MIPI DevCon Taipei 2019: New Trends in the High-Volume Manufacturing Test of MIPI-based Devices
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The document discusses the testing and production requirements for MIPI-based devices, highlighting the need for at-speed testing and the development of system-oriented solutions by manufacturers. It covers hardware and protocol requirements essential for effectively testing these devices, including challenges related to signaling and communication. The presentation concludes with relevant resources for high-volume manufacturing test solutions.
MIPI DevCon Taipei 2019: New Trends in the High-Volume Manufacturing Test of MIPI-based Devices
- 1. Mohamed Hafed Introspect Technology New Trends in the High- Volume Manufacturing Test of MIPI-Based Devices
- 2. © 2019 MIPI Alliance, Inc. 2 Agenda • Introduction • Hardware Requirements for MIPI Testing in Production • Protocol Requirements for MIPI Testing in Production • System-Oriented Testing & Case Studies
- 3. © 2019 MIPI Alliance, Inc. 3 Typical Device Classes
- 4. © 2019 MIPI Alliance, Inc. 4 Golden Device Methodology ATE or Bench Instrument Add-On (e.g. Scope) Test Methodology Spectrum Reduce Cost / Increase Quality Test Module Test Methodology Spectrum Achieve Instrument Grade
- 5. © 2019 MIPI Alliance, Inc. 5 Test Methodology Spectrum – On-Board Channel Card
- 7. © 2019 MIPI Alliance, Inc. 7 Low-Power (LP) and High-Speed (HS) Signaling *LVCMOS = Low-Voltage Complementary Metal Oxide Semiconductor Logic
- 8. © 2019 MIPI Alliance, Inc. 8 Switching Challenges on ATE Integrated Driver Conventional Switch-Based Solution With Hi-Z loadWith Hi-Z load Switch timing & charge injection cause poor timing control Challenges exist because of receiver switchable termination as well Proper D-PHY LP/HS transition Proper C-PHY LP/HS transition
- 9. © 2019 MIPI Alliance, Inc. 9 Multi-Level HS Drivers and Comparators
- 10. © 2019 MIPI Alliance, Inc. 10 Equalization Waveforms D-PHY C-PHY
- 11. © 2019 MIPI Alliance, Inc. 11 Bidirectional Bus Control
- 13. © 2019 MIPI Alliance, Inc. 13 Packet Based Communication
- 14. © 2019 MIPI Alliance, Inc. 14 DUT Configuration Through the MIPI Bus
- 15. © 2019 MIPI Alliance, Inc. 15 Functional Testing on ATE
- 16. System-Oriented Testing and Case Studies
- 17. © 2019 MIPI Alliance, Inc. 17 Microcontroller CSI-2 Input Test
- 18. © 2019 MIPI Alliance, Inc. 18 Microcontroller CSI-2 Input Test
- 19. © 2019 MIPI Alliance, Inc. 19 DDIC* with Integrated Device Response Checking *DDIC = Display Driver IC
- 20. © 2019 MIPI Alliance, Inc. 20 Image Sensor Test Low-Speed ATE with Image Processor Illuminator DUT Module used as a fast capture tool
- 21. © 2019 MIPI Alliance, Inc. 21 Summary • Increasing requirements have emerged for at-speed testing of MIPI-based devices • System-like solutions are being developed by manufacturers of microcontrollers, image sensors, display drivers, and storage devices • Hardware and protocol requirements for enabling the test of such solutions have been described in this presentation
- 22. © 2019 MIPI Alliance, Inc. 22 • https://introspect.ca/ – Total solutions for most high-speed interface technologies • https://introspect.ca/products-solutions/high-volume- manufacturing-test/ – Solutions for at-speed testing during mass production • https://introspect.ca/products-solutions/mipi-camera-and- imaging/ – Image sensor test and validation solutions • https://introspect.ca/products-solutions/mipi-display-and-touch/ – Display test and validation solutions https://introspect.ca ADDITIONAL RESOURCES