and Fp terminals will discharge at different speed which depends on the inputs applied to the circuit. If Vinp > Vinn, the terminal Fn discharges fasterthan Fp and vice versa. If the potential at terminals Fp or Fn, becomes less than the threshold voltage of transistor (MI2 or MI1), the transistor MI2 or MI1 turns OFF. Thelatchstage of the comparator drives, one output to Vdd and other output to ground. Thus input signals can be compared at quickly during evaluation phase. This greatly reduces the delay and power consumption in the circuit. 3. IMPLEMENTATION The comparator circuit schematic is designed and tested using Cadence Virtuoso 45nm tool is shown in Fig -3. The circuit has two input terminals (Vinp, Vinn), two output terminals (Outp, Outn), high frequency clock signal, and supply voltage of 1V. The proposed comparator is tested with different input parameters and verified for correct output. The transient response of the comparator architecture is observed by using ADE (Analog Design Environment) tool is shown in Fig -4.
- 3. International Research Journal of Engineering and Technology (IRJET) e-ISSN: 2395-0056 Volume: 06 Issue: 07 | July 2019 www.irjet.net p-ISSN: 2395-0072 © 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 2174 Fig -3: Circuit schematic in 45nm Cadence Virtuoso tool Fig -4: Transient Response of the proposed comparator Layout of the comparatorisdesignedusingCadencevirtuoso Layout XL tool. All the layouts components need to be arranged and connected properly in order to manage the area. The layout is checked for Design Rule Check errors, made error free and Layout Versus Schematic is matched. The silicon area of this layout design is 21.56µm2 isshownin Fig -5. Thus proposed comparator occupies minimum area when compared to other conventional comparators. Fig -5: Layout design of the proposed comparator circuit schematic using cadence virtuoso 45nm tool 4. OUTCOME The proposed optimized comparator has an efficient layout area, minimum delay, and power consumption when compared to other existing comparator architecture. The proposedcomparatorhaspowerconsumptionof128nW and delay of 22.8 ps. It operates with the low supply voltage of 1V. The comparison between the existing approaches and the proposed design is listed in Table -1 Table -1: Comparisons between existing approaches and proposed design. Paramete rs [6] [1] [3] [2] [4] [5] Propo sed work Technolo gy (nm) 130 180 90 180 90 180 45 Supply voltage (V) 1.2 1.2 1 1 700 m 1 1 Average Power (W) 1.5n 96.5 p 31.8 μ 70μ 13.8 μ 0.95 μ 128.6 n Delay (s) 0.62 n 0.56 n 50.9 p - 1.12 μ 1.56 n 22.8p Clock Frequenc y (Hz) 100 M 250 M 1G - - - 10G PDP (fJ) 0.00 093 0.00 05 1.62 - - 1.48 0.002 9 Area (µm2) 256 - 58.3 2 - - - 21.56
- 4. International Research Journal of Engineering and Technology (IRJET) e-ISSN: 2395-0056 Volume: 06 Issue: 07 | July 2019 www.irjet.net p-ISSN: 2395-0072 © 2019, IRJET | Impact Factor value: 7.211 | ISO 9001:2008 Certified Journal | Page 2175 5. CONCLUSION The proposed comparator enhancestheperformanceofADC and it is highly improved for high speed applications. The proposed comparator circuit is designed and tested using Cadence virtuoso 45nm technology, which has efficient layout area of 21.56 µm2. This comparator has low power consumption of 128.6nW.Thusperformanceparameters are improved in the proposed design. REFERENCES [1] Sagar Kumar Vinodiya and R. S. Gamad, “Analysis and Design of Low Power, High speed Comparators in 180nm Technology with LowSupplyVoltagesforADCs,” 2017 8th International Conference on Computing, Communication and Networking Technologies (ICCCNT). IEEE, 2017. [2] Shabi Tabassum, Anush Bekal, and Manish Goswami, “A Low Power Preamplifier Latch based ComparatorUsing 180nm CMOS Technology,” 2013 IEEE Asia Pacific Conference on Postgraduate Research in Microelectronics and Electronics (PrimeAsia). IEEE, 2013. [3] Savani, Vijay, and N. M. Devashrayee, “Design and analysis of low-power shared charge reset technique based dynamic latch comparator,” Microelectronics journal 74 (2018): 116-126. [4] Anil Khatak,Manoj Kumar, and Sanjeev Dhull, “Comparative analysis of comparators in 90nm CMOS Technology,” 2018 International Conference on Power Energy, Environment and Intelligent Control (PEEIC). IEEE, 2018. [5] Ms. Aayisa Banu S, Ms. Divya R, and Mr. Ramesh K, “Design and Simulation of Low Power and High Speed Comparator using VLSI Technique,” International Journal of Advanced Research in Computer and Communication Engineering (IJARCCE).Vol. 6, Issue 1, January 2017. [6] B.B.A. Fouzy, M.B.I. Reaz, M.A.S. Bhuiyan, M.T.I. Badal, and F.H. Hashim, “Design of a Low-power High-speed Comparator in 0.13µm CMOS,” 2016 International Conference on Advances in Electrical, Electronic and System Engineering, 14-16 Nov 2016, Malaysia IEEE, 2016.